JP5734236B2 - ワイヤボンディング装置及びボンディング方法 - Google Patents
ワイヤボンディング装置及びボンディング方法 Download PDFInfo
- Publication number
- JP5734236B2 JP5734236B2 JP2012096242A JP2012096242A JP5734236B2 JP 5734236 B2 JP5734236 B2 JP 5734236B2 JP 2012096242 A JP2012096242 A JP 2012096242A JP 2012096242 A JP2012096242 A JP 2012096242A JP 5734236 B2 JP5734236 B2 JP 5734236B2
- Authority
- JP
- Japan
- Prior art keywords
- wire
- bonding
- pad
- tail
- lead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 58
- 238000003825 pressing Methods 0.000 claims description 126
- 239000004065 semiconductor Substances 0.000 claims description 101
- 238000005452 bending Methods 0.000 claims description 87
- 239000000758 substrate Substances 0.000 claims description 68
- 238000005520 cutting process Methods 0.000 claims description 25
- 230000007246 mechanism Effects 0.000 description 43
- 230000008569 process Effects 0.000 description 20
- 235000014676 Phragmites communis Nutrition 0.000 description 10
- 230000000694 effects Effects 0.000 description 10
- 230000002093 peripheral effect Effects 0.000 description 10
- 238000003860 storage Methods 0.000 description 9
- 230000004044 response Effects 0.000 description 8
- 239000011295 pitch Substances 0.000 description 7
- 238000005304 joining Methods 0.000 description 6
- 230000000630 rising effect Effects 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 230000009897 systematic effect Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04042—Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32135—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/32145—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45015—Cross-sectional shape being circular
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48145—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
- H01L2224/48472—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
- H01L2224/49173—Radial fan-out arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/783—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/78301—Capillary
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7855—Mechanical means, e.g. for severing, pressing, stamping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/786—Means for supplying the connector to be connected in the bonding apparatus
- H01L2224/78621—Holding means, e.g. wire clampers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/788—Means for moving parts
- H01L2224/78801—Lower part of the bonding apparatus, e.g. XY table
- H01L2224/78802—Rotational mechanism
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/788—Means for moving parts
- H01L2224/78801—Lower part of the bonding apparatus, e.g. XY table
- H01L2224/78804—Translational mechanism
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/85009—Pre-treatment of the connector or the bonding area
