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JP2007093338A - Visual inspection system - Google Patents

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JP2007093338A
JP2007093338A JP2005281885A JP2005281885A JP2007093338A JP 2007093338 A JP2007093338 A JP 2007093338A JP 2005281885 A JP2005281885 A JP 2005281885A JP 2005281885 A JP2005281885 A JP 2005281885A JP 2007093338 A JP2007093338 A JP 2007093338A
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cylindrical
inspected
semi
inspection apparatus
objects
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JP2005281885A
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Japanese (ja)
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Tatsuya Hirai
達也 平井
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Tsubakimoto Chain Co
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Tsubakimoto Chain Co
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a visual inspection system for inspecting anomalous parts in the outer circumferential surfaces of objects to be inspected such as a cylindrical tube and capable of simplifying a system constitution, accurately inspecting the anomalous parts, and easily handing the objects to be inspected, in other words, easily inserting and extracting the objects to be inspected. <P>SOLUTION: The visual inspection system for inspecting anomalous parts in the outer circumferential surfaces of objects W2 to be inspected in the form of a cylindrical tube, a cylindrical column, a semi-cylindrical tube, and a semi-cylindrical column, comprises a pair of semi-cylindrical or half-ring illumination means 210 arranged on both ends of an object to be inspected; an imaging means 220 at a prescribed height on the center of the object to be inspected in its longitudinal direction; and a mechanism for rotating the object to be inspected in the form of a cylindrical tube or a cylindrical column. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、カメラ等の撮像手段により撮像した外観画像に基づき、円筒状、円柱状、略半円筒状、略半円柱状の被検査物の外周面のキズやクラック等を検出する外観検査装置に関するものである。   The present invention relates to an appearance inspection apparatus for detecting scratches, cracks, and the like on the outer peripheral surface of a cylindrical, columnar, substantially semi-cylindrical, or substantially semi-cylindrical object based on an appearance image captured by an imaging unit such as a camera. It is about.

物品の外周面の外観検査を行う装置として、内側を通過又は内側に位置する物品に対して異なる方向から異なる色の光を照射する2つのリング状光源と、棒状の検査対象物に対して直行する光軸方向に配置され、前記2つのリング状光源からの光で照射された部分を撮像するカラー画像撮像部と、前記カラー画像撮像部からの画像を各色の画像に分離し、分離した各色の画像から差分を求め、その後に差分画像の絶対値をとって差分絶対値画像とし、この差分絶対値画像を2値化し、その2値化した画像で凹凸欠陥の有無を検出する演算部とを具備している外観検査装置が知られている(例えば、特許文献1参照)。   As a device for inspecting the appearance of the outer peripheral surface of an article, two ring-shaped light sources that irradiate light of different colors from different directions to the article passing through or on the inner side, and direct to the rod-shaped inspection object A color image pickup unit that is arranged in the optical axis direction and picks up a portion irradiated with light from the two ring-shaped light sources, and an image from the color image pickup unit is separated into images of each color, and the separated colors A calculation unit that obtains a difference from the image of the image, then takes the absolute value of the difference image to obtain a difference absolute value image, binarizes the difference absolute value image, and detects the presence or absence of the uneven defect from the binarized image; There is known an appearance inspection apparatus including the above (for example, see Patent Document 1).

また、図4に示したように、被検査物W4の両端に四角形の平面照明410を設置し、キズやクラック等の異常箇所を白く光らせて、それをカメラ等の撮像手段420で撮像することによって、異常箇所を検査する外観検査装置400も知られている。   Also, as shown in FIG. 4, square plane illumination 410 is installed at both ends of the inspection object W4, and abnormal portions such as scratches and cracks are illuminated in white, and the image is taken by an imaging means 420 such as a camera. Therefore, an appearance inspection apparatus 400 that inspects abnormal places is also known.

特開2005−37203号公報JP-A-2005-37203

ところが、上述したようなリング状光源を用いた外観検査装置では、一対のリング状光源の間に被検査物を供給したり、排出したりする機構を設置するスペースがとれないため、装置構造が複雑化すると共に、画像処理の方法も煩雑化していた。   However, in the appearance inspection apparatus using the ring-shaped light source as described above, there is no space for installing a mechanism for supplying or discharging the object to be inspected between the pair of ring-shaped light sources. In addition to complexity, the image processing method has become complicated.

