JPH05299406A - Substrate washing tub - Google Patents
Substrate washing tubInfo
- Publication number
- JPH05299406A JPH05299406A JP2931391A JP2931391A JPH05299406A JP H05299406 A JPH05299406 A JP H05299406A JP 2931391 A JP2931391 A JP 2931391A JP 2931391 A JP2931391 A JP 2931391A JP H05299406 A JPH05299406 A JP H05299406A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- flow
- dust
- inflow
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Cleaning By Liquid Or Steam (AREA)
- Coating Apparatus (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
【0001】
【産業上の利用分野】 この発明は、半導体装置の製造
工程の前処理において、半導体基板を洗浄する基板洗浄
槽に関するものである。
【0002】
【従来の技術】近年、半導体装置の高密度化が進むにつ
れて、形成されるパターンが微細化し、該半導体装置の
製造工程において半導体基板表面に付着する微小なゴミ
の有無がその歩留りを左右するようになってきている。
このため、前記製造工程における前処理として半導体基
板(以後、基板と言う)を洗浄する工程が重要になって
くる。
【0003】この基板の洗浄工程は、一般に、半導体基
板をキャリア(搬送手段)に設置して、これを洗浄槽に
挿入し、その洗浄液供給口より洗浄液を注入して基板に
付着しているゴミを洗浄液と共に洗浄槽外に流出させ
る。具体的な例として、特開平2−137321号公報
には、図2に示すように、洗浄槽20の底面中央部に洗
浄液供給口20a及びその周囲にゴミの洗浄効果を上げ
るための振動板10が設けられ、これに近接して洗浄液
を整流するための整流板11が底面に平行して設けられ
ており、基板7を設置したキャリア6を洗浄槽20内に
挿入した後、洗浄液を洗浄液供給口20aより流入させ
ると、整流板11を介して矢印のように噴出して洗浄槽
20の周縁部から外部へ流出する。この場合、該周縁部
の近くを上方に向かって流れる洗浄液(矢印)は、外向
きの力が強く作用して周縁部を越えて排出する。
【0004】
【発明が解決しようとする課題】しかしながら、上記従
来の基板洗浄層においては、洗浄槽20の中央部を上方
に向かって流れる洗浄液は基板7やキャリア6による面
抵抗により外向きの力が弱く、洗浄槽20の中央層部に
移動速度の遅い淀みが発生するため、基板7から遊離し
たゴミは洗浄槽20の上層中央部に集まって浮遊するよ
うになり、基板7を洗浄槽20から取り出す際に、一度
洗浄されて遊離したゴミが再付着するという問題点があ
った。
【0005】そこで、この発明の目的は上述した従来の
問題点を解消して、基板を洗浄槽から取り出すときに、
一度遊離したゴミが再付着することがなく、効果的な洗
浄を行なうことのできる基板洗浄装置を提供することに
ある。
【0006】
【課題を解決するための手段】この発明の要旨とすると
ころは、洗浄液供給口と、外洗浄液供給口から供給され
た洗浄液を整流してキャリアに設置した基板の方へ向け
るための複数の流入孔を有する流入液整流板と、槽底面
に設けられた振動板とを備えた基板洗浄槽において、前
記流入液整流板は前記槽底面に対して垂直方向に設けら
れており、且つ前記流入孔を通過した洗浄液が前記基板
の面に沿って水平方向に流れた後、外部へ流出させるた
めの複数の流出孔を有する流出液整流板が前記流入液整
流板に平行して設けられたことにある。
【0007】
【作用】したがって、洗浄液供給口から供給された洗浄
液は流入液整流板の流入孔を通過して基板の面に沿って
水平方向に流れ、流出液整流板の流出孔より外部へ流出
する。この時、振動板の振動にも助けられて基板に付着
しているゴミが遊離し、外部へ流出する。そして、基板
を槽外へ取り出すときにもゴミが再付着することない。
【0008】
【実施例】以下、この発明の実施例を図面を参照して説
明する。図1において、洗浄槽(基板洗浄槽)1には、
その側壁1aに洗浄液供給口2が設けられ、この側壁1
aに近接して、これに平行に洗浄液が通過する複数の流
入孔3を施した流入液整流板1bと、同じく複数の流出
孔4が施され、、該流入液、整流板1bと平行な(対向
して)流出液整流板1cとが設けられている。そして、
これら流入液整流板1b及び流出液整流板1cとの中間
位置に基板7を設置したキャリア6が挿入・配置されて
おり、該キャリア6に対向する洗浄槽1の底面にはゴミ
の遊離を助けるための振動板10が設置されている。
【0009】上記構成において、洗浄液供給口2より供
給された洗浄液は矢印方向に流れ込み、流入液整流板1
bの流入孔2を通って、基板7の面に沿って水平方向に
流れ、流出液整流板1cの流出孔4から洗浄槽1の外部
へ流出する。この時、洗浄液の水平方向の流れによって
基板7に付着している微小なゴミ等が洗浄され、同時に
振動板10によって超音波振動を起こすことにより、基
板7のゴミの遊離を助ける。この洗浄作用によって遊離
したゴミは洗浄液の流れに沿って流出孔4より流出す
る。
【0010】このように、洗浄液は基板7及びキャリア
6に対して平行(水平)に流れるので洗浄槽1の中央部
に従来のような洗浄液の淀みができないため、基板7を
洗浄槽1から取り出す際に、一度遊離したゴミが再付着
することがない。
【0011】
【発明の効果】以上説明したように、この発明によれ
ば、洗浄液が基板及びキャリアに対して平行(水平)に
流れるように洗浄槽の流入及び流出液整流板を該洗浄槽
の側壁に対して平行(底面に対して垂直)に設けたの
で、従来のような洗浄液の淀みができることなく、基板
を洗浄槽から取り出す時に、一度基板から遊離したゴミ
が再付着するのを防止することができるものである。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate cleaning tank for cleaning a semiconductor substrate in pretreatment of a semiconductor device manufacturing process. 2. Description of the Related Art In recent years, as the density of semiconductor devices has increased, the pattern to be formed has become finer, and the yield depends on the presence or absence of minute dust adhering to the surface of a semiconductor substrate in the manufacturing process of the semiconductor device. It has come to influence.
Therefore, a step of cleaning a semiconductor substrate (hereinafter referred to as a substrate) becomes important as a pretreatment in the manufacturing process. In this substrate cleaning step, generally, a semiconductor substrate is installed in a carrier (conveying means), the semiconductor substrate is inserted into a cleaning tank, and the cleaning liquid is injected from the cleaning liquid supply port to deposit dust on the substrate. With the cleaning liquid. As a specific example, in Japanese Patent Laid-Open No. 2-137321, as shown in FIG. 2, a diaphragm 10 for improving the cleaning effect of dust on the cleaning liquid supply port 20a at the center of the bottom surface of the cleaning tank 20 and its surroundings. Is provided, and a rectifying plate 11 for rectifying the cleaning liquid is provided in parallel with the bottom surface, and after inserting the carrier 6 on which the substrate 7 is installed into the cleaning tank 20, the cleaning liquid is supplied. When it is made to flow in through the port 20a, it is jetted through the flow straightening plate 11 as shown by the arrow and flows out from the peripheral portion of the cleaning tank 20 to the outside. In this case, the cleaning liquid (arrow) flowing upward near the peripheral edge portion is strongly discharged by the outward force and is discharged over the peripheral edge portion. However, in the above conventional substrate cleaning layer, the cleaning liquid flowing upward in the central portion of the cleaning tank 20 has an outward force due to the surface resistance of the substrate 7 and the carrier 6. Since the stagnation is weak and a stagnation with a slow moving speed is generated in the central layer portion of the cleaning tank 20, the dust released from the substrate 7 gathers and floats in the central portion of the upper layer of the cleaning tank 20, so that the substrate 7 is cleaned. There was a problem that the dust that had been washed once and re-attached to it again when it was taken out from the container. Therefore, the object of the present invention is to solve the above-mentioned problems of the prior art, and to remove the substrate from the cleaning tank,
It is an object of the present invention to provide a substrate cleaning apparatus that can perform effective cleaning without dust once detached from reattaching. [0006] The gist of the present invention is to rectify the cleaning liquid supplied from the cleaning liquid supply port and the external cleaning liquid supply port and direct the rectified liquid toward the substrate installed on the carrier. In a substrate cleaning tank provided with an inflow liquid rectifying plate having a plurality of inflow holes and a vibration plate provided on the bottom face of the tank, the inflow liquid rectifying plate is provided in a direction perpendicular to the bottom face of the tank, and An outflow liquid straightening plate having a plurality of outflow holes for allowing the cleaning liquid having passed through