JPH09325095A - Auto-sampler - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an auto-sampler in which uselessness due to left-out sample and wrong placement is eliminated by testing, in advance, whether the sample is actually placed at each recessed part set by a program. SOLUTION: A sample inspection drive part 7 make a sample holding part 15 sequentially hold and replace, without delay, a sample at each recessed part 13 set by a program in a program setting part 1, and if the sample holding part 15 fails to hold the sample at each recessed part 13, a sample detector 5 detects that, and error is displayed on a display 2 by an error display part 6.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an autosampler for automatically and sequentially supplying a sample to a processing device such as a thermal analysis device.

[0002]

2. Description of the Related Art An example of an autosampler for supplying a sample to a thermal analysis device is shown in FIG. This auto sampler 1
In the case of No. 1, the samples placed on the tray 12 are gripped one by one by the sample gripper 15 at the tip of the arm 14, conveyed to the thermal analysis device 16 arranged on the side, and supplied in order. As shown in FIG. 6, the tray 12 is formed by forming a large number of recesses 13 as mounting portions on the surface of a rectangular metal plate, and a sample (not shown) is placed in each of these recesses 13. Although not shown here, each recess 13 of the tray 12 is provided with an identification number. In the case of a solid, the sample is crushed into powder or granules, and is usually housed in a container (referred to as a cell or pan) made of ceramics or platinum and placed in the recess 13. Then, the sample gripper 15 grips and transports the sample together with the container.

The autosampler 11 shown in FIG. 5 shows the sample gripper 15 performing three-axis operation in a cylindrical coordinate system. Therefore, the sample gripping portion 15 can rotate about the base of the arm 14, expand and contract in the longitudinal direction of the arm 14, and move up and down along the central axis of rotation. When the sample is supplied to the thermal analysis device 16, the autosampler 11 first moves the sample holding part 15 onto the designated recess 13 of the tray 12 by rotating and expanding and contracting. Next, the sample gripping part 15 is lowered to form the recess 1
The sample placed on 3 is gripped. Then, the sample gripper 15 is lifted and then moved to the thermal analysis device 16 by the rotation and expansion / contraction operations to convey the sample. When the thermal analysis process is completed, the sample is taken out of the thermal analyzer 16 and returned to the original recess 13 by the same operation of the sample holding unit 15. Since the thermal analysis device 16 normally uses two types of samples, one for measurement and one for reference, each time the thermal analysis process is performed once, two concave portions 1 of the tray 12 are used.
These two types of samples will be supplied from No. 3. Then, the autosampler 11 sequentially repeats these supply operations to sequentially supply a large number of samples placed in the recesses 13 of the tray 12 to the thermal analysis device 16 and continuously perform a plurality of thermal analysis processes. Can be run.

The above-mentioned autosampler 11 sets a sample to be subjected to thermal analysis processing in a program in advance,
A plurality of thermal analysis processes are automatically and continuously executed. The program setting unit 1 shown in FIG. 7 sets the program. The program setting unit 1 is composed of software executed by a computer built in the auto sampler 11 or a personal computer (not shown) connected to the auto sampler 11. The program setting unit 1 displays a program setting screen on the display 2 and the operator This program is set according to the input from the input device 3 by. In the setting of the program, the execution order of a plurality of thermal analysis processes is set, and the concave portion 1 of the tray 12 on which the measurement sample or reference sample used in each of these thermal analysis processes is placed.
Set number 3.

When the setting of the program is completed, the program setting section 1 first sends to the sample supply driving section 4 the number of the concave portion 13 in which the measurement and reference samples used for the first thermal analysis process are placed. Then, the sample supply driving unit 4 causes the sample holding unit 15 to perform the above-mentioned supply operation, and sequentially takes out the samples placed in the recesses 13 having these numbers and conveys them to the thermal analysis device 16, and After the analysis process is completed, these samples are returned to the original recesses 13. Further, when the sample is returned to the original recess 13 in this way, the program setting unit 1 sends the number of the recess 13 on which the sample used for the next thermal analysis process is placed to the sample supply driving unit 4, and thereafter the program These operations are sequentially repeated until all the thermal analysis processes set in step 1 are completed.

