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JPH0325952A - Bipolar cmos hybrid semiconductor integrated circuit - Google Patents

Bipolar cmos hybrid semiconductor integrated circuit

Info

Publication number
JPH0325952A
JPH0325952A JP1161454A JP16145489A JPH0325952A JP H0325952 A JPH0325952 A JP H0325952A JP 1161454 A JP1161454 A JP 1161454A JP 16145489 A JP16145489 A JP 16145489A JP H0325952 A JPH0325952 A JP H0325952A
Authority
JP
Japan
Prior art keywords
cmos
level
bipolar
region
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1161454A
Other languages
Japanese (ja)
Inventor
Ryoichi Yokoyama
良一 横山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1161454A priority Critical patent/JPH0325952A/en
Publication of JPH0325952A publication Critical patent/JPH0325952A/en
Pending legal-status Critical Current

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  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To eliminate CMOS level wiring in a bipolar region and signal interference from a digital circuit to an analog circuit by providing a level converter in the border region between the bipolar region and a CMOS region. CONSTITUTION:There are a bonding pad 2, a CMOS region 3, a level converter region 4, and a bipolar region 5 on an IC chip 1, and circuits are interconnected by connecting wiring 6 and 7 between CMOS's. Level converters in directions both from the CMOS to an ECL and from the ECL to the CMOS are included in the level converter region 4, and the connection between the bipolar region 5 and the CMOS region 3 is effected via respective level converters. Therefore, a signal line in the CMOS level is not present in the bipolar region 5.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はバイポーラCMOS混在型半導体集積回路に関
し、特にバイポーラトランジスタとCMOS}ランジス
タが同一チップ上に混在するバイポーラCMOS混在型
半導体集積回路に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a bipolar CMOS mixed semiconductor integrated circuit, and more particularly to a bipolar CMOS mixed semiconductor integrated circuit in which bipolar transistors and CMOS transistors coexist on the same chip.

〔従来の技術〕[Conventional technology]

従来、かかるバイポーラCMOS混在型半導体a積回路
(以下、B i CMOS−I C):−称す)は、微
少で高精度な信号をバイポーラリニア回路で処理し、且
つディジタル信号をCMOS回路で処理しており、IC
チップ上ではバイポーラ部とCMOS部とが明確に区分
されて配置されるのが通例である。
Conventionally, such bipolar CMOS mixed semiconductor a-product circuits (hereinafter referred to as B i CMOS-IC) process small, highly accurate signals with bipolar linear circuits, and process digital signals with CMOS circuits. IC
On a chip, a bipolar section and a CMOS section are usually clearly separated and arranged.

しかも、この種のICにおけるバイポーラ部とCMOS
部との相互接続は直接行われている。すなわち、所定の
CMOS回路の出カ信号により所定のバイポーラリニア
回路に対する切換等の制御を行う場合、これら二つの回
路は直接接続され、バイポーラリニア回路はCMOSレ
ベル〈例えば、O−5V)の信号を直接受信している。
Moreover, the bipolar part and CMOS in this type of IC
The interconnection with the department is made directly. In other words, when controlling switching or the like for a predetermined bipolar linear circuit using the output signal of a predetermined CMOS circuit, these two circuits are directly connected, and the bipolar linear circuit receives a CMOS level signal (for example, O-5V). Received directly.

