JPH06503687A - ハンダ・メッキした回路トレースに対するハンダ・バンプ相互接続部を形成する方法 - Google Patents
ハンダ・メッキした回路トレースに対するハンダ・バンプ相互接続部を形成する方法Info
- Publication number
- JPH06503687A JPH06503687A JP5506893A JP50689393A JPH06503687A JP H06503687 A JPH06503687 A JP H06503687A JP 5506893 A JP5506893 A JP 5506893A JP 50689393 A JP50689393 A JP 50689393A JP H06503687 A JPH06503687 A JP H06503687A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- bumps
- alloy
- board
- plated surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
- B23K31/02—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to soldering or welding
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
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- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims (10)
- 1.複数のハンダ・バンプ相互接続部によりプリント回路基板に付着された集積 回路部品によって構成されるマイクロエレクトロニクス部品パッケージを形成す る方法であって: 誘電性基板に固着されたハンダ濡れ性を持つ金属トレースによって構成されるプ リント回路基板を作成する段階であって、前記トレースはそれぞれが端子パッド とパッドに接続されたランナ部とによって構成される複数の端子によって構成さ れ、前記トレースは、端子の上にあり、前記の各パッドから隣接するランナ部ま で連続的に延在するハンダ・メッキ面によってさらに構成され、前記ハンダ・メ ッキ面は、ある融点温度を有する第1ハンダ合金で構成される、プリント回路基 板を作成する段階;複数のハンダ・バンプを部品の表面に付着する段階であって 、前記バンプが前記第1ハンダ合金とは組成的に異なり、第1ハンダ合金の融点 温度よりも高い融点温度を有する第2ハンダ合金で構成される複数のハンダ・バ ンプを付着する段階; 前記バンプが端子パッド上でハンダ・メッキ面に接する上うに、前記部品を前記 基板に重ね合わせて、アセンブリを形成する段階; アセンブリを第1ハンダ合金の融点温度よりは高く、第2ハンダ合金の融点温度 よりは低い温度まで、バンプに隣接するハンダ・メッキ面を溶融するのに充分な 時間加熱する段階;および ハンダ合金を冷却して再固化させて、部品を基板に接着する複数のハンダ・バン プ相互接続部を形成する段階;によって構成されることを特徴とする方法。
- 2.ハンダ・メッキ面が、約35ないし45重量パーセントが鉛で残部が実質的 にスズである構成の近共晶スズー鉛合金で形成される請求項1記載の方法。
- 3.ハンダ・バンプが、少なくとも約90重量パーセントの鉛を合むスズー鉛合 金で形成される請求項1記載の方法。
- 4.複数のハンダ・バンプ相互接続部によりプリント回路基板に付着された集積 回路部品によって構成されるマイクロエレクトロニクス部品パッケージを形成す る方法であって: 誘電性基板に固着されたハンダ濡れ性を持つ金属トレースによって構成されるプ リント回路基板を作成する段階であって、前記トレースはそれぞれが前記ハンダ ・バンプ相互接続部を接着するための端子パッドとパッドに接続され、部品によ る処理のために相互接続部との間で電気信号を伝えるランナ部とによって構成さ れる複数の端子によって構成され、前記トレースが、端子の上にあり、前記の各 パッドから隣接するランナ部まで連続的に延在し、ある融点温度を有する第1ス ズー鉛ハンダ合金で構成される、ハンダメッキ面によってさらに構成されるプリ ント回路基板を作成する段階; 複数のハンダ・バンブを部品の全体が平坦な表面に付着する段階であって、前記 部品バンプが前記第1ハンダ合金とは組成が異なり、第1ハンダ合金の融点温度 よりも高い融点温度を有する第2スズー鉛ハンダ合金で構成される複数のハンダ ・バンプを付着する段階であって、前記ハンダ・バンブが基板の端子パッド上に 重ね合わせることができる配列に配置された第1群と、前記端子パッドを避ける 配列に配置された第2群とを含むハンダ・バンプを付着する段階; 前記第1群のバンプが端子パッド上でハンダ・メッキ面に接し、前記第2群のバ ンプが前記パッドから離れた基板の上にあるように、前記部品を前記基板に重ね 合わせて、アセンブリを形成する段階; アセンブリを第1ハンダ合金の融点温度よりは高く、第2ハンダ合金の融点温度 よりは低い温度まで、バンプに隣接するハンダ・メッキ面を溶融するのに充分な 時間加熱して、第1群のバンプと接する液体ハンダ相を形成して、それにより前 記第1群のバンプが部分的に液相内に溶解し、前部部品を前記基板に向かって下 げて、その後で第2群のバンブが基板と噛み合って、基板から離れた位置に部品 を支持する段階;および ハンダ相を冷却して再固化させて、部品を基板に接着する複数のハンダ・バンプ 相互接続部を形成する段階;によって構成されることを特徴とする方法。
- 5.ハンダ・メッキ面が、鉛が約35ないし45重量バーセントで残部が実質的 にスズである構成の近共晶合金で形成される請求項4記載の方法。
- 6.ハンダ・バンプが、少なくとも約90重量パーセントが鉛で、残部が実質的 にスズである合金で形成される請求項4記載の方法。
- 7.ハンダ・メッキ面が電気メッキによりトレース上に付着される請求項5記載 の方法。
- 8.加熱が、摂氏約200度ないし220皮の温度で、40ないし60秒の間行 われる請求項4記載の方法。
- 9.プリント回路基板を作成する段階が:銅板を基板の全体的にに平坦な表面に 付着する段階;ポリマ性マスクを銅板の鎖域に付着する段階で、前記マスクがト レースに対応する配置に前記銅板を露出する開口部を有する段階; ハンダ・メッキ面を露出された銅板上に電気メッキする段階; 前記マスクを除去して、ハンダ・メッキ面周辺の銅板の領域を露出させる段階; および 周辺領域を銅エッチング液で処理して銅を除去し、基板を露出させて、それによ りハンダ・メッキ面が下の銅を保護してトレースを規定する段階; によってさらに構成されることを特徴とする請求項4記載の方法。
- 10.アセンブリを摂氏約200度ないし220度の温度で、40ないし60秒 間加熱してハンダ・メッキ面を溶融させる請求項4記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/770,070 US5186383A (en) | 1991-10-02 | 1991-10-02 | Method for forming solder bump interconnections to a solder-plated circuit trace |
US770,070 | 1991-10-02 | ||
PCT/US1992/007346 WO1993006964A1 (en) | 1991-10-02 | 1992-09-02 | Method for forming solder bump interconnections to a solder-plated circuit trace |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06503687A true JPH06503687A (ja) | 1994-04-21 |
JP3063161B2 JP3063161B2 (ja) | 2000-07-12 |
Family
ID=25087379
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5506893A Expired - Fee Related JP3063161B2 (ja) | 1991-10-02 | 1992-09-02 | ハンダ・メッキした回路トレースに対するハンダ・バンプ相互接続部を形成する方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5186383A (ja) |
EP (1) | EP0559863A4 (ja) |
JP (1) | JP3063161B2 (ja) |
KR (1) | KR970005526B1 (ja) |
WO (1) | WO1993006964A1 (ja) |
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- 1992-09-02 KR KR1019930701635A patent/KR970005526B1/ko not_active IP Right Cessation
- 1992-09-02 EP EP92919654A patent/EP0559863A4/en not_active Ceased
- 1992-09-02 WO PCT/US1992/007346 patent/WO1993006964A1/en not_active Application Discontinuation
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7973406B2 (en) | 2003-11-10 | 2011-07-05 | Stats Chippac, Ltd. | Bump-on-lead flip chip interconnection |
US8188598B2 (en) | 2003-11-10 | 2012-05-29 | Stats Chippac, Ltd. | Bump-on-lead flip chip interconnection |
US8574959B2 (en) | 2003-11-10 | 2013-11-05 | Stats Chippac, Ltd. | Semiconductor device and method of forming bump-on-lead interconnection |
US9773685B2 (en) | 2003-11-10 | 2017-09-26 | STATS ChipPAC Pte. Ltd. | Solder joint flip chip interconnection having relief structure |
US9865556B2 (en) | 2003-11-10 | 2018-01-09 | STATS ChipPAC Pte Ltd. | Semiconductor device and method of self-confinement of conductive bump material during reflow without solder mask |
US9899286B2 (en) | 2003-11-10 | 2018-02-20 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of self-confinement of conductive bump material during reflow without solder mask |
US9922915B2 (en) | 2003-11-10 | 2018-03-20 | STATS ChipPAC Pte. Ltd. | Bump-on-lead flip chip interconnection |
US7901983B2 (en) | 2004-11-10 | 2011-03-08 | Stats Chippac, Ltd. | Bump-on-lead flip chip interconnection |
US8076232B2 (en) | 2008-04-03 | 2011-12-13 | Stats Chippac, Ltd. | Semiconductor device and method of forming composite bump-on-lead interconnection |
JP2015002381A (ja) * | 2013-06-13 | 2015-01-05 | 太陽誘電株式会社 | 弾性波デバイス |
Also Published As
Publication number | Publication date |
---|---|
WO1993006964A1 (en) | 1993-04-15 |
KR930703113A (ko) | 1993-11-29 |
US5186383A (en) | 1993-02-16 |
EP0559863A4 (en) | 1996-03-13 |
KR970005526B1 (ko) | 1997-04-17 |
EP0559863A1 (en) | 1993-09-15 |
JP3063161B2 (ja) | 2000-07-12 |
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