JP6275200B2 - Double-sided circuit board suitable for high-frequency circuits - Google Patents
Double-sided circuit board suitable for high-frequency circuits Download PDFInfo
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- JP6275200B2 JP6275200B2 JP2016119912A JP2016119912A JP6275200B2 JP 6275200 B2 JP6275200 B2 JP 6275200B2 JP 2016119912 A JP2016119912 A JP 2016119912A JP 2016119912 A JP2016119912 A JP 2016119912A JP 6275200 B2 JP6275200 B2 JP 6275200B2
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B13/00—Layered products comprising a a layer of water-setting substance, e.g. concrete, plaster, asbestos cement, or like builders' material
- B32B13/04—Layered products comprising a a layer of water-setting substance, e.g. concrete, plaster, asbestos cement, or like builders' material comprising such water setting substance as the main or only constituent of a layer, which is next to another layer of the same or of a different material
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
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Description
本発明は、高周波伝送特性及び銅箔と樹脂層との密着性に優れ、かつZ軸方向の線膨張率及び弾性率の低い高周波回路に適した両面回路用基板に関する。 The present invention relates to a double-sided circuit board that is excellent in high-frequency transmission characteristics and adhesion between a copper foil and a resin layer, and suitable for a high-frequency circuit having a low linear expansion coefficient and elastic modulus in the Z-axis direction.
一般的にプリント配線基板には、エポキシ樹脂やポリイミド樹脂が広く用いられているが、数十ギガヘルツレベルの高周波領域の用途で用いられるプリント配線基板には、誘電特性や吸湿性の観点から銅箔上にフッ素樹脂の絶縁層を形成した積層体が主に用いられている。 In general, epoxy resins and polyimide resins are widely used for printed wiring boards, but for printed wiring boards used for high frequency applications of several tens of gigahertz, copper foil is used from the viewpoint of dielectric properties and hygroscopicity. A laminate in which a fluororesin insulating layer is formed is mainly used.
一般にフッ素樹脂は金属との接着力が高くないため、接着性を向上させるために金属の表面を粗化させる必要がある。しかしながら、1ギガヘルツ以上の高周波になると信号は金属の表面を伝わりやすくなることが知られており(表皮効果)、伝送線路となる金属箔表面の凹凸が大きい場合、電気信号は導体の内部ではなく凹凸部の表面を迂回して伝わるため、伝送損失が大きくなるという問題が生じる。特許文献1の実施例には、表面粗度(Rz)が0.6〜0.7μmの金属箔を用いた積層体が例示されている。しかしながら高周波回路においては、例えば15ギガヘルツの場合、電気信号は金属表面から0.5μmの深さを伝わると言われており、更に周波数が高くなるにつれて、その深度は浅くなるため、このレベルの粗度では不十分である。 In general, since the fluororesin does not have high adhesive strength with a metal, it is necessary to roughen the surface of the metal in order to improve the adhesion. However, it is known that the signal easily propagates on the surface of the metal at a high frequency of 1 gigahertz or more (skin effect). When the unevenness of the surface of the metal foil that becomes the transmission line is large, the electric signal is not inside the conductor. Since it propagates around the surface of the uneven part, there arises a problem that transmission loss increases. Examples of Patent Document 1 illustrate a laminate using a metal foil having a surface roughness (Rz) of 0.6 to 0.7 μm. However, in a high-frequency circuit, for example, in the case of 15 GHz, it is said that an electric signal travels a depth of 0.5 μm from the metal surface, and as the frequency increases, the depth becomes shallower. The degree is not enough.
また、フッ素樹脂は一般的に線膨張率が100ppm/℃以上と高く、寸法安定性に問題がある。特許文献2及び3には、フッ素樹脂フィルムとガラスクロスを組み合わせる方法が記載されている。特許文献2では接着性を高めるために、接着剤付き銅箔が使用されているが、接着剤は一般的に誘電特性に劣るエポキシ樹脂であるため高周波用途には適していない。また特許文献3の実施例では三井金属株式会社製の3EC(厚さ18μm)という銅箔が使用されているが、この銅箔の表面粗度(Rz)は同社の技術資料によれば5μm以上であり、高周波領域での使用には適していない。特許文献4の実施例では表面粗度(Ra)が0.2μmの両面が粗化処理されていない銅箔が使用されているが、フッ素樹脂製の絶縁基板との接着のために、テトラフルオロエチレン−パーフルオロアルキルビニルエーテルと液晶ポリマー樹脂とのブレンド体の複合フィルムである接着用樹脂フィルムを使用している。 In addition, a fluororesin generally has a high coefficient of linear expansion of 100 ppm / ° C. or higher, and there is a problem in dimensional stability. Patent Documents 2 and 3 describe a method of combining a fluororesin film and a glass cloth. In Patent Document 2, a copper foil with an adhesive is used in order to improve the adhesiveness. However, since the adhesive is generally an epoxy resin having inferior dielectric properties, it is not suitable for high frequency applications. In the example of Patent Document 3, a copper foil 3EC (thickness 18 μm) manufactured by Mitsui Kinzoku Co., Ltd. is used. The surface roughness (Rz) of this copper foil is 5 μm or more according to the company's technical data. Therefore, it is not suitable for use in a high frequency region. In the example of Patent Document 4, a copper foil having a surface roughness (Ra) of 0.2 μm and not roughened on both sides is used, but for adhesion to an insulating substrate made of fluororesin, tetrafluoro is used. An adhesive resin film that is a composite film of a blend of ethylene-perfluoroalkyl vinyl ether and a liquid crystal polymer resin is used.
特許文献5には低粗度銅箔と特殊な表面処理を行ったフッ素樹脂フィルムとガラスクロスからなる銅張積層板の伝送損失が十分低いことが記載されているが、この構造の場合、XY方向の線膨張率は15ppm/℃前後と低いものの、Z軸方向の線膨張率は常温において250ppm/℃前後と非常に高い。この様なZ軸方向の線膨張率の高い基板の場合、基板の貫通孔にメッキを施し、基板の表面と裏面とを導通させた後、−45℃から125℃のヒートショック試験にかけると1000サイクル前後でスルーホールが破断する故障が発生する場合がある。またガラス補強材を用いた一般的な銅張積層板は、補強材の割合を増やせば増やすほど、誘電体層の弾性率が高くなる傾向がある。一方高周波基板においては、半導体チップを実装する際、誘電率の上昇を抑えるために誘電率の高いエポキシ樹脂を原料とするアンダーフィル材を使用しないことが一般的だが、基板の弾性率が高い場合においては、アンダーフィル材を使用しないと基板と半導体チップ間で発生する応力を十分緩和することが出来ず、半導体チップの破壊や脱落が問題となる。そこで高周波回路用基板においては弾性率の十分低い基板が求められている。 Patent Document 5 describes that the transmission loss of a copper-clad laminate composed of a low-roughness copper foil, a fluororesin film subjected to a special surface treatment, and a glass cloth is sufficiently low. In this structure, XY Although the linear expansion coefficient in the direction is as low as around 15 ppm / ° C., the linear expansion coefficient in the Z-axis direction is very high at around 250 ppm / ° C. at room temperature. In the case of such a substrate with a high coefficient of linear expansion in the Z-axis direction, if the through-hole of the substrate is plated and the front surface and the back surface of the substrate are made conductive, then a heat shock test from -45 ° C to 125 ° C is performed. There may be a failure that the through hole breaks around 1000 cycles. Moreover, the general copper clad laminated board using a glass reinforcing material has the tendency for the elasticity modulus of a dielectric material layer to become high, so that the ratio of a reinforcing material increases. On the other hand, when mounting a semiconductor chip on a high-frequency board, it is common not to use an underfill material made of an epoxy resin with a high dielectric constant to suppress an increase in dielectric constant, but when the elastic modulus of the board is high In this case, unless an underfill material is used, the stress generated between the substrate and the semiconductor chip cannot be sufficiently relaxed, and there is a problem that the semiconductor chip is broken or dropped off. Therefore, a substrate having a sufficiently low elastic modulus is required for a high-frequency circuit substrate.
