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JP3705863B2 - Height measuring device and height measuring method - Google Patents

Height measuring device and height measuring method Download PDF

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Publication number
JP3705863B2
JP3705863B2 JP10909496A JP10909496A JP3705863B2 JP 3705863 B2 JP3705863 B2 JP 3705863B2 JP 10909496 A JP10909496 A JP 10909496A JP 10909496 A JP10909496 A JP 10909496A JP 3705863 B2 JP3705863 B2 JP 3705863B2
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Prior art keywords
height
light
light receiving
reference point
plane
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JPH09292218A (en
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菊雄 志村
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株式会社ソキア
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Description

【0001】
【発明の属する技術分野】
本発明は水準測量の分野にかかり、特に、平面光を使用して測定点の高さを測定する測定点の高さ測定装置及び測定点の高さ測定方法に関する。
【0002】
【従来の技術】
従来は、測定点の高さを測定するために、図5に示すようなレーザプレーナ102と、受光装置103が用いられていた。このレーザプレーナ102は、所定径の平行光線束111を、基準点101を通る鉛直線112と垂直に交差するように射出し、かつ該鉛直軸線112の回りに回転させて水準面を設定するものであり、前記平行光線束111を、測定点113上に配置された受光装置103の有する複数の受光素子115で受光するものであり、前記受光素子115を前記測定点113を通る鉛直線上に位置するように配置すれば、前記平行光線束111が照射された受光点116を検出し、測定点113からの高さを求めれば、その値と前記平行光線束111の前記基準点101からの高さとから、水準測量を行なえる。
【0003】
しかし、このようなレーザプレーナによる水準測量では、測定できる高さの範囲は、受光装置上に受光素子が配置された範囲に限定されてしまう。一般の受光装置では、受光素子は高々数センチメートルの範囲にしか配置されておらず、平行光線束を検出できる範囲が非常に狭い。そのため、基準点と測定点との高さの差が大きく、測定点上に直接受光装置を置くと平行光線束が前記受光素子に照射されないような場合は、専用の微動装置の付いた架台を用い、その上にレーザプレーナや受光装置を置いたが、それでも平行光線束を受光素子に照射させるのは容易ではなかった。
【0004】
この場合、受光装置にフォトダイオード等の受光素子を多数配置したり、長いリニアセンサを装着すれば、平行光線束を検出し得る範囲は大きくなるが、コスト高となることは避けられない(例えば実開平2-133608号参照)。
【0005】
このような不都合を解消するために、三次元座標測定システムにより高さ測量を行なうことが考えられる。図6に、三次元座標測定システムの例を示す。このシステム201は、基準点210に2つの交差する平面光2071、2072を回転軸線208を中心に回転させつつ射出する射出装置202を配置し、測定点203上に反射装置204の先端を置き、該反射装置204に配置された反射プリズム2091、2092、2093で前記2つの平面光2071、2072を反射して、前記射出装置202の備える図示しない光検出手段により受光するものであり、光検出手段の受光した信号をコンピュータで解析すれば、前記測定点203の三次元座標の値が算出できるので、測定点203の高も求めることが可能である(例えば特願平5-308035号参照)。
【0006】
しかし、このようなシステムでは、反射プリズム等の光学部品を必須とするため、受光装置が大型化せざるを得ず、取扱いに不便であるという欠点がある。
【0007】
【発明が解決しようとする課題】
本発明は上述のような従来技術にみられる問題点を解決するためになされたものであり、その目的は、システム構成が簡潔で、広い測定範囲を有し、極めて簡単に作業が行える測定点の高さ測定装置、及び高さ測定方法を提供することにある。
【0008】
【課題を解決するための手段】
