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JPH0482184B2 - - Google Patents

Info

Publication number
JPH0482184B2
JPH0482184B2 JP61273280A JP27328086A JPH0482184B2 JP H0482184 B2 JPH0482184 B2 JP H0482184B2 JP 61273280 A JP61273280 A JP 61273280A JP 27328086 A JP27328086 A JP 27328086A JP H0482184 B2 JPH0482184 B2 JP H0482184B2
Authority
JP
Japan
Prior art keywords
chip
substrate
adhesive
bonding
bump
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61273280A
Other languages
Japanese (ja)
Other versions
JPS63127541A (en
Inventor
Noryuki Inagaki
Yutaka Makino
Akihiro Yamamoto
Shinya Matsumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP61273280A priority Critical patent/JPS63127541A/en
Publication of JPS63127541A publication Critical patent/JPS63127541A/en
Publication of JPH0482184B2 publication Critical patent/JPH0482184B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto

Landscapes

  • Wire Bonding (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明はチツプの接合方法に関し、特にフリツ
プチツプのようにチツプの一側面に形成されたバ
ンプ接点を基板のリードに電気的に接続すると同
時にチツプを基板に固定するチツプの接合方法に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a method for bonding chips, and in particular, to electrically connect bump contacts formed on one side of a chip, such as a flip chip, to leads of a board, and at the same time connect the chip to a board. This relates to a method for joining chips that are fixed to

従来の技術 従来から、バンプ接点を有するチツプの接合方
法として、金属間接合による接合方法が種々提案
されている。例えば、本出願人は先に第7図に示
すような接合方法を提案している。即ち、チツプ
41をそのバンプ接点を上向きにした状態で粘着
性フイルム42にて保持するとともにこの粘着性
フイルム42をウエハリング43を介して位置決
め装置44にて位置決めし、このチツプ41を図
示しない吸着コレツトを備えた移送装置にて、昇
降可能でかつチツプを真空吸着するように構成さ
れた押圧体45の載置面46上に移載し、この載
置面46上のチツプ位置を上方に配置した位置検
出装置47にて検出するとともにその位置検出に
応じて押圧体45を位置決め装置48にて位置補
正し、さらに基板位置決め装置52にて前記押圧
体45の上方の水平面上で基板51を移動させる
とともに、基板位置検出装置53で基板51の位
置を検出して基板51のチツプ接合位置を前記載
置面46上のチツプ41の直上に位置させ、その
後押圧体45を上昇させて基板51にチツプ41
を加圧するとともに、熱又は超音波を印加して、
チツプ41のバンプ接点を基板51のリードに接
合する方法を提案した。
BACKGROUND ART Conventionally, various bonding methods using metal-to-metal bonding have been proposed as methods for bonding chips having bump contacts. For example, the present applicant has previously proposed a joining method as shown in FIG. That is, the chip 41 is held with the adhesive film 42 with its bump contacts facing upward, and the adhesive film 42 is positioned by the positioning device 44 via the wafer ring 43, and the chip 41 is held by suction (not shown). Using a transfer device equipped with a collet, the chip is transferred onto the mounting surface 46 of a pressing body 45 that is movable up and down and configured to vacuum-adsorb the chip, and the chip is positioned upward on the mounting surface 46. The position of the pressing body 45 is detected by the position detection device 47, and the position of the pressing body 45 is corrected by the positioning device 48 according to the position detection, and the substrate 51 is further moved on a horizontal plane above the pressing body 45 by the substrate positioning device 52. At the same time, the position of the substrate 51 is detected by the substrate position detection device 53, and the chip bonding position of the substrate 51 is positioned directly above the chip 41 on the mounting surface 46, and then the pressing body 45 is raised to place the chip on the substrate 51. Chip 41
By pressurizing and applying heat or ultrasonic waves,
A method of bonding the bump contacts of the chip 41 to the leads of the substrate 51 was proposed.