また、上述した四角形の平面照明を用いた外観検査装置では、被検査物の表面に明るさムラが発生し、異常箇所により明るく光っているのか、明るさムラのために明るく光っているのか区別が付きにくく、正確な外観検査ができないという問題が生じていた。   Further, in the appearance inspection apparatus using the above-described square planar illumination, brightness unevenness occurs on the surface of the object to be inspected, and it is distinguished whether it is brightly shining due to abnormal places or brightly shining due to uneven brightness. There was a problem that it was difficult to attach and accurate visual inspection could not be performed.

そこで、本発明の目的は、円筒体等の被検査物の外周面のキズやクラック等の異常箇所を検査する外観検査装置において、装置構成を簡略化し、且つ、正確に異常箇所を検査することが可能で、しかも被検査物の取扱い、すなわち、出し入れが容易な外観検査装置を提供することにある。   Accordingly, an object of the present invention is to simplify the apparatus configuration and accurately inspect an abnormal part in an appearance inspection apparatus that inspects an abnormal part such as a scratch or a crack on an outer peripheral surface of an inspection object such as a cylindrical body. In addition, an object of the present invention is to provide an appearance inspection apparatus that can handle an object to be inspected, that is, can be easily taken in and out.

請求項1に係る発明は、円筒状、円柱状、略半円筒状、略半円柱状の被検査物の外周面のキズやクラックを検査する外観検査装置において、前記被検査物の両端に配置された半円形状又は半リング形状の一対の照明手段を有し、前記被検査物の長手方向中心上の所定の高さに撮像手段を有する構成にしたことによって上記の課題を解決する。   The invention according to claim 1 is an appearance inspection apparatus that inspects scratches and cracks on the outer peripheral surface of a cylindrical, columnar, substantially semi-cylindrical, or substantially semi-cylindrical object, and is arranged at both ends of the object. The above-mentioned problem is solved by having a pair of illumination means having a semicircular shape or a semi-ring shape and having an imaging means at a predetermined height on the longitudinal center of the inspection object.

請求項2に係る発明は、請求項1に係る発明の構成に加えて、前記円筒状及び前記円柱状の被検査物の外周部のキズやクラックを検出するために、前記被検査物を回転させる機構を有する構成にしたことによって、上記の課題をさらに解決する。   According to a second aspect of the invention, in addition to the configuration of the first aspect of the invention, the inspection object is rotated in order to detect scratches and cracks in the outer peripheral portion of the cylindrical and columnar inspection objects. The above-described problem is further solved by adopting a configuration having a mechanism for causing the problem to occur.

なお、本発明が検査対象としている円筒状、円柱状、略半円筒状、略半円柱状の被検査物としては、特に限定されるものではないが、チェーンの部品であるピンやブシュに対して好適に適用される。   The cylindrical, columnar, substantially semi-cylindrical, and substantially semi-cylindrical objects to be inspected by the present invention are not particularly limited, but for pins and bushes that are parts of the chain. And is preferably applied.

請求項1に係る外観検査装置によれば、円筒状、円柱状、略半円筒状、略半円柱状の被検査物の外周面のキズやクラック等の異常箇所を検査する外観検査装置であって、前記被検査物の両端に配置された半円形状又は半リング形状の一対の照明手段を有し、前記被検査物の長手方向中心上の所定の高さに撮像手段を有する構成にしたことによって、被検査物の表面の各部分にほぼ同一光量が当たるため、被検査物表面上に明るさムラが生じることが抑制される。そのため、キズやクラック等の異常箇所の検査精度が向上する。また、照明手段が半円形状又は半リング状であるため、リング状照明に比べて設置しやすい。   According to the appearance inspection apparatus of the first aspect, it is an appearance inspection apparatus that inspects abnormal portions such as scratches and cracks on the outer peripheral surface of a cylindrical, columnar, substantially semi-cylindrical, and substantially semi-cylindrical object. And having a pair of semicircular or semi-ring illumination means arranged at both ends of the inspection object, and having an imaging means at a predetermined height on the longitudinal center of the inspection object. As a result, since almost the same amount of light strikes each part of the surface of the inspection object, it is possible to suppress the occurrence of uneven brightness on the surface of the inspection object. For this reason, the inspection accuracy of abnormal portions such as scratches and cracks is improved. Moreover, since the illumination means has a semicircular shape or a semi-ring shape, it is easier to install than the ring-shaped illumination.

請求項2に係る外観検査装置によれば、円筒状及び円柱状の被検査物を回転させる機構を有する構成にしたことによって、請求項1に係る外観検査装置が奏する効果に加えて、明るさムラの発生がより一層抑制され、円筒状及び円柱状の被検査物の全周の検査が少ない回転数で検査可能である。   According to the appearance inspection apparatus according to claim 2, in addition to the effect exhibited by the appearance inspection apparatus according to claim 1, brightness is achieved by having a mechanism that rotates the cylindrical and columnar inspection objects. The occurrence of unevenness is further suppressed, and the inspection of the entire circumference of the cylindrical and columnar inspection objects can be performed with a small number of rotations.

以下、本発明に係る外観検査装置の実施例について、図面に基づき説明する。   Embodiments of an appearance inspection apparatus according to the present invention will be described below with reference to the drawings.

図1(a)は、本発明に係る一実施の形態である外観検査装置100の全体構成を示した斜視図であり、図1(b)は、その正面図である。この図では、略半円柱状(すなわち、かまぼこ状)の被検査物W1を検査している状態を示している。照明手段110は、略半リング状をしており、その仮想中心が、図1(b)に示すように、前記被検査物W1の仮想中心VCとほぼ一致するように配置されている。照明手段110の光源としては、特に限定されるものではないが、寿命が長く、消費電力が少なく、発熱が少なく、充分な光量が得られる白色発光ダイオード112が好適に使用される。また、図1(a)の例では、白色発光ダイオード112をむき出しの状態で使用しているが、光を拡散する目的及び白色発光ダイオードが汚れることを防ぐ目的でアクリル板などで遮蔽することもできる。この場合、白色発光ダイオード112が汚れることを防止でき、アクリル板を拭うだけで常に良好な光量を得ることができる。撮像手段120は、被検査物W1の長手方向中心上の所定の高さに設置されている。この撮像手段120も特に限定されるものではないが、工業用CCDカメラが好適に使用される。一方、細かなキズに対しては、青色発光ダイオードと通常のCCDカメラあるいは紫外線発光ダイオードと紫外線用CCDカメラが用いられる。   FIG. 1A is a perspective view showing an overall configuration of an appearance inspection apparatus 100 according to an embodiment of the present invention, and FIG. 1B is a front view thereof. This figure shows a state in which a substantially semi-cylindrical (that is, semi-cylindrical) inspection object W1 is being inspected. The illumination means 110 has a substantially semi-ring shape, and is arranged so that its virtual center substantially coincides with the virtual center VC of the inspection object W1 as shown in FIG. The light source of the illumination unit 110 is not particularly limited, but a white light emitting diode 112 that has a long life, consumes less power, generates less heat, and provides a sufficient amount of light is preferably used. In the example of FIG. 1A, the white light emitting diode 112 is used in an exposed state, but may be shielded with an acrylic plate for the purpose of diffusing light and preventing the white light emitting diode from becoming dirty. it can. In this case, the white light emitting diode 112 can be prevented from becoming dirty, and a good light amount can always be obtained simply by wiping the acrylic plate. The imaging means 120 is installed at a predetermined height on the longitudinal center of the inspection object W1. The imaging unit 120 is not particularly limited, but an industrial CCD camera is preferably used. On the other hand, for fine scratches, a blue light emitting diode and a normal CCD camera or an ultraviolet light emitting diode and an ultraviolet CCD camera are used.

図2(a)は、本発明に係る別の実施の形態である外観検査装置200の全体構成を示した斜視図であり、図2(b)は、その正面図である。この図では、円柱状の被検査物W2を検査している状態を示している。照明手段210は、半リング状をしており、その中心が、図2(b)に示すように前記被検査物W2の中心Cと一致するように、配置されている。撮像手段220は、被検査物W2の長手方向中心上の所定の高さに設置されている。また、被検査物W2の直径よりも狭い間隔で平行に軸支された2本の支持棒230が設けられており、その上に被検査物W2が置かれている。そして、前記2本の支持棒230を回転させることにより、その上に置かれた被検査物W2を回転させることができる。そのため、被検査物W2の全周の検査を簡単に行うことができる。   FIG. 2A is a perspective view showing the overall configuration of an appearance inspection apparatus 200 according to another embodiment of the present invention, and FIG. 2B is a front view thereof. In this figure, the state which is inspecting cylindrical object W2 is shown. The illumination unit 210 has a semi-ring shape, and is arranged so that the center thereof coincides with the center C of the inspection object W2 as shown in FIG. The imaging means 220 is installed at a predetermined height on the longitudinal center of the inspection object W2. In addition, two support rods 230 that are pivotally supported in parallel at intervals smaller than the diameter of the inspection object W2 are provided, and the inspection object W2 is placed thereon. Then, by rotating the two support rods 230, the object W2 placed thereon can be rotated. Therefore, the entire circumference of the inspection object W2 can be easily inspected.

