JPH10209192A - Method for molding hollow semiconductor package - Google Patents
Method for molding hollow semiconductor packageInfo
- Publication number
- JPH10209192A JPH10209192A JP2328397A JP2328397A JPH10209192A JP H10209192 A JPH10209192 A JP H10209192A JP 2328397 A JP2328397 A JP 2328397A JP 2328397 A JP2328397 A JP 2328397A JP H10209192 A JPH10209192 A JP H10209192A
- Authority
- JP
- Japan
- Prior art keywords
- molding
- resin
- resin molded
- lead frame
- cavity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000465 moulding Methods 0.000 title claims abstract description 85
- 238000000034 method Methods 0.000 title claims description 24
- 239000004065 semiconductor Substances 0.000 title claims description 22
- 229920005989 resin Polymers 0.000 claims abstract description 114
- 239000011347 resin Substances 0.000 claims abstract description 114
- 230000008878 coupling Effects 0.000 claims description 8
- 238000010168 coupling process Methods 0.000 claims description 8
- 238000005859 coupling reaction Methods 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 4
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- 239000003822 epoxy resin Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 229920001187 thermosetting polymer Polymers 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/16—Making multilayered or multicoloured articles
- B29C45/1671—Making multilayered or multicoloured articles with an insert
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14639—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
- B29C45/14655—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明はCCD、EPROM
等のような光照射窓を有する中空型半導体パッケージの
成形方法に関する。The present invention relates to a CCD and an EPROM.
The present invention relates to a method for molding a hollow semiconductor package having a light irradiation window as described above.
【0002】[0002]
【従来の技術】従来、CCD、EPROM等のような外
部から光を透明な窓を通して半導体に照射する中空型の
半導体パッケージは図7、8に示すような構造を有し、
リードフレーム10に対し、中空形状のパッケージ部1
2を樹脂モールドにより成形し、一体に結合して備え付
けている。このリードフレーム10はセクション毎、そ
の中央部にダイサポート(半導体素子設置箇所)14を
中心にして、その周辺に多数のインナリード16の先端
部18を配設して、中央部の一面側に接続用のボンディ
ングエリア20を形成し、周辺部に多数のアウターリー
ド22を配設したものである。そして、製作時にはリー
ドフレーム10にパッケージ部12を備え付けた後、ダ
イサポート14の接合面にICチップ等の半導体素子2
4を接合し、その素子24の各電極と対応する各インナ
ーリード16の先端部18とをワイヤ26でボンディン
グする。その後、パッケージ部12の開口部28にガラ
ス等の透明板30を取り付けて窓を形成し、ボンディン
グエリア20の付近を封止する。なお、32はダイサポ
ート14より左右に伸びるピンチリードである。2. Description of the Related Art Conventionally, a hollow semiconductor package such as a CCD or an EPROM which irradiates a semiconductor with light from the outside through a transparent window has a structure as shown in FIGS.
For the lead frame 10, the hollow package part 1
2 is molded by a resin mold and integrally provided. This lead frame 10 has a die support (semiconductor element installation location) 14 at the center of each section, and a plurality of tips 18 of inner leads 16 disposed around the center. A bonding area 20 for connection is formed, and a number of outer leads 22 are arranged in a peripheral portion. At the time of manufacture, after the package portion 12 is provided on the lead frame 10, the semiconductor element 2 such as an IC chip is
4 are bonded, and each electrode of the element 24 is bonded to the distal end portion 18 of each corresponding inner lead 16 with a wire 26. Thereafter, a window is formed by attaching a transparent plate 30 made of glass or the like to the opening 28 of the package unit 12, and the vicinity of the bonding area 20 is sealed. Reference numeral 32 denotes a pinch lead extending left and right from the die support 14.
【0003】しかも、上記パッケージ部12の成形時に
は図9に示すように第1、第2の成形型34、36を上
下に配置して備え付けたパッケージ成形用モールド装置
を用い、その両成形型34、36のパーティングライン
面の所定位置にリードフレーム10を配置し、その第1
成形型34のキャビティ部38と第2成形型36のキャ
ビティ部40との内部にそれぞれ溶融樹脂材料を注入充
填する。すると、そのリードフレーム10の上面側にボ
ンディングエリア20付近の外周をリング状に被って突
出する筒状の第1樹脂成形体42を固着し、下面側にそ
の第1樹脂成形体42の外周内に含まれる全領域と相対
する領域の全面を被って突出するブロック状の第2樹脂
成形体44を固着して、その両樹脂成形体42、44に
よりボンディングエリア20付近を露出した中空形状の
パッケージ部12を形成できる。Further, when molding the package section 12, as shown in FIG. 9, a first and second molding dies 34, 36 are used by using a package molding apparatus which is disposed vertically. , 36, the lead frame 10 is arranged at a predetermined position on the parting line surface.
A molten resin material is injected and filled into the cavity portion 38 of the molding die 34 and the cavity portion 40 of the second molding die 36, respectively. Then, a cylindrical first resin molded body 42 is fixed on the upper surface side of the lead frame 10 so as to cover the periphery of the vicinity of the bonding area 20 in a ring shape, and is fixed on the lower surface side of the outer periphery of the first resin molded body 42. A block-shaped second resin molded body 44 projecting over the entire surface of the region opposed to the entire region included in the resin molded body 44 is fixed, and the vicinity of the bonding area 20 is exposed by the two resin molded bodies 42 and 44. The part 12 can be formed.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、このよ
うなパッケージ部12の成形時に樹脂注入を行なうと、
キャビティ部40に注入した溶融樹脂がダイサポート1
4と各インナリード16の先端部18間にある隙間を通
り、矢印方向に流れて第1成形型36とボンディングエ
リア20間に侵入し易い。又、キャビティ部38に注入
した溶融樹脂も第1成形型34と各インナリード16間
にできる隙間を通り、矢印方向に流れて侵入し易いた
め、ダイサポート14と各インナリード16の先端部1
8の付近が上下にばたつき、ボンディングエリア20に
樹脂バリができ易い。何故なら、パッケージ部12の成
形精度を高めるには樹脂注入圧力を非常に大きくしなけ
ればならないが、その注入圧力に比べてボンディングエ
リア20を第1成形型34に密着する力が弱いからであ
る。そして、ボンディングエリア20に樹脂バリが発生
すると、ダイサポート14に対する半導体素子24の接
合とその素子24と各インナーリード16との接続を良
好に行なうことができなくなり、断線事故を招き易い。
それ故、負担の大きな樹脂バリ取り工程を必要とする。However, when resin is injected during the molding of such a package portion 12,
The molten resin injected into the cavity 40 is the die support 1
It flows in the direction of the arrow through the gap between the inner mold 4 and the tip 18 of each inner lead 16, and easily flows between the first mold 36 and the bonding area 20. Further, the molten resin injected into the cavity 38 also flows through the gap formed between the first molding die 34 and each inner lead 16 in the direction of the arrow and easily enters, so that the die support 14 and the distal end 1 of each inner lead 16 are formed.
8 flaps up and down, and resin burrs are easily formed in the bonding area 20. This is because the resin injection pressure must be extremely large in order to increase the molding accuracy of the package portion 12, but the force for adhering the bonding area 20 to the first molding die 34 is weaker than the injection pressure. . If resin burrs are generated in the bonding area 20, it becomes impossible to bond the semiconductor element 24 to the die support 14 and to connect the element 24 to each of the inner leads 16 in a favorable manner, and it is easy to cause a disconnection accident.
Therefore, a burdensome resin deburring step is required.
【0005】本発明はこのような従来の問題点に着目し
てなされたものであり、第1にボンディングエリアに樹
脂バリを発生し難く、製品の精度を高めることのできる
中空型半導体パッケージ成形方法を提供することを目的
とする。又、第2にボンディングエリアに樹脂バリを発
生し難くすると共に、リードフレームにパッケージ部を
強固に結合して、製品の精度を一層高めることのできる
中空型半導体パッケージ成形方法を提供することを目的
とする。The present invention has been made in view of such a conventional problem. First, a method of molding a hollow semiconductor package which is less likely to cause resin burrs in a bonding area and which can improve the precision of a product. The purpose is to provide. Second, it is another object of the present invention to provide a method of forming a hollow semiconductor package, which makes it difficult for resin burrs to be generated in a bonding area and firmly couples a package portion to a lead frame to further improve the accuracy of a product. And
【0006】[0006]
【課題を解決するための手段】上記目的を達成するため
に、本発明の第1目的に対応する中空型半導体パッケー
ジ成形方法では第1、第2の成形型を備えたパッケージ
成形用モールド装置を用い、その両成形型のパーティン
グライン面の所定位置にリードフレームを配置し、キャ
ビティ部内に溶融樹脂材料を注入充填し、そのリードフ
レームの一面側にボンディングエリア付近の外周をリン
グ状に被って突出する筒状の第1樹脂成形体を固着し、
他面側にその第1樹脂成形体の外周内に含まれる全領域
と相対する領域の全面を被って突出するブロック状の第
2樹脂成形体を固着し、その両樹脂成形体によりボンデ
ィングエリア付近を露出した中空形状のパッケージ部を
形成する。In order to achieve the above object, a method of molding a hollow semiconductor package according to a first object of the present invention uses a molding apparatus for molding a package having first and second molds. Using, the lead frame is arranged at a predetermined position on the parting line surface of both molds, the molten resin material is injected and filled in the cavity, and the outer periphery near the bonding area is covered in a ring shape on one side of the lead frame. A first cylindrical resin molded body projecting is fixedly attached,
On the other surface side, a block-shaped second resin molded body that covers and projects over the entire surface of the area opposed to the entire area included in the outer periphery of the first resin molded body is fixed. Is formed to form a hollow package portion.
