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JP2004153045A - Method and metallic mold for molding sealing with resin for electronic part - Google Patents

Method and metallic mold for molding sealing with resin for electronic part Download PDF

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Publication number
JP2004153045A
JP2004153045A JP2002317177A JP2002317177A JP2004153045A JP 2004153045 A JP2004153045 A JP 2004153045A JP 2002317177 A JP2002317177 A JP 2002317177A JP 2002317177 A JP2002317177 A JP 2002317177A JP 2004153045 A JP2004153045 A JP 2004153045A
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Japan
Prior art keywords
mold
resin
substrate
electronic component
cavity
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JP2002317177A
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Japanese (ja)
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JP4358501B2 (en
Inventor
Shinji Takase
慎二 高瀬
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Towa Corp
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Towa Corp
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  • Injection Moulding Of Plastics Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method and a metallic mold for molding sealing with resin for an electronic part by which the productivity of products is efficiently improved by efficiently preventing resin burr, wire deformation, etc. caused by curving of a substrate and efficiently solving problems on resin molding. <P>SOLUTION: In the mold clamping process of metallic molds 1, 2 and 3, the upper mold 1 is covered with a mold release film 4, and an electronic part (a semiconductor chip 7) and a wire 8 are fitted into a cavity space 28 formed by a cavity 19 extending through a middle plate 3 and an upper mold metallic mold surface 11 covered with the film 4. In the state of setting at least the space 28 to a prescribed vacuum degree by a vacuuming mechanism, melt resin 31 is injected into the cavity space 28 through a resin path 30 provided in linkage with the inside of the cavity space 28 and without contact with the substrate 6, to mold and seal the electronic part and the wire 8 with the resin. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
本発明は、IC等の半導体チップ(電子部品)の搭載された基板を樹脂封止成形用金型にて一括して樹脂封止成形する電子部品の樹脂封止成形方法及び金型の改良に関するものである。
【0002】
【従来の技術】
従来より、電子部品の樹脂封止成形用金型を用いて、基板に搭載した複数個の半導体チップを一括して樹脂封止成形(一括片面モールド)することが行われている。
【0003】
例えば、図5に示すように、従来の樹脂封止成形用金型(二枚型)には、固定上型101と可動下型102とから構成されている。
また、金型101・102にて樹脂封止成形される基板103には、複数個の半導体チップ104(電子部品)が搭載されていると共に、前記基板103側と該チップ104とをワイヤ105で電気的に接続するように構成されている。
また、上型101の金型面(上型面106)には、トランスファー成形により加熱溶融化された樹脂材料を注入する樹脂通路107と、樹脂通路107と連通し且つ該チップ104とワイヤ105とを一括樹脂封止するキャビティ108とが設けられている。
また、下型101の金型面(下型面109)には、該チップ104とワイヤ105とを装着した基板103を下型面109の所定位置に供給セットできるセット用凹所110が設けられていると共に、基板103をセット用凹所109に供給セットする場合、該チップ104・ワイヤ105装着側を上方向に向けた状態で供給セットするように構成されている。
また、図示していないが、金型101・102には、樹脂材料を加熱溶融化させる加熱ヒータ等の加熱手段を埋設していると共に、加熱ヒータにて金型101・102を所定の樹脂成形温度にまで加熱して樹脂材料を加熱溶融化して溶融樹脂111となるように構成されている。
【0004】
即ち、まず、上型101と下型102とが型開き状態で、基板103の該チップ104・ワイヤ105装着側を上方向に向けた状態で凹所120に基板103を供給セットする。
次に、上型101と下型102とを完全型締めし、次に、上型面106のキャビティ108内に嵌装された該チップ104・ワイヤ105(樹脂成形体)を予め加熱溶融化された溶融樹脂111にて樹脂通路107を介して注入し、次に、基板103に搭載された該チップ104・ワイヤ105に樹脂封止された溶融樹脂111が硬化して硬化樹脂を形成して封止済基板(製品)を形成する。
【0005】
なお、前述したような従来例が記載されている特許文献等を調査したが発見できなかった。
【0006】
【発明が解決しようとする課題】
しかしながら、近年の基板の大型化・薄型化をし、以下のような樹脂成形上の諸問題が発生して、製品の生産性が低下している。
【0007】
即ち、基板の大型化・薄型化により、基板の厚さにばらつきが発生している。例えば、基板が薄い場合、上型面と基板面との間に隙間が発生して、基板上面に樹脂が浸入して樹脂ばりを付着形成したり、半導体チップ非装着面(バンプ形成面・基板下面)に樹脂が浸入して樹脂ばりを付着形成したりする。
また、基板が厚い場合、上型面と基板面との型締圧力による基板におけるクラックが発生する。
従って、下型に基板の厚みに対応する摺動タイプの凹所底面部材(フロート)を設けた構成が検討されている。
しかしながら、下型と底面部材との間に樹脂が浸入して底面部材(フロート)が摺動不良を引き起こし、金型の修理とメンテナンスとを頻繁に行わなければならず、製品の生産性が低下している。
【0008】
また、基板の大型化・薄型化によって、高密度の樹脂が使用されることが多くなって、キャビティ面と樹脂成形体との密着性が強くなるためエジェクタピンによる離型時に基板が反り返って樹脂成形体にクラックが発生したり、樹脂の流れが悪くなるため空気等が樹脂に巻き込まれて樹脂成形体にクラックが発生する。従って、キャビティ面に離型フィルムを吸着固定して樹脂封止するフィルム成形と、少なくともキャビティから空気等を強制的に排出して樹脂封止成形する真空成形とを併用した構成が検討されている。
しかしながら、前述の離型フィルムが圧力の関係でキャビティ内に移動し、離型フィルムがワイヤを変形或いは断線し、製品の歩留まりが低下している。
【0009】
また、基板の大型化・薄型化によって、金型の所定位置に基板を供給セットする場合、基板が薄いために基板に反りが発生し易くなるので、上型のキャビティ天面にワイヤが接触し易くワイヤを変形或いは断線し、製品の歩留まりが低下している。
【0010】
従って、本発明は、基板反りによる樹脂ばりとワイヤ変形等とを効率良く防止すると共に、樹脂成形上の諸問題を効率良く解決して製品の生産性を効率良く向上させる、電子部品の樹脂封止成形方法及び金型を提供することを目的とするものである。
【0011】
【課題を解決するための手段】
前記した技術的課題を解決するために本発明に係る電子部品の樹脂封止成形方法は、一方の型と他方の型と前記両型の間に設けられ且つ貫通した状態で形成された樹脂成形用キャビティを備えた中間プレートとを含む電子部品の樹脂封止成形用金型を用意する工程と、前記した他方の型の所定位置に基板側とワイヤで電気的に接続した電子部品を装着した基板を供給セットする工程と、前記した金型の所定位置に樹脂材料を供給して加熱溶融化する工程と、前記した金型を型締めする工程と、前記した金型の型締工程時に、前記したキャビティと前記した一方の型の型面とからキャビティ空間部を形成する工程と、前記した金型の型締工程時に、前記した他方の型にて前記した基板を弾性支受した状態で前記キャビティ空間部内に前記した電子部品とワイヤとを嵌装セットする工程と、前記したキャビティ空間部に連通され且つ前記基板とは非接触状態で設けられた樹脂通路を通して前記した加熱溶融化された樹脂材料を前記キャビティ空間部内に注入することにより、前記したキャビティ空間部内で前記したワイヤと電子部品とを樹脂封止成形する工程とを含むことを特徴とする。
従って、金型の型締め工程時において、摺動部材に弾性支受した状態で他方の型の所定位置に基板を供給セットすることができるので、基板の反りによる樹脂ばりとワイヤ変形等とを効率良く防止することができる。
【0012】