図3は、本発明に係る別の実施の形態である外観検査装置300の全体構成を示した斜視図である。この図では、円柱状の被検査物W3を検査している状態を示している。照明手段310は、半円形状をしている。撮像手段320は、被検査物W3の長手方向中心上の所定の高さに設置されている。この実施例に於いても被検査物W3の各部分に同一光量が当たるため、明るさムラがなくなり、正確な外観検査を行うことができる。   FIG. 3 is a perspective view showing the overall configuration of an appearance inspection apparatus 300 according to another embodiment of the present invention. In this figure, the state which is inspecting cylindrical object W3 is shown. The illumination means 310 has a semicircular shape. The imaging means 320 is installed at a predetermined height on the longitudinal center of the inspection object W3. Also in this embodiment, since the same amount of light hits each part of the inspection object W3, brightness unevenness is eliminated and an accurate appearance inspection can be performed.

本発明における実施例1の外観検査装置の斜視図と正面図。The perspective view and front view of the external appearance inspection apparatus of Example 1 in this invention. 本発明における実施例2の外観検査装置の斜視図と正面図。The perspective view and front view of the external appearance inspection apparatus of Example 2 in this invention. 本発明における実施例3の外観検査装置の斜視図。The perspective view of the external appearance inspection apparatus of Example 3 in this invention. 従来の外観検査装置の斜視図。The perspective view of the conventional external appearance inspection apparatus.

符号の説明Explanation of symbols

100、200、300、400 ・・・ 外観検査装置
110、210、310、410 ・・・ 照明手段
120、220、320、420 ・・・ 撮像手段
230 ・・・ 支持棒
W1、W2、W3、W4 ・・・ 被検査物
100, 200, 300, 400 ... visual inspection devices 110, 210, 310, 410 ... illumination means 120, 220, 320, 420 ... imaging means 230 ... support rods W1, W2, W3, W4 ... Inspected object

Claims (2)

円筒状、円柱状、略半円筒状、略半円柱状の被検査物の外周面のキズやクラックを検査する外観検査装置において、
前記被検査物の両端に配置された半円形状又は半リング形状の一対の照明手段を有し、
前記被検査物の長手方向中心上の所定の高さに撮像手段を有すること
を特徴とする外観検査装置。
In an appearance inspection apparatus for inspecting scratches and cracks on the outer peripheral surface of a cylindrical, columnar, substantially semi-cylindrical, substantially semi-cylindrical object,
A pair of illumination means having a semicircular shape or a semi-ring shape disposed at both ends of the inspection object;
An appearance inspection apparatus having an imaging means at a predetermined height on the longitudinal center of the inspection object.
円筒状及び円柱状の前記被検査物を回転させる機構を有すること
を特徴とする請求項1記載の外観検査装置。
The appearance inspection apparatus according to claim 1, further comprising a mechanism for rotating the cylindrical and columnar inspection objects.
JP2005281885A 2005-09-28 2005-09-28 Visual inspection system Pending JP2007093338A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011122986A (en) * 2009-12-11 2011-06-23 Mitsubishi Heavy Ind Ltd Crack inspection device and crack analyzer, method, and program
JP2017203734A (en) * 2016-05-13 2017-11-16 株式会社ジェイテクト Visual inspection method and visual inspection device
CN107389690A (en) * 2017-08-24 2017-11-24 广东上川智能装备股份有限公司 Pipe fitting cleaning detection all-in-one
CN114414487A (en) * 2022-01-19 2022-04-29 北京科技大学设计研究院有限公司 Two-dimensional and three-dimensional fused round steel surface imaging system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011122986A (en) * 2009-12-11 2011-06-23 Mitsubishi Heavy Ind Ltd Crack inspection device and crack analyzer, method, and program
JP2017203734A (en) * 2016-05-13 2017-11-16 株式会社ジェイテクト Visual inspection method and visual inspection device
CN107389690A (en) * 2017-08-24 2017-11-24 广东上川智能装备股份有限公司 Pipe fitting cleaning detection all-in-one
CN114414487A (en) * 2022-01-19 2022-04-29 北京科技大学设计研究院有限公司 Two-dimensional and three-dimensional fused round steel surface imaging system
CN114414487B (en) * 2022-01-19 2024-04-16 北京科技大学设计研究院有限公司 Round steel surface imaging system with two-dimensional and three-dimensional fusion

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