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JPH02116804A - Production of mgf2 film and production of low reflection film - Google Patents

Production of mgf2 film and production of low reflection film

Info

Publication number
JPH02116804A
JPH02116804A JP26948388A JP26948388A JPH02116804A JP H02116804 A JPH02116804 A JP H02116804A JP 26948388 A JP26948388 A JP 26948388A JP 26948388 A JP26948388 A JP 26948388A JP H02116804 A JPH02116804 A JP H02116804A
Authority
JP
Japan
Prior art keywords
film
mgx2
substrate
mgf2
low reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26948388A
Other languages
Japanese (ja)
Inventor
Takeshi Morimoto
剛 森本
Yasuhiro Sanada
恭宏 真田
Hiroshi Ariga
広志 有賀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP26948388A priority Critical patent/JPH02116804A/en
Publication of JPH02116804A publication Critical patent/JPH02116804A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To obtain the MgF2 film which is simple and stable and has low reflection characteristics by applying a liquid contg. Mg(BF4)2 and MgX2 on a substrate, then heating the substrate, thereby producing the MgX2. CONSTITUTION:The Mg(BF4)2 film is formed by applying the liquid contg. the Mg(BF4)2 and the MgX2 (X=halogen elements exclusive of fluorine) on the substrate, then heating the substrate. The low reflection film is thereby produced. Namely, the the MgX2 film is considered to be formed on the bases of the reaction Mg(BF4)2+3MgX2 4MgF2+2BX3 in forming the MgX2 film by bringing the Mg(BF4)2 and the MgX2 into reaction. The boron (B) of the Mg(BF4)2 removes X of MgX2 in the form of the gas of BX3. The extremely pure MgX2 is, therefore, formed efficiently if the Mg(BF4)2 and the MgX2 are used at 1:3 molar ratio. The excellent MgX2 and the low reflection film contg. MgF2 film are thereby obtd. efficiently in this way by the simple method.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は低反射膜の製造方法に関するものである。[Detailed description of the invention] [Industrial application field] The present invention relates to a method of manufacturing a low reflection film.

[従来の技術] 低反射膜のコーティング法は従来より光学的機器におい
てはいうまでもな(、民生用機器特にTV、コンピュー
タ端末の陰極線管(CR’r)に関し多く検討がなされ
てきた。
[Prior Art] Coating methods for low-reflection films have been studied extensively not only in optical equipment, but also in consumer equipment, especially cathode ray tubes (CR'r) for TVs and computer terminals.

従来の方法は例えば特開昭61−118931号記載の
如くブラウン管表面に防眩効果をもたせる為に表面に微
細な凹凸を有するSiO□層を付着させたり、弗酸によ
り表面をエツチングして凹凸を設ける等の方法が採られ
てきた。しかし、これらの方法は外部光を拡散反射させ
るノングレア−処理と呼ばれ、本質的に低反射層を設け
る手法でない為、反射率の低減には限界があった。
Conventional methods include, for example, as described in JP-A-61-118931, in order to provide an anti-glare effect to the surface of a cathode ray tube, a SiO□ layer having fine irregularities is attached to the surface, or the surface is etched with hydrofluoric acid to remove irregularities. Methods such as establishing a However, these methods are called non-glare treatments that diffusely reflect external light, and are essentially not methods of providing a low-reflection layer, so there is a limit to the reduction in reflectance.

また安定な低屈折率物質であるtAgF 2を真空蒸着
等物理的な手段によってレンズ、ガラス表面ごと に付着させカ姓秀も行なわれているが、この方法では装
置費が高く、或いはCRT完成球の様な大きな被付着物
を真空チャンバー内に収納するのが困難であるという欠
点があった。
In addition, tAgF2, a stable low refractive index substance, has been applied to each lens and glass surface by physical means such as vacuum evaporation, but this method requires high equipment costs or requires a complete CRT sphere. The disadvantage is that it is difficult to accommodate large adherents such as these in a vacuum chamber.

[発明の解決しようとする課題] 本発明の目的は従来技術が有していた前述の欠点を解決
し、化学的手法により簡便で安定且つ優れた低反射特性
を有するMgFz膜の製造方法を新たに提供することに
よる。
[Problems to be Solved by the Invention] The purpose of the present invention is to solve the above-mentioned drawbacks of the prior art, and to provide a new method for producing a MgFz film that is simple, stable, and has excellent low reflection characteristics by a chemical method. By providing.