- H01L2224/8503—Reshaping, e.g. forming the ball or the wedge of the wire connector
- H01L2224/85047—Reshaping, e.g. forming the ball or the wedge of the wire connector by mechanical means, e.g. severing, pressing, stamping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/851—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector the connector being supplied to the parts to be connected in the bonding apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8512—Aligning
- H01L2224/85148—Aligning involving movement of a part of the bonding apparatus
- H01L2224/85169—Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
- H01L2224/8518—Translational movements
- H01L2224/85181—Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8512—Aligning
- H01L2224/85148—Aligning involving movement of a part of the bonding apparatus
- H01L2224/85169—Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
- H01L2224/8518—Translational movements
- H01L2224/85186—Translational movements connecting first outside the semiconductor or solid-state body, i.e. off-chip, reverse stitch
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/852—Applying energy for connecting
- H01L2224/85201—Compression bonding
- H01L2224/85205—Ultrasonic bonding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/04—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same main group of the same subclass of class H10
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06506—Wire or wire-like electrical connections between devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/04—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same main group of the same subclass of class H10
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/0651—Wire or wire-like electrical connections from device to substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/04—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same main group of the same subclass of class H10
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06555—Geometry of the stack, e.g. form of the devices, geometry to facilitate stacking
- H01L2225/06568—Geometry of the stack, e.g. form of the devices, geometry to facilitate stacking the devices decreasing in size, e.g. pyramidical stack
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00
- H01L25/0655—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00
- H01L25/0657—Stacked arrangements of devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Description
行うことができるので、次のパッド73へのボンディングを行う際にワイヤテール82の側面を確実にパッド73の上に押し付けることができ、良好なウェッジボンディングを行うことができる。
Claims (20)
- 棒状体で、その長手方向にワイヤが挿通される貫通孔と、その先端の前記貫通孔の周縁に設けられてボンディング対象に前記ワイヤを押圧する押圧面と、を有するボンディングツールと、
前記ワイヤを把持するクランパと、
前記ボンディングツールの先端から延出した前記ワイヤテールを引っ掛ける段部を含む折り曲げステーションと、