発明が解決しようとする問題点 ところで、上記チツプの接合方法においては、
接合面に圧力を加えながら熱又は超音波を加えて
金属間接合を行い、チツプの固定と電気的接合を
同時に行うようにしているため、基板やチツプに
熱や超音波を印加しなければならないという問題
があるとともに、僅かな条件の相違によつても確
実に接合できない場合が生じるという問題があつ
た。
Problems to be solved by the invention By the way, in the above chip joining method,
Metal-to-metal bonding is performed by applying heat or ultrasonic waves while applying pressure to the bonding surfaces, and the chips are fixed and electrically bonded at the same time, so heat and ultrasonic waves must be applied to the substrate and chips. In addition to this problem, there was also the problem that reliable bonding may not be possible even due to slight differences in conditions.

本発明は上記従来の問題点に鑑み、基板に対し
てチツプを押圧することにより、バンプ接点とリ
ードを電気的に接続した状態でチツプを基板に対
して確実に固定できるチツプの接合方法を提供す
ることを目的とする。
In view of the above-mentioned conventional problems, the present invention provides a chip bonding method that can reliably fix the chip to the board while the bump contacts and leads are electrically connected by pressing the chip against the board. The purpose is to

問題点を解決するための手段 本発明は上記目的を達成するため、チツプを載
置するチツプテーブルと、前記チツプテーブルに
対向してリード配置され、リードが形成された透
明基板を支持する基板支持台と、接着剤塗布装置
および紫外線照射装置が並設された作業台とを用
いて前記透明基板上のリードとバンプとを電気的
に接続するチツプの接合方法であつて、チツプの
バンプ接点が前記透明基板と対向するように前記
チツプを前記チツプテーブル上に載置する工程
と、前記チツプのバンプ接点が形成された面に前
記作業装置の前記接着剤塗布装置を用いて紫外線
硬化型の接着剤を塗布する工程と、前記チツプの
バンプ接点が前記透明基板のリードに圧接するよ
うにチツプと基板とを加圧する工程と、前記作業
装置を移動させてチツプと基板との接合部上に前
記紫外線照射装置を位置させる工程と、前記紫外
線照射装置を用いて、接合部に前記透明基板の裏
面側から紫外線を照射して接着剤を硬化させバン
プ接点とリードとを電気的に接続した状態でチツ
プを基板に固定する工程を備えていることを特徴
とする。
Means for Solving the Problems In order to achieve the above object, the present invention includes a chip table on which a chip is placed, and a substrate support that supports a transparent substrate with leads arranged opposite to the chip table and on which leads are formed. A chip bonding method in which the leads and bumps on the transparent substrate are electrically connected using a table and a work table on which an adhesive coating device and an ultraviolet irradiation device are installed in parallel, the bump contacts of the chip are placing the chip on the chip table so as to face the transparent substrate; applying ultraviolet curable adhesive to the surface of the chip on which bump contacts are formed using the adhesive applicator of the work device; a step of applying pressure between the chip and the substrate so that the bump contacts of the chip come into pressure contact with the leads of the transparent substrate; and a step of moving the working device to apply the agent on the joint between the chip and the substrate. a step of positioning an ultraviolet irradiation device, and using the ultraviolet irradiation device to irradiate the bonding portion with ultraviolet rays from the back side of the transparent substrate to cure the adhesive and electrically connect the bump contact and the lead; The method is characterized by a step of fixing the chip to the substrate.

作 用 本発明は上記構成を有するので、バンプ接点を
有するチツプを基板に接合するのに、接着剤を用
いて接合しており、熱や超音波を印加する必要が
ないので、装置が簡単になるとともに容易かつ確
実にチツプを基板に固定していることができ、し
かもバンプ接点をリードに圧接して電気的接続を
確保した状態でそのまま接着剤を硬化させて接合
しているので、接着剤の硬化による機械的接合完
了後、加圧を解除してもバンプ接点はその弾性復
元力によつてリードに圧接されて電気的接続が保
持され、機械的並びに電気的接合を確実に得るこ
とができる。
Function Since the present invention has the above-mentioned configuration, an adhesive is used to bond a chip having bump contacts to a substrate, and there is no need to apply heat or ultrasonic waves, so the device can be easily constructed. In addition, the chip can be easily and reliably fixed to the board, and since the bump contacts are pressed against the leads to ensure electrical connection, the adhesive is cured and bonded. After the mechanical bonding is completed by curing, even if the pressure is removed, the bump contacts are pressed against the leads by their elastic restoring force and the electrical connection is maintained, ensuring a reliable mechanical and electrical bond. can.

また、チツプと基板の加圧時にそれらの平行調
整を行うことにより、接合面が確実に圧接し、信
頼性の高い電気的接合状態を得ることができる。
Furthermore, by adjusting the parallelism between the chip and the substrate when pressurizing them, the bonding surfaces can be reliably pressed against each other, and a highly reliable electrical bonding state can be obtained.

実施例 以下、本発明の一実施例を第1図〜第6図を参
照しながら説明する。
Embodiment An embodiment of the present invention will be described below with reference to FIGS. 1 to 6.

第5図において、1はICチツプ等のチツプで、
その一側面にはバンプ接点2が突出して設けられ
ており、このバンプ接点2が基板3のチツプ接着
面に形成されたリード4に電気的に接続される。
前記チツプ1はチツプテーブル5の上端の加圧台
5a上に図示しない移送装置にてチツプ供給部か
ら移載される。前記チツプテーブル5は、下方か
らX軸方向に移動するXテーブル6と、X軸に直
角なY軸方向に移動するYテーブル7と、X軸及
びY軸に直角なZ軸を中心として回転するθテー
ブル8と、Z軸方向に移動するZテーブル9と、
X軸及びY軸に平行な軸回りに揺動可能な平行調
整テーブル10とから構成されている。一方、前
記基板3は、透明なガラス基板にて構成され、そ
のチツプ装着面の適当な位置に位置決め用の基準
標識(図示せず)が設けられている。この基板3
は、前記チツプテーブル5の上方の配設された基
板移動装置11に保持具12にてチツプ装着面を
下向きにして保持されている。この基板移動装置
11はチツプテーブル5の上方位置とその側方に
退避した位置との間で移動可能にかつ保持した基
板3の任意の位置を前記チツプテーブル5の加圧
台5aの中心位置に正確に対向するように位置決
め可能に構成され、基板移動装置11が退避位置
に位置するときに、図示しない基板供給取出装置
にて基板3が供給されるとともにチツプ1を装着
された基板3を取出すように構成されている。
又、基板移動装置11の基板3の背面が当接する
が支持板11aには、前記基板に設けられた基準
標識の配置位置とチツプ装着位置に対応して貫通
孔13が穿設されている。14は、前記基板移動
装置11の上方に配設された作業台で、CCTVカ
メラを有する焦点検出装置付顕微鏡15と、接着
剤を滴下するデイスペンサから成る接着剤塗布装
置16と、紫外線照射具17とが並設されてお
り、Z軸方向に移動可能なかつ上記各装置の配設
方向に移動可能に構成されている。前記紫外線照
射具17には、シヤツターを有する水銀灯具18
より光フアイバー19を経て紫外線が導かれてい
る。また、前記焦点検出装置付顕微鏡15は、前
記作業台14に対してZ軸方向に移動可能な可動
台20に取付けられている。
In Figure 5, 1 is a chip such as an IC chip,
A bump contact 2 is provided protruding from one side thereof, and this bump contact 2 is electrically connected to a lead 4 formed on the chip adhesion surface of the substrate 3.
The chips 1 are transferred from the chip supply section onto the pressure table 5a at the upper end of the chip table 5 by a transfer device (not shown). The chip table 5 includes an X table 6 that moves in the X-axis direction from below, a Y table 7 that moves in the Y-axis direction perpendicular to the X-axis, and a Z-axis that rotates around the Z-axis that is perpendicular to the X and Y axes. A θ table 8, a Z table 9 that moves in the Z-axis direction,
It is composed of a parallel adjustment table 10 that can swing around an axis parallel to the X-axis and the Y-axis. On the other hand, the substrate 3 is made of a transparent glass substrate, and a reference mark (not shown) for positioning is provided at an appropriate position on the chip mounting surface. This board 3
is held by a holder 12 in a substrate moving device 11 disposed above the chip table 5 with the chip mounting surface facing downward. This substrate moving device 11 is movable between a position above the chip table 5 and a position evacuated to the side thereof, and moves the held substrate 3 to an arbitrary position at the center of the pressurizing table 5a of the chip table 5. When the substrate moving device 11 is located at the retracted position, the substrate 3 is supplied by a substrate supply/take-out device (not shown) and the substrate 3 on which the chip 1 is mounted is taken out. It is configured as follows.
Further, through holes 13 are bored in the support plate 11a against which the back surface of the substrate 3 of the substrate moving device 11 comes into contact, corresponding to the placement position of the reference mark provided on the substrate and the chip mounting position. Reference numeral 14 denotes a workbench disposed above the substrate moving device 11, which includes a microscope 15 with a focus detection device equipped with a CCTV camera, an adhesive applicator 16 consisting of a dispenser that drips adhesive, and an ultraviolet irradiator 17. are arranged in parallel, and are configured to be movable in the Z-axis direction and movable in the arrangement direction of each of the above devices. The ultraviolet irradiator 17 includes a mercury lamp 18 having a shutter.
The ultraviolet rays are guided through the optical fiber 19. Further, the microscope 15 with a focus detection device is attached to a movable table 20 that is movable in the Z-axis direction with respect to the workbench 14.