【0007】そして、上記第1、第2樹脂成形体の成形
工程を別工程とし、先に第1樹脂成形体用のキャビティ
部を有する第1成形型とキャビティ部のない平らなリー
ドフレーム接触面を有する第2成形型とを用いて第1樹
脂成形体を成形し、次に第1樹脂成形体用のキャビティ
部を有する第1成形型と第2樹脂成形体用のキャビティ
部を有する第2成形型とを用いて第2樹脂成形体を成形
する。The first and second resin moldings are formed separately from each other. The first molding die having a cavity for the first resin molding and the flat lead frame contact surface having no cavity are provided. The second resin mold is used to mold the first resin molded body, and then the first mold having a cavity for the first resin molded body and the second mold having a cavity for the second resin molded body. The second resin molded body is molded using a molding die.
【0008】又、第2目的に対応する中空型半導体パッ
ケージ成形方法では第1樹脂成形体を成形する際に、キ
ャビティ部のない平らなリードフレーム接触面を有する
第2成形型に替えて、その第1樹脂成形体と一体に結合
し、リードフレームの他面側に固着する結合用樹脂部成
形用のキャビティ部を有する第2成形型を用いる。In the method of molding a hollow semiconductor package corresponding to the second object, when the first resin molded body is molded, it is replaced with a second molding die having a flat lead frame contact surface without a cavity. A second mold having a cavity for molding a resin part for coupling, which is integrally coupled to the first resin molded body and fixed to the other surface side of the lead frame, is used.
【0009】[0009]
【発明の実施の形態】以下、添付図面に基づいて、本発
明の実施の形態を説明する。図1は本発明を適用した中
空型半導体パッケージ成形方法による第1樹脂成形体成
形工程におけるパッケージ成形用モールド装置の金型内
におけるリードフレームの配置状態を示す要部縦断面図
である。このパッケージ成形用モールド装置には金型と
して上側に従来通りの第1成形型34を用い、下側にキ
ャビティ部のない平らなリードフレーム接触面46を有
する第2成形型48を用いる。そして、成形に際しては
両成形型34、48のパーティングライン面の所定位置
に従来通りのリードフレーム10を配置する。なお、5
0は第1成形型34のキャビティ部38に溶融樹脂材料
を注入するゲートである。Embodiments of the present invention will be described below with reference to the accompanying drawings. FIG. 1 is a longitudinal sectional view of a main part showing an arrangement state of a lead frame in a mold of a package molding apparatus in a first resin molded body molding step by a hollow semiconductor package molding method to which the present invention is applied. This package molding apparatus uses a conventional first molding die 34 as an upper mold and a second molding die 48 having a flat lead frame contact surface 46 without a cavity below. Then, at the time of molding, the conventional lead frame 10 is arranged at a predetermined position on the parting line surface of both molds 34 and 48. In addition, 5
Reference numeral 0 denotes a gate for injecting the molten resin material into the cavity portion 38 of the first molding die 34.
【0010】このように第2成形型48を用いると、金
型を閉じた時に第2成形型48のキャビティ部のない平
らなリードフレーム接触面46で下側からリードフレー
ム10の全体を良好に支えて、第1成形型34のリード
フレーム接触面(下面)52にリードフレーム10のボ
ンディングエリア20を強く密着させて固定できる。そ
れ故、第1成形型34のゲート50から溶融した熱硬化
性樹脂例えばエポキシ樹脂を圧力を非常に大きくしてキ
ャビティ部38に注入しても、その溶融樹脂がボンディ
ングエリア20に侵入することがない。しかも、第2成
形型48にはキャビティ部がなく樹脂注入を行なうこと
もないため、当然第2成形型48からボンディングエリ
ア20に樹脂の侵入がない。When the second mold 48 is used as described above, when the mold is closed, the entire lead frame 10 is satisfactorily removed from below with the flat lead frame contact surface 46 having no cavity of the second mold 48. By supporting, the bonding area 20 of the lead frame 10 can be firmly adhered to the lead frame contact surface (lower surface) 52 of the first molding die 34 and fixed. Therefore, even if a thermosetting resin, such as an epoxy resin, melted from the gate 50 of the first mold 34 is injected into the cavity 38 with a very high pressure, the molten resin may enter the bonding area 20. Absent. In addition, since the second mold 48 does not have a cavity and does not perform resin injection, the resin does not enter the bonding area 20 from the second mold 48 naturally.
【0011】その後金型を開くと、図2に示すような片
側成形した成形品、即ちリードフレーム10の上面側に
ボンディングエリア20付近の外周をリング状に被って
突出する筒状の第1樹脂成形体54を固着した成形品5
6が得られる。そして、この成形品56のボンディング
エリア20には樹脂バリの発生がない。又、成形品56
はリードフレーム10と第1樹脂成形体54との結合が
強固である等結合状態が良好であり、それ等の配置関係
も正確であるため、精度も優れている。Then, when the mold is opened, a one-side molded product as shown in FIG. 2, that is, a cylindrical first resin protruding from the upper surface side of the lead frame 10 by covering the outer periphery near the bonding area 20 in a ring shape. Molded product 5 to which molded body 54 is fixed
6 is obtained. Then, no resin burr is generated in the bonding area 20 of the molded product 56. Also, the molded product 56
Since the connection between the lead frame 10 and the first resin molded body 54 is strong and the equi-joined state is good, and the arrangement relationship between them is accurate, the accuracy is also excellent.
【0012】次に、このような成形品56を両側成形す
るため、従来通りの第1、第2成形型34、36を備え
たパッケージ成形用モールド装置を用い、図3に示すよ
うにその所定箇所に成形品56を配置し金型を閉じる。
そして、第2成形型36のゲート58からキャビティ部
40にやはり溶融した熱硬化性樹脂としてエポキシ樹脂
を注入する。その際、注入圧力を非常に大きくしても溶
融樹脂はボンディングエリア20に侵入することがな
く、キャビティ部40の内部で固化する。何故なら、片
側成形した成形品56はリードフレーム10と第1樹脂
成形体54との結合が強固であり、それ等の配置関係も
正確であるため、樹脂注入中にダイサポート14と各イ
ンナーリード16の先端部18とがばたつくことなく、
第1成形型34のリードフレーム接触面52にボンディ
ングエリア20が強く密着した状態で接触するからであ
る。Next, in order to form such a molded article 56 on both sides, a conventional package molding apparatus having first and second molding dies 34 and 36 is used, and as shown in FIG. The molded product 56 is arranged at the location and the mold is closed.
Then, an epoxy resin is injected from the gate 58 of the second mold 36 into the cavity 40 as a thermosetting resin which has also been melted. At this time, even if the injection pressure is extremely increased, the molten resin does not enter the bonding area 20 and solidifies inside the cavity 40. This is because the one-sided molded product 56 has a strong bond between the lead frame 10 and the first resin molded body 54 and has a precise positional relationship. Without fluttering with the tip 18 of the 16
This is because the bonding area 20 comes into contact with the lead frame contact surface 52 of the first molding die 34 in a state of being in close contact with the lead frame.
【0013】その後金型を開くと、図4に示すような両
側成形した成形品、即ち成形品56のリードフレーム1
0の下面側にその第1樹脂成形体54の外周内に含まれ
る全領域と相対する領域の全面を被って突出する断面台
形ブロック状の第2樹脂成形体60を固着し、リードフ
レーム10に第1、第2樹脂成形体54、60からなる
中空形状のパッケージ部62を備え付けた成形品64が
得られる。そして、この成形品64のボンディングエリ
ア20には樹脂バリの発生がない。又、成形品64でも
リードフレーム10と第2樹脂成形体54との結合が強
固である等結合状態が良好であり、それ等の配置関係も
正確であるため当然精度も優れたものになる。After that, when the mold is opened, a molded product molded on both sides as shown in FIG.
A second resin molded body 60 having a trapezoidal cross section is fixed to the lower surface side of the first resin molded body 54 so as to cover and project over the entire area opposed to the entire area included in the outer periphery of the first resin molded body 54. A molded product 64 provided with a hollow package portion 62 including the first and second resin molded bodies 54 and 60 is obtained. Then, no resin burr is generated in the bonding area 20 of the molded product 64. In the molded product 64, the connection between the lead frame 10 and the second resin molded body 54 is strong and the state of equi-bonding is good, and the positional relationship between them is also accurate, so that the precision is naturally excellent.
