JP5069191B2 - 光学読み取り装置 - Google Patents
光学読み取り装置 Download PDFInfo
- Publication number
- JP5069191B2 JP5069191B2 JP2008213833A JP2008213833A JP5069191B2 JP 5069191 B2 JP5069191 B2 JP 5069191B2 JP 2008213833 A JP2008213833 A JP 2008213833A JP 2008213833 A JP2008213833 A JP 2008213833A JP 5069191 B2 JP5069191 B2 JP 5069191B2
- Authority
- JP
- Japan
- Prior art keywords
- angle
- illumination light
- light source
- illumination
- dark field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000003287 optical effect Effects 0.000 title claims description 83
- 238000005286 illumination Methods 0.000 claims description 133
- 238000003384 imaging method Methods 0.000 claims description 5
- 235000012431 wafers Nutrition 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 5
- 239000000758 substrate Substances 0.000 description 4
- 238000007689 inspection Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 230000036544 posture Effects 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/141—Control of illumination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Multimedia (AREA)
- Biochemistry (AREA)
- Theoretical Computer Science (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microscoopes, Condenser (AREA)
- Studio Devices (AREA)
- Structure And Mechanism Of Cameras (AREA)
- Image Input (AREA)
- Facsimile Scanning Arrangements (AREA)
Description
200 光学読み取り装置
203 ハウジング
211 撮像素子
212 後群レンズ
213 前群レンズ
214 全反射ミラー
215 ハーフミラー
221 LED
222 コンデンサレンズ
231 LED
241a、241a 透孔
242、242 ナット
243、243 長孔
244、244 アーム
245 支持部
250 支持部材
Claims (2)
- 被写体の画像を読み取る撮影光学系および撮像素子を有する光学読み取り装置において、
前記撮影光学系の光軸に不一致な照明角度で前記被写体を照明する暗視野照明光源と、
前記暗視野照明光源の照明光を前記被写体方向に反射させる反射手段と、
前記暗視野照明光源の照明光により直接被写体を照明する第1の照明角度、または、前記暗視野照明光源の照明光の前記反射手段を介した反射によって前記被写体を照明する第2の照明角度のいずれかを得られるように前記暗視野照明光源の角度および位置を調節する調節手段を有し、
前記反射手段が、前記撮影光学系の近傍に配置された、前記暗視野照明光源とは異なる明視野照明光源および低角度暗視野照明光源を用いた照明光学系に含まれ、
前記低角度暗視野照明光源が光軸との入射角度が1°乃至3°の第1低角度暗視野照明光源と、光軸との入射角度が3°乃至5°の第2低角度暗視野照明光源からなることを特徴とする光学読み取り装置。 - 請求項1に記載の光学読み取り装置において、前記反射手段の反射角度を調節する手段を有することを特徴とする光学読み取り装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008213833A JP5069191B2 (ja) | 2008-08-22 | 2008-08-22 | 光学読み取り装置 |
US12/461,782 US8243134B2 (en) | 2008-08-22 | 2009-08-21 | Optical reader capable of changing the incident angle of dark field illumination |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008213833A JP5069191B2 (ja) | 2008-08-22 | 2008-08-22 | 光学読み取り装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010049528A JP2010049528A (ja) | 2010-03-04 |
JP5069191B2 true JP5069191B2 (ja) | 2012-11-07 |
Family
ID=41696000
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008213833A Expired - Fee Related JP5069191B2 (ja) | 2008-08-22 | 2008-08-22 | 光学読み取り装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US8243134B2 (ja) |
JP (1) | JP5069191B2 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9575008B2 (en) * | 2014-02-12 | 2017-02-21 | ASA Corporation | Apparatus and method for photographing glass in multiple layers |
US9298647B2 (en) | 2014-08-25 | 2016-03-29 | HGST Netherlands B.V. | Method and apparatus to generate zero content over garbage data when encryption parameters are changed |
IL254325B2 (en) | 2015-03-13 | 2024-03-01 | Genea Ltd | Method and device for microscopy |