また、バイポーラ回路のアナログ信号を二値変換してデ
ィジタルCMOS回路にディジタル信号として供給する
場合、個々のアナログ回路内にてCMOSレベルに変換
し、その変換したディジタル信号を直接CMOS回路に
送出している。
Also, when converting the analog signal of a bipolar circuit into a binary value and supplying it to a digital CMOS circuit as a digital signal, convert it to a CMOS level in each analog circuit, and send the converted digital signal directly to the CMOS circuit. There is.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のBiCMOS−ICは、バイポーラリニ
ア回路の内部をCMOSレベルの信号ののった多数の配
線が通ることになる.しかるに、ICチップ上の配線は
通常多層配線が用いられ、配線との交差を可能にし設計
の自由度を拡大している。また、その交差する部分の各
配線の間は眉間絶縁膜を誘電体とする容量で結合されて
いる,従って、CMOSレベルのディジタル信号は振幅
が電源電圧程度であり、且つその立上りおよび立下りが
急峻であるので、前記容量によって結合された他の層の
配線にCMOSレベル信号の微分波形電流がリークして
しまう.通常、アナログ回路では、CMOSレベルに比
べてはるかに微少な信号が扱われているため、アナログ
回路に対して上述の様なディジタル信号からのリークが
あると、IC全体の動作に重大な影響をおよぼすという
欠点がある。また、かかるリークを防止するために多層
配線の交差を避けることは、集積回路設計に大きな制約
を与えるという欠点がある.本発明の目的は、かかるデ
ィジタル回路からアナログ回路への信号干渉を皆無にす
るとともに、設計効率を向上させることのできるバイポ
ーラCMOS混在型半導体集積回路を提供することにあ
る。
In the conventional BiCMOS-IC described above, a large number of wires carrying CMOS level signals pass through the inside of the bipolar linear circuit. However, multilayer wiring is usually used for wiring on an IC chip, which allows wiring to intersect with each other and expands the degree of freedom in design. In addition, each wiring at the intersection is coupled by a capacitance using the glabella insulating film as a dielectric.Therefore, the amplitude of a CMOS level digital signal is about the same as the power supply voltage, and its rise and fall are Because of the steepness, the differential waveform current of the CMOS level signal leaks to the wiring in other layers connected by the capacitance. Normally, analog circuits handle signals that are much smaller than those at the CMOS level, so if there is a leak from the digital signal to the analog circuit as described above, it will seriously affect the operation of the entire IC. It has the disadvantage of causing a lot of damage. Furthermore, avoiding the intersection of multilayer interconnections in order to prevent such leakage has the drawback of placing significant constraints on integrated circuit design. An object of the present invention is to provide a bipolar CMOS mixed semiconductor integrated circuit that can eliminate signal interference from digital circuits to analog circuits and improve design efficiency.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のBiCMOS−ICは、アナログ回路をバイポ
ーラトランジスタで形成した同一チップ上にディジタル
回路をCMOS}ランジスタで形成するバイポーラCM
OS混在型半導体集積回路において、バイポーラ領域と
CMOS領域の境界領域にECL−CMOS間の入出力
レベルを変換するレベル変換器を配置し、前記アナログ
回路および前記ディジタル回路の相互接続を前記レベル
変換器を介して行うように構或される。
The BiCMOS-IC of the present invention is a bipolar CM in which an analog circuit is formed by bipolar transistors and a digital circuit is formed by CMOS transistors on the same chip.
In the OS mixed semiconductor integrated circuit, a level converter for converting input/output levels between ECL and CMOS is arranged in a boundary area between a bipolar region and a CMOS region, and interconnections between the analog circuit and the digital circuit are connected to the level converter. It is configured to be carried out via.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を示すBiCMOS−ICの
回路配置図である。
FIG. 1 is a circuit layout diagram of a BiCMOS-IC showing an embodiment of the present invention.

第1図に示すように、本実施例はICチップ1上にボン
ディングバッド2と、CMOS領域3と、レベル変換器
領域4と、バイポーラ領域5とを有し、相互の回路はバ
イポーラCMOS間接続配線6および7により接続され
ている。レベル変換器領域4には、CMOSからECL
へ、およびECLからCMOSへの双方向のレベル変換
器が含まれ、前述したバイポーラ領域5とCMOS領域
3の接続は各レベル変換器を介して行われる。
As shown in FIG. 1, this embodiment has a bonding pad 2, a CMOS region 3, a level converter region 4, and a bipolar region 5 on an IC chip 1, and the mutual circuits are bipolar CMOS interconnects. They are connected by wires 6 and 7. Level converter area 4 includes CMOS to ECL
and from ECL to CMOS are included, and the aforementioned bipolar region 5 and CMOS region 3 are connected via each level converter.

