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JP7059877B2 - Terminal material for connectors and terminals for connectors - Google Patents

Terminal material for connectors and terminals for connectors Download PDF

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JP7059877B2
JP7059877B2 JP2018186107A JP2018186107A JP7059877B2 JP 7059877 B2 JP7059877 B2 JP 7059877B2 JP 2018186107 A JP2018186107 A JP 2018186107A JP 2018186107 A JP2018186107 A JP 2018186107A JP 7059877 B2 JP7059877 B2 JP 7059877B2
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nickel
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JP2020056055A (en
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圭栄 樽谷
清隆 中矢
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Mitsubishi Materials Corp
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Description

本発明は、微摺動が発生する自動車や民生機器等の電気配線の接続に使用される有用な皮膜が設けられたコネクタ用端子材及びコネクタ用端子に関する。 The present invention relates to a connector terminal material and a connector terminal provided with a useful film used for connecting electrical wiring of automobiles, consumer devices, etc. in which fine sliding occurs.

従来、自動車等の電気配線の接続に用いられるコネクタが知られている。この車載用コネクタ(車載用端子)には、メス端子に設けられた接触片が、メス端子内に挿入されたオス端子に所定の接触圧を有して接触することで、電気的に接続されるように設計された端子対を備えるものが用いられている。このようなコネクタ(端子)として、一般的に銅または銅合金板上に錫めっきを施し、リフロー処理を行った錫めっき付き端子が多く用いられていた。しかし近年、自動車の高電流・高電圧化に伴い、より電流を多く流すことができる耐熱性及び耐摩耗性に優れた貴金属めっきを施した端子の用途が増加している。 Conventionally, connectors used for connecting electrical wiring of automobiles and the like are known. A contact piece provided on the female terminal is electrically connected to the vehicle-mounted connector (vehicle-mounted terminal) by contacting the male terminal inserted in the female terminal with a predetermined contact pressure. Those with a pair of terminals designed to be used are used. As such a connector (terminal), a tin-plated terminal obtained by tin-plating a copper or copper alloy plate and performing a reflow process is generally used. However, in recent years, with the increase in current and voltage of automobiles, the use of terminals plated with precious metals, which can pass a larger current and have excellent heat resistance and wear resistance, is increasing.

このような耐熱性及び耐摩耗性が求められる車載用端子のめっきとして、例えば、特許文献1に記載のような銀めっきが知られている。しかし、銀めっき層は、加熱によって銀の結晶径が大きくなるため硬度が低下する。この硬度の低下を抑制するため、銀めっき膜厚を厚くすることが考えられるが、コスト面での問題がある。また、耐摩耗性を向上させた銀めっき端子として、特許文献2に記載されているように、アンチモンを銀めっき層に添加した銀めっき端子が知られている。しかし、アンチモンは加熱によって銀めっき層の最表面に濃化し、その後酸化して接触抵抗が増大するため、高温環境での使用には適さない。 As plating for in-vehicle terminals that are required to have such heat resistance and wear resistance, for example, silver plating as described in Patent Document 1 is known. However, the hardness of the silver-plated layer decreases because the crystal diameter of silver increases due to heating. In order to suppress this decrease in hardness, it is conceivable to increase the silver plating film thickness, but there is a problem in terms of cost. Further, as a silver-plated terminal having improved wear resistance, as described in Patent Document 2, a silver-plated terminal in which antimony is added to a silver-plated layer is known. However, antimony is not suitable for use in a high temperature environment because it is concentrated on the outermost surface of the silver-plated layer by heating and then oxidized to increase the contact resistance.

また、加熱による耐摩耗性低下を防ぐため、特許文献3のように銀めっきを合金化する手法もあるが、めっき層の一部のみを合金化しているため、その合金化した部分が摺動により消耗されると、耐摩耗性の低下を抑制できない。そこで、特許文献4のように、めっき層全体の組成を均一に保つことが考えられている。 Further, in order to prevent deterioration of wear resistance due to heating, there is also a method of alloying silver plating as in Patent Document 3, but since only a part of the plating layer is alloyed, the alloyed portion slides. When it is consumed, the decrease in wear resistance cannot be suppressed. Therefore, as in Patent Document 4, it is considered to keep the composition of the entire plating layer uniform.

特開2008-169408号公報Japanese Unexamined Patent Publication No. 2008-169408 特開2009-79250号公報Japanese Unexamined Patent Publication No. 2009-79250 特開2017-79143号公報JP-A-2017-79143 特開2015-183216号公報Japanese Patent Application Laid-Open No. 2015-183216 特許第5876622号Patent No. 5876622 国際公開2015/092978号International release 2015/092978

しかしながら、特許文献4に記載の方法では、液中の錫イオンが4価になりやすいアルカリ性のシアン浴を用いているため、錫イオンが酸化錫になりやすい。また、浴中の錫イオンが4価となることで、析出速度が略1/2となり、一定の組成比で安定的に析出させることが難しい。また、シアン浴には、毒物であるシアン化カリウムなどが含まれているため、環境負荷が非常に高く排水処理が煩雑になる問題があった。さらに、特許文献1及び2に記載の構成では、最表層の純錫層の厚みが薄く、純錫量が少ないことから、微摺動摩耗が発生しても錫の摩耗粉の発生は少なく、抵抗値の増加は抑制できるものの、摩耗により純錫めっき層が消失するのが早く、素材が早期に露出してしまう問題があった。また、特許文献3の構成では、中間層に銅錫合金層が存在しているため、銅の摩耗や酸化による抵抗値の増大も懸念される。 However, in the method described in Patent Document 4, since an alkaline cyan bath in which tin ions in the liquid tend to become tetravalent is used, tin ions tend to become tin oxide. Further, since the tin ion in the bath becomes tetravalent, the precipitation rate is reduced to about 1/2, and it is difficult to stably precipitate at a constant composition ratio. In addition, since the cyanide bath contains potassium cyanide, which is a toxic substance, there is a problem that the environmental load is very high and the wastewater treatment becomes complicated. Further, in the configurations described in Patent Documents 1 and 2, since the thickness of the pure tin layer on the outermost surface is thin and the amount of pure tin is small, even if slight sliding wear occurs, the generation of tin wear powder is small. Although the increase in the resistance value can be suppressed, there is a problem that the pure tin plating layer disappears quickly due to wear and the material is exposed at an early stage. Further, in the configuration of Patent Document 3, since the copper-tin alloy layer is present in the intermediate layer, there is a concern that the resistance value may increase due to the wear and oxidation of copper.

ところで、車載用端子のめっきとしては、リフロー錫めっき材が多く用いられている。この点、特許文献5及び6には、リフロー錫めっき材のうち耐摩耗性が重視される部分のみに銀めっきを施すことで、リフロー錫めっき材の特性を向上させることが記載されている。
しかし、特許文献5に記載の構成では、リフロー材に銀めっき層を形成するものの、銀めっき層は、加熱によって硬度が低下するため、耐摩耗性を向上させることができない。さらに、特許文献6に記載の構成では、リフロー錫めっき層上に良好な銀めっき層を積層させる技術についての開示がなく、仮にリフロー錫めっき上に銀めっき層を形成させることができたとしても、上述したように、耐摩耗性を向上させることができない。
By the way, a reflow tin plating material is often used for plating an in-vehicle terminal. In this regard, Patent Documents 5 and 6 describe that the characteristics of the reflow tin-plated material are improved by applying silver plating only to the portion of the reflow tin-plated material in which wear resistance is important.
However, in the configuration described in Patent Document 5, although the silver-plated layer is formed on the reflow material, the hardness of the silver-plated layer is lowered by heating, so that the wear resistance cannot be improved. Further, in the configuration described in Patent Document 6, there is no disclosure of a technique for laminating a good silver plating layer on the reflow tin plating layer, and even if the silver plating layer can be formed on the reflow tin plating. , As mentioned above, the wear resistance cannot be improved.

本発明は、このような事情に鑑みてなされたもので、耐摩耗性及び耐熱性を向上できるコネクタ用端子材、コネクタ用端子及びコネクタ用端子材の製造方法を提供することを目的とする。 The present invention has been made in view of such circumstances, and an object of the present invention is to provide a connector terminal material, a connector terminal, and a method for manufacturing a connector terminal material, which can improve wear resistance and heat resistance.