US10302598B2 (en) | 2016-10-24 | 2019-05-28 | General Electric Company | Corrosion and crack detection for fastener nuts |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4222804A1 (de) * | 1991-07-10 | 1993-04-01 | Raytheon Co | Einrichtung und verfahren zur automatischen visuellen pruefung elektrischer und elektronischer baueinheiten |
US5737122A (en) * | 1992-05-01 | 1998-04-07 | Electro Scientific Industries, Inc. | Illumination system for OCR of indicia on a substrate |
JP3386269B2 (ja) * | 1995-01-25 | 2003-03-17 | 株式会社ニュークリエイション | 光学検査装置 |
JP3980722B2 (ja) * | 1997-04-03 | 2007-09-26 | 株式会社モリテックス | Ccdマイクロスコープ |
US5933521A (en) * | 1997-06-23 | 1999-08-03 | Pasic Engineering, Inc. | Wafer reader including a mirror assembly for reading wafer scribes without displacing wafers |
US6667762B1 (en) * | 1998-05-29 | 2003-12-23 | Robotic Vision Systems, Inc. | Miniature inspection system |
US6870949B2 (en) * | 2003-02-26 | 2005-03-22 | Electro Scientific Industries | Coaxial narrow angle dark field lighting |
US7823783B2 (en) * | 2003-10-24 | 2010-11-02 | Cognex Technology And Investment Corporation | Light pipe illumination system and method |
JP4825426B2 (ja) * | 2005-01-31 | 2011-11-30 | 財団法人 東京都医学総合研究所 | 生物顕微鏡に用いる暗視野照明装置 |
US20070153084A1 (en) * | 2005-12-30 | 2007-07-05 | George Deveau | Semiconductor wafer reader and illumination system |
JP3142994U (ja) * | 2008-04-22 | 2008-07-03 | 株式会社渋谷光学 | 暗視野照明装置 |
-
2008
- 2008-08-22 JP JP2008213833A patent/JP5069191B2/ja not_active Expired - Fee Related
-
2009
- 2009-08-21 US US12/461,782 patent/US8243134B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2010049528A (ja) | 2010-03-04 |
US8243134B2 (en) | 2012-08-14 |
US20100045807A1 (en) | 2010-02-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100871855B1 (ko) | 디지털 카메라를 사용한 책 스캐너 | |
JP5086687B2 (ja) | レーザ加工装置 | |
CN102095736B (zh) | 双光学放大倍率图像采集装置及图像采集控制处理系统 | |
WO2005103658A1 (ja) | 欠陥検査装置およびそれを用いた基板製造システム | |
JP5069191B2 (ja) | 光学読み取り装置 | |
CN107621692A (zh) | 一种物镜模块及显微镜 | |
JP2008064656A (ja) | 周縁検査装置 | |
CN107390449A (zh) | 照明装置及检查装置 | |
JP2012181114A (ja) | 外観検査装置 | |
JP2001027780A (ja) | 接写用レンズユニット | |
JP2020170366A5 (ja) | ||
KR100803461B1 (ko) | 촬상렌즈 및 촬상렌즈 모듈용 검사 및 조정장치 | |
JP7266514B2 (ja) | 撮像装置及び表面検査装置 | |
JP5954757B2 (ja) | 外観検査装置 | |
JP3951833B2 (ja) | 資料提示装置 | |
JP2014033049A (ja) | 板状ワーク中心検出方法 | |
CN207502807U (zh) | 一种物镜模块及显微镜 | |
JP2008128770A (ja) | レンズ性能検査装置及びレンズ性能検査方法 | |
JP2013083726A (ja) | 拡大観察装置 | |
US10996106B2 (en) | Luminous body measurement apparatus and luminous body measurement method comprising a control unit to pivot a first and a second arm to hold an image pickup device in plural postures | |
US20070153084A1 (en) | Semiconductor wafer reader and illumination system | |
JP7222765B2 (ja) | 画像測定装置 | |
KR102040564B1 (ko) | 광학식 손떨림 보정유닛 성능 검사장치 | |
TWI542860B (zh) | 適用於光學檢測的可調適照明裝置 | |
JP2011122820A (ja) | 電子部品の実装部分確認用スコープ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20110805 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20120521 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120612 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120719 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120807 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20120816 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150824 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |