JP6941618B2 - 付加製造で製造される形状の補正 - Google Patents
付加製造で製造される形状の補正 Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
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- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
- B24D18/009—Tools not otherwise provided for
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
- B29C64/10—Processes of additive manufacturing
- B29C64/106—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material
- B29C64/112—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using individual droplets, e.g. from jetting heads
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/32115—Planarisation
- H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
- H01L21/32125—Planarisation by chemical mechanical polishing [CMP] by simultaneously passing an electrical current, i.e. electrochemical mechanical polishing, e.g. ECMP
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
- B29L2031/00—Other particular articles
- B29L2031/736—Grinding or polishing equipment
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- Engineering & Computer Science (AREA)
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- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Description
Claims (14)
- 付加製造システムを使用して研磨パッドを製造する方法であって、
液滴吐出によって製造される前記研磨パッドの望ましい形状を示すデータを受信することであって、前記望ましい形状が、前記研磨パッド上の研磨面と一又は複数の溝とを含むプロファイルを画定する、データを受信することと、
前記付加製造システムによって生じる前記プロファイルのゆがみを少なくとも部分的に補償するために、供給材料を分配する修正後のパターンを示すデータを生成することと、
前記修正後のパターンにしたがって、液滴吐出により、複数層の前記供給材料を分配することとを含み、
前記付加製造システムによって生じる前記プロファイルの前記ゆがみが、製造中のフィーチャ上に吐出された液滴の流れによって生じるゆがみを含む、方法。 - 前記研磨パッド上の前記一又は複数の溝が、前記複数層に対して実質的に垂直な側壁によって画定され、前記一又は複数の溝のゆがみが、前記研磨面に対する前記側壁の垂直度のゆがみを含む、請求項1に記載の方法。
- 前記研磨面が前記複数層に実質的に平行であり、前記研磨パッドの前記研磨面のゆがみが、前記研磨面の平坦度のゆがみを含む、請求項1に記載の方法。
- 前記研磨パッドの前記望ましい形状が、前記研磨面を画定する平面を含み、前記修正後のパターンが、前記平面に対応する非平面部分を含み、前記非平面部分は、前記付加製造システムによって生じる前記研磨面のゆがみを、少なくとも部分的に補償するよう構成される、請求項1に記載の方法。
- 非一過性のコンピュータ可読媒体において有形に具現化されるコンピュータプログラム製品であって、プロセッサに、
付加製造システムにおいて液滴吐出によって製造される研磨パッドの望ましい形状を示すデータを受信することであって、前記望ましい形状が、前記研磨パッド上の研磨面と一又は複数の溝とを含むプロファイルを画定する、データを受信することと、
前記付加製造システムによって生じる前記プロファイルのゆがみを少なくとも部分的に補償するために、供給材料を分配する修正後のパターンを示すデータを生成することと、
前記付加製造システムに、前記修正後のパターンにしたがって、液滴吐出により、複数層の前記供給材料を分配させることとを、実行させるための指令を含み、
前記付加製造システムによって生じる前記プロファイルの前記ゆがみが、製造中のフィーチャ上に吐出された液滴の流れによって生じるゆがみを含む、コンピュータプログラム製品。 - 前記研磨パッドの前記望ましい形状を示す前記データが、前記複数層の供給材料を分配するパターンを示すデータを含み、前記パターンを示す前記データは、平坦な上面を表わすデータを含み、
前記修正後のパターンを示す前記データが、前記平坦な上面を表わす前記データに基づいて生成される凹型上面を表わすデータを含む、請求項5に記載のコンピュータプログラム製品。 - 前記凹型上面を表わす前記データが、前記パターンを示す前記データを使用して形成された前記研磨パッドの研磨面の平坦度のゆがみを少なくとも部分的に補償するために生成される、請求項6に記載のコンピュータプログラム製品。
- 前記修正後のパターンを示す前記データを生成するための前記指令が、前記研磨パッドの前記望ましい形状を形成するために、当初のパターンを示すデータを修正するための指令を含む、請求項5に記載のコンピュータプログラム製品。
- 前記当初のパターンを示す前記データが、前記当初のパターンに対する補正プロファイルに基づいて修正される、請求項8に記載のコンピュータプログラム製品。
- 前記補正プロファイルが、前記当初のパターンの幅を越えて延在する部分を含む、請求項9に記載のコンピュータプログラム製品。
- 前記補正プロファイルが、前記ゆがみによって少なくとも部分的に画定されている当初の形状と、前記望ましい形状との間の差異を特定することによって決定される、請求項9に記載のコンピュータプログラム製品。
- 前記当初のパターンを示す前記データを修正するための前記指令が、ボクセルごとに堆積される前記供給材料の量を修正するための指令を含む、請求項8に記載のコンピュータプログラム製品。
- 前記当初のパターンが、少なくとも2つの溝を分離させる仕切り部を含む研磨面を表わすデータを含み、前記当初のパターンを示す前記データを修正するための前記指令が、
前記溝に隣接した前記仕切り部のエッジ部分の近位に分配される材料の第1の体積を決定するため、
