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JP2823019B2 - Pure water vapor drying method - Google Patents

Pure water vapor drying method

Info

Publication number
JP2823019B2
JP2823019B2 JP17568689A JP17568689A JP2823019B2 JP 2823019 B2 JP2823019 B2 JP 2823019B2 JP 17568689 A JP17568689 A JP 17568689A JP 17568689 A JP17568689 A JP 17568689A JP 2823019 B2 JP2823019 B2 JP 2823019B2
Authority
JP
Japan
Prior art keywords
container
pure water
water vapor
drying
vapor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP17568689A
Other languages
Japanese (ja)
Other versions
JPH0341730A (en
Inventor
節夫 長島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17568689A priority Critical patent/JP2823019B2/en
Publication of JPH0341730A publication Critical patent/JPH0341730A/en
Application granted granted Critical
Publication of JP2823019B2 publication Critical patent/JP2823019B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Drying Of Solid Materials (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Description

【発明の詳細な説明】 〔概要〕 半導体装置に使用されるウェハやガラス基板等を洗浄
した後に乾燥する方法、特に純水を使用してこれらの被
洗浄物を乾燥する方法に関し、 有機溶剤のような危険性がなく且つ高純度な洗浄・乾
燥の品質が得られ、更に容易且つ安価に入手できる純水
を使用した純水ベーパ乾燥方法を得ることを目的とし、 上側が密閉した容器の下方で純水を沸騰させて純水ベ
ーパを容器内の上部へ導くと共に、該容器の下部より容
器内の空気を抜いて該容器内に純水ベーパを充満させ、
ついで容器内の温度を下げて純水ベーパの層を容器内の
下方へ移動させることにより、容器内の被洗浄物を乾燥
させることを特徴とする純水ベーパ乾燥方法を構成す
る。
DETAILED DESCRIPTION OF THE INVENTION [Summary] The present invention relates to a method of cleaning and drying a wafer or a glass substrate used in a semiconductor device, and more particularly to a method of drying these objects to be cleaned using pure water. The purpose is to obtain a pure water vapor drying method using pure water, which is free of such danger and has high-purity washing and drying quality, and is easily and inexpensively available. While boiling the pure water at the top and guiding the pure water vapor to the upper part of the container, the air in the container is evacuated from the lower part of the container and the container is filled with pure water vapor,
Then, a pure water vapor drying method is characterized in that the object to be cleaned in the container is dried by lowering the temperature in the container and moving the layer of pure water vapor downward in the container.

〔産業上の利用分野〕[Industrial applications]

本発明は半導体装置に使用されるウェハやガラス基板
等を洗浄した後に乾燥する方法、特に純水を使用してこ
れらの被洗浄物を乾燥する方法に関する。
The present invention relates to a method of cleaning and drying a wafer or a glass substrate used in a semiconductor device, and more particularly to a method of drying these objects to be cleaned using pure water.

各種産業において、爆発の危険や環境汚染の問題を生
じさせることなく、安全且つ高性能に洗浄・乾燥を行う
ことが要求されている。特に、近年の半導体産業では、
ウェハの洗浄に高性能の洗浄技術が要求されており、中
でも最終の洗浄乾燥技術が重要であり、乾燥時にゴミ等
を付着させないことが必要である。また、環境に悪影響
を及ぼす危険のある各種有機溶剤は環境保全の見地から
今後は洗浄に使用できなくなる可能性が充分にある。従
って、これらの被洗浄物に対する乾燥に安全且つ高性能
な技術の確立が要求される。
2. Description of the Related Art In various industries, there is a demand for safe and high-performance washing and drying without causing a risk of explosion or environmental pollution. In particular, in the recent semiconductor industry,
A high-performance cleaning technique is required for cleaning a wafer, and the final cleaning and drying technique is particularly important, and it is necessary to prevent dust and the like from adhering during drying. Further, there is a possibility that various organic solvents having a risk of adversely affecting the environment can no longer be used for cleaning from the viewpoint of environmental protection. Therefore, it is required to establish a safe and high-performance technique for drying these objects to be cleaned.

〔従来の技術〕[Conventional technology]

従来、半導体素子に使用されるウェハの最終段階の乾
燥方法として、フレオンベーパ、IPAベーパ、スピン乾
燥、自然乾燥、ドライガスブロー等の方法があった。こ
れらの方法にはそれぞれに長所、短所がある。その中で
有機溶剤のベーパによる乾燥が広く利用されている。そ
の理由として、有機溶剤は分子の極性が大きく、ベーパ
の密度が空気密度より高いため、容易にベーパゾーンが
作れ高い洗浄効果が得られるためである。しかしなが
ら、有機溶剤を使用した洗浄・乾燥方法は高い洗浄度が
得られるものの、大気汚染、可燃性、発癌性等の理由で
今後使用制限が厳しくなる。また、他の洗浄・乾燥方法
では、有機溶剤のベーパ乾燥程の高い洗浄度は得られて
いないのが現状である。
Conventionally, as a drying method at the final stage of a wafer used for a semiconductor element, there have been methods such as freon vapor, IPA vapor, spin drying, natural drying, and dry gas blowing. Each of these methods has advantages and disadvantages. Among them, drying of organic solvents by vapor is widely used. This is because the organic solvent has a large molecular polarity and the vapor density is higher than the air density, so that a vapor zone can be easily formed and a high cleaning effect can be obtained. However, although the washing / drying method using an organic solvent can provide a high degree of washing, use restrictions will be stricter in the future because of air pollution, flammability, carcinogenicity and the like. Further, at present, other cleaning / drying methods cannot obtain a high degree of cleaning as high as vapor drying of an organic solvent.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

上記のように有機溶剤によるベーパ乾燥は今後使用が
制限され、溶剤の回収設備や安全対策のための費用が嵩
み、また代替薬品の開発等にも大きな費用がかかる。
As described above, the use of vapor drying with an organic solvent will be restricted in the future, and the cost for solvent recovery equipment and safety measures will increase, and the development of alternative chemicals will also require large costs.

そこで、本発明は、有機溶剤のような危険性がなく且
つ高純度な洗浄・乾燥の品質が得られ、更に容易且つ安
価に入手できる純水を使用した純水ベーパ乾燥方法を提
供することを目的とする。
Therefore, the present invention provides a pure water vapor drying method using pure water that is free from dangers such as organic solvents and can be obtained with high-purity washing and drying qualities and that can be obtained easily and inexpensively. Aim.

〔課題を解決するための手段〕[Means for solving the problem]

このような課題を解決するために、本発明によれば、
上側が密閉した容器の下方で純水を沸騰させて純水ベー
パを容器内の上部へ導くと共に、該容器の下部より容器
内の空気を抜いて該容器内に純水ベーパを充満させ、つ
いで容器内の温度を下げて純水ベーパの層を容器内の下
方へ移動させることにより、容器内の被洗浄物を乾燥さ
せることを特徴とする純水ベーパ乾燥方法が提供され
る。
To solve such a problem, according to the present invention,
The pure water is boiled below the closed container on the upper side to guide the pure water vapor to the upper part of the container, and the air in the container is evacuated from the lower part of the container to fill the container with pure water vapor. A method for drying pure water vapor, characterized in that the object to be cleaned is dried by lowering the temperature in the container and moving the layer of pure water vapor downward in the container.

〔作用〕[Action]

被洗浄物を容器に入れた後、上記のように容器内に高
温の純水ベーパを充満させる。被洗浄物は最初は湿潤状
態にあり、容器内のベーパより温度が低いので、凝縮し
た液滴が被洗浄物の表面に付着し、汚れを洗い落とす。
被洗浄物の温度が上昇すると液滴はもはや付着しなくな
り乾燥状態となる。この時点で、容器内の温度を下げて
純水ベーパの層を容器内の下方へ移動させ、被洗浄物を
容器上部より取り出す。
After the object to be cleaned is placed in the container, the container is filled with high-temperature pure water vapor as described above. Since the object to be cleaned is initially in a wet state and has a lower temperature than the vapor in the container, condensed droplets adhere to the surface of the object to be cleaned and wash away dirt.
When the temperature of the object to be cleaned rises, the droplets no longer adhere and become dry. At this time, the temperature in the container is lowered, the layer of pure water vapor is moved downward in the container, and the object to be cleaned is taken out from the upper portion of the container.

〔実施例〕〔Example〕

以下、添付図面を参照して本発明の実施例を詳細に説
明する。
Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

第1図は本発明の純水ベーパ乾燥方法の原理図であ
る。上側が密閉した容器1の下方に純水溜2があり、更
にその下側にヒーター3がある。純水がヒーター3によ
り加熱され沸騰すると、純水ベーパが上昇し容器1の上
部に導かれる。容器1内にあった空気は容器1の下部よ
りフィルタ4を通し外部に出される。このようにして容
器1内にはその上部より純水ベーパ層が形成される。容
器1の内壁に沿って螺旋状の冷却水導管5が設けられい
て、この冷却水導管5に冷却水が供給される。これによ
り、容器1の内部が冷却されるので、純水ベーパ層は容
器1内の下方へ移動する。この過程で、容器1内の被洗
浄物10の乾燥が行われる。
FIG. 1 is a principle diagram of a pure water vapor drying method of the present invention. A pure water reservoir 2 is provided below the container 1 whose upper side is sealed, and a heater 3 is provided below the pure water reservoir 2. When the pure water is heated and boiled by the heater 3, the pure water vapor rises and is led to the upper part of the container 1. The air in the container 1 is discharged from the lower part of the container 1 through the filter 4. Thus, a pure water vapor layer is formed in the container 1 from above. A spiral cooling water conduit 5 is provided along the inner wall of the container 1, and cooling water is supplied to the cooling water conduit 5. Thereby, the inside of the container 1 is cooled, so that the pure water vapor layer moves downward in the container 1. In this process, the object to be cleaned 10 in the container 1 is dried.

第2図は本発明の純水ベーパ乾燥方法の実施例であ
る。この実施例は、例えば半導体用のウェハやガラス基
板等の最終の洗浄・乾燥工程で使用されているものであ
る。容器1の上部には開閉可能な蓋12があり、キャリア
13に搭載された被洗浄物10が蓋12の開いている間に容器
1内へ搬入、搬出できる。容器1の内部は例えばステン
レス製の金網14により上部と下部に分けられている。容
器1の上部には第1図の冷却水導管5と同様の導管5が
容器1の内壁に沿って螺旋状に設けられている。但し、
この導管5には、冷却水を供給して容器を冷却するだけ
でなく、高温(例えば140℃程度)の水蒸気を供給して
容器1の上部域を加熱することもできる。容器1の下部
には別の冷却・加熱用配管15が設けてある。この配管15
にも冷却水又は高温(例えば140℃程度)水蒸気を供給
して、容器1の下部域を冷却・加熱することができる。
配管15には多数の冷却・加熱フィン16が取付けてある。
容器1の下部には第1図と同様にフィルタ4を介して外
部と連通されている個所がある。第1図と同様、容器1
の下方には純水溜2及びヒーター3があるが、実施例で
は、更に純水溜2の周囲に、純水溜2から溢流した水又
は容器1内で凝結しかつ落下した水分を受ける溢流溜17
があり、この溢流溜17の純水は純水循環ポンプ18及びフ
ィルタ19により純水溜2に戻される。
FIG. 2 shows an embodiment of the pure water vapor drying method of the present invention. This embodiment is used in a final cleaning / drying step of, for example, a semiconductor wafer or a glass substrate. At the top of the container 1, there is a lid 12 which can be opened and closed.
The object to be cleaned 10 mounted on 13 can be carried into and out of the container 1 while the lid 12 is open. The inside of the container 1 is divided into an upper portion and a lower portion by a stainless steel wire net 14, for example. At the upper part of the container 1, a conduit 5 similar to the cooling water conduit 5 of FIG. 1 is provided spirally along the inner wall of the container 1. However,
In addition to supplying cooling water to the conduit 5 to cool the container, high-temperature (for example, about 140 ° C.) steam can be supplied to heat the upper region of the container 1. Another cooling / heating pipe 15 is provided in the lower part of the container 1. This piping 15
Also, cooling water or high-temperature (for example, about 140 ° C.) steam can be supplied to cool and heat the lower region of the container 1.
A number of cooling / heating fins 16 are attached to the pipe 15.
As shown in FIG. 1, a lower portion of the container 1 has a portion that is communicated with the outside via a filter 4. Container 1 as in FIG.
There is a pure water reservoir 2 and a heater 3 below the water reservoir. In this embodiment, an overflow reservoir receiving water overflowing from the pure water reservoir 2 or water condensed and dropped in the container 1 is further provided around the pure water reservoir 2. 17
The pure water in the overflow reservoir 17 is returned to the pure water reservoir 2 by the pure water circulation pump 18 and the filter 19.

第2図の実施例による乾燥工程は次の通りである。ま
ず、容器1上部の蓋12を閉じた状態で、ヒーター3にて
純水を加熱し沸騰状態にして容器1の上部にベーパ層を
形成する。コイル状の導管5にはまだ冷却水を流さない
でおく。被洗浄物10を入れたキャリア13をこの容器1に
入れる直前に、冷却水を配管5、15に流し、容器1内の
上部域におけるベーパ層を取り除く。この状態にて容器
1上部の蓋12を開き、キャリア13を容器1に入れて金網
14上にセットする。
The drying process according to the embodiment of FIG. 2 is as follows. First, with the lid 12 on the upper portion of the container 1 closed, pure water is heated by the heater 3 to a boiling state, and a vapor layer is formed on the upper portion of the container 1. Cooling water has not yet flowed into the coiled conduit 5. Immediately before the carrier 13 containing the object 10 to be washed is placed in the container 1, cooling water is supplied to the pipes 5 and 15 to remove the vapor layer in the upper region of the container 1. In this state, the lid 12 on the upper part of the container 1 is opened, and the carrier 13 is put into the container 1 and the wire mesh is
Set on 14.

蓋12を閉じ、配管5、15への冷却水の供給を止める
と、再び純水ベーパ層が上昇する。これにより、洗浄物
であるウェハ10を上述のように洗浄しかつ乾燥させる。
このとき、純水ベーパの上昇を促進するために、配管
5、15に溜まった冷却水をエアーで押し出すか、又は上
述のように高温(例えば140℃程度)水蒸気を流して冷
却水を即座に押し出しかつ容器1を加熱する。
When the lid 12 is closed and the supply of the cooling water to the pipes 5 and 15 is stopped, the pure water vapor layer rises again. As a result, the wafer 10 to be cleaned is cleaned and dried as described above.
At this time, in order to promote the rise of the pure water vapor, the cooling water accumulated in the pipes 5 and 15 is pushed out with air, or the high-temperature (for example, about 140 ° C.) steam is flowed as described above to immediately cool the cooling water. Extrude and heat vessel 1.

乾燥後、取り出す時は、再度配管5、15に冷却水を流
し、容器内の純水ベーパを取り除いてから、蓋12を開け
てキャリア13ごと取り出す。
After the drying, when taking out the carrier, the cooling water is flown again into the pipes 5 and 15 to remove the pure water vapor in the container, and then the cover 12 is opened and the carrier 13 is taken out.

〔発明の効果〕〔The invention's effect〕

以上に説明したように、本発明によれば、純水ベーパ
を用いて乾燥を行うことにより、従来の有機溶剤ベーパ
乾燥方法に比べ、爆発の危険、大気汚染や発癌性等の問
題は全くなく、溶剤の回収や廃棄のための費用も必要と
しない。また、純水は溶剤よりも高純度のものが容易に
入手できるので、高い洗浄効果を期待できる。
As described above, according to the present invention, by performing drying using pure water vapor, there is no problem such as explosion risk, air pollution and carcinogenicity as compared with the conventional organic solvent vapor drying method. Also, there is no need for cost for solvent recovery and disposal. Further, since pure water having a higher purity than the solvent can be easily obtained, a high cleaning effect can be expected.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の原理を示す概略図、第2図は本発明の
実施例の構成を示す図である。 1……容器、12……開閉蓋、 2……純水溜、13……キャリア、 3……ヒータ、14……金網、 4……フィルタ、15……冷却・加熱用配管、 5……冷却・加熱用導管、16……フィン、 10……被洗浄物、17……溢流溜、 18……純水循環ポンプ、 19……フィルタ。
FIG. 1 is a schematic diagram showing the principle of the present invention, and FIG. 2 is a diagram showing the configuration of an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1 ... Container, 12 ... Opening / closing lid, 2 ... Pure water reservoir, 13 ... Carrier, 3 ... Heater, 14 ... Wire mesh, 4 ... Filter, 15 ... Cooling / heating piping, 5 ... Cooling・ Heating conduit, 16 fins, 10 objects to be cleaned, 17 overflow reservoir, 18 pure water circulation pump, 19 filters.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】上側が密閉した容器(1)の下方で純水を
沸騰させて純水ベーパを容器内の上部へ導くと共に、該
容器の下部より容器内の空気を抜いて該容器内に純水ベ
ーパを充満させ、ついで容器内の温度を下げて純水ベー
パの層を容器内の下方へ移動させることにより、容器内
の被洗浄物(10)を乾燥させることを特徴とする純水ベ
ーパ乾燥方法。
1. Boiling pure water below a closed container (1) to guide pure water vapor to an upper portion of the container, and bleeding air from the lower portion of the container to remove the air from the container. Pure water characterized by drying the object to be cleaned (10) in the container by filling the container with pure water vapor and then lowering the temperature in the container and moving the layer of pure water vapor downward in the container. Vapor drying method.
JP17568689A 1989-07-10 1989-07-10 Pure water vapor drying method Expired - Fee Related JP2823019B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17568689A JP2823019B2 (en) 1989-07-10 1989-07-10 Pure water vapor drying method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17568689A JP2823019B2 (en) 1989-07-10 1989-07-10 Pure water vapor drying method

Publications (2)

Publication Number Publication Date
JPH0341730A JPH0341730A (en) 1991-02-22
JP2823019B2 true JP2823019B2 (en) 1998-11-11

Family

ID=16000468

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17568689A Expired - Fee Related JP2823019B2 (en) 1989-07-10 1989-07-10 Pure water vapor drying method

Country Status (1)

Country Link
JP (1) JP2823019B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW555651B (en) * 1998-04-14 2003-10-01 Fuji Photo Film Co Ltd Paper feeding cassette printer for use with paper feeding cassette and paper feeding method
JP4852079B2 (en) * 2008-09-09 2012-01-11 株式会社東芝 Paper feeder

Also Published As

Publication number Publication date
JPH0341730A (en) 1991-02-22

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