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JP7077807B2 - 画像検査システム及びその制御方法 - Google Patents

画像検査システム及びその制御方法 Download PDF

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Publication number
JP7077807B2
JP7077807B2 JP2018112066A JP2018112066A JP7077807B2 JP 7077807 B2 JP7077807 B2 JP 7077807B2 JP 2018112066 A JP2018112066 A JP 2018112066A JP 2018112066 A JP2018112066 A JP 2018112066A JP 7077807 B2 JP7077807 B2 JP 7077807B2
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Japan
Prior art keywords
image
inspection
recording
timings
imaging
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JP2018112066A
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English (en)
Japanese (ja)
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JP2019215225A (ja
Inventor
豊 加藤
正広 高山
佑二 山内
伸悟 稲積
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
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Omron Corp
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Priority to JP2018112066A priority Critical patent/JP7077807B2/ja
Priority to CN201910405641.8A priority patent/CN110596115B/zh
Publication of JP2019215225A publication Critical patent/JP2019215225A/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G01D21/02—Measuring two or more variables by means not covered by a single other subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/695—Control of camera direction for changing a field of view, e.g. pan, tilt or based on tracking of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0162—Arrangements or apparatus for facilitating the optical investigation using microprocessors for control of a sequence of operations, e.g. test, powering, switching, processing
    • G01N2021/0175—Arrangements or apparatus for facilitating the optical investigation using microprocessors for control of a sequence of operations, e.g. test, powering, switching, processing for selecting operating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0181—Memory or computer-assisted visual determination

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2018112066A 2018-06-12 2018-06-12 画像検査システム及びその制御方法 Active JP7077807B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2018112066A JP7077807B2 (ja) 2018-06-12 2018-06-12 画像検査システム及びその制御方法
CN201910405641.8A CN110596115B (zh) 2018-06-12 2019-05-16 图像检查系统以及其控制方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018112066A JP7077807B2 (ja) 2018-06-12 2018-06-12 画像検査システム及びその制御方法

Publications (2)

Publication Number Publication Date
JP2019215225A JP2019215225A (ja) 2019-12-19
JP7077807B2 true JP7077807B2 (ja) 2022-05-31

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018112066A Active JP7077807B2 (ja) 2018-06-12 2018-06-12 画像検査システム及びその制御方法

Country Status (2)

Country Link
JP (1) JP7077807B2 (zh)
CN (1) CN110596115B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7500515B2 (ja) 2021-09-03 2024-06-17 株式会社東芝 被検体の検査に関連する処理装置、被検体の検査システム、被検体の検査に関連する処理方法、及び、被検体の検査に関連する処理プログラム
JP7126285B1 (ja) * 2021-09-17 2022-08-26 上野精機株式会社 電子部品の処理装置
CN116684724B (zh) * 2023-05-19 2024-04-09 中科慧远视觉技术（洛阳）有限公司 工件图像采集控制方法、装置、工件检测设备和存储介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009010890A (ja) 2007-06-29 2009-01-15 Canon Inc 撮像装置および方法
US20160379357A1 (en) 2015-06-26 2016-12-29 Canon Kabushiki Kaisha Inspection method, inspection apparatus, processing apparatus, and recording medium

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2952712C2 (de) * 1979-12-29 1984-07-12 Hoesch Werke Ag, 4600 Dortmund Vorrichtung zur Erkennung von Fehlern
JP3617159B2 (ja) * 1995-12-22 2005-02-02 神鋼電機株式会社 検査装置
US9092841B2 (en) * 2004-06-09 2015-07-28 Cognex Technology And Investment Llc Method and apparatus for visual detection and inspection of objects
DE102005010552B4 (de) * 2005-03-04 2007-01-18 Isra Glass Vision Gmbh Vorrichtung und Verfahren zur Detektion von Fehlern auf bewegten Gegenständen
JP4828234B2 (ja) * 2006-01-17 2011-11-30 株式会社サキコーポレーション 被検査体の検査装置
JP4791222B2 (ja) * 2006-03-27 2011-10-12 パナソニック株式会社 表示制御装置
CN101487934B (zh) * 2009-02-10 2011-02-09 友达光电股份有限公司 光学检测装置及光学检测方法
CN101957325B (zh) * 2010-10-14 2012-05-23 山东鲁能智能技术有限公司 基于变电站巡检机器人变电站设备外观异常识别方法
WO2014045508A1 (ja) * 2012-09-18 2014-03-27 日本電気株式会社 検査装置、検査方法、および検査プログラム
JP2014159989A (ja) * 2013-02-19 2014-09-04 Yaskawa Electric Corp 物体検出装置及びロボットシステム
EP3052926B1 (en) * 2013-10-03 2021-12-01 Renishaw PLC Method of inspecting an object with a camera probe
JP6494313B2 (ja) * 2015-02-09 2019-04-03 キヤノン株式会社 画像処理方法、装置システム、プログラム、記憶媒体
JP6500518B2 (ja) * 2015-03-10 2019-04-17 オムロン株式会社 シート検査装置
WO2016162930A1 (ja) * 2015-04-06 2016-10-13 三菱電機株式会社 非破壊検査システム及び特異点検出システム
JP2017067633A (ja) * 2015-09-30 2017-04-06 キヤノン株式会社 検査装置および物品製造方法
JP6878781B2 (ja) * 2016-06-30 2021-06-02 オムロン株式会社 検査システム
JP2018059830A (ja) * 2016-10-06 2018-04-12 川崎重工業株式会社 外観検査方法
CN106546594B (zh) * 2016-11-14 2019-04-12 大连海事大学 一种二冲程内燃机气缸内部可视化检查及缸径测量设备

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009010890A (ja) 2007-06-29 2009-01-15 Canon Inc 撮像装置および方法
US20160379357A1 (en) 2015-06-26 2016-12-29 Canon Kabushiki Kaisha Inspection method, inspection apparatus, processing apparatus, and recording medium
JP2017015396A (ja) 2015-06-26 2017-01-19 キヤノン株式会社 検査方法、検査装置、処理装置、プログラム及び記録媒体

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Publication number Publication date
JP2019215225A (ja) 2019-12-19
CN110596115B (zh) 2022-03-18
CN110596115A (zh) 2019-12-20

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