本発明のコネクタ用端子材は、銅又は銅合金からなる基材と該基材の表面に被覆されたリフロー錫層とを備えるリフロー錫材を有し、前記リフロー錫材の表面の一部には、銀錫合金からなる銀錫めっき層が被覆され、前記銀錫めっき層は、Agを70at%以上85at%以下の範囲で含み、かつ、銀錫系金属間化合物を主成分とし、前記銀錫めっき層を150℃で250時間加熱後にEBSD(後方散乱電子回折:Electron BackScatter Diffraction)で測定した該銀錫めっき層の結晶粒の平均粒径が1μm以下であり、前記銀錫めっき層と前記リフロー錫材との間には、NiSnを主成分とする金属間化合物が配置されている。 The terminal material for a connector of the present invention has a reflow tin material including a base material made of copper or a copper alloy and a reflow tin layer coated on the surface of the base material, and is formed on a part of the surface of the reflow tin material. Is coated with a silver-tin plated layer made of a silver-tin alloy, and the silver-tin plated layer contains Ag in a range of 70 at% or more and 85 at% or less, and contains a silver-tin-based intermetallic compound as a main component, and the silver. After heating the tin-plated layer at 150 ° C. for 250 hours, the average particle size of the crystal grains of the silver-tin-plated layer measured by EBSD (Backscattered Electron Diffraction: Alloy BackScanter Diffraction) is 1 μm or less, and the silver-tin-plated layer and the above. An intermetallic compound containing NiSn 4 as a main component is arranged between the reflow tin material.

本発明では、Agを70at%以上85at%以下の範囲で含み、かつ、銀錫系金属間化合物を主成分としており、銀錫めっき層の結晶粒の平均粒径が1μm以下と小さいため、耐摩耗性を向上させることができる。なお、Agが70at%未満では、加熱後の接触抵抗が低下し、Agが85at%を超えると銀錫めっき層の粒径が大きくなり、耐摩耗性が低下する。また、銀錫めっき層とリフロー錫材との間にNiSnを主成分とする金属間化合物が配置されているので、銀錫めっき層とリフロー錫材(リフロー錫層)との密着性を高めることができ、耐剥離性(耐熱性)を高めることができる。なお、銀錫系金属間化合物としては、AgSn及びAgSnの金属間化合物を例示できる。 In the present invention, Ag is contained in the range of 70 at% or more and 85 at% or less, and the silver-tin intermetallic compound is the main component, and the average particle size of the crystal grains of the silver-tin plated layer is as small as 1 μm or less. Abrasion resistance can be improved. If Ag is less than 70 at%, the contact resistance after heating is lowered, and if Ag is more than 85 at%, the particle size of the silver-tin plated layer is increased and the wear resistance is lowered. Further, since the intermetallic compound containing NiSn 4 as a main component is arranged between the silver tin plating layer and the reflow tin material, the adhesion between the silver tin plating layer and the reflow tin material (reflow tin layer) is enhanced. It is possible to improve the peel resistance (heat resistance). Examples of the silver-tin-based intermetallic compound include Ag 3 Sn and Ag 4 Sn intermetallic compounds.

本発明のコネクタ用端子材の好ましい態様としては、前記銀錫めっき層の膜厚は、1μm以上50μm以下であるとよい。 As a preferred embodiment of the terminal material for a connector of the present invention, the film thickness of the silver-tin plated layer is preferably 1 μm or more and 50 μm or less.

銀錫めっき層が1μm未満であると、銀錫めっき層が薄すぎて摩耗により銀錫めっき層が消失するのが早く、素材が早期に露出して、接続信頼性(耐熱性)が悪化する可能性がある。 If the silver-tin plating layer is less than 1 μm, the silver-tin plating layer is too thin and the silver-tin plating layer disappears quickly due to wear, the material is exposed early, and the connection reliability (heat resistance) deteriorates. there is a possibility.

本発明のコネクタ用端子材の好ましい態様としては、前記リフロー錫材と前記銀錫めっき層との間には、ニッケル又はニッケル合金からなるニッケル層が設けられ、該ニッケル層の膜厚は0.5μm以上5μm以下であるとよい。 As a preferred embodiment of the terminal material for a connector of the present invention, a nickel layer made of nickel or a nickel alloy is provided between the reflow tin material and the silver tin plating layer, and the thickness of the nickel layer is 0. It is preferably 5 μm or more and 5 μm or less.

上記態様では、AgSn及びAgSnの金属間化合物を主成分とする銀錫めっき層がニッケル層上に形成されているので、銀錫めっき層がリフロー錫材から剥離することを確実に抑制できる。なお、ニッケル層の厚さが0.5μm未満であると、高温環境下では銅又は銅合金からなる基材からCu成分が銀錫めっき層内に拡散して該銀錫めっき層の抵抗値が大きくなり、耐熱性が低下する可能性があり、5μmを超えると、曲げ加工時に割れが発生する可能性がある。 In the above embodiment, since the silver tin plating layer containing the intermetallic compound of Ag 3 Sn and Ag 4 Sn as the main component is formed on the nickel layer, the silver tin plating layer is surely peeled off from the reflow tin material. Can be suppressed. If the thickness of the nickel layer is less than 0.5 μm, the Cu component from the base material made of copper or a copper alloy diffuses into the silver tin plating layer under a high temperature environment, and the resistance value of the silver tin plating layer becomes high. It may become large and the heat resistance may decrease, and if it exceeds 5 μm, cracks may occur during bending.

本発明のコネクタ用端子は、上記コネクタ用端子材からなるコネクタ用端子であって、接点部分に前記銀錫めっき層が位置している。 The connector terminal of the present invention is a connector terminal made of the connector terminal material, and the silver-tin plating layer is located at a contact portion.

本発明によれば、コネクタ用端子材及びコネクタ用端子の耐摩耗性及び耐熱性を向上できる。 According to the present invention, the wear resistance and heat resistance of the connector terminal material and the connector terminal can be improved.

本発明の一実施形態に係るコネクタ用端子材を模式的に示す断面図である。It is sectional drawing which shows typically the terminal material for a connector which concerns on one Embodiment of this invention. 上記実施形態におけるコネクタ用端子材の断面(NiSn4化合物付近)のTEM像である。It is a TEM image of the cross section (near NiSn4 compound) of the terminal material for a connector in the said embodiment. 上記実施形態の変形例に係るコネクタ用端子材を模式的に示す断面図である。It is sectional drawing which shows typically the terminal material for a connector which concerns on the modification of the said Embodiment. 実施例における加熱後のコネクタ用端子材の断面のSIM像である。It is a SIM image of the cross section of the terminal material for a connector after heating in an Example. 比較例における加熱後のコネクタ用端子材の断面のSIM像である。It is a SIM image of the cross section of the terminal material for a connector after heating in a comparative example.

以下、本発明の一実施形態について図面を用いて説明する。 Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

[コネクタ用端子材の構成]
本実施形態のコネクタ用端子材1は、図1に断面を模式的に示したように、銅又は銅合金からなる板状の基材21と、該基材21の表面に被覆されたリフロー錫層22とからなるリフロー錫材2と、リフロー錫材2の表面の一部(コネクタ用端子材1が加工され、コネクタ用端子となった際に、接点部となる部位)に被覆されたニッケル又はニッケル合金からなるニッケル層3と、ニッケル層3の表面に被覆された銀錫めっき層4と、を備えている。なお、基材21は、銅または銅合金からなるものであれば、特に、その組成が限定されるものではない。
[Structure of terminal material for connector]
The terminal material 1 for a connector of the present embodiment has a plate-shaped base material 21 made of copper or a copper alloy and reflow tin coated on the surface of the base material 21, as schematically shown in FIG. Nickel coated on the reflow tin material 2 composed of the layer 22 and a part of the surface of the reflow tin material 2 (a portion that becomes a contact portion when the terminal material 1 for a connector is processed and becomes a terminal for a connector). Alternatively, a nickel layer 3 made of a nickel alloy and a silver-tin plated layer 4 coated on the surface of the nickel layer 3 are provided. The composition of the base material 21 is not particularly limited as long as it is made of copper or a copper alloy.