前記課題を解決するために請求項1記載の発明装置は、平面光射出装置と、受光装置と、演算装置とを有し、前記平面光射出装置が配置される基準点の高さと測定点の高さの差を求める高さ測定装置であって、前記平面光射出装置は、所定角度で交差する2つの平面光を、該2つの平面光の交線が基準点を通る垂線と垂直に交わるように射出する発光手段と、前記2つの平面光を前記垂線を回転軸線として所定速度で回転させる回転手段とを有し、前記受光装置は所定位置に固定された2つの光検出手段を有し、前記演算装置は、前記光検出手段を結ぶ直線が測定点を通る鉛直線となるように前記受光装置を配置したときに、前記各光検出手段が前記2つの平面光を受光した受光時刻と、前記各光検出手段の測定点からの高さと、前記交線の基準点の高さとから、前記基準点と測定点との高さの差を算出することを特徴とし、
請求項2記載の発明装置は、請求項1記載の高さ測定装置であって、前記各光検出手段は、前記直線と垂直方向に密着配置された2つの受光素子を有することを特徴とし、
請求項3記載の発明方法は、高さ測定方法であって、所定角度で交差する2つの平面光を、該2つの平面光の交線が基準点を通る鉛直線と垂直に交わるように射出し、前記2つの平面光を前記鉛直線を回転軸線として一定速度で回転させ、前記測定点を通る鉛直線上の所定位置に配置された複数の受光点で前記2つの平面光を受光して受光時刻を検出し、前記2つの平面光の前記交線の前記基準点からの高さと、前記受光時刻と、前記所定位置とから測定点と基準点の高さの差を求めることを特徴とする。
【0009】
本発明の測定原理を図面を用いて説明する。
【0010】
図3を参照し、A1、A2は、所定角度で交差する2つの平面光であり、一の交線で交わっている。該2つの平面光A1、A2の交線は、図示しない基準点を通る垂線と垂直に交わるようにされており、前記2つの平面光A1、A2は、図面右方向に一定の角速度ωで回転しているものとする。
【0011】
2つの受光点PA、PBは、測定点P0を通る鉛直線J上に位置し、前記受光点PBは、前記測定点P0から高さbの位置に固定され、前記受光点PAは、前記受光点PBから高さdの位置に固定されている。
【0012】
前記2つの平面光A1、A2が回転した場合、前記受光点PAは前記平面光A1、A2とそれぞれ点S1、S4で交わり、前記受光点PBはそれぞれ点S2、S3で交わるものとする。このとき、前記点S1、S2、S3、S4は一つの垂直面を張る。その垂直面と前記2つの平面光A1、A2の交線とが交わる点を点S0とする。
【0013】
前記2つの平面光A1、A2が回転し、前記鉛直線Jと交差すると、受光点PAと時間間隔tAをおいて2回交わり、受光点PBと時間間隔tBをおいて2回交わる。この場合、基準点と測定点との距離をLとすると、
14 = L・ω・tA (1)
32 = L・ω・tB (2)
が成立する。
【0014】
ここで、三角形S104と三角形S302に着目すると、両三角形は相似形であることから、辺S14と辺S32の比は、該辺S14、辺S32を底辺としたときの高さの比に等しい。従って、前記(1)、(2)式により、次式、
32/S14 = tB/tA = a/(d−a) (3)
が成立する。
【0015】
ところで、基準点の高さをh0、前記2つの平面光の交線の基準点からの高さをh1とすると、測定点P0の高さHは、
H = h0 + h1 − a − b (4)
で表わされるから、(3)式を(4)式に用いてaを消去すると、
H = h0 + h1 −d・tB/(tA+tB) − b (5)
が得られる。基準点からの前記交線の高さh1は巻尺等により測定可能であり、受光点PA、PBの位置b、dは予め決まっている値であるから、結局、前記時間間隔tA、tBを測定すれば、測定点の高さHを求めることができる。
【0016】
【発明の実施の形態】
図1に本発明装置の一実施の形態の高さ測定装置を示す。
【0017】
この高さ測定装置2は、平面光射出装置10と、受光装置20と、信号処理装置23を有しており、前記平面光射出装置10は基準点3上に配置され、前記受光装置20は測定点4上に配置され、前記信号処理装置23は前記受光装置20に取付けられている。
【0018】
前記平面光射出装置10内の回転板13上には、図2に示す光学系4a、4bを有する発光手段が設けられており、該光学系4a、4bは、それぞれ発光素子6a、6bと、コリメータレンズ7a、7bと、シリンドリカルレンズ8a、8bとが設けられている。前記発光素子6a、6bからは強度変調がかけられた光が射出され、その光は、それぞれ前記コリメータレンズ7a、7bによって平行光にされ、更に前記シリンドリカルレンズ8a、8bによって、それぞれ適当な角度をもって一定平面内で扇状に広がる2つの平面光12a、12bにされて前記平面光射出装置10から射出されるように構成されている。
【0019】
このとき、前記コリメータレンズ7a、7bの光軸11a、11bは、前記回転板13の回転軸線5と垂直に交差する平面内に位置し、互いに平行になるように配置されており、且つ前記光軸11aと前記回転軸線5との間隔と、前記光軸11bと前記回転軸線5との間隔は等しくなるように配置されている。また、前記シリンドリカルレンズ8a、8bの円筒面の中心軸線は、前記光軸11a、11bとそれぞれ直角に交わるように配置され、且つ、前記回転軸線5と垂直に交わる平面に対して互いに逆向きに45°の角度を成すように傾けられている。
【0020】
従って、前記回転軸線5を前記基準点3を通る鉛直線となるように整準すると、前記2つの平面光12a、12bは、水準面に対して互いに逆向きに45°傾くこととなる。この場合、前記平面光12aと前記平面光12bとは互いに直角に交わり、両平面光が交差してできる交線16は前記回転軸線5と直角に交差する。
【0021】
なお、前記平面光12aと前記平面光12bとは、必ずしも直角に交わる必要はないが、測定の分解能を上げるためには大きく広がっている方が好ましい。
【0022】
また、前記平面光12a、12bは扇形状をしているが、その発散角は基準点と測定点の距離と、測定しなければならない高さに応じて決められる。例えば、距離が3mで500mmの高さまで測定したい場合には、発散角は約27°程でよい。
【0023】
前記平面光射出装置10には、モータを有する回転手段が設けられており、該回転手段により、前記回転板13が一定の速度で前記回転軸線5を中心に回転し得るように構成されている。
【0024】
測定点4上には、両端に光検出手段21、22が間隔dで固設された柱状の受光装置20が置かれ、該光検出手段21、22の受光面を通る軸線24が前記測定点4を通り、且つ、鉛直になるように、図示しない気泡管により整準されているので、前記回転手段の起動により、前記2つの平面光12a、12bは、回転軸線5を中心に一定速度で回転し始めると、該2つの平面光12a、12bが前記光検出手段21、22の受光面に照射される。
【0025】
この受光装置20の測定限界は、前記間隔dの大きさの半分になるので、例えば500mmの範囲の測定を行ないたい場合は、前記間隔dは1m以上必要となる。
【0026】
前記光検出手段21、22は、2つの受光素子をそれぞれ有しており、該2つの受光素子は、前記平面光12a、12bの進行方向に密着配置されている。
【0027】
この2つの受光素子を説明すると、図4を参照し、21a、21bは前記光検出手段21の有する2つの受光素子であり、前記2つの平面光12a、12bの進行方向である図面下方向に、密着配置されている。
【0028】
前記受光素子21aが出力する信号は増幅器31の反転入力端子に入力され、前記受光素子21bが出力する信号は前記増幅器31の非反転入力端子に入力されるので、前記受光素子21aと前記受光素子21bに入射する平面光の光量がほぼ等しくなったときに、前記増幅器31はパルス回路32にパルス信号を出力する。
【0029】
前記パルス信号は演算装置33に入力され、該演算装置33には、クロック回路34からクロック信号も入力されるので、前記演算装置33は前記パルス信号が入力された時刻を検出でき、この時刻を記憶装置35に記憶させる。
【0030】
従って、前記記憶装置35には、平面光が前記受光素子21aと前記受光素子21bの中央に照射されたときの時刻が記憶されるので、精度よく照射時刻を記憶することができる。
【0031】
前記光検出手段22の有する2つの受光素子も図4で示したのと同様のブロック図で演算装置33に接続されており、前記2つの平面光12a、12bが前記光検出手段21、22に照射される度にこれを行なえば、前記各光検出手段21、22に平面光が照射された時間間隔tA、tBを算出することができる。
【0032】
該記憶装置35には、基準点の高さh0と、前記光検出手段21、22の間隔dと、前記光検出手段22の底面からの高さbとが記憶されており、前記基準点3の高さh0と、基準点と平面光12a、12bの交線16の高さh1を入力しておき、前記時間間隔tA、tBを算出すれば、測定点4の高さHは、前記(5)式、
H = h0 + h1 −d・tB/(tA+tB) − b
から求めることができる。
【0033】
なお、前記演算装置33、記憶装置35は前記受光装置20の中央に取付けられた信号処理装置23中に配置されており、前記測定点の高さHは、該信号処理装置23に設けられた表示装置により表示されるように構成されており、該信号処理装置23には、前記光検出手段21、22が配置された中央の位置にマーク14が刻まれている。
【0034】
以上は光検出手段が2個配置された実施の形態について説明したが、同一の直線上に光検出手段を3個以上配置し、測定誤差を少なくするようにしてもよい。
【0035】
【発明の効果】
測定可能な高さの範囲が従来よりも広くでき、測定作業の高能率化が図れる。
【図面の簡単な説明】
【図1】 本発明装置の一実施の形態を示す図
【図2】 本発明の平面光射出装置の光学系の配置の一例を示す図
【図3】 本発明の測定原理を説明するための図
【図4】 本発明の測定回路の一例を示すブロック図
【図5】 レーザプレーナを使用した従来技術の高さ測定装置
【図6】 平面光と反射光を使用した従来技術の座標測定装置
【符号の説明】
3 基準点
4 測定点
5 回転軸線
6a、6b 発光手段
10 平面光射出装置
16 交線
12a、12b 平面光
20 受光装置
21、22 光検出手段
21a、21b 受光素子
33 演算装置
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to the field of leveling, and more particularly to a measurement point height measuring apparatus and a measurement point height measuring method for measuring the height of a measurement point using plane light.
[0002]
[Prior art]
Conventionally, in order to measure the height of a measurement point, a laser planar 102 and a light receiving device 103 as shown in FIG. 5 have been used. The laser planar 102 emits a parallel light beam 111 having a predetermined diameter so as to intersect perpendicularly with a vertical line 112 passing through the reference point 101, and rotates around the vertical axis 112 to set a level surface. The parallel light beam 111 is received by a plurality of light receiving elements 115 of a light receiving device 103 arranged on a measurement point 113, and the light receiving element 115 is positioned on a vertical line passing through the measurement point 113. If the light receiving point 116 irradiated with the parallel light beam 111 is detected and the height from the measurement point 113 is obtained, the value and the height of the parallel light beam 111 from the reference point 101 are determined. Sato can be used for leveling.
[0003]
However, in leveling with such a laser planar, the range of height that can be measured is limited to the range in which the light receiving elements are arranged on the light receiving device. In a general light receiving device, the light receiving elements are arranged only within a few centimeters at most, and the range in which the parallel light flux can be detected is very narrow. Me other, the reference point the height difference is large and the measurement point, when parallel light beams by placing the direct light receiving device on the measuring point is that not irradiated to the light receiving element, with a special fine movement device Although a frame was used and a laser planar and light receiving device were placed on it, it was still not easy to irradiate the light receiving element with a parallel light beam.
[0004]
In this case, if a large number of light receiving elements such as photodiodes are arranged in the light receiving device or a long linear sensor is attached, the range in which the parallel light flux can be detected is increased, but it is inevitable that the cost is increased (for example, (See Japanese Utility Model Publication No. 2-133608).