【0014】このようにして、パッケージ部62を構成
する第1、第2樹脂成形体54、60の成形工程を別工
程とすると、ボンディングエリア20に発生する樹脂バ
リを皆無或いは非常に少なく抑制できる。それ故、樹脂
バリ除去に関する負担を最小限にして次の工程に移れ
る。そこで、以後従来通りの各工程を踏み、ダイサポー
ト14の接合面にICチップ等の半導体素子を接合し、
その素子の各電極と対応する各インナーリード16の先
端部18とをワイヤボンディングし、それ等の露出して
いるボンディングエリア20の付近を第1樹脂成形体5
4の開口部にガラス板等を嵌めて封止をすると、中空型
半導体パッケージが完成する。As described above, if the molding process of the first and second resin molded bodies 54 and 60 constituting the package portion 62 is a separate process, resin burrs generated in the bonding area 20 can be suppressed to no or very little. . Therefore, it is possible to move to the next step while minimizing the burden on removing resin burrs. Therefore, the semiconductor element such as an IC chip is bonded to the bonding surface of the die support 14 by following the conventional steps.
Each electrode of the element is wire-bonded to the corresponding distal end portion 18 of each inner lead 16, and the vicinity of the exposed bonding area 20 of the first resin molded body 5 is
When a glass plate or the like is fitted into the opening of No. 4 for sealing, a hollow semiconductor package is completed.
【0015】上記実施の形態では第1樹脂成形体54を
成形する際に、第1樹脂成形体用のキャビティ部38を
有する第1成形型34とキャビティ部のない平らなリー
ドフレーム接触面46を有する第2成形型48とを用い
たが、その第2成形型48に替えて、図5に示すような
第2成形型66を用いることもできる。この第2成形型
66ではリードフレーム接触面68に小さな凹所を複数
箇所設けて、そこを小さなキャビティ部72にする。In the above embodiment, when the first resin molded body 54 is molded, the first molding die 34 having the cavity 38 for the first resin molded body and the flat lead frame contact surface 46 having no cavity are formed. Although the second molding die 48 is used, a second molding die 66 as shown in FIG. 5 can be used instead of the second molding die 48. In the second molding die 66, a plurality of small recesses are provided in the lead frame contact surface 68, and these are used as small cavity portions 72.
【0016】それ故、溶融樹脂をキャビティ部38、7
0に注入すると、図6に示すような片側成形した成形
品、即ちリードフレーム10の上面側に第1樹脂成形体
54を固着し、下面側に複数の小さな樹脂部72を固着
して、その第1樹脂成形体54と各樹脂部72とを一体
に結合した成形品74が得られる。そして、第1樹脂成
形体54と各結合用樹脂部72によってリードフレーム
10を挾持し、リードフレーム10と第1樹脂成形体5
4とを一層強固に結合し、それ等の配置関係も更に正確
にして精度を向上させることができる。なお、各結合用
樹脂部72の位置は必ずしも第1樹脂成形体54と相対
する位置に設ける必要がなく、内側方向へ位置を変更す
ることもできる。Therefore, the molten resin is supplied to the cavity portions 38, 7
When the resin is injected into the mold, the one-side molded product as shown in FIG. 6, that is, the first resin molded body 54 is fixed to the upper surface side of the lead frame 10, and a plurality of small resin parts 72 are fixed to the lower surface side. A molded product 74 in which the first resin molded body 54 and the respective resin portions 72 are integrally joined is obtained. Then, the lead frame 10 is sandwiched between the first resin molded body 54 and each of the coupling resin parts 72, and the lead frame 10 and the first resin molded body 5 are sandwiched.
4 can be more firmly connected, and their positional relationship can be made more accurate to improve the accuracy. The position of each coupling resin portion 72 does not necessarily need to be provided at a position facing the first resin molded body 54, and the position can be changed inward.
【0017】[0017]
【発明の効果】以上説明した本発明によれば、請求項1
記載の発明では中空形状のパッケージ部を構成する第
1、第2樹脂成形体の成形工程を別工程とし、先に第1
樹脂成形体用のキャビティ部を有する第1成形型とキャ
ビティ部のない平らなリードフレーム接触面を有する第
2成形型とを用いて、筒状の第1樹脂成形体を成形する
ため、成形時に第1成形型のリードフレーム接触面にリ
ードフレームのボンディングエリアを強く密着させて固
定できる。それ故、第1成形型のキャビティ部に注入す
る溶融樹脂の注入圧力を非常に大きくしても、樹脂がボ
ンディングエリアに侵入することがない。According to the present invention described above, claim 1
In the described invention, the molding process of the first and second resin molded bodies constituting the hollow package portion is a separate process, and
In order to mold a cylindrical first resin molded body by using a first mold having a cavity for a resin molded body and a second mold having a flat lead frame contact surface having no cavity, The bonding area of the lead frame can be firmly adhered to the lead frame contact surface of the first molding die and fixed. Therefore, even if the injection pressure of the molten resin injected into the cavity of the first mold is extremely increased, the resin does not enter the bonding area.
【0018】又、後工程において第1樹脂成形体用のキ
ャビティ部を有する第1成形型と第2樹脂成形体用のキ
ャビティ部を有する第2成形型とを用い、その所定位置
に先の工程において片側成形した成形品を配置すると、
第1成形型のリードフレーム接触面にリードフレームの
ボンディングエリアを強く密着させて固定できる。それ
故、第2成形型のキャビティ部に注入する溶融樹脂の注
入圧力をやはり大きくしても、樹脂がボンディングエリ
アに侵入することがない。従って両側成形した成形品の
ボンディングエリアに樹脂バリが発生せず、リードフレ
ームとパッケージ部との結合が強固となり、それ等の配
置関係も正確になって成形品の精度が向上する。In a subsequent step, a first molding die having a cavity portion for a first resin molded body and a second molding die having a cavity portion for a second resin molded body are used. When placing a molded product on one side in
The bonding area of the lead frame can be firmly adhered to the lead frame contact surface of the first molding die and fixed. Therefore, even if the injection pressure of the molten resin injected into the cavity of the second mold is increased, the resin does not enter the bonding area. Therefore, resin burrs do not occur in the bonding area of the molded product molded on both sides, the connection between the lead frame and the package portion is strengthened, and the arrangement relationship between them is also accurate, and the accuracy of the molded product is improved.
【0019】又、請求項2記載の発明では筒状の第1樹
脂成形体を成形する際、第1樹脂成形体用のキャビティ
部を有する第1成形型とその第1樹脂成形体と一体に結
合し、リードフレームの他面側に固着する結合用樹脂部
成形用のキャビティ部を有する第2成形型とを用いて、
リードフレームの他面側に結合用樹脂部を設けるため、
その第1樹脂成形体と結合用樹脂部によってリードフレ
ームを挾持し、リードフレームと第1樹脂成形体とを一
層強固に結合し、それ等の配置関係も更に正確にして、
片側成形した成形品の精度を向上させることができる。
それ故、両側成形した成形品においてもボンディングエ
リアに樹脂バリが発生せず、リードフレームとパッケー
ジ部との結合が一層強固となり、それ等の配置関係も更
に正確になって成形品の精度が一層向上する。According to the second aspect of the present invention, when the cylindrical first resin molded body is molded, the first molding die having a cavity for the first resin molded body and the first resin molded body are integrally formed. By using a second mold having a cavity for molding a resin part for coupling, which is coupled to and fixed to the other surface side of the lead frame,
To provide a coupling resin part on the other side of the lead frame,
The lead frame is sandwiched between the first resin molded body and the coupling resin portion, and the lead frame and the first resin molded body are more firmly connected to each other.
It is possible to improve the accuracy of a molded product formed on one side.
Therefore, even in a molded product molded on both sides, resin burrs are not generated in the bonding area, the connection between the lead frame and the package portion is further strengthened, and the arrangement relationship thereof is more accurate, and the precision of the molded product is further improved. improves.
【図1】本発明を適用した中空型半導体パッケージ成形
方法による第1樹脂成形体成形工程におけるパッケージ
成形用モールド装置の金型内におけるリードフレームの
配置状態を示す要部縦断面図である。FIG. 1 is a longitudinal sectional view of a main part showing an arrangement state of a lead frame in a mold of a package molding apparatus in a first resin molded body molding step by a hollow semiconductor package molding method to which the present invention is applied.
【図2】同成形工程を経てリードフレームの片側に第1
樹脂成形体を備え付けた片側成形した成形品の縦断面図
である。FIG. 2 shows a first side of the lead frame after the same molding process.
It is a longitudinal cross-sectional view of the one-side molded article provided with the resin molded body.
【図3】同中空型半導体パッケージ成形方法による第2
樹脂成形体成形工程におけるパッケージ成形用モールド
装置の金型内における片側成形した成形品の配置状態を
示す要部縦断面図である。FIG. 3 shows a second example of the hollow semiconductor package molding method.