本発明は、上記の点に鑑みてなされたものであり、高周波回路における電気信号の伝送損失を低減することができると同時に、表面粗度の低い銅箔とフッ素樹脂との密着性が高く、面方向のみならずZ軸方向の線膨張率が十分低く、更に弾性率も十分低い両面回路用基板を提供することを目的とするものである。 The present invention has been made in view of the above points, and can reduce electrical signal transmission loss in a high-frequency circuit, and at the same time has high adhesion between a copper foil having a low surface roughness and a fluororesin, An object of the present invention is to provide a substrate for a double-sided circuit that has a sufficiently low linear expansion coefficient in the Z-axis direction as well as a surface direction and a sufficiently low elasticity.
本発明者らは、銅箔、フッ素樹脂及びガラス不織布(ガラスペーパー)の積層体である両面回路用基板において、該銅箔のフッ素樹脂と接する面の二次元粗さRaが特定の値以下とし、かつ該フッ素樹脂の銅箔と接する面の酸素原子の存在割合が特定の値以上とすることにより、表面粗度の低い銅箔に対しても接着性が高く、その結果高周波数における伝送損失が低く、更に面方向に加えてZ軸方向の線膨張率も低く、弾性率も十分低い両面回路基板が得られることを見出し、本発明を完成した。 In the double-sided circuit board that is a laminate of copper foil, fluororesin, and glass nonwoven fabric (glass paper), the present inventors set the two-dimensional roughness Ra of the surface in contact with the fluororesin of the copper foil to a specific value or less. In addition, by making the presence ratio of oxygen atoms on the surface in contact with the copper foil of the fluororesin more than a specific value, the adhesiveness is high even for a copper foil having a low surface roughness, resulting in a transmission loss at a high frequency. It was found that a double-sided circuit board having a low linear expansion coefficient in the Z-axis direction in addition to the surface direction and having a sufficiently low elastic modulus was obtained.
即ち本発明は、
(1)二枚の銅箔と、該二枚の銅箔の間に設けた表面及び裏面がフッ素樹脂で覆われたガラス不織布からなる複合材料とを含む積層体である両面回路用基板であって、二枚の銅箔の複合材料と接する面の二次元粗さRaが0.2μm以下であり、かつ複合材料の銅箔と接する面のESCAで観察される酸素原子の存在割合が1.0%以上である、両面回路用基板、
(2)複合材料が、表面改質された複合材料である前項(1)に記載の両面回路用基板、
(3)二枚の銅箔と、該二枚の銅箔の間にn枚のフッ素樹脂からなるフィルム及びn−1枚のガラス不織布を交互に設けた交互層とを含む積層体である両面回路用基板であって、nが2乃至10の整数であり、二枚の銅箔のフッ素樹脂からなるフィルムと接する面の二次元粗さRaが0.2μm以下であり、かつフッ素樹脂からなるフィルムの銅箔と接する面のESCAで観察される酸素原子の存在割合が1.0%以上である、両面回路用基板、
(4)フッ素樹脂からなるフィルムが、銅箔と接する面が表面改質されたフィルムである前項(3)に記載の両面回路用基板、
(5)前項(1)乃至(4)のいずれかに記載の両面回路用基板であって、該両面回路用基板から二枚の銅箔を除いた絶縁体層におけるガラス不織布の含有量が10質量%以上である両面回路用基板、
(6)フッ素樹脂の成分がテトラフルオロエチレン・パーフルオロアルキルビニルエーテル共重合体(PFA)又はテトラフルオロエチレン・ヘキサフルオロプロピレン共重合体(FEP)である前項(1)乃至(5)のいずれかに記載の両面回路用基板、
(7)基板に対して90度方向への銅箔の引きはがし強さが0.8N/mm以上である前項(1)乃至(6)のいずれかに記載の両面回路用基板、
に関する。
That is, the present invention
(1) A double-sided circuit board, which is a laminate including two copper foils and a composite material made of a glass nonwoven fabric with a front surface and a back surface covered with a fluororesin provided between the two copper foils. The two-dimensional roughness Ra of the surface in contact with the composite material of the two copper foils is 0.2 μm or less, and the presence ratio of oxygen atoms observed by ESCA on the surface in contact with the copper foil of the composite material is 1. A double-sided circuit board that is 0% or more,
(2) The double-sided circuit board according to (1), wherein the composite material is a surface-modified composite material;
(3) Both surfaces which are laminated bodies including two copper foils and alternating layers in which n sheets of fluororesin and n-1 glass nonwoven fabrics are alternately provided between the two copper foils. A circuit board, wherein n is an integer of 2 to 10, the two-dimensional roughness Ra of the surface of the two copper foils in contact with the fluororesin film is 0.2 μm or less, and the fluororesin A substrate for a double-sided circuit, wherein the existence ratio of oxygen atoms observed by ESCA on the surface in contact with the copper foil of the film is 1.0% or more;
(4) The substrate for a double-sided circuit according to the above item (3), wherein the film made of the fluororesin is a film whose surface in contact with the copper foil is surface-modified.
(5) The double-sided circuit board according to any one of (1) to (4) above, wherein the content of the glass nonwoven fabric in the insulator layer obtained by removing two copper foils from the double-sided circuit board is 10 A substrate for a double-sided circuit that is at least mass%,
(6) Any of (1) to (5) above, wherein the component of the fluororesin is a tetrafluoroethylene / perfluoroalkyl vinyl ether copolymer (PFA) or a tetrafluoroethylene / hexafluoropropylene copolymer (FEP). The double-sided circuit board as described,
(7) The double-sided circuit board according to any one of (1) to (6), wherein the peel strength of the copper foil in the 90-degree direction with respect to the board is 0.8 N / mm or more,
About.
本発明の回路基板は表面粗度が極めて低い銅箔を用いているため、高周波帯においても伝送損失が極めて少なく、さらにフッ素樹脂フィルム層と金属との接着及び寸法安定性に優れる。 Since the circuit board of the present invention uses a copper foil having an extremely low surface roughness, the transmission loss is extremely small even in a high frequency band, and the adhesion between the fluororesin film layer and the metal and dimensional stability are excellent.
本発明の両面回路用基板に用いられる銅箔とは、フッ素樹脂と接する面の表面粗度(Ra)が0.2μm以下の範囲内にあることが好ましく、0.15μm以下の範囲内にあることがより好ましい。表面粗度が0.2μmを超えると伝送損失が大きくなり、両面回路用基板の実用性能を満足しないことがある。銅箔の種類には電解箔と圧延箔があるが、本発明の両面回路用基板にはどちらの銅箔も用いることができる。銅箔の厚さは好ましくは5乃至50μmであり、より好ましくは8乃至40μmである。 The copper foil used for the double-sided circuit board of the present invention preferably has a surface roughness (Ra) of the surface in contact with the fluororesin in the range of 0.2 μm or less, and in the range of 0.15 μm or less. It is more preferable. If the surface roughness exceeds 0.2 μm, the transmission loss increases, and the practical performance of the double-sided circuit board may not be satisfied. There are electrolytic foils and rolled foils as the types of copper foils, but both copper foils can be used for the double-sided circuit board of the present invention. The thickness of the copper foil is preferably 5 to 50 μm, more preferably 8 to 40 μm.
銅箔のフッ素樹脂と接する面は、未処理でも、表面処理を施されていてもよい。表面処理の具体例としては、例えばニッケル、鉄、亜鉛、金、銀、アルミニウム、クロム、チタン、パラジウムまたは錫より選ばれる1種以上の金属によるメッキ処理が挙げられ、ニッケル、鉄、亜鉛、金またはアルミニウムより選ばれる1種以上によるメッキ処理が好ましく、ニッケル又はアルミニウムによるメッキ処理がより好ましく、場合によりニッケル、鉄、亜鉛、金又は錫より選ばれる1種以上の金属メッキ処理が好ましい。、また未処理の銅箔表面もしくは前記の金属によってメッキ処理された銅箔表面に、シランカップリング剤などの薬剤で表面改質を処してもよい。 The surface of the copper foil in contact with the fluororesin may be untreated or surface-treated. Specific examples of the surface treatment include, for example, plating treatment with one or more metals selected from nickel, iron, zinc, gold, silver, aluminum, chromium, titanium, palladium, or tin. Nickel, iron, zinc, gold Or the plating process by 1 or more types chosen from aluminum is preferable, the plating process by nickel or aluminum is more preferable, and the 1 or more types of metal plating process chosen from nickel, iron, zinc, gold | metal | money, or tin in some cases is preferable. Alternatively, the surface of the copper foil that has not been treated or the surface of the copper foil that has been plated with the above metal may be subjected to surface modification with a chemical such as a silane coupling agent.
本発明の両面回路用基板に用いられるガラス不織布とは、ガラスの短繊維を少量のバインダー化合物(樹脂あるいは無機物)で固着したもの、あるいはバインダー化合物を使用せずにガラス短繊維を絡ませることによってその形状を維持しているもの、であり、市販のものが使用できる。ガラス短繊維の直径は好ましくは0.5乃至30μmであり、繊維長は好ましくは5乃至30mmである。バインダー化合物の具体例としては、エポキシ樹脂、アクリル樹脂、セルロース、ポリビニルアルコール、フッ素樹脂等の樹脂や、シリカ化合物等の無機物が挙げられる。バインダー化合物の使用量はガラス短繊維に対して通常3〜15質量%である。ガラス短繊維の材質としてはEガラス、Cガラス、Aガラス、Sガラス、Dガラス、NEガラス、低誘電率ガラスなどが挙げられる。ガラス不織布の厚さは通常50μm乃至1000μmであり、100μm乃至〜900μmであることが好ましい。尚、本願におけるガラス不織布の厚さは、JIS P8118:1998に準じ、(株)小野測器製のデジタルゲージDG−925(荷重110グラム、面径10mm)を用いて測定した値を意味する。フッ素樹脂との親和性を高めるために、ガラス不織布にシランカップリング剤処理を施してもよい。 The glass nonwoven fabric used for the double-sided circuit board of the present invention is obtained by fixing glass short fibers with a small amount of a binder compound (resin or inorganic material) or by entanglement of glass short fibers without using a binder compound. A commercially available product can be used. The diameter of the short glass fiber is preferably 0.5 to 30 μm, and the fiber length is preferably 5 to 30 mm. Specific examples of the binder compound include resins such as epoxy resin, acrylic resin, cellulose, polyvinyl alcohol, and fluorine resin, and inorganic substances such as silica compound. The usage-amount of a binder compound is 3-15 mass% normally with respect to a glass short fiber. Examples of the material for the short glass fiber include E glass, C glass, A glass, S glass, D glass, NE glass, and low dielectric constant glass. The thickness of the glass nonwoven fabric is usually 50 μm to 1000 μm, preferably 100 μm to 900 μm. In addition, the thickness of the glass nonwoven fabric in this application means the value measured using digital gauge DG-925 (load 110 grams, surface diameter 10mm) by Ono Sokki Co., Ltd. according to JISP8118: 1998. In order to increase the affinity with the fluororesin, the glass nonwoven fabric may be treated with a silane coupling agent.
ガラス不織布の多くは空隙率が80%以上と非常に高いので、後述するフッ素樹脂からなるフィルムより厚いものを使用し、圧力によって圧縮して用いることが好ましい。 Since most of the glass nonwoven fabrics have a very high porosity of 80% or more, it is preferable to use a material thicker than a film made of a fluororesin described later and compress it with pressure.
フッ素樹脂としては、ポリテトラフルオロエチレン〔PTFE〕、ポリクロロトリフルオロエチレン〔PCTFE〕、エチレン−TFE共重合体〔ETFE〕、エチレン−クロロトリフルオロエチレン〔ECTFE〕共重合体、CTFE−TFE共重合体、TFE−HFP共重合体〔FEP〕、TFE−PAVE共重合体〔PFA〕、及び、ポリビニリデンフルオライド〔PVdF〕からなる群より選択される少なくとも1種であることが好ましく、電気特性(誘電率・誘電正接)や耐熱性などの観点から、PFA及び/又はFEPであることがより好ましく、PFAであることが更に好ましい。 Examples of fluororesins include polytetrafluoroethylene [PTFE], polychlorotrifluoroethylene [PCTFE], ethylene-TFE copolymer [ETFE], ethylene-chlorotrifluoroethylene [ECTFE] copolymer, and CTFE-TFE copolymer. Preferably, it is at least one selected from the group consisting of a polymer, a TFE-HFP copolymer [FEP], a TFE-PAVE copolymer [PFA], and a polyvinylidene fluoride [PVdF]. From the viewpoint of dielectric constant / dielectric loss tangent) and heat resistance, PFA and / or FEP are more preferable, and PFA is more preferable.
PFAは、TFEに基づく重合単位(TFE単位)、及び、PAVEに基づく重合単位(PAVE単位)を含む共重合体である。
上記PFAにおいて、PAVEは特に限定されず、例えば、下記一般式(1):
CF2=CF−ORf1 (1)
で表されるパーフルオロ不飽和化合物が挙げられる。式中、Rf1は、パーフルオロ有機基を表す。
PFA is a copolymer including polymerized units based on TFE (TFE units) and polymerized units based on PAVE (PAVE units).
In the PFA, PAVE is not particularly limited, and for example, the following general formula (1):
CF 2 = CF-ORf 1 (1)
The perfluoro unsaturated compound represented by these is mentioned. In the formula, Rf 1 represents a perfluoro organic group.
尚、本明細書において、「パーフルオロ有機基」とは、炭素原子に結合する水素原子の全てがフッ素原子に置換された有機基を意味すし、パーフルオロ有機基はエーテル結合性の酸素原子を有していてもよい。 In the present specification, the “perfluoro organic group” means an organic group in which all of the hydrogen atoms bonded to the carbon atom are substituted with fluorine atoms, and the perfluoro organic group is an ether-bonded oxygen atom. You may have.
上記PAVEとしては、例えば、上記一般式(1)において、Rf1が炭素数1乃至10のパーフルオロアルキル基であるものが好ましく、炭素数が1乃至5のパーフルオロアルキル基であるものがより好ましい。 As the PAVE, for example, in the general formula (1), Rf 1 is preferably a perfluoroalkyl group having 1 to 10 carbon atoms, more preferably a perfluoroalkyl group having 1 to 5 carbon atoms. preferable.
上記PAVEとしては、パーフルオロ(メチルビニルエーテル)〔PMVE〕、パーフルオロ(エチルビニルエーテル)〔PEVE〕、パーフルオロ(プロピルビニルエーテル)〔PPVE〕、及び、パーフルオロ(ブチルビニルエーテル)からなる群より選択される少なくとも1種であることがより好ましく、PMVE、PEVE及びPPVEからなる群より選択される少なくとも1種であることが更に好ましく、耐熱性に優れる点でPPVEであることが特に好ましい。 The PAVE is selected from the group consisting of perfluoro (methyl vinyl ether) [PMVE], perfluoro (ethyl vinyl ether) [PEVE], perfluoro (propyl vinyl ether) [PPVE], and perfluoro (butyl vinyl ether). It is more preferably at least one, more preferably at least one selected from the group consisting of PMVE, PEVE and PPVE, and particularly preferably PPVE in terms of excellent heat resistance.
上記PFAは、PAVE単位が1乃至10モル%であるものが好ましく、3乃至6モル%であるものがより好ましい。また、上記PFAは、全重合単位に対して、TFE単位及びPAVE単位が合計で90乃至100モル%であることが好ましい。 The PFA preferably has 1 to 10 mol% of PAVE units, and more preferably 3 to 6 mol%. The PFA preferably has a total of 90 to 100 mol% of TFE units and PAVE units with respect to all polymerized units.
上記PFAは、TFE単位、PAVE単位、並びに、TFE及びPAVEと共重合可能な単量体に基づく重合単位を含む共重合体であってもよい。TFE及びPAVEと共重合可能な単量体としては、ヘキサフルオロプロピレン、CX1X2=CX3(CF2)nX4(式中、X1、X2及びX3は同一であっても異なってもよく、水素原子又はフッ素原子を表す。X4は水素原子、フッ素原子又は塩素原子を表す。nは2乃至10の整数を表す。)で表されるビニル単量体、CF2=CF−OCH2−Rf2(式中、Rf2は炭素数1乃至5のパーフルオロアルキル基を表す。)で表されるアルキルパーフルオロビニルエーテル誘導体からなる群より選択される少なくとも1種が好ましい。 The PFA may be a copolymer including TFE units, PAVE units, and polymerized units based on monomers copolymerizable with TFE and PAVE. As monomers copolymerizable with TFE and PAVE, hexafluoropropylene, CX 1 X 2 = CX 3 (CF 2 ) nX 4 (wherein X 1 , X 2 and X 3 are the same or different) And represents a hydrogen atom or a fluorine atom, X 4 represents a hydrogen atom, a fluorine atom or a chlorine atom, n represents an integer of 2 to 10, and CF 2 = CF At least one selected from the group consisting of alkyl perfluorovinyl ether derivatives represented by —OCH 2 —Rf 2 (wherein Rf 2 represents a perfluoroalkyl group having 1 to 5 carbon atoms) is preferable.
上記アルキルパーフルオロビニルエーテル誘導体としては、Rf2が炭素数1乃至3のパーフルオロアルキル基であるものが好ましく、CF2=CF−OCH2−CF2CF3がより好ましい。 As the alkyl perfluorovinyl ether derivative, those in which Rf 2 is a perfluoroalkyl group having 1 to 3 carbon atoms are preferable, and CF 2 ═CF—OCH 2 —CF 2 CF 3 is more preferable.
PFAが、TFE及びPAVEと共重合可能な単量体に基づく重合単位を有するものである場合、PFAは、TFE及びPAVEと共重合可能な単量体に由来する単量体単位が0乃至10モル%であり、TFE単位及びPAVE単位が合計で90乃至100モル%であることが好ましい。より好ましくは、TFE及びPAVEと共重合可能な単量体に由来する単量体単位が0.1乃至10モル%であり、TFE単位及びPAVE単位が合計で90乃至99.9モル%である。 When PFA has polymerized units based on monomers copolymerizable with TFE and PAVE, PFA has 0 to 10 monomer units derived from monomers copolymerizable with TFE and PAVE. Preferably, the total amount of TFE units and PAVE units is 90 to 100 mol%. More preferably, the monomer units derived from monomers copolymerizable with TFE and PAVE are 0.1 to 10 mol%, and the total of TFE units and PAVE units is 90 to 99.9 mol%. .
FEPは、テトラフルオロエチレンに基づく重合単位(TFE単位)、及びヘキサフルオロプロピレンに基づく重合単位(HFP単位)を含む共重合体である。 FEP is a copolymer containing polymerized units based on tetrafluoroethylene (TFE units) and polymerized units based on hexafluoropropylene (HFP units).
FEPとしては、特に限定されないが、TFE単位とHFP単位とのモル比(TFE単位/HFP単位)が70乃至99/30乃至1である共重合体が好ましく、80乃至97/20乃至3である共重合体がより好ましい。TFE単位が少なすぎると機械物性が低下する傾向があり、多すぎると融点が高くなりすぎ成形性が低下する傾向がある。 The FEP is not particularly limited, but is preferably a copolymer having a molar ratio of TFE units to HFP units (TFE units / HFP units) of 70 to 99/30 to 1, preferably 80 to 97/20 to 3. A copolymer is more preferred. When there are too few TFE units, there exists a tendency for a mechanical physical property to fall, and when too much, melting | fusing point becomes high too much and there exists a tendency for a moldability to fall.
FEPは、TFE及びHFPと共重合可能な単量体に由来する単量体単位が0.1乃至10モル%であり、TFE単位及びHFP単位が合計で90乃至99.9モル%である共重合体であることも好ましい。TFE及びHFPと共重合可能な単量体としては、PAVE、アルキルパーフルオロビニルエーテル誘導体等が挙げられる。 FEP has a monomer unit derived from a monomer copolymerizable with TFE and HFP in an amount of 0.1 to 10 mol%, and a total of 90 to 99.9 mol% of TFE units and HFP units. A polymer is also preferred. Examples of monomers copolymerizable with TFE and HFP include PAVE and alkyl perfluorovinyl ether derivatives.
上述した共重合体の各単量体の含有量は、NMR、FT−IR、元素分析、蛍光X線分析を単量体の種類によって適宜組み合わせることで算出できる。
上記フッ素樹脂は、メルトフローレート(MFR)が1.0g/10分以上であることが好ましく、2.5g/10分以上であることがより好ましく、10g/10分以上であることが更に好ましい。MFRの上限は、例えば、100g/10分である。
上記MFRは、ASTM D3307に準拠して、温度372℃、荷重5.0kgの条件下で測定し得られる値である。
The content of each monomer of the copolymer described above can be calculated by appropriately combining NMR, FT-IR, elemental analysis, and fluorescent X-ray analysis depending on the type of monomer.
The fluororesin preferably has a melt flow rate (MFR) of 1.0 g / 10 min or more, more preferably 2.5 g / 10 min or more, and further preferably 10 g / 10 min or more. . The upper limit of MFR is, for example, 100 g / 10 minutes.
The MFR is a value that can be measured under conditions of a temperature of 372 ° C. and a load of 5.0 kg in accordance with ASTM D3307.
フッ素樹脂の融点は、320℃以下であることが好ましく、310℃以下であることがより好ましい。融点は、耐熱性および両面基盤を作製する上での加工性も鑑みると260℃以上が好ましく、265℃以上がより好ましい。 The melting point of the fluororesin is preferably 320 ° C. or lower, and more preferably 310 ° C. or lower. The melting point is preferably 260 ° C. or higher and more preferably 265 ° C. or higher in view of heat resistance and workability in producing a double-sided substrate.