The sample holding section 15 is usually provided with a sample detector 5. The sample detector 5 is the sample gripper 1
5 is a detector for detecting whether or not the sample can be actually gripped by the opening degree of the pin when the operation of gripping the sample by sandwiching it with the pin or the like is executed. Then, when there is no sample in the recessed portion 13 of the set number, or when the sample gripping portion 15 misses the sample and removes it,
The sample detector 5 detects a failure in gripping the sample and sends an error signal to the error display section 6. Then, the error display section 6
Displays on the display 2 which thermal analysis process failed to grip the sample in which concave portion 13, and stops the thermal analysis process. Therefore, the operator can know the failure of the thermal analysis process by looking at this error display, and can take appropriate measures such as re-execution of the process.

[0007]

However, in the conventional auto sampler 11 described above, the operator is required to use the display 2
While visually observing the setting contents of the program displayed in, the tray 1 for measurement and reference samples used in each thermal analysis process is displayed.
They must be placed in the set numbered recesses 13 in 2 respectively. Therefore, conventionally, it is necessary to compare the set number on the program and the number given to the concave portion 13 of the tray 12 for each thermal analysis process one by one, so that it is easy to misplace the sample. was there. Also, especially when a large number of thermal analysis processes are set,
Since the number of samples to be placed is large, not only is this sample more likely to be misplaced, but the display 2
While following the setting contents of the program displayed in,
For example, there is a problem in that the sample may be left behind due to an error such as overlooking the thermal analysis process once during the process.

[0008] One thermal analysis process requires about 30 minutes at the earliest, and may take several hours depending on the process. Since these thermal analysis processes are automatically and continuously performed unattended, if the sample is misplaced or misplaced as described above, an error will be discovered after a long time and the sample will be used. The thermal analysis process that had been performed must be redone, and a long time is wasted. Further, in some cases, a series of thermal analysis processes set in the program may have to be redone due to misplacement of one sample, etc., and thus a longer time may be wasted. The above circumstances are not limited to the autosampler used for the thermal analysis processing, but are common to the autosampler that supplies the sample to some processing apparatus.

The present invention has been made in view of such circumstances, and forgets or leaves the sample by inspecting in advance whether the sample is actually placed on the placing part set in the program. The purpose is to provide an autosampler that can eliminate waste caused by mistakes.

[0010]

The invention according to claim 1 detects whether or not a sample is actually mounted on each mounting portion where the sample should be mounted by setting a program, and the sample is detected. By taking warning measures to the operator when the sample is not placed, the operator can know in advance the misplacement of the sample or the misplacement of the placing part, and correct it before executing a series of processing. To be able to

Further, the invention of claim 2 relates to each of the mounting portions on which the sample should be mounted by setting the program,
The sample gripper holds the sample once and then returns it to the processing device again without supplying it to the processing unit in order to detect whether or not the sample was actually gripped at each of these mounting parts, and then the sample can be gripped. If it does not exist, the operator can be alerted to the operator in advance to detect any misplacement of the sample or misplacement of the mounting part, and a series of processing can be performed with a slight addition to the control software of the autosampler. To be able to fix this before running.

[0012]

Embodiments of the present invention will be described below with reference to the drawings. 1 to 4 show an embodiment of the present invention, FIG. 1 is a block diagram showing a configuration of a control unit of an autosampler, FIG. 2 is a diagram showing a setting screen of a program displayed on a display, 3 is a plan view of the tray, and FIG. 4 is a perspective view of the turntable. In addition,
Constituent members having the same functions as those of the conventional example shown in FIGS.

