JPH06152112A - Connection of circuit - Google Patents
Connection of circuitInfo
- Publication number
- JPH06152112A JPH06152112A JP30200792A JP30200792A JPH06152112A JP H06152112 A JPH06152112 A JP H06152112A JP 30200792 A JP30200792 A JP 30200792A JP 30200792 A JP30200792 A JP 30200792A JP H06152112 A JPH06152112 A JP H06152112A
- Authority
- JP
- Japan
- Prior art keywords
- particles
- connection
- circuit
- connecting member
- deformed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29499—Shape or distribution of the fillers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/36—Assembling printed circuits with other printed circuits
- H05K3/361—Assembling flexible printed circuits with other printed circuits
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Combinations Of Printed Boards (AREA)
Abstract
(57)【要約】
【目的】 回路の接続方法について、接続状態の確認が
可能な接続方法を提供する。
【構成】 接続部材中に熱圧着時に変形する粒子2を分
散させた接続部材を用い、この接続部材を介して、電極
5とリード4が形成されたフィルム3と基板6とを加圧
接合する。
【効果】 導電性粒子1が変形を生じにくい金属粒子で
あっても、加圧が良好であれば変形粒子2が変形するた
め、加圧状態の良否を変形粒子2の変形により確認で
き、接続状態を確実に確認できる。
(57) [Abstract] [Purpose] To provide a connection method capable of confirming the connection state of a circuit. A connecting member is used in which particles 2 that deform during thermocompression are dispersed in the connecting member, and the electrode 3 and the film 3 on which the leads 4 are formed and the substrate 6 are pressure-bonded to each other through the connecting member. . [Effect] Even if the conductive particle 1 is a metal particle that is hard to be deformed, the deformed particle 2 is deformed if the pressure is good. You can check the status with certainty.
Description
【0001】[0001]
【産業上の利用分野】本発明は、回路の接続方法に関す
るものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit connecting method.
【0002】[0002]
【従来の技術】近年の部品・デバイスの開発では高密度
な回路の接続を如何に実現するかが課題となっている。2. Description of the Related Art In the recent development of parts and devices, how to realize high-density circuit connection has become an issue.
【0003】特に液晶パネルのようなデバイスでは多数
点、高密度の接続の実現が製造上の重要なポイントであ
る。Particularly in devices such as liquid crystal panels, realization of a large number of points and high-density connection is an important point in manufacturing.
【0004】以下に従来の回路の接続方法について図面
を参照しながら説明する。図5は従来の回路の接続方法
を示す断面図である。ポリイミド等のフィルム3上に銅
箔を用いてリード4が設けられており、ガラス基板6上
には金属薄膜にて電極5が設けられている。フィルム3
は接着剤7でガラス基板6に接着されており、接着剤7
中の導電性粒子1にてリード4と電極5の電気的導通が
とられている。A conventional circuit connecting method will be described below with reference to the drawings. FIG. 5 is a sectional view showing a conventional circuit connecting method. The leads 4 are provided on the film 3 made of polyimide or the like by using a copper foil, and the electrodes 5 are provided on the glass substrate 6 by a metal thin film. Film 3
Is adhered to the glass substrate 6 with the adhesive 7, and the adhesive 7
The conductive particles 1 in the inside electrically connect the leads 4 to the electrodes 5.
【0005】ガラス基板6上に形成された電極5の配置
状態を図6に平面図として示す。最外部のリードについ
ては接続状態が不安定になりやすいので、その更に外側
にダミー電極9を設けている。ガラス基板6にフィルム
3が重なった状態を図7に示す。接着剤7の硬化は高温
のヒーターツールでフィルム3を上方から熱圧着する方
法が一般的である。このような回路の接続方法は異方導
電性接着剤を用いた実装方法として広く用いられている
(例えば 渥美他ら ”液晶モジュールのTAB実装技
術”電子技術 第32巻第7号)。The arrangement of the electrodes 5 formed on the glass substrate 6 is shown as a plan view in FIG. Since the connection state of the outermost lead is likely to be unstable, the dummy electrode 9 is provided further outside thereof. FIG. 7 shows a state in which the film 3 is superposed on the glass substrate 6. Generally, the adhesive 7 is cured by thermocompression bonding the film 3 from above with a high temperature heater tool. Such a circuit connecting method is widely used as a mounting method using an anisotropic conductive adhesive (for example, Atsumi et al., "TAB mounting technology for liquid crystal modules", Electronic Technology Vol. 32, No. 7).