上記融点は、DSC(示差走査熱量測定)装置を用い、10℃/分の速度で昇温したときの融解ピークに対応する温度である。 The melting point is a temperature corresponding to a melting peak when the temperature is raised at a rate of 10 ° C./min using a DSC (Differential Scanning Calorimetry) apparatus.
フッ素樹脂の材料形態としてフィルムを用いる場合は、上記溶融加工可能なフッ素樹脂又は該フッ素樹脂を含む組成物を、溶融押出し成形法、溶媒キャスト法又はスプレー法等の公知の方法で成型することにより得られる。フッ素樹脂からなるフィルム1枚の厚さは好ましくは10乃至100μmであり、より好ましくは20乃至80μmである。 When a film is used as the material form of the fluororesin, the melt-processable fluororesin or a composition containing the fluororesin is molded by a known method such as a melt extrusion molding method, a solvent casting method, or a spray method. can get. The thickness of one film made of a fluororesin is preferably 10 to 100 μm, more preferably 20 to 80 μm.
本発明の両面回路用基板に用いられる複合材料としては、表面及び裏面がフッ素樹脂で覆われたガラス不織布を用いることができる。フッ素樹脂とガラス不織布から複合材料を得る方法としては、例えば、
I.あらかじめ成形され表面処理がなされたフッ素樹脂のフィルムとガラス不織布を加熱下で圧着する方法、
II.ダイスなどから押し出されたフッ素樹脂の溶融物とガラス不織布と加熱下で複合化及び成型する方法、
等が挙げられるが、生産性を考慮した場合、Iの方法が好ましい。
As the composite material used for the double-sided circuit board of the present invention, a glass nonwoven fabric whose front and back surfaces are covered with a fluororesin can be used. As a method of obtaining a composite material from a fluororesin and a glass nonwoven fabric, for example,
I. A method in which a fluororesin film and a glass nonwoven fabric that have been pre-formed and surface-treated are pressure-bonded under heating,
II. A method of compounding and molding under heat with a fluororesin melt extruded from a die or the like and a glass nonwoven fabric,
In view of productivity, the method I is preferable.
加熱下で圧着(熱圧着)する場合は、通常250〜400℃の範囲内で、1〜20分間、0.1〜10メガパスカルの圧力で行うことが出来る。熱圧着温度に関しては、高温になると樹脂のしみ出しや、厚みの不均一化が起こる懸念があり、350℃未満であることが好ましく、340℃以下であることがより好ましい。熱圧着はプレス機を用いてバッチ式に行うこともでき、また高温ラミネーターを用いて連続的に行うこともできる。プレス機を用いる場合は空気の挟み込みを防ぎ、フッ素樹脂のガラス不織布内への含浸性を高めるために、真空プレス機を用いることが好ましい。フッ素樹脂のガラス不織布への含浸性が低い場合は、スルーホールを形成する際、メッキ液がガラスクロス内に浸透し、スルーホール間にショートを生ぜしめるといった問題が発生し易い。ただし、本明細書では、フッ素樹脂からなるフィルムが、ガラス不織布に対し、十分に含浸している、十分に含浸していないにかかわらず、フッ素樹脂フィルム及びガラス不織布から構成される交互層を、複合材料の一形態とする。 In the case of pressure bonding under heat (thermocompression bonding), the pressure can be usually within a range of 250 to 400 ° C. for 1 to 20 minutes at a pressure of 0.1 to 10 megapascals. Regarding the thermocompression bonding temperature, there is a concern that the resin may ooze out or the thickness may become non-uniform at a high temperature, and is preferably less than 350 ° C., more preferably 340 ° C. or less. Thermocompression bonding can be performed batch-wise using a press machine, or can be performed continuously using a high-temperature laminator. In the case of using a press machine, it is preferable to use a vacuum press machine in order to prevent air from being caught and to improve the impregnation property of the fluororesin into the glass nonwoven fabric. When the impregnation property of the fluororesin into the glass nonwoven fabric is low, the problem that the plating solution permeates into the glass cloth and forms a short between the through holes when the through holes are formed is likely to occur. However, in this specification, the film made of a fluororesin is sufficiently impregnated with respect to the glass nonwoven fabric, regardless of whether it is not sufficiently impregnated, an alternating layer composed of the fluororesin film and the glass nonwoven fabric, One form of the composite material is used.
本発明の両面回路用基板に用いられる複合材料及びフッ素樹脂からなるフィルムにおける、銅箔と接する表面のESCAで観測した酸素原子の存在割合が1.0%以上であることを特徴とする。銅箔と接する表面のESCAで観察した酸素原子の存在割合は1.2%以上が好ましく、1.8%以上がより好ましく、2.5%以上が更に好ましい。上限に関しては特に規定はないが、生産性やその他の物性への影響を鑑みると、15%以下であることが好ましい。銅箔と接する表面のESCAで観測した窒素原子の存在割合は特に規定されないが、0.1%以上あることが好ましい。 In the film made of the composite material and the fluororesin used for the double-sided circuit board of the present invention, the oxygen atom existence ratio observed by ESCA on the surface in contact with the copper foil is 1.0% or more. The proportion of oxygen atoms observed by ESCA on the surface in contact with the copper foil is preferably 1.2% or more, more preferably 1.8% or more, and even more preferably 2.5% or more. The upper limit is not particularly specified, but it is preferably 15% or less in view of the influence on productivity and other physical properties. The proportion of nitrogen atoms observed by ESCA on the surface in contact with the copper foil is not particularly defined, but is preferably 0.1% or more.
銅箔と接する表面のESCAで観測した酸素原子の存在割合を1.0%以上とするためには、複合材料の表面(のフッ素樹脂面)及びフッ素樹脂からなるフィルムの表面の改質が必要である。尚、複合材料の場合は、予め表面改質したフッ素樹脂からなるフィルムを、上記の方法によりガラス不織布と圧着して表面が改質された複合材料を得ることもできる。 Modification of the surface of the composite material (the surface of the fluororesin) and the surface of the film made of the fluororesin is necessary in order to make the oxygen atom existing ratio observed by ESCA on the surface in contact with the copper foil 1.0% or more. It is. In the case of a composite material, a film made of a fluororesin whose surface has been modified in advance can be pressure-bonded to a glass nonwoven fabric by the above method to obtain a composite material whose surface has been modified.
表面改質は、従来公知のコロナ放電処理やグロー放電処理、プラズマ放電処理、スパッタリング処理などによる放電処理が採用できる。例えば、放電雰囲気中に酸素ガス、窒素ガス、水素ガスなどを導入することで表面自由エネルギーをコントロールできる他、有機化合物が含まれている不活性ガス(たとえば窒素ガス、ヘリウムガス、アルゴンガスなど)雰囲気に改質すべき表面を曝し、電極間に高周波電圧をかけることにより放電を起こさせ、これにより表面に活性種を生成し、ついで有機化合物の官能基を導入もしくは重合性有機化合物をグラフト重合することによって表面改質を行うことができる。 For the surface modification, a conventionally known discharge treatment such as corona discharge treatment, glow discharge treatment, plasma discharge treatment, or sputtering treatment can be employed. For example, surface free energy can be controlled by introducing oxygen gas, nitrogen gas, hydrogen gas, etc. into the discharge atmosphere, and inert gas containing organic compounds (eg nitrogen gas, helium gas, argon gas, etc.) The surface to be modified is exposed to the atmosphere, and a high frequency voltage is applied between the electrodes to cause discharge, thereby generating active species on the surface, and then introducing a functional group of the organic compound or graft polymerization of the polymerizable organic compound. Thus, surface modification can be performed.