前記ボンディングツールの移動を規定すると共に前記クランパを開閉する制御部と、を含み、複数の第1ボンド点と複数の第2ボンド点とをそれぞれ前記ワイヤで接続するワイヤボンディング装置であって、
前記制御部は、
先の第2ボンド点に前記ワイヤをボンディングした後、前記クランパを開として前記ボンディングツールを上昇させ、次の第1ボンド点から次の第2ボンド点に向う直線に沿って所定距離だけ移動させ、前記ボンディングツールの前記貫通孔から前記ワイヤを前記次の第1ボンド点から前記次の第2ボンド点に向う直線に沿った方向に延出させるワイヤテール延出手段と、
前記ワイヤテールを延出させた後、前記クランパを閉として前記ボンディングツールを前記次の第1ボンド点から前記次の第2ボンド点に向う直線に沿った方向に移動させて前記ワイヤテールを切断するテールカット手段と、
前記ボンディングツールを折り曲げステーションに移動させ、前記ワイヤテールを前記段部に沿った位置に配置した後、前記次の第1ボンド点から前記次の第2ボンド点に向う直線に沿って前記次の第2ボンド点の方向に前記ボンディングツールを移動させて前記ワイヤテールを前記次の第1ボンド点に向う方向に折り曲げるワイヤテール折り曲げ手段と、
を有することを特徴とするワイヤボンディング装置。 - 請求項1に記載のワイヤボンディング装置であって、
制御部は、
先の第1ボンド点と前記先の第2ボンド点とを結ぶ第1の直線と、前記次の第1ボンド点と前記次の第2ボンド点とを結ぶ第2の直線とのなす角度が所定の角度よりも小さい場合には、前記ワイヤテール延出手段と、前記テールカット手段によってワイヤテールの形成を行い、
前記第1の直線と前記第2の直線とのなす角度が前記所定の角度よりも大きいか同じ場合には、前記ワイヤテール折り曲げ手段によってワイヤテールの形成を行うこと、
を特徴とするワイヤボンディング装置。 - 請求項1または2に記載のワイヤボンディング装置であって、
前記貫通孔の前記押圧面側の端部はストレート孔で、前記ストレート孔の内面と前記押圧面とのなす角度は略直角であること、
を特徴とするワイヤボンディング装置。 - 請求項1から3のいずれか1項に記載のワイヤボンディング装置であって、
前記押圧面は、円環状の平面であり、
前記ワイヤテール延出手段は、前記ワイヤテールの長さが前記押圧面の外半径より僅かに長くなるように前記ボンディングツールを移動させること、
を特徴とするワイヤボンディング装置。 - 請求項1から4のいずれか1項に記載のワイヤボンディング装置であって、
前記ワイヤテール延出手段は、前記ボンディングツールを所定のZ方向距離だけ上昇させた後、次の第1ボンド点から次の第2ボンド点に向う直線に沿って所定のXY方向距離だけ水平に移動させること、
を特徴とするワイヤボンディング装置。 - 請求項1から4のいずれか1項に記載のワイヤボンディング装置であって、
前記ワイヤテール延出手段は、前記ボンディングツールを次の第1ボンド点から次の第2ボンド点に向う直線に沿って所定の斜め方向距離だけ斜め上方に移動させること、
を特徴とするワイヤボンディング装置。 - 請求項1から6のいずれか1項に記載のワイヤボンディング装置であって、
前記複数の第1ボンド点は、基板のリードであり、
前記複数の第2ボンド点は、半導体チップのパッドであること、
を特徴とするワイヤボンディング装置。 - 請求項1から7のいずれか1項に記載のワイヤボンディング装置であって、
前記折り曲げステーションの段部は、
前記ワイヤテールを引っ掛ける壁面と、前記壁面につながる上平面とを有し、
前記ワイヤテール折り曲げ手段は、
前記ボンディングツールの前記押圧面が前記折り曲げステーションの前記段部の前記上平面より前記ワイヤの直径よりも僅かに高い高さで前記ボンディングツールを移動させること、
を特徴とするワイヤボンディング装置。 - 棒状体で、その長手方向にワイヤが挿通される貫通孔と、その先端の前記貫通孔の周縁に設けられてボンディング対象に前記ワイヤを押圧する押圧面と、を有するボンディングツールと、前記ワイヤを把持するクランパと、前記ボンディングツールの先端から延出した前記ワイヤテールを引っ掛ける段部を含む折り曲げステーションとを含むワイヤボンディング装置によって、複数の第1ボンド点と複数の第2ボンド点とをそれぞれ前記ワイヤで接続するワイヤボンディング方法であって、
先の第2ボンド点に前記ワイヤをボンディングした後、前記クランパを開として前記ボンディングツールを上昇させ、次の第1ボンド点から次の第2ボンド点に向う直線に沿って前記ボンディングツールを所定距離だけ移動させ、前記ボンディングツールの前記貫通孔から前記ワイヤを前記次の第1ボンド点から前記次の第2ボンド点に向う直線に沿った方向に延出させるワイヤテール延出工程と、
前記ワイヤテール延出工程の後、前記クランパを閉として前記ボンディングツールを前記次の第1ボンド点から前記次の第2ボンド点に向う直線に沿った方向に移動させて前記ワイヤテールを切断するテールカット工程と、
前記ボンディングツールを折り曲げステーションに移動させ、前記ワイヤテールを前記段部に沿った位置に配置した後、前記次の第1ボンド点から前記次の第2ボンド点に向う直線に沿って前記次の第2ボンド点の方向に前記ボンディングツールを移動させて前記ワイヤテールを前記次の第1ボンド点に向う方向に折り曲げるワイヤテール折り曲げ工程と、
を有することを特徴とするワイヤボンディング方法。 - 請求項9に記載のワイヤボンディング方法であって、
先の第1ボンド点と前記先の第2ボンド点とを結ぶ第1の直線と、前記次の第1ボンド点と前記次の第2ボンド点とを結ぶ第2の直線とのなす角度が所定の角度よりも小さい場合には、前記ワイヤテール延出工程と、前記テールカット工程によってワイヤテールの形成を行い、
前記第1の直線と前記第2の直線とのなす角度が前記所定の角度よりも大きいか同じ場合には、前記ワイヤテール折り曲げ工程によってワイヤテールの形成を行うこと、
を特徴とするワイヤボンディング方法。 - 請求項9または10に記載のワイヤボンディング方法であって、
前記押圧面は、円環状の平面であり、
前記ワイヤテール延出工程は、前記ワイヤテールの長さが前記押圧面の外半径より僅かに長くなるように前記ボンディングツールを移動させること、
を特徴とするワイヤボンディング方法。 - 請求項9から11のいずれか1項に記載のワイヤボンディング方法であって、
