JP5912552B2 - X線検査装置 - Google Patents
X線検査装置 Download PDFInfo
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- JP5912552B2 JP5912552B2 JP2012004380A JP2012004380A JP5912552B2 JP 5912552 B2 JP5912552 B2 JP 5912552B2 JP 2012004380 A JP2012004380 A JP 2012004380A JP 2012004380 A JP2012004380 A JP 2012004380A JP 5912552 B2 JP5912552 B2 JP 5912552B2
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- 238000007689 inspection Methods 0.000 title claims description 97
- 239000000758 substrate Substances 0.000 claims description 150
- 230000007246 mechanism Effects 0.000 claims description 94
- 230000005540 biological transmission Effects 0.000 claims description 13
- 238000012546 transfer Methods 0.000 claims description 12
- 230000007723 transport mechanism Effects 0.000 claims description 10
- 238000003384 imaging method Methods 0.000 description 38
- 230000003028 elevating effect Effects 0.000 description 11
- 230000000452 restraining effect Effects 0.000 description 6
- 238000003860 storage Methods 0.000 description 6
- 238000004891 communication Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000011144 upstream manufacturing Methods 0.000 description 5
- 238000003825 pressing Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 239000002184 metal Substances 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/08—Means for conveying samples received
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/082—Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
- G01N2223/6113—Specific applications or type of materials patterned objects; electronic devices printed circuit board [PCB]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/163—Monitoring a manufacturing process
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- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Multimedia (AREA)
- Radiology & Medical Imaging (AREA)
- Operations Research (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
40 X線カメラユニット
44 X軸ボールねじ機構(移動手段の一例)
48 Y軸ボールねじ機構(移動手段の一例)
50 X線カメラ
60 基板テーブル
61 枠体
62、63 X軸片
62b 傾斜面
64、65 Y軸片
66 開口
67、68 Y軸レール(スライド機構の一例)
70 コンベアユニット
71、72 コンベアフレーム
71c 傾斜面
73、74 基板搬送コンベア(基板搬送機構の要部の一例)
80 コンベア駆動機構(基板搬送機構の要部の一例)
81 モータ
82 駆動シャフト
83、84 出力プーリ(第1、第2出力プーリの一例)
90 間隔調整機構
91、92 両ねじボルト
93 動力伝達ユニット
94 モータ
95、96 ナット機構
100 テーブル駆動機構
110 X軸駆動ユニット
140 Y軸駆動ユニット
160 X線照射ユニット
d1 所定寸法
d2 間隔
RL X線
W プリント基板
Claims (5)
- プリント基板を予め設定された基板搬送方向に搬送する搬送経路上で用いられるX線検査装置であって、
X線を通す開口を有する枠体を含み、前記プリント基板を保持する基板テーブルと、
前記枠体の上に固定され、前記基板搬送方向と水平に直交する基板幅方向に沿って延びる一対のレールと、
前記一対のレールに沿って前記枠体と相対的に移動可能に設けられ、前記基板幅方向に前記プリント基板を挟んで支持する一対のコンベアフレームと、
各コンベアフレームにそれぞれ設けられた基板搬送コンベアを含み、当該コンベアフレームに支持されるプリント基板を前記基板搬送方向に沿って搬送する基板搬送機構と、
両コンベアフレームをそれぞれ前記基板幅方向に沿って接離するように駆動することにより、各コンベアフレームに設けられた基板搬送機構が搬送可能なプリント基板の幅寸法を調整する間隔調整機構と、
前記枠体の開口を開放した状態で前記枠体の下面に配置される可動フレームを含み、前記可動フレームを介して前記基板テーブルを前記基板搬送方向と直交する水平方向に駆動するテーブル駆動機構と、
を備え、
前記間隔調整機構は、前記レールに沿って両コンベアフレームを均等に接離するように駆動するものであり、
前記一対のコンベアフレームは、当該基板の搬送方向に沿う前記開口の中心軸を軸とする対称形に配置されている
ことを特徴とするX線検査装置。 - 請求項1記載のX線検査装置において、
前記枠体は、前記開口を平面視四角形に区画する4つの辺を有し、各辺のうち、少なくとも前記基板搬送方向に沿う辺は、前記X線照射ユニットのX線照射方向において下流側が広くなるように傾斜する傾斜面を有している
ことを特徴とするX線検査装置。 - 請求項1又は2に記載のX線検査装置において、
前記一対のコンベアフレームは、それぞれが前記基板幅方向において対向する対向縁を有し、前記対向縁には、前記X線照射ユニットのX線照射方向において下流側が広くなるように傾斜する傾斜面が形成されている
ことを特徴とするX線検査装置。 - 請求項1から3の何れか1項に記載のX線検査装置において、
前記間隔調整機構は、前記基板幅方向に沿って延び、一端側と他端側とでねじ方向が逆に設定された両ねじボルトと、一方の前記コンベアフレームに取り付けられ、前記両ねじボルトの一端側と螺合する第1のナット機構と、他方の前記コンベアフレームに取り付けられ、前記両ねじボルトの他端側と螺合する第2のナット機構と、各両ねじボルトを駆動するためのモータと、前記モータの動力を双方の両ねじボルトに対し、同一方向に同一速度で伝達する動力伝達ユニットとを含んでいる
ことを特徴とするX線検査装置。 - 請求項1から4の何れか1項に記載のX線検査装置において、
前記基板搬送機構は、前記一対の基板搬送コンベアを駆動するコンベア駆動機構をさらに備え、
前記コンベア駆動機構は、モータと、モータによって回転駆動される駆動シャフトと、駆動シャフトに対し、当該駆動シャフトの軸回りの回転を規制された状態で、当該駆動シャフトの軸方向に移動可能に設けられて対をなし、一方の基板搬送コンベアに動力を伝達
する第1の出力プーリ及び他方の基板搬送コンベアに動力を伝達する第2の出力プーリとを含んでいる
ことを特徴とするX線検査装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012004380A JP5912552B2 (ja) | 2012-01-12 | 2012-01-12 | X線検査装置 |
KR1020147022153A KR101659828B1 (ko) | 2012-01-12 | 2012-06-27 | X선 검사 장치 |
EP12864997.7A EP2803981B1 (en) | 2012-01-12 | 2012-06-27 | X-ray inspection device |
PCT/JP2012/004174 WO2013105149A1 (ja) | 2012-01-12 | 2012-06-27 | X線検査装置 |
US14/371,678 US9322790B2 (en) | 2012-01-12 | 2012-06-27 | X-ray inspection device |
CN201280067009.3A CN104053986B (zh) | 2012-01-12 | 2012-06-27 | X射线检查装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012004380A JP5912552B2 (ja) | 2012-01-12 | 2012-01-12 | X線検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013142677A JP2013142677A (ja) | 2013-07-22 |
JP5912552B2 true JP5912552B2 (ja) | 2016-04-27 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2012004380A Active JP5912552B2 (ja) | 2012-01-12 | 2012-01-12 | X線検査装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9322790B2 (ja) |
EP (1) | EP2803981B1 (ja) |
JP (1) | JP5912552B2 (ja) |
KR (1) | KR101659828B1 (ja) |
CN (1) | CN104053986B (ja) |
WO (1) | WO2013105149A1 (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9492130B2 (en) | 2010-11-24 | 2016-11-15 | Hologic, Inc. | System for improved tissue-handling and in line analysis of the tissue |
DE102013203708B4 (de) * | 2013-03-05 | 2015-12-24 | Siemens Ag Österreich | Verfahren zur eindeutigen Identifikation von mehrschichtigen Leiterplatten |
CN105452804B (zh) * | 2013-05-10 | 2019-01-15 | 株式会社尼康 | X线装置及构造物的制造方法 |
WO2015134277A1 (en) | 2014-03-05 | 2015-09-11 | Faxitron Bioptics, Llc | System and method for multi-axis imaging of specimens |
JP6315683B2 (ja) * | 2014-06-11 | 2018-04-25 | 富士通周辺機株式会社 | プリント基板検査装置及びプリント基板検査システム |
CN104406995A (zh) * | 2014-11-26 | 2015-03-11 | 无锡日联科技有限公司 | 扁平构件的ct检测设备 |
WO2017040977A1 (en) | 2015-09-04 | 2017-03-09 | Faxitron Bioptics, Llc | Multi-axis specimen imaging device with embedded orientation markers |
WO2017100475A1 (en) * | 2015-12-09 | 2017-06-15 | Integrated-X, Inc. | Systems and methods for inspection using electromagnetic radiation |
US11083426B2 (en) * | 2016-11-04 | 2021-08-10 | Hologic, Inc. | Specimen radiography system comprising cabinet and a specimen drawer positionable by a controller in the cabinet |
EP3618721A1 (en) | 2017-05-03 | 2020-03-11 | Hologic, Inc. | Device for reducing fluid in the imaging field of a tissue handling apparatus for improving biopsy system imaging quality |
WO2019051496A1 (en) | 2017-09-11 | 2019-03-14 | Faxitron Bioptics, Llc | IMAGING SYSTEM WITH ADAPTIVE OBJECT MAGNIFICATION |
JP7020085B2 (ja) * | 2017-12-04 | 2022-02-16 | コニカミノルタ株式会社 | X線撮影システム |
CN109936929A (zh) * | 2017-12-15 | 2019-06-25 | 得力富企业股份有限公司 | 电路板投料设备 |
JP7219148B2 (ja) * | 2018-04-25 | 2023-02-07 | 住友化学株式会社 | 検査システム及び検査システムの駆動方法 |
JP7088514B2 (ja) * | 2018-06-29 | 2022-06-21 | コー・ヤング・テクノロジー・インコーポレーテッド | 対象物検査装置及びこれを用いた対象物検査方法 |
EP3902473B1 (en) | 2018-12-26 | 2023-02-01 | Hologic, Inc. | Tissue imaging in presence of fluid during biopsy procedure |
