JP7301512B2 - 基板研削装置及び基板研削方法 - Google Patents
基板研削装置及び基板研削方法 Download PDFInfo
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- JP7301512B2 JP7301512B2 JP2018171475A JP2018171475A JP7301512B2 JP 7301512 B2 JP7301512 B2 JP 7301512B2 JP 2018171475 A JP2018171475 A JP 2018171475A JP 2018171475 A JP2018171475 A JP 2018171475A JP 7301512 B2 JP7301512 B2 JP 7301512B2
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- 239000000758 substrate Substances 0.000 title claims description 247
- 238000000034 method Methods 0.000 title claims description 51
- 238000005520 cutting process Methods 0.000 claims description 11
- 238000013459 approach Methods 0.000 claims description 10
- 238000012545 processing Methods 0.000 description 7
- 238000004140 cleaning Methods 0.000 description 6
- 239000007788 liquid Substances 0.000 description 5
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 238000004513 sizing Methods 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000006061 abrasive grain Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/04—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a rotary work-table
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0076—Other grinding machines or devices grinding machines comprising two or more grinding tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/02—Frames; Beds; Carriages
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/04—Headstocks; Working-spindles; Features relating thereto
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D13/00—Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor
- B24D13/14—Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor acting by the front face
- B24D13/142—Wheels of special form
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Description
図1は、本発明の実施形態に係る基板研削装置10の概略を示す平面図である。図1を参照して、基板研削装置10は、基板30を研削または研磨する装置である。
図1を参照して、先ず、回転自在なワークテーブル20に基板30を吸着させるチャッキング工程が実行される。
図4は、粗研削工程における基板30の回転中心21付近を模式的に示す縦断面図である。研削工程では、先ず、粗研削工程が実行される。図4を参照して、粗研削工程では、仕上げ研削といし11及び粗研削といし15は、仕上げ研削といし11よりも粗研削といし15の方が基板30の上面31に近い状態で基板30に接近して基板30を研削する。
なお、本発明は、上記実施形態に限定されるものではなく、その他、本発明の要旨を逸脱しない範囲で、種々の変更実施が可能である。
11 仕上げ研削といし
12 といし刃先
14 仕上げ研削コラム
15 粗研削といし
16 といし刃先
18 粗研削コラム
20 ワークテーブル
21 回転中心
22 貼付ハウジング
23 スタンバイステージ
24 研削ステージ
25 制御盤
26 定寸装置
30 基板
31 上面
32 凸部
Claims (4)
- 基板を吸着して保持した状態で回転するワークテーブルと、
前記ワークテーブルに保持されて回転する前記基板の上面に接近して回転しながら前記基板の前記上面を研削するカップホイール型の第1の研削といしと、
前記第1の研削といしと同時に前記基板の前記上面に接近して回転しながら前記基板の前記上面を研削するカップホイール型の第2の研削といしと、を具備し、
前記第1の研削といしの粒度は、前記第2の研削といしの粒度よりも大きく、
前記第1の研削といしは、研削範囲の直径が前記基板の回転中心から前記基板の最外周までの距離よりも大きく、といし刃先が前記基板の回転中心を通過する位置に設けられており、
前記第1の研削といし及び前記第2の研削といしは、前記第1の研削といしよりも前記第2の研削といしの方が前記基板に近い状態で同時に前記基板に接近して前記基板を研削した後、前記第2の研削といしが前記基板から離れた状態で前記第1の研削といしが前記基板に接近して前記第1の研削といしのみで前記基板を研削することを特徴とする基板研削装置。 - 前記第1の研削といしは、研削範囲の直径が前記ワークテーブルの半径よりも大きく、
前記第2の研削といしは、研削範囲の直径が前記ワークテーブルの半径よりも大きく、前記基板の回転中心に近く前記第1の研削といしに接触しない位置に設けられていることを特徴とする請求項1に記載の基板研削装置。 - 回転自在なワークテーブルに基板を吸着させるチャッキング工程と、
前記ワークテーブルを回転させて保持されている前記基板を回転させると共にカップホイール型の第1の研削といし及び第2の研削といしを回転させ前記基板の上面に接近させて前記基板の前記上面を研削する研削工程と、を具備し、
前記第1の研削といしの粒度は、前記第2の研削といしの粒度よりも大きく、
前記第1の研削といしは、研削範囲の直径が前記基板の回転中心から前記基板の最外周までの距離よりも大きく、前記研削工程において、といし刃先が前記基板の回転中心を通過する位置に送られ、
前記研削工程において、前記第1の研削といしよりも前記第2の研削といしの方が前記基板に近い状態で前記第1の研削といし及び前記第2の研削といしが同時に前記基板に接近して前記基板を研削する粗研削工程が実行された後、前記第2の研削といしが前記基板から離れた状態で前記第1の研削といしが前記基板に接近して前記第1の研削といしのみで前記基板を研削する仕上げ研削工程が実行されることを特徴とする基板研削方法。 - 前記第1の研削といしは、研削範囲の直径が前記ワークテーブルの半径よりも大きく、
前記第2の研削といしは、研削範囲の直径が前記ワークテーブルの半径よりも大きく、前記研削工程において、前記基板の回転中心に近く前記第1の研削といしに接触しない位置に送られることを特徴とする請求項3に記載の基板研削方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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JP2018171475A JP7301512B2 (ja) | 2018-09-13 | 2018-09-13 | 基板研削装置及び基板研削方法 |
