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JPH0332432U - - Google Patents

Info

Publication number
JPH0332432U
JPH0332432U JP1989091910U JP9191089U JPH0332432U JP H0332432 U JPH0332432 U JP H0332432U JP 1989091910 U JP1989091910 U JP 1989091910U JP 9191089 U JP9191089 U JP 9191089U JP H0332432 U JPH0332432 U JP H0332432U
Authority
JP
Japan
Prior art keywords
heat dissipation
dissipation fin
semiconductor device
view
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1989091910U
Other languages
Japanese (ja)
Other versions
JPH0648865Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989091910U priority Critical patent/JPH0648865Y2/en
Publication of JPH0332432U publication Critical patent/JPH0332432U/ja
Application granted granted Critical
Publication of JPH0648865Y2 publication Critical patent/JPH0648865Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の取付機構を利用し
て半導体装置に放熱フインを取り付けた状態を示
す断面図、第2図は同じくその正面図、第3図は
同じくその平面図、第4図は同じくその側面図、
第5図は同じく放熱フインの斜視図、第6図は同
じく封止樹脂の硬化収縮特性による反りの状態を
示す図である。第7図は従来のねじ締めにより半
導体装置に放熱フインを取り付けた例を示す正面
図、第8図は同じくその側面図、第9図は同じく
その平面図、第10図は同じくその断面図、第1
1図は同じくその半導体装置の正面図、第12図
は同じくその放熱フインの斜視図である。 11……外枠、12……半導体内部素子、13
……熱硬化封止樹脂、14……半導体装置、15
……放熱フイン、17……凹部。
FIG. 1 is a sectional view showing a state in which a heat dissipation fin is attached to a semiconductor device using an attachment mechanism according to an embodiment of the present invention, FIG. 2 is a front view thereof, and FIG. 3 is a plan view thereof. Figure 4 is the same side view.
FIG. 5 is a perspective view of the heat dissipation fin, and FIG. 6 is a diagram showing the state of warpage due to the curing and shrinkage characteristics of the sealing resin. FIG. 7 is a front view showing an example of a heat dissipation fin attached to a semiconductor device by conventional screw tightening, FIG. 8 is a side view thereof, FIG. 9 is a plan view thereof, and FIG. 10 is a sectional view thereof. 1st
1 is a front view of the semiconductor device, and FIG. 12 is a perspective view of the heat dissipation fin. 11...Outer frame, 12...Semiconductor internal element, 13
... Thermosetting sealing resin, 14 ... Semiconductor device, 15
...radiating fin, 17...recess.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 放熱フインと、該放熱フインに形成された凹部
に挿入載置され、かつ挿入載置された状態で外枠
内の半導体素子が熱硬化封止樹脂により樹脂封止
される半導体装置とからなる半導体装置の放熱フ
イン取付機構。
A semiconductor device comprising a heat dissipation fin and a semiconductor device that is inserted and placed in a recess formed in the heat dissipation fin, and in which a semiconductor element within an outer frame is resin-sealed with a thermosetting sealing resin while being inserted and placed. Equipment's heat dissipation fin attachment mechanism.
JP1989091910U 1989-08-03 1989-08-03 Heat sink fin mounting mechanism for semiconductor devices Expired - Fee Related JPH0648865Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989091910U JPH0648865Y2 (en) 1989-08-03 1989-08-03 Heat sink fin mounting mechanism for semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989091910U JPH0648865Y2 (en) 1989-08-03 1989-08-03 Heat sink fin mounting mechanism for semiconductor devices

Publications (2)

Publication Number Publication Date
JPH0332432U true JPH0332432U (en) 1991-03-29
JPH0648865Y2 JPH0648865Y2 (en) 1994-12-12

Family

ID=31641369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989091910U Expired - Fee Related JPH0648865Y2 (en) 1989-08-03 1989-08-03 Heat sink fin mounting mechanism for semiconductor devices

Country Status (1)

Country Link
JP (1) JPH0648865Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101043369B1 (en) * 2009-03-06 2011-06-21 현대로템 주식회사 Fire Extinguisher Condition Detection System

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101043369B1 (en) * 2009-03-06 2011-06-21 현대로템 주식회사 Fire Extinguisher Condition Detection System

Also Published As

Publication number Publication date
JPH0648865Y2 (en) 1994-12-12

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees