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JPH02312136A - Manufacture of charge preventing film and cathode-ray tube - Google Patents

Manufacture of charge preventing film and cathode-ray tube

Info

Publication number
JPH02312136A
JPH02312136A JP13272389A JP13272389A JPH02312136A JP H02312136 A JPH02312136 A JP H02312136A JP 13272389 A JP13272389 A JP 13272389A JP 13272389 A JP13272389 A JP 13272389A JP H02312136 A JPH02312136 A JP H02312136A
Authority
JP
Japan
Prior art keywords
silica sol
ray tube
film
charge preventing
preventing film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13272389A
Other languages
Japanese (ja)
Inventor
Hisami Okuwada
久美 奥和田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP13272389A priority Critical patent/JPH02312136A/en
Publication of JPH02312136A publication Critical patent/JPH02312136A/en
Pending legal-status Critical Current

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Landscapes

  • Formation Of Various Coating Films On Cathode Ray Tubes And Lamps (AREA)
  • Vessels, Lead-In Wires, Accessory Apparatuses For Cathode-Ray Tubes (AREA)
  • Elimination Of Static Electricity (AREA)

Abstract

PURPOSE:To obtain a charge preventing film having a stable charge preventing effect by coating and sintering silica sol including a conductive particle. CONSTITUTION:A particle such as being stable in a silica sol without any deterioration of its property at a temperature required for sintering is suitable for a conductive particle. Generally, the content of the conductive particle in the silica sol is preferably about 10-70wt.% with respect to a solid substance (oxide conversion) in the silica sol. It is enough for the silica sol to basically generate silica SiO2 by sintering of a tunnel kiln, infrared irradiation or the like. The concentration of the silica sol can be determined adequately, and 1-10wt.% with respect to a solid substance (oxide conversion) is preferable. As a coating method, various techniques such as spraying spin-coating, and dipping techniques can be used. A thus obtained charge preventing film is high in strength, is table without any deterioration of its property due to an exterior environment, and further can be fabricated easily.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は帯電防止膜の製造方法及びそれを用いた陰極線
管に関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a method for manufacturing an antistatic film and a cathode ray tube using the same.

(従来の技術) パーソナルコンピュータ、各種表示端末等に用いられる
陰極線管の前面パネルは帯電し易く、結果として大気中
のごみ等の付着による画像の見にくさ等の問題が生じる
。この問題に対処するため特開昭61−118946号
公報にはシラノール基を含む帯電防止膜を形成する技術
が開示されており。
(Prior Art) The front panel of a cathode ray tube used in personal computers, various display terminals, etc. is easily charged with electricity, resulting in problems such as difficulty in viewing images due to adhesion of atmospheric dust and the like. To deal with this problem, Japanese Patent Laid-Open No. 118946/1983 discloses a technique for forming an antistatic film containing silanol groups.

特開昭63−76247号公報には5L(OR)4(R
はアルキル基)を吹き付け塗布後焼成した反射防止膜上
に、 常圧CVD法により作成したSnO,。
5L(OR)4(R
SnO was created by normal pressure CVD on an antireflection film that was spray-coated with an alkyl group (alkyl group) and then baked.

In、O,の帯電防止膜を形成する技術が開示されてい
る。前者は湿度等の外部環境に影響され易く帯電防止効
果が不十分である。また後者はCVD法を用いるため製
造コストが高価となる。
A technique for forming an antistatic film of In, O, has been disclosed. The former is easily influenced by the external environment such as humidity and has insufficient antistatic effect. Furthermore, since the latter uses the CVD method, the manufacturing cost is high.

一方、帯電防止に関しては陰極線管に限らず。On the other hand, antistatic issues are not limited to cathode ray tubes.

ガラス、プラスチック部品の多いOA機器でも問題とな
る。特にコピーマシン等では静電気が発生し易い、従来
は有機バインダーを主成分とした導電性塗料が用いられ
ているが、耐熱性にば欠ける。
This is also a problem for office automation equipment that has many glass and plastic parts. Particularly in copy machines and the like, static electricity is easily generated. Conventionally, conductive paints based on organic binders have been used, but they lack heat resistance.

膜強度が弱い等の問題があり、やはり安定な帯電防止効
果に関しては不十分であった。
There were problems such as weak film strength, and the stable antistatic effect was still insufficient.

(発明が解決しようとする課題) この様に帯電防止膜については広範な要求があるものの
、満足のいくものは得られないのが現状である。特に製
造が容易で、安定な帯電防止効果を有する帯電防止膜に
対する希望は大きなものであった。
(Problems to be Solved by the Invention) Although there is a wide range of demands for antistatic films as described above, the present situation is that no satisfactory film can be obtained. In particular, there has been a great desire for an antistatic film that is easy to manufacture and has a stable antistatic effect.

本発明は以上の点を考慮してなされたもので。The present invention has been made in consideration of the above points.

安定な帯電防止効果を有する帯電防止膜を容易に得るこ
とのできる製造方法を提供し、またこの方法を用いて良
好な帯電防止効果が得られる陰極線管を提供することを
目的とする。
It is an object of the present invention to provide a manufacturing method by which an antistatic film having a stable antistatic effect can be easily obtained, and also to provide a cathode ray tube that can obtain a good antistatic effect using this method.

〔発明の構成〕[Structure of the invention]

(iagを解決するための手段及び作用)本発明は導電
性微粒子を含有するシリカゾルを塗布・焼成することを
特徴とする帯電防止膜の製造方法である。
(Means and effects for solving IAG) The present invention is a method for producing an antistatic film characterized by coating and baking a silica sol containing conductive fine particles.

導電性微粒子はシリカゾル中で安定であり、焼成に必要
な温度で特性が劣化しないものであれば良い。特に透過
率の高いことが要求される場合は、−次粒子径が200
Å以下、更には150Å以下のSnO2及びIn2O,
の少なくとも一種が好ましい。特に−次粒子径が150
Å以下の場合には、透過率90%以上の膜が成膜できる
ため、光学機器用として有効である。また必要に応じ添
加物を加えたSnO2: Sb、SnO,: P、In
2O,: Sn等でも良い。この導電性微粒子のシリカ
ゾル中の配合量は、帯電防止膜として良好なシート抵抗
1010Ω/口以下程度を実現できるように適宜設定で
きるが、一般的にはシリカゾル中の固形分(酸化物換算
)に対し、10〜70重量%程度が好ましい。
The conductive fine particles may be those that are stable in the silica sol and whose characteristics do not deteriorate at the temperature required for firing. In particular, when high transmittance is required, the -order particle size is 200
SnO2 and In2O of Å or less, even 150Å or less,
At least one of these is preferred. Especially when the -order particle size is 150
When the thickness is Å or less, a film with a transmittance of 90% or more can be formed, which is effective for use in optical equipment. Also, SnO2: Sb, SnO,: P, In with additives added as necessary
2O,: Sn, etc. may also be used. The amount of these conductive fine particles in the silica sol can be set as appropriate to achieve a sheet resistance of 1010 Ω/or less, which is good for an antistatic film, but it is generally determined by the solid content (in terms of oxide) in the silica sol. On the other hand, about 10 to 70% by weight is preferable.

またシリカゾルであるが、基本的にはトンネル炉、赤外
線照射等の焼成によりシリカ(S i Oz )を生成
すれば良いが、5i(OR)、(Rはアルキル基)を主
成分としたアルコール溶液は100〜600℃の低温で
成膜できるため好ましい。なお濃度は塗布条件により適
宜設定できるが、固形分(酸化物換算)で1〜10νt
%が望ましい。 またシリカゾルであるが他の元素を添
加しても良く、例えばM(OR)x(M;例えばZrt
 AQ2Mg、 Ca)の形で添加することが可能であ
る。
Regarding silica sol, basically silica (S i Oz ) can be produced by firing in a tunnel furnace, infrared irradiation, etc., but 5i (OR), an alcoholic solution containing (R is an alkyl group) as the main component is preferable because it can form a film at a low temperature of 100 to 600°C. The concentration can be set as appropriate depending on the coating conditions, but the solid content (in terms of oxide) is 1 to 10 νt.
% is desirable. Although it is a silica sol, other elements may be added, for example, M(OR) x (M; for example, Zrt
AQ2Mg, Ca) can be added.