前記可動台20および焦点検出装置付顕微鏡1
5は、第6図に示すように構成されている。照明
装置21により証明されたチツプ1の上面や基板
3のチツプ装着面の標識等の像は対物レンズ22
によりCCTVカメラ23の撮像管上に結ばれる
が、途中その光の一部はビームスプリツター24
によつて横方向に取り出され、さらにビームスプ
リツターと全反射プリズムの組み合わせ25によ
り直進光と、より長い光路の光束としてCCDラ
インセンサー26上に2つの像を結ぶ。27は焦
点判定装置であり、CCDラインセンサー26上
の2つの像のコントラスト差から焦点位置方向を
判定し、モータドライバー28によりモータ29
を駆動し、ボールねじ30により可動台20を移
動駆動する。この可動台20の高さ位置は変位検
出器31とカウンタ32により中央制御装置(以
下CPUと略す)にモニターされる。CCTVカメ
ラ23の画像信号はカメラコントロールユニツト
33を経てパターンマツチング方式位置読取装置
34とモニターテレビ35に送られ、位置読取り
結果はCPUに伝送される。
The movable table 20 and the microscope 1 with a focus detection device
5 is constructed as shown in FIG. The image of the top surface of the chip 1 or the mark on the chip mounting surface of the substrate 3, which is verified by the illumination device 21, is captured by the objective lens 22.
The light is focused on the image pickup tube of the CCTV camera 23, but part of the light passes through the beam splitter 24.
The light is taken out laterally by a beam splitter and a total reflection prism 25 to form two images on a CCD line sensor 26 as straight light and a light beam with a longer optical path. 27 is a focus determination device, which determines the focus position direction from the contrast difference between two images on the CCD line sensor 26, and drives a motor 29 by a motor driver 28.
is driven, and the movable base 20 is moved and driven by the ball screw 30. The height position of the movable base 20 is monitored by a central control unit (hereinafter abbreviated as CPU) using a displacement detector 31 and a counter 32. The image signal of the CCTV camera 23 is sent via the camera control unit 33 to a pattern matching type position reading device 34 and a monitor television 35, and the position reading result is transmitted to the CPU.