[0005]
In order to eliminate such an inconvenience, it is conceivable to perform height measurement using a three-dimensional coordinate measurement system. FIG. 6 shows an example of a three-dimensional coordinate measurement system. In this system 201, an emission device 202 that emits two intersecting plane lights 207 1 and 207 2 while rotating around a rotation axis 208 is arranged at a reference point 210, and the tip of the reflection device 204 is placed on a measurement point 203. Then, the two planar lights 207 1 and 207 2 are reflected by the reflecting prisms 209 1 , 209 2 , and 209 3 disposed in the reflecting device 204 and received by a light detection means (not shown) included in the emitting device 202. If the signal received by the light detection means is analyzed by a computer, the value of the three-dimensional coordinates of the measurement point 203 can be calculated, so that the height of the measurement point 203 can also be obtained (for example, Japanese Patent Application No. Hei. (See 5-308035).
[0006]
However, in such a system, an optical component such as a reflecting prism is indispensable, so that the light receiving device has to be increased in size and is inconvenient to handle.
[0007]
[Problems to be solved by the invention]
The present invention has been made in order to solve the problems found in the prior art as described above. The purpose of the present invention is to provide a measuring system with a simple system configuration, a wide measuring range, and an extremely simple operation. It is to provide a height measuring apparatus and a height measuring method.
[0008]
[Means for Solving the Problems]
In order to solve the above-mentioned problem, an invention apparatus according to claim 1 includes a planar light emitting device, a light receiving device, and a computing device, and includes a height of a reference point where the planar light emitting device is arranged and a measurement point. A height measuring device for obtaining a difference in height, wherein the planar light emitting device intersects two planar lights intersecting at a predetermined angle perpendicularly with a perpendicular line passing through a reference point. Light emitting means for emitting the light and rotating means for rotating the two plane lights at a predetermined speed with the perpendicular as a rotation axis, and the light receiving device has two light detecting means fixed at predetermined positions. When the light receiving device is arranged such that a straight line connecting the light detecting means is a vertical line passing through the measurement point, the arithmetic unit is configured to receive a light receiving time at which each of the light detecting means has received the two plane lights. , The height from the measurement point of each light detection means, and the intersection line From the height of the semi-point, characterized by calculating the difference in height between the measuring point and the reference point,
The invention apparatus according to claim 2 is the height measuring apparatus according to claim 1, wherein each of the light detection means includes two light receiving elements arranged in close contact with the straight line in a vertical direction,
According to a third aspect of the present invention, there is provided a height measurement method, wherein two plane lights intersecting at a predetermined angle are emitted such that an intersection line of the two plane lights intersects a vertical line passing through a reference point perpendicularly. Then, the two plane lights are rotated at a constant speed with the vertical line as a rotation axis, and the two plane lights are received by a plurality of light receiving points arranged at predetermined positions on the vertical line passing through the measurement points. A time is detected, and a difference between a height of the measurement point and the reference point is obtained from the height of the intersection line of the two plane lights from the reference point, the light reception time, and the predetermined position. .
[0009]
The measurement principle of the present invention will be described with reference to the drawings.
[0010]
Referring to FIG. 3, A 1 and A 2 are two plane lights that intersect at a predetermined angle, and intersect at one intersection line. The intersecting line of the two plane lights A 1 and A 2 intersects with a perpendicular passing through a reference point (not shown), and the two plane lights A 1 and A 2 are constant in the right direction of the drawing. It is assumed that it is rotating at an angular velocity ω.
[0011]
The two light receiving points P A and P B are located on a vertical line J passing through the measurement point P 0, and the light reception point P B is fixed at a position of height b from the measurement point P 0. P A is fixed at a position of height d from the light receiving point P B.
[0012]
When the two plane lights A 1 and A 2 are rotated, the light receiving point P A intersects the plane lights A 1 and A 2 at points S 1 and S 4 , respectively, and the light receiving point P B is a point S 2 respectively. , it is assumed that intersect at S 3. At this time, the points S 1 , S 2 , S 3 , S 4 form one vertical plane. A point where the vertical plane and the intersecting line of the two plane lights A 1 and A 2 intersect is defined as a point S 0 .
