JP2005283393A - 慣性センサ - Google Patents
慣性センサ Download PDFInfo
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- JP2005283393A JP2005283393A JP2004099161A JP2004099161A JP2005283393A JP 2005283393 A JP2005283393 A JP 2005283393A JP 2004099161 A JP2004099161 A JP 2004099161A JP 2004099161 A JP2004099161 A JP 2004099161A JP 2005283393 A JP2005283393 A JP 2005283393A
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- inertial sensor
- stopper
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
- G01P15/123—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0035—Constitution or structural means for controlling the movement of the flexible or deformable elements
- B81B3/0051—For defining the movement, i.e. structures that guide or limit the movement of an element
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P1/00—Details of instruments
- G01P1/02—Housings
- G01P1/023—Housings for acceleration measuring devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/18—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration in two or more dimensions
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/50—Devices controlled by mechanical forces, e.g. pressure
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0228—Inertial sensors
- B81B2201/0235—Accelerometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
- G01P2015/084—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass the mass being suspended at more than one of its sides, e.g. membrane-type suspension, so as to permit multi-axis movement of the mass
- G01P2015/0842—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass the mass being suspended at more than one of its sides, e.g. membrane-type suspension, so as to permit multi-axis movement of the mass the mass being of clover leaf shape
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Pressure Sensors (AREA)
- Gyroscopes (AREA)
Abstract
【解決手段】 錘12と枠14は、張り合わせウエーハなどのSOI基板にMEMS技術によって一体的に形成されている。そして、錘ストッパ16は、ビーム13を支持する枠14と錘12との間の間隙部の一部を覆いながらSOI基板の上側Si結晶部分の枠14から水平方向に張り出して錘12の主面の枠14側領域の一部を覆うようにクリアランスdで形成されている。錘12がセンサのダイナミックレンジに対応する可動範囲内(d未満)で動く際には錘ストッパ16は錘12を制動することがないが、センサに衝撃が加わったことにより錘12がセンサのダイナミックレンジに対応する可動範囲以上(d以上)に動こうとすると錘ストッパ16が錘12を制動し、破壊するなどの事態が回避されることとなる。
【選択図】 図3
Description
11 ピエゾ抵抗
12 錘
13 ビーム
14 枠
15 ガラス基板
16 錘ストッパ
16´ 柱状部
17 センシング部
18 パッケージ
19 キャップ
20 接着剤
21、22、25 酸化膜
23 Bイオン注入
24 配線
26 Alパッド保護パターン
27 ガラス片
28 Cr層
29 配線部
30 ワイヤ
31a 上部ストッパ
31b 下部ストッパ
32 信号線
33 バンプ
34 突起(スペーサ)
35 検出用電極
36 駆動用電極
Claims (11)
- 可動部である錘がビームにより支持されるセンシング部構成の慣性センサであって、
前記錘の可動範囲を制限する錘ストッパを備え、
前記錘ストッパは、前記慣性センサ用基板の一部がMEMS加工されて前記錘の近傍に当該錘と所定のクリアランスをもって配置されていることを特徴とする慣性センサ。 - 前記錘ストッパは、前記ビームを支持する枠部と前記錘との間の間隙部の一部を覆いながら前記枠部側から前記錘側へと張り出していることを特徴とする請求項1に記載の慣性センサ。
- 前記錘ストッパの一部領域に柱状部が設けられて強度補強されていることを特徴とする請求項1または2に記載の慣性センサ。
- 前記錘ストッパはMEMS加工されたSiで構成されていることを特徴とする請求項1乃至3の何れかに記載の慣性センサ。
- 前記基板はSOI基板であり、
前記錘ストッパは当該SOI基板のSi部分をMEMS加工したものであることを特徴とする請求項4に記載の慣性センサ。 - 前記錘ストッパは、前記慣性センサの支持部底面もしくはパッケージキャップ内面の少なくとも一方に設けられていることを特徴とする請求項1乃至3の何れかに記載の慣性センサ。
- 前記錘ストッパの端部に前記慣性センサの支持部底面もしくはパッケージキャップ内面の位置を規定するスペーサを備え、当該スペーサにより前記クリアランスが調整されていることを特徴とする請求項6に記載の慣性センサ。
- 前記センシング部の枠部にバンプを備え、当該バンプにより前記クリアランスが調整されていることを特徴とする請求項6または7に記載の慣性センサ。
- 前記錘ストッパの前記錘への対向面もしくは前記錘の前記錘ストッパへの対向面の少なくとも一方に凹凸部を備え、当該凹凸部により前記クリアランスが調整されていることを特徴とする請求項1乃至8の何れかに記載の慣性センサ。
- 前記クリアランスは、前記慣性センサのダイナミックレンジに対応する前記錘の可動範囲以上に設定されていることを特徴とする請求項1乃至9の何れかに記載の慣性センサ。
