JP2014018349A - Connection structure for endoscope processor - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a connection structure for an endoscope processor which can prevent charges from accumulating in the endoscope processor, regardless of a connection state between the endoscope and the endoscope processor.SOLUTION: A connection structure for an endoscope processor has a connection part for attaching the endoscope to the endoscope processor. The connection structure is provided with a first member equipped to the endoscope processor or the endoscope. The fist member is grounded. The connection structure is provided with a second member installed inside the endoscope processor or the endoscope. The second member has a projection part extended toward the first member and is electrically conducted to the connection part.

Description

  The present invention relates to an endoscope processor connection structure, and more particularly to an endoscope processor connection structure capable of electrostatic protection.

  2. Description of the Related Art Conventionally, as a configuration for reducing charge accumulation on the scope side, a configuration is known in which the terminal on the insertion side of the connector is connected to the ground while the connector between the processor and the scope is not connected (Patent Document 1). ). As a result, no electric charge is accumulated in the scope, and it is possible to prevent a failure of an electronic component or the like due to the electric charge of the processor flowing into the scope when the connector is connected.

JP 2004-267488 A

  However, in this configuration, there is a problem that charges are accumulated when the scope and the processor are connected. That is, there is a possibility that an electronic component or the like may break down due to the charge accumulated in the connected state flowing from the processor to the scope. For example, failure of an electronic component due to static electricity applied in a connected state in an EMC test cannot be prevented.

  Accordingly, an object of the present invention is to provide an endoscope processor connection structure capable of preventing charge accumulation in the processor regardless of the connection state between the scope and the processor.

  The connection structure of the endoscope processor according to the present invention is a connection structure having a connection portion for mounting the scope to the endoscope processor, the first member provided in the processor or the scope and grounded, and the processor Or it has a projection part which is provided in a scope and extends toward the 1st member, and is provided with the 2nd member which conducts to a connection part.

  It is preferable that the connection portion has an insertion portion and a receiving portion, and the receiving portion, the second member, and the protruding portion are electrically connected. With this configuration, the charge of the receiving portion can be moved to the protruding portion.

  The first member is a housing of the processor, and it is preferable that the tip of the protruding portion is close to the first member on the top surface or the bottom surface. It is because it can be discharged by being close.

  A protrusion may be formed at the tip of the protrusion, and the tip of the protrusion may be brought close to the first member.

  A recess may be formed in the first member on the upper surface, and the tip of the protrusion may be brought close to the recess.

  A resin material is provided on the first member on the bottom surface, a lower projection is formed vertically downward along the outer wall surface of the resin material, the lower projection is electrically connected to the second member, and the lower end of the lower projection is the bottom You may make it adjoin to the 1st member.

  ADVANTAGE OF THE INVENTION According to this invention, the connection structure of the endoscope processor which can prevent accumulation | storage of the electric charge to a processor irrespective of the connection state of a scope and a processor can be provided.

It is a connection structure of an endoscope processor to which the first embodiment of the present invention is applied. It is a connection structure of an endoscope processor to which a second embodiment of the present invention is applied. It is a connection structure of an endoscope processor to which a third embodiment of the present invention is applied.

  The configuration of the first embodiment of the present invention will be described below with reference to the drawings. The endoscope 10 includes a scope 20 and a processor 40. The scope 20 and the processor 40 are connected at the connection unit 80. A scope connector 22 is provided at the proximal end of the scope 20, and the scope connector 22 is provided with a signal insertion portion 24 and an optical insertion portion 26. The processor 40 is provided with a signal receiver 42 and an optical receiver 44. In the connecting portion 80, the signal insertion portion 24 and the signal receiving portion 42 are connected, and the optical insertion portion 26 and the optical receiving portion 44 are connected. Thereby, the scope 20 and the processor 40 are electrically and optically connected, and the scope 20 can observe the inside of the body.

  The housing of the processor 40 is formed by providing a first member 46, which is a conductor, on the top surface and the bottom surface. The first member 46 on the bottom surface is provided with an insulating resin plate 47. A space S is formed between the resin plate 47 and the outer wall 51. The signal connection hole 48 is formed by a cylindrical conductive member 50 extending to the signal receiving portion 42. Further, the optical connection hole 52 is formed by a cylindrical conductive member 54 that extends to the optical receiving portion 44. A signal line (not shown) is inserted into the signal connection hole 48, and image processing or the like is performed via the cable 49. The light guide 53 is inserted into the optical connection hole 52, and the light from the light source 90 is transmitted to the scope 20.

  The distance between the signal connection hole 48 and the optical connection hole 52 is determined by a conductive member 56 provided in the vertical direction between the conductive member 50 and the conductive member 54. The distance between the signal connection hole 48 and the first member 46 on the top surface, and the distance between the optical connection hole 52 and the first member 46 on the bottom surface are determined by a conductive member 58 provided vertically downward from the conductive member 54. Further, the lower end of the conductive member 58 is extended so as to be bent in the horizontal direction, and then fixed to the resin plate 47 with a screw 60. The signal connection hole 48 does not contact the first member 46 on the upper surface. Thus, the vertical positions of the signal connection hole 48 and the optical connection hole 52 are determined by the conductive members 56 and 58.

  The conductive member 50 has a protrusion 62 extending toward the first member 46 on the upper surface, that is, upward in the vertical direction. Further, a protrusion 64 is extended at the upper end thereof. The protrusion 64 is made of the same material as the protrusion 62 or a different conductive material. The protrusion 64 and the first member 46 are close to each other.

  Here, the signal receiving portion 42, the optical receiving portion 44, the conductive members 50, 54, 56, 58, the protruding portion 62, and the protrusion 64 are conductive, and these members are collectively referred to as the second member 66 hereinafter. . The first member 46 contacts the processor 40 when placed on a desk or floor. That is, the potential of the first member 46 is the same as the grounded state.

  In a normal use state, the scope 20 and the processor 40 are in an insulated state. When static electricity is generated in the scope 20, the charge flows into the second member 66 through the connection portion 80. Here, since the potential of the protrusion 64 is higher than that of the grounded first member 46, a discharge is generated from the protrusion 64 toward the first member 46. On the other hand, when static electricity is generated in the processor 40, the charge flows into the first member 46 on the upper surface having the lowest impedance. For example, in an EMC test for a medical device or the like, the operator generates static electricity at the connection unit 80. At this time, the entire second member 66 is charged, but is immediately discharged from the protrusion 64 toward the first member 46 on the upper surface.

  Further, the distance between the protrusion 64 and the first member 46 can be freely determined according to the pressure resistance between the second member 66 and the first member 46. Specifically, if the distance is 1 [mm], it can be insulated against a voltage of 1 [kv]. In this embodiment, since the distance is 4 [mm], insulation can be performed with respect to a voltage of 4 [kv]. According to the standard, the first member 46, which is the primary GND, and the second member 66, which is the secondary GND, need to be insulated by 2 [kv] or more, but this embodiment satisfies this standard.

  Thus, regardless of whether or not the scope 20 and the processor 40 are connected, it is possible to prevent the charge from being accumulated in the processor by discharging the charge to the first member 46. Further, since the additional parts need only be the protrusions 64, the configuration is simple. Further, the protrusion 64 may be formed integrally with the protrusion 62, but in this case, no additional parts are required.

  Next, a second embodiment will be described with reference to FIG. The difference from the first embodiment is that a recess D is provided in the first member 46 on the upper surface, which is the housing of the processor 40, instead of removing the protrusion 64. Other configurations are the same as those of the first embodiment, and the same reference numerals are given to the same members.

  The first member 46 has stepped portions C and E that become depressions. The step C is provided slightly closer to the light source 90 than the end A of the signal connection hole 48. The stepped portion E is provided at substantially the same position as the protruding portion 62. That is, the inner wall surface of the recess D of the first member 46 is provided so as to cover the protruding portion 62. As described above, the withstand voltage depends on the distance between the protrusion 62 and the first member 46. Therefore, when static electricity is generated, an insulating effect corresponding to the distance between the protruding portion 62 and the first member 46 can be obtained as in the first embodiment. Further, when static electricity exceeding the withstand voltage is generated, a discharge is generated from the protruding portion 62 toward the first member 46. Although the effect in this embodiment is the same as that in the first embodiment, in the second embodiment, since it is not necessary to provide the protrusion 64, the processing is easier than in the first embodiment.

  Next, a third embodiment will be described with reference to FIG. The difference from the first embodiment is that, instead of the protrusion 64, a lower protrusion 72 extending on the conductive member 58 is provided. Other configurations are the same as those of the first embodiment, and the same reference numerals are given to the same members.

  The lower projection 72 extends along the horizontal direction opposite to the screw 70 after the conductive member 58 reaches the resin plate 47, and is formed downward along the vertical outer wall surface of the resin plate 47, that is, in the space S. Is done. The lower end of the lower protrusion 72 is close to the first member 46. When static electricity is generated in the connection portion 80, discharge is generated from the lower end of the lower protrusion 72 toward the first member 46, as in the other embodiments.

20 scope
24 signal insertion portion 40 processor 42 signal receiving portion 46 first member 47 resin plate 62 protrusion 64 protrusion 66 second member 72 lower protrusion 80 connection portion D recess

Claims (6)

A connection structure having a connection part for attaching the scope to the endoscope processor,
A first member provided in the processor or the scope and grounded;
A connection structure for an endoscope processor, comprising: a second member provided in the processor or scope, having a projecting portion extending toward the first member, and conducting to the connection portion.   The endoscope processor connection structure according to claim 1, wherein the connection portion includes an insertion portion and a receiving portion, and the receiving portion, the second member, and the protruding portion are electrically connected. The first member is a housing of the processor;
The endoscope processor connection structure according to claim 2, wherein a tip of the projecting portion is close to the first member on the top surface or the bottom surface.   The endoscope processor connection structure according to claim 3, wherein a protrusion is formed at a tip of the protrusion, and the tip of the protrusion is close to the first member.   The endoscope processor connection structure according to claim 3, wherein a concave portion is formed in the first member on the upper surface, and a tip of the protruding portion is close to the concave portion.   A resin material is provided on the first member on the bottom surface, and a downward protrusion is formed vertically downward along the outer wall surface of the resin material. The downward protrusion is electrically connected to the second member, and The endoscope processor connection structure according to claim 3, wherein a lower end of the protrusion is close to the first member on the bottom surface.

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