the inflow hole to flow horizontally along the surface of the substrate is provided in parallel with the inflow liquid straightening plate. There is something. Therefore, the cleaning liquid supplied from the cleaning liquid supply port flows horizontally along the surface of the substrate through the inflow hole of the inflow liquid straightening plate, and flows out from the outflow hole of the outflow liquid straightening plate to the outside. To do. At this time, the dust attached to the substrate is released by the vibration of the diaphragm, and flows out to the outside. Further, dust is not redeposited even when the substrate is taken out of the bath. Embodiments of the present invention will be described below with reference to the drawings. In FIG. 1, a cleaning tank (substrate cleaning tank) 1 includes
A cleaning liquid supply port 2 is provided on the side wall 1 a, and the side wall 1 a
Inflow liquid rectifying plate 1b having a plurality of inflow holes 3 through which the cleaning liquid passes in parallel with a and a plurality of outflow holes 4 are provided, and the inflow liquid and the rectifying plate 1b are parallel to the inflow liquid. An effluent rectifying plate 1c is provided (oppositely). And
A carrier 6 having a substrate 7 is inserted and arranged at an intermediate position between the inflow liquid rectifying plate 1b and the outflow liquid rectifying plate 1c, and the bottom of the cleaning tank 1 facing the carrier 6 helps release of dust. A vibrating plate 10 is installed. In the above structure, the cleaning liquid supplied from the cleaning liquid supply port 2 flows in the direction of the arrow, and the inflow liquid straightening plate 1
It flows in the horizontal direction along the surface of the substrate 7 through the inflow hole 2 of b, and flows out of the cleaning tank 1 through the outflow hole 4 of the outflow liquid rectifying plate 1c. At this time, minute dust and the like adhering to the substrate 7 is washed by the horizontal flow of the cleaning liquid, and at the same time, ultrasonic vibration is generated by the vibration plate 10 to help release the dust on the substrate 7. The dust released by this cleaning action flows out from the outflow hole 4 along the flow of the cleaning liquid. As described above, since the cleaning liquid flows parallel (horizontal) to the substrate 7 and the carrier 6, the cleaning liquid cannot stagnate in the central portion of the cleaning tank 1 as in the conventional case, and the substrate 7 is taken out from the cleaning tank 1. In this case, once released dust does not reattach. As described above, according to the present invention, the inflow and outflow liquid rectifying plates of the cleaning tank are arranged so that the cleaning liquid flows in parallel (horizontal) to the substrate and the carrier. Since it is installed parallel to the side wall (perpendicular to the bottom surface), it prevents the stagnation of the cleaning liquid as in the past and prevents the dust once detached from the substrate from reattaching when the substrate is taken out from the cleaning tank. Is something that can be done.
