JPH04290258A - Multichip module - Google Patents
Multichip moduleInfo
- Publication number
- JPH04290258A JPH04290258A JP3053012A JP5301291A JPH04290258A JP H04290258 A JPH04290258 A JP H04290258A JP 3053012 A JP3053012 A JP 3053012A JP 5301291 A JP5301291 A JP 5301291A JP H04290258 A JPH04290258 A JP H04290258A
- Authority
- JP
- Japan
- Prior art keywords
- organic insulating
- ceramic
- ceramic boards
- substrates
- insulating layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/144—Stacked arrangements of planar printed circuit boards
-
- H10W90/724—
Landscapes
- Combinations Of Printed Boards (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、LSIのマルチチップ
モジュールの構造に関し、特に大型コンピュータ等の高
速データ処理システムに用いられるマルチチップモジュ
ールの構造に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to the structure of an LSI multi-chip module, and more particularly to the structure of a multi-chip module used in high-speed data processing systems such as large-scale computers.
【0002】0002
【従来の技術】従来、この種のマルチチップモジュール
としては、プリント基板やセラミック基板にLSIを搭
載したものが代表的である。これらのモジュールは平面
的であり、各々の基板間の電気的接続は、必要数の基板
を並列に並べてその間をケーブル等により接続するかあ
るいは必要数の基板をマザーボードにコネクタ接続し、
このマザーボードを通して、接続していた。2. Description of the Related Art Conventionally, a typical multi-chip module of this type is one in which an LSI is mounted on a printed circuit board or a ceramic substrate. These modules are flat, and electrical connections between each board can be made by arranging the required number of boards in parallel and connecting them with cables, or by connecting the required number of boards to the motherboard with connectors.
It was connected through this motherboard.
【0003】大型コンピュータ等の高速データ処理シス
テムの性能を上げるためには、LSI内における論理ゲ
ートスイッチング速度や、メモリアクセス速度を速くす
るだけでなく、これらLSI間を結ぶ相互配線長を短か
くする必要がある。従来から、大型コンピュータ等の高
速データ処理システムにおいては、この相互配線は多層
配線基板により実現されてきている。したがって相互配
線長をいかに短かくするかということは多層配線基板内
及び多層配線基板間の配線長をいかに短かくするかとい
うことである。In order to improve the performance of high-speed data processing systems such as large-scale computers, it is necessary not only to increase the logic gate switching speed and memory access speed within the LSI, but also to shorten the interconnection length between these LSIs. There is a need. Conventionally, in high-speed data processing systems such as large-sized computers, this interconnection has been realized using multilayer wiring boards. Therefore, how to shorten the mutual wiring length means how to shorten the wiring length within the multilayer wiring board and between the multilayer wiring boards.
【0004】近年とくにLSIの集積化がすすみ大型コ
ンピュータでさえ一枚の多層基板上に必要論理素子をす
べて搭載できるようになってきた。むしろ基板間の信号
遅延が基板内の信号遅延より大きくなるため性能を上げ
るためには、一枚の基板にすべて実装せざるを得なくな
ったと言った方が正しいかもしれない。[0004] In recent years, the integration of LSIs has particularly progressed, and it has become possible to mount all necessary logic elements on a single multilayer board even in large computers. In fact, it may be more accurate to say that the signal delay between boards is greater than the signal delay within the board, so in order to improve performance, it is necessary to mount everything on a single board.
【0005】[0005]
【発明が解決しようとする課題】上述のように多層配線
基板間の配線長を除去するためにワンボードシステムに
した場合、配線基板の大きさはLSI等の回路素子の必
要搭載面積及び外部との信号のやりとりや電力を供給す
るための入出力端子の必要面積から決定される。したが
ってこのような必要面積を確保しつついかに基板内の配
線長を短かくするかが課題となるわけであるが従来の平
面形状の多層配線基板では十分な特性とは言えない。プ
リント基板の場合は表裏二面に素子を搭載できるがこう
すると入出力端子は基板周辺に配置せざるを得なくなる
。したがって
(1)素子と入出力端子の間の距離が大きくなりこの分
配線長が長くなる。[Problems to be Solved by the Invention] As mentioned above, when creating a one-board system in order to eliminate the wiring length between multilayer wiring boards, the size of the wiring board is determined by the required mounting area for circuit elements such as LSI and external space. It is determined from the required area of input/output terminals for exchanging signals and supplying power. Therefore, the problem is how to shorten the wiring length within the board while securing the necessary area, but conventional planar multilayer wiring boards cannot be said to have sufficient characteristics. In the case of a printed circuit board, elements can be mounted on both the front and back sides, but in this case the input/output terminals have to be placed around the board. Therefore, (1) the distance between the element and the input/output terminal becomes large, and the length of this distribution line becomes long.
【0006】(2)入出力端子のための面積が狭く、端
子数の制約を受ける。(2) The area for input/output terminals is small, and the number of terminals is limited.
【0007】という問題がある。[0007] There is a problem.
【0008】[0008]
【課題を解決するための手段】本発明のマルチチップモ
ジュールは、導体配線パターンを有し間隔をおいて積重
ねられた複数の基板と、この複数の基板に搭載された複
数の半導体デバイスと、前記基板相互の間に形成された
有機絶縁層と、この有機絶縁層中に設けられ前記基板相
互の導体配線パターンを電気的に接続する配線パターン
とを備えている。[Means for Solving the Problems] A multi-chip module of the present invention includes a plurality of substrates having conductive wiring patterns and stacked at intervals, a plurality of semiconductor devices mounted on the plurality of substrates, and a plurality of semiconductor devices mounted on the plurality of substrates. The device includes an organic insulating layer formed between the substrates, and a wiring pattern provided in the organic insulating layer to electrically connect the conductor wiring patterns between the substrates.
【0009】[0009]
【実施例】次に、本発明について図面を参照して説明す
る。DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained with reference to the drawings.
【0010】図1は本発明の一実施例のマルチチップモ
ジュールの断面図である。FIG. 1 is a sectional view of a multi-chip module according to an embodiment of the present invention.
【0011】図1において、内部にGND,電源および
信号などの導体配線パターン10を有するアルミナ等を
主成分とするセラミック基板1の表面に半導体デバイス
2が実装されている。2の半導体デバイス2とセラミッ
ク基板1との接続は使われる半導体デバイス2の種類に
よって異なる。In FIG. 1, a semiconductor device 2 is mounted on the surface of a ceramic substrate 1 mainly made of alumina or the like and having conductor wiring patterns 10 for GND, power supply, signals, etc. therein. The connection between the semiconductor device 2 and the ceramic substrate 1 differs depending on the type of semiconductor device 2 used.
【0012】図2に各種の半導体デバイスのセラミック
基板1への取り付け構造を示す。図2(a)はTABリ
ード100を有するTABタイプの半導体デバイス21
を示し、TABリード100はTABリード100がセ
ラミック基板1にAu −Au 熱圧着される。図2(
b)に示すPGAタイプの半導体デバイス22はI/O
ピン200がSn /Pb ,Au /Sn 等により
セラミック基板1にはんだ付けされる。図2(c)に示
すフリップチップタイプの半導体デバイス23ははんだ
ボール又ははんだバンプ300でセラミック基板1に取
り付けられる。これら半導体デバイス21,22,23
はピン数,電力,チップサイズなどにより使い分けが可
能である。FIG. 2 shows a structure for attaching various semiconductor devices to the ceramic substrate 1. FIG. 2(a) shows a TAB type semiconductor device 21 having a TAB lead 100.
The TAB lead 100 is Au-Au thermocompression bonded to the ceramic substrate 1. Figure 2 (
The PGA type semiconductor device 22 shown in b) is an I/O
A pin 200 is soldered to the ceramic substrate 1 using Sn/Pb, Au/Sn, or the like. The flip-chip type semiconductor device 23 shown in FIG. 2(c) is attached to the ceramic substrate 1 with solder balls or solder bumps 300. These semiconductor devices 21, 22, 23
can be used depending on the number of pins, power, chip size, etc.
【0013】半導体デバイス2が実装されたセラミック
基板1をモジュールが必要とする数だけ積重ねて、一つ
のマルチチップモジュール構造とする。各々のセラミッ
ク基板1同志をスタックするためにセラミック基板1間
に有機絶縁層3が形成される。そしてこの有機絶縁層3
は耐熱性,電気的特性および機械的強度にすぐれたポリ
イミド樹脂が用いられる。[0013] Ceramic substrates 1 having semiconductor devices 2 mounted thereon are stacked as many times as required by the module to form one multi-chip module structure. An organic insulating layer 3 is formed between the ceramic substrates 1 in order to stack the ceramic substrates 1 together. And this organic insulating layer 3
Polyimide resin is used for its excellent heat resistance, electrical properties, and mechanical strength.
【0014】さらにこの有機絶縁層3の内部には各段の
セラミック基板1同志を電気的接続するための配線パタ
ーン20が設けられる。有機絶縁層3の厚さは内部の半
導体デバイス2および配線パターン20の密度によって
異なるが通常0.5〜3mmぐらいである。又、配線パ
ターン20の材料としては上下セラミック基板1との接
続方法および有機絶縁層との加工性,密着性などからC
u ,Au 等が用いられる。配線パターン20とセラ
ミック基板1との接続はセラミック基板1の表面に形成
されたパッド30を介してはんだ付けもしくはAu −
Au 熱圧着される。Further, inside the organic insulating layer 3, a wiring pattern 20 is provided for electrically connecting the ceramic substrates 1 at each stage. The thickness of the organic insulating layer 3 varies depending on the density of the internal semiconductor device 2 and the wiring pattern 20, but is usually about 0.5 to 3 mm. In addition, the material for the wiring pattern 20 is C due to the method of connection with the upper and lower ceramic substrates 1 and the workability and adhesion with the organic insulating layer.
u, Au, etc. are used. The connection between the wiring pattern 20 and the ceramic substrate 1 is made by soldering or Au-
Au is bonded by thermocompression.
【0015】このマルチチップモジュールと外部との接
続は最下部のセラミック基板11の周辺に設けたパッド
31やセラミック基板11の底面に設けるピン(図示せ
ず)等を介して行うことができる。This multi-chip module can be connected to the outside through pads 31 provided around the lowermost ceramic substrate 11 or pins (not shown) provided on the bottom surface of the ceramic substrate 11.
【0016】図3は本発明の他の実施例の断面図で最下
部のセラミック基板11を除く基板1の表裏の両面に半
導体デバイス2を搭載している。FIG. 3 is a cross-sectional view of another embodiment of the present invention, in which semiconductor devices 2 are mounted on both the front and back surfaces of the substrate 1 except for the ceramic substrate 11 at the bottom.
【0017】モジュール全体の集積度が大きくなったり
、あるいは信号遅延が厳しい設計を必要とするときは図
3のようにセラミック基板1の表裏の両面に半導体デバ
イス2を実装する構造も可能である。When the degree of integration of the entire module increases or a design with severe signal delay is required, a structure in which semiconductor devices 2 are mounted on both the front and back sides of the ceramic substrate 1 as shown in FIG. 3 is also possible.
【0018】本発明のさらに他の実施例として、図4に
示すようにセラミック基板1間の領域のうち、半導体デ
バイス2が実装されている周囲の領域40だけは有機絶
縁層3が形成されない構成をとる。こうすることにより
、高パワーの半導体デバイス2が使用された場合の放熱
手段として領域40中に図示されてない放熱媒体を通し
、半導体デバイス2を冷却することが可能となる。As a further embodiment of the present invention, as shown in FIG. 4, among the regions between the ceramic substrates 1, only the surrounding region 40 where the semiconductor device 2 is mounted is not formed with the organic insulating layer 3. Take. By doing so, it becomes possible to cool the semiconductor device 2 by passing a heat radiating medium (not shown) through the region 40 as a heat radiating means when a high power semiconductor device 2 is used.
【0019】[0019]
【発明の効果】以上説明したように本発明は半導体デバ
イスが実装されたセラミック基板間を内部配線パターン
を有した有機絶縁層で連結することにより、配線長が短
かく信号遅延の極めて小さい、高密度のLSIマルチチ
ップモジュールが実現できる。Effects of the Invention As explained above, the present invention connects ceramic substrates on which semiconductor devices are mounted with an organic insulating layer having an internal wiring pattern, thereby achieving high performance with short wiring length and extremely small signal delay. A high-density LSI multi-chip module can be realized.
【図1】本発明の一実施例の断面図である。FIG. 1 is a sectional view of one embodiment of the present invention.
【図2】各種の半導体デバイスのセラミック基板への取
り付け構造を示す図である。FIG. 2 is a diagram showing a structure for attaching various semiconductor devices to a ceramic substrate.
【図3】本発明の他の実施例の断面図である。FIG. 3 is a cross-sectional view of another embodiment of the invention.
【図4】本発明のさらに他の実施例の断面図である。FIG. 4 is a cross-sectional view of yet another embodiment of the invention.
1,11 セラミック基板
2,21,22,23 半導体デバイス3
有機絶縁層
10 導体配線パターン
20 配線パターン
30,31 パッド
100 TABリード
200 I/Oピン
201 はんだ1, 11 Ceramic substrate 2, 21, 22, 23 Semiconductor device 3
Organic insulating layer 10 Conductor wiring pattern 20 Wiring patterns 30, 31 Pad 100 TAB lead 200 I/O pin 201 Solder
Claims (3)
積重ねられた複数の基板と、この複数の基板に搭載され
た複数の半導体デバイスと、前記基板相互の間に形成さ
れた有機絶縁層と、この有機絶縁層中に設けられ前記基
板相互の導体配線パターンを電気的に接続する配線パタ
ーンとを備えることを特徴とするマルチチップモジュー
ル。1. A plurality of substrates having conductor wiring patterns stacked at intervals, a plurality of semiconductor devices mounted on the plurality of substrates, and an organic insulating layer formed between the substrates. A multi-chip module comprising: a wiring pattern provided in the organic insulating layer and electrically connecting conductor wiring patterns between the substrates.
デバイスが搭載された請求項1記載のマルチチップモジ
ュール。2. The multi-chip module according to claim 1, wherein semiconductor devices are mounted on both the front and back surfaces of the ceramic substrate.
機絶縁層が形成されていない請求項1または2記載のマ
ルチチップモジュール。3. The multi-chip module according to claim 1, wherein the organic insulating layer is not formed only in a region around the semiconductor device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3053012A JPH04290258A (en) | 1991-03-19 | 1991-03-19 | Multichip module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3053012A JPH04290258A (en) | 1991-03-19 | 1991-03-19 | Multichip module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04290258A true JPH04290258A (en) | 1992-10-14 |
Family
ID=12930997
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3053012A Pending JPH04290258A (en) | 1991-03-19 | 1991-03-19 | Multichip module |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04290258A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08236694A (en) * | 1995-02-24 | 1996-09-13 | Nec Corp | Semiconductor package and manufacturing method thereof |
| US5715144A (en) * | 1994-12-30 | 1998-02-03 | International Business Machines Corporation | Multi-layer, multi-chip pyramid and circuit board structure |
| US5784264A (en) * | 1994-11-28 | 1998-07-21 | Nec Corporation | MCM (Multi Chip Module) carrier with external connection teminals BGA (Ball Grid Array) type matrix array form |
| US5821762A (en) * | 1994-02-28 | 1998-10-13 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device, production method therefor, method for testing semiconductor elements, test substrate for the method and method for producing the test substrate |
| US5907903A (en) * | 1996-05-24 | 1999-06-01 | International Business Machines Corporation | Multi-layer-multi-chip pyramid and circuit board structure and method of forming same |
| JP2001168269A (en) * | 1999-12-08 | 2001-06-22 | Denso Corp | Semiconductor element mounting structure, laminated circuit module, and method of manufacturing semiconductor element mounting structure |
| JP2011198866A (en) * | 2010-03-18 | 2011-10-06 | Renesas Electronics Corp | Semiconductor device, and method of manufacturing the same |
| RU206439U1 (en) * | 2021-05-27 | 2021-09-13 | федеральное государственное бюджетное образовательное учреждение высшего образования "Национальный исследовательский университет "МЭИ" (ФГБОУ ВО "НИУ "МЭИ") | Multichip power module |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59205747A (en) * | 1983-05-09 | 1984-11-21 | Matsushita Electric Ind Co Ltd | Manufacture of semiconductor device |
| JPS6110299A (en) * | 1984-06-26 | 1986-01-17 | 三菱電機株式会社 | integrated circuit mounting structure |
| JPH01225196A (en) * | 1988-03-03 | 1989-09-08 | Marcon Electron Co Ltd | Manufacture of laminated hybrid integrated circuit |
-
1991
- 1991-03-19 JP JP3053012A patent/JPH04290258A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59205747A (en) * | 1983-05-09 | 1984-11-21 | Matsushita Electric Ind Co Ltd | Manufacture of semiconductor device |
| JPS6110299A (en) * | 1984-06-26 | 1986-01-17 | 三菱電機株式会社 | integrated circuit mounting structure |
| JPH01225196A (en) * | 1988-03-03 | 1989-09-08 | Marcon Electron Co Ltd | Manufacture of laminated hybrid integrated circuit |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5821762A (en) * | 1994-02-28 | 1998-10-13 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device, production method therefor, method for testing semiconductor elements, test substrate for the method and method for producing the test substrate |
| US5784264A (en) * | 1994-11-28 | 1998-07-21 | Nec Corporation | MCM (Multi Chip Module) carrier with external connection teminals BGA (Ball Grid Array) type matrix array form |
| US5715144A (en) * | 1994-12-30 | 1998-02-03 | International Business Machines Corporation | Multi-layer, multi-chip pyramid and circuit board structure |
| JPH08236694A (en) * | 1995-02-24 | 1996-09-13 | Nec Corp | Semiconductor package and manufacturing method thereof |
| US5907903A (en) * | 1996-05-24 | 1999-06-01 | International Business Machines Corporation | Multi-layer-multi-chip pyramid and circuit board structure and method of forming same |
| JP2001168269A (en) * | 1999-12-08 | 2001-06-22 | Denso Corp | Semiconductor element mounting structure, laminated circuit module, and method of manufacturing semiconductor element mounting structure |
| JP2011198866A (en) * | 2010-03-18 | 2011-10-06 | Renesas Electronics Corp | Semiconductor device, and method of manufacturing the same |
| RU206439U1 (en) * | 2021-05-27 | 2021-09-13 | федеральное государственное бюджетное образовательное учреждение высшего образования "Национальный исследовательский университет "МЭИ" (ФГБОУ ВО "НИУ "МЭИ") | Multichip power module |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 19970225 |