また、前記した技術的課題を解決するために本発明に係る電子部品の樹脂封止成形方法は、少なくとも一方の型と他方の型と前記両型との間に設けられ且つ貫通した状態で形成された樹脂成形用キャビティを備えた中間プレートとを含む電子部品の樹脂封止成形用金型と、前記した一方の型と中間プレートとの間に供給される離型フィルムと、前記した他方の型と中間プレートとの間に供給される基板側とワイヤで電気的に接続した電子部品を装着した基板とを用意する工程と、前記した他方の型の所定位置に前記電子部品を装着した基板を供給セットする工程と、前記した金型の所定位置に樹脂材料を供給して加熱溶融化する工程と、前記した金型を型締めする工程と、前記した金型の型締工程時に、前記した一方の型の型面に前記した離型フィルムを被覆することにより、前記したキャビティと前記した離型フィルムを被覆した一方の型の型面とからキャビティ空間部を形成する工程と、前記した金型の型締工程時に、前記した他方の型にて前記した基板を弾性支受した状態で前記キャビティ内に前記した電子部品とワイヤとを嵌装セットする工程と、前記した金型の型締工程時に、前記した一方の型と中間プレートと間に前記したキャビティ空間部内に前記した基板と非接触状態で前記した加熱溶融化された樹脂材料を注入する樹脂通路を形成する工程と、前記した金型の型締工程時に、少なくとも前記した加熱溶融化された樹脂材料と接触する金型面を外気遮断状態にして外気遮断範囲を形成する工程と、前記した外気遮断範囲内の空気を強制的に吸引排出して少なくとも前記したキャビティ空間部を所定の真空度に設定する工程と、前記した樹脂通路を通して前記した所定の真空度に設定されたキャビティ空間部内に前記した加熱溶融化された樹脂材料を注入することにより、前記したキャビティ空間部内で前記したワイヤと電子部品とを樹脂封止成形する工程とを含むことを特徴とする。
従って、金型の型締め工程時において、離型フィルムが一方の型面に被覆されるので、所定の真空度に設定圧力に左右されず離型フィルムがキャビティ空間部内に移動せず、離型フィルムがワイヤを変形或いは断線することを効率良く防止すると共に、所定の真空度に設定した状態で、キャビティ空間部内に連通し且つ基板と非接触状態で設けた樹脂通路を通して加熱溶融化された樹脂材料を注入するので、溶融樹脂の流れが良くなりボイドの発生を効率良く防止する。
また、封止済基板を金型から離型する場合、離型フィルムを一方の型面に被覆することができるので、従来のエジェクタピンによる基板が反り返ってクラックが発生することを効率良く防止する。
従って、樹脂成形上の諸問題を効率良く解決して製品の生産性を効率良く向上させることができる。
【0013】
また、前記した技術的課題を解決するために本発明に係る電子部品の樹脂封止成形用金型は、一方の型と、一方の型に対向配置した他方の型と、前記した両型間に設けた中間プレートと、前記した中間プレートに貫通した状態で設けた樹脂成形用キャビティと、前記した他方の型に設けられ且つ基板側とワイヤで電気的に接続した電子部品を装着した基板における前記したワイヤと電子部品とを前記したキャビティ内に嵌装した状態で前記した基板を弾性支受する基板セット用摺動部材と、前記した一方の型と中間プレートとを型締めして形成される樹脂注入用樹脂通路とを含むことを特徴とする。
従って、金型の型締め工程時において、摺動部材に弾性支受した状態で他方の型の所定位置に基板を供給セットすることができるので、基板の反りによる樹脂ばりとワイヤ変形等とを効率良く防止することができる。
【0014】
また、前記した技術的課題を解決するために本発明に係る電子部品の樹脂封止成形用金型は、一方の型と、該一方の型に対向配置した他方の型と、前記した両型間に設けた中間プレートと、前記した中間プレートに貫通した状態で設けた樹脂成形用のキャビティと、前記した一方の型の型面を被覆する離型フィルムと、前記した他方の型に設けた基板側とワイヤで電気的に接続した電子部品を装着した基板を前記したワイヤと電子部品とを前記したキャビティ方向に向けた状態で弾性支受する基板セット用摺動部材と、前記した一方の型と中間プレートとを型締めして形成される樹脂注入用の樹脂通路と、前記した他方の型と中間プレートと少なくとも一方の型面に設けられ且つ前記した加熱溶融化された樹脂材料と接触する金型面を外気遮断状態にして外気遮断囲を形成するシール部材と、前記した外気遮断範囲から空気を強制的に吸引排出する真空引き機構とを含むことを特徴とする。
従って、金型の型締め工程時において、離型フィルムが一方の型面に被覆されるので、所定の真空度に設定圧力に左右されず離型フィルムがキャビティ空間部内に移動せず、離型フィルムがワイヤを変形或いは断線することを効率良く防止すると共に、所定の真空度に設定した状態で、キャビティ空間部内に連通し且つ基板と非接触状態で設けた樹脂通路を通して加熱溶融化された樹脂材料を注入するので、溶融樹脂の流れが良くなりボイドの発生を効率良く防止する。
また、封止済基板を金型から離型する場合、離型フィルムを一方の型面に被覆することができるので、従来のエジェクタピンによる基板が反り返ってクラックが発生することを効率良く防止する。
従って、樹脂成形上の諸問題を効率良く解決して製品の生産性を効率良く向上させることができる。
【0015】
【発明の実施の形態】
以下、図1乃至図4に基づいて、詳細に説明する。
なお、図1乃至図4は、本発明に係る樹脂封止成形用金型における各工程を段階的に示した概略拡大縦断面図である。
【0016】
即ち、本発明に係る電子部品の樹脂封止成形用金型において、例えば、図1に示すように、上型1(一方の型)と該上型1に対向配置した下型2(他方の型)と両型1・2間に設けた中間プレート3とから成る樹脂封止成形用金型と、上型1の金型面を被覆する離型フィルム4を上型1と中間プレート3との間に供給する離型フィルム供給機構(図示しない)と、両型1・2の金型面に設けられ且つ加熱溶融化された樹脂材料と接触する金型面を外気遮断状態にして外気遮断範囲を形成するシール部材5と、外気遮断範囲から空気を強制的に吸引排出する真空引き機構(図示しない)とを設けている。
【0017】
また、本実施例における電子部品(IC等の半導体チップ7)が搭載された基板6は、例えば、図1に示すように、基板6上の所定個所にダイボンディングされマトリクス状に配列された半導体チップ7と、基板6側と該チップ7とを電気的に接続するワイヤ8とから少なくとも構成されていると共に、電子部品側7・8には、加熱溶融化された樹脂材料で樹脂封止する樹脂成形体9部分と樹脂封止されない基板外周部10とが形成され構成されている。
なお、電子部品が搭載された他の基板6としては、基板6上に所定個所にバンプを介して電気的に接続された半導体チップ7から構成されたフリップチップ基板を用いてもよい。
【0018】
また、上型1には、例えば、図1で示すように、離型フィルム4を緊張して被覆することができる、上型金型面11と傾斜部12A・12Bとを下方向に凸形状の状態で形成する上型用凸所ブロック13と、凸所ブロック13を取り囲むように付設されたフィルム用保持部材14A・14Bと、保持部材14A・14Bを摺動自在に上下往復動させる弾性部材15A・15Bと、凸所ブロック13と保持部材14A・14Bと弾性部材15A・15Bとを着脱自在に嵌め込むことができる上型固定面16を有する上型固定ブロック17とが設けられていると共に、上型固定ブロック17の外周囲には、シール部材5を付設した上型外周ブロック18とが設けられている。
【0019】
また、中間プレート3は、例えば、図1に示すように、中間プレート3に貫通した状態で設けられ且つ基板6に装着した電子部品側7・8を嵌装するキャビティ19と、上型1の上型固定面16・保持部材14Aと傾斜部12Aと接合できる離型フィルム4を介して形成したフィルム用狭持面21と傾斜面20Aと、基板外周部10と下型固定面25と下型固定ブロック27に付設したシール部材5とに当接する基板当接面22と、加熱溶融化された樹脂材料を注入できる傾斜面20Bと樹脂通路面28とが形成され構成されている。
【0020】
また、下型2には、電子部品(半導体チップ7)とワイヤ8とを装着した基板6を上方向(キャビティ19方向)に向けて所定位置に弾性支受できる基板セット用摺動部材23と、摺動部材23を摺動自在に上下往復動させる弾性部材24と、摺動部材23と弾性部材24とを着脱自在に嵌め込むことができる下型固定面25を有する下型固定ブロック26と、下型固定ブロックの外周囲にあるシール部材5を付設した下型外周ブロック27とが設けられている。
【0021】
また、上型の弾性部材15A・15Bと下型2の弾性部材24とは、例えば、スプリング等を設けて構成されている。
また、図示していないが、金型1・2・3には、樹脂材料を加熱溶融化させる加熱ヒータ等の加熱手段を埋設していると共に、加熱ヒータにて金型1・2・3を所定の樹脂成形温度にまで加熱して樹脂材料を加熱溶融化して溶融樹脂31となるように構成されている。
なお、図示していないが、前記した金型1・2・3には二枚の基板6における樹脂成形体11内に樹脂を注入するように構成されていると共に、一枚の基板6のみを樹脂封止成形するようにしてもよい。
【0022】
従って、金型1・2・3にて基板6の樹脂成形体11を樹脂封止する場合、まず、図1で示すように、金型1・2・3が型開きした状態であって、所定の張力に張架された状態で水平に保持された離型フィルム4が、上型1と中間プレート3との間に供給されると共に、基板6が樹脂成形体11側(電子部品側7・8)を上方向にした状態で、中間プレート3と下型2との間に供給され且つ摺動部材23の所定位置の直上部まで供給される。
このとき、保持部材14A・14Bと摺動部材23とは、各別に付設した弾性部材15A・15Bと弾性部材24とが連動しており、弾性部材15A・15B・24は、伸びた状態(復元した状態)であると共に、少なくとも、狭持部材15A・15Bの底面は、上型固定面16より下方向に突出するように構成されており、且つ、摺動部材23の天面は、下型固定面25より上方向に突出するように構成されている。
【0023】
次に、摺動部材23の所定位置の直上部まで供給された基板6を摺動部材23に供給セットし、次に、図2に示すように、中間プレート3と下型2とが型締めする、つまりは、基板当接面22は、基板外周部10と下型固定面25とが当接し、且つ下型固定ブロック27に付設したシール部材5と接触することになる。このとき、基板6と摺動部材23とは、基板6の厚みに対応して下動する(下方向に摺動する)と共に、摺動部材23に付設した弾性部材24が縮んだ状態、つまりは、弾性部材23に弾性支受した状態となって基板6を破損しないような弾性力で弾性支受され、且つ基板固定部10と基板当接面22との間に隙間がなく当接されるように構成れている。
従って、摺動部材23に弾性支受した状態で下型2の弾性部材23の所定位置に基板6を供給セットすることができるので、基板の反りによる樹脂ばりとワイヤ変形等とを効率良く防止することができる。
【0024】
なお、図2で示すように、離型フィルム4は、水平状態となって上型1と中間プレート3との間に待機しているが、このとき、該フィルム4を該フィルム供給機構にて上動させて、上型1にある上型金型面11と傾斜部12A・12Bとフィルム狭持部材14A・14Bの底面と上型固定面16とに、予め接触して被覆させて上型固定面16の該フィルム4を緊張させて被覆する構成にしてもよい。
