JP2007178337A - Deterioration determining device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a deterioration determining device and a deterioration determining method, capable of early and properly determining the deterioration of a device to be measured. <P>SOLUTION: The deterioration determining device 100 comprises a waveform measuring section 11 for measuring the outputs of a power supply unit 200, and a determining section 12 for determining the deterioration of the power supply unit 200, and the determination section 12 determines the deterioration of the power supply unit 200, based on the tendency of the output voltage from turn-on of the power supply unit 200, until the output of the unit 200 reaches a predetermined value in the output voltage of the power supply unit 200. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a deterioration determination device and a deterioration determination method, and more particularly to a deterioration determination device and a deterioration determination method for an electrolytic capacitor used for a system protection relay power supply in an electric power system.

FIG. 11 is a conceptual diagram illustrating a system protection relay in a power transmission line that supplies power.
Referring to FIG. 11, the electric power generated at power plant 1 is supplied to the power demand destination via transmission line 3. The power transmission line 3 is provided with a breaker 2. The breaker 2 is controlled by the system protection relay 4, and when an accident occurs at a place where the power transmission line 3 is present, the breaker 2 is electrically cut off so that excessive power supply is not performed. For example, when a surge voltage is applied to the transmission line 3 due to a lightning strike, the breaker 2 operates and an excessive power supply is cut off. Thereby, damage to the electrical equipment connected to the power transmission line 3 is prevented. In this example, one breaker 2 is representatively shown.

  Here, the system protection relay 4 receives an instruction from the current / voltage detector 5 that detects the current / voltage supplied to the power transmission line 3 and determines whether or not an excessive surge voltage is supplied. When it is determined that excessive power is supplied, the system protection relay 4 issues a cutoff command to the breaker 2.

  On the other hand, in the flow of electric power liberalization, there is a demand for efficient use of equipment and efficient maintenance and inspection. For example, a stabilized DC power source used for equipment and the like is an important factor that affects the reliability of equipment and the like. When such fluctuations or abnormalities occur in the stabilized DC power supply, the function of the entire equipment is greatly affected.

  For example, when the power supply device used for the system protection relay 4 shown in FIG. 11 becomes abnormal due to secular change or the like, it becomes impossible to issue an appropriate cutoff command to the breaker 2, and the electric power connected to the transmission line 3 It can also cause significant damage to the equipment.

  In general, an electrolytic capacitor is used in the power supply device, and the capacitance value of the electrolytic capacitor is deteriorated due to secular change, which causes a power supply abnormality.

  Therefore, in order to prevent an accidental failure caused by the electrolytic capacitor used in the system protection relay 4 shown in FIG.

  Conventionally, various methods for monitoring the quality of the electrolytic capacitor and the progress of deterioration have been proposed. For example, in Patent Document 1, as shown in FIG. 12, the AC voltage value appearing in the output voltage waveform of the electrolytic capacitor, that is, A method for determining the life of an electrolytic capacitor by measuring a ripple voltage has been proposed.

Patent Document 2 discloses a method for diagnosing deterioration of a system protection relay power supply as follows. That is, the step of turning on the power to the power supply device of the system protection relay having the electrolytic capacitor, the step of measuring the time until the output voltage from the power supply device reaches a predetermined voltage level after the power is turned on, and the measurement result And a step of diagnosing the deterioration status of the system protection relay power supply.
JP-A-9-264913 JP 2005-321203 A

FIG. 13 is a graph illustrating the relationship between the capacitance of the electrolytic capacitor and the ripple voltage.
As shown in FIG. 13, it can be seen that the ripple voltage changes rapidly from a certain value. Specifically, as shown in FIG. 13, it can be seen that the ripple voltage increases rapidly after the ratio of the capacitance of the electrolytic capacitor to the standard value is less than 30%. That is, the electrolytic capacitor has a characteristic that, at the end of its life, the relationship between the characteristic change and the amount of the electrolytic solution is not linear but changes rapidly.

  Therefore, in the method for determining the life of the electrolytic capacitor described in Patent Document 1, since the life of the electrolytic capacitor is determined based on the measurement of the ripple voltage, only the state in which the life of the electrolytic capacitor is at the end can be determined. That is, since it is difficult to grasp the life of the electrolytic capacitor to some extent before the end of the life of the capacitor, it is not preferable from the viewpoint of maintenance and inspection of the system protection relay.

  Moreover, in the degradation diagnosis method for the system protection relay power supply described in Patent Document 2, if there is no abnormality in the time until the output of the power supply device that is the device under test reaches a predetermined voltage level, the output of the power supply device is abnormal. Even if there is, it cannot be detected as degradation of the power supply device.

  Therefore, an object of the present invention is to provide a deterioration determination device and a deterioration determination method capable of determining deterioration of a device under measurement early and appropriately.

  In order to solve the above-described problem, a deterioration determination apparatus according to an aspect of the present invention includes a measurement unit that measures an output of a device under measurement and a determination unit that determines deterioration of the device under measurement based on a measurement result. The determination unit determines deterioration of the device under test based on the output voltage value of the device under test from when the device under test is turned on until the output voltage of the device under test reaches a predetermined voltage value. .

Preferably, the determination unit determines deterioration of a capacitor included in the device under measurement.
Preferably, the determination unit further determines deterioration of the device under measurement based on a time from when power is supplied to the device under measurement until the output voltage of the device under test reaches a predetermined voltage value.

  Preferably, the determination unit further determines deterioration of the device under test based on the output voltage value of the device under measurement after a predetermined time has elapsed since the output voltage of the device under test reached a predetermined voltage value.

  Preferably, the determination unit further determines deterioration of the device under test based on a maximum value and a minimum value of the output voltage of the device under test during a predetermined period after the output voltage of the device under test reaches a predetermined voltage value. .

  In order to solve the above-described problem, a deterioration determination method according to an aspect of the present invention includes a step of measuring an output of a device under measurement, and a determination step of determining deterioration of the device under measurement based on a measurement result. In the determination step, the deterioration of the device under test is determined based on the output voltage value of the device under test from when the device under test is turned on until the output voltage of the device under test reaches a predetermined voltage value. .

  Preferably, in the determination step, deterioration of the capacitor provided in the device under measurement is determined.

  Preferably, in the determination step, the deterioration of the device under test is further determined based on the time from when the device under test is turned on until the output voltage of the device under test reaches a predetermined voltage value.

  Preferably, in the determining step, the deterioration of the device under test is further determined based on the output voltage value of the device under test after a predetermined time has elapsed since the output voltage of the device under test reached a predetermined voltage value.

  Preferably, in the determination step, the deterioration of the device under test is further determined based on the maximum value and the minimum value of the output voltage of the device under test during a predetermined period after the output voltage of the device under test reaches a predetermined voltage value. To do.

  ADVANTAGE OF THE INVENTION According to this invention, deterioration of a to-be-measured apparatus can be determined early and appropriately.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the drawings, the same or corresponding parts are denoted by the same reference numerals and description thereof will not be repeated.

FIG. 1 is a functional block diagram showing a configuration of a deterioration determination apparatus according to an embodiment of the present invention.
With reference to FIG. 1, degradation determination apparatus 100 includes waveform measurement unit 11, determination unit 12, and display unit 13.

  The waveform measurement unit 11 measures the output waveform of the power supply device 200 that is the device under measurement. Determination unit 12 determines deterioration of power supply device 200 based on the measurement result received from waveform measurement unit 11. The display unit 13 displays the determination result received from the determination unit 12.

FIG. 2 is a functional block diagram showing the configuration of the power supply apparatus 200.
Referring to the figure, power supply device 200 includes an input voltage detection circuit 51, an inrush current protection circuit 52, a switching regulator circuit 53, a control circuit 54, a transformer 55, a rectifier circuit 56P, and a rectifier circuit 56N. And an output smoothing circuit 57P and an output smoothing circuit 57N. Input voltage detection circuit 51 includes a capacitor C1. The switching regulator circuit 53 includes a capacitor C2. Control circuit 54 includes a capacitor C3. The output smoothing circuit 57P includes a capacitor C4. The output smoothing circuit 57N includes a capacitor C5.

  The input voltage detection circuit 51 detects a DC voltage input from the outside. The inrush current protection circuit 52 prevents an inrush current from the outside from flowing to the subsequent circuit.

  Switching regulator circuit 53 converts the DC voltage received from inrush current protection circuit 52 into an AC voltage. Here, the switching regulator circuit 53 includes a switching element, and adjusts the voltage value or the like of the AC voltage by switching the ON state and the OFF state of the switching element based on the control signal received from the control circuit 54.

  The transformer 55 receives the AC voltage from the switching regulator circuit 53 and outputs the AC voltage to the rectifier circuit 56P and the rectifier circuit 56N.

  The rectifier circuit 56P and the rectifier circuit 56N convert the AC voltage received from the transformer 55 into a DC voltage having a predetermined voltage value.

  Output smoothing circuit 57P and output smoothing circuit 57N attenuate the high frequency components included in the DC voltages received from rectifier circuit 56P and rectifier circuit 56N, respectively, and output the attenuated DC voltage to the outside.

  The control circuit 54 outputs a control signal to the switching regulator circuit 53 based on the DC voltage that has passed through the output smoothing circuit 57P or the output smoothing circuit 57N.

  Next, an operation when the deterioration determination device 100 determines the deterioration of the power supply device 200 will be described.

[Judgment method 1]
FIG. 3 is a graph showing an operation when the deterioration determining device 100 determines the deterioration of the power supply device 200. Solid lines indicated by A1 to A3 are output waveforms of the power supply apparatus 200 when deterioration has occurred. A broken line indicated by B is a reference waveform, that is, an output waveform of the power supply apparatus 200 when no deterioration has occurred.

  Here, when a deteriorated capacitor is charged, the rise is moderated when the voltage across the capacitor exceeds a certain voltage value, and the time required to reach the rated voltage of the capacitor is longer than that of a good capacitor. Therefore, when the capacitor included in the switching regulator circuit 53, the output smoothing circuit 57P, or the output smoothing circuit 57N is deteriorated, the rising of the output waveform is often gradual as in A1. Further, when the capacitor C3 included in the control circuit 54 is deteriorated, the control for the switching regulator circuit 53 of the control circuit 54 malfunctions or a delay occurs in the control, so that the output waveform undulates like A3. In many cases, the rise of the output waveform becomes gradual as in A1. Further, when the capacitor further deteriorates, the output of the power supply device 200 may not reach the target voltage value.

  FIG. 4 is a flowchart showing an operation when the deterioration determination device 100 determines the deterioration of the power supply device 200.

  3 and 4, first, determination unit 12 detects a minimum value from voltage values at times t1, t2, and t3 using a pre-stored reference waveform, and detects the detected minimum value. Is the target voltage of the reference waveform (step S1). Here, times t1, t2, and t3 are times after a sufficient time has elapsed since the power supply device 200 was turned on and the output of the power supply device 200 was stabilized.

  Then, the determination unit 12 sets the period from the time Ta when the voltage value of the reference waveform is 0.05 V or more to the time Tb when the voltage reaches the target voltage as the reference waveform rising period (step S2). That is, the rising period of the reference waveform is represented by Tb-Ta.

  When power is turned on to the power supply device 200, the determination unit 12 causes the power supply device 200 to have the power supply device 200 every 0.5 ms from when the output voltage of the power supply device 200 becomes 0.05 V or higher until Tb-Ta elapses. The output waveform and the reference waveform are compared (step S3).

  If the voltage difference between the output waveform of the power supply device 200 and the reference waveform does not exceed ± 20% with respect to the voltage value of the reference waveform at all comparison times (YES in step S4), the determination unit 12 200 is determined to be normal (step S5). On the other hand, when the voltage difference between the output waveform of power supply apparatus 200 and the reference waveform exceeds ± 20% with respect to the voltage value of the reference waveform at any of the comparison times, determination unit 12 (in step S4). NO), it is determined that the power supply device 200 has deteriorated (step S6).

  Therefore, the comparison unit 2 can determine that the power supply apparatus 200 has deteriorated in the case of an output waveform such as A1 shown in FIG. 3, and reaches the target voltage at time Tb as in the reference waveform. In the case of output waveforms such as A2 and A3, that is, even when there is no abnormality in the time until the output of the power supply device 200 reaches the target voltage, it is possible to appropriately determine the deterioration of the power supply device 200.

  The comparison unit 2 is a case where the voltage difference between the output waveform of the power supply device 200 and the reference waveform does not exceed ± 20% with respect to the voltage value of the reference waveform at all the comparison times from the time Ta to the time Tb. However, when the output waveform undulates up and down as in A3, it is detected that the voltage difference between the output waveform of the power supply apparatus 200 and the reference waveform does not increase with time, and the power supply apparatus 200 deteriorates. It can also be configured to determine that the

  Next, another operation example when the deterioration determination device 100 determines deterioration of the power supply device 200 will be described.

[Judgment method 2]
FIG. 5 is a graph showing an operation when the deterioration determining device 100 determines the deterioration of the power supply device 200. A solid line indicated by A4 is an output waveform of the power supply apparatus 200 when deterioration has occurred. Here, A4 is a waveform in which the determination method 1 cannot determine the deterioration of the power supply device 200, that is, until the time Tb-Ta elapses after the voltage value becomes 0.05 V or more. The description will be made assuming that the voltage difference between the output waveform and the reference waveform does not exceed ± 20% with respect to the voltage value of the reference waveform. Since other views of the figure are the same as those in FIG. 3, the description thereof will not be repeated here.

  FIG. 6 is a flowchart illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200.

  Referring to FIG. 4, steps S11 and S12 are the same as steps S1 and S2 of FIG. 4, and thus description thereof will not be repeated here.

  When the power supply device 200 is turned on, the determination unit 12 determines the rising period of the power supply device 200, that is, until the target voltage value of the reference waveform is reached after the output voltage of the power supply device 200 becomes 0.05 V or higher. Time is measured (step S13).

  The determination unit 12 determines that the power supply device 200 is normal when the measured time does not exceed ± 20% with respect to the rising period of the reference waveform, that is, Tb-Ta (NO in step S14) (step S14). S16).

  On the other hand, when the measured time exceeds ± 20% with respect to the rising period of the reference waveform, that is, Tb-Ta (YES in step S14), the determination unit 12 does not exceed the expected life time ( NO in step S15), it is determined that the power supply device 200 has deteriorated (step S17).

  Furthermore, the determination unit 12 determines that the measured time exceeds ± 20% with respect to the rising period of the reference waveform, that is, Tb-Ta (YES in step S14), and exceeds the estimated life time (step S14). It is determined that the power supply device 200 has a lifetime, for example, the capacitor provided in the power supply device 200 has a lifetime (step S18).

  Here, for example, when the capacitor included in the power supply device 200 has a resistance value that is 30 times that of a non-defective capacitor, the estimated life time of the reference waveform of the reference waveform after the output voltage of the power supply device 200 becomes 0.05 V or more is used. This is the time to reach the target voltage value.

  Therefore, the comparison unit 2 can appropriately determine the deterioration of the power supply device 200 even for the waveform A4 in which the determination method 1 cannot determine the deterioration of the power supply device 200.

  Further, in the determination method 2, the power supply device can be efficiently repaired by the configuration for determining the life as a kind of deterioration of the power supply device 200. That is, when the power supply device 200 is at the end of its life, an accident failure is likely to occur, so the power supply device 200 is repaired quickly, and when the power supply device 200 is not at the end of its life, the urgency is low. For example, the power supply device 200 may be repaired at a predetermined time such as four times a year.

  Next, another operation example when the deterioration determination device 100 determines deterioration of the power supply device 200 will be described.

[Judgment method 3]
FIG. 7 is a graph showing an operation when the deterioration determining device 100 determines the deterioration of the power supply device 200. A solid line indicated by A5 is an output waveform of the power supply apparatus 200 when deterioration has occurred. Here, A5 will be described on the assumption that the determination method 1 cannot determine the deterioration of the power supply device 200. Since other views of the figure are the same as those in FIG. 3, the description thereof will not be repeated here.

  FIG. 8 is a flowchart illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200.

  With reference to the figure, when power is turned on to power supply device 200, determination unit 12 calculates an average value of the output voltage of power supply device 200 at times t1, t2, and t3, and the calculated average value is used as the power supply device. The rated voltage is 200 (step S21). Here, times t1, t2, and t3 are times after a sufficient time has elapsed since the power supply device 200 was turned on and the output of the power supply device 200 was stabilized.

  Then, when the calculated rated voltage is within the predetermined range Z with respect to the rated voltage of the reference waveform (YES in step S22), the determination unit 12 determines that the power supply device 200 is normal (step S23). ). Here, the rated voltage of the reference waveform is, for example, the target voltage of the reference waveform shown in FIG.

  On the other hand, when the calculated rated voltage is outside the predetermined range Z with respect to the rated voltage of the reference waveform (NO in step S22), the determination unit 12 has an abnormality in the rated voltage of the power supply device 200. It is determined that the apparatus 200 has deteriorated (step S24).

  Here, the reason why the rated voltage of the power supply device 200 does not reach the rated voltage of the reference waveform as shown by A5 in FIG. 7 is that, for example, the capacitor C3 included in the control circuit 54 has deteriorated, and the switching of the control circuit 54 It can be considered that there is a delay in the control of the regulator circuit 53.

  Therefore, the comparison unit 2 can appropriately determine the deterioration of the power supply device 200 even for the waveform A5 in which the determination method 1 cannot determine the deterioration of the power supply device 200.

  Next, another operation example when the deterioration determination device 100 determines deterioration of the power supply device 200 will be described.

[Judgment Method 4]
FIG. 9 is a graph illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200. A solid line indicated by A6 is an output waveform of the power supply apparatus 200 when deterioration has occurred. Here, a ripple waveform is generated in the output of the power supply apparatus 200. Here, A6 will be described on the assumption that the determination method 1 cannot determine the deterioration of the power supply device 200. Since other views of the figure are the same as those in FIG. 3, the description thereof will not be repeated here.

  FIG. 10 is a flowchart illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200.

  With reference to the figure, when power is turned on to power supply device 200, determination unit 12 calculates the maximum value and the minimum value of the output voltage of power supply device 200 in the period from time t1 to t3 (step S31). . For example, the determination unit 12 sets the sampling period of the output of the power supply apparatus 200 to 25 microseconds, compares the voltage value 25 microseconds before with the voltage value sampled this time, and detects an increase or decrease in the voltage value. By doing so, the maximum value and the minimum value of the output waveform are calculated.

  Here, the calculated maximum and minimum values are often the maximum and minimum values of a sine wave having the maximum amplitude as indicated by R1 in FIG. Times t1, t2, and t3 are times after sufficient time has passed since the power supply device 200 was turned on and the output of the power supply device 200 was stabilized.

  Next, when the difference between the calculated maximum value and minimum value exceeds a predetermined value (NO in step S32), the determination unit 12 determines that the power supply device 200 has a life (step S36).

  On the other hand, when the difference between the calculated maximum value and minimum value does not exceed the predetermined value (YES in step S32), the determination unit 12 determines each sine of the output waveform that is the power supply device 200 during the period from time t1 to time t3. The maximum and minimum values of the wave, that is, the voltage values of the peaks and valleys of the sine wave are calculated. And the determination part 12 calculates the average value of the maximum value of each sine wave in the time t1-t3, and the average value of the minimum value (step S33).

  When the difference between the calculated average value of the maximum value and the average value of the minimum value exceeds a predetermined value (NO in step S34), determination unit 12 determines that power supply device 200 has a life (step S36).

  On the other hand, when the difference between the average value of the calculated maximum value and the average value of the minimum value does not exceed the predetermined value (YES in step S34), determination unit 12 determines that power supply device 200 is normal (step S34). S35).

  Here, the reason why the ripple waveform is generated at the output of the power supply apparatus 200 as A6 shown in FIG. 9 is, for example, that at least one of the capacitor C4 included in the output smoothing circuit 57P and the capacitor C5 included in the output smoothing circuit 57N is It is considered that the DC voltage received from the rectifier circuit is not sufficiently smoothed because of deterioration.

  Therefore, the comparison unit 2 can appropriately determine the deterioration of the power supply device 200 even for the waveform A6 in which the determination method 1 cannot determine the deterioration of the power supply device 200.

  By the way, in the method for discriminating the life of the electrolytic capacitor described in Patent Document 1, there is a problem that it is difficult to grasp the life of the electrolytic capacitor to some extent before the end of the life of the capacitor. Further, in the degradation diagnosis method for the system protection relay power supply described in Patent Document 2, if there is no abnormality in the time until the output of the power supply apparatus reaches a predetermined voltage level, the power supply apparatus even if there is an abnormality in the output of the power supply apparatus There was a problem that it could not be detected as degradation of.

  However, in the degradation determination apparatus according to the embodiment of the present invention, in the determination method 1, after the power supply apparatus 200 is turned on, the reference waveform rises after the output voltage of the power supply apparatus 200 becomes 0.05 V or higher. Until the elapse of the period, the output waveform of the power supply apparatus 200 is compared with the reference waveform every 0.5 ms, and deterioration of the power supply apparatus 200 is determined based on the comparison result. Therefore, in the deterioration determination device according to the embodiment of the present invention, it is possible to determine the deterioration of power supply device 200 during the rising period of power supply device 200, and until the output of power supply device 200 reaches a predetermined voltage level. Even when the time is normal, it is possible to detect the deterioration of the power supply apparatus 200.

  Further, in the deterioration determination device according to the embodiment of the present invention, the deterioration determination of power supply device 200 is comprehensively determined by performing deterioration determination of power supply device 200 by appropriately combining determination method 1 with determination methods 2 to 4. It is possible to make a more appropriate deterioration determination.

  Moreover, in the degradation determination apparatus according to the embodiment of the present invention, in the determination method 1, after the power supply apparatus 200 is turned on, the reference waveform rises after the output voltage of the power supply apparatus 200 becomes 0.05 V or higher. Although the configuration is such that the deterioration of the power supply apparatus 200 is determined based on the output voltage value of the power supply apparatus 200 until the period elapses, the present invention is not limited to this. Deterioration of the power supply apparatus 200 based on the output voltage value of the power supply apparatus 200 after the power supply apparatus 200 is turned on until the output of the power supply apparatus 200 reaches a predetermined voltage value, for example, the target voltage value of the reference waveform. It can be set as the structure which determines.

  The embodiment disclosed this time should be considered as illustrative in all points and not restrictive. The scope of the present invention is defined by the terms of the claims, rather than the description above, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

It is a functional block diagram which shows the structure of the deterioration determination apparatus which concerns on embodiment of this invention. 3 is a functional block diagram showing a configuration of a power supply device 200. FIG. FIG. 6 is a graph showing an operation when the degradation determination device 100 determines degradation of the power supply device 200. 5 is a flowchart illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200. FIG. 6 is a graph showing an operation when the degradation determination device 100 determines degradation of the power supply device 200. 5 is a flowchart illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200. FIG. 6 is a graph showing an operation when the degradation determination device 100 determines degradation of the power supply device 200. 5 is a flowchart illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200. FIG. 6 is a graph showing an operation when the degradation determination device 100 determines degradation of the power supply device 200. 5 is a flowchart illustrating an operation when the deterioration determination device 100 determines deterioration of the power supply device 200. It is a conceptual diagram explaining the system protection relay in the power transmission line which supplies electric power. It is a graph explaining the alternating voltage value which appears in the output voltage waveform of an electrolytic capacitor. It is a graph explaining the relationship between the capacity | capacitance of an electrolytic capacitor, and a ripple voltage.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 Power station, 2 Breaker, 3 Transmission line, 4 System protection relay, 5 Current / voltage detector, 11 Waveform measurement part, 12 Judgment part, 13 Display part, 51 Input voltage detection circuit, 52 Inrush current protection circuit, 53 Switching Regulator circuit, 54 control circuit, 55 transformer, 56P, 56N rectifier circuit, 57P, 57N output smoothing circuit, C1 to C5 capacitor, 100 deterioration determination device, 200 power supply device.

Claims (10)

A measurement unit for measuring the output of the device under test;
A determination unit that determines deterioration of the device under measurement based on the measurement result,
The determination unit determines whether the device under test is based on an output voltage value of the device under test during a period from when power is supplied to the device under test until the output voltage of the device under test reaches a predetermined voltage value. A deterioration determination device for determining deterioration.   The deterioration determination device according to claim 1, wherein the determination unit determines deterioration of a capacitor included in the device under measurement.   The determination unit further determines deterioration of the device under test based on a time from when power is supplied to the device under test until an output voltage of the device under test reaches the predetermined voltage value. 1. The deterioration determination device according to 1.   The determination unit further determines deterioration of the device under test based on an output voltage value of the device under test after a predetermined time has elapsed since the output voltage of the device under test reaches the predetermined voltage value. The deterioration determination apparatus according to claim 1.   The determination unit further determines deterioration of the device under test based on a maximum value and a minimum value of the output voltage of the device under test in a predetermined period after the output voltage of the device under test reaches the predetermined voltage value. The deterioration determination apparatus according to claim 1 for determining. Measuring the output of the device under test;
A determination step of determining deterioration of the device under measurement based on the measurement result,
In the determining step, the device under measurement is based on an output voltage value of the device under test from when power is supplied to the device under test until an output voltage of the device under test reaches a predetermined voltage value. Deterioration determination method for determining deterioration of   The deterioration determination method according to claim 6, wherein in the determination step, deterioration of a capacitor provided in the device under measurement is determined.   In the determination step, the deterioration of the device under test is further determined based on the time from when the device under test is turned on until the output voltage of the device under test reaches the predetermined voltage value. Item 7. The deterioration determination method according to Item 6.   In the determining step, the deterioration of the device under test is further determined based on the output voltage value of the device under test after a predetermined time has elapsed since the output voltage of the device under test reaches the predetermined voltage value. The deterioration determination method according to claim 6.   In the determination step, the deterioration of the device under test is further performed based on the maximum value and the minimum value of the output voltage of the device under test in a predetermined period after the output voltage of the device under test reaches the predetermined voltage value. The deterioration determination method according to claim 6.

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