塗布方法には、スプレー、スピンコード、ディッピング
等各種方法を用いることができる。陰極線管の前面パネ
ルの外表面に用いる場合は、反射防止の機能をもたせる
ため、スプレー(吹き付け)塗布を用いることが好まし
い、この場合、形成された膜表面は微細な凹凸ができ、
良好な反射防止効果を得ることができる。処理条件によ
りいかようにも調整できるが、形成された膜の平均膜厚
が1000人前後、凹凸のピッチが約10〜30μm前
後、凹凸高さが表面粗さで0.5μs前後となるように
行なうことが解像度等の光学特性の面で特に有効である
。また本発明に係る帯電防止膜形成後、導電性微粒子を
含まないシリカゾルを吹き付け塗布・焼成することによ
り1反射防止膜を別個に設けることもできる。
As the coating method, various methods such as spraying, spin cord, dipping, etc. can be used. When used on the outer surface of the front panel of a cathode ray tube, it is preferable to use spray coating in order to provide an anti-reflection function.In this case, the formed film surface will have minute irregularities.
A good antireflection effect can be obtained. Although it can be adjusted in any way depending on the processing conditions, the average thickness of the formed film should be around 1000 mm, the pitch of the unevenness should be around 10 to 30 μm, and the height of the unevenness should be around 0.5 μs in terms of surface roughness. This is particularly effective in terms of optical characteristics such as resolution. Further, after forming the antistatic film according to the present invention, an antireflection film can be separately provided by spraying and baking a silica sol that does not contain conductive particles.

本発明により得られた帯電防止膜は膜強度が強く、また
外部環境による特性劣化もなく安定である。また塗布・
焼成により形成できるため製造も容易である。
The antistatic film obtained by the present invention has strong film strength and is stable without deterioration of characteristics due to external environment. Also, apply
Since it can be formed by firing, it is easy to manufacture.

特に本発明では、光学的特性を低下させずに帯電防止能
が付与された陰極線管が得られる。
In particular, according to the present invention, a cathode ray tube can be obtained which is provided with antistatic ability without deteriorating its optical characteristics.

(実施例) 以下に本発明の詳細な説明する。(Example) The present invention will be explained in detail below.

実施例1〜4 ガラス板上に第1表に示すシリカゾル (S x (OCt Hs )4のエチルアルコール溶
液、酸化物換算で5vt%a度)を塗布し、同表記載の
条件で熱処理した結果を示す。いずれも1010Ω/口
以下の低抵抗が実現でき、良好な帯電防止効果を得るこ
とができる。
Examples 1 to 4 Silica sol shown in Table 1 (ethyl alcohol solution of S x (OCt Hs ) 4, 5 vt% a degree in terms of oxide) was applied on a glass plate, and the results were heat-treated under the conditions listed in the table. shows. In either case, a low resistance of 1010 Ω/hole or less can be achieved, and a good antistatic effect can be obtained.

以下余白 第  1  表 得られた膜は基本マトリックスがSio、の膜であり、
強固かつ−(熱性に優れ、周囲環境に左右されない帯電
防止膜を得ることができる。更に実施例3,4にはほぼ
透明であり、下地色を損うことがない。また処理温度が
低いことからOA機器のボディー等を構成するプラスチ
ックにも適用できる6特に帯電が生じ易い低湿環境下で
の使用に好適である。
The following is a margin: Table 1 The obtained film has a basic matrix of Sio.
It is possible to obtain an antistatic film that is strong and has excellent heat resistance and is not affected by the surrounding environment. Furthermore, Examples 3 and 4 are almost transparent and do not damage the base color. Also, the processing temperature is low. It can also be applied to plastics constituting the bodies of OA equipment, etc. 6 It is particularly suitable for use in low humidity environments where charging is likely to occur.

実施例5〜9および比較例 第2表組成の各コーテイング液を調製した。各液を陰極
線管パネル表面にスピンコードし、400℃のトンネル
炉を通した。各陰極線管のパネル表面抵抗を測定したと
ころ、107〜10907口であった。特に実施例2〜
4は透過率が90%以上と高く、図面の曇りも見られな
かった。実施例5は800℃で外表面を再熱処理すると
透明度が増した。比較実施例10〜14 実施例5〜9で用いた各コーテイング液を陰極線管パネ
ル表面に吹き付け塗布し、トンネル炉を通し得た陰極線
管をそれぞれ実施例;二aとした。
Coating liquids of Examples 5 to 9 and Comparative Examples having the compositions shown in Table 2 were prepared. Each solution was spin-coded onto the surface of a cathode ray tube panel and passed through a tunnel furnace at 400°C. When the panel surface resistance of each cathode ray tube was measured, it was 107 to 10,907 ports. Especially Example 2~
No. 4 had a high transmittance of 90% or more, and no clouding was observed in the drawing. In Example 5, the transparency increased when the outer surface was reheated at 800°C. Comparative Examples 10 to 14 Each of the coating solutions used in Examples 5 to 9 was applied by spraying onto the surface of a cathode ray tube panel, and the cathode ray tubes obtained by passing through a tunnel furnace were designated as Example 2a.

表面抵抗はいずれも109Ω/口以下であり、映り込み
が少なくなった。特に実施例11〜13では曇りもほと
んど見られなかった。
The surface resistance was 109Ω/mouth or less in all cases, and reflections were reduced. Particularly in Examples 11 to 13, almost no clouding was observed.

実施例15〜19 実施例5〜9の各陰極線管パネル表面に導電性微粒子を
含有させないSi(○C2Hs )4のアルコール溶液
を吹き付け塗布し、画面を150℃まで加熱した。これ
らの陰極線管をそれぞれ実施例15〜19とする。表面
抵抗はいずれも10″Ω/口以下であり、映り込みも軽
減された。特に実施例16〜18では曇りもほとんど見
られなかった。また、実施例1〜19はいずれも湿度1
0〜90%の環境下で表面抵抗が1010Ω/口以上に
上がることはなかった。
Examples 15 to 19 An alcohol solution of Si(○C2Hs)4 containing no conductive particles was applied by spraying onto the surface of each of the cathode ray tube panels of Examples 5 to 9, and the screen was heated to 150°C. These cathode ray tubes are referred to as Examples 15 to 19, respectively. The surface resistance was 10"Ω/mouth or less in all cases, and reflections were also reduced. Particularly in Examples 16 to 18, almost no clouding was observed. In addition, in Examples 1 to 19, the humidity was 1.
In an environment of 0 to 90%, the surface resistance did not rise above 1010 Ω/mouth.

また、実施例5〜19の陰極線管のスイッチオフ後の誘
導電圧がOVになるまでの時間を測定したところ、いず
れも60秒以下であった。これに対し。
Furthermore, when the time required for the induced voltage to reach OV after switching off the cathode ray tubes of Examples 5 to 19 was measured, all of them were 60 seconds or less. Against this.

比較例の場合は5分以上かかった。In the case of the comparative example, it took more than 5 minutes.

以下余白 第   2   表 〔発明の効果〕 以上説明したように本発明によれば、膜強度が大きく安
定な帯電効果を有する帯電防止膜を容易に得ることがで
き、特に陰他線管の一!iF電防止膜として優れたもの
となる。
Table 2 (Blank below) [Effects of the Invention] As explained above, according to the present invention, it is possible to easily obtain an antistatic film having a high film strength and a stable charging effect, especially for cathode ray tubes. It becomes an excellent iF antistatic film.

代理人 弁理士  則 近 憲 佑 同  松山光之Agent: Patent Attorney Noriyuki Chika Same as Mitsuyuki Matsuyama

Claims (4)

【特許請求の範囲】[Claims] (1)導電性微粒子を含有するシリカゾルを塗布後、熱
処理することを特徴とする帯電防止膜の製造方法。
(1) A method for producing an antistatic film, which comprises applying a silica sol containing conductive fine particles and then subjecting it to heat treatment.
(2)前面パネルの外表面に請求項1記載の製造方法に
より帯電防止膜を形成したことを特徴とする陰極線管。
(2) A cathode ray tube characterized in that an antistatic film is formed on the outer surface of the front panel by the manufacturing method according to claim 1.
(3)請求項2記載の陰極線管において、帯電防止膜上
にシリカゾル吹き付け塗布・焼成による反射防止膜を形
成したことを特徴とする陰極線管。
(3) The cathode ray tube according to claim 2, wherein an antireflection film is formed on the antistatic film by spray coating and baking silica sol.
(4)導電性微粒子がSnO_2及びIn_2O_3の
少なくとも一種を主成分とする、一次粒子径150Å以
下の微粒子であることを特徴とする請求項1記載の帯電
防止膜の製造方法。
(4) The method for producing an antistatic film according to claim 1, wherein the conductive fine particles are fine particles containing at least one of SnO_2 and In_2O_3 as a main component and having a primary particle diameter of 150 Å or less.
JP13272389A 1989-05-29 1989-05-29 Manufacture of charge preventing film and cathode-ray tube Pending JPH02312136A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13272389A JPH02312136A (en) 1989-05-29 1989-05-29 Manufacture of charge preventing film and cathode-ray tube

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13272389A JPH02312136A (en) 1989-05-29 1989-05-29 Manufacture of charge preventing film and cathode-ray tube

Publications (1)

Publication Number Publication Date
JPH02312136A true JPH02312136A (en) 1990-12-27

Family

ID=15088078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13272389A Pending JPH02312136A (en) 1989-05-29 1989-05-29 Manufacture of charge preventing film and cathode-ray tube

Country Status (1)

Country Link
JP (1) JPH02312136A (en)

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