【0025】
次に、図3で示すように、上型1と中間プレート3とが型締めすることで、上型1と下型2と中間プレート3とが完全に型締め状態となる。
このとき、離型フィルム4は、上型1と中間プレート3とが型締めすることにより、上型凸部ブロック13に形成された下方向に凸形状にある上型金型面11に緊張して被覆するように構成されている。
また、上型1と中間プレート3とが型締めすることにより、離型フィルム4を緊張して被覆した上型金型面11と中間プレート3のキャビティ19とで形成されるキャビティ空間部29と、キャビティ空間部29と連通しており且つ該フィルム4を被覆した傾斜部12B・保持部材14B底面と傾斜面20Bと樹脂通路面28とで形成される樹脂通路30とが構成される。
【0026】
ここで、図3で示すように、上型金型面11に離型フィルム4を緊張して被覆する場合、上型金型面11に該フィルム4が接触して被覆されて傾斜部12A・12Bとの形状に沿って該フィルム4が接触して被覆することで上型金型面11に該フィルム4のフィルム皺を発生することなく緊張させ被覆すると共に、上型1の傾斜部12A・保持部材14A底面・上型固定面16と中間プレート3の狭持面21A・傾斜面20Aとが該フィルム4を狭持し保持する、このとき、保持部材14Aは上動し且つ弾性部材15Aを縮むようにして該フィルム4を狭持して保持するように構成されている。
また、上型1の保持部材14Aと同様に、保持部材14Bも該フィルム4を被覆した状態で上動し且つ弾性部材15Aを縮むように構成されていると共に、該フィルム4が傾斜部12Bと保持部材14Aとを被覆して樹脂通路30を形成することができるのであれば、弾性部材15Bを付設せずに上型凸部ブロック13と保持部材14Bとを一体型にして設けてもよい。
【0027】
従って、図3に示すように、金型1・2・3の型締め工程時に、キャビティ空間部28内に嵌装セットされた樹脂成形体9部分の電子部品(半導体チップ7)とワイヤ8とに非接触状態で、予め加熱溶融化された樹脂材料を溶融樹脂31として樹脂通路30を通して当該溶融樹脂31を注入する。
このとき、金型1・2・3の型締め工程時に、上型固定ブロック18と下型固定ブロック27とに付設された各シール部材5が中間プレート3の狭持面21と基板当接面22とに各別に当接して、少なくとも溶融樹脂31と接触する金型面を外気遮断状態にして外気遮断範囲を形成して、真空引き機構にて外気遮断範囲から空気を強制的に吸引排出して少なくともキャビティ空間部28を所定の真空度に設定して、樹脂通路30を通して当該溶融樹脂31を注入するように構成されている。
【0028】
次に、図示していないが、金型1・2・3の型締め工程時に、キャビティ空間部28内に嵌装セットされた樹脂成形体9部分の電子部品(半導体チップ7)とワイヤ8とに非接触状態で、樹脂通路30を通して所定の真空度に設定されたキャビティ空間部28内に加熱溶融化された樹脂材料を溶融樹脂31として注入することにより、キャビティ空間部28内で樹脂成形体9部分の電子部品(半導体チップ7)とワイヤ8とを樹脂封止成形する。
従って、金型1・2・3の型締め工程時において、離型フィルム4が上型金型面11に被覆されるので、真空引き機構にて所定の真空度に設定した圧力に左右されず該フィルム4がキャビティ空間部28内に移動せず、該フィルム4がワイヤ8を変形或いは断線することを効率良く防止すると共に、真空引き機構にて所定の真空度に設定した状態で、キャビティ空間部28内と連通し且つ基板6と非接触状態で設けた樹脂通路30を通して加熱溶融化された樹脂材料を注入するので、溶融樹脂31の流れが良くなりボイドの発生を効率良く防止する。
【0029】
次に、図示していないが、金型1・2・3の型締め工程時において、樹脂通路30とキャビティ空間部28内にある溶融樹脂31が硬化して硬化樹脂32を形成して、硬化樹脂32となった樹脂通路30部分を含む封止済基板33が成形される。
ここで、少なくともキャビティ空間部28内の溶融樹脂31が注入されて硬化樹脂32を成形すると真空引き機構より設定された所定の真空度を解除するように構成されている。
【0030】
次に、図示していないが、中間プレート3と下型2とを型締めした状態のままで、離型フィルム4を被覆された上型1を型開きをして、該フィルム4を被覆した上型金型面11(キャビティ空間部28天面)と傾斜部12Bと保持部材14B底面とから樹脂通路30部分を含む封止済基板33を離型する。
なお、樹脂通路30部分を含む封止済基板33を離型する場合に、該フィルム4を介して上型金型面11の下方向に突出するように構成されたエジェクタ機構(図示しない)を設けて更に離型力を向上させてもよい。
【0031】
次に、図4に示すように、中間プレート3と下型2とを型開きと同時に、下型2にある弾性部材24を復元する方向、つまりは、摺動部材23を上動して封止済基板33を弾性支受の状態から解除される。
このとき、封止済基板33と樹脂通路30部分とを切り離して(ディゲートして)、弾性支受の状態から解除された摺動部材23上に封止済基板33を載置するように構成されている。
なお、封止済基板33と樹脂通路30部分とを切り離す場合に、ディゲート機構(図示しない)を金型内に供給して切り離すようにしてもよい。
従って、封止済基板33を金型1・2・3から離型する場合、離型フィルム4を上型金型面11に被覆することができるので、従来の離型ピンのような基板6が反り返ってクラックが発生することを効率良く防止する。
【0032】
次に、図1に示すように、樹脂通路30部分を切り離した封止済基板33を下型2の摺動部材23の所定位置より、次工程へ搬送すると共に、上型1に被覆された使用済の離型フィルム4を該フィルム供給機構にて下動させて所定の張力にて張架して水平状態として上型1の金型面より離し、次に、使用済の該フィルム4を搬送して使用前の該フィルム4を該フィルム供給機構にて供給する。
従って、前述したように、電子部品(半導体チップ7)とワイヤ8とを装着した基板6を連続して、金型1・2・3にて樹脂成形体11を樹脂封止成形することができるので、樹脂成形上の諸問題を効率良く解決して製品の生産性を効率良く向上させる。
【0033】
即ち、前述したように、基板反りによる樹脂ばりとワイヤ変形等とを効率良く防止すると共に、樹脂成形上の諸問題を効率良く解決して製品の生産性を効率良く向上させる、電子部品の樹脂封止成形方法及び金型を提供することができる。
【0034】
なお、離型フィルム4の上型1側の被覆面(加熱溶融化した樹脂材料の非接触面)に粘着性を持たせるようにしてもよい。
【0035】
また、前記した基板6は、マトリクス状に配列した電子部品を搭載したもので説明したが、基板6上に単数個、或いは、単数列の半導体チップ7を搭載した基板6でもよい。
【0036】
また、摺動部材23の所定位置に基板6を供給セットする場合、基板6を水平に弾性支受するように説明しているが、摺動部材23に基板6を供給セットできる、基板セット用凹所或いは基板セット用位置決めピン(図示しない)を設けるように構成にしてもよい。
【0037】
また、上型外周ブロック18と下型外周ブロック25とにシール部材5を付設するような構成にしているが、金型1・2・3の型締め工程時に、少なくとも加熱溶融化された樹脂材料と接触する金型面を外気遮断状態にして外気遮断範囲を形成する構成であれば、シール部材5を適宜に付設するか、或いは、金型1・2・3全体を外気遮断範囲として形成する構成にしてもよい。
この場合、上型外周ブロック18と下型外周ブロック25とを設けない構成にしてもよい。
【0038】
また、金型1・2・3の型締め工程時に、加熱溶融化された樹脂材料の樹脂通路30は、基板6と非接触状態であればキャビティ空間部28の天面に設けてもよい。
【0039】
また、本発明は、上述の各実施形態に限定されるものではなく、本発明の趣旨を逸脱しない範囲内で、必要に応じて、任意にかつ適宜に変更・選択して採用できるものである。
【0040】
【発明の効果】
本発明によれば、基板反りによる樹脂ばりとワイヤ変形等とを効率良く防止すると共に、樹脂成形上の諸問題を効率良く解決して製品の生産性を効率良く向上させる、電子部品の樹脂封止成形方法及び金型を提供するという優れた効果を奏するものである。
【図面の簡単な説明】
【図1】図1は、本発明に係る樹脂封止成形用金型要部の概略拡大縦断面図であって、上型と下型と中間プレートとを型開きした状態を示す。
【図2】図2は、本発明に係る樹脂封止成形用金型要部の概略拡大縦断面図であって、下型と中間プレートとを型締めした状態を示す。
【図3】図3は、本発明に係る樹脂封止成形用金型要部の概略拡大縦断面図であって、上型と下型と中間プレートとを型締めして加熱溶融化された樹脂材料を注入した状態を示す。
【図4】図4は、本発明に係る樹脂封止成形用金型要部の概略拡大縦断面図であって、上型と中間プレートとを型開きして封止済基板を離型した状態を示す。
【図5】図5は、従来における樹脂封止成形用金型要部の概略拡大縦断面図である。
【符号の説明】
1 上型
2 下型
3 中間プレート
4 離型フィルム
5 シール部材
6 基板
7 半導体チップ
8 ワイヤ
9 樹脂成形体
10 基板外周部
11 上型金型面
12A・12B 傾斜部
13 上型凸部ブロック
14A・14B 保持部材
15A・15B・24 弾性部材
16 上型固定面
17 上型固定ブロック
18 上型外周ブロック
19 キャビティ
20A・20B 傾斜面
21 狭持面
22 基板当接面
23 摺動部材
25 下型固定面
26 下型固定ブロック
27 下型外周ブロック
28 樹脂通路面
29 キャビティ空間部
30 樹脂通路
31 溶融樹脂
32 硬化樹脂
33 封止済基板(製品)
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a resin sealing molding method for an electronic component and a mold improvement in which a substrate on which a semiconductor chip (electronic component) such as an IC is mounted is collectively resin molded by a resin molding die. Things.
[0002]
[Prior art]
2. Description of the Related Art Conventionally, a plurality of semiconductor chips mounted on a substrate are collectively subjected to resin encapsulation molding (batch single-side molding) using a resin encapsulation molding die for electronic components.
[0003]
For example, as shown in FIG. 5, a conventional resin sealing mold (two-piece mold) includes a fixed upper mold 101 and a movable lower mold 102.