前記ワイヤテール延出工程は、前記ボンディングツールを所定のZ方向距離だけ上昇させた後、次の第1ボンド点から次の第2ボンド点に向う直線に沿って所定のXY距離だけ水平に移動させること、
を特徴とするワイヤボンディング方法。 - 請求項9から12のいずれか1項に記載のワイヤボンディング方法であって、
前記ワイヤテール延出工程は、前記ボンディングツールを次の第1ボンド点から次の第2ボンド点に向う直線に沿って所定の斜め方向距離だけ斜め上方に移動させること、
を特徴とするワイヤボンディング方法。 - 請求項9から13のいずれか1項に記載のワイヤボンディング方法であって、
前記複数の第1ボンド点は、基板のリードであり、
前記複数の第2ボンド点は、半導体チップのパッドであること、
を特徴とするワイヤボンディング方法。 - 請求項2から6のいずれか1項に記載のワイヤボンディング装置であって、
制御部は、
共通の基板に複数の半導体チップを配置し、各半導体チップの複数のパッドと各パッドに対応する基板の各リードとをそれぞれワイヤで接続する際に、
先の半導体チップの最後のパッドとそのパッドに対応する基板のリードとをワイヤで接続した後、該パッドから該リードに向かう方向に沿ってパッドとそのパッドに対応するリードが配置されている後の半導体チップの該パッドと該リードの組からワイヤの接続を開始すること、を特徴とするワイヤボンディング装置。 - 請求項2から6のいずれか1項に記載のワイヤボンディング装置であって、
制御部は、
共通の基板に複数の半導体チップを配置し、各半導体チップの複数のパッドと各パッドに対応する基板の各リードとをそれぞれワイヤで接続する際に、
各パッドと各パッドに対応する各リードとを結ぶ線の方向が同様となっている各パッドと各リードの組ごとに順次ワイヤで接続すること、
を特徴とするワイヤボンディング装置。 - 請求項1から4のいずれか1項に記載のワイヤボンディング装置であって、
前記ワイヤテール延出手段は、前記ボンディングツールを所定のZ方向距離だけ上昇させ、第2ボンド点から第1ボンドの方向に所定のXY方向距離だけ水平に移動させた後、次の第1ボンド点から次の第2ボンド点に向う直線に沿って所定のXY方向距離だけ水平に移動させること、
を特徴とするワイヤボンディング装置。 - 請求項10から13のいずれか1項に記載のワイヤボンディング方法であって、
共通の基板に複数の半導体チップを配置し、各半導体チップの複数のパッドと各パッドに対応する基板の各リードとをそれぞれワイヤで接続する際に、
先の半導体チップの最後のパッドとそのパッドに対応する基板のリードとをワイヤで接続した後、該パッドから該リードに向かう方向に沿ってパッドとそのパッドに対応するリードが配置されている後の半導体チップの該パッドと該リードの組からワイヤの接続を開始すること、を特徴とするワイヤボンディング方法。 - 請求項10から13のいずれか1項に記載のワイヤボンディング方法であって、
共通の基板に複数の半導体チップを配置し、各半導体チップの複数のパッドと各パッドに対応する基板の各リードとをそれぞれワイヤで接続する際に、
各パッドと各パッドに対応する各リードとを結ぶ線の方向が同様となっている各パッドと各リードの組ごとに順次ワイヤで接続すること、
を特徴とするワイヤボンディング方法。 - 請求項9から11のいずれか1項に記載のワイヤボンディング方法であって、
前記ワイヤテール延出手段は、前記ボンディングツールを所定のZ方向距離だけ上昇させた、第2ボンド点から第1ボンドの方向に所定のXY方向距離だけ水平に移動させた後、次の第1ボンド点から次の第2ボンド点に向う直線に沿って所定のXY方向距離だけ水平に移動させること、
を特徴とするワイヤボンディング方法。
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012096242A JP5734236B2 (ja) | 2011-05-17 | 2012-04-20 | ワイヤボンディング装置及びボンディング方法 |
TW101116483A TWI488243B (zh) | 2011-05-17 | 2012-05-09 | Threading device and joining method |
SG2013084942A SG195003A1 (en) | 2011-05-17 | 2012-05-14 | Wire bonding device and bonding method |
PCT/JP2012/062275 WO2012157599A1 (ja) | 2011-05-17 | 2012-05-14 | ワイヤボンディング装置及びボンディング方法 |
KR1020137030305A KR101580135B1 (ko) | 2011-05-17 | 2012-05-14 | 와이어본딩 장치 및 본딩 방법 |
CN201280023579.2A CN103534797B (zh) | 2011-05-17 | 2012-05-14 | 打线接合装置及接合方法 |
US14/081,104 US9337166B2 (en) | 2011-05-17 | 2013-11-15 | Wire bonding apparatus and bonding method |
US15/045,758 US20160163673A1 (en) | 2011-05-17 | 2016-02-17 | Wire bonding apparatus and bonding method |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011110093 | 2011-05-17 | ||
JP2011110093 | 2011-05-17 | ||
JP2012096242A JP5734236B2 (ja) | 2011-05-17 | 2012-04-20 | ワイヤボンディング装置及びボンディング方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2012256861A JP2012256861A (ja) | 2012-12-27 |
JP2012256861A5 JP2012256861A5 (ja) | 2014-01-09 |
JP5734236B2 true JP5734236B2 (ja) | 2015-06-17 |
Family
ID=47176916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012096242A Active JP5734236B2 (ja) | 2011-05-17 | 2012-04-20 | ワイヤボンディング装置及びボンディング方法 |
Country Status (7)
Country | Link |
---|---|
US (2) | US9337166B2 (ja) |
JP (1) | JP5734236B2 (ja) |
KR (1) | KR101580135B1 (ja) |
CN (1) | CN103534797B (ja) |
SG (1) | SG195003A1 (ja) |
TW (1) | TWI488243B (ja) |
WO (1) | WO2012157599A1 (ja) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103069557B (zh) * | 2010-08-10 | 2015-12-02 | 库力索法工业公司 | 引线环、形成引线环的方法及相关处理 |
TWI570864B (zh) * | 2013-02-01 | 2017-02-11 | 英帆薩斯公司 | 具有焊線通孔的微電子封裝、其之製造方法以及用於其之硬化層 |
TWI543284B (zh) * | 2014-02-10 | 2016-07-21 | 新川股份有限公司 | 半導體裝置的製造方法以及打線裝置 |
TWI528481B (zh) * | 2014-02-13 | 2016-04-01 | 新川股份有限公司 | 球形成裝置、打線裝置以及球形成方法 |
TWI517277B (zh) * | 2014-02-14 | 2016-01-11 | 新川股份有限公司 | 打線裝置以及半導體裝置的製造方法 |
JP5686912B1 (ja) * | 2014-02-20 | 2015-03-18 | 株式会社新川 | バンプ形成方法、バンプ形成装置及び半導体装置の製造方法 |
TWI557821B (zh) * | 2014-02-21 | 2016-11-11 | 新川股份有限公司 | 半導體裝置的製造方法以及打線裝置 |
TWI585927B (zh) | 2014-02-21 | 2017-06-01 | 新川股份有限公司 | 半導體裝置的製造方法、半導體裝置以及打線裝置 |
JP2015173205A (ja) * | 2014-03-12 | 2015-10-01 | 株式会社東芝 | 半導体装置及びワイヤボンディング装置 |
JP5950994B2 (ja) * | 2014-12-26 | 2016-07-13 | 株式会社新川 | 実装装置 |
USD797826S1 (en) | 2015-02-03 | 2017-09-19 | Coorstek, Inc. | Ceramic bonding tool with textured tip |
USD797171S1 (en) | 2015-02-03 | 2017-09-12 | Coorstek, Inc. | Ceramic bonding tool with textured tip |
USD797172S1 (en) * | 2015-02-03 | 2017-09-12 | Coorstek, Inc. | Ceramic bonding tool with textured tip |
US9881895B2 (en) * | 2015-08-18 | 2018-01-30 | Lockheed Martin Corporation | Wire bonding methods and systems incorporating metal nanoparticles |
USD868123S1 (en) | 2016-12-20 | 2019-11-26 | Coorstek, Inc. | Wire bonding wedge tool |
CN107301989A (zh) * | 2017-06-06 | 2017-10-27 | 深圳国民飞骧科技有限公司 | 一种确定焊线芯片表面焊盘间距的方法 |
CN108054108B (zh) * | 2017-12-19 | 2019-10-25 | 哈尔滨工业大学 | 一种基于快速局域电沉积的引线键合方法 |
US10763236B2 (en) * | 2018-01-09 | 2020-09-01 | Kulicke And Soffa Industries, Inc. | Systems and methods of operating wire bonding machines including clamping systems |
KR102488006B1 (ko) | 2018-03-20 | 2023-01-12 | 엘지이노텍 주식회사 | 카메라 모듈 및 이를 포함하는 광학 기기 |
EP3570318A1 (en) * | 2018-05-15 | 2019-11-20 | Infineon Technologies AG | Method for bonding an electrically conductive element to a bonding partner |
EP3603826B1 (en) * | 2018-07-31 | 2023-05-10 | Infineon Technologies AG | Method for calibrating an ultrasonic bonding machine |
US11791309B2 (en) | 2018-12-12 | 2023-10-17 | Heraeus Materials Singapore Pte. Ltd. | Process for electrically connecting contact surfaces of electronic components |
WO2020184338A1 (ja) * | 2019-03-08 | 2020-09-17 | 株式会社新川 | ワイヤボンディング装置 |
US11420287B2 (en) * | 2019-09-29 | 2022-08-23 | Ningbo Shangjin Automation Technology Co., Ltd. | Wire clamping system for fully automatic wire bonding machine |
