JPH04277660A - Integrated circuit package - Google Patents
Integrated circuit packageInfo
- Publication number
- JPH04277660A JPH04277660A JP3971491A JP3971491A JPH04277660A JP H04277660 A JPH04277660 A JP H04277660A JP 3971491 A JP3971491 A JP 3971491A JP 3971491 A JP3971491 A JP 3971491A JP H04277660 A JPH04277660 A JP H04277660A
- Authority
- JP
- Japan
- Prior art keywords
- heat sink
- integrated circuit
- resin
- circuit package
- mold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011347 resin Substances 0.000 claims abstract description 30
- 229920005989 resin Polymers 0.000 claims abstract description 30
- 238000007789 sealing Methods 0.000 abstract description 3
- 239000002184 metal Substances 0.000 abstract 2
- 230000002950 deficient Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 11
- 238000005538 encapsulation Methods 0.000 description 9
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、集積回路パッケージに
関し、特にその放熱板の構造に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to integrated circuit packages, and more particularly to the structure of heat sinks thereof.
【0002】0002
【従来の技術】従来の絶縁型ヒートシンク付集積回路パ
ッケージの構造は、図3(a),(b)の斜視図および
そのA−A′断面図のように示される。2. Description of the Related Art The structure of a conventional integrated circuit package with an insulated heat sink is shown in perspective views and sectional views taken along line A-A' in FIGS. 3(a) and 3(b).
【0003】この集積回路パッケージは、リード3が取
付けられた放熱板2の上に集積回路チップ4をのせ、モ
ールド樹脂1で覆ったものである。この放熱板2の裏面
には、モールド樹脂1が厚さ0.1〜0.3ミリメート
ルの薄い樹脂層5を有している。This integrated circuit package has an integrated circuit chip 4 placed on a heat sink 2 to which leads 3 are attached, and covered with a molding resin 1. On the back surface of the heat sink 2, the mold resin 1 has a thin resin layer 5 having a thickness of 0.1 to 0.3 mm.
【0004】この薄い樹脂層5は、集積回路の放熱板2
を外部と電気的に絶縁する目的で設けられているが、同
時に集積回路パッケージ4の動作時に発生する熱を放熱
板2,樹脂層5を介して外部に放出させる必要があり、
出来る限り薄く、すなわち熱抵抗を低く抑えることが必
要である。この放熱板2は一枚の平坦な銅を主材料とし
た板状に作られている。[0004] This thin resin layer 5 is a heat sink 2 of an integrated circuit.
Although it is provided for the purpose of electrically insulating the integrated circuit package 4 from the outside, it is also necessary to release the heat generated during the operation of the integrated circuit package 4 to the outside via the heat sink 2 and the resin layer 5.
It is necessary to make it as thin as possible, that is, to keep the thermal resistance low. The heat dissipation plate 2 is made into a flat plate mainly made of copper.
【0005】[0005]
【発明が解決しようとする課題】上述のように絶縁型ヒ
ートシンク付パッケージでは、放熱板2の裏面部の樹脂
厚を0.1〜0.3ミリメートルと薄く形成する必要が
ある。このことは、集積回路パッケージの製造工程に於
いて、放熱板2及び放熱板上にマウントされた集積回路
チップ4などをモールド樹脂1で封入する封入工程にお
いて、樹脂の未充填という不良を多発させる原因となり
、従って製造歩留りを大幅に悪化させる要因となってい
る。この未充填不良は、封入工程において、放熱板裏面
の薄い樹脂層5を形成する部分への樹脂の進入が遅い為
に生じている。SUMMARY OF THE INVENTION As described above, in the package with an insulated heat sink, it is necessary to form the resin thickness of the back surface of the heat sink 2 to be as thin as 0.1 to 0.3 mm. This leads to frequent failures such as unfilled resin in the encapsulation process in which the heat sink 2 and the integrated circuit chip 4 mounted on the heat sink are encapsulated with the mold resin 1 in the manufacturing process of the integrated circuit package. Therefore, it is a factor that significantly deteriorates the manufacturing yield. This non-filling failure occurs because the resin enters the portion of the back surface of the heat sink where the thin resin layer 5 is formed slowly during the sealing process.
【0006】図4(a),(b)はその封入工程の途中
の断面図を示している。この場合、封入金型6のゲート
8から樹脂がキャビティ9内に注入される様子を示して
いる。放熱板2の裏面部のキャビティ9は間隙7が狭く
モールド樹脂1aの進入が他の部分より非常に遅い。従
って図4(b)に示すように、ゲート8の側以外の部分
から放熱板2の裏面への樹脂の進入が起こり、エアを封
じ込めるため、空隙11即ち未充填部を非常に生じやす
く、封入工程の歩留りを大幅に悪化させている。FIGS. 4(a) and 4(b) show cross-sectional views during the encapsulation process. In this case, resin is shown being injected into the cavity 9 from the gate 8 of the encapsulation mold 6. The cavity 9 on the back surface of the heat sink 2 has a narrow gap 7, and the mold resin 1a enters the cavity 9 much more slowly than other parts. Therefore, as shown in FIG. 4(b), the resin enters the back surface of the heat sink 2 from the part other than the gate 8 side, and in order to seal the air, a void 11, that is, an unfilled part, is very likely to be formed. The yield of the process is significantly deteriorated.
【0007】この空隙11の発生を防止するため、封入
金型6のゲート部8の形状を工夫し、樹脂の注入方向を
制御する方法がとられているものもあり、若干の効果は
認められるが、本質的な解決には至っていない。[0007] In order to prevent the formation of voids 11, some methods have been adopted in which the shape of the gate portion 8 of the encapsulation mold 6 is devised to control the injection direction of the resin, and some effects have been observed. However, no fundamental solution has been reached.
【0008】本発明の目的は、このような問題を解決し
、モールド樹脂の未充填の不良を防止し、製造歩留りを
改善した集積回路パッケージを提供することにある。SUMMARY OF THE INVENTION It is an object of the present invention to provide an integrated circuit package that solves these problems, prevents defects due to unfilled molding resin, and improves manufacturing yield.
【0009】[0009]
【課題を解決するための手段】本発明の構成は、集積回
路チップが載置されかつ1本のリードに接続された放熱
板を、封入金型に挿入して樹脂封止された絶縁型ヒート
シンク付集積回路パッケージにおいて、前記放熱板は、
その裏面に前記封入金型のゲート側の一部分から延長さ
れる少くとも1本の溝が設けられていることを特徴とす
る。[Means for Solving the Problems] The structure of the present invention is an insulated heat sink in which a heat sink on which an integrated circuit chip is mounted and connected to one lead is inserted into an encapsulating mold and sealed with a resin. In the integrated circuit package with
It is characterized in that at least one groove extending from a portion of the gate side of the encapsulation mold is provided on the back surface thereof.
【0010】0010
【実施例】図1(a),(b)は本発明の一実施例に用
いる放熱板の斜視図およびその注入工程を説明する断面
図である。ここでは、放熱板2の裏面を上に、表面(集
積回路チップ4の搭載面)を下にして示している。DESCRIPTION OF THE PREFERRED EMBODIMENTS FIGS. 1(a) and 1(b) are perspective views of a heat sink used in an embodiment of the present invention, and sectional views for explaining the injection process. Here, the back surface of the heat sink 2 is shown facing up and the front surface (the surface on which the integrated circuit chip 4 is mounted) is facing down.
【0011】図1(a)のように、この放熱板2はその
裏側に幅0.1〜0.5ミリメートル程度、深さ0.1
〜0.5ミリメートル程度、長さは放熱板長さの50〜
80パーセント程度の溝12〜14を設けている。この
溝12〜14は、封入工程において樹脂が進入する方向
に3本設けられている。As shown in FIG. 1(a), this heat sink 2 has a width of about 0.1 to 0.5 mm and a depth of 0.1 mm on the back side.
~0.5 mm, length is 50~ of the heat sink length
Approximately 80% of the grooves 12 to 14 are provided. Three grooves 12 to 14 are provided in the direction in which the resin enters in the encapsulation process.
【0012】本実施例の封入工程においては、図1(b
)のように、溝13の部分は当然封入金型6と放熱板2
の間隙が広くなり、この部分での樹脂の進入が促進され
、溝に進入した樹脂は次第に溝以外の部分にも広がって
行き、結果として放熱板の裏全体の樹脂進入が促進され
ていることになる。In the encapsulation process of this example, FIG.
), the groove 13 is naturally connected to the enclosing mold 6 and the heat sink 2.
The gap becomes wider, promoting the entry of resin in this area, and the resin that enters the groove gradually spreads to other parts than the groove, and as a result, resin entry into the entire back of the heat sink is promoted. become.
【0013】従って放熱板1の裏の樹脂進入が遅いこと
により、他の部分から樹脂がまわり込み、エアの封じ込
めるという問題は解決できる。Therefore, it is possible to solve the problem that the resin enters the back side of the heat sink 1 slowly, causing the resin to wrap around from other parts and trapping air.
