JPS56152394A - Channel test system for time division system digital exchange - Google Patents
Channel test system for time division system digital exchangeInfo
- Publication number
- JPS56152394A JPS56152394A JP5542580A JP5542580A JPS56152394A JP S56152394 A JPS56152394 A JP S56152394A JP 5542580 A JP5542580 A JP 5542580A JP 5542580 A JP5542580 A JP 5542580A JP S56152394 A JPS56152394 A JP S56152394A
- Authority
- JP
- Japan
- Prior art keywords
- channel
- memory
- information
- idle
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
- H04M3/24—Arrangements for supervision, monitoring or testing with provision for checking the normal operation
- H04M3/244—Arrangements for supervision, monitoring or testing with provision for checking the normal operation for multiplex systems
Landscapes
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Use Of Switch Circuits For Exchanges And Methods Of Control Of Multiplex Exchanges (AREA)
Abstract
PURPOSE:To obtain a simple channel test system, by setting test information to a channel holding memory and by using one idle channel to test the channel. CONSTITUTION:Sending test information STD is written into address Hi of channel holding memory HM by central control device CC. Idle information of channel (i) is stored in bit ID of memory HM. Selecting circuit SEL transmits the signal from voice memory SPM to coding and decoding circuit CODEC if the channel is busy in the assigned time slot; and if the channel is idle, circuit SEL transmits the signal of memory HM to circuit CODEC. Circuit CODEC returns information STD, and returned information RTD is written in memory SPM. Device CC compares information STD on memory HM and information RTD on memory SPM with each other to discriminate whether the channel is correct or not.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5542580A JPS56152394A (en) | 1980-04-28 | 1980-04-28 | Channel test system for time division system digital exchange |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5542580A JPS56152394A (en) | 1980-04-28 | 1980-04-28 | Channel test system for time division system digital exchange |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56152394A true JPS56152394A (en) | 1981-11-25 |
Family
ID=12998218
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5542580A Pending JPS56152394A (en) | 1980-04-28 | 1980-04-28 | Channel test system for time division system digital exchange |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56152394A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0171803A2 (en) * | 1984-08-15 | 1986-02-19 | Fujitsu Limited | Time division exchange for carrying out a loop-back test |
-
1980
- 1980-04-28 JP JP5542580A patent/JPS56152394A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0171803A2 (en) * | 1984-08-15 | 1986-02-19 | Fujitsu Limited | Time division exchange for carrying out a loop-back test |
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