リフロー錫層22は、基材21の表面に錫又は錫合金からなる錫層が被覆され、この錫層をリフロー処理することにより形成される。具体的には、(1)基材21の上に、銅と錫との金属間化合物層からなる中間合金層が形成され、その中間合金層の上に錫層が形成されたもの、(2)基材21の上に、ニッケル層3を介して、ニッケルと錫との金属間化合物を有するニッケル層の上に銅と錫との金属間化合物層が積層した構造の中間合金層が形成され、その中間合金層の上に錫層が形成されたもの、(3)基材21の上に、ニッケル又はニッケル合金層からなる接点特性皮膜用下地層を介して、ニッケルと錫との金属間化合物を有するニッケル層からなる中間合金層が形成され、その中間合金層の上に錫層が形成されたもの、の3種類がある。なお、(1)の場合も、基材21と中間合金層との間にニッケル又はニッケル合金層からなる接点特性皮膜用下地層を設けてもよい。また、(3)の場合、中間合金層が収束イオンビーム装置(FIB)等による観察では層としてまでは認識できず、接点特性皮膜用下地層の上に錫層が形成されているように認識される場合がある。 The reflow tin layer 22 is formed by coating the surface of the base material 21 with a tin layer made of tin or a tin alloy and reflowing the tin layer. Specifically, (1) an intermediate alloy layer composed of an intermetallic compound layer of copper and tin is formed on the base material 21, and a tin layer is formed on the intermediate alloy layer, (2). ) An intermediate alloy layer having a structure in which a metal-metal compound layer of copper and tin is laminated on a nickel layer having a metal-metal compound of nickel and tin is formed on the base material 21 via a nickel layer 3. , A tin layer is formed on the intermediate alloy layer, and (3) between the metals of nickel and tin on the base material 21 via a base layer for a contact characteristic film made of nickel or a nickel alloy layer. There are three types: an intermediate alloy layer made of a nickel layer having a compound is formed, and a tin layer is formed on the intermediate alloy layer. In the case of (1) as well, a base layer for a contact characteristic film made of nickel or a nickel alloy layer may be provided between the base material 21 and the intermediate alloy layer. Further, in the case of (3), the intermediate alloy layer cannot be recognized as a layer by observation with a focused ion beam device (FIB) or the like, and it is recognized that a tin layer is formed on the base layer for the contact characteristic film. May be done.

ニッケル層3は、リフロー錫材2(リフロー錫層22)の表面の一部にニッケルストライクめっきが施された後、その上面にニッケル又はニッケル合金めっきを施すことにより被覆される。このニッケル層3は、ニッケル層3上に被覆される銀錫めっき層4へのリフロー錫材2の基材21からのCu成分の拡散を抑制する機能を有する。このニッケル層3の厚さは、0.5μm以上5μm以下であることが好ましい。ニッケル層3の厚さが0.5μm未満であると、高温環境下では銅又は銅合金からなる基材21からCu成分が銀錫めっき層4内に拡散して銀錫めっき層4の抵抗値が大きくなり、耐熱性が低下する可能性があり、5μmを超えると、曲げ加工時に割れが発生する可能性がある。なお、ニッケル層3は、ニッケル又はニッケル合金からなるものであれば、特に、その組成が限定されるものではない。また、このニッケル層3は必須の構成ではなく、例えば、ニッケルストライクめっきが施されたリフロー錫材2(リフロー錫層22)の表面の一部に銀錫めっき層4が形成されてもよい。 The nickel layer 3 is coated by subjecting a part of the surface of the reflow tin material 2 (reflow tin layer 22) to nickel strike plating and then plating the upper surface thereof with nickel or a nickel alloy. The nickel layer 3 has a function of suppressing the diffusion of the Cu component from the base material 21 of the reflow tin material 2 into the silver tin plating layer 4 coated on the nickel layer 3. The thickness of the nickel layer 3 is preferably 0.5 μm or more and 5 μm or less. When the thickness of the nickel layer 3 is less than 0.5 μm, the Cu component is diffused into the silver tin plating layer 4 from the base material 21 made of copper or a copper alloy under a high temperature environment, and the resistance value of the silver tin plating layer 4 is high. If it exceeds 5 μm, cracks may occur during bending. The composition of the nickel layer 3 is not particularly limited as long as it is made of nickel or a nickel alloy. Further, the nickel layer 3 is not an essential configuration, and for example, the silver tin plating layer 4 may be formed on a part of the surface of the reflow tin material 2 (reflow tin layer 22) subjected to nickel strike plating.

なお、ニッケルストライクめっきを施すことにより形成されるニッケルストライクめっき層は、その膜厚が極めて薄いため、ニッケル層3を形成しない場合には、ニッケルストライクめっき層中のニッケルがNiSnを主成分とする金属間化合物に変化し、リフロー錫層22上にニッケルストライクめっき層が残存しない場合がある。 Since the nickel strike plating layer formed by performing nickel strike plating has an extremely thin film thickness, when the nickel layer 3 is not formed, the nickel in the nickel strike plating layer contains NiSn 4 as a main component. The nickel strike plating layer may not remain on the reflow tin layer 22.

銀錫めっき層4は、コネクタ用端子材1の最表面に位置し、ニッケル層3上に銀ストライクめっきが施された後、その上面にメタンスルホン酸を主成分とするめっきを施すことにより被覆される。この銀錫めっき層4は、銀錫系金属間化合物(例えば、AgSn及びAgSnの金属間化合物)を主成分とし、Agを70at%以上85at%以下の範囲で含んでいる。このような金属間化合物を含んでいるため、耐摩耗性が向上する。なお、銀錫めっき層4を150℃で240時間加熱後にEBSDで測定した銀錫めっき層4の結晶粒の平均粒径は、1μm以下となる。 The silver-tin plating layer 4 is located on the outermost surface of the terminal material 1 for a connector, and is coated by plating the nickel layer 3 with silver strike plating and then plating the upper surface thereof with methanesulfonic acid as a main component. Will be done. The silver-tin plated layer 4 contains a silver-tin-based intermetallic compound (for example, an intermetallic compound of Ag 3 Sn and Ag 4 Sn) as a main component, and contains Ag in a range of 70 at% or more and 85 at% or less. Since it contains such an intermetallic compound, wear resistance is improved. The average grain size of the crystal grains of the silver-tin-plated layer 4 measured by EBSD after heating the silver-tin-plated layer 4 at 150 ° C. for 240 hours is 1 μm or less.

また、銀錫めっき層4の厚さは、1μm以上50μm以下であることが好ましい。銀錫めっき層4が1μm未満であると、銀錫めっき層4が薄すぎて摩耗により銀錫めっき層4が消失するのが早く、素材(ニッケル層3)が早期に露出して、接続信頼性(耐熱性)が悪化する可能性がある。 The thickness of the silver-tin plated layer 4 is preferably 1 μm or more and 50 μm or less. When the silver-tin plating layer 4 is less than 1 μm, the silver-tin plating layer 4 is too thin and the silver-tin plating layer 4 disappears quickly due to wear, and the material (nickel layer 3) is exposed early, so that the connection reliability is established. The property (heat resistance) may deteriorate.

次に、このコネクタ用端子材1の製造方法について説明する。このコネクタ用端子材1の製造方法は、リフロー錫材2の表面を洗浄する前処理工程と、リフロー錫材2の表面の一部にニッケルストライクめっきを施すニッケルストライクめっき工程と、ニッケルストライクめっきが施されたリフロー錫材2の表面にニッケル層3を形成するニッケル層形成工程と、ニッケル層3の表面に銀ストライクめっきを施す銀ストライクめっき工程と、銀ストライクめっきが施されたニッケル層3の表面に銀錫めっき層4を形成する銀錫めっき層形成工程と、を備える。 Next, a method of manufacturing the terminal material 1 for the connector will be described. The method for manufacturing the terminal material 1 for the connector includes a pretreatment step for cleaning the surface of the reflow tin material 2, a nickel strike plating step for applying nickel strike plating to a part of the surface of the reflow tin material 2, and nickel strike plating. A nickel layer forming step of forming a nickel layer 3 on the surface of the reflowed tin material 2, a silver strike plating step of silver strike plating on the surface of the nickel layer 3, and a silver strike plating of the nickel layer 3. It comprises a silver-tin plating layer forming step of forming a silver-tin plating layer 4 on the surface.

[前処理工程]
まず、リフロー錫材2の表面に脱脂、酸洗等をすることによって表面を清浄する前処理を行う。
[Pretreatment process]
First, a pretreatment for cleaning the surface of the reflow tin material 2 is performed by degreasing, pickling, or the like.

[ニッケルストライクめっき工程]
このリフロー錫材2(リフロー錫層22)の表面に、ニッケルストライクめっきを施す。このニッケルストライクめっきは、NiSnを主成分とする金属間化合物をニッケル層3とリフロー錫材2との間に形成してこれらの密着性を高めるために実行される。また、ニッケルストライクめっきは、公知のウッド浴などを用いて電気めっきにより形成することができる。なお、このニッケルストライクめっきは水素を多く含むため、長時間とならないように薄く形成するのが好ましい。
[Nickel strike plating process]
Nickel strike plating is applied to the surface of the reflow tin material 2 (reflow tin layer 22). This nickel strike plating is performed in order to form an intermetallic compound containing NiSn 4 as a main component between the nickel layer 3 and the reflow tin material 2 to enhance their adhesion. Further, nickel strike plating can be formed by electroplating using a known wood bath or the like. Since this nickel strike plating contains a large amount of hydrogen, it is preferable to form it thin so as not to take a long time.

[ニッケル層形成工程]
リフロー錫材2のニッケルストライクめっきが施された部位に対して、ニッケル又はニッケル合金めっきを施してニッケル層3をリフロー錫材2に形成する。例えば、スルファミン酸ニッケル300g/L、塩化ニッケル30g/L、ホウ酸30g/Lからなるニッケルめっき液を用いて、浴温45℃、電流密度3A/dmの条件下でニッケルめっきを施して形成される。なお、ニッケル層3を形成するニッケルめっきは、緻密なニッケル主体の膜が得られるものであれば特に限定されず、公知のワット浴を用いて電気めっきにより形成してもよい。また、リフロー錫材2の表面に直接銀錫めっき層4を形成する場合には、ニッケル層形成工程は、実行しなくてよい。
[Nickel layer forming process]
A nickel or nickel alloy plating is applied to a portion of the reflow tin material 2 that has been subjected to nickel strike plating to form a nickel layer 3 on the reflow tin material 2. For example, it is formed by nickel plating using a nickel plating solution consisting of nickel sulfamic acid 300 g / L, nickel chloride 30 g / L, and boric acid 30 g / L under the conditions of a bath temperature of 45 ° C. and a current density of 3 A / dm 2 . Will be done. The nickel plating for forming the nickel layer 3 is not particularly limited as long as a dense nickel-based film can be obtained, and may be formed by electroplating using a known watt bath. Further, when the silver tin plating layer 4 is directly formed on the surface of the reflow tin material 2, the nickel layer forming step does not have to be performed.

[銀ストライクめっき工程]
リフロー錫材2に形成されたニッケル層3上に、銀ストライクめっきを施す。この銀ストライクめっきは、ニッケル層3上に形成される銀錫めっき層4とニッケル層3との密着性を高めるために実行される。この銀ストライクめっきを施すためのめっき液の組成は、ノーシアン浴(シアン化物であるシアン化銀、シアン化銀カリウム、シアン化ナトリウム、シアン化カリウム等を含まないめっき浴)であれば特に限定されないが、メタンスルホン酸銀浴を主体としたものが望ましい。
[Silver strike plating process]
Silver strike plating is performed on the nickel layer 3 formed on the reflow tin material 2. This silver strike plating is performed in order to improve the adhesion between the silver tin plating layer 4 formed on the nickel layer 3 and the nickel layer 3. The composition of the plating solution for performing this silver strike plating is not particularly limited as long as it is a no-cyanide bath (a plating bath containing no cyanide such as silver cyanide, silver potassium cyanide, sodium cyanide, potassium cyanide, etc.). It is desirable to use a silver bath of methanesulfonic acid as the main component.

[銀錫めっき層形成工程]
そして、銀ストライクめっき工程後、ニッケル層3上に銀錫めっきを施して銀錫めっき層4を形成する。例えば、メタンスルホン酸、メタンスルホン酸錫、メタンスルホン酸銀、硫黄を含有した有機添加剤を含み、遊離メタンスルホン酸濃度を40g/L、Ag濃度を40g/Lを超えて90g/L以下、Sn濃度を5~35g/Lの範囲で調整した銀錫めっき液を用いるとよい。なお、この銀錫めっき液は、シアン化銀、シアン化銀カリウム、シアン化ナトリウム、シアン化カリウム等のシアン化物を含んでいない。また、錫陽極は、AgとPt/Ti不溶性電極との両方を用い、これらの面積は、陰極の2倍以上、AgとPt/Tiの電流配分はAg:Pt/Ti=4:1とすることが好ましい。さらに、浴温は40℃~60℃、電流密度1~15A/dmとし、例えば、膜厚2.5μmの銀錫めっき層4を形成する。
[Silver-tin plating layer forming process]
Then, after the silver strike plating step, silver tin plating is performed on the nickel layer 3 to form the silver tin plating layer 4. For example, it contains an organic additive containing methanesulfonic acid, tin methanesulfonic acid, silver methanesulfonic acid, and sulfur, and has a free methanesulfonic acid concentration of 40 g / L and an Ag concentration of more than 40 g / L and 90 g / L or less. It is preferable to use a silver-tin plating solution having a Sn concentration adjusted in the range of 5 to 35 g / L. This silver-tin plating solution does not contain cyanide such as silver cyanide, potassium silver cyanide, sodium cyanide, and potassium cyanide. For the tin anode, both Ag and Pt / Ti insoluble electrodes are used, the area of these is at least twice that of the cathode, and the current distribution of Ag and Pt / Ti is Ag: Pt / Ti = 4: 1. Is preferable. Further, the bath temperature is 40 ° C. to 60 ° C., the current density is 1 to 15 A / dm 2 , and for example, the silver-tin plated layer 4 having a film thickness of 2.5 μm is formed.

このようにしてリフロー錫材2の表面の一部にニッケル層3及び銀錫めっき層4が形成されたコネクタ用端子材1に対してプレス加工等を施し、接点として用いられる部分に銀錫めっき層4が配置されるコネクタ用端子を形成する。 In this way, the connector terminal material 1 having the nickel layer 3 and the silver tin plating layer 4 formed on a part of the surface of the reflow tin material 2 is pressed, and the portion used as a contact is silver tin plated. Form a connector terminal on which the layer 4 is arranged.

本実施形態では、銀錫めっき層4がAgを70at%以上85at%以下の範囲で含み、かつ、銀錫系金属間化合物(例えば、AgSn及びAgSnの金属間化合物)を主成分としており、銀錫めっき層4を150℃で250時間加熱後にEBSDで測定した該銀錫めっき層4の結晶粒の平均粒径が1μm以下と小さいため、耐摩耗性を向上させることができる。また、銀錫めっき層4がニッケル層3上に形成されているので、銀錫めっき層4がリフロー錫材2(ニッケル層3)から剥離することを抑制できる。さらに、メタンスルホン酸を主成分とし、かつ、シアン化物を含まないめっき液を用いて銀錫めっき層4を形成しているので、環境負荷を低減できる。また、銀錫めっき層4とリフロー錫材2との間にNiSnを主成分とする金属間化合物が配置されているので、銀錫めっき層4とリフロー錫材2(リフロー錫層22)との密着性を高めることができ、耐剥離性(耐熱性)を高めることができる。 In the present embodiment, the silver-tin plated layer 4 contains Ag in the range of 70 at% or more and 85 at% or less, and contains a silver-tin-based intermetallic compound (for example, an intermetallic compound of Ag 3 Sn and Ag 4 Sn) as a main component. Since the average particle size of the crystal grains of the silver-tin plated layer 4 measured by EBSD after heating the silver-tin plated layer 4 at 150 ° C. for 250 hours is as small as 1 μm or less, wear resistance can be improved. Further, since the silver tin plating layer 4 is formed on the nickel layer 3, it is possible to prevent the silver tin plating layer 4 from peeling from the reflow tin material 2 (nickel layer 3). Further, since the silver-tin plating layer 4 is formed by using a plating solution containing methanesulfonic acid as a main component and not containing cyanide, the environmental load can be reduced. Further, since the intermetallic compound containing NiSn 4 as a main component is arranged between the silver tin plating layer 4 and the reflow tin material 2, the silver tin plating layer 4 and the reflow tin material 2 (reflow tin layer 22) are arranged. Adhesion can be enhanced, and peeling resistance (heat resistance) can be enhanced.