【0006】[0006]
【発明が解決しようとする課題】しかし、このような工
法では接続状態の確認が課題となっている。つまり、導
電性粒子がリードおよび電極に確実に接触していること
を製造工程内で確認する方法が必要とされる。液晶パネ
ルの工程などでは電極の材料にITO(Indium
Thin Oxide)等の透明な材料を用いることが
多いので、例えばガラス基板裏面から確認すると導電性
粒子がリードと電極の間に挟まれて変形している様子が
確認でき、これを判定基準する方法が採られる。However, in such a construction method, confirmation of the connection state is a problem. That is, a method for confirming that the conductive particles are surely in contact with the leads and the electrodes is required in the manufacturing process. In the process of liquid crystal panels, ITO (Indium) is used as the electrode material.
Since a transparent material such as Thin Oxide is often used, it can be confirmed that the conductive particles are deformed by being sandwiched between the lead and the electrode when confirmed from the back surface of the glass substrate, for example. Is taken.
【0007】しかし、導電性粒子がNi粒子などの硬い
粒子であるとつぶれ具合の判定が困難であり、電極がA
l等の不透明な金属であると裏面からの確認は不可能で
ある。However, if the conductive particles are hard particles such as Ni particles, it is difficult to determine the degree of collapse, and the electrode is A
If it is an opaque metal such as l, confirmation from the back surface is impossible.
【0008】このように接続状態の確認が回路の接続方
法における大きな課題となっていた。Thus, confirmation of the connection state has been a major problem in the circuit connection method.
【0009】本発明はこのような課題を解決するもので
あり、安定な回路の接続方法を提供するものである。The present invention solves such a problem and provides a stable circuit connecting method.
【0010】[0010]
【課題を解決するための手段】上記目的を達成するため
に、本発明の回路の接続方法は接続部材中に2種類以上
の粒子を分散させ、そのうち低硬度の粒子を変形させ
る。あるいは、接続回路の一部を伸長し接続抵抗確認用
の電極を設けたものである。In order to achieve the above object, in the circuit connecting method of the present invention, two or more kinds of particles are dispersed in a connecting member, and particles having a low hardness are deformed. Alternatively, a part of the connection circuit is extended and an electrode for confirming the connection resistance is provided.
【0011】[0011]
【作用】したがって本発明によれば、接続状態を確認す
る変形粒子あるいは接続抵抗確認用電極の作用により接
続状態の確認が容易にできるものである。Therefore, according to the present invention, the connection state can be easily confirmed by the action of the deformed particles for confirming the connection state or the connection resistance confirmation electrode.
【0012】[0012]
【実施例】以下、本発明の実施例について同一機能を有
するものには同一番号を付して詳しい説明を省略し、相
違する点について説明する。Embodiments of the present invention having the same function are denoted by the same reference numerals, detailed description thereof will be omitted, and different points will be described.
【0013】(実施例1)図1は本発明の第1の実施例
の回路の接続方法を示す断面図である。導電性粒子1は
Niであり、変形粒子2は樹脂ボールを用いた。樹脂ボ
ールはその粒径を揃えることが容易で、例えば10μm
径でばらつきが1μm以内というものを入手することが
可能である。そのため、変形粒子2のつぶれ具合を観察
することで熱圧着時にかかった圧力を確認することがで
きる。例えば、工程内の基準として変形後の粒子径が2
0μm以上であることと規定しておけば、熱圧着工程を
管理することができる。(Embodiment 1) FIG. 1 is a sectional view showing a circuit connecting method according to a first embodiment of the present invention. The conductive particles 1 were Ni, and the deformable particles 2 were resin balls. It is easy to make the particle size of resin balls uniform, for example, 10 μm.
It is possible to obtain a product with a variation in diameter within 1 μm. Therefore, the pressure applied during thermocompression bonding can be confirmed by observing the degree of collapse of the deformed particles 2. For example, as a reference in the process, the particle size after deformation is 2
If it is specified that the thickness is 0 μm or more, the thermocompression bonding process can be controlled.
【0014】また、電極5がAl等の不透明な材料の場
合は、図2に示すように確認用リード8を設けてガラス
基板6と確認用リード8の間で変形した変形粒子2をガ
ラス基板6の裏面より確認すれば良い。確認用リード8
はフィルム8とガラス基板6のアライメント用のパター
ンを兼ねることもできる。When the electrode 5 is made of an opaque material such as Al, a confirmation lead 8 is provided as shown in FIG. 2, and the deformed particles 2 deformed between the glass substrate 6 and the confirmation lead 8 are transferred to the glass substrate. Check from the back side of 6. Confirmation lead 8
Can also serve as an alignment pattern for the film 8 and the glass substrate 6.
【0015】(実施例2)本実施例における接続部分の
断面構成は図2と同様である。ただし、図4に示すよう
に、図6で示したダミー電極9の一部を変形して測定用
電極10としている。フィルム3を圧着した様子を図3
に示す。リード4で測定用電極10が短絡されている。
短絡されている2個の測定用電極10の間の接続抵抗を
測定すれば接続が確実に行われていることが確認でき
る。中央部に比べて両端部は接続状態が不安定になりや
すいので、両端部の接続ができていれば中央部の接続は
良好であると判断できる。(Embodiment 2) The sectional structure of the connecting portion in this embodiment is the same as that in FIG. However, as shown in FIG. 4, a part of the dummy electrode 9 shown in FIG. Figure 3 shows how film 3 is crimped
Shown in. The measuring electrode 10 is short-circuited by the lead 4.
It can be confirmed that the connection is surely made by measuring the connection resistance between the two short-circuited measuring electrodes 10. Since the connection state at both ends is more likely to be unstable than at the center, it can be determined that the connection at the center is good if both ends are connected.
【0016】[0016]
【発明の効果】上記実施例より明らかなように本発明は
接続部材に圧着時に変形する粒子を添加する、確認用の
ダミー接続回路を設ける、接続抵抗確認用電極を設ける
等の構成を用いることで接続状態の確認を容易なものと
することができた。As is apparent from the above-described embodiments, the present invention employs a structure in which particles that deform during pressure bonding are added to the connecting member, a confirmation dummy connection circuit is provided, and a connection resistance confirmation electrode is provided. With, it was possible to easily check the connection status.
【図1】本発明の第1の実施例の説明図FIG. 1 is an explanatory diagram of a first embodiment of the present invention.
【図2】同実施例の説明図FIG. 2 is an explanatory diagram of the same embodiment.
【図3】本発明の第2の実施例の説明図FIG. 3 is an explanatory diagram of a second embodiment of the present invention.
【図4】同実施例の説明図FIG. 4 is an explanatory view of the same embodiment.
【図5】従来の回路の接続方法の説明図FIG. 5 is an explanatory diagram of a conventional circuit connection method.
【図6】従来例の回路の接続方法の説明図FIG. 6 is an explanatory view of a conventional circuit connection method.
【図7】従来例の回路の接続方法の説明図FIG. 7 is an explanatory diagram of a conventional circuit connection method.
1 導電性粒子 2 変形粒子 3 フィルム 4 リード 5 電極 6 ガラス基板 7 接着剤 8 確認用リード 9 ダミー電極 10 測定用電極 1 Conductive Particles 2 Deformed Particles 3 Film 4 Lead 5 Electrode 6 Glass Substrate 7 Adhesive 8 Confirmation Lead 9 Dummy Electrode 10 Measurement Electrode
───────────────────────────────────────────────────── フロントページの続き (72)発明者 河津 明美 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Akemi Kawazu 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.
Claims (5)
続端子を接続部材を介して加圧して相互に接続する回路
の接続方法であって、接続部材は、電気絶縁性の接着剤
中に硬度の異なる少なくとも2種類以上の粒子を分散さ
せたものを用い、硬度の低い粒子を接続時の加圧力によ
り変形せしめるとともに端子間に前記粒子を存在せしめ
て接続端子間の電気伝導を行う回路の接続方法。1. A method for connecting circuits, in which connecting terminals formed on opposing supports are pressed against each other via a connecting member to connect them to each other, wherein the connecting member is an electrically insulating adhesive. Using particles in which at least two kinds of particles having different hardness are dispersed, the particles having low hardness are deformed by the pressing force at the time of connection, and the particles are made to exist between the terminals to perform electric conduction between the connection terminals. Circuit connection method.
い粒子が金属よりなる請求項1記載の回路の接続方法。2. The circuit connecting method according to claim 1, wherein the particles having low hardness are made of resin and the particles having high hardness are made of metal.
け、前記ダミー端子により接続部材中の粒子の状態を観
察しつつ接続を行うことを特徴とする請求項1記載の回
路の接続方法。3. The circuit connecting method according to claim 1, wherein a dummy terminal is provided only on one of the supports, and the dummy terminal is used for connection while observing the state of particles in the connecting member. .
長して接続抵抗測定用電極とし、接続抵抗を測定しつつ
行うことを特徴とする回路の接続方法。4. A method of connecting a circuit, wherein a part of a connection terminal formed on a support is extended to form a connection resistance measuring electrode, which is measured while measuring the connection resistance.
徴とする請求項4記載の回路の接続方法。5. The circuit connecting method according to claim 4, wherein the adhesive is an anisotropic conductive adhesive.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30200792A JPH06152112A (en) | 1992-11-12 | 1992-11-12 | Connection of circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30200792A JPH06152112A (en) | 1992-11-12 | 1992-11-12 | Connection of circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH06152112A true JPH06152112A (en) | 1994-05-31 |
Family
ID=17903768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP30200792A Pending JPH06152112A (en) | 1992-11-12 | 1992-11-12 | Connection of circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH06152112A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001026079A1 (en) * | 1999-10-06 | 2001-04-12 | Seiko Epson Corporation | Electrooptic device, method for manufacturing electrooptic device, and electronic apparatus |
JP2003516642A (en) * | 1999-12-07 | 2003-05-13 | ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング | Non-separable electrical and mechanical joints, contact parts for non-separable electrical and mechanical joints, and methods for the production of non-separable electrical and mechanical joints |
JP2006324030A (en) * | 2005-05-17 | 2006-11-30 | Matsushita Electric Ind Co Ltd | Lighting inspection apparatus and lighting inspection method for flat display panel |
JP2007053198A (en) * | 2005-08-17 | 2007-03-01 | Fujikura Ltd | Rigid printed board and connecting method of printed board |
JP2010243585A (en) * | 2009-04-01 | 2010-10-28 | Funai Electric Co Ltd | Liquid crystal module |
-
1992
- 1992-11-12 JP JP30200792A patent/JPH06152112A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001026079A1 (en) * | 1999-10-06 | 2001-04-12 | Seiko Epson Corporation | Electrooptic device, method for manufacturing electrooptic device, and electronic apparatus |
US6646708B1 (en) | 1999-10-06 | 2003-11-11 | Seiko Epson Corporation | Electrooptic device, manufacturing method therefor with visual confirmation of compression bonding to terminals and electronic apparatus |
JP2003516642A (en) * | 1999-12-07 | 2003-05-13 | ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング | Non-separable electrical and mechanical joints, contact parts for non-separable electrical and mechanical joints, and methods for the production of non-separable electrical and mechanical joints |
JP2006324030A (en) * | 2005-05-17 | 2006-11-30 | Matsushita Electric Ind Co Ltd | Lighting inspection apparatus and lighting inspection method for flat display panel |
JP2007053198A (en) * | 2005-08-17 | 2007-03-01 | Fujikura Ltd | Rigid printed board and connecting method of printed board |
JP2010243585A (en) * | 2009-04-01 | 2010-10-28 | Funai Electric Co Ltd | Liquid crystal module |
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