【0014】図2は、本発明の第2の実施例に用いる放
熱板の斜視図を示している。本実施例は、放熱板2の溝
12〜13の端部分の形状を広げて開口部15を設けた
ものである。この開口部15によって、封入工程での溝
12〜14の部分への樹脂の進入を更に促進することが
出来る。FIG. 2 shows a perspective view of a heat sink used in a second embodiment of the present invention. In this embodiment, the shapes of the end portions of the grooves 12 to 13 of the heat sink 2 are widened to provide openings 15. This opening 15 can further promote entry of the resin into the grooves 12 to 14 during the sealing process.
【0015】この場合、溝12〜14を設けることによ
り、放熱板2の裏の樹脂厚の薄い部分5の面積が、従来
構造に比較し小さくなり、相対的に熱抵抗が大きくなる
心配があるが、溝12〜14の部分の面積を放熱板2の
全体の面積の数%以下にすれば、実用上は殆んど問題な
い。In this case, by providing the grooves 12 to 14, the area of the thin resin portion 5 on the back side of the heat sink 2 becomes smaller than that of the conventional structure, and there is a concern that the thermal resistance will become relatively large. However, if the area of the grooves 12 to 14 is set to a few percent or less of the entire area of the heat sink 2, there will be almost no problem in practice.
【0016】[0016]
【発明の効果】以上説明したように本発明は、放熱板に
樹脂を注入しやすくした溝を設けることにより、絶縁型
ヒートシンク付集積回路パッケージの封入工程において
未充填不良を防止出来、装置歩留を改善できるという効
果がある。As explained above, the present invention can prevent unfilled defects in the encapsulation process of integrated circuit packages with insulated heat sinks by providing grooves in the heat sink to facilitate resin injection, thereby improving device yield. It has the effect of improving the
【図1】(a),(b)は本発明の一実施例に用いる放
熱板の斜視図およびその組立時の断面図。FIGS. 1(a) and 1(b) are a perspective view of a heat sink used in an embodiment of the present invention and a cross-sectional view when assembled.
【図2】本発明の第2の実施例に用いる放熱板の斜視図
。FIG. 2 is a perspective view of a heat sink used in a second embodiment of the present invention.
【図3】(a),(b)は従来例の集積回路の斜視図お
よびその断面図。FIGS. 3(a) and 3(b) are a perspective view and a sectional view of a conventional integrated circuit.
【図4】(a),(b)は図3の封入工程を説明する断
面図。4A and 4B are cross-sectional views illustrating the enclosing process of FIG. 3;
1,1a モールド樹脂
2 放熱板
3 リード
4 集積回路チップ
5 薄い樹脂層
6 封入金型
7 キャビティ間隙
8 ゲート部
9 キャビティ部
11 キャビティ内に生じた空隙12〜14
溝部
15 開口部1, 1a Mold resin 2 Heat dissipation plate 3 Lead 4 Integrated circuit chip 5 Thin resin layer 6 Encapsulation mold 7 Cavity gap 8 Gate section 9 Cavity section 11 Gaps 12 to 14 created in the cavity
Groove 15 Opening
Claims (1)
リードに接続された放熱板を、封入金型に挿入して樹脂
封止された絶縁型ヒートシンク付集積回路パッケージに
おいて、前記放熱板は、その裏面に前記封入金型のゲー
ト側の一部分から延長される少くとも1本の溝が設けら
れていることを特徴とする集積回路パッケージ。1. An integrated circuit package with an insulated heat sink in which a heat sink on which an integrated circuit chip is mounted and connected to one lead is inserted into an encapsulating mold and sealed with a resin, wherein the heat sink is , wherein at least one groove extending from a portion of the gate side of the encapsulating mold is provided on the back surface thereof.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3971491A JPH04277660A (en) | 1991-03-06 | 1991-03-06 | Integrated circuit package |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3971491A JPH04277660A (en) | 1991-03-06 | 1991-03-06 | Integrated circuit package |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04277660A true JPH04277660A (en) | 1992-10-02 |
Family
ID=12560659
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3971491A Pending JPH04277660A (en) | 1991-03-06 | 1991-03-06 | Integrated circuit package |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04277660A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5814878A (en) * | 1995-11-30 | 1998-09-29 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device |
JP2008243970A (en) * | 2007-03-26 | 2008-10-09 | Mitsubishi Electric Corp | Semiconductor device and manufacturing method thereof |
JP2013161956A (en) * | 2012-02-06 | 2013-08-19 | Mitsubishi Electric Corp | Semiconductor device |
-
1991
- 1991-03-06 JP JP3971491A patent/JPH04277660A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5814878A (en) * | 1995-11-30 | 1998-09-29 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device |
JP2008243970A (en) * | 2007-03-26 | 2008-10-09 | Mitsubishi Electric Corp | Semiconductor device and manufacturing method thereof |
JP2013161956A (en) * | 2012-02-06 | 2013-08-19 | Mitsubishi Electric Corp | Semiconductor device |
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