【図面の簡単な説明】
【図1】この発明の実施例を示す基板洗浄槽の側断面図
である。
【図2】従来の基板洗浄槽を示す側断面図である。
【符号の説明】
1 洗浄槽
1b 流入液整流板
1c 流出液整流板
2 洗浄液供給口
3 流入孔
4 流出孔
6 キャリア
7 基板
10 振動板BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side sectional view of a substrate cleaning tank showing an embodiment of the present invention. FIG. 2 is a side sectional view showing a conventional substrate cleaning tank. [Explanation of Codes] 1 cleaning tank 1b inflow liquid rectifying plate 1c outflow liquid rectifying plate 2 cleaning liquid supply port 3 inflow hole 4 outflow hole 6 carrier 7 substrate 10 diaphragm
Claims (1)
された洗浄液を整流してキャリアに設置した基板の方へ
向けるための複数の流入孔を有する流入液整流板と、槽
底面に設けられた振動板とを備えた基板洗浄槽におい
て、前記流入液整流板は前記槽底面に対して垂直方向に
設けられており、且つ前記流入孔を通過した洗浄液が前
記基板の面に沿って水平方向に流れた後、外部へ流出さ
せるための複数の流出孔を有する流出液整流板が前記流
入液整流板に平行して設けられていることを特徴とする
基板洗浄槽。Claims [Claim 1] Inflow liquid rectification having a cleaning liquid supply port and a plurality of inflow holes for rectifying the cleaning liquid supplied from the outer cleaning liquid supply port and directing the rectified liquid toward the substrate installed on the carrier. In a substrate cleaning tank comprising a plate and a vibrating plate provided on the bottom surface of the tank, the inflow liquid rectifying plate is provided in a direction perpendicular to the bottom surface of the tank, and the cleaning liquid passing through the inflow hole is Substrate cleaning, characterized in that an outflow liquid rectifying plate having a plurality of outflow holes for flowing out to the outside after flowing in the horizontal direction along the surface of the substrate is provided in parallel with the inflow liquid rectifying plate. Tank.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2931391A JPH05299406A (en) | 1991-01-29 | 1991-01-29 | Substrate washing tub |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2931391A JPH05299406A (en) | 1991-01-29 | 1991-01-29 | Substrate washing tub |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05299406A true JPH05299406A (en) | 1993-11-12 |
Family
ID=12272732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2931391A Pending JPH05299406A (en) | 1991-01-29 | 1991-01-29 | Substrate washing tub |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05299406A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6849865B1 (en) | 2002-11-21 | 2005-02-01 | Mitsubishi Denki Kabushiki Kaisha | Chemical processor |
JP2007275723A (en) * | 2006-04-04 | 2007-10-25 | Hitachi Global Storage Technologies Netherlands Bv | Cleaning device and cleaning method |
US20090283158A1 (en) * | 2008-05-16 | 2009-11-19 | Xyratex Corporation | Laminated walls for uniform fluid flow |
CN111906077A (en) * | 2020-06-29 | 2020-11-10 | 广州国显科技有限公司 | Cleaning device |
-
1991
- 1991-01-29 JP JP2931391A patent/JPH05299406A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6849865B1 (en) | 2002-11-21 | 2005-02-01 | Mitsubishi Denki Kabushiki Kaisha | Chemical processor |
US6992016B2 (en) | 2002-11-21 | 2006-01-31 | Mitsubishi Denki Kabushiki Kaisha | Chemical processing method, and method of manufacturing semiconductor device |
JP2007275723A (en) * | 2006-04-04 | 2007-10-25 | Hitachi Global Storage Technologies Netherlands Bv | Cleaning device and cleaning method |
US20090283158A1 (en) * | 2008-05-16 | 2009-11-19 | Xyratex Corporation | Laminated walls for uniform fluid flow |
US8707971B2 (en) * | 2008-05-16 | 2014-04-29 | Xyratex Corporation | Laminated walls for uniform fluid flow |
CN111906077A (en) * | 2020-06-29 | 2020-11-10 | 广州国显科技有限公司 | Cleaning device |
CN111906077B (en) * | 2020-06-29 | 2022-03-25 | 广州国显科技有限公司 | Cleaning device |
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