[go: up one dir, main page]

JPS5520470A - Signal processing method in surface defect detection of high-temperature tested material - Google Patents

Signal processing method in surface defect detection of high-temperature tested material

Info

Publication number
JPS5520470A
JPS5520470A JP9378378A JP9378378A JPS5520470A JP S5520470 A JPS5520470 A JP S5520470A JP 9378378 A JP9378378 A JP 9378378A JP 9378378 A JP9378378 A JP 9378378A JP S5520470 A JPS5520470 A JP S5520470A
Authority
JP
Japan
Prior art keywords
signal
signals
sent
difference
peak
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9378378A
Other languages
Japanese (ja)
Other versions
JPS5916661B2 (en
Inventor
Yasuhide Nakai
Yoshiro Nishimoto
Nobuo Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP9378378A priority Critical patent/JPS5916661B2/en
Publication of JPS5520470A publication Critical patent/JPS5520470A/en
Publication of JPS5916661B2 publication Critical patent/JPS5916661B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE: To eliminate temperature spots and the influence of a scale in the defect discrimination of a high-temperature tested aterial, by generating the material surface temperature level, where no scale exists, as a reference signal and discriminating defect signals on a basis of the difference between the reference signals and video signals.
CONSTITUTION: Video signal acquired from high-temperature tested material 1 by image pick-up unit 2 are not only sent to storage circuit 4 for a fixed time delay but also sent to peak hold circuits 6 and 8 which define the peak for every picture dividing pulse to divide video signals in the scanning direction as the signal of the picture element, and the average value of peak signals of plural picture elements is outputted successively for every picture element, and the average value is compared with the delay signal from storage circuit 4 as a reference signal, and the difference between them is obtained by subtraction circuit 15, and the difference signal is sent to hurt decision circuit 16.
COPYRIGHT: (C)1980,JPO&Japio
JP9378378A 1978-07-29 1978-07-29 Signal processing method for surface defect detection of high-temperature test materials Expired JPS5916661B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9378378A JPS5916661B2 (en) 1978-07-29 1978-07-29 Signal processing method for surface defect detection of high-temperature test materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9378378A JPS5916661B2 (en) 1978-07-29 1978-07-29 Signal processing method for surface defect detection of high-temperature test materials

Publications (2)

Publication Number Publication Date
JPS5520470A true JPS5520470A (en) 1980-02-13
JPS5916661B2 JPS5916661B2 (en) 1984-04-17

Family

ID=14092001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9378378A Expired JPS5916661B2 (en) 1978-07-29 1978-07-29 Signal processing method for surface defect detection of high-temperature test materials

Country Status (1)

Country Link
JP (1) JPS5916661B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS574540A (en) * 1980-06-12 1982-01-11 Unitika Ltd Method and apparatus for detecting defect of long flat object
JPS59163861A (en) * 1983-03-09 1984-09-14 Hitachi Electronics Eng Co Ltd Detector for white flaw and black flaw of solid-state image pickup element
JPS6089734A (en) * 1983-10-24 1985-05-20 Nok Corp Inspecting method of surface defect

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56136929U (en) * 1980-03-18 1981-10-16
JPH0453807Y2 (en) * 1986-07-04 1992-12-17

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS574540A (en) * 1980-06-12 1982-01-11 Unitika Ltd Method and apparatus for detecting defect of long flat object
JPS59163861A (en) * 1983-03-09 1984-09-14 Hitachi Electronics Eng Co Ltd Detector for white flaw and black flaw of solid-state image pickup element
JPS6089734A (en) * 1983-10-24 1985-05-20 Nok Corp Inspecting method of surface defect

Also Published As

Publication number Publication date
JPS5916661B2 (en) 1984-04-17

Similar Documents

Publication Publication Date Title
JPS5451556A (en) Distance measuring apparatus
EP0393823A3 (en) Image motion vector detecting apparatus
JPS54130825A (en) Image scanner
JPS5520470A (en) Signal processing method in surface defect detection of high-temperature tested material
JPS54143168A (en) Appearance tester
JPS5520469A (en) Surface defect extraction signal processing unit of high- temperature tested material
JPS5459169A (en) Size measuring apparatus
JPS5466019A (en) Detection system for moving object
JPS5474622A (en) Shading correction unit
FR2417222A1 (en) Surveillance zone monitor - compares successive zone rages to detect movement in zone
JPS5492774A (en) Method and apparatus for detecting objects
JPS562563A (en) Deciding method for particle coagulation pattern
JPS5556761A (en) Picture process system
JPS5569040A (en) Processing system for flaw detection signal
JPS5742282A (en) A/d converter for output video signal of vtr
JPS57163805A (en) Method and device for inspecting thickness of tablet
JPS55100788A (en) Defect inspection unit
JPS52110030A (en) Detector for distinctness of object image
JPS57134763A (en) Correlation tracking device
JPS5596766A (en) Noise reduction circuit in solid image pickup device
JPS56149187A (en) Color solid image pickup device
JPS541624A (en) Distortion detector of recording images
JPS5596767A (en) Output signal drop-out compensation circuit of solid image pickup element
JPS5744838A (en) Method for discriminating defect on surface of high temperature material
JPS55121106A (en) Detector for waveform of beltlike body