[0013]
When the two plane lights A 1 and A 2 rotate and intersect the vertical line J, they intersect with the light receiving point P A twice with a time interval t A and with a light receiving point P B with a time interval t B. Intersect twice. In this case, if the distance between the reference point and the measurement point is L,
S 1 S 4 = L ・ ω ・ t A (1)
S 3 S 2 = L ・ ω ・ t B (2)
Is established.
[0014]
Here, focusing on the triangle S 1 S 0 S 4 and the triangle S 3 S 0 S 2 , since both triangles are similar, the ratio of the side S 1 S 4 to the side S 3 S 2 is the side S It is equal to the ratio of the height when 1 S 4 and side S 3 S 2 are the bottom side. Therefore, according to the above equations (1) and (2),
S 3 S 2 / S 1 S 4 = t B / t A = a / (da) (3)
Is established.
[0015]
By the way, if the height of the reference point is h 0 and the height from the reference point of the intersection of the two plane lights is h 1 , the height H of the measurement point P 0 is
H = h 0 + h 1 -a-b (4)
Therefore, if a is deleted using equation (3) in equation (4),
H = h 0 + h 1 −d · t B / (t A + t B ) −b (5)
Is obtained. The height h 1 of the line of intersection of the reference point can be measured by a tape measure or the like, the light receiving point P A, the position b of P B, since d is a value determined in advance, after all, the time interval t A , T B is measured, the height H of the measurement point can be obtained.
[0016]
DETAILED DESCRIPTION OF THE INVENTION
FIG. 1 shows a height measuring apparatus according to an embodiment of the apparatus of the present invention.
[0017]
The height measuring device 2 includes a planar light emitting device 10, a light receiving device 20, and a signal processing device 23. The planar light emitting device 10 is disposed on a reference point 3, and the light receiving device 20 is Arranged on the measurement point 4, the signal processing device 23 is attached to the light receiving device 20.
[0018]
On the rotating plate 13 in the planar light emitting device 10, light emitting means having optical systems 4a and 4b shown in FIG. 2 are provided. The optical systems 4a and 4b are respectively light emitting elements 6a and 6b, and Collimator lenses 7a and 7b and cylindrical lenses 8a and 8b are provided. The light-emitting elements 6a and 6b emit intensity-modulated light, and the light is collimated by the collimator lenses 7a and 7b, respectively, and further by the cylindrical lenses 8a and 8b at appropriate angles. It is configured to be emitted from the planar light emitting device 10 into two planar lights 12a and 12b spreading in a fan shape within a certain plane.
[0019]
At this time, the optical axes 11a and 11b of the collimator lenses 7a and 7b are located in a plane perpendicular to the rotation axis 5 of the rotating plate 13 and are arranged in parallel to each other, and the light The distance between the shaft 11a and the rotation axis 5 and the distance between the optical axis 11b and the rotation axis 5 are arranged to be equal. Further, the central axes of the cylindrical surfaces of the cylindrical lenses 8a and 8b are arranged so as to intersect with the optical axes 11a and 11b at right angles, respectively, and are opposite to each other with respect to a plane perpendicular to the rotation axis 5 It is tilted at an angle of 45 °.
[0020]
Therefore, when the rotation axis 5 is leveled so as to be a vertical line passing through the reference point 3, the two plane lights 12a and 12b are inclined 45 ° in opposite directions with respect to the level surface. In this case, the planar light 12a and the planar light 12b intersect each other at a right angle, and an intersecting line 16 formed by the intersection of the both planar lights intersects the rotation axis 5 at a right angle.
[0021]
Note that the planar light 12a and the planar light 12b do not necessarily intersect at right angles, but it is preferable that the planar light 12a and the planar light 12b are greatly spread in order to increase the measurement resolution.
[0022]
The planar lights 12a and 12b have a fan shape, and the divergence angle is determined according to the distance between the reference point and the measurement point and the height to be measured. For example, when it is desired to measure to a height of 500 mm at a distance of 3 m, the divergence angle may be about 27 °.
