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JPH05872Y2 - - Google Patents

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Publication number
JPH05872Y2
JPH05872Y2 JP1983022806U JP2280683U JPH05872Y2 JP H05872 Y2 JPH05872 Y2 JP H05872Y2 JP 1983022806 U JP1983022806 U JP 1983022806U JP 2280683 U JP2280683 U JP 2280683U JP H05872 Y2 JPH05872 Y2 JP H05872Y2
Authority
JP
Japan
Prior art keywords
test
printed wiring
base plate
unit circuit
wiring board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1983022806U
Other languages
Japanese (ja)
Other versions
JPS59128577U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2280683U priority Critical patent/JPS59128577U/en
Publication of JPS59128577U publication Critical patent/JPS59128577U/en
Application granted granted Critical
Publication of JPH05872Y2 publication Critical patent/JPH05872Y2/ja
Granted legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【考案の詳細な説明】 この考案は、プリント配線基板の断混線試験装
置、特に同一の単位回路パターンを多数印刷して
成るプリント配線基板の断混線試験に適した断混
線試験装置に関するものである。
[Detailed description of the invention] This invention relates to a cross-disconnection test device for printed wiring boards, and in particular, a cross-disconnection test device suitable for testing printed wiring boards that are printed with a large number of identical unit circuit patterns. .

プリント配線基板の断混線を試験する基本的な
方法は、プリント配線の各端子部に試験ピンを挿
入接触させ、この試験ピンを介して当該プリント
回路の導通試験を行なうように構成される。
The basic method for testing disconnected cross-wires on a printed wiring board is to insert test pins into contact with each terminal portion of the printed wiring, and conduct a continuity test of the printed circuit through the test pins.

プリント配線基板が同一印刷パタンのプリント
配線部の複数個を含む場合の従来の試験装置の一
例を第1図について説明する。試験すべきプリン
ト配線基板2が同一の印刷パタンを有する複数の
単位回路パターンP1,P2,…Poを含む場合には、
この基板2を定位置に位置決めするための合わせ
ピン11とガイドピン12が上面に穿設された試
験台板1上に載置し、前記単位回路パターン群の
各端子部21に対応した位置にそれぞれ試験ピン
32A,32B,32C,32Dの設けられたピ
ン台板3をガイドピン12に係合するガイド孔3
1を利用して試験台板1と平行状態に下降させて
これらの試験ピン32A,32B,…を各端子部
21のすべてに対して同時に接触させ、この試験
ピン32A,32B,…を介してこのプリント回
路の導通試験を行なうものである。
An example of a conventional test apparatus in a case where a printed wiring board includes a plurality of printed wiring parts having the same printing pattern will be described with reference to FIG. When the printed wiring board 2 to be tested includes a plurality of unit circuit patterns P 1 , P 2 , ... P o having the same printed pattern,
This board 2 is placed on a test stand board 1 having dowel pins 11 and guide pins 12 drilled in the upper surface for positioning the board 2 in a fixed position, and placed at a position corresponding to each terminal part 21 of the unit circuit pattern group. A guide hole 3 that engages a pin base plate 3 provided with test pins 32A, 32B, 32C, and 32D with a guide pin 12, respectively.
1 to be lowered parallel to the test stand plate 1, and bring these test pins 32A, 32B,... into contact with all of the terminal parts 21 at the same time, and through these test pins 32A, 32B,... This is to perform a continuity test on this printed circuit.

したがつて、プリント配線基板に含まれる同一
単位回路パターンの数nが多いときは単一の回路
パターンに対応する試験ピンの組32も数多いn
組必要になつて、加工も煩雑となり、また試験台
板1もピン台板3もそれだけ横拡がりの大きい大
面積のものが必要になるわけであるから、これら
両台板1,3の平行度も出にくく、また両者の近
傍および離隔方向の案内運動も円滑さを欠くなど
の欠点がある。
Therefore, when the number n of identical unit circuit patterns included in a printed wiring board is large, the number of test pin sets 32 corresponding to a single circuit pattern is also large n.
As a result, the processing becomes complicated, and the test base plate 1 and the pin base plate 3 are required to have a large surface area with a large lateral spread, so the parallelism of both base plates 1 and 3 must be adjusted. There are drawbacks such as difficulty in coming out, and the guiding movement in the vicinity and in the direction of separation between the two also lacks smoothness.