TWI802880B (zh) * | 2021-05-11 | 2023-05-21 | 日商新川股份有限公司 | 打線接合裝置以及打線接合方法 |
CN115707348A (zh) * | 2021-06-07 | 2023-02-17 | 株式会社新川 | 半导体装置的制造方法以及打线接合装置 |
WO2022264427A1 (ja) | 2021-06-18 | 2022-12-22 | 株式会社新川 | 半導体装置の製造装置および製造方法 |
JP7253862B1 (ja) * | 2021-07-06 | 2023-04-07 | 株式会社新川 | 半導体装置の製造装置および製造方法 |
JP7542895B1 (ja) | 2023-08-29 | 2024-09-02 | 株式会社新川 | ワイヤボンディング装置 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1439262B2 (de) * | 1963-07-23 | 1972-03-30 | Siemens AG, 1000 Berlin u. 8000 München | Verfahren zum kontaktieren von halbleiterbauelementen durch thermokompression |
JPS54152962A (en) * | 1978-05-24 | 1979-12-01 | Hitachi Ltd | Ultrasonic wire-bonding unit |
US4239144A (en) | 1978-11-22 | 1980-12-16 | Kulicke & Soffa Industries, Inc. | Apparatus for wire bonding |
US4422568A (en) | 1981-01-12 | 1983-12-27 | Kulicke And Soffa Industries, Inc. | Method of making constant bonding wire tail lengths |
JPS5889833A (ja) * | 1981-11-25 | 1983-05-28 | Shinkawa Ltd | ワイヤボンデイング方法 |
US4437604A (en) * | 1982-03-15 | 1984-03-20 | Kulicke & Soffa Industries, Inc. | Method of making fine wire interconnections |
JPS5994431A (ja) * | 1982-11-19 | 1984-05-31 | Matsushita Electric Ind Co Ltd | ボンデイング方法 |
JPH04206841A (ja) * | 1990-11-30 | 1992-07-28 | Mitsubishi Electric Corp | 半導体装置用ワイヤボンダ装置 |
JP2500655B2 (ja) * | 1993-11-24 | 1996-05-29 | 日本電気株式会社 | ワイヤ―ボンディング方法及びその装置 |
JP3425510B2 (ja) * | 1996-09-27 | 2003-07-14 | 松下電器産業株式会社 | バンプボンダー形成方法 |
JP3422937B2 (ja) * | 1998-07-27 | 2003-07-07 | 株式会社新川 | ワイヤボンディングにおけるボール形成方法 |
JP2002064117A (ja) * | 2000-08-22 | 2002-02-28 | Mitsubishi Electric Corp | ワイヤボンディング方法、ワイヤボンディング装置および半導体装置 |
JP2004221257A (ja) * | 2003-01-14 | 2004-08-05 | Seiko Epson Corp | ワイヤボンディング方法及びワイヤボンディング装置 |
TWI248186B (en) * | 2004-01-09 | 2006-01-21 | Unaxis Internat Tranding Ltd | Method for producing a wedge-wedge wire connection |
US20060186179A1 (en) * | 2005-02-23 | 2006-08-24 | Levine Lee R | Apparatus and method for bonding wires |
JP5008832B2 (ja) * | 2005-04-15 | 2012-08-22 | ローム株式会社 | 半導体装置及び半導体装置の製造方法 |
KR100734269B1 (ko) * | 2005-07-29 | 2007-07-02 | 삼성전자주식회사 | 와이어 본딩 장치 |
JP4679427B2 (ja) * | 2006-04-24 | 2011-04-27 | 株式会社新川 | ボンディング装置のテールワイヤ切断方法及びプログラム |
US20100059883A1 (en) * | 2008-09-05 | 2010-03-11 | Freescale Semiconductor, Inc. | Method of forming ball bond |
US20120032354A1 (en) * | 2010-08-06 | 2012-02-09 | National Semiconductor Corporation | Wirebonding method and device enabling high-speed reverse wedge bonding of wire bonds |
US7918378B1 (en) * | 2010-08-06 | 2011-04-05 | National Semiconductor Corporation | Wire bonding deflector for a wire bonder |
JP5700482B2 (ja) * | 2012-11-16 | 2015-04-15 | 株式会社新川 | ワイヤボンディング装置及び半導体装置の製造方法 |
-
2012