従って、バイポーラ領域5内には、CMOSレベルの信
号ラインは存在しなくなる。
Therefore, no CMOS level signal line exists within the bipolar region 5.

第2図(a).(b)はそれぞれ第1図におけるレベル
変換器の一例を示すCMOSレベルからのECLレベル
へのレベル変換器の回路図とECLレベルからCMOS
レベルへの変換器の回路図である。
Figure 2(a). (b) is a circuit diagram of a level converter from a CMOS level to an ECL level, and a circuit diagram of a level converter from an ECL level to a CMOS, respectively showing an example of the level converter in FIG.
FIG. 2 is a circuit diagram of a level converter;

第2図(a)に示すように、このレベル変換器は、CM
OSレベルに入力端I1〜I4と基準電圧人力REFに
接続されたバッファアンブ8と抵抗R,〜R&とECL
レベル出力端0.〜04とを有している。例えば、電源
電圧が5■のとき、CMOSレベルには5Vp−pも必
要となるが、ECLレベルは約300mVp−pで充分
である。
As shown in FIG. 2(a), this level converter
Buffer amplifier 8 connected to the input terminals I1 to I4 and reference voltage REF at the OS level, resistors R, ~R&, and ECL
Level output terminal 0. ~04. For example, when the power supply voltage is 5.5V, 5Vp-p is also required for the CMOS level, but approximately 300mVp-p is sufficient for the ECL level.

従って、R2 / (Rl +R2 ) =0 . 3
/ 5 . 0に設定し且つR3〜88も同様に設定す
れば、適当なECLレベルに変換される。
Therefore, R2/(Rl+R2)=0. 3
/ 5. If it is set to 0 and R3 to R88 are also set in the same way, it will be converted to an appropriate ECL level.

また、第2図(b)に示すように、このレベル変換器は
、前述したように、ECLレベルからCMOSレベルへ
の変換器であり、ECL入力端I,,I6に微少差電圧
が印加されると、CMOSレベル出力端07までの電圧
利得が大きいため、出力はほぼ電源電圧VCC又は接地
電圧GNDのCMOSレベルが得られる。尚、Q1〜Q
8はバイポーラトランジスタであり、R9は低電流源と
なる抵抗である。
Furthermore, as shown in FIG. 2(b), this level converter is a converter from the ECL level to the CMOS level, as described above, and a minute difference voltage is applied to the ECL input terminals I, I6. Then, since the voltage gain up to the CMOS level output terminal 07 is large, the CMOS level of approximately the power supply voltage VCC or ground voltage GND is obtained as an output. In addition, Q1~Q
8 is a bipolar transistor, and R9 is a resistor serving as a low current source.

これら第2図(a),(b)に示す両レベル変換器を第
1図に示すレベル変換領域4に配置することにより、ア
ナログ信号を扱うバイポーラ領域5内のディジタル信号
振幅が全て0〜3Vp−p程度のECLレベルに低減さ
れ、大振幅のCMOSレベルディジタル信号は一掃され
る。これによって、ディジタル信号ラインからアナログ
信号ラインへの微分波形電流は無視出来る程度のレベル
となり得る。
By arranging both the level converters shown in FIGS. 2(a) and 2(b) in the level conversion area 4 shown in FIG. The signal is reduced to an ECL level of about -p, and the large amplitude CMOS level digital signal is wiped out. As a result, the differential waveform current flowing from the digital signal line to the analog signal line can be at a negligible level.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明のBiCMOS−ICは、
バイポーラ領域とCMOS領域の境界領域にレベル変換
器を配置することにより、バイポーラ領域内のCMOS
レベル配線を一掃したので、ディジタル回路からアナロ
グ回路への信号干渉を皆無にすることが出来るという効
果があり、また設計時においても信号干渉に対する配慮
が不要となるので、設計効率を向上させることができる
という効果がある, 第l図は本発明の一実施例を示すB i CMOS−I
Cの回路配置図、第2図(a),(1:+)はそれぞれ
第1図におけるレベル変換器の一例を示すCMOS−E
CLレベル変換器の回路図とE C L−CMOSレベ
ル変換器の回路図である。
As explained above, the BiCMOS-IC of the present invention has
By placing a level converter in the boundary area between the bipolar area and the CMOS area, CMOS in the bipolar area
By eliminating level wiring, there is the effect of completely eliminating signal interference from digital circuits to analog circuits. Also, since there is no need to consider signal interference during design, design efficiency can be improved. Figure l shows an embodiment of the present invention.
The circuit layout diagram of C, Figure 2 (a) and (1:+) respectively show an example of the level converter in Figure 1.
They are a circuit diagram of a CL level converter and a circuit diagram of an ECL-CMOS level converter.

1・・・ICチップ、2・・・ボンディングパッド、3
・・・CMOS領域、4・・・レベル変換領域、5・・
・バイポーラ領域、6.7・・・バイポーラCMOS接
続配線、8・・・バッファアンプ、■1〜I4・・・C
MOSレベル入力端、01〜04・・・ECLレベル出
力端、I5,I6・・・ECLレベル入力端、0フ・・
・CMOSレベル出力端。
1... IC chip, 2... Bonding pad, 3
... CMOS area, 4... Level conversion area, 5...
・Bipolar area, 6.7...Bipolar CMOS connection wiring, 8...Buffer amplifier, ■1 to I4...C
MOS level input terminal, 01-04...ECL level output terminal, I5, I6...ECL level input terminal, 0f...
・CMOS level output terminal.

Claims (1)

【特許請求の範囲】[Claims] アナログ回路をバイポーラトランジスタで形成した同一
チップ上にディジタル回路をCMOSトランジスタで形
成するバイポーラCMOS混在型半導体集積回路におい
て、バイポーラ領域とCMOS領域の境界領域にECL
−CMOS間の入出力レベルを変換するレベル変換器を
配置し、前記アナログ回路および前記ディジタル回路の
相互接続を前記レベル変換器を介して行うことを特徴と
するバイポーラCMOS混在型半導体集積回路。
In a bipolar CMOS mixed semiconductor integrated circuit in which digital circuits are formed using CMOS transistors on the same chip in which analog circuits are formed using bipolar transistors, an ECL is applied to the boundary area between the bipolar region and the CMOS region.
- A bipolar CMOS mixed semiconductor integrated circuit, characterized in that a level converter for converting input and output levels between CMOS is arranged, and the analog circuit and the digital circuit are interconnected via the level converter.
JP1161454A 1989-06-23 1989-06-23 Bipolar cmos hybrid semiconductor integrated circuit Pending JPH0325952A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1161454A JPH0325952A (en) 1989-06-23 1989-06-23 Bipolar cmos hybrid semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1161454A JPH0325952A (en) 1989-06-23 1989-06-23 Bipolar cmos hybrid semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH0325952A true JPH0325952A (en) 1991-02-04

Family

ID=15735413

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1161454A Pending JPH0325952A (en) 1989-06-23 1989-06-23 Bipolar cmos hybrid semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH0325952A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8365122B2 (en) 2007-04-30 2013-01-29 Innovations Holdings, L.L.C. Method and apparatus for configurable systems

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6432647A (en) * 1987-07-29 1989-02-02 Hitachi Ltd Semiconductor integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6432647A (en) * 1987-07-29 1989-02-02 Hitachi Ltd Semiconductor integrated circuit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8365122B2 (en) 2007-04-30 2013-01-29 Innovations Holdings, L.L.C. Method and apparatus for configurable systems

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