[課題を解決するための手段] 即ち、本発明はMg(BF4)a及びMgX2(X=フ
ッ素を除くハロゲン元素)を含む液体を基体上に塗布し
た後、加熱することを特徴とするMgF2膜の製造方法
、及び基体上に単層又は多層膜からなり、そのうち少な
くとも一層がMgF、膜である低反射膜を形成する方法
において、該MgF2膜を、Mg(BFn)z及びMg
L (X =フッ素を除(ハロゲン元素)を含む液体を
基体上に塗布した後加熱することによって形成すること
を特徴とする低反射膜の製造方法を提供するものである
[Means for Solving the Problems] That is, the present invention provides an MgF2 film characterized in that a liquid containing Mg(BF4)a and MgX2 (X = halogen element excluding fluorine) is applied onto a substrate and then heated. and a method for forming a low reflection film consisting of a single layer or a multilayer film on a substrate, at least one of which is a MgF film, in which the MgF2 film is formed of Mg(BFn)z and Mg
The present invention provides a method for producing a low-reflection film, characterized in that it is formed by applying a liquid containing L (X = halogen element excluding fluorine) onto a substrate and then heating it.

本発明の特徴は、Mg(BF4)z及びMgxz (以
下まとめて出発物質という)を反応させてMgF2膜を
形成することにある。
The feature of the present invention is that Mg(BF4)z and Mgxz (hereinafter collectively referred to as starting materials) are reacted to form a MgF2 film.

本発明に於いては下式の反応に基づいてMgF 2が生
成すると考えられる。
In the present invention, it is thought that MgF 2 is produced based on the reaction of the following formula.

Mg (BF41 m + 3MgL→4MgF2+ 
28Xa↑ ・・・(1)上記反応は出発物質を溶媒に
分散或いは溶解させ、更に加熱することによって容易に
進行する。
Mg (BF41 m + 3MgL→4MgF2+
28Xa↑ (1) The above reaction easily proceeds by dispersing or dissolving the starting material in a solvent and further heating.

出発物質のMgLとしては、MgC1z、 MgBrz
、 MgIt等が使用可能であるが、MgC1gが上記
(1)式の反応が最も容易に進行するので特に好ましい
As the starting material MgL, MgC1z, MgBrz
, MgIt, etc. can be used, but MgClg is particularly preferred because the reaction of the above formula (1) proceeds most easily.

溶媒としては特に限定されないが、水、水溶ン夜、アル
コール プロピレンカーボネート、γーブチロラクトン等有機高
誘電率溶媒が使用可能である。
The solvent is not particularly limited, but organic high dielectric constant solvents such as water, water-soluble solvents, alcohol propylene carbonate, and γ-butyrolactone can be used.

(1)式の反応は、固相でも進行するので、出発物質が
溶媒中に溶解せずに固まりとなって分散した状態でも、
加熱することによって進行するが、均一な膿ができにく
いこと、又、膜の基体に対する十分な付着強度が得にく
いことから、出発物質が溶解した溶液を用いる方が好ま
しい。又、出発物質の溶媒中での安定性も考慮すると、
溶媒としては、アルコール、特にメタノール、エタノー
ル、プロパツール、ブタノール等が好ましい。
The reaction of formula (1) proceeds even in a solid phase, so even if the starting material is not dissolved in the solvent but dispersed as a lump,
Although the process progresses by heating, it is difficult to form uniform pus and it is difficult to obtain sufficient adhesion strength of the membrane to the substrate, so it is preferable to use a solution in which the starting material is dissolved. Also, considering the stability of the starting material in the solvent,
As the solvent, alcohols, particularly methanol, ethanol, propatool, butanol, etc. are preferred.

出発物質は、Mg(BF4)zとMgx2を、モル比で
1:3の割合で使用すると、上記(1)式の反応が最も
効率よく進行するので好ましい。
It is preferable to use Mg(BF4)z and Mgx2 in a molar ratio of 1:3 as the starting materials because the reaction of the above formula (1) proceeds most efficiently.

又、出発物質は、Mg(BF−)2とMgX 2と合せ
て、溶媒に対して1〜30wt%含まれていることが好
ましい。
Further, it is preferable that the starting materials, together with Mg(BF-)2 and MgX2, are contained in an amount of 1 to 30 wt% based on the solvent.

又、本発明において用いるMg(BF4)z及びMgL
を含む液体には、膜の付着強度及び硬度を向上させるた
めに、Si(OR)4( R :アルキル基)等等直鎖
アルキルベンゼンスルホン酸ナトリウム、アルキルエー
テル硫酸エステル等を添加してもよい。又、導電性付与
を目的として、導電性を有する金属酸化物(例えばSn
O.、 Snを含むIniOs (ITO)等)を形成
し得る金属(例えば、Sn, In等)のアセチルアセ
トネート、アルコキシド等の有機金属塩、ハロゲン化物
、酢酸塩、硝酸塩あるいはキレート化合物などの金属塩
を、本発明において用いるMg(sp+)z及びMgX
 2を含む液体に添加し、SnowやSnを含むIn.
03 (ITO)等を同時に析出させることも可能であ
る。
Furthermore, Mg(BF4)z and MgL used in the present invention
In order to improve the adhesion strength and hardness of the film, sodium linear alkylbenzene sulfonate such as Si(OR)4 (R: alkyl group), alkyl ether sulfate, etc. may be added to the liquid containing . In addition, for the purpose of imparting conductivity, metal oxides having conductivity (for example, Sn
O. , Sn-containing IniOs (ITO), etc.), organic metal salts such as acetylacetonates, alkoxides, halides, acetates, nitrates, or chelate compounds of metals (e.g., Sn, In, etc.). , Mg(sp+)z and MgX used in the present invention
2 and In.2 containing Snow or Sn.
It is also possible to precipitate 03 (ITO) etc. at the same time.

加熱温度は50℃以上が必要であるが、上限は通常は基
板に用いられるガラス、プラスチック等の軟化点によっ
て決定される。この点も考慮すると、好ましい温度範囲
は100〜400℃である。
The heating temperature needs to be 50° C. or higher, but the upper limit is usually determined by the softening point of the glass, plastic, etc. used for the substrate. Considering this point, the preferred temperature range is 100 to 400°C.

膜の基板上への付着法はスピンコード法、デイツプ法、
スプレー法、ロールコータ−法、メニスカスコーター法
等種々考えられるが、特にスピンコード法は量産性、再
現性に優れ好ましく採用可能である。かかる方法によっ
て100人〜1μm程度の膜厚のMgF2膜を形成可能
である。
The method of attaching the film to the substrate is spin code method, dip method,
Various methods can be considered, such as a spray method, a roll coater method, a meniscus coater method, etc., but the spin code method is particularly preferable because it has excellent mass productivity and reproducibility. By this method, it is possible to form a MgF2 film with a thickness of about 100 to 1 μm.

本発明においてMgF z膜及びMgFiを含む低反射
膜を形成する基体としては、特に限定されるものではな
く、目的に応じてソーダライムシリケートガラス、アル
ミノシリケートガラス、硼珪酸塩ガラス、リチウムアル
ミノシリケートガラス、石英ガラスなどのガラス、鋼玉
等の単結晶、マグネシア、サイアロン等の透光性セラミ
ックス、ポリカーボネート等のプラスチックなどが使用
できる。
In the present invention, the substrate on which the MgFz film and the low reflection film containing MgFi are formed is not particularly limited, and depending on the purpose, soda lime silicate glass, aluminosilicate glass, borosilicate glass, lithium aluminosilicate glass can be used. , glasses such as quartz glass, single crystals such as corundum, translucent ceramics such as magnesia and sialon, and plastics such as polycarbonate can be used.

本発明のMgF2膜の製造方法は、MgFa膜を含む多
層の低反射膜の製造にも応用できる。反射防止性能を有
する多層の低反射膜の構成としては、反射防止したい波
長をλとして、基体側より、高屈折率層−低屈折率層を
光学厚みλ/2−λ/4で形成した2層の低反射膜、基
体側より中屈折率層−高屈折率層−低屈折率層を光学厚
みλ/4−ん/2−λ/4で形成した3層の低反射膜、
基体より低屈折率層−中屈折率層一高屈折率層一低屈折
率層を光学厚みえ/4−λ/4−え/2−え/4で形成
した4層の低反射膜等が典型的な例として知られており
、本発明においては、低屈折率層としてMgF、膜(n
 = 1.38)を用いた多層の低反射膜を製造するこ
とも可能である。
The method for manufacturing a MgF2 film of the present invention can also be applied to manufacturing a multilayer low reflection film including a MgFa film. The structure of a multilayer low-reflection film having anti-reflection performance is as follows: The wavelength to be anti-reflected is set to λ, and from the base side, a high refractive index layer and a low refractive index layer are formed with an optical thickness of λ/2-λ/4. A three-layer low-reflection film formed from the substrate side by forming a medium refractive index layer, a high refractive index layer, and a low refractive index layer with an optical thickness of λ/4-n/2-λ/4,
A 4-layer low-reflection film, etc., formed from the substrate with a low refractive index layer, a medium refractive index layer, a high refractive index layer, and a low refractive index layer with an optical thickness of /4-λ/4-e/2-e/4. This is known as a typical example, and in the present invention, MgF, a film (n
It is also possible to manufacture a multilayer low-reflection film using 1.38).

又、ブラウン管(CRT)や前面パネル等において指摘
されている、CRT動作中に発生する静電気により表面
が帯電し、人体との間で放電を起こしたり、はこりが吸
着しやすいという問題の解決策として、低反射膜の一層
を透明で導電性を有する材料で構成したものが知られて
いるが、かかる導電性を有する低反射膜の製造にも適用
できる。例えば、基体/SnO□/MgF2、基体/I
TO/MgF2等の低反射膜も形成できる。
In addition, it is a solution to the problem that has been pointed out in cathode ray tubes (CRTs) and front panels, where the surface is charged due to static electricity generated during CRT operation, causing discharge between the CRT and the human body, and causing lumps to be easily attracted. It is known that one layer of a low-reflection film is made of a transparent and conductive material, but it can also be applied to the production of such a conductive low-reflection film. For example, substrate/SnO□/MgF2, substrate/I
A low reflection film such as TO/MgF2 can also be formed.

[作 用] 本発明においては、上述したように、 Mg(BF4)z+ 3MgL = 4MgF2+ 2
BXa↑ ・・・(11という反応に基づきMgF2膜
が生成すると考えられる。Mg(BF4)zのホウ素(
Blがvgx2のXをBX3という気体の形で除去する
為、Mg (BF4 ) 2とMgX 2をモル比で1
=3の割合で用いれば、効率良く、非常に純粋なMgF
a膜が形成することができる。
[Function] In the present invention, as described above, Mg(BF4)z+ 3MgL = 4MgF2+ 2
BXa↑ ... (It is thought that MgF2 film is generated based on the reaction 11. Mg(BF4)z boron (
Since Bl removes the
If used at a ratio of =3, efficient and extremely pure MgF can be obtained.
A film can be formed.

[実施例] 実施例1 メタノール−ブタノール混合溶媒(体積比1:2)に対
しll1g(BF4)zとMgC1□をモル比で1:3
且つ、総量が、前記溶媒に対し濃度が5重量%となる様
に添加し、溶解させた。
[Example] Example 1 ll1g(BF4)z and MgC1□ in a molar ratio of 1:3 to methanol-butanol mixed solvent (volume ratio 1:2)
Further, the total amount was added and dissolved in such a manner that the concentration was 5% by weight based on the solvent.

ガラス基板をこの溶液中に浸漬塗布し、更にスピンコー
ターで回転数3000rpmでコーティングした。この
ガラス基板を空気中250℃で30分間焼成して950
人のMgFa膜を形成した後、波長360〜700 (
nm)に於ける片面反射率を測定した。
A glass substrate was coated by dipping into this solution, and further coated with a spin coater at a rotation speed of 3000 rpm. This glass substrate was baked in air at 250°C for 30 minutes to obtain a
After forming the human MgFa film, the wavelength 360~700 (
The single-sided reflectance at 100 nm) was measured.

実施例2 焼成温度を150℃とした以外は実施例1と同様の方法
で、MgFa膜(1150人)を形成した。
Example 2 A MgFa film (1150 people) was formed in the same manner as in Example 1 except that the firing temperature was 150°C.

実施例3 溶媒にメタノール−ブタノール(体積比1・1)溶媒を
用いた以外は実施例1と同様の方法で、MgFa)l莫
(1100人)を形成した。
Example 3 MgFa)1 (1100 people) was formed in the same manner as in Example 1 except that methanol-butanol (volume ratio 1.1) was used as the solvent.

実施例4 スピンコーターの回転数を300rpmとした以外は実
施例1と同様の方法で、MgF2膜(1200人)を形
成した。
Example 4 A MgF2 film (1200 people) was formed in the same manner as in Example 1 except that the rotation speed of the spin coater was 300 rpm.

比較例 未処理のガラス基板の反射率を実施例1と同様に測定し
た。
Comparative Example The reflectance of an untreated glass substrate was measured in the same manner as in Example 1.

実施例1〜4及び比較例の測定結果として波長520 
(nm)に於ける反射率を表1に示す。
Wavelength 520 as measurement results of Examples 1 to 4 and comparative example
Table 1 shows the reflectance in (nm).

表  1 実施例5 メタノール、水からなる溶媒(体積比1:1)に対し5
nC1,、5bC1sを溶媒に対し各々2゜0.2wt
%になる様に添加し溶解した溶液に、ガラス基板を浸漬
塗布し、更にスピンコーターで回転数300Orpmで
コーティングした後、空気中400℃で30分間焼成し
て1100人のSn0w膜を形成した。次に、実施例1
と全く同様の方法でMgFi膜(膜厚950人)を形成
し、ガラス/SnO□/MgFiとした。波長520 
(nm)における反射率は1.4%であった。
Table 1 Example 5 5 for a solvent consisting of methanol and water (volume ratio 1:1)
nC1,, 5bC1s to the solvent at 2°0.2wt each
A glass substrate was dip-coated in a solution in which the amount of 10% of Sn0w was added and dissolved, and further coated with a spin coater at a rotational speed of 300 rpm, and then baked in air at 400° C. for 30 minutes to form a 1100-layer Sn0w film. Next, Example 1
A MgFi film (film thickness: 950 mm) was formed in exactly the same manner as described above, and was made into glass/SnO□/MgFi. wavelength 520
(nm) reflectance was 1.4%.

[発明の効果] 本発明によれば、Mg(BF4)zとMgx2を含む液
体を基体上にスプレー又はスピンコード、あるいは液体
中に基体を浸漬するなどの簡便な方法により、効率良<
、優れたλ!gF 2膜及びMgFz膜を含む低反射膜
を提供することが可能となる。
[Effects of the Invention] According to the present invention, a liquid containing Mg(BF4)z and Mgx2 can be sprayed onto a substrate by a simple method such as spraying or using a spin cord, or immersing the substrate in the liquid.
, excellent λ! It becomes possible to provide a low reflection film including a gF 2 film and a MgFz film.

本発明は、生産性に優れ、かつ、真空を必要としないの
で装置も比較的簡単なもので良い。
The present invention has excellent productivity and does not require a vacuum, so the apparatus may be relatively simple.

特にCRTのフェイス面等の大面積の基体にも十分適用
でき、量産も可能であり、工業的価値は非常に高い。
In particular, it can be sufficiently applied to large-area substrates such as the face of a CRT, and can be mass-produced, so its industrial value is extremely high.

Claims (3)

【特許請求の範囲】[Claims] (1)Mg(BF_4)_2及びMgX_2(X=フッ
素を除くハロゲン元素)を含む液体を基体上に塗布した 後、加熱して、MgF_2膜を製造することを特徴とす
るMgF_2膜の製造方法。
(1) A method for producing an MgF_2 film, which comprises applying a liquid containing Mg(BF_4)_2 and MgX_2 (X = halogen element excluding fluorine) onto a substrate and then heating it to produce an MgF_2 film.
(2)基体上に単層又は多層膜からなり、そのうち少な
くとも一層がMgF_2膜である低反射膜を形成する方
法において、該MgF_2膜を、Mg(BF_4)_2
及びMgX_2(X=フッ素を除くハロゲン元素)を含
む液体を基体上に塗布した後加熱することによって形成
することを特徴とする低反射膜の製造方法。
(2) In a method of forming a low reflection film consisting of a single layer or a multilayer film on a substrate, at least one of which is an MgF_2 film, the MgF_2 film is replaced with Mg(BF_4)_2
and MgX_2 (X = halogen element excluding fluorine) is applied onto a substrate and then heated.
(3)基体上に透明導電膜を形成し、次いで、その上に
Mg(BF_4)_2及びMgX_2(X=フッ素を除
くハロゲン元素)を含む液体を塗布し、加熱してMgF
_2膜を形成することにより、2層からなる、低反射膜
を形成することを特徴とする請求項2記載の低反射膜の
製造方法。
(3) Form a transparent conductive film on the substrate, then apply a liquid containing Mg(BF_4)_2 and MgX_2 (X = halogen element excluding fluorine) thereon, and heat it to form the MgF
3. The method of manufacturing a low-reflection film according to claim 2, wherein a two-layer low-reflection film is formed by forming the _2 film.
JP26948388A 1988-10-27 1988-10-27 Production of mgf2 film and production of low reflection film Pending JPH02116804A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26948388A JPH02116804A (en) 1988-10-27 1988-10-27 Production of mgf2 film and production of low reflection film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26948388A JPH02116804A (en) 1988-10-27 1988-10-27 Production of mgf2 film and production of low reflection film

Publications (1)

Publication Number Publication Date
JPH02116804A true JPH02116804A (en) 1990-05-01

Family

ID=17473071

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26948388A Pending JPH02116804A (en) 1988-10-27 1988-10-27 Production of mgf2 film and production of low reflection film

Country Status (1)

Country Link
JP (1) JPH02116804A (en)

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