JP5227525B2 - 生体光計測装置 - Google Patents
生体光計測装置 Download PDFInfo
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Description
そこで、本発明は生体計測用の光源として、可視から赤外の複数の異なる波長で発振する半導体発光素子をひとつのカンパッケージに収納した小型光源装置およびその光源装置を搭載した生体光計測装置を提供することを目的とする。また、もうひとつには、生体計測用の光源として市場で入手困難であった700nm〜760nmの波長で発振する半導体レーザの特性安定化、高信頼化が可能となる構成を提案することを目的とする。
この波長範囲を満たすことのできる活性層として結晶成長方法が確立されていなかったために作製が困難であったGaAs基板上のInGaAsPを選ぶ。有機金属気層成長(MOVPE)装置を用いて、成長条件を実験的に最適化することでGaAs基板上にレーザの活性層相当の膜厚をもつInGaAsPを成長させることに成功した。成長条件はGaAs基板を用いた成長の常識的な範囲内のあるものであったが、装置ごとに最適化するべきものである。
なお、上記GaAs基板201は面方位が(100)面から<011>方向へ傾いたオフ基板でも良く、また、上記歪量子井戸活性層205は、障壁層に引張り歪を加えた歪補償構造でも良い。
特許文献1は生体の情報を得るために、光計測に先立ってCT計測が必要であるが、本発明では、光計測のみで生体情報を得る。特許文献2は光計測により生体情報を時系列表示できるが、その光源については波長以外の詳細な記述がない。本発明では特許文献2の信号処理理論をそのまま用いて、光計測装置に用いる光源の構成と光出力安定化の制御を提案した。
ここでは、生体計測の分光分析の精度を上げるために、半導体レーザ1〜3は、非常に近いが異なる周波数で変調されており、このときモニタ信号分離回路11としてはロックインアンプを用いるとよい。
これを第1の実施例の半導体レーザ2に適用することで生体光計測に適した光源を供給することができる。
1.格子定数aを有するGaAs基板上に設けられ、面内の格子定数awを有するIn1−xGaxAsyP1−y量子井戸層および障壁層からなる発光層を有し、前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.4%≦ε≦1.4%で、その組成が0.10≦y≦0.45であり、発光する波長が700nm以上760nm以下であることを特徴とする半導体レーザ装置。
2.格子定数aを有するGaAs基板上に設けられ、面内の格子定数awを有するIn1−xGaxAsyP1−y量子井戸層および障壁層からなる発光層を有し、前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.4%≦ε≦1.2%で、その組成が0.10≦y≦0.25であり、発光する波長が700nm以上730nm以下であることを特徴とする半導体レーザ装置。
3.格子定数aを有するGaAs基板上に設けられ、面内の格子定数awを有するIn1−xGaxAsyP1−y量子井戸層および障壁層からなる発光層を有し、前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.4%≦ε≦0.9%で、その組成が0.10≦y≦0.2であり、発光する波長が700nm以上720nm以下であることを特徴とする半導体レーザ装置。
4.格子定数aを有するGaAs基板上に設けられ、面内の格子定数awを有するIn1−xGaxAsyP1−y量子井戸層および障壁層からなる発光層を有し、前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.6%≦ε≦1.4%で、その組成が0.20≦y≦0.35であり、発光する波長が700nm以上760nm以下であることを特徴とする半導体レーザ装置。
5.格子定数aを有するGaAs基板上に設けられ、面内の格子定数awを有するIn1−xGaxAsyP1−y量子井戸層および障壁層からなる発光層を有し、前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.1%≦ε≦0.45%で、その組成が0.4≦y≦1.4であり、発光する波長が700nm以上760nm以下であることを特徴とする半導体レーザ装置。
6.格子定数aを有するGaAs基板上に設けられ、面内の格子定数awを有するIn1−xGaxAsyP1−y量子井戸層および障壁層からなる発光層を有し、前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.4%≦ε≦1.2%で、その組成が0.10≦y≦0.25であり、発光する波長が700nm以上730nm以下であることを特徴とする半導体レーザ装置。
