JPH03217067A - Semiconductor laser device - Google Patents
Semiconductor laser deviceInfo
- Publication number
- JPH03217067A JPH03217067A JP1283390A JP1283390A JPH03217067A JP H03217067 A JPH03217067 A JP H03217067A JP 1283390 A JP1283390 A JP 1283390A JP 1283390 A JP1283390 A JP 1283390A JP H03217067 A JPH03217067 A JP H03217067A
- Authority
- JP
- Japan
- Prior art keywords
- chip
- submount
- solder
- light
- gold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 12
- 229910000679 solder Inorganic materials 0.000 claims abstract description 21
- 229910020658 PbSn Inorganic materials 0.000 claims abstract description 12
- 101150071746 Pbsn gene Proteins 0.000 claims abstract description 12
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 12
- 239000010931 gold Substances 0.000 claims abstract description 10
- 229910052737 gold Inorganic materials 0.000 claims abstract description 10
- 239000002184 metal Substances 0.000 claims abstract description 10
- 229910052751 metal Inorganic materials 0.000 claims abstract description 10
- 239000000463 material Substances 0.000 claims abstract description 4
- 230000017525 heat dissipation Effects 0.000 claims description 5
- 230000008646 thermal stress Effects 0.000 claims description 3
- 238000001816 cooling Methods 0.000 abstract 1
- 230000008642 heat stress Effects 0.000 abstract 1
- 230000002040 relaxant effect Effects 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
Landscapes
- Semiconductor Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野1
本発明はレーザダイオード(以下LDと略す)チップが
熱応力緩和材としてのサブマウントを介して組立てられ
て構成される半導体レーザ装置に関するものである。[Detailed Description of the Invention] [Industrial Application Field 1] The present invention relates to a semiconductor laser device in which a laser diode (hereinafter abbreviated as LD) chip is assembled via a submount serving as a thermal stress relaxation material. be.
第3図は従来の半導体レーザ装置を示す断面正面図で、
LDチップ(1)は熱応力緩和材としてのサブマウント
(2)を介して放熱ブロック(3)に組立てられ、放熱
ブロック(3》はモニタ用PDチップ(4)が組込まれ
たステム(5)に組立てられている。FIG. 3 is a cross-sectional front view showing a conventional semiconductor laser device.
The LD chip (1) is assembled into a heat dissipation block (3) via a submount (2) serving as a thermal stress relaxation material, and the heat dissipation block (3) is assembled into a stem (5) into which a monitor PD chip (4) is incorporated. It is assembled in.
LDチップ(1)及びPDチップ(4)は金線(6)が
ポンデイングされ、リード線(7)に電気的に導通され
ている。ステム(5)にキャップ(8)が取付けられ、
LDが構成される,第4図に示す如<、LDチップ(1
)は熱特性の向上を図るため、熱源であるLDチップ(
1)の活性層(9)がサブマウント(2)側になるよう
ジャンクションダウン( Jc lnction do
ur+ )方式にて組立てられるっ
サブマウント(2)の両面にPbS1:l系の半田(1
0)が形成されており、LDチップ(1)、サブマウン
ト(2)、放熱ブロック(3)が接着される。The LD chip (1) and the PD chip (4) are bonded with a gold wire (6) and are electrically connected to a lead wire (7). A cap (8) is attached to the stem (5),
The LD is composed of an LD chip (1) as shown in FIG.
) to improve its thermal characteristics, the LD chip (
Junction down so that the active layer (9) of 1) is on the submount (2) side.
PbS1:l solder (1) is applied to both sides of the submount (2), which is assembled using the
0) is formed, and the LD chip (1), submount (2), and heat dissipation block (3) are bonded thereto.
次に動作について説明する。Next, the operation will be explained.
LDチップ(1)はリード線(7) K t圧を印加さ
れると、LDチップ(1)に電流が流れレーザ発振が始
まり、LDチップ(1)より2方向にレーザ光が第3図
に矢印で示す如く放射される。一方のレーザ光は光シス
テムの光源として用いられ、他方のレーザ光はモニタP
D(4)に入射して,LD光出力の制御に用いられるっ
モニタPD(4)はレーザに対して図示の如く傾斜され
ており、レーザ光の入射光がPD(4)で反射して再び
LDチップ(1)へ入射する事のないように組立てられ
ている。The LD chip (1) is connected to the lead wire (7). When Kt pressure is applied, a current flows through the LD chip (1) and laser oscillation begins, and laser light is emitted from the LD chip (1) in two directions as shown in Figure 3. It is radiated as shown by the arrow. One laser beam is used as the light source of the optical system, and the other laser beam is used as a monitor P.
The monitor PD (4), which is used to control the LD light output and is incident on D (4), is tilted with respect to the laser as shown in the figure, and the incident laser light is reflected by the PD (4). It is assembled so that it will not enter the LD chip (1) again.
[発明が解決しようとする課題]
従来の半導体レーザ装置は以上のように構成されていた
ので、活性層がサブマウントに近接して組立てられてお
り、LDチップ裏面からの出射光はPbSn系の半田表
面に反射してモニタPD(4)に入射することとなり、
PbSn系半田の場合、良好な接着性が得られ、又、ソ
フト半田であるため、LDチップへの組立ストレスを小
さくできる利点を有するが、表面状態の経時変化が生じ
やすく(ウイスカの発生、表面荒れによる反射率の変化
等による)モニタPDへの入射光量を一定としにくくレ
ーザ光の制御性に問題を生じやすかった。[Problems to be Solved by the Invention] Since the conventional semiconductor laser device was constructed as described above, the active layer was assembled close to the submount, and the light emitted from the back surface of the LD chip was caused by a PbSn-based laser. It will be reflected on the solder surface and will be incident on the monitor PD (4).
In the case of PbSn-based solder, good adhesion can be obtained, and since it is a soft solder, it has the advantage of reducing assembly stress on the LD chip. It was difficult to keep the amount of light incident on the monitor PD constant (due to changes in reflectance due to roughness, etc.), and problems were likely to occur in the controllability of the laser light.
本発明は上記のような問題を解決するためになされたも
ので、PbSn系半田においてもモニタPDヘの入射光
量を一定になるようにしレーザ光の制御性を高める事を
目的とするっ
〔課題を解決するための手段〕
本発明に係る半導体レーザ装置は、サブマウントのLD
チップが装着される側の表面にPhon系の半田がLD
チップの面積より小さく形成され、半田のない領域は金
等の表面状態の経時変化のない金属で被うようにしたも
のである。The present invention has been made in order to solve the above-mentioned problems, and its purpose is to improve the controllability of laser light by making the amount of light incident on the monitor PD constant even in PbSn-based solder. Means for Solving the Problem] A semiconductor laser device according to the present invention has a submount LD.
Phon-based solder is LD on the surface where the chip is attached.
It is formed smaller than the area of the chip, and the areas without solder are covered with a metal such as gold whose surface condition does not change over time.
〔作用1
本発明における半導体レーザ装置は、LDチップ裏面か
らの出射光がPbSn系半田に入射し反射されることが
なく、金等の表面状態の安定な金属で反射されるため、
モニタPDへの入射光は一定となる。[Effect 1] In the semiconductor laser device of the present invention, the light emitted from the back surface of the LD chip does not enter the PbSn solder and is reflected, but is reflected by a metal with a stable surface state such as gold.
The incident light on the monitor PD remains constant.
以下、本発明の一実施例を図について説明する,第1図
・第2図は本発明の実施例である半導体レーザ装置の平
面図および正面図である,図に示す如くサブマウント(
2)のLDチップ(1)が装着される側の面にはLDチ
ップ(1)の面積より小さ( PbSn系半田(10)
を形成して置き、PbSn系半田(10)以外の表面を
金等の表面状態の安定な金属(11)で被って置く。サ
ブマウント(2)の他方の面は全面PhSr′l系半田
(10)を形成する。Hereinafter, one embodiment of the present invention will be explained with reference to the drawings. Figs. 1 and 2 are a plan view and a front view of a semiconductor laser device which is an embodiment of the present invention. As shown in the figure, a submount (
2) On the side where the LD chip (1) is mounted, there is a PbSn solder (10) smaller in area than the LD chip (1).
is formed and placed, and the surfaces other than the PbSn solder (10) are covered with a metal (11) with a stable surface condition such as gold. The other surface of the submount (2) is entirely coated with PhSr'l solder (10).
LDチップ(1)、サブマウント(2)を放熱ブロック
(図示せず)上で位置合せし、ヒートアツプしてPbS
n系半田(10)により接着する。Align the LD chip (1) and submount (2) on a heat dissipation block (not shown) and heat up the PbS.
Adhesion is performed using n-based solder (10).
次に動作について説明するわ
LDチップ(1)よりの裏面出射光は第2図のようにサ
ブマウント(2)上の金等の表面状態の安定な金属(1
1)で反射され、モニタPDL図示せず)に入射するこ
ととなる。Next, I will explain the operation.The light emitted from the back surface of the LD chip (1) is emitted from a metal (1) with a stable surface condition such as gold on the submount (2) as shown in Figure 2.
1) and enters the monitor PDL (not shown).
[発明の効果]
以上のように本発明によれば、サブマウントのLDチッ
プが接着される面のPbSn系半田面積をLDチップ面
積より小さく形成され、PbSn系半田以外の表面は金
等の表面状態の安定な金属で被われているので、LDチ
ップよりの裏面出射光は安定的に一定量モニタPDに入
射し、レーザ出射光の制御性向上を図ることができろう[Effects of the Invention] As described above, according to the present invention, the PbSn solder area on the surface of the submount to which the LD chip is bonded is formed to be smaller than the LD chip area, and the surface other than the PbSn solder is made of gold or the like. Since it is covered with a stable metal, a constant amount of light emitted from the back side of the LD chip enters the monitor PD in a stable manner, improving the controllability of the laser emitted light.
第1図・第2図は本発明の一実施例である半導体レーザ
装置の平面図および正面図、第3図は従来の半導体レー
ザ装置の断面正面図、第4図は第3図のLDチップとサ
ブマウントの拡大正面図である。
図において、(1)はLDチップ、(2)はサブマウン
ト、(10)はPhon系半田、(11)は金などの金
属を示すク
なお、図中、同一符号は同一、または相当部分を示す。1 and 2 are a plan view and a front view of a semiconductor laser device that is an embodiment of the present invention, FIG. 3 is a cross-sectional front view of a conventional semiconductor laser device, and FIG. 4 is an LD chip of FIG. 3. and an enlarged front view of the submount. In the figure, (1) is the LD chip, (2) is the submount, (10) is Phon solder, and (11) is metal such as gold. show.
Claims (1)
して放熱ブロックに組立てられて構成される半導体レー
ザ装置において、 前記サブマウントのLDチップが接着される面にはPb
Sn系半田が前記LDチップ面積より小さく形成され、
PbSn系半田のない前記サブマウント表面は金等の表
面状態の安定な金属で被われていることを特徴とする半
導体レーザ装置。[Claims] In a semiconductor laser device configured by assembling an LD chip onto a heat dissipation block via a submount as a thermal stress relaxation material, the surface of the submount to which the LD chip is bonded is made of Pb.
Sn-based solder is formed to be smaller than the area of the LD chip,
A semiconductor laser device characterized in that the submount surface without PbSn solder is covered with a metal having a stable surface condition, such as gold.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1283390A JPH03217067A (en) | 1990-01-22 | 1990-01-22 | Semiconductor laser device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1283390A JPH03217067A (en) | 1990-01-22 | 1990-01-22 | Semiconductor laser device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03217067A true JPH03217067A (en) | 1991-09-24 |
Family
ID=11816377
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1283390A Pending JPH03217067A (en) | 1990-01-22 | 1990-01-22 | Semiconductor laser device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03217067A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7889770B2 (en) | 2002-03-25 | 2011-02-15 | Sanyo Electric Co., Ltd. | Semiconductor laser device |
US20170371110A1 (en) * | 2016-06-23 | 2017-12-28 | Futurewei Technologies, Inc. | Optical Transceiver With a Mirrored Submount and a Laser Diode for Laser-to-Fiber Coupling |
WO2018193551A1 (en) * | 2017-04-19 | 2018-10-25 | 三菱電機株式会社 | Light semiconductor device and production method therefor |
-
1990
- 1990-01-22 JP JP1283390A patent/JPH03217067A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7889770B2 (en) | 2002-03-25 | 2011-02-15 | Sanyo Electric Co., Ltd. | Semiconductor laser device |
US20170371110A1 (en) * | 2016-06-23 | 2017-12-28 | Futurewei Technologies, Inc. | Optical Transceiver With a Mirrored Submount and a Laser Diode for Laser-to-Fiber Coupling |
WO2018193551A1 (en) * | 2017-04-19 | 2018-10-25 | 三菱電機株式会社 | Light semiconductor device and production method therefor |
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