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JPS54130841A - Address generator - Google Patents

Address generator

Info

Publication number
JPS54130841A
JPS54130841A JP3895078A JP3895078A JPS54130841A JP S54130841 A JPS54130841 A JP S54130841A JP 3895078 A JP3895078 A JP 3895078A JP 3895078 A JP3895078 A JP 3895078A JP S54130841 A JPS54130841 A JP S54130841A
Authority
JP
Japan
Prior art keywords
circuit
signal
addresses
period
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3895078A
Other languages
Japanese (ja)
Other versions
JPS5712220B2 (en
Inventor
Masao Shimizu
Takashi Tokuno
Koji Ishikawa
Naoaki Narumi
Osamu Oguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Nippon Telegraph and Telephone Corp
Original Assignee
Advantest Corp
Nippon Telegraph and Telephone Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Nippon Telegraph and Telephone Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP3895078A priority Critical patent/JPS54130841A/en
Priority to US06/026,246 priority patent/US4293950A/en
Publication of JPS54130841A publication Critical patent/JPS54130841A/en
Publication of JPS5712220B2 publication Critical patent/JPS5712220B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To make access high-speed by detecting a page mode to not only supply successively only changed addresses but also shorten the clock period and the memory clock period in the address generator. CONSTITUTION:The row address signal at terminal 23R of pattern generator 21 is compared with a signal, which is obtained by delaying the row address signal by unit clock one period components in chain register 37, in comparator circuit 36. When circuit 36 outputs a non-coincidence signal, multiplexer 27 supplies row addresses and column addresses alternately to driver comparator 31. When circuit 36 outputs a coincidence signal, multiplexer 27 supplies only column addresses to driver comparator 31. Further, timing control circuit 42 is controlled by signals from terminal 41, thereby controlling the timing generation period of timing generator 33.
JP3895078A 1978-04-03 1978-04-03 Address generator Granted JPS54130841A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP3895078A JPS54130841A (en) 1978-04-03 1978-04-03 Address generator
US06/026,246 US4293950A (en) 1978-04-03 1979-04-02 Test pattern generating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3895078A JPS54130841A (en) 1978-04-03 1978-04-03 Address generator

Publications (2)

Publication Number Publication Date
JPS54130841A true JPS54130841A (en) 1979-10-11
JPS5712220B2 JPS5712220B2 (en) 1982-03-09

Family

ID=12539474

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3895078A Granted JPS54130841A (en) 1978-04-03 1978-04-03 Address generator

Country Status (1)

Country Link
JP (1) JPS54130841A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5972050U (en) * 1982-11-05 1984-05-16 日立電子株式会社 transceiver
JPS60555A (en) * 1982-11-15 1985-01-05 デ−タ−・ゼネラル・コ−ポレ−シヨン General-purpose memory
JPH0296851A (en) * 1988-10-03 1990-04-09 Mitsubishi Electric Corp Access circuit
JPH08129900A (en) * 1994-10-28 1996-05-21 Nec Corp Testing method for semiconductor memory
JP2006214839A (en) * 2005-02-03 2006-08-17 Fujitsu Ltd Test pattern generation apparatus and test pattern generation method for memory built-in device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59150525A (en) * 1983-02-16 1984-08-28 Mitsubishi Heavy Ind Ltd Apparatus for removing dry acidic gas

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5972050U (en) * 1982-11-05 1984-05-16 日立電子株式会社 transceiver
JPS60555A (en) * 1982-11-15 1985-01-05 デ−タ−・ゼネラル・コ−ポレ−シヨン General-purpose memory
JPH0296851A (en) * 1988-10-03 1990-04-09 Mitsubishi Electric Corp Access circuit
JPH08129900A (en) * 1994-10-28 1996-05-21 Nec Corp Testing method for semiconductor memory
JP2006214839A (en) * 2005-02-03 2006-08-17 Fujitsu Ltd Test pattern generation apparatus and test pattern generation method for memory built-in device

Also Published As

Publication number Publication date
JPS5712220B2 (en) 1982-03-09

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