It is a principal part longitudinal cross-sectional view which shows the arrangement | positioning state of the one-side molded part in the metal mold | die of the package molding mold device in a resin molded object molding process.
【図4】同成形工程を経てリードフレームの片側に第2
樹脂成形体を備え付けてパッケージ部を構成した両側成
形した成形品の縦断面図である。FIG. 4 is a cross-sectional view of a second side of the lead frame after the molding process.
It is a longitudinal cross-sectional view of the molded product which is provided with the resin molded body and is molded on both sides and forms a package portion.
【図5】本発明を適用した他の中空型半導体パッケージ
成形方法による第1樹脂成形体成形工程におけるパッケ
ージ成形用モールド装置の金型内におけるリードフレー
ムの配置状態を示す要部縦断面図である。FIG. 5 is a vertical sectional view of a main part showing an arrangement state of a lead frame in a mold of a package molding apparatus in a first resin molded body molding step by another hollow semiconductor package molding method to which the present invention is applied. .
【図6】同成形工程を経てリードフレームの片側に第1
樹脂成形体を備え付け、他側に結合用樹脂部を設けた片
側成形した成形品の縦断面図である。FIG. 6 is a view showing a state in which a first side of a lead frame is formed through the same molding process;
It is a longitudinal cross-sectional view of the molded article which was provided with the resin molded body and was molded on one side and provided with a coupling resin portion on the other side.
【図7】中空型半導体パッケージの1例を示す平面図で
ある。FIG. 7 is a plan view showing an example of a hollow semiconductor package.
【図8】図7のA−A断面図である。FIG. 8 is a sectional view taken along line AA of FIG. 7;
【図9】従来の中空型半導体パッケージ成形方法による
成形時におけるパッケージ成形用モールド装置の金型内
に配置したリードフレームのボンディングエリアに侵入
する溶融樹脂の流れを示す要部縦断面図である。FIG. 9 is a vertical cross-sectional view of a main part showing a flow of a molten resin that enters a bonding area of a lead frame arranged in a mold of a package molding apparatus during molding by a conventional hollow semiconductor package molding method.
10…リードフレーム 14…ダイサポート 16…イ
ンナーリード 18…先端部 20…ボンディングエリ
ア 22…アウターリード 34…第1成形型 36、48、66…第2成形型 38、40、70…キ
ャビティ部 46、52、68…リードフレーム接触面
50、58…ゲート 54…第1樹脂成形体 56、74…片側成形した成形品 60…第2樹脂成形
体 62…パッケージ部 64…両側成形した成形品 72…結合用樹脂部DESCRIPTION OF SYMBOLS 10 ... Lead frame 14 ... Die support 16 ... Inner lead 18 ... Tip part 20 ... Bonding area 22 ... Outer lead 34 ... 1st shaping | molding die 36,48,66 ... 2nd shaping | molding die 38,40,70 ... Cavity part 46, 52, 68 ... Lead frame contact surface 50, 58 ... Gate 54 ... First resin molded body 56, 74 ... One-side molded product 60 ... Second resin molded product 62 ... Package part 64 ... Both-side molded product 72 ... Joining Resin part
Claims (2)
成形用モールド装置を用い、その両成形型のパーティン
グライン面の所定位置にリードフレームを配置し、キャ
ビティ部内に溶融樹脂材料を注入充填し、そのリードフ
レームの一面側にボンディングエリア付近の外周をリン
グ状に被って突出する筒状の第1樹脂成形体を固着し、
他面側にその第1樹脂成形体の外周内に含まれる全領域
と相対する領域の全面を被って突出するブロック状の第
2樹脂成形体を固着し、その両樹脂成形体によりボンデ
ィングエリア付近を露出した中空形状のパッケージ部を
形成する中空型半導体パッケージ成形方法において、上
記第1、第2樹脂成形体の成形工程を別工程とし、先に
第1樹脂成形体用のキャビティ部を有する第1成形型と
キャビティ部のない平らなリードフレーム接触面を有す
る第2成形型とを用いて第1樹脂成形体を成形し、次に
第1樹脂成形体用のキャビティ部を有する第1成形型と
第2樹脂成形体用のキャビティ部を有する第2成形型と
を用いて第2樹脂成形体を成形することを特徴とする中
空型半導体パッケージ成形方法。1. A lead frame is arranged at a predetermined position on a parting line surface of both molds using a package molding mold device having first and second molds, and a molten resin material is filled in a cavity portion. Injecting and filling, a cylindrical first resin molded body is fixed to one surface side of the lead frame so as to cover the outer periphery near the bonding area in a ring shape and protrude,
On the other surface side, a block-shaped second resin molded body that covers and projects over the entire surface of the area opposed to the entire area included in the outer periphery of the first resin molded body is fixed. In the method of molding a hollow semiconductor package for forming a hollow-shaped package portion exposing the first and second resin molded products, the molding process of the first and second resin molded products is performed separately, and the first and second resin molded products have a cavity portion for the first resin molded product. A first resin molding is molded using a molding die and a second molding die having a flat lead frame contact surface without a cavity, and then a first molding die having a cavity for the first resin molding. A method of molding a hollow semiconductor package, comprising molding a second resin molded body using a second mold having a cavity for the second resin molded body.
