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JPS56123044A - Digital signal processing device having selfdiagnostic function - Google Patents

Digital signal processing device having selfdiagnostic function

Info

Publication number
JPS56123044A
JPS56123044A JP2632080A JP2632080A JPS56123044A JP S56123044 A JPS56123044 A JP S56123044A JP 2632080 A JP2632080 A JP 2632080A JP 2632080 A JP2632080 A JP 2632080A JP S56123044 A JPS56123044 A JP S56123044A
Authority
JP
Japan
Prior art keywords
signal processing
fault
processing blocks
change
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2632080A
Other languages
Japanese (ja)
Other versions
JPS6156539B2 (en
Inventor
Masahiko Iijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2632080A priority Critical patent/JPS56123044A/en
Publication of JPS56123044A publication Critical patent/JPS56123044A/en
Publication of JPS6156539B2 publication Critical patent/JPS6156539B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To reduce the number of signal lines and switch circuits to simplify the circuit, by providing on change-over switch for each of plural signal processing blocks and by switching this switch to search the fault of an arbitrary block. CONSTITUTION:The digital signal processing device which becomes the object of fault search is divided into plural signal processing blocks 1-8, and change-over switches 11-18 are provided at output terminals of respective processing blocks, and these swithes are switched to supply the diagnostic test signal for checking presence or absence of the fault from test signal generating circuit 9 to an arbitary block of signal processing blocks, and the test signal output from the signal processing to be tested is checked (diagonsed) by test signal checking circuit 10. By this simple circuit constitution with change-over switches provided in respective signal processing blocks, the fault of an arbitrary processing block is searched.
JP2632080A 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function Granted JPS56123044A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2632080A JPS56123044A (en) 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2632080A JPS56123044A (en) 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function

Publications (2)

Publication Number Publication Date
JPS56123044A true JPS56123044A (en) 1981-09-26
JPS6156539B2 JPS6156539B2 (en) 1986-12-03

Family

ID=12190095

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2632080A Granted JPS56123044A (en) 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function

Country Status (1)

Country Link
JP (1) JPS56123044A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50158245A (en) * 1974-06-11 1975-12-22
JPS526436A (en) * 1975-07-04 1977-01-18 Nec Corp Electronic circuit test system
JPS5222840A (en) * 1975-08-15 1977-02-21 Hitachi Ltd Logical circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50158245A (en) * 1974-06-11 1975-12-22
JPS526436A (en) * 1975-07-04 1977-01-18 Nec Corp Electronic circuit test system
JPS5222840A (en) * 1975-08-15 1977-02-21 Hitachi Ltd Logical circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits

Also Published As

Publication number Publication date
JPS6156539B2 (en) 1986-12-03

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