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JPS5622925A - Analytic measurement method for base material for optical fiber - Google Patents

Analytic measurement method for base material for optical fiber

Info

Publication number
JPS5622925A
JPS5622925A JP9826979A JP9826979A JPS5622925A JP S5622925 A JPS5622925 A JP S5622925A JP 9826979 A JP9826979 A JP 9826979A JP 9826979 A JP9826979 A JP 9826979A JP S5622925 A JPS5622925 A JP S5622925A
Authority
JP
Japan
Prior art keywords
rays
optical fiber
base material
analysis
transmissivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9826979A
Other languages
Japanese (ja)
Inventor
Hiroshi Takahashi
Shintaro Izutsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP9826979A priority Critical patent/JPS5622925A/en
Publication of JPS5622925A publication Critical patent/JPS5622925A/en
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE: To enable an easy analysis without destruction by irradiating a workpiece as an optical-fiber base material in process or after manufacture with X-rays of γ- rays, by measuring energy dependency characteristics of transmissivity, and then by analyzing the component on the basis of the analysis.
CONSTITUTION: When X-ray source 1 is used, optical fiber workpiece 8 is irradiated with X-rays, which are detected by detector 2 through lead-made slit structure 3 with slit 4 and its output is passed through amplifier 5 and multichannel pulse height analyzer 6 to record energy spectrum by recorder 7. Exposure source 1 can use monochromatic X-rays and γ-rays by using a crystal monochromator, etc. When the optical fiber consists of n elements, the structure can be determined from transmissivity that corresponds to n energies. Therefore, the analysis can be carried out easily without destruction.
COPYRIGHT: (C)1981,JPO&Japio
JP9826979A 1979-08-01 1979-08-01 Analytic measurement method for base material for optical fiber Pending JPS5622925A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9826979A JPS5622925A (en) 1979-08-01 1979-08-01 Analytic measurement method for base material for optical fiber

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9826979A JPS5622925A (en) 1979-08-01 1979-08-01 Analytic measurement method for base material for optical fiber

Publications (1)

Publication Number Publication Date
JPS5622925A true JPS5622925A (en) 1981-03-04

Family

ID=14215215

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9826979A Pending JPS5622925A (en) 1979-08-01 1979-08-01 Analytic measurement method for base material for optical fiber

Country Status (1)

Country Link
JP (1) JPS5622925A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61167848A (en) * 1985-01-21 1986-07-29 Furukawa Electric Co Ltd:The Method for analyzing composition of object to be measured by x-ray
JPS61167847A (en) * 1985-01-21 1986-07-29 Furukawa Electric Co Ltd:The Method for analyzing composition of object to be measured by x-ray
JPS61240146A (en) * 1985-04-17 1986-10-25 Furukawa Electric Co Ltd:The Method for analyzing composition of article to be measured by x-rays
JPS61240148A (en) * 1985-04-17 1986-10-25 Furukawa Electric Co Ltd:The Method for analyzing composition of article to be measured by x-rays

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4168431A (en) * 1978-01-06 1979-09-18 The Kartridg Pak Co. Multiple-level X-ray analysis for determining fat percentage

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4168431A (en) * 1978-01-06 1979-09-18 The Kartridg Pak Co. Multiple-level X-ray analysis for determining fat percentage

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61167848A (en) * 1985-01-21 1986-07-29 Furukawa Electric Co Ltd:The Method for analyzing composition of object to be measured by x-ray
JPS61167847A (en) * 1985-01-21 1986-07-29 Furukawa Electric Co Ltd:The Method for analyzing composition of object to be measured by x-ray
JPS61240146A (en) * 1985-04-17 1986-10-25 Furukawa Electric Co Ltd:The Method for analyzing composition of article to be measured by x-rays
JPS61240148A (en) * 1985-04-17 1986-10-25 Furukawa Electric Co Ltd:The Method for analyzing composition of article to be measured by x-rays

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