In this embodiment, an autosampler 11 having a structure similar to that shown in FIG. 5 will be described. In addition,
In this autosampler 11, the sample holding unit 15 performs three-axis operation in a cylindrical coordinate system, but may operate in another coordinate system such as a rectangular coordinate system. Further, the autosampler 11 is for supplying the sample to the thermal analysis device 16, but the present invention is not limited to this, and may be for supplying the sample to a processing device that performs some other processing. It can be implemented similarly. In the auto sampler 11 of this embodiment, the program setting unit 1 shown in FIG. 1 sets a program. The program setting unit 1 displays a “program setting” screen as shown in FIG. 2 on the display 2, and sets the program according to an operator's input from the input device 3 such as a mouse or a keyboard. It should be noted that, like the conventional example of FIG. 7, the program setting unit 1 is also configured by software executed by a computer built in the auto sampler 11 or a personal computer (not shown) connected to the auto sampler 11. You can Further, here, as the software of the program setting unit 1, an application executed on the window system is used.

In the "program setting" screen of FIG. 2, each line of the list display frame 21 shows the setting of the thermal analysis process of each step. The numbers "1" to "11" in the leftmost column 22 of each row indicate the number of steps of the thermal analysis process, and the numbers are executed in ascending order. When the thermal analysis process to be processed exceeds 11 steps, the line in the list display frame 21 is scrolled by the scroll bar 23 to set the thermal analysis process with a larger number of steps (for example, up to 99 steps). You can However, in FIG.
The case where the steps are set is shown below.

[Measurement condition] column 24 of the list display frame 21
Is a column for setting measurement conditions for each thermal analysis process. When the "measurement condition" button 25 is clicked (the mouse button is pressed), a new window can be opened to determine the measurement condition such as the temperature process of the thermal analysis process and the introduction of gas. Then, by entering the identification number of the measurement condition defined here in the "measurement condition" column 24, the measurement condition can be set for each thermal analysis process in each step. “003” illustrated in the “Measurement condition” column 24 is the identification number of the measurement condition, and “96/2/22” indicates the creation date of the measurement condition. In FIG. 2, all steps of the thermal analysis process are set to the same measurement condition with the identification number “003”, but it goes without saying that different measurement conditions can be set. The “file information” column 26 of the list display frame 21 is a column for setting a file name for outputting the data of the processing result of the thermal analysis process. The “automatic file name” here means that the system automatically Indicates that a unique file name should be created and output. Also,
By clicking the "File Information" button 27, a new window can be opened and various information to be included in this output file can be set.

The "sample" column 28 of the list display frame 21 is a column for setting a sample for measurement used in the thermal analysis process of each step, and is provided in the recess 13 of the tray 12 on which the sample for measurement is placed. Enter the number. Further, the “reference” column 29 is
This is a column for setting a reference sample used in the thermal analysis process of each step, and the number of the concave portion 13 on which the reference sample is placed is entered. Enter the numbers in these fields 28 and 29
This is done by selecting a number in the "cell setting" box 30 and clicking the "set" button.

As shown in FIG. 3, the tray 12 is provided with different consecutive numbers for each recess 13. Then, in the “sample” column 28 and the “reference” column 29, by entering the number given to the concave portion 13, the concave portion 1
3. Set the sample to be placed on 3. For example, in FIG. 2, the first
In the thermal analysis process of the step and the second step, the sample placed in the recess 13 having the same number 1 is set for measurement. Further, in the thermal analysis processing from the first step to the third step, the sample placed in the concave portion 13 numbered with the same number 85 is set as a reference.
However, in the thermal analysis process of the third step, the sample placed in the concave portion 13 numbered 2 is set for measurement. In the thermal analysis processing from the fourth step to the sixth step, the samples placed in the recesses 13 with different numbers are set for measurement and reference.

Here, in order to easily distinguish the measurement sample and the reference sample, the tray 12 is used for the measurement sample.
The concave portions 13 having the lowest number are used in order, and the reference samples are used in the order from the concave portion 13 having the old number. However, these samples do not necessarily have to be placed in the recessed portions 13 having consecutive numbers, but the setting of sample No. 5 for measurement in the thermal analysis process of the fifth step and the measurement in the thermal analysis process of the sixth step And sample of 8 for reference
Recessed part 1 with some numbers skipped, like the setting of No. 80 and No. 80
3 may be mounted. Further, in general, even when a larger number of steps are set, all the concave portions 1 of the tray 12 are
The sample is rarely placed on the sample No. 3, and in many cases, the sample is placed sparsely in a toothless manner. The thermal analysis process of the first step and the second step means that the same thermal analysis process is repeated twice by setting the same measurement condition for the same sample.

To delete the thermal analysis process at any step in the list display frame 21, the "delete line" button 31 is used. However, if you want to save the settings themselves and temporarily skip the execution of the thermal analysis processing, you can enter the "x" mark in the "Execution" column 32 of this row. When inserting another thermal analysis process before any step, the “insert row” button 33 is used. Further, when deleting all the settings and starting new settings again, the "clear all" button 34 is clicked.

When the setting of the above-mentioned program is completed, the thermal analysis process of each step can be sequentially executed by clicking the "start measurement" button 35. That is, when the execution of the thermal analysis process is started, the program setting unit 1 shown in FIG. 1 first sets the measurement sample number “1” set in the thermal analysis process of the first step to the sample supply driving unit. Send to 4. Then, the sample supply driving unit 4 holds the sample placed in the first recess 13 of the tray 12 with the sample holding unit 15 and conveys the sample to the thermal analyzer 16. In addition, by sending the reference sample number “85” set in the thermal analysis process of the first step to the sample supply driving unit 4,
The sample placed in the 85th recess 13 is attached to the sample gripping portion 15
It is gripped by and conveyed to the thermal analysis device 16. Then, when the thermal analysis processing of the first step is completed in the thermal analysis device 16, these samples are returned to the original concave portions 13 in order, and thereafter, all the thermal analysis processings of the second step to the sixth step are performed in the same manner. These operations are repeated until it is completed.

Further, when the operation by the sample supply driving section 4 is executed, the sample is not placed in the recess 13 having the number set by the program, or the sample holding section 15 is used.
In the case where the sample is caught by the sample and is removed, the sample detector 5 provided in the sample holding section 15 detects the failure of the sample holding and sends an error signal to the error display section 6. Then, the error display unit 6 displays on the display 2 which number of the concave portion 13 the sample was missed in during the thermal analysis process, and the thermal analysis process is stopped. Therefore, the operator can know the failure of the thermal analysis process by looking at this error display, and can take appropriate measures such as re-execution of the process. The “state” column 36 of the list display frame 21 shown in FIG. 2 is a column for displaying the step currently being processed or the step for which the process has been completed during execution of the thermal analysis process. Also, "Close" button 3
Clicking 7 cancels the setting operation of this program.

The configuration described above is exactly the same as that of the conventional autosampler 11 shown in FIG. But,
Unlike the conventional example, the autosampler 11 of the present embodiment includes the sample inspection drive unit 7 shown in FIG. Like the sample supply drive unit 4, the sample inspection drive unit 7 receives information from the program setting unit 1 and drives and controls the sample holding unit 15. However, the sample supply drive unit 4 is activated when the “measurement start” button 35 shown in FIG. 2 is clicked, but the sample inspection drive unit 7 is activated when the “test execution” button 38 is clicked. To be done. Further, when the sample number is sent from the program setting unit 1 shown in FIG. 1, the sample inspection drive unit 7 has the recess 13 of this number.
The sample mounted on the sample is once held by the sample holding section 15,
The original concave portion 1 is immediately transferred to the thermal analysis device 16 without being conveyed.
The operation of returning to 3 is performed. At this time, it goes without saying that the thermal analysis device 16 does not execute the thermal analysis process.