この考案はこのような従来の欠点を排除するた
めになされたものであつて、一つの単位回路パタ
ーンに対応した試験ピンを備えた試験台を床面に
対して定位置で繰り返して往復移動させて、多数
の単位回路パターンを印刷して成るプリント配線
基板の断混線を簡単に検査しうる装置を提供する
ことを目的とする。
This idea was made to eliminate these conventional drawbacks, and it involves repeatedly moving a test stand equipped with test pins corresponding to one unit circuit pattern back and forth from a fixed position on the floor. It is an object of the present invention to provide a device that can easily inspect for disconnection and crosstalk in a printed wiring board formed by printing a large number of unit circuit patterns.

つぎにこの考案を図示の例によつて詳細に説明
する。
Next, this invention will be explained in detail using illustrated examples.

第2図はこの考案の一例をしめすものであつ
て、同一の印刷パタンを持つ単位回路パターン
P1,P2,…を含むプリント配線基板2は試験台
板4上の定位置に載置される。載置位置を一定に
するために試験台板4上に位置ぎめ用の合わせピ
ン41を突設し、プリント配線基板2にもその隅
の一定位置にこの合わせピン41に係合する孔を
穿設する。
Figure 2 shows an example of this invention, showing unit circuit patterns with the same printed pattern.
The printed wiring board 2 including P 1 , P 2 , . . . is placed at a fixed position on the test stand plate 4 . In order to keep the mounting position constant, a dowel pin 41 for positioning is provided protrudingly on the test table plate 4, and a hole that engages with the dowel pin 41 is bored in the printed wiring board 2 at a certain position in the corner. Set up

試験台板4の下部には直交する2方向に延びる
ピツチの比較的小さい送りねじ51、同61を係
合させ、それぞれの送りねじ51,61にはこれ
を回転駆動させるパルスモータを取りつける。こ
れがすなわち試験台板4をその平面のx,y両軸
方向に移動させるためのx軸駆動装置5およびy
軸駆動装置6である。各軸方向の駆動装置として
はこの例のパルスモータと送りねじとの組み合わ
せに限らないが、送り量を精密に制御できるもの
でなければならない。
Feed screws 51 and 61 with relatively small pitches extending in two orthogonal directions are engaged with the lower part of the test table plate 4, and a pulse motor for rotationally driving the feed screws 51 and 61 is attached to each of the feed screws 51 and 61. This means an x-axis drive device 5 and a y-axis drive device 5 for moving the test table plate 4 in both the
This is a shaft drive device 6. The driving device for each axis is not limited to the combination of a pulse motor and a feed screw as in this example, but it must be capable of precisely controlling the feed amount.

試験台板4の上方には少くとも1個の単位回路
パターンを試験するに必要な試験ピン71を備え
たピン台板7を試験台板4と平行に設け、試験台
板4に近傍または離隔する方向に動かすための、
たとえば流体圧シリンダのようなピン台板駆動装
置72を取りつける。
A pin base plate 7 equipped with test pins 71 necessary for testing at least one unit circuit pattern is provided above the test base plate 4 in parallel with the test base plate 4, and a pin base plate 7 is provided in parallel with the test base plate 4, and a pin base plate 7 is provided near the test base plate 4 or at a distance from the test base plate 4. to move in the direction of
A pin bed plate drive 72, such as a hydraulic cylinder, is attached.

さらに試験の結果不良となつたプリント配線部
にマークをつけるための適宜のマーカ8が、これ
を突出および退去させるための、たとえば流体圧
シリンダのようなマーカ作動装置81を介して設
けられる。
Furthermore, a suitable marker 8 for marking printed wiring parts which have failed the test is provided via a marker actuation device 81, for example a hydraulic cylinder, for ejecting and retracting them.

この実施例ではマーカ8はピン台板7に併設さ
れているが、もちろんこれに限らず別途に取りつ
けてもよい。
In this embodiment, the marker 8 is attached to the pin base plate 7, but of course the marker 8 is not limited to this and may be attached separately.

試験すべきプリント配線基板2を試験台板4上
に移し、またここから運び去るための装置が別に
設けられる。第2図に符号9で示したものはこの
ための吸盤であつて、吸盤9は流体圧シリンダ9
1によつて試験台板4の表面に垂直な方向に昇降
し、またアーム92によつて回動あるいは進退運
動を与えられ、試験すべきプリント配線基板2
の、この試験装置へのセツトおよび取外しを行な
うのである。
A separate device is provided for transferring the printed wiring board 2 to be tested onto the test stand 4 and removing it from there. 2 is a suction cup for this purpose, and the suction cup 9 is a fluid pressure cylinder 9.
The printed wiring board 2 to be tested is moved up and down in a direction perpendicular to the surface of the test plate 4 by the arm 92, and rotated or moved back and forth by the arm 92.
The test equipment is set in and removed from the test equipment.

次にこの考案の試験装置の作用について説明す
る。まず試験ピン71をプリント回路の端子部2
1に接触させて行なう導通試験については従来装
置と全く同様なので説明を省略する。
Next, the operation of the testing device of this invention will be explained. First, connect the test pin 71 to the terminal section 2 of the printed circuit.
The continuity test carried out by contacting the device 1 is completely the same as the conventional device, so the explanation will be omitted.

試験すべきプリント配線基板2は吸盤9、ある
いは作業者の手によつて試験台板4上の所定位置
に載置される。このときピン台板7はプリント配
線基板2の一番端の単位回路パターンP1の直上
にあるように設定する。次にピン台板駆動装置7
2を駆動させてピン台板7を下降させ、既述のよ
うに従来と同一のやり方ではじめのプリント配線
部P1について導通試験を行なう。この導通試験
に合格ならば次に移るが、もし断混線が存在して
不合格ならば前記試験ピンからの信号によつてマ
ーカ作動装置81に指令されてマーカ8が作動
し、不合格と判定されたプリント配線部P1上に
適宜のマークがつけられる。
The printed wiring board 2 to be tested is placed at a predetermined position on the test bench 4 using a suction cup 9 or by the operator's hand. At this time, the pin base plate 7 is set to be directly above the unit circuit pattern P 1 at the end of the printed wiring board 2. Next, the pin base plate drive device 7
2 is driven to lower the pin base plate 7, and a continuity test is performed on the first printed wiring section P1 in the same manner as in the conventional method as described above. If this continuity test passes, the next step will be taken. However, if there is a disconnection and crosstalk and the test fails, a signal from the test pin will command the marker actuator 81 to operate the marker 8, and it will be determined that the test has failed. An appropriate mark is placed on the printed wiring section P1 .

次にひとつの単位回路パターンP1の導通試験
が終了してピン台板7が上昇すると、x軸駆動装
置5が作動して試験台板4が正確にプリント配線
部1個分の横幅だけ移動し、次の単位回路パター
ンP2がピン台板7の直下にきて試験ピン71に
対向する。こうして再びピン台板7が下降して単
位回路パターンP2の導通試験が実施される。
Next, when the continuity test for one unit circuit pattern P 1 is completed and the pin base plate 7 is raised, the x-axis drive device 5 is activated and the test base plate 4 is moved by exactly the width of one printed wiring section. Then, the next unit circuit pattern P 2 comes directly under the pin base plate 7 and faces the test pins 71 . In this way, the pin base plate 7 is lowered again and the continuity test of the unit circuit pattern P2 is performed.

このようにして試験台板4をx軸およびy軸方
向に移動して順次各単位回路パターンの導通試験
を行なう。たとえばプリント配線基板2が4×4
=16個の単位回路パターンを含むとすれば、上述
のようにまずx軸方向に移動して試験を進めると
して、x軸駆動装置5を正、負方向を含めて12
回、y軸駆動装置6を3回作動させて試験台板4
を移動させることによつて全プリント配線部P1
P2,…P16の挿通試験が完了するわけである。な
おこの例で、ピン台板7にプリント配線部の横並
び2個分の試験ピンを突設しておき、横並び2個
分のプリント配線部P1,P2を1度に試験するや
り方とすれば、試験台板4の移動回数はx軸方向
に4回、y軸方向に3回となる。
In this way, the test base plate 4 is moved in the x-axis and y-axis directions to sequentially conduct a continuity test on each unit circuit pattern. For example, the printed wiring board 2 is 4×4
=16 unit circuit patterns are included, and if the test is carried out by first moving in the x-axis direction as described above, then the x-axis drive device 5 is moved 12 times including the positive and negative directions.
3 times, the y-axis drive device 6 is operated 3 times to test the test base plate 4.
By moving the entire printed wiring section P 1 ,
This completes the penetration test for P 2 ,...P 16 . In this example, test pins for two horizontally arranged printed wiring sections are provided protruding from the pin base plate 7, and two horizontally arranged printed wiring sections P 1 and P 2 are tested at one time. For example, the number of times the test table plate 4 is moved is four times in the x-axis direction and three times in the y-axis direction.

