JPS5660054A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPS5660054A JPS5660054A JP13490579A JP13490579A JPS5660054A JP S5660054 A JPS5660054 A JP S5660054A JP 13490579 A JP13490579 A JP 13490579A JP 13490579 A JP13490579 A JP 13490579A JP S5660054 A JPS5660054 A JP S5660054A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- type
- specific resistance
- region
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/103—Integrated devices the at least one element covered by H10F30/00 having potential barriers, e.g. integrated devices comprising photodiodes or phototransistors
Landscapes
- Solid State Image Pick-Up Elements (AREA)
Abstract
PURPOSE:To coexist both a PIN photodiode and a bipolar integrated circuit by growing a high specific resistance I layer on a semiconductor substrate and forming a low specific resistance region on a part of the layer by an ion implantation or diffusion or the like. CONSTITUTION:n Type buried layers 2-1, 2-2 are selectively formed on a p type Si substrate 1, a high specific resistance semiconductor layer (an I layer) 3 is thereafter grown thereon, and an n type buried layer 4-1 and an electrode pickup region 4-2 are formed on the surface of the I layer 3. Further, the second I layer 5 is grown and low specific resistance region 6 for forming a bipolar element is formed by an ion implantation or diffusion or the like. A p type layer 9 and an n<+> type layer 11 are formed in the region 6 and a bipolar element is thus formed. A p type layer 10 is formed on the residual part of the layer 5 and a PIN diode is formed. p<+> Type layers 7-1, 7-2 are formed for isolating the elements from each other.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13490579A JPS5660054A (en) | 1979-10-19 | 1979-10-19 | Semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13490579A JPS5660054A (en) | 1979-10-19 | 1979-10-19 | Semiconductor integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5660054A true JPS5660054A (en) | 1981-05-23 |
JPS6136713B2 JPS6136713B2 (en) | 1986-08-20 |
Family
ID=15139262
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13490579A Granted JPS5660054A (en) | 1979-10-19 | 1979-10-19 | Semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5660054A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63122164A (en) * | 1986-11-11 | 1988-05-26 | Pioneer Electronic Corp | optical sensor integrated circuit |
EP0576009A1 (en) * | 1992-06-25 | 1993-12-29 | Sanyo Electric Co., Limited. | Optical semiconductor device and fabrication method therefor |
EP0660414A1 (en) * | 1993-12-21 | 1995-06-28 | Sony Corporation | Semiconductor device |
US6049117A (en) * | 1995-09-26 | 2000-04-11 | Sharp Kabushiki Kaisha | Light-receiving element |
JP2002141419A (en) * | 2000-11-06 | 2002-05-17 | Texas Instr Japan Ltd | Semiconductor device |
JP2002231917A (en) * | 2001-02-05 | 2002-08-16 | Hamamatsu Photonics Kk | Semiconductor light detection device |
US7211829B2 (en) | 2004-03-01 | 2007-05-01 | Matsushita Electric Industrial Co., Ltd | Semiconductor photodetector device |
-
1979
- 1979-10-19 JP JP13490579A patent/JPS5660054A/en active Granted
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63122164A (en) * | 1986-11-11 | 1988-05-26 | Pioneer Electronic Corp | optical sensor integrated circuit |
EP0576009A1 (en) * | 1992-06-25 | 1993-12-29 | Sanyo Electric Co., Limited. | Optical semiconductor device and fabrication method therefor |
EP0660414A1 (en) * | 1993-12-21 | 1995-06-28 | Sony Corporation | Semiconductor device |
US6049117A (en) * | 1995-09-26 | 2000-04-11 | Sharp Kabushiki Kaisha | Light-receiving element |
JP2002141419A (en) * | 2000-11-06 | 2002-05-17 | Texas Instr Japan Ltd | Semiconductor device |
JP2002231917A (en) * | 2001-02-05 | 2002-08-16 | Hamamatsu Photonics Kk | Semiconductor light detection device |
US7211829B2 (en) | 2004-03-01 | 2007-05-01 | Matsushita Electric Industrial Co., Ltd | Semiconductor photodetector device |
Also Published As
Publication number | Publication date |
---|---|
JPS6136713B2 (en) | 1986-08-20 |
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