ここで用いられる有機化合物としては酸素原子を含有する重合性または非重合性有機化合物であり、たとえば酢酸ビニル、ギ酸ビニルなどのビニルエステル類;グリシジルメタクリレートなどのアクリル酸エステル類;ビニルエチルエーテル、ビニルメチルエーテル、グリシジルメチルエーテルなどのエーテル類;酢酸、ギ酸などのカルボン酸類;メチルアルコール、エチルアルコール、フェノール、エチレングリコールなどのアルコール類;アセトン、メチルエチルケトンなどのケトン類;酢酸エチル、ギ酸エチルなどのカルボン酸エステル類;アクリル酸、メタクリル酸などのアクリル酸類などがあげられる。これらのうち改質された表面が失活しにくい(寿命が長い)点、安全性の面で取扱いが容易な点から、ビニルエステル類、アクリル酸エステル類、ケトン類が好ましく、特に酢酸ビニル、グリシジルメタクリレートが好ましい。 The organic compound used here is a polymerizable or non-polymerizable organic compound containing an oxygen atom. For example, vinyl esters such as vinyl acetate and vinyl formate; acrylic acid esters such as glycidyl methacrylate; vinyl ethyl ether and vinyl Ethers such as methyl ether and glycidyl methyl ether; Carboxylic acids such as acetic acid and formic acid; Alcohols such as methyl alcohol, ethyl alcohol, phenol and ethylene glycol; Ketones such as acetone and methyl ethyl ketone; Carboxes such as ethyl acetate and ethyl formate Acid esters; acrylic acids such as acrylic acid and methacrylic acid; Of these, vinyl esters, acrylate esters, and ketones are preferred from the viewpoint that the modified surface is not easily deactivated (long life) and easy in terms of safety, and particularly vinyl acetate, Glycidyl methacrylate is preferred.
有機化合物の濃度はその表面改質されるフッ素樹脂や有機化合物の種類等によって異なるが、通常0.1乃至3.0容量%、好ましくは0.1乃至1.0容量%である。放電条件は目的とする表面改質の度合い、フッ素樹脂の種類、有機化合物の種類や濃度などによって適宜選定すればよいが、通常、荷電密度が0.3乃至9.0W・sec/cm2、好ましくは0.3乃至3.0W・sec/cm2の範囲で放電処理する。処理温度は0乃至100℃の範囲の任意の温度で行なうことができる。 The concentration of the organic compound varies depending on the fluorine resin to be surface-modified, the kind of the organic compound, and the like, but is usually 0.1 to 3.0% by volume, preferably 0.1 to 1.0% by volume. The discharge conditions may be appropriately selected depending on the desired degree of surface modification, the type of fluororesin, the type and concentration of the organic compound, etc. Usually, the charge density is 0.3 to 9.0 W · sec / cm 2 , The discharge treatment is preferably performed in the range of 0.3 to 3.0 W · sec / cm 2 . The treatment temperature can be any temperature in the range of 0 to 100 ° C.
次に本発明の両面回路用基板を作製する方法を説明する。 Next, a method for producing the double-sided circuit board of the present invention will be described.
本発明の両面回路用基板を得る方法としては、例えば
A法;二枚の銅箔と前記の複合材料を、二次元粗さが0.2μm以下である銅箔面が複合材料と対向する様に銅箔−複合材料−銅箔をこの順番で重ね合せて積層体を形成した後に加熱下で圧着する方法、
B法;n枚のフッ素樹脂からなるフィルム及びn−1枚のガラス不織布を交互に重ね合せてフッ素樹脂からなるフィルムとガラス不織布の交互層を得た後、該積層体の最上層フッ素樹脂からなるフィルムの上及び最下層のフッ素樹脂からなるフィルムの下に、二次元粗さが0.2μm以下である銅箔面がフッ素樹脂からなるフィルムと対向する様にそれどれ銅箔を設け、積層体を形成した後に加熱下で圧着する方法、等が挙げられる。
As a method for obtaining the double-sided circuit board of the present invention, for example, method A; two copper foils and the above composite material are used, and a copper foil surface having a two-dimensional roughness of 0.2 μm or less is opposed to the composite material. A method in which a copper foil-composite material-copper foil is laminated in this order to form a laminate, followed by pressure bonding under heating,
Method B: After alternately laminating n sheets of fluororesin and n-1 glass nonwoven fabrics to obtain alternating layers of fluororesin films and glass nonwoven fabrics, from the top layer fluororesin of the laminate Laminate and laminate the copper foil on the top and bottom layers of the fluororesin film so that the copper foil surface with a two-dimensional roughness of 0.2 μm or less faces the fluororesin film. Examples of the method include a method of performing pressure bonding under heating after forming a body.
前記のA法は一枚の複合材料を用いた最も単純な調製方法であるが、二枚の銅箔の間に複数枚の複合材料を用いて両面回路用基板を調製してもよい。複数の複合材料を用いる場合は複合材料の銅箔と接する面のESCAで観察した酸素原子の存在割合が1.0%以上でありさえすれば、他の複合材材料と接する面のESCAで観察した酸素原子の存在割合は1.0%未満であっても構わない。 The method A is the simplest preparation method using a single composite material, but a double-sided circuit board may be prepared using a plurality of composite materials between two copper foils. In the case of using a plurality of composite materials, as long as the oxygen atom existence ratio observed by ESCA on the surface in contact with the copper foil of the composite material is 1.0% or more, the surface is inspected by ESCA on the surface in contact with another composite material. The existing proportion of oxygen atoms may be less than 1.0%.
尚、前記のA法は両面のみに銅箔を設けた両面回路基板の調製方法であるが、三枚以上の銅箔を用いて得られる三層以上の多層基板や、両面に銅箔を有する二層基板の銅箔上に、更にフッ素樹脂層(及びガラス不織布)を積層した構成の回路用基板も本発明の両面回路用基板の範疇に含まれる。 In addition, although said A method is a preparation method of the double-sided circuit board which provided the copper foil only on both surfaces, it has a multilayered board of three or more layers obtained using three or more copper foils, and a copper foil on both surfaces A circuit board having a structure in which a fluororesin layer (and a glass nonwoven fabric) is further laminated on the copper foil of the two-layer board is also included in the category of the double-sided circuit board of the present invention.
