JP6835275B1 - 短絡判定装置、スイッチ装置、および、短絡判定方法 - Google Patents
短絡判定装置、スイッチ装置、および、短絡判定方法 Download PDFInfo
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- 238000000034 method Methods 0.000 title claims description 13
- 230000008859 change Effects 0.000 claims abstract description 46
- 238000001514 detection method Methods 0.000 claims description 54
- 239000004065 semiconductor Substances 0.000 claims description 6
- 229910002601 GaN Inorganic materials 0.000 claims description 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 3
- 229910003460 diamond Inorganic materials 0.000 claims description 3
- 239000010432 diamond Substances 0.000 claims description 3
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 claims description 3
- 229910001195 gallium oxide Inorganic materials 0.000 claims description 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 3
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 3
- 230000000903 blocking effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 abstract description 5
- 230000004044 response Effects 0.000 description 11
- 238000011084 recovery Methods 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000001934 delay Effects 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3275—Fault detection or status indication
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
- G01R15/181—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using coils without a magnetic core, e.g. Rogowski coils
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
- H03K17/0812—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit
- H03K17/08122—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Power Conversion In General (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
[先行技術文献]
[特許文献]
[特許文献1] 特開2001−169533
20 スイッチング素子
22 制御端子
24 第1主端子
26 第2主端子
30 制御端子駆動部
100 短絡判定装置
110 センサ
120 短絡判定部
130 定常動作時短絡判定部
132 タイミング検出部
134 第1の判定部
140 ターンオン動作時短絡判定部
142 積分器
144 第2の判定部
150 短絡信号出力部
160 短絡電流遮断部
410 タイミング変更部
Claims (9)
- 制御端子、第1主端子、および、第2主端子を有するスイッチング素子における、前記第1主端子および前記第2主端子間に流れる主電流の時間変化を検出するセンサと、
前記制御端子を駆動するための制御信号がオンした後における第1のタイミング以降にのみ、前記主電流の時間変化が第1のしきい値以上となった場合に、前記スイッチング素子が短絡したと判定する第1の判定部を有する短絡判定部と
を備え、
前記短絡判定部は、前記主電流の時間変化と第2のしきい値とを比較し、前記主電流の時間変化が前記第2のしきい値以下となった場合に、前記第1のタイミングを検出するタイミング検出部を有する、短絡判定装置。 - 前記第1の判定部は、前記タイミング検出部が前記第1のタイミングを検出した場合に、前記主電流の時間変化が前記第1のしきい値以上となったか否かの判定を開始する、請求項1に記載の短絡判定装置。
- 前記短絡判定部は、
前記主電流の時間変化を積分する積分器と、
前記積分器の出力に基づいて、前記スイッチング素子の短絡を判定する第2の判定部とを更に有する、請求項1または2に記載の短絡判定装置。 - 前記スイッチング素子が短絡したと判定された場合に、短絡電流を遮断する短絡電流遮断部を更に備える、請求項1から3のいずれか一項に記載の短絡判定装置。
- 前記センサは、ロゴスキーコイルである、請求項1から4のいずれか一項に記載の短絡判定装置。
- 前記スイッチング素子は、ワイドバンドギャップ半導体素子である、請求項1から5のいずれか一項に記載の短絡判定装置。
- 前記ワイドバンドギャップ半導体素子は、炭化ケイ素、窒化ガリウム、酸化ガリウム、および、ダイアモンドの少なくともいずれかを含む、請求項6に記載の短絡判定装置。
- 請求項1から7のいずれか一項に記載の短絡判定装置と、
前記スイッチング素子と
を備える、スイッチ装置。 - 制御端子、第1主端子、および、第2主端子を有するスイッチング素子の短絡を判定する短絡判定方法であって、
前記第1主端子および前記第2主端子間に流れる主電流の時間変化を検出することと、
前記主電流の時間変化と第2のしきい値とを比較し、前記主電流の時間変化が前記第2のしきい値以下となった場合に、第1のタイミングを検出することと、
前記制御端子を駆動するための制御信号がオンした後における前記第1のタイミング以降にのみ、前記主電流の時間変化が第1のしきい値以上となった場合に、前記スイッチング素子が短絡したと判定することと
を備える短絡判定方法。
Priority Applications (5)
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JP2020047251A JP6835275B1 (ja) | 2020-03-18 | 2020-03-18 | 短絡判定装置、スイッチ装置、および、短絡判定方法 |
DE112021000078.0T DE112021000078T5 (de) | 2020-03-18 | 2021-03-15 | Kurzschlussbestimmungsvorrichtung, schaltgerät und verfahren zur bestimmung eines kurzschlusses |