本実施形態の銀錫めっき層4は、FIBにてめっきの断面加工を行った後、断面の銀錫めっき層4のめっき表面からニッケル層3に向かって0.3μmの深さ位置P1と、ニッケル層3との界面から銀錫めっき層4の表面側に向かって0.3μmの深さ位置P2とについて、それぞれ電子線マイクロアナライザー(EPMA)にて組成分析を行い、錫(Sn)と銀(Ag)の組成比をAg/(Sn+Ag)×100(at%)で計算した際の(P1-P2)の差分の絶対値が5以下となる。すなわち、銀錫めっき層4は、上記めっき処理により形成されているため、AgSn及びAgSnの金属間化合物の上記位置P1及び上記位置P2における組成が略同じとなる。このため、銀錫めっき層4の耐摩耗性及び耐熱性(接続信頼性)に優れたコネクタ用端子材1を提供できる。 The silver-tin plating layer 4 of the present embodiment has a depth position P1 of 0.3 μm from the plating surface of the silver-tin plating layer 4 in the cross section toward the nickel layer 3 after the cross-sectional processing of plating is performed by FIB. The composition of P2 at a depth of 0.3 μm from the interface with the nickel layer 3 toward the surface side of the silver-tin plated layer 4 was analyzed with an electron beam microanalyzer (EPMA), and tin (Sn) and silver were analyzed. The absolute value of the difference of (P1-P2) when the composition ratio of (Ag) is calculated by Ag / (Sn + Ag) × 100 (at%) is 5 or less. That is, since the silver-tin plating layer 4 is formed by the above-mentioned plating treatment, the compositions of the intermetallic compounds of Ag 3 Sn and Ag 4 Sn at the above-mentioned position P1 and the above-mentioned position P2 are substantially the same. Therefore, it is possible to provide a connector terminal material 1 having excellent wear resistance and heat resistance (connection reliability) of the silver-tin plated layer 4.

その他、細部構成は実施形態の構成のものに限定されるものではなく、本発明の趣旨を逸脱しない範囲において種々の変更を加えることが可能である。例えば、上記実施形態では、リフロー錫材2は、基材21及びリフロー錫層22とから構成されることとしたが、これに限らない。図3は、上記実施形態の変形例に係るコネクタ用端子材1Aの断面を模式的に示す図である。このコネクタ用端子材1Aのリフロー錫材2Aは、図3に示すように、基材21とリフロー錫層22との間にニッケル層23を有している。このニッケル層23は、基材21のCu成分がリフロー錫層22に拡散することを抑制する。このため、本変形例では、リフロー錫材2Aと銀錫めっき層4との間にニッケル層3を設けていない。なお、本変形例においても、リフロー錫材2Aの表面の一部には、ニッケルストライクめっきが施されていることから、リフロー錫材2Aと銀錫めっき層4との間にNiSnを主成分とする金属間化合物が生成される。このため、本変形例においても銀錫めっき層4とリフロー錫材2Aとの密着性を高めることができる。また、上記変形例に示したリフロー錫材2Aの表面の一部にニッケル層3を形成し、該ニッケル層3の上面に銀錫めっき層4を形成してもよい。 In addition, the detailed configuration is not limited to the configuration of the embodiment, and various changes can be made without departing from the spirit of the present invention. For example, in the above embodiment, the reflow tin material 2 is composed of the base material 21 and the reflow tin layer 22, but the present invention is not limited to this. FIG. 3 is a diagram schematically showing a cross section of the connector terminal material 1A according to the modified example of the above embodiment. As shown in FIG. 3, the reflow tin material 2A of the connector terminal material 1A has a nickel layer 23 between the base material 21 and the reflow tin layer 22. The nickel layer 23 suppresses the diffusion of the Cu component of the base material 21 into the reflow tin layer 22. Therefore, in this modification, the nickel layer 3 is not provided between the reflow tin material 2A and the silver tin plating layer 4. In this modification as well, since nickel strike plating is applied to a part of the surface of the reflow tin material 2A, NiSn 4 is the main component between the reflow tin material 2A and the silver tin plating layer 4. An intermetallic compound is produced. Therefore, even in this modification, the adhesion between the silver tin plating layer 4 and the reflow tin material 2A can be improved. Further, the nickel layer 3 may be formed on a part of the surface of the reflow tin material 2A shown in the above modification, and the silver tin plating layer 4 may be formed on the upper surface of the nickel layer 3.

[第1実施例]
リフロー錫材の表面の一部にニッケルストライクめっきを施した後、ニッケル層を形成し、該ニッケル層上に銀錫めっき層を形成した各試料(実施例1~6)を製造した。この際、銀錫めっき液におけるAgの量(g/L)、Snの量(g/L)及び電流密度、並びに、リフロー錫材の電解脱脂処理時間及びニッケルストライクめっき時間を表1に示す値とし、銀錫めっき層におけるA位置及びB位置の銀(Ag)の組成比差の絶対値(%)、銀錫めっき中のAg濃度(at%)、銀錫めっき層の結晶粒の平均粒径を測定するとともに、NiSnを主成分とする金属間化合物の生成の有無を判定し、耐摩耗性及び耐熱性(耐剥離性)を評価した。なお、各試料におけるリフロー錫材は、銅合金からなる基材、リフロー錫層及びこれらの間に位置するニッケル層とからなり、基材の厚みを0.25mm、リフロー錫層の厚みを1.2μm、ニッケル層の厚みを0.5μm、銀錫めっき層の膜厚を2.5μmとした。
[First Example]
After nickel strike plating was applied to a part of the surface of the reflow tin material, a nickel layer was formed, and each sample (Examples 1 to 6) in which a silver tin plating layer was formed on the nickel layer was produced. At this time, the values shown in Table 1 show the amount of Ag (g / L), the amount of Sn (g / L) and the current density in the silver tin plating solution, and the electrolytic degreasing treatment time and the nickel strike plating time of the reflow tin material. The absolute value (%) of the composition ratio difference between the silver (Ag) at the A position and the B position in the silver tin plating layer, the Ag concentration (at%) in the silver tin plating, and the average grain of the crystal grains of the silver tin plating layer. In addition to measuring the diameter, the presence or absence of formation of an intermetall compound containing NiSn 4 as a main component was determined, and wear resistance and heat resistance (peeling resistance) were evaluated. The reflow tin material in each sample is composed of a base material made of a copper alloy, a reflow tin layer and a nickel layer located between them, and the thickness of the base material is 0.25 mm and the thickness of the reflow tin layer is 1. The thickness of the nickel layer was set to 2 μm, the thickness of the nickel layer was set to 0.5 μm, and the thickness of the silver-tin plated layer was set to 2.5 μm.

また、比較例1~10の各試料のうち、比較例1及び2の試料については、アトテックジャパン社製のシアン浴を用いて光沢銀めっきを行った。具体的には、実施例1~6と同様に、表1に示す時間ニッケルストライクめっきを施し、かつ、その表面にニッケル層が形成されたリフロー錫材のニッケル層上に銀ストライクめっきを実施後、銀めっき浴に浸漬してめっきを行った。めっき浴の組成は、標準組成のものを用い、温度は25℃、電流密度3A/dmとし、陽極には純銀板を用いた。比較例1の試料の膜厚は2.5μmとし、比較例2の試料の膜厚は10μmとした。また、比較例3の試料は、リフロー錫材をそのまま用いた。さらに、比較例4及び5の試料については、めっき厚1.2μmのリフロー錫めっき上の酸化膜や有機付着物を脱脂もしくは酸洗などで除去後、銀めっきを実施した。めっき浴は日進化成製エコシルバーストライク液を用い、1A/dmで10秒めっきした後、水洗し、さらにめっき浴に日進化成製エコシルバーを用いて、0.5A/dmでめっきし、銀めっき膜を50nm成膜した。成膜後150℃で24時間加熱し、最表面をAgSnとした。比較例6~10の試料については、実施例1~6と同様に、リフロー錫材の表面の一部にニッケルストライクめっきを施した後、ニッケル層を形成し、該ニッケル層上に銀錫めっき層を形成した。 Further, among the samples of Comparative Examples 1 to 10, the samples of Comparative Examples 1 and 2 were subjected to glossy silver plating using a cyan bath manufactured by Atotech Japan. Specifically, as in Examples 1 to 6, after performing nickel strike plating for the time shown in Table 1 and performing silver strike plating on the nickel layer of the reflow tin material having a nickel layer formed on the surface thereof. , Dipping in a silver plating bath for plating. The composition of the plating bath was a standard composition, the temperature was 25 ° C., the current density was 3 A / dm 2 , and a pure silver plate was used as the anode. The film thickness of the sample of Comparative Example 1 was 2.5 μm, and the film thickness of the sample of Comparative Example 2 was 10 μm. Further, as the sample of Comparative Example 3, the reflow tin material was used as it was. Further, for the samples of Comparative Examples 4 and 5, silver plating was performed after removing the oxide film and organic deposits on the reflow tin plating having a plating thickness of 1.2 μm by degreasing or pickling. The plating bath uses Nikkei Seisei Eco-Silver Strike Liquid, and after plating at 1 A / dm 2 for 10 seconds, the plating bath is washed with water, and then the plating bath is plated with Nikkei Seisei Eco-Silver at 0.5 A / dm 2 . Then, a silver-plated film of 50 nm was formed. After the film was formed, it was heated at 150 ° C. for 24 hours to make the outermost surface Ag 3 Sn. For the samples of Comparative Examples 6 to 10, similarly to Examples 1 to 6, a nickel strike plating was applied to a part of the surface of the reflow tin material, a nickel layer was formed, and silver tin plating was performed on the nickel layer. Formed a layer.