以上の構成において、チツプ1を基板3の所定
位置に装着する動作を第1図及び第2図により説
明する。まず、予め退避位置に移動した基板移動
装置11に対して図示しない基板供給取出装置に
て基板3を供給し、またチツプテーブル5の加圧
台5a上に図示しない移送装置にてチツプ1を移
載して保持する。次に、基板移動装置11をチツ
プテーブル5の上方位置に移動させるとともに、
作業台14を所定位置まで下降させ、その後第1
図aに示すように、基板3に設けられた3つの基
準標識を順次焦点検出装置付顕微鏡15の直下位
置に位置決めするとともに可動台20を移動させ
て自動焦点合せ動作を行わせ、合焦点時の可動台
20の高さ位置を変位検出器31とカウンタ32
によつて読み取つて、基板3の3点のそれぞれの
高さを検出する。これによつて基板3のチツプ装
着面の位置及び傾きを検出することができる。次
に、基板移動装置11を退避位置に移動させた
後、第1図bに示すように、作業台14を所定位
置までさらに下降させ、チツプテーブル5上のチ
ツプ1を焦点検出装置付顕微鏡15の視野に収
め、その画像からチツプ1の位置を検出してXテ
ーブル6、Yテーブル7、θテーブル8を作動さ
せ、チツプ1の中心を所定位置に位置決めし、次
いでチツプ1の上面の3点を順次焦点検出装置付
顕微鏡15の直下位置に位置決めするとともに可
動台20を移動させて自動焦点動作を行わせ、合
焦点時の可動台20の高さ位置と上記と同様に読
み取り、チツプ1の上面の3点の高さを検出し、
チツプ1の上面位置と傾きを検出する。次いで、
上記検出結果から、前記基板3のチツプ装着面に
対してチツプ1の上面が平行となるように平行調
整テーブル10を作動させる。次に、第1図cに
示すように、作業台14を横移動させてチツプ1
上に接着剤塗布装置16を対向位置させ、接着剤
36を吐出することによつて、第3図aに示すよ
うに、チツプ1の上面に接着剤36を塗布する。
続いて、作業台14を上昇させた後、基板移動装
置11をチツプテーブル5の上方位置まで移動さ
せてチツプ1を接合すべき位置をチツプ1の直上
に対向位置させ、Zテーブル9を上昇動作させる
ことによつて、第1図d及び第3図bに示すよう
に、チツプ1を基板3に対して加圧し、チツプ1
のバンプ接点2を基板3のリード4に圧接させ
る。このとき、各バンプ接点2は例えば1辺が
0.1mm程度と一般に小さいため、第4図に示すよ
うに、加圧力によつてバンプ接点2とリード4の
間から接着剤36が完全に排除されるとともにバ
ンプ接点2がリード4表面に食い込むようにかつ
弾性的に圧接され、電気的接続が確保される。こ
れと同時に作業台14が横移動して紫外線照射具
17がチツプ1の直上に対向位置するともに作業
台14が下降し、第1図eに示すように紫外線照
射具17から基板3の貫通孔13及び透明な基板
3を通して接着剤36に紫外線を照射してこれを
硬化させ、チツプ1を基板3に固定する。この
間、前記バンプ接点2とリード4の圧接状態を維
持しておくことによつて、接着剤36が硬化する
と、チツプ1の加圧を解除しても上記圧接状態は
保持され、バンプ接点2とリード4の電気的接続
が確実に保持されるのである。こうして、1つの
チツプの接合が完了すると、基板移動装置11が
退避し、以降順次新たなチツプ1がチツプテーブ
ル5の加圧台5a上に移載され、上記と同様に基
板3に装着固定され、すべてのチツプ1が装着固
定されると基板移動装置11が退避位置に退避し
て基板供給取出装置にて取り出されるとともに、
新たな基板3が供給され、上記動作が繰り返され
るのである。
In the above configuration, the operation of mounting the chip 1 at a predetermined position on the board 3 will be explained with reference to FIGS. 1 and 2. First, the substrate 3 is supplied to the substrate moving device 11, which has been moved to the retracted position in advance, by a substrate supply/take-out device (not shown), and the chip 1 is transferred onto the pressure table 5a of the chip table 5 by a transfer device (not shown). Place and hold. Next, the substrate moving device 11 is moved to a position above the chip table 5, and
The workbench 14 is lowered to a predetermined position, and then the first
As shown in FIG. The height position of the movable table 20 is measured by a displacement detector 31 and a counter 32.
The height of each of the three points on the substrate 3 is detected. Thereby, the position and inclination of the chip mounting surface of the board 3 can be detected. Next, after moving the substrate moving device 11 to the retracted position, the work table 14 is further lowered to a predetermined position as shown in FIG. The position of the chip 1 is detected from the image, the X table 6, the Y table 7, and the θ table 8 are operated to position the center of the chip 1 at a predetermined position. are sequentially positioned directly below the microscope 15 with a focus detection device, and the movable base 20 is moved to perform an automatic focusing operation.The height position of the movable base 20 at the focused point is read in the same manner as above, and Detect the height of three points on the top surface,
The upper surface position and inclination of chip 1 are detected. Then,
Based on the above detection results, the parallel adjustment table 10 is operated so that the top surface of the chip 1 is parallel to the chip mounting surface of the board 3. Next, as shown in FIG. 1c, the work table 14 is moved laterally and the chip 1
The adhesive applicator 16 is placed oppositely above and discharges the adhesive 36, thereby applying the adhesive 36 to the upper surface of the chip 1, as shown in FIG. 3a.
Subsequently, after raising the workbench 14, the substrate moving device 11 is moved to a position above the chip table 5, the position where the chip 1 is to be bonded is positioned directly above the chip 1, and the Z table 9 is raised. As shown in FIG. 1d and FIG. 3b, the chip 1 is pressed against the substrate 3, and the chip 1 is
The bump contacts 2 are brought into pressure contact with the leads 4 of the substrate 3. At this time, each bump contact 2 has one side, for example.
Since it is generally small, about 0.1 mm, the adhesive 36 is completely removed from between the bump contact 2 and the lead 4 by the pressure applied, and the bump contact 2 digs into the surface of the lead 4, as shown in FIG. They are pressed together and elastically to ensure electrical connection. At the same time, the workbench 14 moves laterally so that the ultraviolet ray irradiation tool 17 is located directly above the chip 1, and the workbench 14 is lowered, allowing the ultraviolet ray irradiation tool 17 to pass through the through hole in the substrate 3, as shown in FIG. 1e. The adhesive 36 is irradiated with ultraviolet light through the adhesive 13 and the transparent substrate 3 to cure it, thereby fixing the chip 1 to the substrate 3. During this time, by maintaining the pressure contact state between the bump contact 2 and the lead 4, when the adhesive 36 hardens, the pressure contact state is maintained even when the pressure on the chip 1 is released, and the bump contact 2 and The electrical connection of the leads 4 is reliably maintained. When bonding of one chip is completed in this way, the substrate moving device 11 is retracted, and new chips 1 are sequentially transferred onto the pressure table 5a of the chip table 5, and are attached and fixed to the substrate 3 in the same manner as above. When all the chips 1 are mounted and fixed, the substrate moving device 11 is retracted to the retracted position and taken out by the substrate supplying and unloading device, and
A new substrate 3 is supplied and the above operation is repeated.