When the "test execution" button 38 is clicked, the program setting unit 1 first sends the sample inspection drive unit 7 the measurement sample number "1" set in the thermal analysis process of the first step. . Then, the sample inspection drive unit 7
The sample placed on the second concave portion 13 is once held by the sample holding portion 15 and then immediately returned to the original concave portion 13. Further, the program setting unit 1 then sends the sample inspection drive unit 7 the reference sample number “85” set in the thermal analysis process of the first step. Then, the sample inspection drive unit 7 once holds the sample placed in the 85th recess 13 with the sample holding unit 15 and immediately returns it to the original recess 13. Then, the program setting section 1 successively sends the numbers of the measurement and reference samples set in the respective thermal analysis processes from the second step to the sixth step, and the sample inspection drive section 7 is accordingly sent.
Repeats the operation of sequentially holding the samples placed in the recesses 13 having these numbers by the sample holding part 15 and immediately returning them to the original recesses 13. Since the autosampler 11 of the present embodiment configures a series of operations of gripping the sample by the sample gripping portion 15 and moving it upward as one step of control, the sample inspection driving section 7 actually After the sample is gripped by the sample gripper 15 to be lifted, the sample is gripped again to release the grip.

Also, when the test operation by the sample inspection drive unit 7 is executed, the sample is forgotten to be placed in the recess 13 having the number set in the program, or the sample is mistakenly placed in the recess 13 having another number. When the sample is placed, the sample detector 5 detects a failure in gripping the sample and sends an error signal to the error display unit 6. Then, the error display unit 6 displays on the display 2 which number of the concave portion 13 the sample was missed in during the thermal analysis process of which step, and stops this test operation. Therefore, the operator can check the error display and confirm the mistake before executing the thermal analysis process. Also, in the case where the sample is placed in the recess 13 having the number set in the program, but the sample holding part 15 fails to hold the sample because the mounting state is bad or the container shape is inappropriate. , It is possible to detect this in advance and take appropriate measures. Moreover, this test operation is completed in an extremely short time because the thermal analysis process that requires a long time is not executed, and the operator hardly takes unnecessary time.

The sample is placed in each recess 13 of the tray 12 shown in FIG. 3 as described above. At this time, if the thermal analysis processing of a large number of steps is set in the program, the number of samples to be mounted also increases, so that misplacement is particularly likely to occur.
Further, when the program is modified many times, the sample to be placed is not always placed in the recessed portions 13 having consecutive numbers in the step order, and the sample is placed in a toothless shape or the recessed portions having completely different numbers. Since it is often placed on 13,
Even in this case, misplacement is likely to occur. Not only one sample is left alone, but when the samples are placed one after another, for example, when the numbers are shifted, the sample no longer exists in any of the recesses 13 with the numbers set in the program. . And in these cases, an error can be detected by the above test. However, when the two samples are replaced and placed, since the sample exists in the recess 13 of any number, the above test cannot detect an error. However, it is extremely rare that the two samples are misplaced at the same time and in the same manner.

As described above, according to the autosampler 11 of the present embodiment, the test by the sample inspection drive unit 7 is executed before the thermal analysis process is actually executed, so that the sample is misplaced in advance. Since the operator can know the error and the like from the error display on the display 2, it is possible to eliminate the waste of performing the process again after executing the thermal analysis process that requires a long time. Moreover, since the sample inspection drive unit 7 only executes the control operation of the sample holding unit 15 by the sample supply drive unit 4 by partially omitting it,
It can be easily implemented by adding simple control software to the autosampler 11.

In the above embodiment, the case where the concave portion 13 is formed in the tray 12 which is detachably attached to the auto sampler 11 has been described. For example, as shown in FIG. The recess 13 may be formed on the circumference of the turntable 17, or the recess 13 may be formed on any other member. Further, the concave portion 13 is not limited to a concave recess, and may have any configuration as long as it is a mounting portion capable of positioning and mounting the sample.