KR102187052B1 (ko) * | 2019-09-17 | 2020-12-04 | 주식회사 씨엔아이 | 화물검색기용 엑스레이 검출박스 |
ES2994319T3 (en) | 2020-03-31 | 2025-01-22 | Hologic Inc | Systems and methods for x-ray imaging tissue specimens |
CN112730471A (zh) * | 2020-12-25 | 2021-04-30 | 航天海鹰(哈尔滨)钛业有限公司 | 一种用于定向x射线探伤检测环形工件的工装 |
CN113960074B (zh) * | 2021-09-28 | 2024-06-11 | 丹东华日理学电气有限公司 | 检测定位结构、方法及汽车零部件x射线检测设备、方法 |
CN115338434B (zh) * | 2022-08-18 | 2023-11-21 | 上海交通大学 | 利用同步辐射x射线成像监测增材制造过程的设备 |
CN116900329A (zh) * | 2023-07-13 | 2023-10-20 | 上海交通大学 | 一种用于激光增材制造同步辐射原位表征的实验系统 |
CN119355013B (zh) * | 2024-12-26 | 2025-04-15 | 河北凯威信达信息技术有限公司 | 一种基于x射线的检测设备 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62151268A (ja) * | 1985-12-26 | 1987-07-06 | Tamura Seisakusho Co Ltd | 気相式はんだ付け装置 |
JP3128900B2 (ja) | 1991-11-25 | 2001-01-29 | 松下電器産業株式会社 | 半田付状態のx線検査装置 |
US5754621A (en) * | 1993-03-15 | 1998-05-19 | Hitachi, Ltd. | X-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit board |
JPH0743320A (ja) * | 1993-03-15 | 1995-02-14 | Hitachi Ltd | X線検査方法およびその装置並びにプレプレグの検査方法および多層配線基板の製造方法 |
JPH0715176A (ja) * | 1993-06-23 | 1995-01-17 | Yamaha Motor Co Ltd | 実装機の搬送部調整装置 |
US5541856A (en) * | 1993-11-08 | 1996-07-30 | Imaging Systems International | X-ray inspection system |
WO1996005714A1 (fr) * | 1994-08-08 | 1996-02-22 | Kabushiki Kaisha Kobe Seiko Sho | Procede et dispositif de verification des soudures d'une plaquette de circuit imprime |
JPH11278020A (ja) * | 1998-03-26 | 1999-10-12 | Bridgestone Corp | マーキング検査装置 |
JP2002189002A (ja) * | 2000-06-29 | 2002-07-05 | Matsushita Electric Ind Co Ltd | X線検査装置及び方法 |
JP2003315288A (ja) | 2002-04-26 | 2003-11-06 | Hitachi Medical Corp | X線検査装置 |
JP2004028845A (ja) * | 2002-06-27 | 2004-01-29 | Japan Science & Technology Corp | 高輝度・高出力微小x線発生源とそれを用いた非破壊検査装置 |
US7099432B2 (en) * | 2003-08-27 | 2006-08-29 | Matsushita Electric Industrial Co., Ltd. | X-ray inspection apparatus and X-ray inspection method |
US7099435B2 (en) * | 2003-11-15 | 2006-08-29 | Agilent Technologies, Inc | Highly constrained tomography for automated inspection of area arrays |
JP2006098195A (ja) | 2004-09-29 | 2006-04-13 | Ishida Co Ltd | X線検査装置 |
JP4718371B2 (ja) | 2006-05-17 | 2011-07-06 | 富士機械製造株式会社 | プリント基板保持装置 |
JP4554578B2 (ja) * | 2006-09-11 | 2010-09-29 | アンリツ株式会社 | 基板搬送装置及びそれを備えた印刷はんだ検査装置 |
KR100943002B1 (ko) | 2009-07-22 | 2010-02-18 | (주)자비스 | 엑스레이검사장치 |
KR100983244B1 (ko) | 2010-06-10 | 2010-09-24 | (주)자비스 | 복합기능을 갖는 인라인 피씨비 엑스레이검사장치. |
-
2012
- 2012-01-12 JP JP2012004380A patent/JP5912552B2/ja active Active
- 2012-06-27 WO PCT/JP2012/004174 patent/WO2013105149A1/ja active Application Filing
- 2012-06-27 US US14/371,678 patent/US9322790B2/en active Active
- 2012-06-27 CN CN201280067009.3A patent/CN104053986B/zh active Active
- 2012-06-27 KR KR1020147022153A patent/KR101659828B1/ko active Active
- 2012-06-27 EP EP12864997.7A patent/EP2803981B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2803981A1 (en) | 2014-11-19 |
EP2803981A4 (en) | 2015-06-10 |
CN104053986A (zh) | 2014-09-17 |
KR101659828B1 (ko) | 2016-09-26 |
US20140334605A1 (en) | 2014-11-13 |
CN104053986B (zh) | 2016-08-24 |
EP2803981B1 (en) | 2016-06-08 |
JP2013142677A (ja) | 2013-07-22 |
US9322790B2 (en) | 2016-04-26 |
KR20140110068A (ko) | 2014-09-16 |
WO2013105149A1 (ja) | 2013-07-18 |
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