尚、上記実施例では基板3及びチツプ1の3点
位置を検出して平行調整を行つたが、基板3に基
準面としての信頼性がある場合はチツプ1のみ3
点位置を検出して平行調整してもよく、さらに両
者の平行度が高い場合や、加圧台5aに球面軸受
等が内蔵されていて基板3に対して平行調整機能
を有している場合には平行調整工程を省略するこ
ともできる。又、接着剤はチツプ1側でなく、基
板3側に塗布してもよい。さらに、上記実施例で
は基板3として透明な基板を用いた例を示した
が、基板3の3点位置の検出及び紫外線照射をチ
ツプ装着面側から行うようにすれば、不透明な基
板にも適用可能である。
In the above embodiment, parallel adjustment was performed by detecting the positions of the three points of the board 3 and the chip 1. However, if the board 3 is reliable as a reference surface, only the position of the chip 1 can be adjusted at 3 points.
Parallel adjustment may be performed by detecting point positions, and in cases where the degree of parallelism between the two is high, or when the pressurizing table 5a has a built-in spherical bearing or the like and has a parallel adjustment function with respect to the substrate 3. In this case, the parallel adjustment step can also be omitted. Further, the adhesive may be applied not to the chip 1 side but to the substrate 3 side. Furthermore, although the above embodiment shows an example in which a transparent substrate is used as the substrate 3, it can also be applied to an opaque substrate by detecting the three positions of the substrate 3 and irradiating the ultraviolet rays from the chip mounting surface. It is possible.

