JP2009074815A - Lens defect inspection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a lens defect inspection device capable of forming many parallel light sources having prescribed angles by the effective use of surface illuminations and a louver layer, for example, imaging accurately a defect on a lens appearance by an imaging means, and automating inspection. <P>SOLUTION: This lens defect inspection device for inspecting a defect such as a flaw, a crack, a foreign substance or a bubble generated during the manufacturing of a lens being an inspection object comprises the surface illuminations; the louver layer arranged between the surface illuminations and the inspection object lens for using light irradiated from the surface illuminations as many parallel light sources; and the imaging means for imaging the light irradiated from the louver layer and transmitted through the inspection object lens. The louver layer has the first louver layer formed by arranging a light transmission band and a shielding band alternately for preventing the diffusion of light entering from the surface illuminations; and the second louver layer arranged in an orthogonal state with respect to the first louver layer formed by arranging a light transmission band and a shielding band alternately for preventing the diffusion of light entering from the surface illumination. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a lens defect inspection apparatus for automatically inspecting appearance defects of a small number of various types of lenses such as camera lenses and eyeglass lenses.

Conventionally, when inspecting appearance defects such as scratches and cracks on the lens surface, foreign matters and bubbles inside the lens, etc. that occur during the manufacture of a small amount of various types of lenses, for example, an inspection device as shown in FIG. 9 is used. Has been. In this inspection apparatus 101, light emitted from a single light source 102 is converted into parallel light by a lens 103, and this parallel light is collected by a condenser lens 104 and transmitted through an inspection target lens W. The defect of the lens W is imaged by the imaging lens 105 by the light transmitted through W, and the image is displayed on the imaging screen 106. The inspector visually observes the image projected on the imaging screen 106, so that the defect of the inspection target lens W is inspected. For example, Patent Document 1 discloses a publication relating to this type of inspection apparatus.
JP 2002-5853 A

  However, in such an inspection apparatus 101, since the refractive index varies depending on the shape (curvature) of the unevenness or the like of the inspection target lens W, the condensing lens 104 and the imaging lens 105 depend on the individual inspection target lens W. Etc. must be set to a predetermined curvature, or the position thereof must be manually set one by one as indicated by arrows (b) and (c) in the figure, and this adjustment is troublesome. In addition, since it depends on the experience and intuition of the inspector to set and adjust various lenses at the time of inspection, it is inferior in inspection efficiency and inspection accuracy. It is the actual situation that invites up.

  The present invention has been made in view of such circumstances, and an object thereof is to form a large number of parallel light sources having a predetermined angle by effective use of surface illumination and a louver layer. It is an object of the present invention to provide a lens defect inspection apparatus that can accurately image defects on an imaging means and can automate inspection.

  In order to achieve such an object, the invention described in claim 1 of the present invention is a lens defect inspection apparatus for inspecting defects such as scratches, cracks, foreign matter, bubbles, etc. that occur during the manufacture of a lens to be inspected. Illumination, a louver layer that is arranged between the surface illumination and the inspection target lens and uses light emitted from the surface illumination as a number of parallel light sources, and light that is emitted from the louver layer and passes through the inspection target lens. And imaging means for imaging.

  According to a second aspect of the present invention, the louver layer includes a first louver layer in which light transmission bands and light shielding bands are alternately arranged to prevent diffusion of light incident from the surface illumination, and the first louver. And a second louver layer that is arranged in a state orthogonal to the layer, and in which light transmission bands and light shielding bands are alternately arranged to prevent diffusion of light incident from the surface illumination. Furthermore, the invention described in claim 3 is characterized in that the surface illumination is a surface-emitting LED illumination of a predetermined color, and the invention described in claim 4 is configured such that the focus position of the imaging means can be adjusted. It is characterized by.

  According to the invention described in claim 1 of the present invention, a louver layer is disposed between the surface illumination and the lens to be inspected, and the light emitted from the surface illumination is a number of parallel light sources, and irradiation is performed from the louver layer. Since the light that has passed through the lens to be inspected is picked up by the image pickup means, a large number of parallel light sources can be formed by effective use of surface illumination and the louver layer, and the light can pick up defects in the lens without reducing contrast. Even with a small amount of various types of lenses, the inspection can be automated and a low-cost lens can be obtained.

  According to the invention described in claim 2, in addition to the effect of the invention described in claim 1, the second louver in which the louver layer is arranged in a state orthogonal to the first louver layer and the first louver layer. For example, a micro louver or the like can be used as the louver layer, and a large number of parallel light sources can be obtained easily and reliably, and better imaging data can be obtained by the imaging means.

  Further, according to the invention described in claim 3, in addition to the effect of the invention described in claim 1 or 2, since the surface illumination is a surface emitting LED illumination of a predetermined color, the parallel light is excellent in terms of stability and energy saving. Can be obtained easily and inexpensively and the reliability of the inspection apparatus can be improved.

  According to the fourth aspect of the present invention, in addition to the effects of the first to third aspects, the focus position of the image pickup means is adjustable, so that the focus of the image pickup means is adjusted to the inspection target lens. Therefore, it is possible to easily inspect a defect at each position of the inspection target lens with high accuracy.

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
1 to 8 show an embodiment of a lens defect inspection apparatus according to the present invention. FIG. 1 is a front view thereof, FIG. 2 is a side view, FIG. 3 is a schematic configuration diagram, and FIG. 5 is an exploded perspective view of the louver layer, FIG. 6 is a flowchart showing an example of the operation, and FIGS. 7 and 8 are explanatory diagrams thereof.

  As shown in FIGS. 1 and 2, a lens defect inspection apparatus 1 (hereinafter referred to as an inspection apparatus 1) is disposed on a column 2 and on the column 2 so as to be movable in the XYZ directions, and at a predetermined position inside. The illumination unit 4 including the surface illumination 5 and the louver layer 6 is disposed, and the table 3 on which the inspection target lens W (hereinafter referred to as a workpiece W) is set, and the table 3 is disposed so as to be movable in the Z direction. Imaging means 7 and the like are provided. Further, at a predetermined position above the table 3, a workpiece exchange robot 8 (see FIG. 1) for setting the workpiece W on the table 3 and taking out the inspected workpiece W is disposed so as to be movable in the XYZ directions, for example. ing.

  In this inspection apparatus 1, as shown in FIG. 3, the LED driving unit 10 is connected to the illumination unit 4, the camera moving unit 11 is connected to the imaging unit 7, and these are connected to the control unit 9. In addition, an image pickup unit 7 a composed of a CCD of the image pickup means 7 is also connected to the control means 9, and a display 12 and the like are connected to the control means 9. Then, the light irradiated by the surface illumination 5 becomes parallel light in the louver layer 6, and this parallel light passes through the workpiece W, and the transmitted light is moved by the image pickup unit 7 a of the image pickup means 7 that can move in the direction of the arrow a in the figure. The image is captured.

  As shown in FIG. 4, the control means 9 includes a CPU 14 having a timer connected via a bus line 13, a ROM 15, a RAM 16, an input interface 17 (input I / F), an output interface 18 (output I / F). ), A hard disk 19 (HD), a keyboard 20 and a mouse 21 connected to the input I / F 17, a speaker 22 connected to the output I / F 18, and the like.

  The input unit 17 of the control unit 9 is connected to the imaging unit 7 and is detected by a focus position signal S1 from the camera moving unit 11 or a sensor (not shown) disposed at the inspection position. Various signals such as a workpiece presence / absence signal S2 are input. Further, the display 12 is connected to the output I / F 18 of the control means 9, and the camera moving unit 11 and the LED driving unit 10 are connected to each other.

  The surface illumination 5 of the illuminating means 4 is constituted by a surface-emitting LED illumination having a predetermined area that emits surface light using an LED element. Further, as shown in FIG. 5, the louver layer 6 of the illumination means 4 is formed in a thin plate shape by a first louver layer 6a and a second louver layer 6b spreading in the XY plane. In the first louver layer 6a, the light transmission bands 24a and the light shielding bands 24b are alternately arranged, and the light shielding band 24b is formed in a wall shape extending in the X direction, for example, and a portion separated by the light shielding band 24b is a light transmission band. 24a. A transparent protective layer 24c is provided on the front and back surfaces of the first louver layer 6a.

  In the second louver layer 6b, the light transmission bands 25a and the light shielding bands 25b are alternately arranged, and the light shielding bands 25b are formed in a wall shape extending in the Y direction, for example, and the portion separated by the light shielding bands 25b is light. Thus, the direction of the light shielding band 25b is set to be orthogonal to the light shielding band 24a of the first louver layer 6a. A transparent protective layer 25c is also provided on the front and back surfaces of the second louver layer 6b. In addition, the thickness in the Z direction of the light transmission bands 24a and 25a and the light shielding bands 24b and 25b of the louver layers 6a and 6b is preferably about 0.1 to 2.5 mm, and the light transmission band 24a in the Y direction is preferred. The width in the X direction of the light transmission band 25a is preferably in the range of 50 μm to 0.3 mm, and the width in the Y direction of the light shielding band 24b and the width in the X direction of the light shielding band 25b are preferably 5 to 50 μm.

  Further, the light transmission bands 24a and 25a of the louver layers 6a and 6b are preferably made of highly transparent resin, and the light transmittance in the Z direction is preferably 75% or more (more preferably 85% or more), and light shielding. The bands 24b and 25b preferably have a color tone of black, red, yellow, green, blue, light blue and have a light transmittance of 40% or less (more preferably 10% or less). Furthermore, the transparent protective layers 24c and 25c of the louver layers 6a and 6b preferably have a light transmittance of 75% or more (more preferably 85% or more).

  Next, an example of operation | movement of the test | inspection apparatus 1 comprised in this way is demonstrated based on the flowchart of FIG. Note that the flowchart shown in FIG. 6 is automatically executed according to a program stored in the ROM 15 of the control means 9. First, when the power of the inspection apparatus 1 is turned on, the program starts (S101), and it is determined whether or not the calibration lens 26 is set (S102). This determination S102 is repeated until "YES".

  As shown in FIG. 7, the calibration lens 26 is a lens having the same shape as the workpiece W, in which four lines 26 a are inserted in the diameter direction, and the calibration lens 26 is set on the table 3. When the position is moved to the inspection position, “YES” is determined in the step S102, the imaging unit 7 is operated, and the calibration lens 26 is imaged (S103). The imaging of the recalibration lens 26 is performed as follows.

  That is, when a drive signal (lighting signal) is output from the control means 9 to the LED driving section 10, as shown in FIG. 3, the surface illumination 5 is turned on, and light of a predetermined color is irradiated onto the louver layer 6. By passing through the louver layer 6, the workpiece W is irradiated with a large number of parallel lights. As a result, a large number of light sources are present in the louver layer 6, and a large number of parallel lights are emitted from the light source to the calibration lens 26 and transmitted through the entire area of the lens 26, and the transmitted light is imaged by the imaging means 7. Will be.

  When the calibration lens 26 is imaged in step S103, a portion where the contrast of the edge portion of each line 26a matches is defined as a focus position (S104), and it is then determined whether or not the workpiece W is set (S105). This determination S105 is also repeated until “YES”. When “YES” is determined in the determination S105, that is, when the calibration lens 26 on the table 3 is removed by the workpiece exchange robot 8 and the workpiece W is set, the camera moving unit 11 moves the imaging unit 7 by a predetermined amount (moves up and down). The focus position i is set (S106). The focus positions i are eight positions A to H in the thickness direction of the workpiece W shown in FIG. 8A and four planar shapes a to d of the workpiece W shown in FIG. 8B. One position is used, that is, a total of 32 focus positions are used.

  Then, for example, when the imaging means 7 is moved up and down via the camera moving unit 11 by the control signal of the control means 9 when the plane position as the first focus position is a and the thickness direction position is A, and set. The workpiece W is imaged by the imaging means 7 at this position (S107). In the imaging of the workpiece W, similarly to the imaging of the calibration lens 26 described above, the parallel light emitted from a large number of light sources formed by the louver layer 6 of the illumination unit 4 is transmitted through the entire area of the workpiece W. This is done by imaging the transmitted light with the imaging means 7.

  When the work W is imaged, the imaged data is appropriately processed and stored (S108). At this time, the imaging data captured by the imaging unit 7a of the imaging unit 7 is subjected to image processing such as binarization processing by the CPU 14 of the control unit 9, and for example, a reference value related to a defect stored in advance in the processing data. When there is a part exceeding the limit, the part is detected as a defect, and the number and size thereof are temporarily stored in the HD 19 or the RAM 16 as defect data.

  When the imaging data of the first focus position is stored in step S108, it is determined whether or not all the focus positions have been imaged (S109). If this determination S109 is "NO", the process returns to step S106, and the imaging means 7 Is the next focus position, for example, the plane position is set to a and the thickness direction position is set to B, the workpiece W is imaged at this position (S107), and the imaged data is stored (S108).

  When this operation is executed for all 32 focus positions, “YES” is determined in the determination S109, and the defect degree is calculated (S110). The defect degree is calculated based on the defect data stored in step S108 when there is a defect, and is calculated as zero defect degree when there is no defect. Note that the defect degree is set such that, for example, when a defect is detected at each focus position in the plane direction, the defect degree increases toward the position a which is the center when the work is viewed from the front, that is, each focus position. Is weighted. Further, for example, a defect that exists between the zones consisting of the a position and the b position is detected together on the imaging data in which the positions are aligned with each other, but such a defect is not counted redundantly by the position data. It has become.

  When the defect degree is calculated in step S110, the defect degree is compared with a reference value stored in advance in the ROM 15 or the like corresponding to the workpiece W to determine whether the defect degree is within a predetermined value ( S111). If “YES” in this determination S111, that is, if the calculated defect degree is within a predetermined value, the workpiece W is determined to be non-defective (S112), and if “NO” in the determination S111, that is, the calculated defect degree is predetermined. If the value is exceeded, the workpiece W is determined as a defective product (S113), and these data are stored in the HD 19 or the like.

  In this way, when the predetermined workpiece W is imaged and determined as “good” or “defective”, it is determined whether or not the inspection of the target lot of the workpiece W has been completed (S114). If “NO”, the process returns to the determination S105, and the determination S105 and subsequent steps are repeated for the next workpiece W in the same lot. On the other hand, if “YES” in the determination S114, that is, if the inspection of all the workpieces W of the target lot is completed, the series of programs is ended (S115). Note that the workpiece W determined to be a non-defective product or a defective product in steps S112 and S113 is clearly distinguished and stored in a non-defective product box or a defective product box by the workpiece replacement robot 8 or the like, or the determination result or defective part ( Part) is displayed.

  That is, according to this flowchart, the calibration lens 26 having the same form as the workpiece W is set on the table 3 to define the focus position, and based on this definition, the imaging means 7 is set in the plane direction or thickness of the workpiece W. An image of the work W is picked up by focusing on a plurality of focus positions in the direction, and a defect is detected and stored based on the picked-up data, and the work W is determined as a defective product when the degree of defect exceeds a predetermined value. become. Then, the setting and removal of the calibration lens 26, the setting and removal of the work W, and the determination of pass / fail are automatically executed by the control of each part of the control means 9 and the like.

  In the above flowchart, all the focus positions of the 32 positions of the workpiece W are inspected in order. For example, first, the focus position of the central portion of the workpiece W is inspected, and a defect is detected by this inspection. In such a case, the inspection of other parts such as the outer peripheral part may be omitted to shorten the inspection time. In the above flowchart, the calibration 26 is used to set 32 focus positions. For example, a predetermined number of focus positions are calculated from the shape data of the workpiece W, and the calculated values are input. The focus position may be set.

  As described above, in the inspection apparatus 1 of the above embodiment, the louver layer 6 is arranged on the illumination unit 4 using the light emitted from the surface illumination 5 as a number of parallel light sources, and is irradiated from the louver layer 6. Since the light transmitted through the workpiece W is picked up by the image pickup means 7, a large number of parallel light sources can be formed by effectively using the surface illumination 5 and the louver layer 6, without reducing the contrast due to the light. The appearance state of the workpiece W can be accurately imaged by the imaging means 7.

  In particular, the imaging means 7 is arranged so as to be movable up and down so that the focus position can be adjusted, and since the focus position can be set with high accuracy by using the calibration lens 26, one imaging means 7 is used. However, the focal point can be easily set at a predetermined position of the workpiece W, the entire area of the workpiece W can be reliably imaged, and the defect degree is weighted according to the defect portion of the workpiece W, so that the workpiece W is required. Appropriate inspections according to performance can be easily performed, and these enable high-accuracy inspection of the workpiece W.

  Further, since the louver layer 6 includes the first louver layer 6a and the second louver layer 6b arranged in a state orthogonal to the first louver layer 6a, for example, a micro louver can be used as the louver layer 6, A large number of parallel light sources can be easily formed, better imaging data can be obtained, and the surface illumination 5 of the illumination means 4 is a surface-emitting LED illumination of a predetermined color. Can be obtained, and the reliability of the inspection apparatus 1 can be improved.

  Furthermore, since a series of operations such as imaging by the imaging unit 7 from setting and removal of the calibration lens 26 and the workpiece W is mechanically performed by the workpiece exchanging robot 8 or the like under the control of the control unit 9, the conventional inspection apparatus 101. Thus, there is no need to change the position of each lens or adjust the position of each lens manually according to the form of the workpiece W. Further, since the defect is mechanically detected by the control means 9 based on the picked-up image data and it is determined whether it is a non-defective product or a non-defective product, there is less work that relies on the experience and intuition of the inspector as in the past, and the inspection accuracy As a result, it is possible to easily cope with the inspection of a small quantity and a wide variety of workpieces W, and the manufacturing cost of the workpieces W can be greatly reduced.

  In the above embodiment, the focus position of the workpiece W is set to 32 in total, ie, 8 in the thickness direction and 4 in the plane direction. However, the present invention is not limited to this, and the form of the workpiece W and the required shape are required. The focus position can be increased / decreased appropriately according to the quality, and the workpiece W itself is not limited to a convex lens but can be a concave lens. Moreover, in the said embodiment, although the surface emitting LED illumination was used as the surface illumination 5, for example, the illumination which has a function substantially equivalent to the surface illumination 5 using a halogen lamp and an optical fiber can also be formed and used. Furthermore, the configuration diagram of the control means 9 and the arrangement positions of the illumination means 4 and the imaging means 7 with respect to the column 2 in the above embodiment are also examples. For example, an image processing unit is built in the imaging means 7 or the imaging means 7 The illumination means 4 can be appropriately changed within a range not departing from the gist of the present invention.

  The present invention is not limited to use for eyeglass lenses and camera lenses, but can also be used for defect inspection on the appearance of all other lenses.

The front view which shows one Embodiment of the lens defect inspection apparatus which concerns on this invention Same side view Schematic configuration diagram Block diagram of the control means Exploded perspective view of the louver layer Flow chart showing an example of the same operation Explanation of the same Other explanatory diagrams Schematic configuration diagram of a conventional lens defect inspection device

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Lens defect inspection apparatus, 2 ... Column, 3 ... Table, 4 ... Illumination means, 5 ... Surface illumination, 6 ... Louver layer, 6a ... 1st louver layer 6b ... second louver layer, 7 ... imaging means, 7a ... imaging section, 8 ... work exchange robot, 9 ... control means, 10 ... LED drive section, 11 ... Camera moving unit, 12 ... display, 14 ... CPU, 15 ... ROM, 16 ... RAM, 24a, 25a ... light transmission band, 24b, 25b ... light shielding band, 24c, 25c ... Transparent protective layer, 26 ... Calibration lens, 26a ... Line, W ... Workpiece (lens to be inspected).

Claims (4)

A lens defect inspection device that inspects defects such as scratches, cracks, foreign objects, bubbles, etc. that occur during the manufacture of the inspection target lens,
Surface illumination, a louver layer disposed between the surface illumination and the lens to be inspected and having light emitted from the surface illumination as a number of parallel light sources, and light emitted from the louver layer and transmitted through the lens to be inspected A lens defect inspection apparatus comprising: an imaging unit that images   The louver layer includes a first louver layer in which a light transmission band and a light shielding band are alternately arranged to prevent diffusion of light incident from the surface illumination, and a light transmission band that is orthogonal to the first louver layer. The lens defect inspection apparatus according to claim 1, further comprising: a second louver layer configured to alternately disperse light incident from the surface illumination by alternately arranging light shielding bands.   The lens defect inspection apparatus according to claim 1, wherein the surface illumination is a surface emitting LED illumination of a predetermined color.   4. The lens defect inspection apparatus according to claim 1, wherein the imaging unit is configured so that a focus position thereof can be adjusted.

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