以上詳述したようにこの考案によれば、同一の
単位回路パターンが一枚のシートに多数にわたつ
て印刷されて成るプリント配線基板の断混線試験
装置であつて、該プリント配線基板の隅部に穿設
した位置合わせ孔に係合してその位置決めをする
ための位置合わせピン41を備えた試験台板4
と、この試験台板4をx,y両方向に駆動させる
x軸駆動装置5およびy軸駆動装置6と、前記試
験台板4上に載置されるプリント配線板がx方向
またはY方向に一単位移動するごとに、単位回路
パターンの各端子部に対応して試験ピン71、…
…の植設された断混線検出ピン台板7が床面に対
して固定された位置で下降および上昇を行い、該
各単位回路パターンに接触および離隔を繰り返す
断混線検出ピン台板駆動装置72と、前記断混線
検出ピン台板7の近傍に配置され、前記試験ピン
71、……によつて検出された単位回路パターン
の断混線信号によつて当該単位回路パターンの表
面に不良標識を付記する不良標識表示装置81と
を具備するように構成されるので、一つの単位回
路パターンにのみ対応した試験ピンを備えた断混
線検出ピン台板を往復移動させるだけで多数の単
位回路パターン群を有する面積の大きなプリント
配線板を効率よく検査することができる。このた
め断混線検出ピン台板のサイズを小さくすること
ができ、したがつて複雑な多数の試験ピンの植設
作業が不要となり、また不良箇所に標識が自動的
に付記されるので各単位回路パターンごとに切り
離し、製品として出荷する際に不良製品を判別す
ることが容易になる等効果がある。
As described in detail above, according to this invention, there is provided a disconnection cross-wire testing device for a printed wiring board in which a number of identical unit circuit patterns are printed on one sheet. Test stand plate 4 equipped with positioning pins 41 for positioning by engaging with positioning holes drilled in
An x-axis drive device 5 and a y-axis drive device 6 drive the test stand board 4 in both the x and y directions, and the printed wiring board placed on the test stand board 4 is aligned in the x direction or the Y direction. For each unit movement, the test pins 71, . . . correspond to each terminal part of the unit circuit pattern.
A disconnected cross-wire detection pin base plate drive device 72 in which the implanted disconnected cross-wire detection pin base plate 7 lowers and rises at a fixed position relative to the floor surface, and repeatedly contacts and separates from each unit circuit pattern. and a defect mark is added to the surface of the unit circuit pattern by the disconnection/crossover signal of the unit circuit pattern which is arranged near the disconnection/crossover detection pin base plate 7 and detected by the test pins 71, . . . Since the device is configured to include a defect indicator display device 81 for detecting a defective circuit pattern, a large number of unit circuit pattern groups can be detected simply by reciprocating the disconnection/crossing detection pin base plate equipped with test pins corresponding to only one unit circuit pattern. A printed wiring board having a large area can be efficiently inspected. This makes it possible to reduce the size of the broken and cross-wire detection pin base plate, which eliminates the need for the complicated work of planting a large number of test pins.Furthermore, since marks are automatically added to defective locations, each unit circuit This has the effect of making it easier to separate out each pattern and identify defective products when shipping the product.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来技術の一例を示す斜視図、第2図
はこの考案の一実施例を示す斜視図である。 P1,P2……プリント配線部、2……プリント
配線板、4……試験台板、5……x軸駆動装置、
6……y軸駆動装置、7……ピン台板、71……
試験ピン、72……断混線検出ピン台板駆動装
置。
FIG. 1 is a perspective view showing an example of the prior art, and FIG. 2 is a perspective view showing an embodiment of this invention. P1 , P2 ...Printed wiring section, 2...Printed wiring board, 4...Test stand board, 5...x-axis drive device,
6...Y-axis drive device, 7...Pin base plate, 71...
Test pin, 72...Disconnection/cross detection pin base plate drive device.

Claims (1)

【実用新案登録請求の範囲】 (イ) 同一の単位回路パターンが一枚のシートに多
数にわたつて印刷されて成るプリント配線基板
の断混線試験装置であつて、該プリント配線基
板の隅部に穿設した位置合わせ孔に係合してそ
の位置決めをするための位置合わせピン41を
備えた試験台板4と、 (ロ) この試験台板4をx,y両方向に駆動させる
x軸駆動装置5およびy軸駆動装置6と、 (ハ) 前記試験台板4上に載置されるプリント配線
板がx方向またはY方向に一単位移動するごと
に、単位回路パターンの各端子部に対応して試
験ピン71、……の植設された断混線検出ピン
台板7が床面に対して固定された位置で下降お
よび上昇を行い、該各単位回路パターンに接触
および離隔を繰り返す断混線検出ピン台板駆動
装置72と、 (ニ) 前記断混線検出ピン台板7の近傍に配置さ
れ、前記試験ピン71、……によつて検出され
た単位回路パターンの断混線信号によつて当該
単位回路パターンの表面に不良標識を付記する
不良標識表示装置81とを具備することを特徴
とする同一の単位回路パターンが一枚のシート
に多数にわたつて印刷されて成るプリント配線
基板の断混線試験装置。
[Scope of Claim for Utility Model Registration] (a) A disconnection cross-wire testing device for a printed wiring board consisting of a large number of identical unit circuit patterns printed on one sheet, which A test bed plate 4 equipped with a positioning pin 41 for engaging with a drilled positioning hole for positioning, and (b) an x-axis drive device for driving this test bed plate 4 in both x and y directions. (c) Each time the printed wiring board placed on the test stand board 4 moves one unit in the x direction or the y direction, The test pins 71, . . . are installed on the broken and cross-wire detection pin base plate 7, which lowers and rises at a fixed position relative to the floor surface, and repeatedly contacts and separates from each unit circuit pattern, thereby detecting the broken and cross-wire. a pin base plate driving device 72; A disconnection cross-wire test for a printed wiring board in which a large number of the same unit circuit patterns are printed on one sheet, characterized by comprising a defect indicator display device 81 that adds a defect indicator to the surface of the circuit pattern. Device.
JP2280683U 1983-02-18 1983-02-18 Printed wiring board disconnection cross-wire testing equipment Granted JPS59128577U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2280683U JPS59128577U (en) 1983-02-18 1983-02-18 Printed wiring board disconnection cross-wire testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2280683U JPS59128577U (en) 1983-02-18 1983-02-18 Printed wiring board disconnection cross-wire testing equipment

Publications (2)

Publication Number Publication Date
JPS59128577U JPS59128577U (en) 1984-08-29
JPH05872Y2 true JPH05872Y2 (en) 1993-01-11

Family

ID=30153899

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2280683U Granted JPS59128577U (en) 1983-02-18 1983-02-18 Printed wiring board disconnection cross-wire testing equipment

Country Status (1)

Country Link
JP (1) JPS59128577U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994000404A1 (en) * 1992-06-24 1994-01-06 Cosmo Enterprise Co., Ltd. Organic substance liquefying apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01260591A (en) * 1988-04-11 1989-10-17 Toshiba Corp Processor for paper or the like

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS533848A (en) * 1976-06-30 1978-01-13 Matsushita Electric Ind Co Ltd Automatic position measurement device
JPS5367878A (en) * 1976-11-29 1978-06-16 Fujitsu Ltd Device for inspecting electrode

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53118056U (en) * 1977-02-28 1978-09-20
JPS54176860U (en) * 1978-06-01 1979-12-13

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS533848A (en) * 1976-06-30 1978-01-13 Matsushita Electric Ind Co Ltd Automatic position measurement device
JPS5367878A (en) * 1976-11-29 1978-06-16 Fujitsu Ltd Device for inspecting electrode

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994000404A1 (en) * 1992-06-24 1994-01-06 Cosmo Enterprise Co., Ltd. Organic substance liquefying apparatus

Also Published As

Publication number Publication date
JPS59128577U (en) 1984-08-29

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