JP2015519009A - ファセットミラー - Google Patents
ファセットミラー Download PDFInfo
- Publication number
- JP2015519009A JP2015519009A JP2015513078A JP2015513078A JP2015519009A JP 2015519009 A JP2015519009 A JP 2015519009A JP 2015513078 A JP2015513078 A JP 2015513078A JP 2015513078 A JP2015513078 A JP 2015513078A JP 2015519009 A JP2015519009 A JP 2015519009A
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- JP
- Japan
- Prior art keywords
- facet
- mirror
- facet mirror
- optical unit
- exposure apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/002—Arrays of reflective systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0019—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having reflective surfaces only (e.g. louvre systems, systems with multiple planar reflectors)
- G02B19/0023—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having reflective surfaces only (e.g. louvre systems, systems with multiple planar reflectors) at least one surface having optical power
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0095—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with ultraviolet radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
- G02B27/425—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application in illumination systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
- G02B5/0891—Ultraviolet [UV] mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1861—Reflection gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/702—Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70575—Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Optical Elements Other Than Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Abstract
Description
10 EUV放射線
13 視野ファセットミラー
14 瞳ファセットミラー
42 1次の回折光
Claims (15)
- 投影露光装置(1)の照明光学ユニット(4)のためのファセットミラー(14)であって、
特定の限界周波数よりも高い空間周波数を減衰させるための手段がそれぞれ設けられた多数のファセット(14a)、
を含むことを特徴とするファセットミラー(14)。 - 空間周波数を減衰させるための前記ファセット(14a)には、散乱関数が備えられることを特徴とする請求項1に記載のファセットミラー(14)。
- 前記散乱関数は、1次元散乱関数であることを特徴とする請求項2に記載のファセットミラー(14)。
- 前記散乱関数は、少なくとも0.1mradの散乱角(σ)を有することを特徴とする請求項2及び請求項3のいずれか1項に記載のファセットミラー(14)。
- 前記ファセット(14a)は、円筒面区画からなる反射面(43)をそれぞれ有することを特徴とする請求項1から請求項4のいずれか1項に記載のファセットミラー(14)。
- 投影露光装置(1)の照明光学ユニット(4)のためのファセットミラー(13)であって、
多数のファセット(13a)、
を含み、
a.前記ファセット(13a)には、赤外線領域の波長を有する放射線(36)を回折するための少なくとも1つの回折構造がそれぞれ設けられ、
b.前記回折構造は、最大で5mmの格子周期(p)を有する、
ことを特徴とするファセットミラー(13)。 - 投影露光装置(1)内の物体視野(5)を照明するための照明光学ユニット(4)であって、
a.第1のファセットミラー(13)、及び
b.請求項1から請求項5のいずれか1項に記載の第2のファセットミラー(14)、
を含み、
c.前記第1のファセットミラー(13)は、少なくとも1つの方向に少なくとも0.2mm-1の空間周波数を有する構造を少なくとも各領域に有する、
ことを特徴とする照明光学ユニット(4)。 - 前記第2のファセットミラー(14)の前記ファセット(14a)の前記空間周波数を減衰させるための手段は、前記第1のファセットミラー(13)の前記ファセット(13a)の前記構造に対してこの構造の該空間周波数が前記物体視野(5)の領域内で最大で1%のコントラストを有するように整合されることを特徴とする請求項7に記載の照明光学ユニット(4)。
- 前記第1のファセットミラー(13)の前記構造は、バイナリ位相格子を形成することを特徴とする請求項7及び請求項8のいずれか1項に記載の照明光学ユニット(4)。
- 前記バイナリ位相格子は、遮蔽される波長(λex)の4分の1にちょうど対応する溝深さ(d)を有することを特徴とする請求項9に記載の照明光学ユニット(4)。
- 前記バイナリ位相格子は、遮蔽される波長(λex)を有する放射線の1次及び−1次の回折が、結像放射線(10)の像が収まる瞳ファセット(14a)の近くに位置する前記第2のファセットミラー(14)のファセット(14a)上に結像されるように、該第2のファセットミラー(14)の該ファセット(14a)の構成に整合された格子周期(p)を有することを特徴とする請求項8から請求項10のいずれか1項に記載の照明光学ユニット(4)。
- EUV投影露光装置(1)のための照明系であって、
a.請求項7から請求項11のいずれか1項に記載の照明光学ユニット(4)、及び
b.EUV放射線源(3)、
を含むことを特徴とする照明系。 - マイクロリソグラフィのための投影露光装置(1)であって、
請求項7から請求項11のいずれか1項に記載の照明光学ユニット(4)、
を含むことを特徴とする投影露光装置(1)。 - 微細構造化又はナノ構造化構成要素を生成する方法であって、
感光材料で作られた層が少なくとも部分的に塗布された基板を与える段階と、
結像される構造を有するレチクルを与える段階と、
請求項13に記載の投影露光装置(1)を与える段階と、
前記投影露光装置(1)を用いて前記レチクルの少なくとも一部を前記基板の前記感光層の領域上に投影する段階と、
を含むことを特徴とする方法。 - 請求項14に記載の方法によって生成された構成要素。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261650568P | 2012-05-23 | 2012-05-23 | |
DE102012010093.0 | 2012-05-23 | ||
DE102012010093A DE102012010093A1 (de) | 2012-05-23 | 2012-05-23 | Facettenspiegel |
US61/650,568 | 2012-05-23 | ||
PCT/EP2013/059427 WO2013174644A1 (en) | 2012-05-23 | 2013-05-07 | Facet mirror |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2015519009A true JP2015519009A (ja) | 2015-07-06 |
JP2015519009A5 JP2015519009A5 (ja) | 2017-11-09 |
JP6504506B2 JP6504506B2 (ja) | 2019-04-24 |
Family
ID=49546795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015513078A Active JP6504506B2 (ja) | 2012-05-23 | 2013-05-07 | ファセットミラー |
Country Status (6)
Country | Link |
---|---|
US (1) | US10599041B2 (ja) |
JP (1) | JP6504506B2 (ja) |
CN (1) | CN104335096B (ja) |
DE (1) | DE102012010093A1 (ja) |
TW (1) | TWI639850B (ja) |
WO (1) | WO2013174644A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018527612A (ja) * | 2015-08-25 | 2018-09-20 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置のための抑制フィルタ、放射コレクタ及び放射源、並びに抑制フィルタの少なくとも2つの反射面レベル間の分離距離を決定する方法 |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10216093B2 (en) | 2013-01-28 | 2019-02-26 | Asml Netherlands B.V. | Projection system and minor and radiation source for a lithographic apparatus |
DE102015209175A1 (de) * | 2015-05-20 | 2016-11-24 | Carl Zeiss Smt Gmbh | Pupillenfacettenspiegel |
DE102015209453A1 (de) * | 2015-05-22 | 2016-11-24 | Carl Zeiss Smt Gmbh | Pupillenfacettenspiegel |
DE102016205624B4 (de) * | 2016-04-05 | 2017-12-28 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithografie, Beleuchtungssystem, Projektionsbelichtungsanlage und Verfahren zur Projektionsbelichtung |
US10295911B2 (en) | 2016-05-19 | 2019-05-21 | Nikon Corporation | Extreme ultraviolet lithography system that utilizes pattern stitching |
US11067900B2 (en) | 2016-05-19 | 2021-07-20 | Nikon Corporation | Dense line extreme ultraviolet lithography system with distortion matching |
US10712671B2 (en) | 2016-05-19 | 2020-07-14 | Nikon Corporation | Dense line extreme ultraviolet lithography system with distortion matching |
US11099483B2 (en) * | 2016-05-19 | 2021-08-24 | Nikon Corporation | Euv lithography system for dense line patterning |
DE102016209359A1 (de) | 2016-05-31 | 2017-11-30 | Carl Zeiss Smt Gmbh | EUV-Kollektor |
DE102016225563A1 (de) | 2016-12-20 | 2018-06-21 | Carl Zeiss Smt Gmbh | Hohlwellenleiter zur Führung von EUV-Licht mit einer Nutzwellenlänge |
DE102017205548A1 (de) | 2017-03-31 | 2018-10-04 | Carl Zeiss Smt Gmbh | Optische Baugruppe zum Führen eines Ausgabestrahls eines Freie-Elektronen-Lasers |
US11934105B2 (en) | 2017-04-19 | 2024-03-19 | Nikon Corporation | Optical objective for operation in EUV spectral region |
WO2018200536A2 (en) * | 2017-04-26 | 2018-11-01 | Nikon Corporation | Illumination system with flat 1d-patterned mask for use in euv-exposure tool |
US11054745B2 (en) | 2017-04-26 | 2021-07-06 | Nikon Corporation | Illumination system with flat 1D-patterned mask for use in EUV-exposure tool |
TWI763834B (zh) * | 2017-04-26 | 2022-05-11 | 日商尼康股份有限公司 | 反射系統、微影曝光工具、在工件上形成條紋圖案的方法及微器件的製造方法 |
US11300884B2 (en) | 2017-05-11 | 2022-04-12 | Nikon Corporation | Illumination system with curved 1d-patterned mask for use in EUV-exposure tool |
WO2018208912A2 (en) * | 2017-05-11 | 2018-11-15 | Nikon Corporation | Illumination system with curved 1d-patterned mask for use in euv-exposure tool |
DE102017217867A1 (de) * | 2017-10-09 | 2018-07-26 | Carl Zeiss Smt Gmbh | EUV-Facettenspiegel für eine EUV-Projektionsbelichtungsanlage |
DE102018216870A1 (de) * | 2018-10-01 | 2020-04-02 | Carl Zeiss Smt Gmbh | Verfahren zum Herstellen eines Beleuchtungssystems für eine EUV-Anlage |
DE102018220629A1 (de) | 2018-11-29 | 2020-06-04 | Carl Zeiss Smt Gmbh | Spiegel für eine Beleuchtungsoptik einer Projektionsbelichtungsanlage mit einem Spektralfilter in Form einer Gitterstruktur und Verfahren zur Herstellung eines Spektralfilters in Form einer Gitterstruktur auf einem Spiegel |
TWI705910B (zh) * | 2019-05-16 | 2020-10-01 | 怡利電子工業股份有限公司 | 標靶反射式擴散片抬頭顯示裝置 |
DE102019212017A1 (de) | 2019-08-09 | 2021-02-11 | Carl Zeiss Smt Gmbh | Optisches Beleuchtungssystem zur Führung von EUV-Strahlung |
DE102019129135A1 (de) * | 2019-10-29 | 2021-04-29 | Zumtobel Lighting Gmbh | 3D-Druckverfahren zur Herstellung eines Leuchtenelements mit optischem Teil |
DE102020208665A1 (de) | 2020-07-10 | 2022-01-13 | Carl Zeiss Smt Gmbh | Optisches Beleuchtungssystem zur Führung von EUV-Strahlung |
DE102020213837A1 (de) | 2020-11-04 | 2021-08-19 | Carl Zeiss Smt Gmbh | Facettenspiegel-Vorrichtung |
EP4092458A1 (en) * | 2021-05-19 | 2022-11-23 | Universität Stuttgart | Grating mirror and radiation providing system comprising a grating mirror |
DE102022207052A1 (de) | 2022-07-11 | 2024-01-11 | Carl Zeiss Smt Gmbh | Spiegel für eine Projektionsbelichtungsanlage |
US20250216254A1 (en) * | 2024-01-03 | 2025-07-03 | Kla Corporation | Diffractive euv spectral purity filters for optical systems |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005049845A (ja) * | 2003-07-09 | 2005-02-24 | Asml Netherlands Bv | ミラー及びミラーを備えたリソグラフィック装置 |
JP2005302998A (ja) * | 2004-04-12 | 2005-10-27 | Canon Inc | Euv光を用いた露光装置および露光方法 |
JP2005536900A (ja) * | 2002-08-26 | 2005-12-02 | カール・ツァイス・エスエムティー・アーゲー | 極紫外線リソグラフィーシステム内で所定の帯域の放射線を取り除く格子ベースのスペクトルフィルター |
JP2008544531A (ja) * | 2005-06-21 | 2008-12-04 | カール ツァイス エスエムテー アーゲー | 瞳ファセットミラー上に減衰素子を備えた二重ファセット照明光学系 |
JP2010004002A (ja) * | 2008-05-20 | 2010-01-07 | Komatsu Ltd | 極端紫外光を用いる半導体露光装置 |
JP2010153871A (ja) * | 1996-12-20 | 2010-07-08 | Digital Optics Corp | ビームホモジェナイザ |
JP4518078B2 (ja) * | 2004-09-22 | 2010-08-04 | 株式会社ニコン | 照明装置、露光装置及びマイクロデバイスの製造方法 |
JP2011523782A (ja) * | 2008-05-30 | 2011-08-18 | エーエスエムエル ネザーランズ ビー.ブイ. | スペクトル純度フィルタを形成する方法 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5581605A (en) * | 1993-02-10 | 1996-12-03 | Nikon Corporation | Optical element, production method of optical element, optical system, and optical apparatus |
US6859515B2 (en) | 1998-05-05 | 2005-02-22 | Carl-Zeiss-Stiftung Trading | Illumination system, particularly for EUV lithography |
DE10138313A1 (de) | 2001-01-23 | 2002-07-25 | Zeiss Carl | Kollektor für Beleuchtugnssysteme mit einer Wellenlänge < 193 nm |
US7006595B2 (en) | 1998-05-05 | 2006-02-28 | Carl Zeiss Semiconductor Manufacturing Technologies Ag | Illumination system particularly for microlithography |
US6573978B1 (en) * | 1999-01-26 | 2003-06-03 | Mcguire, Jr. James P. | EUV condenser with non-imaging optics |
KR100931335B1 (ko) * | 2000-09-29 | 2009-12-11 | 칼 짜이스 에스엠티 아게 | 격자 엘리먼트를 구비한 조명 시스템 |
EP1472562B1 (de) * | 2002-02-09 | 2010-04-14 | Carl Zeiss SMT AG | Facettenspiegel mit mehreren spiegelfacetten |
JPWO2006082738A1 (ja) | 2005-02-03 | 2008-06-26 | 株式会社ニコン | オプティカルインテグレータ、照明光学装置、露光装置、および露光方法 |
DE102006036064A1 (de) | 2006-08-02 | 2008-02-07 | Carl Zeiss Smt Ag | Beleuchtungssystem für eine Projektionsbelichtungsanlage mit Wellenlängen ≦ 193 nm |
US7719661B2 (en) * | 2007-11-27 | 2010-05-18 | Nikon Corporation | Illumination optical apparatus, exposure apparatus, and method for producing device |
DE102008009600A1 (de) | 2008-02-15 | 2009-08-20 | Carl Zeiss Smt Ag | Facettenspiegel zum Einsatz in einer Projektionsbelichtungsanlage für die Mikro-Lithographie |
CN101946190B (zh) | 2008-02-15 | 2013-06-19 | 卡尔蔡司Smt有限责任公司 | 微光刻的投射曝光设备使用的分面镜 |
US8227778B2 (en) * | 2008-05-20 | 2012-07-24 | Komatsu Ltd. | Semiconductor exposure device using extreme ultra violet radiation |
JP2010114344A (ja) * | 2008-11-10 | 2010-05-20 | Nikon Corp | 露光装置、およびデバイス製造方法 |
DE102009044462A1 (de) | 2009-11-06 | 2011-01-05 | Carl Zeiss Smt Ag | Optisches Element, Beleuchtungssystem und Projektionsbelichtungsanlage |
JP5637702B2 (ja) * | 2010-03-09 | 2014-12-10 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
US9372413B2 (en) * | 2011-04-15 | 2016-06-21 | Asml Netherlands B.V. | Optical apparatus for conditioning a radiation beam for use by an object, lithography apparatus and method of manufacturing devices |
DE102011082065A1 (de) * | 2011-09-02 | 2012-09-27 | Carl Zeiss Smt Gmbh | Spiegel-Array |
DE102012209882A1 (de) * | 2012-06-13 | 2013-06-13 | Carl Zeiss Smt Gmbh | Spiegel für EUV-Projektionsbelichtungsanlage mit Streufunktion |
-
2012
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- 2013-05-07 CN CN201380026836.2A patent/CN104335096B/zh active Active
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Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010153871A (ja) * | 1996-12-20 | 2010-07-08 | Digital Optics Corp | ビームホモジェナイザ |
JP2005536900A (ja) * | 2002-08-26 | 2005-12-02 | カール・ツァイス・エスエムティー・アーゲー | 極紫外線リソグラフィーシステム内で所定の帯域の放射線を取り除く格子ベースのスペクトルフィルター |
US20050275818A1 (en) * | 2002-08-26 | 2005-12-15 | Wolfgang Singer | Attenuator for attenuating wavelengths unequal to a used wavelength |
JP2005049845A (ja) * | 2003-07-09 | 2005-02-24 | Asml Netherlands Bv | ミラー及びミラーを備えたリソグラフィック装置 |
JP2005302998A (ja) * | 2004-04-12 | 2005-10-27 | Canon Inc | Euv光を用いた露光装置および露光方法 |
JP4518078B2 (ja) * | 2004-09-22 | 2010-08-04 | 株式会社ニコン | 照明装置、露光装置及びマイクロデバイスの製造方法 |
JP2008544531A (ja) * | 2005-06-21 | 2008-12-04 | カール ツァイス エスエムテー アーゲー | 瞳ファセットミラー上に減衰素子を備えた二重ファセット照明光学系 |
JP2010004002A (ja) * | 2008-05-20 | 2010-01-07 | Komatsu Ltd | 極端紫外光を用いる半導体露光装置 |
JP2011523782A (ja) * | 2008-05-30 | 2011-08-18 | エーエスエムエル ネザーランズ ビー.ブイ. | スペクトル純度フィルタを形成する方法 |
US20110223543A1 (en) * | 2008-05-30 | 2011-09-15 | Asml Netherlands B.V. | Radiation system, radiation collector, radiation beam conditioning system, spectral purity filter for radiation system and method for forming a spectral purity filter |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018527612A (ja) * | 2015-08-25 | 2018-09-20 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置のための抑制フィルタ、放射コレクタ及び放射源、並びに抑制フィルタの少なくとも2つの反射面レベル間の分離距離を決定する方法 |
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JP6504506B2 (ja) | 2019-04-24 |
CN104335096A (zh) | 2015-02-04 |
CN104335096B (zh) | 2018-08-28 |
TW201415076A (zh) | 2014-04-16 |
US10599041B2 (en) | 2020-03-24 |
WO2013174644A1 (en) | 2013-11-28 |
US20150049321A1 (en) | 2015-02-19 |
TWI639850B (zh) | 2018-11-01 |
DE102012010093A1 (de) | 2013-11-28 |
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