US16/565,548 US12358095B2 (en) | 2018-09-13 | 2019-09-10 | Substrate grinding device and substrate grinding method |
KR1020190111834A KR102725508B1 (ko) | 2018-09-13 | 2019-09-10 | 기판 연삭 장치 및 기판 연삭 방법 |
TW108132750A TWI828750B (zh) | 2018-09-13 | 2019-09-11 | 基板磨削裝置以及基板磨削方法 |
CN201910863453.XA CN110900313B (zh) | 2018-09-13 | 2019-09-12 | 基板磨削装置以及基板磨削方法 |
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JP2018171475A JP7301512B2 (ja) | 2018-09-13 | 2018-09-13 | 基板研削装置及び基板研削方法 |
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JP2020040189A JP2020040189A (ja) | 2020-03-19 |
JP7301512B2 true JP7301512B2 (ja) | 2023-07-03 |
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US (1) | US12358095B2 (ja) |
JP (1) | JP7301512B2 (ja) |
KR (1) | KR102725508B1 (ja) |
CN (1) | CN110900313B (ja) |
TW (1) | TWI828750B (ja) |
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JP2023042444A (ja) * | 2021-09-14 | 2023-03-27 | 株式会社岡本工作機械製作所 | 基板研削装置及び基板研削方法 |
Citations (3)
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JP2007203432A (ja) | 2006-02-06 | 2007-08-16 | Disco Abrasive Syst Ltd | 基板の研削装置および研削方法 |
JP2014097551A (ja) | 2012-11-15 | 2014-05-29 | Disco Abrasive Syst Ltd | 研削方法 |
WO2017138355A1 (ja) | 2016-02-09 | 2017-08-17 | 東京エレクトロン株式会社 | 研削装置および研削方法 |
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JPH05129259A (ja) * | 1991-11-07 | 1993-05-25 | Toshiba Corp | 研削装置 |
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JPH08336741A (ja) | 1995-06-09 | 1996-12-24 | Tokyo Seimitsu Co Ltd | 表面研削方法 |
JPH1015807A (ja) * | 1996-07-01 | 1998-01-20 | Canon Inc | 研磨システム |
JPH11138426A (ja) * | 1997-11-11 | 1999-05-25 | Tokyo Electron Ltd | 研磨装置 |
JP3070917B2 (ja) * | 1998-06-16 | 2000-07-31 | 株式会社共立 | ディスククリーナ |
JP2001351884A (ja) * | 2000-06-05 | 2001-12-21 | Okamoto Machine Tool Works Ltd | 基板の化学機械研磨装置 |
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JP2002305164A (ja) * | 2002-02-19 | 2002-10-18 | Tokyo Seimitsu Co Ltd | 半導体ウェーハの破損を防止する方法 |
JP2006086240A (ja) * | 2004-09-15 | 2006-03-30 | Okamoto Machine Tool Works Ltd | 半導体基板の平面研削・研磨装置および研削・研磨方法 |
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KR20080113682A (ko) * | 2007-06-25 | 2008-12-31 | 세크론 주식회사 | 웨이퍼용 연마 휠 및 이를 갖는 웨이퍼 이면 연마 장치 |
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- 2018-09-13 JP JP2018171475A patent/JP7301512B2/ja active Active
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2019
- 2019-09-10 KR KR1020190111834A patent/KR102725508B1/ko active Active
- 2019-09-10 US US16/565,548 patent/US12358095B2/en active Active
- 2019-09-11 TW TW108132750A patent/TWI828750B/zh active
- 2019-09-12 CN CN201910863453.XA patent/CN110900313B/zh active Active
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JP2007203432A (ja) | 2006-02-06 | 2007-08-16 | Disco Abrasive Syst Ltd | 基板の研削装置および研削方法 |
JP2014097551A (ja) | 2012-11-15 | 2014-05-29 | Disco Abrasive Syst Ltd | 研削方法 |
WO2017138355A1 (ja) | 2016-02-09 | 2017-08-17 | 東京エレクトロン株式会社 | 研削装置および研削方法 |
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KR102725508B1 (ko) | 2024-11-01 |
US12358095B2 (en) | 2025-07-15 |
JP2020040189A (ja) | 2020-03-19 |
TWI828750B (zh) | 2024-01-11 |
CN110900313A (zh) | 2020-03-24 |
TW202031421A (zh) | 2020-09-01 |
CN110900313B (zh) | 2023-09-29 |
US20200086450A1 (en) | 2020-03-19 |
KR20200031050A (ko) | 2020-03-23 |
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