前記仕切り部の中心部分に分配される材料の第2の体積を決定するため、及び、
前記第2の体積が前記第1の体積よりも大きくなるように、前記第1の体積及び前記第2の体積に基づいて前記供給材料の体積分布を修正するための指令を含む、請求項8に記載のコンピュータプログラム製品。 - 付加製造システムであって、
製造中の研磨パッドを保持するための、プラットフォームと、
前記プラットフォーム、又は前記研磨パッドの既に堆積された層の上に、液滴吐出によって複数層を形成するための、プリントヘッドと、
前記研磨パッドの望ましい形状を示すデータを受信することであって、前記望ましい形状が、前記研磨パッド上の研磨面と一又は複数の溝とを含むプロファイルを画定する、データを受信することと、
前記付加製造システムによって生じる前記プロファイルのゆがみを少なくとも部分的に補償するために、供給材料を分配する修正後のパターンを示すデータを生成することと、
前記プリントヘッドに、前記修正後のパターンにしたがって、液滴吐出により、複数層の前記供給材料を分配させることとを、実行するよう設定されたコントローラとを備え、
前記付加製造システムによって生じる前記プロファイルの前記ゆがみが、製造中のフィーチャ上に吐出された液滴の流れによって生じるゆがみを含む、
付加製造システム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US201662305973P | 2016-03-09 | 2016-03-09 | |
US62/305,973 | 2016-03-09 | ||
PCT/US2017/021686 WO2017156342A1 (en) | 2016-03-09 | 2017-03-09 | Correction of fabricated shapes in additive manufacturing |
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JP2019510648A JP2019510648A (ja) | 2019-04-18 |
JP6941618B2 true JP6941618B2 (ja) | 2021-09-29 |
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US (3) | US10537973B2 (ja) |
EP (2) | EP3869538A1 (ja) |
JP (1) | JP6941618B2 (ja) |
KR (2) | KR102377436B1 (ja) |
CN (1) | CN108701610B (ja) |
SG (1) | SG11201806820UA (ja) |
TW (2) | TWI765655B (ja) |
WO (1) | WO2017156342A1 (ja) |
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JP6241244B2 (ja) * | 2013-12-10 | 2017-12-06 | セイコーエプソン株式会社 | 三次元造形物製造装置、三次元造形物の製造方法および三次元造形物 |
US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
CN107078048B (zh) | 2014-10-17 | 2021-08-13 | 应用材料公司 | 使用加成制造工艺的具复合材料特性的cmp衬垫建构 |
US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
US10618141B2 (en) | 2015-10-30 | 2020-04-14 | Applied Materials, Inc. | Apparatus for forming a polishing article that has a desired zeta potential |
US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
JP2017113979A (ja) * | 2015-12-24 | 2017-06-29 | キヤノン株式会社 | 造形装置、造形方法及びプログラム |
US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
EP3869538A1 (en) | 2016-03-09 | 2021-08-25 | Applied Materials, Inc. | Correction of fabricated shapes in additive manufacturing |
US10864612B2 (en) * | 2016-12-14 | 2020-12-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing pad and method of using |
US10967482B2 (en) | 2017-05-25 | 2021-04-06 | Applied Materials, Inc. | Fabrication of polishing pad by additive manufacturing onto mold |
US11059149B2 (en) | 2017-05-25 | 2021-07-13 | Applied Materials, Inc. | Correction of fabricated shapes in additive manufacturing using initial layer |
US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
CN110570512B (zh) | 2018-06-06 | 2024-02-02 | 哈米尔顿森德斯特兰德公司 | 包括利用形状变换的补偿建模方法的增材制造 |
CN112654655A (zh) | 2018-09-04 | 2021-04-13 | 应用材料公司 | 先进抛光垫配方 |
US11851570B2 (en) | 2019-04-12 | 2023-12-26 | Applied Materials, Inc. | Anionic polishing pads formed by printing processes |
CN111136593A (zh) * | 2020-01-15 | 2020-05-12 | 河南科技学院 | 一种具有复杂流道结构的固结研抛垫制备装置及制备方法 |
US11791224B2 (en) | 2020-05-14 | 2023-10-17 | Applied Materials, Inc. | Technique for training neural network for use in in-situ monitoring during polishing and polishing system |
