JPH0333375U - - Google Patents
Info
- Publication number
- JPH0333375U JPH0333375U JP9218589U JP9218589U JPH0333375U JP H0333375 U JPH0333375 U JP H0333375U JP 9218589 U JP9218589 U JP 9218589U JP 9218589 U JP9218589 U JP 9218589U JP H0333375 U JPH0333375 U JP H0333375U
- Authority
- JP
- Japan
- Prior art keywords
- conductive
- socket
- inner plunger
- plunger
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案の一実施例を示す正面断面図、
第２図はその取付状態の説明図、第３図は四端子
法測定における回路図、第４図は四端子法測定の
説明図である。
１……ソケツト、２……内側プランジヤ、３，
１３……ばね、４……バレル、５……絶縁体、１
２……外側プランジヤ、２１……プリント基板、
２２……スルーホール、２３……フイクスチヤ部
材。
FIG. 1 is a front sectional view showing an embodiment of the present invention;
FIG. 2 is an explanatory diagram of the installation state, FIG. 3 is a circuit diagram for four-terminal method measurement, and FIG. 4 is an explanatory diagram for four-terminal method measurement. 1...Socket, 2...Inner plunger, 3,
13... Spring, 4... Barrel, 5... Insulator, 1
2... Outer plunger, 21... Printed circuit board,
22... Through hole, 23... Fixture member.
Claims (1)
勢して摺動自在に挿入した導電性のバレル４に、
その外周に絶縁体５を介在させて導電性のソケツ
ト１を被着固定すると共に、該ソケツト１の外周
に、内側プランジヤ２を囲繞する導電性の外側プ
ランジヤ１２をばね１３で内側プランジヤ２と同
様に摺動自在に保持したことを特徴とする四端子
法測定用プローブ。 A conductive inner plunger 2 is biased outwardly by a spring 3 and slidably inserted into a conductive barrel 4;
A conductive socket 1 is fixed on the outer periphery of the socket 1 with an insulator 5 interposed therebetween, and a conductive outer plunger 12 surrounding the inner plunger 2 is attached to the outer periphery of the socket 1 with a spring 13 in the same manner as the inner plunger 2. A four-terminal method measurement probe characterized by being slidably held in the holder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9218589U JPH0333375U (en) | 1989-08-07 | 1989-08-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9218589U JPH0333375U (en) | 1989-08-07 | 1989-08-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0333375U true JPH0333375U (en) | 1991-04-02 |
Family
ID=31641625
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9218589U Pending JPH0333375U (en) | 1989-08-07 | 1989-08-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0333375U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002063314A1 (en) * | 2001-02-02 | 2002-08-15 | Tokyo Electron Limited | Probe |
| JP2007192554A (en) * | 2006-01-17 | 2007-08-02 | Onishi Denshi Kk | Coaxial probe for four-probe measurement and probe jig provided with same |
| JP2018128404A (en) * | 2017-02-10 | 2018-08-16 | 株式会社日本マイクロニクス | Probe and electrical connection device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58175273A (en) * | 1982-04-07 | 1983-10-14 | 沖電気工業株式会社 | Coaxial movable contact probe |
-
1989
- 1989-08-07 JP JP9218589U patent/JPH0333375U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58175273A (en) * | 1982-04-07 | 1983-10-14 | 沖電気工業株式会社 | Coaxial movable contact probe |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002063314A1 (en) * | 2001-02-02 | 2002-08-15 | Tokyo Electron Limited | Probe |
| JP2007192554A (en) * | 2006-01-17 | 2007-08-02 | Onishi Denshi Kk | Coaxial probe for four-probe measurement and probe jig provided with same |
| JP4667253B2 (en) * | 2006-01-17 | 2011-04-06 | 大西電子株式会社 | Four-probe measurement coaxial probe and probe jig provided with the same |
| JP2018128404A (en) * | 2017-02-10 | 2018-08-16 | 株式会社日本マイクロニクス | Probe and electrical connection device |
| WO2018147024A1 (en) * | 2017-02-10 | 2018-08-16 | 株式会社日本マイクロニクス | Probe and electrical connection device |
| US11022627B2 (en) | 2017-02-10 | 2021-06-01 | Kabushiki Kaisha Nihon Micronics | Probe and electric connecting apparatus |
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