- 前記センシング部はフリップチップ実装されてパッケージ内に格納されていることを特徴とする請求項1乃至9の何れかに記載の慣性センサ。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004099161A JP2005283393A (ja) | 2004-03-30 | 2004-03-30 | 慣性センサ |
EP05251783A EP1582879A1 (en) | 2004-03-30 | 2005-03-23 | Inertial sensor |
KR1020050025556A KR100627217B1 (ko) | 2004-03-30 | 2005-03-28 | 관성 센서 |
CNA2005100597047A CN1677056A (zh) | 2004-03-30 | 2005-03-29 | 惯性传感器 |
US11/091,456 US7019231B2 (en) | 2004-03-30 | 2005-03-29 | Inertial sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004099161A JP2005283393A (ja) | 2004-03-30 | 2004-03-30 | 慣性センサ |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2005283393A true JP2005283393A (ja) | 2005-10-13 |
Family
ID=34879970
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004099161A Pending JP2005283393A (ja) | 2004-03-30 | 2004-03-30 | 慣性センサ |
Country Status (5)
Country | Link |
---|---|
US (1) | US7019231B2 (ja) |
EP (1) | EP1582879A1 (ja) |
JP (1) | JP2005283393A (ja) |
KR (1) | KR100627217B1 (ja) |
CN (1) | CN1677056A (ja) |
Cited By (7)
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KR100927094B1 (ko) | 2006-09-27 | 2009-11-13 | 후지쯔 가부시끼가이샤 | 마이크로 구조체 제조 방법 및 마이크로 구조체 |
WO2010140468A1 (ja) | 2009-06-03 | 2010-12-09 | アルプス電気株式会社 | 物理量センサ |
US8387459B2 (en) | 2008-10-28 | 2013-03-05 | Rohm Co., Ltd. | MEMS sensor |
WO2015151951A1 (ja) * | 2014-03-31 | 2015-10-08 | 北陸電気工業株式会社 | 角速度センサ |
US10215566B2 (en) | 2015-09-15 | 2019-02-26 | Seiko Epson Corporation | Oscillator, electronic device, and moving object |
US10386186B2 (en) | 2015-09-15 | 2019-08-20 | Seiko Epson Corporation | Physical quantity sensor, electronic device, and moving object |
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JP4216525B2 (ja) * | 2002-05-13 | 2009-01-28 | 株式会社ワコー | 加速度センサおよびその製造方法 |
JP2004085296A (ja) * | 2002-08-26 | 2004-03-18 | Matsushita Electric Works Ltd | 半導体加速度センサ |
JP4518738B2 (ja) | 2002-12-18 | 2010-08-04 | Okiセミコンダクタ株式会社 | 加速度センサ |
EP1491901A1 (en) * | 2003-06-25 | 2004-12-29 | Matsushita Electric Works, Ltd. | Semiconductor acceleration sensor and method of manufacturing the same |
-
2004
- 2004-03-30 JP JP2004099161A patent/JP2005283393A/ja active Pending
-
2005
- 2005-03-23 EP EP05251783A patent/EP1582879A1/en not_active Withdrawn
- 2005-03-28 KR KR1020050025556A patent/KR100627217B1/ko not_active IP Right Cessation
- 2005-03-29 CN CNA2005100597047A patent/CN1677056A/zh active Pending
- 2005-03-29 US US11/091,456 patent/US7019231B2/en not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007250869A (ja) * | 2006-03-16 | 2007-09-27 | Oki Electric Ind Co Ltd | ピエゾ抵抗素子及びその製造方法 |
KR100927094B1 (ko) | 2006-09-27 | 2009-11-13 | 후지쯔 가부시끼가이샤 | 마이크로 구조체 제조 방법 및 마이크로 구조체 |
US8387459B2 (en) | 2008-10-28 | 2013-03-05 | Rohm Co., Ltd. | MEMS sensor |
WO2010140468A1 (ja) | 2009-06-03 | 2010-12-09 | アルプス電気株式会社 | 物理量センサ |
WO2015151951A1 (ja) * | 2014-03-31 | 2015-10-08 | 北陸電気工業株式会社 | 角速度センサ |
US10215566B2 (en) | 2015-09-15 | 2019-02-26 | Seiko Epson Corporation | Oscillator, electronic device, and moving object |
US10386186B2 (en) | 2015-09-15 | 2019-08-20 | Seiko Epson Corporation | Physical quantity sensor, electronic device, and moving object |
Also Published As
Publication number | Publication date |
---|---|
US20050217373A1 (en) | 2005-10-06 |
KR20060044857A (ko) | 2006-05-16 |
CN1677056A (zh) | 2005-10-05 |
US7019231B2 (en) | 2006-03-28 |
EP1582879A1 (en) | 2005-10-05 |
KR100627217B1 (ko) | 2006-09-25 |
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