Further, in the above-described embodiment, even when a sample placement error is found by the test operation of the sample inspection drive unit 7, the same error display unit 6 as in the case of the thermal analysis process of the sample supply drive unit 4 is used. Although the error is displayed and the operation is stopped by the above, it is not always necessary to stop the test operation on the way, and the error list may be displayed after all the steps are completed. Further, as long as it is a warning measure for notifying the operator of the sample placement error, other arbitrary measures may be taken instead of the error display by the error display unit 6.

Further, in the above-mentioned embodiment, the sample holding section 1
Although the sample is actually gripped in 5 and the sample is detected by the sample detector 5, for example, if a sensor for detecting the presence or absence of the sample is provided in the sample gripping portion 15 in a non-contact manner, the sample inspection driving unit 7 Only by moving the sample gripper 15 above each recess 13, it is possible to detect that no sample is present in each recess 13 set in the program. Further, if an optical sensor or the like for detecting the presence or absence of a sample is provided in each recess 13 of the tray 12, the sample inspection drive unit 7 does not operate the sample holding unit 15 and only checks the detection result of each optical sensor or the like. Then, each recess 13 set in the program
It is possible to detect the absence of sample in the. However, in this case, it is necessary to provide as many optical sensors as the number of the recesses 13. Further, in these cases, it was detected whether or not the sample exists only in each recess 13 set in the program, but if the presence or absence of the sample in all the recesses 13 is detected and compared with the setting of the program, It also becomes possible to detect a mistake that the sample is meaningless in the recess 13 which is not set in the program.

[0030]

As is apparent from the above description, according to the autosampler of the present invention, a warning measure is taken when a sample is not placed on each placing part set by the program, so the operator With, it is possible to know in advance whether or not the sample has been misplaced, and it is possible to eliminate the waste of re-processing. Further, by simply adding simple control software for performing only the sample gripping operation at the sample gripping portion, it becomes possible to inspect the sample for misplacement or misplacement.

[Brief description of drawings]

FIG. 1 shows an embodiment of the present invention and is a block diagram showing a configuration of a control unit of an autosampler.

FIG. 2 shows an embodiment of the present invention and is a diagram showing a program setting screen displayed on a display.

FIG. 3 is a plan view of the tray according to the embodiment of the present invention.

FIG. 4 shows an embodiment of the present invention and is a perspective view of a turntable.

FIG. 5 is an overall perspective view showing a configuration of an autosampler.

FIG. 6 is a perspective view of a tray installed in the auto sampler.

FIG. 7 shows a conventional example and is a block diagram showing a configuration of a control unit of an autosampler.

[Explanation of symbols]

 1 Program setting section 2 Display 5 Sample detector 6 Error display section 7 Sample inspection drive section 11 Autosampler 13 Recessed section 15 Sample gripping section 38 "Test execution" button

Claims (2)

[Claims] 1. An autosampler having a plurality of mounting portions for mounting a sample, wherein the sample is taken out from the mounting portion and supplied to a processing apparatus in accordance with a program setting, and the sample is mounted on the mounting portion. Sample detecting means for detecting whether or not the sample is placed, and sample placement determining means for making an error determination when the sample detecting means does not detect the placement of the sample with respect to each of the placement parts where the sample is to be placed by the setting of the program. And an alarm means for taking a warning measure for each of the mounting portions when the sample placement determining means makes an error determination. 2. An autosampler in which a plurality of mounting parts for mounting a sample are formed, and the sample gripping part grips the sample of each of these mounting parts according to the setting of the program and conveys it to the processing apparatus. When the gripper grips the sample on the mounting part, the sample detection means for detecting whether or not the sample can be gripped, and each mounting part on which the sample should be mounted by the setting of the program. Sample gripping inspecting means for sequentially performing the operation of once gripping the sample of the sample by the sample gripping part and returning it to the original mounting part again, and when this sample gripping inspecting means grips the sample at each mounting part, An automatic sampler, which is provided with a warning means for taking a warning measure for each mounting part when the sample detection means detects that the sample cannot be gripped.