発明の効果 本発明のチツプの接合方法によれば、以上のよ
うにバンプ接点を有するチツプを基板に接着剤を
用いて接合しており、熱や超音波を印加する必要
がないので、装置が簡単になることともに容易か
つ確実にチツプを基板に固定することができ、し
かもバンプ接点をリードに圧接して電気的接続を
確保した状態でそのまま接着剤を硬化させて接合
しているので、接着剤の硬化による機械的接合完
了後、加圧を解除してもバンプ接点はその弾性復
元力によつてリードに圧接されて電気的接続が保
持され、機械的並びに電気的接合を確実に得るこ
とができる。
Effects of the Invention According to the chip bonding method of the present invention, a chip having bump contacts is bonded to a substrate using an adhesive as described above, and there is no need to apply heat or ultrasonic waves, so the device can In addition to being simple, it is also possible to easily and reliably fix the chip to the board, and since the bump contacts are pressed against the leads and the electrical connection is secured, the adhesive is cured and bonded. After the mechanical bonding is completed due to curing of the agent, even if the pressure is removed, the bump contact is pressed against the lead by its elastic restoring force and the electrical connection is maintained, ensuring mechanical and electrical bonding. I can do it.

また、第2発明ではチツプと基板の加圧時にそ
れらの平行調整を行つているので、すべての接合
面が確実に圧接して信頼性の高い電気的接合状態
を得ることができる等、大なる効果を発揮する。
In addition, in the second invention, since the chip and the substrate are adjusted in parallel when they are pressurized, it is possible to ensure that all bonding surfaces are in pressure contact and obtain a highly reliable electrical bonding state. be effective.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の工程図、第2図は
同フローチヤート、第3図a,bはそれぞれ接着
剤の塗布状態及びチツプの圧接状態の拡大正面
図、第4図はバンプ接点とリードの圧接状態を示
す拡大断面図、第5図は接合装置の全体概略構成
を示す部分断面正面図、第6図は焦点検出装置付
顕微鏡の構成原理図、第7図は従来装置の概略構
成を示す正面図である。 1……チツプ、2……バンプ接点、3……基
板、4……リード、5……チツプテーブル、5a
……加圧台、10……平行調整テーブル、15…
…焦点検出装置付顕微鏡、16……接着剤塗布装
置、17……紫外線照射具。
Fig. 1 is a process diagram of an embodiment of the present invention, Fig. 2 is a flowchart of the same, Figs. 3 a and b are enlarged front views of the state of adhesive application and the state of pressure contact of the chip, and Fig. 4 is a bump. FIG. 5 is a partially sectional front view showing the general configuration of the bonding device; FIG. 6 is a diagram showing the principle of construction of a microscope with a focus detection device; FIG. 7 is a diagram of the conventional device. FIG. 2 is a front view showing a schematic configuration. 1... Chip, 2... Bump contact, 3... Board, 4... Lead, 5... Chip table, 5a
...Pressure table, 10...Parallel adjustment table, 15...
...Microscope with focus detection device, 16...Adhesive coating device, 17...Ultraviolet irradiation tool.