[銀錫めっき層におけるP1位置及びP2位置の絶対値(%)の測定]
収束イオンビーム装置(FIB)にて銀錫めっき層の断面加工を行った後、断面の銀錫めっき層のめっき表面からニッケル層に向かって0.3μmの深さ位置P1と、ニッケル層との界面から銀錫めっき層の表面側に向かって0.3μmの深さ位置P2とについて、それぞれ日本電子株式会社製の電子線マイクロアナライザー:EPMA(型番JXA-8530F)にて組成分析を行い、錫(Sn)と銀(Ag)の組成比をAg/(Sn+Ag)×100(at%)で計算した際の(P1-P2)の差分を位置P1及び位置P2の絶対値(%)とした。
[Measurement of absolute value (%) of P1 position and P2 position in the silver-tin plated layer]
After processing the cross section of the silver tin plating layer with a convergent ion beam device (FIB), the depth position P1 of 0.3 μm from the plating surface of the silver tin plating layer in the cross section toward the nickel layer and the nickel layer The composition of P2 at a depth of 0.3 μm from the interface toward the surface side of the silver-tin plated layer was analyzed with an electron beam microanalyzer: EPMA (model number JXA-8530F) manufactured by JEOL Ltd., and tin was used. The difference of (P1-P2) when the composition ratio of (Sn) and silver (Ag) was calculated by Ag / (Sn + Ag) × 100 (at%) was taken as the absolute value (%) of the position P1 and the position P2.

[金属間化合物の測定] [Measurement of intermetallic compounds]

[銀錫めっき中のAg濃度(at%)の測定]
銀錫めっき中のAg濃度は、日本電子株式会社製の電子線マイクロアナライザー:EPMA(型番JXA-8530F)を用いて、加速電圧10kV、ビーム径φ30μmとし、各試料の表面を測定した。
[Measurement of Ag concentration (at%) in silver tin plating]
The Ag concentration during silver-tin plating was measured using an electron probe microanalyzer: EPMA (model number JXA-8530F) manufactured by JEOL Ltd. with an acceleration voltage of 10 kV and a beam diameter of φ30 μm.

[銀錫めっき層の結晶粒の平均粒径の測定]
銀錫めっき層の結晶粒の平均粒径は、めっき膜を電析の成長方向(電気銅の厚さ方向)に沿った断面をイオンミリング法によって加工し、EBSD装置(EDAX/TSL社製OIM Data Collection)付きFE-SEM(日本電子株式会社製JSM-7001FA)を用いて、測定範囲25μm×4μm、測定ステップ0.02μmで測定を行い、このデータを解析ソフト(EDAX/TSL社製OIM Data Analysis ver.5.2)を用いて解析を行い、隣接する測定点間の方位差が15°以上となる測定点間を結晶粒界とし、平均結晶粒径(平均粒径)を計算した。この平均粒径については、加熱前のもの(0h)と、150℃で240時間加熱後(240h)とのそれぞれについて測定した。
[Measurement of average grain size of crystal grains in silver-tin plated layer]
For the average grain size of the crystal grains of the silver-tin plating layer, the cross section of the plating film along the growth direction of electrodeposition (thickness direction of electrolytic copper) is processed by the ion milling method, and the EBSD device (EDAX / TSL OIM) is used. Using FE-SEM (JSM-7001FA manufactured by Nippon Denshi Co., Ltd.) with Data Collection), measurement was performed with a measurement range of 25 μm × 4 μm and a measurement step of 0.02 μm, and this data was analyzed by analysis software (EDAX / TSL OIM Data). Analysis was performed using Analysis ver. 5.2), and the average crystal grain size (average grain size) was calculated with the grain boundaries as the grain boundaries between the measurement points where the orientation difference between adjacent measurement points is 15 ° or more. The average particle size was measured before heating (0 h) and after heating at 150 ° C. for 240 hours (240 h).

[NiSnを主成分とする金属間化合物の生成の有無]
NiSnを主成分とする金属間化合物の生成の有無および同定は、セイコーインスツル株式会社製の集束イオンビーム装置:FIB(型番:SMI3050TB)を用いて、各試料を100nm以下に薄化した観察試料を作製し、この観察試料をFEI社製の走査透過型電子顕微鏡:STEM(型番:Titan G2 ChemiSTEM)を用いて、加速電圧200kVで観察を行い、STEMに付属するエネルギー分散型X線分析装置:EDSを用いて測定した。この際、NiSnを主成分とする金属間化合物が確認できたものを有り「A」と判定し、確認できなかったものを無し「B」と判定した。
[Presence / absence of intermetallic compounds containing NiSn 4 as the main component]
The presence or absence and identification of the formation of an intermetallic compound containing NiSn 4 as a main component was observed by diluting each sample to 100 nm or less using a focused ion beam device: FIB (model number: SMI3050TB) manufactured by Seiko Instruments Co., Ltd. A sample is prepared, and this observation sample is observed with a scanning transmission electron microscope: STEM (model number: Titan G2 ChemiSTEM) manufactured by FEI at an acceleration voltage of 200 kV, and the energy dispersive X-ray analyzer attached to STEM. : Measured using EDS. At this time, the intermetallic compound containing NiSn 4 as a main component was determined to be "A", and the compound that could not be confirmed was determined to be "B".

(耐摩耗性の評価)
加熱前の試料(めっき材)及び150℃で500時間加熱後の試料(めっき材)のそれぞれを60mm×10mmの試験片に切り出し、平板サンプルをオス端子の代用とし、この平板サンプルに曲率半径1.0mmの凸加工を行ったサンプルをメス端子の代用とした。摺動試験は、ブルカー・エイエックスエス株式会社の摩擦摩耗試験機(UMT-Tribolab)を用い、水平に設置したオス端子試験片にメス試験片の凸面を接触させ、5Nの荷重を負荷した状態で、オス端子試験片を水平に移動距離5mm、摺動速度1Hzで摺動させ、摺動100回後の摩耗深さを、摺動試験後に下地(ニッケル層)が露出しているか否かで判定した。この際、摩耗深さが2.5μm未満(摺動試験後に下地が露出していない)のものを良好「A」、摩耗深さが2.5μm以上のもの(摺動試験後に下地が露出しているもの)を不可「B」とした。
(Evaluation of wear resistance)
Each of the sample before heating (plating material) and the sample after heating at 150 ° C. for 500 hours (plating material) were cut into test pieces of 60 mm × 10 mm, and the flat plate sample was used as a substitute for the male terminal. A sample with a protrusion of 0.0 mm was used as a substitute for the female terminal. For the sliding test, a friction and wear tester (UMT-Tribolab) manufactured by Bruker AXS Co., Ltd. was used, and the convex surface of the female test piece was brought into contact with the horizontally installed male terminal test piece, and a load of 5N was applied. Then, the male terminal test piece is slid horizontally at a moving distance of 5 mm and a sliding speed of 1 Hz, and the wear depth after 100 times of sliding is determined by whether or not the base (nickel layer) is exposed after the sliding test. Judged. At this time, those with a wear depth of less than 2.5 μm (the base is not exposed after the sliding test) are good “A”, and those with a wear depth of 2.5 μm or more (the base is exposed after the sliding test). (What is) is not possible "B".