A plurality of semiconductor chips 104 (electronic components) are mounted on a substrate 103 which is molded by resin molding with the molds 101 and 102, and the substrate 103 side and the chips 104 are connected by wires 105. It is configured to be electrically connected.
In addition, a resin passage 107 for injecting a resin material heated and melted by transfer molding is provided on the mold surface (upper mold surface 106) of the upper mold 101, and the chip 104 and the wire 105 are communicated with the resin passage 107. And a cavity 108 for encapsulating the whole with resin.
A setting recess 110 is provided on the mold surface (lower mold surface 109) of the lower mold 101 so that the substrate 103 on which the chip 104 and the wire 105 are mounted can be set at a predetermined position on the lower mold surface 109. In addition, when the substrate 103 is supplied and set in the setting recess 109, the supply is set with the chip 104 and the wire 105 mounted side facing upward.
Although not shown, a heating means such as a heater for heating and melting the resin material is buried in the molds 101 and 102, and the molds 101 and 102 are molded by a heater into a predetermined resin. The resin material is heated and melted by heating to a temperature to become a molten resin 111.
[0004]
That is, first, the substrate 103 is supplied and set to the recess 120 with the upper die 101 and the lower die 102 opened, with the mounting side of the chip 104 and the wire 105 of the substrate 103 facing upward.
Next, the upper mold 101 and the lower mold 102 are completely clamped, and the chips 104 and wires 105 (resin molded body) fitted in the cavities 108 of the upper mold surface 106 are heated and melted in advance. The molten resin 111 is injected through the resin passage 107, and then the molten resin 111 resin-sealed to the chip 104 and the wire 105 mounted on the substrate 103 is cured to form a cured resin and sealed. A fixed substrate (product) is formed.
[0005]
In addition, although the patent document etc. which describe the conventional example described above were investigated, they could not be found.
[0006]
[Problems to be solved by the invention]
However, in recent years, the size and thickness of the substrate have been reduced, and the following problems in resin molding have occurred, resulting in reduced product productivity.
[0007]
That is, as the size of the substrate becomes larger and thinner, the thickness of the substrate varies. For example, when the substrate is thin, a gap is generated between the upper mold surface and the substrate surface, and the resin infiltrates the upper surface of the substrate to form a resin flash, or the surface on which the semiconductor chip is not mounted (the bump forming surface / substrate). The resin may penetrate into the lower surface) to form a resin flash.
When the substrate is thick, cracks occur in the substrate due to the clamping pressure between the upper die surface and the substrate surface.
Therefore, a configuration in which a bottom surface member (float) of a sliding type corresponding to the thickness of the substrate is provided in the lower mold has been studied.
However, resin infiltrates between the lower mold and the bottom member, causing the bottom member (float) to slide poorly, requiring frequent repairs and maintenance of the mold, thereby lowering product productivity. are doing.
[0008]
In addition, the use of high-density resin is increasing due to the increase in size and thickness of the substrate, and the adhesion between the cavity surface and the resin molded body is increased. Cracks occur in the molded body, and the flow of the resin deteriorates, so that air or the like is caught in the resin and cracks occur in the resin molded body. Therefore, a configuration in which film forming in which a release film is suction-fixed to a cavity surface and resin sealing is performed and vacuum forming in which at least air or the like is forcibly discharged from the cavity and resin sealing molding is performed in combination is being studied. .
However, the above-mentioned release film moves into the cavity due to the pressure, and the release film deforms or breaks the wire, and the product yield is reduced.
[0009]
In addition, when a substrate is supplied and set at a predetermined position in a mold due to the increase in size and thickness of the substrate, the substrate is easily warped due to the thinness of the substrate. The wire is easily deformed or broken, and the product yield is reduced.
[0010]
Therefore, the present invention efficiently prevents resin burrs due to substrate warpage and wire deformation, and efficiently solves various problems in resin molding to efficiently improve product productivity. It is an object to provide a stop molding method and a mold.
[0011]
[Means for Solving the Problems]
In order to solve the above-mentioned technical problem, a resin sealing molding method for an electronic component according to the present invention includes a resin molding method provided between one mold and the other mold and both molds and formed in a penetrating state. Preparing a mold for resin-sealing molding of an electronic component including an intermediate plate having a cavity for mounting, and mounting the electronic component electrically connected to the substrate side by wires at a predetermined position of the other mold. A step of supplying and setting a substrate, a step of supplying a resin material to a predetermined position of the mold and heating and melting, a step of clamping the mold, and a step of clamping the mold, A step of forming a cavity space from the cavity and the mold surface of one of the molds, and a step of clamping the mold during the mold, with the substrate being elastically supported by the other mold. In the cavity space, Fitting and setting a part and a wire; and connecting the heat-fused resin material to the cavity space through a resin passage communicated with the cavity space and provided in a non-contact state with the substrate. A step of resin-molding the wire and the electronic component in the cavity space by injection.
Therefore, during the mold clamping step of the mold, the substrate can be supplied and set at a predetermined position of the other mold while being elastically supported by the sliding member. It can be prevented efficiently.
[0012]
Further, in order to solve the above-mentioned technical problem, a resin sealing molding method for an electronic component according to the present invention is provided between at least one of the molds and the other mold and both the molds, and is formed in a penetrated state. A resin sealing molding die for an electronic component including an intermediate plate having a molded resin molding cavity, a release film supplied between one of the dies and the intermediate plate, and the other of the other A step of preparing a substrate supplied between the mold and the intermediate plate and a substrate on which electronic components electrically connected by wires are mounted; and a substrate on which the electronic components are mounted at a predetermined position of the other mold. Supplying and setting, supplying a resin material to a predetermined position of the mold and heating and melting, and clamping the mold, and the mold clamping step of the mold, The mold surface of one of the molds A step of forming a cavity space from the cavity and the mold surface of one of the molds coated with the release film by coating a film, and during the mold clamping step of the mold, the other of the other A step of fitting and setting the electronic component and the wire in the cavity while the substrate is elastically supported by the mold; and, during the mold clamping step of the mold, the one mold and the intermediate plate. A step of forming a resin passage for injecting the heat-melted resin material in a non-contact state with the substrate in the cavity space described above, and at least a mold clamping step of the mold described above. A step of forming an outside air blocking area by bringing a mold surface in contact with the heat-melted resin material into an outside air blocking state, and forcibly sucking and discharging air in the outside air blocking area as described above. By setting the cavity space described above to a predetermined degree of vacuum, and by injecting the heat-melted resin material into the cavity space set to the predetermined degree of vacuum through the resin passage, A step of resin-molding the wire and the electronic component in the cavity space.
Therefore, during the mold clamping process, the release film is coated on one of the mold surfaces, so that the release film does not move into the cavity space without being affected by the set pressure at a predetermined degree of vacuum. The resin that efficiently prevents the film from deforming or breaking the wire, and is heated and melted through a resin passage that communicates with the cavity space and is provided in a non-contact state with the substrate in a state where a predetermined degree of vacuum is set. Since the material is injected, the flow of the molten resin is improved, and the generation of voids is efficiently prevented.
Further, when the sealed substrate is released from the mold, the release film can be coated on one mold surface, so that the substrate is efficiently prevented from being warped and cracked by the conventional ejector pins. .
Therefore, it is possible to efficiently solve various problems in resin molding and efficiently improve product productivity.
[0013]
In addition, in order to solve the above-mentioned technical problem, a resin-sealing molding die for an electronic component according to the present invention includes one die, the other die opposed to one die, and the above-mentioned two die. And a resin molding cavity provided in a state penetrating through the intermediate plate, and a substrate on which the electronic component provided in the other mold and electrically connected to the substrate side by wires is mounted. A sliding member for a substrate set elastically supporting the substrate in a state where the wires and the electronic components are fitted in the cavities, and one of the dies and the intermediate plate, which are formed by clamping. And a resin passage for resin injection.
Therefore, during the mold clamping step of the mold, the substrate can be supplied and set at a predetermined position of the other mold while being elastically supported by the sliding member. It can be prevented efficiently.
[0014]
Further, in order to solve the above-mentioned technical problem, a resin-sealing-molding mold for an electronic component according to the present invention includes one mold, another mold opposed to the one mold, and both molds described above. An intermediate plate provided therebetween, a cavity for resin molding provided in a state penetrating the intermediate plate, a release film covering the mold surface of one of the molds, and a mold release film provided on the other mold. A board-mounting sliding member for elastically supporting a board on which an electronic component electrically connected to the board side with a wire is mounted in a state where the wire and the electronic component are oriented in the cavity direction; A resin passage for resin injection formed by clamping the mold and the intermediate plate with the resin material provided on at least one mold surface with the other mold and the intermediate plate and in contact with the heat-melted resin material described above; Block the mold surface A seal member in a state to form the external air shutoff circumference, characterized in that it comprises a vacuum mechanism for forcibly sucking and discharging the air from the outside air cut off the above-mentioned range.
Therefore, during the mold clamping process, the release film is coated on one of the mold surfaces, so that the release film does not move into the cavity space without being affected by the set pressure at a predetermined degree of vacuum. The resin that efficiently prevents the film from deforming or breaking the wire, and is heated and melted through a resin passage that communicates with the cavity space and is provided in a non-contact state with the substrate in a state where a predetermined degree of vacuum is set. Since the material is injected, the flow of the molten resin is improved, and the generation of voids is efficiently prevented.
Further, when the sealed substrate is released from the mold, the release film can be coated on one mold surface, so that the substrate is efficiently prevented from being warped and cracked by the conventional ejector pins. .
Therefore, it is possible to efficiently solve various problems in resin molding and efficiently improve product productivity.
[0015]
BEST MODE FOR CARRYING OUT THE INVENTION
The details will be described below with reference to FIGS.
FIG. 1 to FIG. 4 are schematic enlarged longitudinal sectional views showing each step in the resin molding die according to the present invention step by step.
[0016]
That is, in the mold for resin sealing molding of an electronic component according to the present invention, for example, as shown in FIG. 1, an upper mold 1 (one mold) and a lower mold 2 (the other mold) opposed to the upper mold 1 are arranged. Mold) and an intermediate plate 3 provided between the molds 1 and 2, and a release film 4 covering the mold surface of the upper mold 1 with the upper mold 1 and the intermediate plate 3. A release film supply mechanism (not shown) for supplying between the molds, and a mold surface provided on the mold surfaces of the molds 1 and 2 and in contact with the resin material heated and melted, to shut off the outside air. A seal member 5 forming a range and a vacuuming mechanism (not shown) for forcibly sucking and discharging air from the outside air blocking range are provided.
[0017]
The substrate 6 on which electronic components (semiconductor chips 7 such as ICs) in this embodiment are mounted is, for example, a semiconductor which is die-bonded to a predetermined position on the substrate 6 and arranged in a matrix as shown in FIG. At least the chip 7 and the wires 8 for electrically connecting the substrate 6 and the chip 7 are provided, and the electronic component sides 7.8 are resin-sealed with a heat-melted resin material. A resin molded body 9 and a substrate outer peripheral portion 10 which is not resin-sealed are formed and configured.
As the other substrate 6 on which the electronic components are mounted, a flip-chip substrate including a semiconductor chip 7 electrically connected to predetermined portions of the substrate 6 via bumps may be used.
[0018]
Also, as shown in FIG. 1, for example, the upper mold 1 has an upper mold surface 11 and inclined portions 12A and 12B, which can cover the release film 4 with tension, and have a downwardly convex shape. , A film holding member 14A / 14B provided so as to surround the protrusion block 13, and an elastic member which reciprocates the holding members 14A / 14B slidably up and down. 15A and 15B, and an upper die fixing block 17 having an upper die fixing surface 16 into which the convex block 13, the holding members 14A and 14B, and the elastic members 15A and 15B can be removably fitted. An outer peripheral block 18 provided with the seal member 5 is provided around the outer periphery of the upper fixed block 17.
[0019]
The intermediate plate 3 is provided, for example, as shown in FIG. 1 so as to penetrate the intermediate plate 3 and fit the electronic component side 7.8 mounted on the substrate 6 with the cavity 19 and the upper mold 1. The film holding surface 21 and the inclined surface 20A formed through the release film 4 that can be joined to the upper mold fixing surface 16, the holding member 14A, and the inclined portion 12A, the substrate outer peripheral portion 10, the lower mold fixing surface 25, and the lower mold A substrate contact surface 22 that contacts the seal member 5 attached to the fixed block 27, an inclined surface 20 </ b> B into which a heat-melted resin material can be injected, and a resin passage surface 28 are formed.
[0020]
Further, the lower die 2 has a sliding member 23 for a substrate set which can elastically support the substrate 6 on which the electronic component (semiconductor chip 7) and the wire 8 are mounted in a predetermined position in the upward direction (toward the cavity 19). An elastic member 24 that reciprocates the sliding member 23 up and down slidably; and a lower die fixing block 26 having a lower die fixing surface 25 into which the sliding member 23 and the elastic member 24 can be detachably fitted. And a lower mold outer peripheral block 27 provided with a seal member 5 around the outer periphery of the lower mold fixed block.
[0021]
The upper elastic members 15A and 15B and the lower elastic member 24 are provided with, for example, a spring or the like.
Although not shown, a heating means such as a heater for heating and melting the resin material is embedded in the molds 1, 2, and 3, and the molds 1, 2, and 3 are heated by the heater. The resin material is heated and melted by heating to a predetermined resin molding temperature to form a molten resin 31.
Although not shown, the molds 1, 2, and 3 are configured to inject a resin into the resin molded body 11 of the two substrates 6, and only one substrate 6 is used. You may make it resin-mold.
[0022]
Therefore, when the resin molded body 11 of the substrate 6 is sealed with the molds 1, 2, and 3, the molds 1, 2, and 3 are first opened as shown in FIG. A release film 4 held horizontally while being stretched to a predetermined tension is supplied between the upper mold 1 and the intermediate plate 3, and the substrate 6 is placed on the resin molded body 11 side (the electronic component side 7). 8) With 8) turned upward, it is supplied between the intermediate plate 3 and the lower mold 2 and is supplied to a position immediately above a predetermined position of the sliding member 23.
At this time, the elastic members 15A and 15B and the elastic member 24 separately attached to the holding members 14A and 14B and the sliding member 23 are interlocked, and the elastic members 15A, 15B and 24 are in the extended state (restored state). State), at least the bottom surfaces of the holding members 15A and 15B are configured to protrude downward from the upper die fixing surface 16, and the top surface of the sliding member 23 is It is configured to protrude upward from the fixing surface 25.
[0023]
Next, the substrate 6 supplied to a position immediately above the predetermined position of the sliding member 23 is supplied and set to the sliding member 23, and then, as shown in FIG. That is, the substrate contact surface 22 comes into contact with the substrate outer peripheral portion 10 and the lower die fixing surface 25, and comes into contact with the seal member 5 attached to the lower die fixing block 27. At this time, the substrate 6 and the sliding member 23 move downward (slide downward) in accordance with the thickness of the substrate 6 and the elastic member 24 attached to the sliding member 23 is in a contracted state. Are elastically supported by the elastic member 23 with an elastic force so as not to damage the substrate 6 in a state of being elastically supported, and are brought into contact with no gap between the substrate fixing portion 10 and the substrate contact surface 22. It is configured to:
Therefore, the substrate 6 can be supplied and set at a predetermined position of the elastic member 23 of the lower mold 2 while being elastically supported by the sliding member 23, so that resin burrs due to warpage of the substrate and wire deformation can be efficiently prevented. can do.
[0024]
Note that, as shown in FIG. 2, the release film 4 is in a horizontal state and waits between the upper mold 1 and the intermediate plate 3, but at this time, the film 4 is moved by the film supply mechanism. The upper mold 1 is moved upward to cover and contact the upper mold surface 11, the inclined portions 12A and 12B, the bottom surfaces of the film holding members 14A and 14B, and the upper mold fixing surface 16 in advance in the upper mold 1. The film 4 of the fixing surface 16 may be configured to be tensioned to cover the film 4.
[0025]
Next, as shown in FIG. 3, the upper mold 1, the lower mold 2, and the intermediate plate 3 are completely clamped by clamping the upper mold 1 and the intermediate plate 3.
At this time, when the upper mold 1 and the intermediate plate 3 are clamped by the mold, the release film 4 is tensioned to the upper mold surface 11 which is formed in the upper mold block 13 and has a downward convex shape. It is constituted so that it may cover.
Also, the upper mold 1 and the intermediate plate 3 are clamped to form a cavity space 29 formed by the upper mold surface 11 that covers the release film 4 by tension and the cavity 19 of the intermediate plate 3. The resin passage 30 is formed by the inclined portion 12B and the holding member 14B, which is in communication with the cavity space 29 and covers the film 4, and is formed by the inclined surface 20B and the resin passage surface 28.
[0026]
Here, as shown in FIG. 3, when the upper mold surface 11 is covered with the release film 4 by tension, the film 4 comes into contact with the upper mold surface 11 and is covered to form the inclined portion 12A. 12B, the film 4 is in contact with and coated along the shape of the film 12B, so that the upper mold surface 11 is tensioned and covered without generating film wrinkles, and the inclined portion 12A The holding member 14A bottom / upper die fixing surface 16 and the holding surface 21A / inclined surface 20A of the intermediate plate 3 hold and hold the film 4. At this time, the holding member 14A moves upward and the elastic member 15A is moved. The film 4 is configured to be pinched and held by contracting.
Similarly to the holding member 14A of the upper mold 1, the holding member 14B is also configured to move upward while covering the film 4 and to contract the elastic member 15A, and the film 4 is held with the inclined portion 12B. If the resin passage 30 can be formed by covering the member 14A, the upper convex block 13 and the holding member 14B may be provided integrally without providing the elastic member 15B.
[0027]
Therefore, as shown in FIG. 3, during the mold clamping process of the dies 1, 2, and 3, the electronic component (semiconductor chip 7) and the wire 8 of the resin molded body 9 part fitted and set in the cavity space 28 are formed. In a non-contact state, the molten resin 31 is injected through a resin passage 30 using a resin material previously melted by heating as a molten resin 31.
At this time, at the time of the mold clamping process of the dies 1, 2, and 3, each sealing member 5 attached to the upper mold fixing block 18 and the lower mold fixing block 27 is attached to the holding surface 21 of the intermediate plate 3 and the substrate contact surface. 22 and a mold surface in contact with the molten resin 31 at least in a state of blocking the outside air to form an outside air blocking range, and forcibly suck and discharge air from the outside air blocking range by a vacuuming mechanism. At least the cavity space 28 is set to a predetermined degree of vacuum, and the molten resin 31 is injected through the resin passage 30.
[0028]
Next, although not shown, the electronic components (semiconductor chip 7) and the wires 8 of the resin molded body 9 fitted and set in the cavity space 28 during the mold clamping process of the dies 1, 2, and 3. In a non-contact state, a resin material that has been heated and melted is injected as molten resin 31 into the cavity space 28 set to a predetermined degree of vacuum through the resin passage 30, thereby forming a resin molded body in the cavity space 28. Nine parts of the electronic component (semiconductor chip 7) and the wire 8 are molded with resin.
Therefore, during the mold clamping process of the molds 1, 2, and 3, the release film 4 is coated on the upper mold surface 11, so that it is not affected by the pressure set to a predetermined degree of vacuum by the vacuuming mechanism. While the film 4 does not move into the cavity space 28, the film 4 is efficiently prevented from deforming or breaking the wire 8, and the cavity 4 is set to a predetermined degree of vacuum by the vacuuming mechanism. Since the resin material that has been heated and melted is injected through the resin passage 30 that communicates with the inside of the portion 28 and is provided in a non-contact state with the substrate 6, the flow of the molten resin 31 is improved and the generation of voids is efficiently prevented.
[0029]
Next, although not shown, at the time of the mold clamping process of the dies 1, 2, and 3, the molten resin 31 in the resin passage 30 and the cavity space 28 is cured to form a cured resin 32, and the cured resin 32 is cured. A sealed substrate 33 including the resin passage 30 portion that has become the resin 32 is formed.
Here, at least when the molten resin 31 in the cavity space 28 is injected and the cured resin 32 is molded, the predetermined degree of vacuum set by the vacuuming mechanism is released.
[0030]
Next, although not shown, the upper mold 1 covered with the release film 4 was opened while the intermediate plate 3 and the lower mold 2 were clamped, and the film 4 was covered. The sealed substrate 33 including the resin passage 30 is released from the upper mold surface 11 (the top surface of the cavity space 28), the inclined portion 12B, and the bottom surface of the holding member 14B.
When the sealed substrate 33 including the resin passage 30 is released from the mold, an ejector mechanism (not shown) configured to project downward from the upper mold surface 11 via the film 4. It may be provided to further improve the release force.
[0031]
Next, as shown in FIG. 4, simultaneously with opening the intermediate plate 3 and the lower mold 2, the direction of restoring the elastic member 24 in the lower mold 2, that is, the sliding member 23 is moved upward and sealed. The stopped substrate 33 is released from the state of elastic support.
At this time, the sealed substrate 33 and the resin passage 30 are separated (degated), and the sealed substrate 33 is placed on the sliding member 23 released from the elastic support state. Have been.
When the sealed substrate 33 and the resin passage 30 are separated from each other, a degate mechanism (not shown) may be supplied into the mold and separated.
Therefore, when the sealed substrate 33 is released from the molds 1, 2, and 3, the release film 4 can be coated on the upper mold surface 11, so that the substrate 6 like a conventional release pin can be used. However, it is possible to efficiently prevent the occurrence of cracks due to warpage.
[0032]
Next, as shown in FIG. 1, the sealed substrate 33 from which the resin passage 30 was cut was transported from a predetermined position of the sliding member 23 of the lower mold 2 to the next step, and was covered with the upper mold 1. The used release film 4 is moved downward by the film supply mechanism, stretched with a predetermined tension to be in a horizontal state, separated from the mold surface of the upper mold 1, and then the used film 4 is removed. The film 4 before being transported and used is supplied by the film supply mechanism.
Therefore, as described above, the resin molded body 11 can be resin-sealed and molded with the dies 1, 2, and 3 on the substrate 6 on which the electronic components (semiconductor chips 7) and the wires 8 are mounted. Therefore, it is possible to efficiently solve various problems in resin molding and efficiently improve product productivity.
[0033]
That is, as described above, a resin for electronic components that efficiently prevents resin burrs due to substrate warpage and wire deformation and efficiently solves various problems in resin molding and efficiently improves product productivity. A sealing molding method and a mold can be provided.
[0034]
In addition, the coating surface of the upper mold 1 side of the release film 4 (the non-contact surface of the heat-melted resin material) may have adhesiveness.
[0035]
Although the above-described substrate 6 has been described as mounting electronic components arranged in a matrix, it may be a substrate 6 having a single or a single row of semiconductor chips 7 mounted on the substrate 6.
[0036]
Further, when the substrate 6 is supplied and set at a predetermined position of the sliding member 23, the substrate 6 is described as being elastically supported horizontally. However, the substrate 6 can be supplied and set to the sliding member 23. It may be configured to provide a recess or a positioning pin (not shown) for substrate setting.
[0037]
In addition, the seal member 5 is attached to the upper die outer peripheral block 18 and the lower die outer block 25. At the time of the die clamping process of the dies 1, 2, and 3, at least the resin material that has been heated and melted. If the configuration is such that the outside air blocking range is formed by setting the mold surface in contact with the outside air into the outside air blocking state, the seal member 5 is appropriately provided, or the entire mold 1, 2, or 3 is formed as the outside air blocking range. It may be configured.
In this case, the upper mold outer peripheral block 18 and the lower mold outer peripheral block 25 may not be provided.
[0038]
In the mold clamping process of the dies 1, 2, and 3, the resin passage 30 of the resin material heated and melted may be provided on the top surface of the cavity space 28 if it is not in contact with the substrate 6.
[0039]
Further, the present invention is not limited to the above-described embodiments, and can be arbitrarily and appropriately changed / selected as needed and adopted without departing from the spirit of the present invention. .
[0040]
【The invention's effect】
ADVANTAGE OF THE INVENTION According to this invention, while efficiently preventing resin burrs and wire deformation due to substrate warpage, efficiently solving various problems in resin molding, and efficiently improving the productivity of products, the resin sealing of electronic components is improved. This provides an excellent effect of providing a stop molding method and a mold.
[Brief description of the drawings]
FIG. 1 is a schematic enlarged longitudinal sectional view of a main part of a mold for resin sealing molding according to the present invention, and shows a state in which an upper mold, a lower mold, and an intermediate plate are opened.
FIG. 2 is a schematic enlarged longitudinal sectional view of a main part of a mold for resin sealing molding according to the present invention, showing a state in which a lower mold and an intermediate plate are clamped.
FIG. 3 is a schematic enlarged longitudinal sectional view of a main part of a resin sealing molding die according to the present invention, in which an upper die, a lower die, and an intermediate plate are clamped and heated and melted. This shows a state where a resin material is injected.
FIG. 4 is a schematic enlarged longitudinal sectional view of a main part of a resin sealing molding die according to the present invention, in which an upper die and an intermediate plate are opened to release a sealed substrate. Indicates the status.
FIG. 5 is a schematic enlarged longitudinal sectional view of a main part of a conventional resin molding die.
[Explanation of symbols]
1 Upper type
2 lower mold
3 Intermediate plate
4 Release film
5 Seal members
6 substrate
7 Semiconductor chip
8 wires
9 Resin molding
10 Peripheral part of substrate
11 Upper mold surface
12A ポ 12B Inclined part
13 Upper die block
14A ポ 14B Holding member
15A / 15B / 24 Elastic member
16 Upper die fixing surface
17 Upper fixed block
18 Upper die outer peripheral block
19 cavities
20A ポ 20B Inclined surface
21 Holding surface
22 Board contact surface
23 Sliding member
25 Lower die fixing surface
26 Lower fixed block
27 Lower die outer peripheral block
28 Resin passage surface
29 Cavity space
30 resin passage
31 molten resin
32 Cured resin
33 Sealed Substrate (Product)

Claims (4)

一方の型と他方の型と前記両型の間に設けられ且つ貫通した状態で形成された樹脂成形用キャビティを備えた中間プレートとを含む電子部品の樹脂封止成形用金型を用意する工程と、
前記した他方の型の所定位置に基板側とワイヤで電気的に接続した電子部品を装着した基板を供給セットする工程と、
前記した金型の所定位置に樹脂材料を供給して加熱溶融化する工程と、
前記した金型を型締めする工程と、
前記した金型の型締工程時に、前記したキャビティと前記した一方の型の型面とからキャビティ空間部を形成する工程と、
前記した金型の型締工程時に、前記した他方の型にて前記した基板を弾性支受した状態で前記キャビティ空間部内に前記した電子部品とワイヤとを嵌装セットする工程と、
前記したキャビティ空間部に連通され且つ前記基板とは非接触状態で設けられた樹脂通路を通して前記した加熱溶融化された樹脂材料を前記キャビティ空間部内に注入することにより、前記したキャビティ空間部内で前記したワイヤと電子部品とを樹脂封止成形する工程とを含むことを特徴とする電子部品の樹脂封止成形方法。
A step of preparing a mold for resin sealing molding of an electronic component including one mold, the other mold, and an intermediate plate having a resin molding cavity formed in a state penetrated between the two molds; When,
A step of supplying and setting a board mounted with electronic components electrically connected to the board side and wires at predetermined positions of the other mold,
A step of supplying a resin material to a predetermined position of the mold and heating and melting the resin material,
A step of clamping the mold,
A step of forming a cavity space from the cavity and the mold surface of the one mold during the mold clamping step of the mold,
At the time of the mold clamping step of the mold, a step of fitting and setting the electronic component and the wire in the cavity space while elastically supporting the substrate with the other mold,
By injecting the heat-melted resin material into the cavity space through a resin passage that is communicated with the cavity space and is provided in a non-contact state with the substrate, the cavity space portion is filled with the resin material. A resin sealing molding of the formed wire and the electronic component.
少なくとも、一方の型と他方の型と前記両型の間に設けられ且つ貫通した状態で形成された樹脂成形用キャビティを備えた中間プレートとを含む電子部品の樹脂封止成形用金型と、前記した一方の型と中間プレートとの間に供給される離型フィルムと、前記した他方の型と中間プレートとの間に供給される基板側とワイヤで電気的に接続した電子部品を装着した基板とを用意する工程と、
前記した他方の型の所定位置に電子部品を装着した基板を供給セットする工程と、
前記した金型の所定位置に樹脂材料を供給して加熱溶融化する工程と、
前記した金型を型締めする工程と、
前記した金型の型締工程時に、前記した一方の型の型面に前記した離型フィルムを被覆することにより、前記したキャビティと前記した離型フィルムを被覆した一方の型の型面とからキャビティ空間部を形成する工程と、
前記した金型の型締工程時に、前記した他方の型にて前記した基板を弾性支受した状態で前記キャビティ内に前記した電子部品とワイヤとを嵌装セットする工程と、
前記した金型の型締工程時に、前記した一方の型と中間プレートとの間に前記したキャビティ空間部内と連通され且つ前記基板とは非接触状態で設けられた前記した加熱溶融化された樹脂材料を注入する樹脂通路を形成する工程と、
前記した金型の型締工程時に、少なくとも前記した加熱溶融化された樹脂材料と接触する金型面を外気遮断状態にして外気遮断範囲を形成する工程と、
前記した外気遮断範囲内の空気を強制的に吸引排出して少なくとも前記したキャビティ空間部を所定の真空度に設定する工程と、
前記した樹脂通路を通して前記した所定の真空度に設定されたキャビティ空間部内に前記した加熱溶融化された樹脂材料を注入することにより、前記したキャビティ空間部内で前記したワイヤと電子部品とを樹脂封止成形する工程とを含むことを特徴とする電子部品の樹脂封止成形方法。
At least, one mold and the other mold and a resin sealing molding die of an electronic component including an intermediate plate provided with a resin molding cavity formed in a penetrating state provided between the two dies, A release film supplied between one of the molds and the intermediate plate, and an electronic component electrically connected to a substrate side supplied between the other mold and the intermediate plate by a wire were mounted. A step of preparing a substrate and
A step of supplying and setting a substrate on which the electronic component is mounted at a predetermined position of the other mold,
A step of supplying a resin material to a predetermined position of the mold and heating and melting the resin material,
A step of clamping the mold,
During the mold clamping process of the mold, by covering the mold surface of the one mold with the release film, the cavity and the mold surface of the one mold coated with the mold film are removed. Forming a cavity space,
At the time of the mold clamping step of the mold, a step of fitting and setting the electronic component and the wire in the cavity in a state where the substrate is elastically supported by the other mold,
During the mold clamping step, the heat-fused resin communicated with the inside of the cavity space between the one mold and the intermediate plate and provided in a non-contact state with the substrate. Forming a resin passage for injecting the material;
During the mold clamping step of the mold, a step of forming an outside air cutoff area by setting the mold surface in contact with at least the heat-melted resin material to the outside air cutoff state,
A step of forcibly sucking and discharging air in the outside air cutoff range and setting at least the cavity space to a predetermined degree of vacuum,
By injecting the heat-melted resin material into the cavity space set to the predetermined degree of vacuum through the resin passage, the wire and the electronic component are sealed in the cavity space by resin. And a step of resin-molding the electronic component.
一方の型と、一方の型に対向配置した他方の型と、前記した両型間に設けた中間プレートと、前記した中間プレートに貫通した状態で設けた樹脂成形用キャビティと、前記した他方の型に設けられ且つ基板側とワイヤで電気的に接続した電子部品を装着した基板における前記したワイヤと電子部品とを前記したキャビティ内に嵌装した状態で前記した基板を弾性支受する基板セット用摺動部材と、前記した一方の型と中間プレートとを型締めして形成される樹脂注入用樹脂通路とを含むことを特徴とする電子部品の樹脂封止成形用金型。One mold, the other mold opposed to one mold, the intermediate plate provided between the two molds, the resin molding cavity provided in a state penetrating the intermediate plate, and the other mold A board set that elastically supports the above-mentioned substrate in a state where the above-mentioned wire and the electronic component are fitted in the above-mentioned cavity in a substrate having an electronic component mounted on the mold and electrically connected to the substrate side by a wire. A resin-molding mold for electronic parts, comprising: a sliding member for use; and a resin passage for resin injection formed by clamping one of the molds and the intermediate plate. 一方の型と、該一方の型に対向配置した他方の型と、前記した両型間に設けた中間プレートと、前記した中間プレートに貫通した状態で設けた樹脂成形用のキャビティと、前記した一方の型の型面を被覆する離型フィルムと、前記した他方の型に設けた基板側とワイヤで電気的に接続した電子部品を装着した基板を前記したワイヤと電子部品とを前記したキャビティ方向に向けた状態で弾性支受する基板セット用摺動部材と、前記した一方の型と中間プレートとを型締めして形成される樹脂注入用の樹脂通路と、前記した他方の型と中間プレートと少なくとも一方の型面に設けられ且つ前記した加熱溶融化された樹脂材料と接触する金型面を外気遮断状態にして外気遮断範囲を形成するシール部材と、前記した外気遮断範囲から空気を強制的に吸引排出する真空引き機構とを含むことを特徴とする電子部品の樹脂封止成形用金型。One mold, the other mold facing the one mold, an intermediate plate provided between the two molds, and a resin molding cavity provided in a state penetrating the intermediate plate, A mold release film covering the mold surface of one mold, and a substrate on which an electronic component electrically connected by wires to the substrate side provided on the other mold is mounted. A substrate setting sliding member elastically supported in a state facing the direction, a resin passage for resin injection formed by clamping one of the molds and the intermediate plate, and an intermediate between the other mold and the other mold. A seal member provided on at least one of the mold surfaces and in contact with the heated and melted resin material to form an outside air blocking area with the outside air blocking state, and air from the outside air blocking area. Forced Resin sealing mold of the electronic component which comprises a vacuum unit for suction and discharge.
JP2002317177A 2002-10-31 2002-10-31 Resin sealing molding method for electronic parts and mold Expired - Lifetime JP4358501B2 (en)

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006516366A (en) * 2003-01-08 2006-06-29 フィーコ ビー.ブイ. Device and method for encapsulating an electronic component fixed on a carrier with an encapsulating material
JP2008252060A (en) * 2007-03-05 2008-10-16 Nok Corp Process for producing sealing structure
US7622067B2 (en) 2005-05-30 2009-11-24 Spansion Llc Apparatus and method for manufacturing a semiconductor device
US7753667B2 (en) * 2004-11-12 2010-07-13 Panasonic Corporation Resin-sealed mold and resin-sealed device
US8105063B1 (en) * 2010-08-26 2012-01-31 National Semiconductor Corporation Three piece mold cavity design for packaging integrated circuits
JP2013525145A (en) * 2011-03-23 2013-06-20 新韓鑽石工業股▲ふん▼有限公司 Sealing material molding method
KR101448490B1 (en) 2008-06-26 2014-10-10 세메스 주식회사 Electronic component molding device
CN107097380A (en) * 2017-06-26 2017-08-29 四川新为橡塑有限公司 A kind of mould of reducing glue core and the method that reducing glue core is produced using the mould
JP2018086739A (en) * 2016-11-28 2018-06-07 Towa株式会社 Mold, resin molding apparatus and resin molding method
JP7530769B2 (en) 2020-08-25 2024-08-08 Towa株式会社 Resin molding device and method for manufacturing resin molded product

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006516366A (en) * 2003-01-08 2006-06-29 フィーコ ビー.ブイ. Device and method for encapsulating an electronic component fixed on a carrier with an encapsulating material
US7753667B2 (en) * 2004-11-12 2010-07-13 Panasonic Corporation Resin-sealed mold and resin-sealed device
US7622067B2 (en) 2005-05-30 2009-11-24 Spansion Llc Apparatus and method for manufacturing a semiconductor device
JP2008252060A (en) * 2007-03-05 2008-10-16 Nok Corp Process for producing sealing structure
KR101448490B1 (en) 2008-06-26 2014-10-10 세메스 주식회사 Electronic component molding device
US8105063B1 (en) * 2010-08-26 2012-01-31 National Semiconductor Corporation Three piece mold cavity design for packaging integrated circuits
JP2013525145A (en) * 2011-03-23 2013-06-20 新韓鑽石工業股▲ふん▼有限公司 Sealing material molding method
JP2018086739A (en) * 2016-11-28 2018-06-07 Towa株式会社 Mold, resin molding apparatus and resin molding method
CN107097380A (en) * 2017-06-26 2017-08-29 四川新为橡塑有限公司 A kind of mould of reducing glue core and the method that reducing glue core is produced using the mould
JP7530769B2 (en) 2020-08-25 2024-08-08 Towa株式会社 Resin molding device and method for manufacturing resin molded product

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