US11759860B2 (en) | 2020-11-09 | 2023-09-19 | General Electric Company | Systems and methods for compensating a geometry of a green body part based on sintering-induced distortion |
US11878389B2 (en) * | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
CN118591435A (zh) | 2021-12-30 | 2024-09-03 | 圣戈班磨料磨具有限公司 | 磨料制品及其形成方法 |
CN118935195B (zh) * | 2024-08-12 | 2025-03-11 | 广东省源天工程有限公司 | 一种基于bim的机电管线安装的激光管道定位装置 |
Family Cites Families (91)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5463653A (en) | 1977-10-29 | 1979-05-22 | Sumitomo Electric Ind Ltd | Dielectric resonator |
US5387380A (en) | 1989-12-08 | 1995-02-07 | Massachusetts Institute Of Technology | Three-dimensional printing techniques |
US5257478A (en) | 1990-03-22 | 1993-11-02 | Rodel, Inc. | Apparatus for interlayer planarization of semiconductor material |
MY114512A (en) * | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
US5906863A (en) | 1994-08-08 | 1999-05-25 | Lombardi; John | Methods for the preparation of reinforced three-dimensional bodies |
JPH0950974A (ja) | 1995-08-07 | 1997-02-18 | Sony Corp | 研磨布及び半導体装置の製造方法 |
US6270335B2 (en) | 1995-09-27 | 2001-08-07 | 3D Systems, Inc. | Selective deposition modeling method and apparatus for forming three-dimensional objects and supports |
US5738574A (en) | 1995-10-27 | 1998-04-14 | Applied Materials, Inc. | Continuous processing system for chemical mechanical polishing |
US6244575B1 (en) | 1996-10-02 | 2001-06-12 | Micron Technology, Inc. | Method and apparatus for vaporizing liquid precursors and system for using same |
US5940674A (en) | 1997-04-09 | 1999-08-17 | Massachusetts Institute Of Technology | Three-dimensional product manufacture using masks |
US5921855A (en) | 1997-05-15 | 1999-07-13 | Applied Materials, Inc. | Polishing pad having a grooved pattern for use in a chemical mechanical polishing system |
US6522386B1 (en) * | 1997-07-24 | 2003-02-18 | Nikon Corporation | Exposure apparatus having projection optical system with aberration correction element |
DE19834559A1 (de) | 1998-07-31 | 2000-02-03 | Friedrich Schiller Uni Jena Bu | Verfahren zur Herstellung von Werkzeugen für die Bearbeitung von Oberflächen |
JP2000061817A (ja) * | 1998-08-24 | 2000-02-29 | Nikon Corp | 研磨パッド |
WO2001064396A1 (en) | 2000-02-28 | 2001-09-07 | Rodel Holdings, Inc. | Polishing pad surface texture formed by solid phase droplets |
US7300619B2 (en) | 2000-03-13 | 2007-11-27 | Objet Geometries Ltd. | Compositions and methods for use in three dimensional model printing |
US6569373B2 (en) | 2000-03-13 | 2003-05-27 | Object Geometries Ltd. | Compositions and methods for use in three dimensional model printing |
ES2230086T3 (es) | 2000-03-24 | 2005-05-01 | Voxeljet Technology Gmbh | Metodo y aparato para fabricar una pieza estructural mediante la tecnica de deposicion multi-capa y moldeo macho fabricado con el metodo. |
JP2002028849A (ja) | 2000-07-17 | 2002-01-29 | Jsr Corp | 研磨パッド |
US6736869B1 (en) | 2000-08-28 | 2004-05-18 | Micron Technology, Inc. | Method for forming a planarizing pad for planarization of microelectronic substrates |
US6641471B1 (en) | 2000-09-19 | 2003-11-04 | Rodel Holdings, Inc | Polishing pad having an advantageous micro-texture and methods relating thereto |
WO2002043921A1 (fr) | 2000-12-01 | 2002-06-06 | Toyo Boseki Kabushiki Kaisha | Tampon de polissage, procede de fabrication de ce tampon de polissage, et couche d'amortissement pour ce tampon de polissage |
US20020111707A1 (en) | 2000-12-20 | 2002-08-15 | Zhimin Li | Droplet deposition method for rapid formation of 3-D objects from non-cross-linking reactive polymers |
GB0103754D0 (en) | 2001-02-15 | 2001-04-04 | Vantico Ltd | Three-dimensional structured printing |
JP3727261B2 (ja) * | 2001-09-28 | 2005-12-14 | 日本写真印刷株式会社 | 凹凸シートの製造方法 |
DE10224981B4 (de) | 2002-06-05 | 2004-08-19 | Generis Gmbh | Verfahren zum schichtweisen Aufbau von Modellen |
WO2004024447A2 (en) | 2002-09-12 | 2004-03-25 | Objet Geometries Ltd. | Device, system and method for calibration in three-dimensional model printing |
US7497977B2 (en) | 2003-01-29 | 2009-03-03 | Hewlett-Packard Development Company, L.P. | Methods and systems for producing an object through solid freeform fabrication by varying a concentration of ejected material applied to an object layer |
US7377840B2 (en) * | 2004-07-21 | 2008-05-27 | Neopad Technologies Corporation | Methods for producing in-situ grooves in chemical mechanical planarization (CMP) pads, and novel CMP pad designs |
IL156094A0 (en) | 2003-05-25 | 2003-12-23 | J G Systems Inc | Fixed abrasive cmp pad with built-in additives |
US20050012247A1 (en) | 2003-07-18 | 2005-01-20 | Laura Kramer | Systems and methods for using multi-part curable materials |
US7120512B2 (en) | 2003-08-25 | 2006-10-10 | Hewlett-Packard Development Company, L.P. | Method and a system for solid freeform fabricating using non-reactive powder |
EP1661690A4 (en) | 2003-08-27 | 2009-08-12 | Fujifilm Corp | METHOD FOR PRODUCING A THREE-DIMENSIONAL MODEL |
US20050074596A1 (en) | 2003-10-06 | 2005-04-07 | Nielsen Jeffrey A. | Method and system for using porous structures in solid freeform fabrication |
GB0323462D0 (en) | 2003-10-07 | 2003-11-05 | Fujifilm Electronic Imaging | Providing a surface layer or structure on a substrate |
KR100576465B1 (ko) | 2003-12-01 | 2006-05-08 | 주식회사 하이닉스반도체 | 연마입자 함침 조성물을 이용한 연마 패드 |
JP2005319634A (ja) | 2004-05-07 | 2005-11-17 | Roland Dg Corp | 三次元造形装置および三次元造形方法 |
US7216009B2 (en) | 2004-06-14 | 2007-05-08 | Micron Technology, Inc. | Machine vision systems for use with programmable material consolidation system and associated methods and structures |
JP2006095680A (ja) | 2004-09-14 | 2006-04-13 | Zhiguo Long | 切割研磨シートとその製造方法 |
KR100606457B1 (ko) | 2004-11-11 | 2006-11-23 | 한국기계연구원 | 3차원 프린팅 조형시스템 |
GB0426126D0 (en) * | 2004-11-29 | 2004-12-29 | Plastic Logic Ltd | Distortion compensation for multiple head printing |
US7182677B2 (en) * | 2005-01-14 | 2007-02-27 | Applied Materials, Inc. | Chemical mechanical polishing pad for controlling polishing slurry distribution |
US7524345B2 (en) | 2005-02-22 | 2009-04-28 | Saint-Gobain Abrasives, Inc. | Rapid tooling system and methods for manufacturing abrasive articles |
US7829000B2 (en) | 2005-02-25 | 2010-11-09 | Hewlett-Packard Development Company, L.P. | Core-shell solid freeform fabrication |
JP2007019434A (ja) * | 2005-07-11 | 2007-01-25 | Disco Abrasive Syst Ltd | 研磨パッド形状修正装置および研磨装置 |
US20070128991A1 (en) | 2005-12-07 | 2007-06-07 | Yoon Il-Young | Fixed abrasive polishing pad, method of preparing the same, and chemical mechanical polishing apparatus including the same |
WO2007104063A1 (en) | 2006-03-09 | 2007-09-13 | Rimpad Tech Ltd. | Composite polishing pad |
US7354779B2 (en) * | 2006-03-10 | 2008-04-08 | International Business Machines Corporation | Topography compensated film application methods |
US20070235904A1 (en) | 2006-04-06 | 2007-10-11 | Saikin Alan H | Method of forming a chemical mechanical polishing pad utilizing laser sintering |
KR100842486B1 (ko) | 2006-10-30 | 2008-07-01 | 동부일렉트로닉스 주식회사 | Cmp 장비의 폴리싱패드와 이의 제조장치 |
US8784723B2 (en) * | 2007-04-01 | 2014-07-22 | Stratasys Ltd. | Method and system for three-dimensional fabrication |
US7862320B2 (en) | 2007-07-17 | 2011-01-04 | Seiko Epson Corporation | Three-dimensional object forming apparatus and method for forming three dimensional object |
EP2664444B1 (en) | 2007-07-25 | 2018-03-28 | Stratasys Ltd. | Solid freeform fabrication using a plurality of modeling materials |
EP2305454B1 (en) | 2008-05-26 | 2017-03-22 | Sony Corporation | Shaping apparatus and shaping method |
US8282866B2 (en) | 2008-06-30 | 2012-10-09 | Seiko Epson Corporation | Method and device for forming three-dimensional model, sheet material processing method, and sheet material processing device |
JP5463653B2 (ja) * | 2008-11-18 | 2014-04-09 | セイコーエプソン株式会社 | 液滴吐出装置の吐出パターンデータ補正方法および液滴吐出装置 |
JP2011207722A (ja) * | 2010-03-30 | 2011-10-20 | Jx Nippon Oil & Energy Corp | 電気二重層キャパシタ電極用活性炭およびその製造方法 |
JP2012094559A (ja) | 2010-10-22 | 2012-05-17 | Sumco Corp | 硬脆性ウェーハの平坦化加工方法および平坦化加工用パッド |
US8968058B2 (en) * | 2011-05-05 | 2015-03-03 | Nexplanar Corporation | Polishing pad with alignment feature |
EP2786859B1 (en) | 2011-06-28 | 2019-08-07 | Global Filtration Systems, A DBA of Gulf Filtration Systems Inc. | Apparatus for forming three-dimensional objects using linear solidification |
US8920219B2 (en) * | 2011-07-15 | 2014-12-30 | Nexplanar Corporation | Polishing pad with alignment aperture |
KR101304143B1 (ko) | 2011-08-01 | 2013-09-05 | 배은식 | 연마 패드 제조 방법 |
CN104487221B (zh) | 2012-03-01 | 2017-09-26 | 纳斯达克有限公司 | 阳离子可聚合组合物及其使用方法 |
JP2013201046A (ja) * | 2012-03-26 | 2013-10-03 | Toppan Printing Co Ltd | 凹型欠陥の修正方法及びそれを用いた有機el素子の製造方法 |
WO2013148497A1 (en) * | 2012-03-27 | 2013-10-03 | Eastman Chemical Company | Process for recovering and recycling an acid catalyst |
US9067299B2 (en) | 2012-04-25 | 2015-06-30 | Applied Materials, Inc. | Printed chemical mechanical polishing pad |
US9886526B2 (en) * | 2012-10-11 | 2018-02-06 | University Of Southern California | 3D printing shrinkage compensation using radial and angular layer perimeter point information |
CN104968500B (zh) * | 2012-11-05 | 2017-06-13 | 斯特拉塔西斯公司 | 三维部件直接喷墨打印的系统及方法 |
US9649742B2 (en) * | 2013-01-22 | 2017-05-16 | Nexplanar Corporation | Polishing pad having polishing surface with continuous protrusions |
WO2015023442A1 (en) | 2013-08-10 | 2015-02-19 | Applied Materials, Inc. | Cmp pads having material composition that facilitates controlled conditioning |
TWI599447B (zh) * | 2013-10-18 | 2017-09-21 | 卡博特微電子公司 | 具有偏移同心溝槽圖樣之邊緣排除區的cmp拋光墊 |
US9421666B2 (en) * | 2013-11-04 | 2016-08-23 | Applied Materials, Inc. | Printed chemical mechanical polishing pad having abrasives therein |
US9993907B2 (en) | 2013-12-20 | 2018-06-12 | Applied Materials, Inc. | Printed chemical mechanical polishing pad having printed window |
JP2015128884A (ja) | 2014-01-09 | 2015-07-16 | セイコーエプソン株式会社 | 三次元造形物の製造方法および三次元造形物 |
EP3094471B1 (en) | 2014-01-16 | 2021-06-02 | Hewlett-Packard Development Company, L.P. | Processing three-dimensional object data of an object to be generated by an additive manufacturing process |
EP2918395B1 (en) * | 2014-03-12 | 2018-07-04 | Rolls-Royce Corporation | Additive manufacturing including layer-by-layer imaging |
US9427867B2 (en) | 2014-04-02 | 2016-08-30 | The Boeing Company | Localization within an environment using sensor fusion |
US9327537B2 (en) * | 2014-06-06 | 2016-05-03 | Xerox Corporation | System for adjusting operation of a printer during three-dimensional object printing using an optical sensor |
US9542525B2 (en) | 2014-06-24 | 2017-01-10 | Siemens Product Lifecycle Management Software Inc. | Additive smoothing of sharp concave edges on designed 3D printable polygonal mesh models |
US10252466B2 (en) * | 2014-07-28 | 2019-04-09 | Massachusetts Institute Of Technology | Systems and methods of machine vision assisted additive fabrication |
US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
US10821573B2 (en) | 2014-10-17 | 2020-11-03 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
CN107078048B (zh) | 2014-10-17 | 2021-08-13 | 应用材料公司 | 使用加成制造工艺的具复合材料特性的cmp衬垫建构 |
US9908287B2 (en) | 2014-11-20 | 2018-03-06 | Ut-Battelle, Llc | Build platform that provides mechanical engagement with additive manufacturing prints |
WO2017079091A1 (en) | 2015-11-06 | 2017-05-11 | Velo3D, Inc. | Adept three-dimensional printing |
JP6612122B2 (ja) | 2015-12-14 | 2019-11-27 | 株式会社ミマキエンジニアリング | 造形物の製造装置及び制御方法 |
JP6839509B2 (ja) | 2016-02-29 | 2021-03-10 | 株式会社ミマキエンジニアリング | 三次元造形物製造方法および造形装置 |
EP3869538A1 (en) | 2016-03-09 | 2021-08-25 | Applied Materials, Inc. | Correction of fabricated shapes in additive manufacturing |
US10391757B2 (en) | 2016-09-29 | 2019-08-27 | Xerox Corporation | Device for facilitating repetitive manufacture of parts having precisionally positioned components with a three-dimensional object printer |
US10967482B2 (en) | 2017-05-25 | 2021-04-06 | Applied Materials, Inc. | Fabrication of polishing pad by additive manufacturing onto mold |
US11059149B2 (en) | 2017-05-25 | 2021-07-13 | Applied Materials, Inc. | Correction of fabricated shapes in additive manufacturing using initial layer |
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CN108701610A (zh) | 2018-10-23 |
CN108701610B (zh) | 2023-06-02 |
US11154961B2 (en) | 2021-10-26 |
EP3869538A1 (en) | 2021-08-25 |
US20200139507A1 (en) | 2020-05-07 |
KR102334828B1 (ko) | 2021-12-06 |
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