[0023]
The planar light emitting device 10 is provided with a rotating means having a motor, and is configured such that the rotating plate 13 can rotate around the rotation axis 5 at a constant speed by the rotating means. .
[0024]
On the measurement point 4, a columnar light receiving device 20 having light detection means 21 and 22 fixed at intervals d is placed on both ends, and an axis line 24 passing through the light receiving surface of the light detection means 21 and 22 is the measurement point. 4 and is leveled by a bubble tube (not shown) so as to be vertical, the two plane lights 12a and 12b are moved at a constant speed around the rotation axis 5 by the activation of the rotating means. When the rotation starts, the two plane lights 12a and 12b are applied to the light receiving surfaces of the light detecting means 21 and 22.
[0025]
Since the measurement limit of the light receiving device 20 is half of the size of the distance d, the distance d needs to be 1 m or more in order to measure in the range of 500 mm, for example.
[0026]
The light detection means 21 and 22 have two light receiving elements, respectively, and the two light receiving elements are arranged in close contact with each other in the traveling direction of the planar lights 12a and 12b.
[0027]
The two light receiving elements will be described. Referring to FIG. 4, reference numerals 21a and 21b denote two light receiving elements included in the light detecting means 21, and the lower direction in the drawing, which is the traveling direction of the two planar lights 12a and 12b. , Are in close contact.
[0028]
Since the signal output from the light receiving element 21a is input to the inverting input terminal of the amplifier 31, and the signal output from the light receiving element 21b is input to the non-inverting input terminal of the amplifier 31, the light receiving element 21a and the light receiving element The amplifier 31 outputs a pulse signal to the pulse circuit 32 when the amount of planar light incident on 21b becomes substantially equal.
[0029]
The pulse signal is input to the arithmetic device 33, and the clock signal is also input from the clock circuit 34 to the arithmetic device 33, so that the arithmetic device 33 can detect the time when the pulse signal is input, The data is stored in the storage device 35.
[0030]
Therefore, the storage device 35 stores the time when the plane light is irradiated to the center of the light receiving element 21a and the light receiving element 21b, so that the irradiation time can be accurately stored.
[0031]
The two light receiving elements of the light detection means 22 are also connected to the arithmetic unit 33 in the same block diagram as shown in FIG. 4, and the two planar lights 12a and 12b are connected to the light detection means 21 and 22, respectively. If this is performed each time the light is irradiated, the time intervals t A and t B when the light detection means 21 and 22 are irradiated with the plane light can be calculated.
[0032]
The storage device 35 stores a reference point height h 0 , a distance d between the light detection means 21 and 22, and a height b from the bottom surface of the light detection means 22. If the height h 0 of 3 and the height h 1 of the intersection 16 of the reference point and the plane lights 12a and 12b are input and the time intervals t A and t B are calculated, the height of the measurement point 4 is calculated. H is the formula (5),
H = h 0 + h 1 -d · t B / (t A + t B) - b
Can be obtained from
[0033]
The arithmetic device 33 and the storage device 35 are disposed in a signal processing device 23 attached to the center of the light receiving device 20, and the height H of the measurement point is provided in the signal processing device 23. The signal processing device 23 is configured to be displayed by a display device, and a mark 14 is engraved on the signal processing device 23 at a central position where the light detection means 21 and 22 are arranged.
[0034]
Although the embodiment in which two light detection means are arranged has been described above, three or more light detection means may be arranged on the same straight line so as to reduce the measurement error.
[0035]
【The invention's effect】
The range of height that can be measured can be made wider than before, and the efficiency of measurement work can be improved.
[Brief description of the drawings]
FIG. 1 is a diagram showing an embodiment of the device of the present invention. FIG. 2 is a diagram showing an example of the arrangement of the optical system of the planar light emitting device of the present invention. FIG. 4 is a block diagram showing an example of the measurement circuit of the present invention. FIG. 5 is a conventional height measuring device using a laser planar. FIG. 6 is a conventional coordinate measuring device using plane light and reflected light. [Explanation of symbols]
3 Reference point 4 Measurement point 5 Rotating axis 6a, 6b Light emitting means 10 Plane light emitting device 16 Intersection line 12a, 12b Plane light 20 Light receiving device 21, 22 Light detecting means 21a, 21b Light receiving element 33 Arithmetic unit

Claims (3)

平面光射出装置と、受光装置と、演算装置とを有し、前記平面光射出装置が配置される基準点の高さと測定点の高さの差を求める高さ測定装置であって、
前記平面光射出装置は、
所定角度で交差する2つの平面光を、該2つの平面光の交線が基準点を通る垂線と垂直に交わるように射出する発光手段と、
前記2つの平面光を前記垂線を回転軸線として所定速度で回転させる回転手段とを有し、
前記受光装置は所定位置に固定された2つの光検出手段を有し、
前記演算装置は、
前記光検出手段を結ぶ直線が測定点を通る鉛直線となるように前記受光装置を配置したときに、前記各光検出手段が前記2つの平面光を受光した受光時刻と、前記各光検出手段の測定点からの高さと、前記交線の基準点の高さとから、前記基準点と測定点との高さの差を算出することを特徴とする高さ測定装置。
A height measuring device that includes a planar light emitting device, a light receiving device, and an arithmetic device, and obtains a difference between a height of a reference point on which the planar light emitting device is arranged and a height of a measurement point,
The planar light emitting device is
Light emitting means for emitting two plane lights intersecting at a predetermined angle so that an intersection line of the two plane lights intersects perpendicularly with a perpendicular passing through a reference point;
Rotating means for rotating the two plane lights at a predetermined speed with the perpendicular as a rotation axis;
The light receiving device has two light detection means fixed at predetermined positions,
The arithmetic unit is:
When the light receiving device is arranged so that a straight line connecting the light detecting means is a vertical line passing through the measurement point, the light receiving times when the light detecting means receive the two plane lights, and the light detecting means A height measuring apparatus that calculates a difference in height between the reference point and the measurement point from a height from the measurement point and a height of the reference point of the intersection line.
前記各光検出手段は、前記直線と垂直方向に密着配置された2つの受光素子を有することを特徴とする請求項1記載の高さ測定装置。2. The height measuring apparatus according to claim 1, wherein each of the light detection means includes two light receiving elements arranged in close contact with the straight line in a vertical direction. 所定角度で交差する2つの平面光を、該2つの平面光の交線が基準点を通る鉛直線と垂直に交わるように射出し、
前記2つの平面光を前記鉛直線を回転軸線として一定速度で回転させ、
測定点を通る鉛直線上の所定位置に配置された複数の受光点で前記2つの平面光を受光して受光時刻を検出し、
前記2つの平面光の前記交線の前記基準点からの高さと、前記受光時刻と、前記所定位置とから測定点と基準点の高さの差を求めることを特徴とする高さ測定方法。
Two plane lights that intersect at a predetermined angle are emitted so that the line of intersection of the two plane lights intersects perpendicularly with a vertical line passing through a reference point,
The two plane lights are rotated at a constant speed with the vertical line as a rotation axis,
Receiving the two plane lights at a plurality of light receiving points arranged at predetermined positions on a vertical line passing through the measurement point, and detecting a light reception time;
A height measurement method, wherein a difference between a height of a measurement point and a reference point is obtained from a height of the intersection line of the two plane lights from the reference point, the light reception time, and the predetermined position.
JP10909496A 1996-04-30 1996-04-30 Height measuring device and height measuring method Expired - Fee Related JP3705863B2 (en)

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Application Number Priority Date Filing Date Title
JP10909496A JP3705863B2 (en) 1996-04-30 1996-04-30 Height measuring device and height measuring method

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JP3816807B2 (en) 2002-01-21 2006-08-30 株式会社トプコン Position measuring device and rotating laser device used therefor
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CN112504135B (en) * 2020-11-30 2022-06-24 深圳市科曼医疗设备有限公司 Height detection device and detection method thereof
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