PCT/JP2021/010428 WO2021187437A1 (ja) | 2020-03-18 | 2021-03-15 | 短絡判定装置、スイッチ装置、および、短絡判定方法 |
CN202180005123.2A CN114342233B (zh) | 2020-03-18 | 2021-03-15 | 短路判定装置、开关装置以及短路判定方法 |
US17/679,020 US12105156B2 (en) | 2020-03-18 | 2022-02-23 | Short circuit determination apparatus, switch apparatus, and short circuit determination method |
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JP2020047251A JP6835275B1 (ja) | 2020-03-18 | 2020-03-18 | 短絡判定装置、スイッチ装置、および、短絡判定方法 |
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JP2021151038A JP2021151038A (ja) | 2021-09-27 |
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US (1) | US12105156B2 (ja) |
JP (1) | JP6835275B1 (ja) |
CN (1) | CN114342233B (ja) |
DE (1) | DE112021000078T5 (ja) |
WO (1) | WO2021187437A1 (ja) |
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US12130312B2 (en) * | 2022-10-13 | 2024-10-29 | Eaton Intelligent Power Limited | Method to detect signal corruption from conductive dust in a circuit breaker |
Citations (5)
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JP3409620B2 (ja) * | 1997-01-31 | 2003-05-26 | 日産自動車株式会社 | スイッチング素子用駆動回路およびインバータ装置 |
WO2013094241A1 (ja) * | 2011-12-22 | 2013-06-27 | 三菱電機株式会社 | ゲート駆動回路 |
JP2015139271A (ja) * | 2014-01-22 | 2015-07-30 | 株式会社日立製作所 | 半導体駆動装置ならびにこれを用いた電力変換装置 |
WO2018193527A1 (ja) * | 2017-04-18 | 2018-10-25 | 三菱電機株式会社 | 過電流検出回路及び電力変換装置 |
WO2019225121A1 (ja) * | 2018-05-23 | 2019-11-28 | 三菱電機株式会社 | 電力用半導体素子の保護回路およびパワーモジュール |
Family Cites Families (12)
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JP2001169533A (ja) | 1999-12-06 | 2001-06-22 | Toshiba Corp | 電力変換装置 |
US7265959B2 (en) * | 2005-01-25 | 2007-09-04 | Yazaki North America, Inc. | Solid state switch with quasi-predictive short circuit protection and thermal protection |
JP4713347B2 (ja) * | 2006-01-13 | 2011-06-29 | 株式会社日立製作所 | 半導体素子の駆動回路 |
JP2008301617A (ja) | 2007-05-31 | 2008-12-11 | Toshiba Corp | 電力変換器の保護装置 |
JP2009225506A (ja) * | 2008-03-13 | 2009-10-01 | Toshiba Corp | 電力変換器 |
JP2010158109A (ja) * | 2008-12-26 | 2010-07-15 | Yazaki Corp | 負荷回路の保護装置 |
JP5840067B2 (ja) | 2012-04-27 | 2016-01-06 | 三菱電機株式会社 | 電力変換装置の電流検出装置、およびこの電流検出装置を備えた半導体モジュール |
GB2520961A (en) * | 2013-12-04 | 2015-06-10 | Eaton Ind Netherlands Bv | Automatic reclosing alternating current circuit breaker |
WO2016008594A1 (de) * | 2014-07-18 | 2016-01-21 | Technische Universität Braunschweig | Vorrichtung und verfahren zur strommessung |
JP6439597B2 (ja) * | 2015-06-09 | 2018-12-19 | 株式会社デンソー | 電力変換装置 |
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Patent Citations (5)
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JP3409620B2 (ja) * | 1997-01-31 | 2003-05-26 | 日産自動車株式会社 | スイッチング素子用駆動回路およびインバータ装置 |
WO2013094241A1 (ja) * | 2011-12-22 | 2013-06-27 | 三菱電機株式会社 | ゲート駆動回路 |
JP2015139271A (ja) * | 2014-01-22 | 2015-07-30 | 株式会社日立製作所 | 半導体駆動装置ならびにこれを用いた電力変換装置 |
WO2018193527A1 (ja) * | 2017-04-18 | 2018-10-25 | 三菱電機株式会社 | 過電流検出回路及び電力変換装置 |
WO2019225121A1 (ja) * | 2018-05-23 | 2019-11-28 | 三菱電機株式会社 | 電力用半導体素子の保護回路およびパワーモジュール |
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WO2021187437A1 (ja) | 2021-09-23 |
DE112021000078T5 (de) | 2022-04-14 |
CN114342233A (zh) | 2022-04-12 |
US20220179011A1 (en) | 2022-06-09 |
JP2021151038A (ja) | 2021-09-27 |
CN114342233B (zh) | 2024-12-10 |
US12105156B2 (en) | 2024-10-01 |
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