JPS5515034A - Adjustment method of corpuscle powder sample for scanning-type electronic microscope - Google Patents
Adjustment method of corpuscle powder sample for scanning-type electronic microscopeInfo
- Publication number
- JPS5515034A JPS5515034A JP8768378A JP8768378A JPS5515034A JP S5515034 A JPS5515034 A JP S5515034A JP 8768378 A JP8768378 A JP 8768378A JP 8768378 A JP8768378 A JP 8768378A JP S5515034 A JPS5515034 A JP S5515034A
- Authority
- JP
- Japan
- Prior art keywords
- powder
- adhesive tape
- solvent
- approximately
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
PURPOSE: To observe condensed corpuscle powder as primary particles by dispersing sample minute powder in a specific solvent under a primary particle state and dropping this solvent onto the adhesion face of an adhesive tape to evaporate the solvent and fixing this powder under a two-dimensional distribution state.
CONSTITUTION: Uranium oxide powder of primary particle diameter 0.2 to 0.5μm is added to low-level alcohol, for example, with a concentration of 0.5 to 1.5 weight %, and dispersion is promoted by an ultrasonic vibrator. Next, this dispersive liquid of approximately 0.1cc is dropped onto the residual adhesion face of a both-side adhesive tape of 8×8mm which has one face fixed to the metallic sample stand of a scanning-type electronic microscope. Then, the solvent is evaporated by vacuum drying, etc. After drying, a conductive thin film such as Au is formed into approximately 100Å thickness throughout the surface of the both-side adhesive tape by the vacuum evaporation method and the sputtering method. Then, a conductive paint such as an Ag paste is applied to four corners of the both-side adhesive tape to obtain conduction to the sample stand. As the result of observation with the fixed powder sample adjusted in this manner, a sufficient observation can be performed with a scale factor of approximately 30000.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53087683A JPS5816690B2 (en) | 1978-07-20 | 1978-07-20 | Preparation method of fine powder sample for scanning electron microscopy |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53087683A JPS5816690B2 (en) | 1978-07-20 | 1978-07-20 | Preparation method of fine powder sample for scanning electron microscopy |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5515034A true JPS5515034A (en) | 1980-02-01 |
JPS5816690B2 JPS5816690B2 (en) | 1983-04-01 |
Family
ID=13921720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53087683A Expired JPS5816690B2 (en) | 1978-07-20 | 1978-07-20 | Preparation method of fine powder sample for scanning electron microscopy |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5816690B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62132143A (en) * | 1985-12-04 | 1987-06-15 | Fujitsu Ltd | Sample preparation method |
US5540951A (en) * | 1991-11-08 | 1996-07-30 | Research Development Corporation Of Japan | Method for two-dimensional assembly formation of fine particles from a liquid dispersion |
JP2017156226A (en) * | 2016-03-02 | 2017-09-07 | 住友金属鉱山株式会社 | Method for observing powder sample and method for forming the powder sample |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61292679A (en) * | 1985-06-20 | 1986-12-23 | 横河電機株式会社 | Graphic display unit |
-
1978
- 1978-07-20 JP JP53087683A patent/JPS5816690B2/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62132143A (en) * | 1985-12-04 | 1987-06-15 | Fujitsu Ltd | Sample preparation method |
US5540951A (en) * | 1991-11-08 | 1996-07-30 | Research Development Corporation Of Japan | Method for two-dimensional assembly formation of fine particles from a liquid dispersion |
JP2017156226A (en) * | 2016-03-02 | 2017-09-07 | 住友金属鉱山株式会社 | Method for observing powder sample and method for forming the powder sample |
Also Published As
Publication number | Publication date |
---|---|
JPS5816690B2 (en) | 1983-04-01 |
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