(耐熱性の評価)
耐熱剥離試験は、加熱前(初期剥離)と、大気加熱炉にて150℃で1000時間加熱後(耐熱剥離)とのそれぞれにおいて、JISK5600-5-6に記載のクロスカット法にて試験を行い、皮膜が剥がれなかったものを良好「A」、1マスでも剥がれたものを不可「B」とした。
(Evaluation of heat resistance)
The heat-resistant peeling test is performed by the cross-cut method described in JIS K5600-5-6 before heating (initial peeling) and after heating at 150 ° C. for 1000 hours in an atmospheric heating furnace (heat-resistant peeling). The one in which the film was not peeled off was regarded as good "A", and the one in which even one square was peeled off was designated as "B".

Figure 0007059877000001
Figure 0007059877000001

Figure 0007059877000002
Figure 0007059877000002

表1及び表2から明らかなように、実施例1~6では、銀錫めっき層がAgを70at%以上85at%以下の範囲で含み、かつ、銀錫系金属間化合物を主成分としていることから、銀錫めっき層の結晶粒の平均粒径が加熱前及び加熱後において1.0μm以下となり、加熱前及び加熱後のいずれにおいても、ニッケル層が露出することがなく、耐摩耗性が良好「A」以上となった。また、実施例1~6では、NiSnを主成分とする金属間化合物が存在していたことから、初期剥離及び耐熱剥離のいずれにおいても良好「A」であった。一方、比較例1~5は、めっき層がAgのみ、AgSnのみ若しくはリフロー錫により構成されていることから、150℃で240時間加熱後の耐摩耗性及び耐熱性のいずれもが不可「B」であった。また、比較例6は、銀錫めっき層中のAg量が65at%と少なかったため、欠陥が多く測定できなかった。さらに、比較例7は、銀錫めっき層中のAg量が95at%と多すぎたことから、銀錫めっき層の結晶粒の平均粒径が加熱後において1.0μmを超えたため、240時間加熱後の耐摩耗性が不可「B」であった。また、比較例8~10は、NiSnを主成分とする金属間化合物が存在しなかったため、240時間加熱後の耐剥離性が不可「B」であり、比較例8及び9に至っては、初期剥離においても耐剥離性が不可「B」であった。 As is clear from Tables 1 and 2, in Examples 1 to 6, the silver-tin plated layer contains Ag in the range of 70 at% or more and 85 at% or less, and contains a silver-tin-based intermetallic compound as a main component. Therefore, the average particle size of the crystal grains of the silver-tin plated layer is 1.0 μm or less before and after heating, the nickel layer is not exposed before and after heating, and the wear resistance is good. It became "A" or more. Further, in Examples 1 to 6, since the intermetallic compound containing NiSn 4 as a main component was present, it was a good "A" in both the initial peeling and the heat-resistant peeling. On the other hand, in Comparative Examples 1 to 5, since the plating layer is composed of only Ag, only Ag 3 Sn, or reflow tin, neither wear resistance nor heat resistance after heating at 150 ° C. for 240 hours is possible. It was "B". Further, in Comparative Example 6, since the amount of Ag in the silver-tin plated layer was as small as 65 at%, many defects could not be measured. Further, in Comparative Example 7, since the amount of Ag in the silver-tin plated layer was too large at 95 at%, the average particle size of the crystal grains of the silver-tin plated layer exceeded 1.0 μm after heating, so that the material was heated for 240 hours. Later wear resistance was not possible "B". Further, in Comparative Examples 8 to 10, since the intermetallic compound containing NiSn 4 as a main component was not present, the peel resistance after heating for 240 hours was impossible "B", and Comparative Examples 8 and 9 were found to be "B". Even in the initial peeling, the peeling resistance was not possible and was "B".

なお、図4は、150℃で240時間加熱後の実施例5のSEM像である。図4に示すように、加熱前の実施例5の銀錫めっき層の結晶粒の平均粒子径は1μm以下である。このため、耐摩耗性及び耐熱性を向上させるためには、150℃で240時間加熱後にEBSDで測定した銀錫めっき層の結晶粒の平均粒径が1μm以下であることがより好ましいことがわかった。また、銀錫めっき層とリフロー錫材との間にNiSnを主成分とする金属間化合物が配置されていれば、耐剥離性を向上できることがわかった。 FIG. 4 is an SEM image of Example 5 after heating at 150 ° C. for 240 hours. As shown in FIG. 4, the average particle size of the crystal grains of the silver-tin plated layer of Example 5 before heating is 1 μm or less. Therefore, in order to improve wear resistance and heat resistance, it was found that it is more preferable that the average particle size of the crystal grains of the silver-tin plated layer measured by EBSD after heating at 150 ° C. for 240 hours is 1 μm or less. rice field. Further, it was found that the peel resistance can be improved if an intermetallic compound containing NiSn 4 as a main component is arranged between the silver tin plating layer and the reflow tin material.

[第2実施例]
この第2実施例では、リフロー錫材の表面の一部に直接銀錫めっき層が形成された試料(実施例1)を製造した。この際、銀錫めっき液におけるAgの量(g/L)、Snの量(g/L)及び電流密度、並びに、リフロー錫材の電解脱脂処理時間及びニッケルストライクめっき時間を表3に示す値とし、銀錫めっき層におけるA位置及びB位置の銀(Ag)の組成比差の絶対値(%)、銀錫めっき中のAg濃度(at%)、銀錫粒子の平均粒径を測定するとともに、NiSnを主成分とする金属間化合物の生成の有無を判定し、耐摩耗性及び耐熱性(耐剥離性)を評価した。なお、各試料におけるリフロー錫材は、銅合金からなる基材、リフロー錫層及びこれらの間に位置するニッケル層とからなり、基材の厚みを0.25mm、リフロー錫層の厚みを1.2μm、ニッケル層の厚みを0.5μm、銀錫めっき層の膜厚を2.5μmとした。
[Second Example]
In this second example, a sample (Example 1) in which a silver tin plating layer was directly formed on a part of the surface of the reflow tin material was produced. At this time, the values shown in Table 3 are the amount of Ag (g / L), the amount of Sn (g / L) and the current density in the silver tin plating solution, and the electrolytic degreasing treatment time and the nickel strike plating time of the reflow tin material. The absolute value (%) of the composition ratio difference between the silver (Ag) at the A position and the B position in the silver tin plating layer, the Ag concentration (at%) in the silver tin plating, and the average particle size of the silver tin particles are measured. At the same time, the presence or absence of the formation of an intermetall compound containing NiSn 4 as a main component was determined, and the wear resistance and heat resistance (peeling resistance) were evaluated. The reflow tin material in each sample is composed of a base material made of a copper alloy, a reflow tin layer and a nickel layer located between them, and the thickness of the base material is 0.25 mm and the thickness of the reflow tin layer is 1. The thickness of the nickel layer was set to 2 μm, the thickness of the nickel layer was set to 0.5 μm, and the thickness of the silver-tin plated layer was set to 2.5 μm.

また、比較例1の試料については、上記第1実施例の比較例1と同様にアトテックジャパン社製のシアン浴を用いて光沢銀めっきを行い、基材上に膜厚2.5μmの銀めっき膜を形成した。さらに、比較例2の試料は、錫めっき厚2.5μmのリフロー錫めっき上の酸化膜や有機付着物を脱脂もしくは酸洗などで除去後、銀めっきを実施し、銀めっき膜を50nm成膜した。成膜後150℃で24時間加熱し、最表面をAgSnとした。さらに、比較例3の試料は、実施例1と同様にリフロー錫材の表面の一部に直接銀錫めっき層を形成した。なお、第2実施例においても第1実施例と同様に銀錫めっき層内における金属間化合物の測定を実行し、その測定結果は、実施例1及び比較例3では、AgSn及びAgSnの金属間化合物が生成され、主成分であることを確認した。一方、比較例1及び2では、AgSn及び/又はAgSnの金属間化合物が生成されていないことを確認した。また、耐摩耗性及び耐熱性の評価については、上記第1実施例と同じ手段を用いた。結果を表4に示す。 Further, the sample of Comparative Example 1 was subjected to glossy silver plating using a cyan bath manufactured by Atotech Japan Co., Ltd. in the same manner as in Comparative Example 1 of the first embodiment, and silver plating having a film thickness of 2.5 μm was performed on the substrate. A film was formed. Further, in the sample of Comparative Example 2, after removing the oxide film and organic deposits on the reflow tin plating having a tin plating thickness of 2.5 μm by degreasing or pickling, silver plating was performed to form a silver plating film of 50 nm. bottom. After the film was formed, it was heated at 150 ° C. for 24 hours to make the outermost surface Ag 3 Sn. Further, in the sample of Comparative Example 3, a silver tin plating layer was directly formed on a part of the surface of the reflow tin material as in Example 1. In the second embodiment as well, the measurement of the intermetallic compound in the silver-tin plated layer was carried out in the same manner as in the first embodiment, and the measurement results were obtained in Example 1 and Comparative Example 3 as Ag 3 Sn and Ag 4 . It was confirmed that an intermetallic compound of Sn was produced and was the main component. On the other hand, in Comparative Examples 1 and 2, it was confirmed that the intermetallic compound of Ag 3 Sn and / or Ag 4 Sn was not produced. Further, for the evaluation of wear resistance and heat resistance, the same means as in the first embodiment were used. The results are shown in Table 4.

Figure 0007059877000003
Figure 0007059877000003

Figure 0007059877000004
Figure 0007059877000004

表3及び表4から明らかなように、実施例1では、銀錫めっき層がAgを70at%以上85at%以下の範囲で含み、かつ、銀錫系金属間化合物を主成分としていることから、銀錫めっきの平均粒径が加熱前及び加熱後において1.0μm以下となり、加熱前及び加熱後のいずれにおいても、リフロー錫材のリフロー錫層(Sn)が露出することがなく、耐摩耗性が良好「A」となった。また、実施例1では、NiSnを主成分とする金属間化合物が存在していたことから、初期剥離及び耐熱剥離のいずれにおいても良好「A」であった。一方、比較例1及び2は、めっき層がAgのみ、もしくはAgSnのみにより構成されていることから、150℃で240時間加熱後の耐摩耗性及び耐熱性のいずれもが不可「B」であった。具体的には、比較例1では、加熱前及び加熱後のいずれにおいてもリフロー錫材のリフロー錫層(Sn)が露出し、比較例2では、加熱前及び加熱後のいずれにおいてもリフロー錫材の基材(Cu)が露出した。なお、比較例3は、銀錫めっき層中のAg量が95at%と高いことから、銀錫めっき層の結晶粒の平均粒径が加熱後において1.0μmを超えるため、240時間加熱後の耐摩耗性が不可「B」であった。これらのことから、リフロー錫材上に直接銀錫めっき層を形成した場合でも、耐摩耗性及び耐熱性(耐剥離性)を向上できることがわかった。 As is clear from Tables 3 and 4, in Example 1, the silver-tin plated layer contains Ag in the range of 70 at% or more and 85 at% or less, and the silver-tin-based intermetallic compound is the main component. The average particle size of silver-tin plating is 1.0 μm or less before and after heating, and the reflow tin layer (Sn) of the reflow tin material is not exposed before and after heating, and wear resistance. Was good "A". Further, in Example 1, since an intermetallic compound containing NiSn 4 as a main component was present, it was a good "A" in both the initial peeling and the heat-resistant peeling. On the other hand, in Comparative Examples 1 and 2, since the plating layer is composed of only Ag or only Ag 3 Sn, neither wear resistance nor heat resistance after heating at 150 ° C. for 240 hours is possible "B". Met. Specifically, in Comparative Example 1, the reflow tin layer (Sn) of the reflow tin material was exposed both before and after heating, and in Comparative Example 2, the reflow tin material was exposed both before and after heating. The base material (Cu) of the above was exposed. In Comparative Example 3, since the amount of Ag in the silver-tin plated layer is as high as 95 at%, the average particle size of the crystal grains of the silver-tin plated layer exceeds 1.0 μm after heating, so that after heating for 240 hours, Abrasion resistance was not possible "B". From these facts, it was found that the wear resistance and the heat resistance (peeling resistance) can be improved even when the silver tin plating layer is directly formed on the reflow tin material.

なお、図5は、150℃で240時間加熱後の実施例1のSEM像である。この図5に示すように、加熱後の銀錫めっき層の結晶粒は、非常に微細であることがわかる。 FIG. 5 is an SEM image of Example 1 after heating at 150 ° C. for 240 hours. As shown in FIG. 5, it can be seen that the crystal grains of the silver-tin plated layer after heating are very fine.

1 1A コネクタ用端子材
2 2A リフロー錫材
3 ニッケル層
4 銀錫めっき層
21 基材
22 リフロー錫層
23 ニッケル層
P1 位置
P2 位置
1 1A Terminal material for connector 2 2A Reflow tin material 3 Nickel layer 4 Silver tin plating layer 21 Base material 22 Reflow tin layer 23 Nickel layer P1 Position P2 Position

Claims (4)

銅又は銅合金からなる基材と該基材の表面に被覆されたリフロー錫層とを備えるリフロー錫材を有し、前記リフロー錫材の表面の一部には、銀錫合金からなる銀錫めっき層が被覆され、
前記銀錫めっき層は、Agを70at%以上85at%以下の範囲で含み、かつ、銀錫系金属間化合物を主成分とし、
前記銀錫めっき層を150℃で240時間加熱後にEBSDで測定した該銀錫めっき層の結晶粒の平均粒径が1μm以下であり、
前記銀錫めっき層と前記リフロー錫材との間には、NiSnを主成分とする金属間化合物が配置されていることを特徴とするコネクタ用端子材。
It has a reflow tin material having a base material made of copper or a copper alloy and a reflow tin layer coated on the surface of the base material, and a part of the surface of the reflow tin material is silver tin made of a silver tin alloy. The plating layer is coated and
The silver-tin plated layer contains Ag in a range of 70 at% or more and 85 at% or less, and contains a silver-tin-based intermetallic compound as a main component.
The average particle size of the crystal grains of the silver-tin-plated layer measured by EBSD after heating the silver-tin-plated layer at 150 ° C. for 240 hours is 1 μm or less.
A terminal material for a connector, characterized in that an intermetallic compound containing NiSn 4 as a main component is arranged between the silver tin plating layer and the reflow tin material.
前記銀錫めっき層の膜厚は、1μm以上50μm以下であることを特徴とする請求項1に記載のコネクタ用端子材。 The terminal material for a connector according to claim 1, wherein the silver-tin plating layer has a film thickness of 1 μm or more and 50 μm or less. 前記リフロー錫材と前記銀錫めっき層との間には、ニッケル又はニッケル合金からなるニッケル層が設けられ、該ニッケル層の膜厚は0.5μm以上5μm以下であることを特徴とする請求項1又は2に記載のコネクタ用端子材。 The claim is characterized in that a nickel layer made of nickel or a nickel alloy is provided between the reflow tin material and the silver tin plating layer, and the thickness of the nickel layer is 0.5 μm or more and 5 μm or less. The terminal material for a connector according to 1 or 2. 請求項1から3のいずれか一項に記載の端子材からなるコネクタ用端子であって、接点部分に前記銀錫めっき層が位置していることを特徴とするコネクタ用端子。
A connector terminal made of the terminal material according to any one of claims 1 to 3, wherein the silver-tin plated layer is located at a contact portion.
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JP2015183216A (en) 2014-03-24 2015-10-22 Jx日鉱日石金属株式会社 ELECTRONIC COMPONENT HAVING Ag-Sn ALLOY PLATING FILM, AND MANUFACTURING METHOD OF Ag-Sn PLATING SOLUTION AND THE ELECTRONIC COMPONENT
JP2016065316A (en) 2013-06-10 2016-04-28 オリエンタル鍍金株式会社 Plated laminate
JP2016522327A (en) 2013-06-04 2016-07-28 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC Silver-tin alloy electroplating bath

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JP2016522327A (en) 2013-06-04 2016-07-28 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC Silver-tin alloy electroplating bath
JP2016065316A (en) 2013-06-10 2016-04-28 オリエンタル鍍金株式会社 Plated laminate
JP2015086446A (en) 2013-10-31 2015-05-07 三菱伸銅株式会社 Conductive member for connector
JP2015183216A (en) 2014-03-24 2015-10-22 Jx日鉱日石金属株式会社 ELECTRONIC COMPONENT HAVING Ag-Sn ALLOY PLATING FILM, AND MANUFACTURING METHOD OF Ag-Sn PLATING SOLUTION AND THE ELECTRONIC COMPONENT

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