ティ部のない平らなリードフレーム接触面を有する第2
成形型に替えて、その第1樹脂成形体と一体に結合し、
リードフレームの他面側に固着する結合用樹脂部成形用
のキャビティ部を有する第2成形型を用いることを特徴
とする請求項1記載の中空型半導体パッケージ成形方
法。2. A method for molding a first resin molded body, comprising: forming a second lead having a flat lead frame contact surface without a cavity;
Instead of a molding die, it is integrated with the first resin molded body,
2. The method of molding a hollow semiconductor package according to claim 1, wherein a second molding die having a cavity portion for molding a coupling resin portion fixed to the other surface side of the lead frame is used.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2328397A JPH10209192A (en) | 1997-01-21 | 1997-01-21 | Method for molding hollow semiconductor package |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2328397A JPH10209192A (en) | 1997-01-21 | 1997-01-21 | Method for molding hollow semiconductor package |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH10209192A true JPH10209192A (en) | 1998-08-07 |
Family
ID=12106286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2328397A Pending JPH10209192A (en) | 1997-01-21 | 1997-01-21 | Method for molding hollow semiconductor package |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH10209192A (en) |
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---|---|---|---|---|
JP2001144523A (en) * | 1999-10-08 | 2001-05-25 | Nokia Mobile Phones Ltd | Antenna assembly and its manufacturing method |
EP3000579A1 (en) * | 2014-09-29 | 2016-03-30 | Nichia Corporation | Method for manufacturing package, method for manufacturing light emitting device, package and light emitting device |
JP2017107989A (en) * | 2015-12-09 | 2017-06-15 | 日亜化学工業株式会社 | Package manufacturing method, light emitting device manufacturing method, package, and light emitting device |
JP2017107965A (en) * | 2015-12-09 | 2017-06-15 | 日亜化学工業株式会社 | Package manufacturing method, light emitting device manufacturing method, package, and light emitting device |
-
1997
- 1997-01-21 JP JP2328397A patent/JPH10209192A/en active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001144523A (en) * | 1999-10-08 | 2001-05-25 | Nokia Mobile Phones Ltd | Antenna assembly and its manufacturing method |
EP3000579A1 (en) * | 2014-09-29 | 2016-03-30 | Nichia Corporation | Method for manufacturing package, method for manufacturing light emitting device, package and light emitting device |
CN105470206A (en) * | 2014-09-29 | 2016-04-06 | 日亚化学工业株式会社 | Method for manufacturing package, method for manufacturing light emitting device, package and light emitting device |
US9640743B2 (en) | 2014-09-29 | 2017-05-02 | Nichia Corporation | Method for manufacturing package, method for manufacturing light emitting device, package and light emitting device |
EP3511147A1 (en) * | 2014-09-29 | 2019-07-17 | Nichia Corporation | Method for manufacturing package, method for manufacturing light emitting device, package and light emitting device |
US10505090B2 (en) | 2014-09-29 | 2019-12-10 | Nichia Corporation | Package including lead component having recess |
US11043623B2 (en) | 2014-09-29 | 2021-06-22 | Nichia Corporation | Package including lead component having recess |
JP2017107989A (en) * | 2015-12-09 | 2017-06-15 | 日亜化学工業株式会社 | Package manufacturing method, light emitting device manufacturing method, package, and light emitting device |
JP2017107965A (en) * | 2015-12-09 | 2017-06-15 | 日亜化学工業株式会社 | Package manufacturing method, light emitting device manufacturing method, package, and light emitting device |
US10079332B2 (en) | 2015-12-09 | 2018-09-18 | Nichia Corporation | Package manufacturing method, light emitting device manufacturing method, package, and light emitting device |
US10490705B2 (en) | 2015-12-09 | 2019-11-26 | Nichia Corporation | Package and light emitting device |
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