Claims (1)

【特許請求の範囲】[Claims] 1 チツプを載置するチツプテーブルと、前記チ
ツプテーブルに対向して配置され、リードが形成
された透明基板を支持する基板支持台と、接着剤
塗布装置および紫外線照射装置が並設された作業
台とを用いて前記透明基板上のリードとバンプと
を電気的に接続するチツプの接合方法であつて、
チツプのバンプ接点が前記透明基板と対向するよ
うに前記チツプを前記チツプテーブル上に載置す
る工程と、前記チツプのバンプ接点が形成された
面に前記作業装置の前記接着剤塗布装置を用いて
紫外線硬化型の接着剤を塗布する工程と、前記チ
ツプのバンプ接点が前記透明基板のリードに圧接
するようにチツプと基板とを加圧する工程と、前
記作業装置を移動させてチツプと基板との接合部
上に前記紫外線照射装置を位置させる工程と、前
記紫外線照射装置を用いて、接合部に前記透明基
板の裏面側から紫外線を照射して接着剤を硬化さ
せバンプ接点とリードとを電気的に接続した状態
でチツプを基板に固定する工程とを備えてなるこ
とを特徴とするチツプの接合方法。
1. A chip table on which a chip is placed, a substrate support stand placed opposite to the chip table and supporting a transparent substrate on which leads are formed, and a workbench on which an adhesive coating device and an ultraviolet irradiation device are installed in parallel. A chip bonding method for electrically connecting leads and bumps on the transparent substrate using
placing the chip on the chip table so that the bump contacts of the chip face the transparent substrate; and using the adhesive application device of the working device on the surface of the chip on which the bump contacts are formed. a step of applying an ultraviolet curable adhesive, a step of pressurizing the chip and the substrate so that the bump contacts of the chip come into pressure contact with the leads of the transparent substrate, and a step of moving the working device to connect the chip and the substrate. a step of positioning the ultraviolet irradiation device on the bonding portion, and using the ultraviolet irradiation device, irradiating the bonding portion with ultraviolet rays from the back side of the transparent substrate to harden the adhesive and electrically connect the bump contact and the lead. A method for bonding chips, comprising the step of fixing the chips to a substrate while connected to the substrate.
JP61273280A 1986-11-17 1986-11-17 Method of bonding chip Granted JPS63127541A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61273280A JPS63127541A (en) 1986-11-17 1986-11-17 Method of bonding chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61273280A JPS63127541A (en) 1986-11-17 1986-11-17 Method of bonding chip

Publications (2)

Publication Number Publication Date
JPS63127541A JPS63127541A (en) 1988-05-31
JPH0482184B2 true JPH0482184B2 (en) 1992-12-25

Family

ID=17525645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61273280A Granted JPS63127541A (en) 1986-11-17 1986-11-17 Method of bonding chip

Country Status (1)

Country Link
JP (1) JPS63127541A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69009259T2 (en) * 1989-02-02 1994-10-13 Matsushita Electric Ind Co Ltd Method of assembling semiconductor devices.
JPH02234447A (en) * 1989-03-07 1990-09-17 Nec Corp Method of connection semiconductor integrated circuit element
US5766972A (en) * 1994-06-02 1998-06-16 Mitsubishi Denki Kabushiki Kaisha Method of making resin encapsulated semiconductor device with bump electrodes
JP2005028202A (en) * 2003-07-07 2005-02-03 Hitachi Industries Co Ltd Table parallelism adjusting device and dispenser using the same
JP4835530B2 (en) * 2007-07-25 2011-12-14 パナソニック電工株式会社 Flooring
JP2010034585A (en) * 2009-11-06 2010-02-12 Toray Eng Co Ltd Method for adjusting parallelism in chip mounting device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60262430A (en) * 1984-06-08 1985-12-25 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device

Also Published As

Publication number Publication date
JPS63127541A (en) 1988-05-31

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