前記のB法をより具体的に説明すると、例えば二枚のフッ素樹脂からなるフィルム及び一枚のガラス不織布を用いて両面回路用基板を調製する場合は、銅箔の二次元粗さが0.2μm以下である面とフッ素樹脂からなるフィルムのESCAで観察した酸素原子の存在割合が1.0%以上である面とが対向する様に銅箔−フッ素樹脂からなるフィルム−ガラス不織布−フッ素樹脂からなるフィルム−銅箔をこの順番で重ね合せた後に加熱下で圧着する方法である。この場合、フッ素樹脂フィルムのガラス不織布と対向する面のESCAで観察した酸素原子の存在割合は1.0%未満であっても構わない。また、例えば三枚のフッ素樹脂からなるフィルム及び二枚のガラス不織布を用いて両面回路用基板を調製する場合は、銅箔の二次元粗さが0.2μm以下である面とフッ素樹脂からなるフィルムのESCAで観察した酸素原子の存在割合が1.0%以上である面とが対向する様に、銅箔−フッ素樹脂からなるフィルム−ガラス不織布−フッ素樹脂からなるフィルム−ガラス不織布−フッ素樹脂からなるフィルム−銅箔をこの順番で重ね合せた後に加熱下で圧着する方法である。 The B method will be described more specifically. For example, when a double-sided circuit board is prepared using two fluororesin films and one glass nonwoven fabric, the two-dimensional roughness of the copper foil is 0.00. Copper foil-film made of fluororesin-glass nonwoven fabric-fluororesin so that the surface of 2 μm or less and the surface of the film made of fluororesin observed by ESCA have a proportion of oxygen atoms of 1.0% or more After the film-copper foil consisting of the above is superposed in this order, it is pressure-bonded under heating. In this case, the proportion of oxygen atoms observed by ESCA on the surface facing the glass nonwoven fabric of the fluororesin film may be less than 1.0%. For example, when a double-sided circuit board is prepared using a film made of three fluororesins and two glass nonwoven fabrics, the copper foil has a surface having a two-dimensional roughness of 0.2 μm or less and a fluororesin. Copper foil-film made of fluororesin-glass nonwoven fabric-film made of fluororesin-glass nonwoven fabric-fluororesin so that the surface of the film observed with ESCA has an oxygen atom content of 1.0% or more. After the film-copper foil consisting of the above is superposed in this order, it is pressure-bonded under heating.
尚、前記のB法は両面に銅箔を設けた両面回路基板の調製方法であるが、両面に銅箔を有する二層基板の銅箔上に、更にフッ素樹脂層(及びガラス不織布)を積層した回路用基板や、n枚のフッ素樹脂からなるフィルム及びn−1枚のガラス不織布を介して銅箔を積層した構成の多層基板も本発明の両面回路用基板の範疇に含まれる。 The above-mentioned method B is a method for preparing a double-sided circuit board provided with copper foil on both sides, and a fluororesin layer (and glass nonwoven fabric) is further laminated on the copper foil of a two-layer board having copper foil on both sides. The multilayer circuit board of the structure which laminated | stacked copper foil through the film board | substrate which carried out, the film which consists of n sheets of fluororesin, and the n-1 glass nonwoven fabric is also contained in the category of the board | substrate for double-sided circuits of this invention.
前記のA法及びB法における熱圧着は、複合材料を得る方法の部分に記載した熱圧着の諸条件に準じた方法で行えばよい。 The thermocompression bonding in the A method and the B method may be performed by a method according to the thermocompression bonding conditions described in the method for obtaining a composite material.
上記の表面処理を行ったフッ素樹脂からなるフィルムは、単体では表面粗度が0.2μm以下の銅箔に対して十分な接着強度は持ちえず、熱圧着時に銅箔から染み出し、厚みの均一化も図れないが、ガラス不織布を併用することにより、或いはガラス不織布との複合材料とすることにより、線膨張率が十分下がり、さらに樹脂の染み出しも低減し、表面粗度Raが0.2μm以下である銅箔に対しても高い接着性を発現する。 The film made of a fluororesin that has been subjected to the above surface treatment cannot have a sufficient adhesive strength with respect to a copper foil having a surface roughness of 0.2 μm or less by itself, and it exudes from the copper foil at the time of thermocompression bonding. Although uniformization cannot be achieved, by using a glass nonwoven fabric in combination or by using a composite material with a glass nonwoven fabric, the linear expansion coefficient is sufficiently lowered, and the resin exudation is reduced, and the surface roughness Ra is 0. High adhesiveness is expressed even for copper foil of 2 μm or less.
本発明の両面回路用基板に用いられるフッ素樹脂からなるフィルムの枚数nは通常2乃至10の整数であり、2乃至8の整数であることが好ましく、2乃至6の整数であることがより好ましい。フッ素樹脂フィルムの厚さやガラス不織布の種類や厚さ、及びnの値を変えることによって本発明の誘電体層のXY方向の線膨張率を変えることが出来るが、線膨張率の値は5乃至50ppm/℃の範囲内が好ましく、10乃至40ppm/℃の範囲内がより好ましい。誘電体層の線膨張率が50ppm/℃を超えると銅箔と誘電体層との密着性が低くなり、また銅箔エッチング後に基板の反りや波打ちなどの不具合を生じやすくなる。 The number n of films made of fluororesin used for the double-sided circuit board of the present invention is usually an integer of 2 to 10, preferably an integer of 2 to 8, and more preferably an integer of 2 to 6. . The linear expansion coefficient in the XY direction of the dielectric layer of the present invention can be changed by changing the thickness of the fluororesin film, the type and thickness of the glass nonwoven fabric, and the value of n. It is preferably in the range of 50 ppm / ° C., more preferably in the range of 10 to 40 ppm / ° C. When the linear expansion coefficient of the dielectric layer exceeds 50 ppm / ° C., the adhesion between the copper foil and the dielectric layer is lowered, and problems such as warping and undulation of the substrate are likely to occur after the copper foil etching.
本発明の両面回路用基板から銅箔を除いた絶縁体層の弾性率は、常温において5GPa以下が好ましく、4GPa以下がより好ましい。高周波基板では誘電特性の悪化を防ぐために、半導体チップと基板の間に応力緩和剤であるアンダーフィルを加えないことが多いが、そのような場合、基板の弾性率が5GPaを超えると、基板上に発生する応力を十分緩和することができず、半導体チップに損傷を及ぼす可能性が高い。
本発明の両面回路用基板から銅箔を除いた絶縁体層におけるガラス不織布の含有量は通常10乃至90質量%、好ましくは15乃至85質量%である。
The elastic modulus of the insulator layer excluding the copper foil from the double-sided circuit board of the present invention is preferably 5 GPa or less at room temperature, more preferably 4 GPa or less. In order to prevent deterioration of dielectric characteristics in a high-frequency substrate, an underfill that is a stress relaxation agent is often not added between the semiconductor chip and the substrate. In such a case, if the elastic modulus of the substrate exceeds 5 GPa, The stress generated in the semiconductor chip cannot be sufficiently relaxed, and the semiconductor chip is likely to be damaged.
The content of the glass nonwoven fabric in the insulator layer excluding the copper foil from the double-sided circuit board of the present invention is usually 10 to 90% by mass, preferably 15 to 85% by mass.
本発明において高周波回路とは、単に高周波信号のみを伝送する回路からなるものだけでなく、高周波信号を低周波信号に変換して、生成された低周波信号を外部へ出力する伝送路や、高周波対応部品の駆動のために供給される電源を供給するための伝送路等、高周波信号ではない信号を伝送する伝送路も同一平面上に併設された回路も含まれる。 In the present invention, the high-frequency circuit is not only a circuit that transmits only a high-frequency signal, but also a transmission path that converts a high-frequency signal into a low-frequency signal and outputs the generated low-frequency signal to the outside, or a high-frequency circuit. A transmission path for transmitting a signal that is not a high-frequency signal, such as a transmission path for supplying power to drive the corresponding component, is also included.
以下、実施例及び比較例に基づいて本発明をより具体的に説明するが、本発明は以下の実施例に限定されるものではない。尚、実施例における測定及び評価は以下に記載の装置及び方法で行った。 EXAMPLES Hereinafter, although this invention is demonstrated more concretely based on an Example and a comparative example, this invention is not limited to a following example. In addition, the measurement and evaluation in an Example were performed with the apparatus and method as described below.
(銅箔表面の二次元粗さRa)
(株)小坂研究所製のSE−500を用い、触針法で測定した。
(Two-dimensional roughness Ra of the copper foil surface)
Measurement was performed by a stylus method using SE-500 manufactured by Kosaka Laboratory.
(フッ素樹脂表面のESCA分析)
X線光電子分光装置((株)島津製作所製のESCA−750)により測定した。
(ESCA analysis of fluororesin surface)
It was measured with an X-ray photoelectron spectrometer (ESCA-750 manufactured by Shimadzu Corporation).
(銅箔とフッ素樹脂間の接着強度)
JIS C5016−1994に準拠して、毎分50mmの速度で銅箔を銅箔除去面に対して90°の方向に引きはがしながら、引っ張り試験機により、銅箔の引きはがし強さを測定し、得られた値を接着強度とした。
(Adhesive strength between copper foil and fluororesin)
In accordance with JIS C5016-1994, the peel strength of the copper foil was measured by a tensile tester while peeling the copper foil at a rate of 50 mm per minute in the direction of 90 ° with respect to the copper foil removal surface. The obtained value was defined as the adhesive strength.
(絶縁体層の弾性率)
作製した両面基板の銅箔をエッチングした後、引張試験機((株)島津製作所製AGS−X)により測定した。
(Elastic modulus of insulator layer)
After etching the copper foil of the produced double-sided substrate, it was measured with a tensile tester (AGS-X manufactured by Shimadzu Corporation).
(両面回路用基板の誘電率、誘電正接)
作製した両面基板の銅箔をエッチングした後、空洞共振器(関東電子応用開発株式会社製)により1GHzにて測定し、ネットワークアナライザー(アジレントテクノロジー株式会社製、型式8719ET)にて解析した。
(Dielectric constant, dielectric loss tangent of double-sided circuit board)
After etching the copper foil of the produced double-sided substrate, it was measured at 1 GHz with a cavity resonator (manufactured by Kanto Electronics Application Development Co., Ltd.) and analyzed with a network analyzer (manufactured by Agilent Technology Co., Ltd., model 8719ET).
(両面回路用基板の伝送損失)
エッチングにより、長さ10cmのマイクロストリップラインを作製し、ネットワークアナライザーを用いて40GHzにおける伝送損失を測定した。
(Transmission loss of double-sided circuit board)
A 10 cm long microstrip line was produced by etching, and the transmission loss at 40 GHz was measured using a network analyzer.
(絶縁体層のZ軸方向の線膨張率)
レーザー熱膨張計(LIX−2M;アドバンス理工(株)製)により測定した。
(Linear expansion coefficient of the insulator layer in the Z-axis direction)
It measured with the laser thermal dilatometer (LIX-2M; Advance Riko Co., Ltd. product).
実施例1
表面粗度Raが0.08μmである厚さ18μmの無粗処理電解銅箔(福田金属箔粉工業株式会社製 製品名CF−T9DA−SV−18)2枚、厚さ50μmの両面に表面処理(コロナ放電装置の放電電極とロール状接地電極の近傍に酢酸ビニルが0.13容量%含まれる窒素ガスを流しながら、フィルムをロール状接地電極に添わせて連続的に通過させ、荷電密度1.7w・s/cm2でフィルムの両面をコロナ放電処理した)がなされ、ESCA表面分析によるOの存在割合が2.62%であるテトラフルオロエチレン・パーフルオロアルキルビニルエーテル共重合体(PFA)フィルム(TFE/PPVE=98.5/1.5(モル%)、MFR:14.8g/10分、融点:305℃)を2枚、厚さ423μmのガラス不織布(オリベスト株式会社製SYS053)1枚を用意し、銅箔のマット面を内側、にして(すなわち、マット面がPFAフィルムに接するように配置する)、銅箔/PFAフィルム/ガラス不織布/PFAフィルム/銅箔の順に積層した。この積層体を真空プレス機を用いて325℃で30分間熱プレスすることにより、厚さが125μmである本発明の両面基板1を作製した。
Example 1
Surface treatment on 2 sides of non-roughened electrolytic copper foil (product name CF-T9DA-SV-18 manufactured by Fukuda Metal Foil Powder Co., Ltd.) having a surface roughness Ra of 0.08 μm and a thickness of 18 μm and 50 μm in thickness (A nitrogen gas containing 0.13% by volume of vinyl acetate is passed in the vicinity of the discharge electrode and the roll-shaped ground electrode of the corona discharge device, and the film is continuously passed along the roll-shaped ground electrode to obtain a charge density of 1 A tetrafluoroethylene / perfluoroalkyl vinyl ether copolymer (PFA) film in which both sides of the film were subjected to corona discharge treatment at 7 w · s / cm 2 ) and the proportion of O present by ESCA surface analysis was 2.62%. (TFE / PPVE = 98.5 / 1.5 (mol%), MFR: 14.8 g / 10 min, melting point: 305 ° C.) 2 sheets, a glass nonwoven fabric (Olive) having a thickness of 423 μm (Sys Co., Ltd., SYS053), and the matte surface of the copper foil is inside (that is, the matte surface is in contact with the PFA film), and the copper foil / PFA film / nonwoven glass / PFA film / It laminated | stacked in order of copper foil. This laminated body was hot-pressed at 325 ° C. for 30 minutes using a vacuum press machine, thereby producing a double-sided substrate 1 of the present invention having a thickness of 125 μm.
実施例2
実施例1において2枚のPFAフィルムの厚さを一方は50μmとし、他方は25μmとして、後は実施例1と同じにして、厚さが100μmである本発明の両面基板2を作製した。
Example 2
In Example 1, the thickness of the two PFA films was set to 50 μm on one side and 25 μm on the other side, and then the same as in Example 1, and a double-sided substrate 2 of the present invention having a thickness of 100 μm was produced.
実施例3
実施例1において、2枚のPFAフィルムをそれぞれFEPフィルムに変更し、実施例1と同様の両面処理を行ったものを用いた以外は同様にして、厚さが125μmである両面基板3を作製した。
Example 3
In Example 1, the double-sided substrate 3 having a thickness of 125 μm was prepared in the same manner except that the two PFA films were changed to FEP films and the same double-sided treatment as in Example 1 was used. did.
比較例1
実施例1においてガラス不織布の代わりに厚さが厚さ43μmのガラスクロス(株式会社製有沢製作所製IPCスタイル名1078)に代えた以外は同様にして、厚さが120μmである両面基板4を作製した。
Comparative Example 1
A double-sided substrate 4 having a thickness of 120 μm is prepared in the same manner as in Example 1 except that a glass cloth having a thickness of 43 μm (IPC style name 1078 manufactured by Arisawa Manufacturing Co., Ltd.) is used instead of the glass nonwoven fabric. did.
上記両面基板1,2,3,4を用い、銅箔とフッ素樹脂層の引きはがし強さを測定した。また銅箔をエッチングし、絶縁体層の弾性率、誘電率、誘電正接及びZ軸方向の線膨張率を測定した。更にマイクロストリップラインを作製し40GHzでの伝送損失を測定した。 Using the double-sided substrates 1, 2, 3, and 4, the peel strength between the copper foil and the fluororesin layer was measured. Further, the copper foil was etched, and the elastic modulus, dielectric constant, dielectric loss tangent, and linear expansion coefficient in the Z-axis direction of the insulating layer were measured. Furthermore, a microstrip line was produced and the transmission loss at 40 GHz was measured.
本発明によれば、線膨張率が小さく、銅箔引きはがし強さが強く、しかも高周波における伝送損失が少ない両面回路用基板を容易に製造出来るため、工業的に極めて有用である。
According to the present invention, a double-sided circuit board having a low linear expansion coefficient, a strong copper foil peeling strength, and a low transmission loss at high frequencies can be easily manufactured, and thus it is extremely useful industrially.
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