7.所定のGaAs基板(格子定数a)上に設けられた、In1−xGaxAsyP1−y量子井戸層(面内の格子定数aw)および障壁層からなる発光層において、ε(%)=(aw−a)/a×100で定義される歪εが0.4%≦ε≦0.9%、量子井戸層の組成が0.10≦y≦0.20、波長が700nm以上720nm以下であることを特徴とする半導体発光装置を搭載したことを特徴とする半導体レーザ装置。
8.所定のGaAs基板(格子定数a)上に設けられた、In1−xGaxAsyP1−y量子井戸層(面内の格子定数aw)および障壁層からなる発光層において、ε(%)=(aw−a)/a×100で定義される歪εが0.6%≦ε≦1.4%、量子井戸層の組成が0.20≦y≦0.35、波長が725nm以上760nm以下であることを特徴とする半導体発光装置を搭載したことを特徴とする半導体レーザ装置。
Claims (10)
- 生体の表面に波長の互いに異なる複数の光信号を出射する光源装置と、
前記生体の内部を前記複数の光信号が通過して該生体の表面から放出される複数の光信号を検出する受光素子と、を備え、
前記光源装置は、サブマウント上に搭載され可視から赤外の波長範囲で互いに異なる波長を有する複数の半導体発光素子と、
前記複数の半導体発光素子に接続され光信号出力を制御して、異なる波長の光信号を放出させる駆動用回路と、
前記複数の半導体発光素子から放射される各々の光信号出力を検知する一つの光出力モニタ素子とが一つに収納されたパッケージを具備してなり、
前記一つの光出力モニタ素子で検出された複数の光信号を、該それぞれの波長を発する前記半導体発光素子に接続された前記駆動用回路の各々に帰還させることにより、前記複数の半導体発光素子の光信号出力の制御を行い、
前記パッケージはプローブに着脱可能な状態で固定され、
前記半導体発光素子の少なくとも一つが、格子定数aを有するGaAs基板上に設けられ、面内の格子定数a w を有するIn 1−x Ga x As y P 1−y 量子井戸層および障壁層からなる発光層を有し、
前記発光層は、前記量子井戸層がε(%)=(a w −a)/a×100で定義される歪εが0.4%≦ε≦1.4%で、その組成が0.10≦y≦0.45であり、発光する波長が700nm以上760nm以下であることを特徴とする生体光計測装置。 - 前記複数の光信号の波長の中で最も短い波長が、705±5nmであることを特徴とする請求項1記載の生体光計測装置。
- 前記複数の光信号のいずれかの光信号の波長が、755±5nmの範囲であることを特徴とする請求項1記載の生体光計測装置。
- 前記半導体発光素子から放射される光を拡げる手段を有することを特徴とする請求項1に記載の生体光計測装置。
- 前記半導体発光素子の光放出端面における、該光放出端面から放射される光の波長の反射率が、50%以上であることを特徴とする請求項1に記載の生体光計測装置。
- 前記半導体発光素子が、セルフパルセーション動作をすることを特徴とする請求項1に記載の生体光計測装置。
- 前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.4%≦ε≦1.2%で、その組成が0.10≦y≦0.25であり、発光する波長が700nm以上730nm以下であることを特徴とする請求項1に記載の生体光計測装置。
- 前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.4%≦ε≦0.9%で、その組成が0.10≦y≦0.2であり、発光する波長が700nm以上720nm以下であることを特徴とする請求項1に記載の生体光計測装置。
- 前記発光層は、前記量子井戸層がε(%)=(aw−a)/a×100で定義される歪εが0.6%≦ε≦1.4%で、その組成が0.20≦y≦0.35であり、発光する波長が725nm以上760nm以下であることを特徴とする請求項1に記載の生体光計測装置。
- 前記受光素子で検出された複数の光信号を受信し、該複数の光信号を波長ごとに分離する信号分離回路を備えていることを特徴とした、請求項1に記載の生体光計測装置。
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US11/984,279 US8369913B2 (en) | 2007-03-23 | 2007-11-15 | Optical measurement instrument for living body semiconductor laser installation for living body light measuring device |
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