JPS5661124A - Forming method of thin film on substrate having stepped part - Google Patents
Forming method of thin film on substrate having stepped partInfo
- Publication number
- JPS5661124A JPS5661124A JP13913579A JP13913579A JPS5661124A JP S5661124 A JPS5661124 A JP S5661124A JP 13913579 A JP13913579 A JP 13913579A JP 13913579 A JP13913579 A JP 13913579A JP S5661124 A JPS5661124 A JP S5661124A
- Authority
- JP
- Japan
- Prior art keywords
- film
- thin film
- substrate
- stepped part
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To obtain a uniform film thickness on the approximately flat surface by overlapping thin films with the mask used for forming the stepped part being remained, removing the mask and the thin film thereon, and adding the thin film again. CONSTITUTION:CVD SiO2 films 6 and 7 are overlapped without removing a resistmask 5 used for etching a poly Si layer 2 on an Si substrate 1. Then, the mask 5 and the film 6 are selectively removed, and a CVD SiO2 film 8 is additionally formed again, thereby the surface is approximately flattened. A resist 9 is rotationally applied thereon. In this method, the difference in the film thickness is not yielded even though the thickness is thin, and the uniform pattern can be formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13913579A JPS5661124A (en) | 1979-10-25 | 1979-10-25 | Forming method of thin film on substrate having stepped part |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13913579A JPS5661124A (en) | 1979-10-25 | 1979-10-25 | Forming method of thin film on substrate having stepped part |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5661124A true JPS5661124A (en) | 1981-05-26 |
Family
ID=15238343
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13913579A Pending JPS5661124A (en) | 1979-10-25 | 1979-10-25 | Forming method of thin film on substrate having stepped part |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5661124A (en) |
-
1979
- 1979-10-25 JP JP13913579A patent/JPS5661124A/en active Pending
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