- 2012-04-20 JP JP2012096242A patent/JP5734236B2/ja active Active
- 2012-05-09 TW TW101116483A patent/TWI488243B/zh active
- 2012-05-14 SG SG2013084942A patent/SG195003A1/en unknown
- 2012-05-14 WO PCT/JP2012/062275 patent/WO2012157599A1/ja active Application Filing
- 2012-05-14 CN CN201280023579.2A patent/CN103534797B/zh active Active
- 2012-05-14 KR KR1020137030305A patent/KR101580135B1/ko active Active
-
2013
- 2013-11-15 US US14/081,104 patent/US9337166B2/en not_active Expired - Fee Related
-
2016
- 2016-02-17 US US15/045,758 patent/US20160163673A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
CN103534797B (zh) | 2016-04-27 |
US20160163673A1 (en) | 2016-06-09 |
WO2012157599A1 (ja) | 2012-11-22 |
US9337166B2 (en) | 2016-05-10 |
KR20140045358A (ko) | 2014-04-16 |
KR101580135B1 (ko) | 2015-12-28 |
TWI488243B (zh) | 2015-06-11 |
CN103534797A (zh) | 2014-01-22 |
TW201314801A (zh) | 2013-04-01 |
SG195003A1 (en) | 2013-12-30 |
JP2012256861A (ja) | 2012-12-27 |
US20140138426A1 (en) | 2014-05-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5734236B2 (ja) | ワイヤボンディング装置及びボンディング方法 | |
US4327860A (en) | Method of making slack free wire interconnections | |
US8191759B2 (en) | Wire bonding apparatus and wire bonding method | |
US9379086B2 (en) | Method of manufacturing semiconductor device | |
US8267303B2 (en) | Wire bonding apparatus with a textured capillary surface enabling high-speed wedge bonding of wire bonds | |
JP4679427B2 (ja) | ボンディング装置のテールワイヤ切断方法及びプログラム | |
US8196803B2 (en) | Method of manufacturing semiconductor device and wire bonding apparatus | |
WO2014077026A1 (ja) | ワイヤボンディング装置及び半導体装置の製造方法 | |
US9887174B2 (en) | Semiconductor device manufacturing method, semiconductor device, and wire bonding apparatus | |
US9922952B2 (en) | Method for producing semiconductor device, and wire-bonding apparatus | |
JP2004087747A (ja) | ワイヤボンディング方法、ワイヤボンディング装置及びワイヤボンディングプログラム | |
TWI736163B (zh) | 打線接合裝置 | |
JP2500655B2 (ja) | ワイヤ―ボンディング方法及びその装置 | |
JP7441558B2 (ja) | ピンワイヤ形成方法、及びワイヤボンディング装置 | |
JP7152079B2 (ja) | ワイヤボンディング装置及び半導体装置の製造方法 | |
JPH1056034A (ja) | ボンディング装置 | |
KR20070076194A (ko) | 회전식 캐필러리를 갖는 와이어 본딩 장치 및 그를 이용한와이어 본딩 방법 | |
JPH04199522A (ja) | ワイヤボンディング装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20130327 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20131119 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140401 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140512 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20150106 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20150227 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20150407 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20150414 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5734236 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |