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JP2002203427A - Circuit connecting material, method for manufacturing circuit board using it, and circuit board - Google Patents

Circuit connecting material, method for manufacturing circuit board using it, and circuit board

Info

Publication number
JP2002203427A
JP2002203427A JP2000399825A JP2000399825A JP2002203427A JP 2002203427 A JP2002203427 A JP 2002203427A JP 2000399825 A JP2000399825 A JP 2000399825A JP 2000399825 A JP2000399825 A JP 2000399825A JP 2002203427 A JP2002203427 A JP 2002203427A
Authority
JP
Japan
Prior art keywords
circuit
connection
circuit board
weight
connection terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000399825A
Other languages
Japanese (ja)
Other versions
JP4590732B2 (en
Inventor
Masahiro Arifuku
征宏 有福
Itsuo Watanabe
伊津夫 渡辺
Koji Kobayashi
宏治 小林
Mitsugi Fujinawa
貢 藤縄
Takashi Nakazawa
孝 中澤
Kazuyoshi Kojima
和良 小島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP2000399825A priority Critical patent/JP4590732B2/en
Publication of JP2002203427A publication Critical patent/JP2002203427A/en
Application granted granted Critical
Publication of JP4590732B2 publication Critical patent/JP4590732B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Landscapes

  • Combinations Of Printed Boards (AREA)
  • Wire Bonding (AREA)
  • Conductive Materials (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an electric/electronic circuit connecting material more superior in low temperature quick curing property to the current epoxy resin base material and providing good bonding strength to a circuit member, and provide a method for manufacturing of a circuit board using this circuit connecting material, and the circuit board. SOLUTION: This circuit connecting material contains (1) silicone modified polyimide resin, (2) a radical polymerizable substance, (3) a curing agent generating a free radical by heating, as an essential ingredient, contains conductive particles, contains (1) 2-75 pts.wt. silicone modified polyimide resin, (2) 30-60 pts.wt. radical polymerizable substance, (3) 0.1-30 pts.wt. curing agent generating free radical by heating, and (4) 0-40 pts.wt. film forming material, and contains 0.1-30 vol.% conductive particles such as Au, Ag, or carbon to an adhesive component. In the method for manufacturing the circuit board, the circuit connecting material is interposed between a first connecting terminal and a second connecting terminal facing each other, and the first connecting terminal and the second connecting terminal are electrically connected by heating and pressing.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は接着剤組成物と導電
性粒子を用いた回路接続材料およびそれを用いた回路板
の製造方法、回路板に関する。
The present invention relates to a circuit connecting material using an adhesive composition and conductive particles, a method of manufacturing a circuit board using the same, and a circuit board.

【0002】[0002]

【従来の技術】エポキシ樹脂系接着剤は、高い接着強さ
が得られ、耐水性や耐熱性に優れること等から、電気・
電子、建築、自動車、航空機等の各種用途に多用されて
いる。中でも一液型エポキシ樹脂系接着剤は、主剤と硬
化剤との混合が不必要であり使用が簡便なことから、フ
ィルム状、ペースト状、粉体状の形態で使用されてい
る。この場合、エポキシ樹脂と硬化剤及び変性剤との多
様な組み合わせにより、特定の性能を得ることが一般的
である。(例えば、特開昭62−141083号公
報)。
2. Description of the Related Art Epoxy resin adhesives have high adhesive strength and are excellent in water resistance and heat resistance.
It is frequently used in various applications such as electronics, architecture, automobiles, and aircraft. Among them, one-pack type epoxy resin-based adhesives are used in the form of a film, paste, or powder because they do not require mixing of a main agent and a curing agent and are easy to use. In this case, a specific performance is generally obtained by various combinations of the epoxy resin and the curing agent and the modifying agent. (For example, JP-A-62-141083).

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上記特
開昭62−141083号公報に示されるフィルム状接
着剤は、作業性に優れるものの、20秒程度の接続時間
で140〜180℃程度の加熱、10秒では180〜2
10℃程度の加熱が必要であった。この理由は、短時間
硬化性(速硬化性)と貯蔵安定性(保存性)の両立によ
り良好な安定性を得ることを目的として、常温で不活性
な触媒型硬化剤を用いているために、硬化に際して十分
な反応が得られないためである。近年、精密電子機器の
分野では、回路の高密度化が進んでおり、接続端子幅、
接続端子間隔が極めて狭くなっている。このため、従来
のエポキシ樹脂系を用いた回路接続材料の接続条件で
は、配線の脱落、剥離や位置ずれが生じるなどの問題が
あった。また、生産効率向上のために10秒以下で接続
できる接続時間の短縮化が求められてきている。これら
の要求を満たすためには、低温でしかも短時間で硬化す
ることの出来る低温速硬化性の回路接続材料が必要不可
欠となっている。(例えば、特開平11−97825号
公報)。しかしながら、上記回路接続部材は接続する回
路を構成する材料の種類により接着強度が異なるという
問題があった。特に、回路端子を支持する基板がポリイ
ミド樹脂等の有機絶縁物質やガラスの場合、または回路
部材表面が窒化シリコン、シリコーン樹脂、ポリイミド
樹脂でコーティング、もしくはこれらの樹脂が回路部材
表面に付着していた場合、著しく接着強度が低下する問
題があった。本発明の目的は、従来のエポキシ樹脂系よ
りも低温速硬化性に優れ、かつ、回路端子を支持する基
板が有機絶縁物質、ガラスから選ばれる少なくとも一種
からなる回路部材及び表面が窒化シリコン、シリコーン
樹脂、ポリイミド樹脂から選ばれる少なくとも一種でコ
ーティングもしくは付着した回路部材に対して特に良好
な接着強度が得られる、電気・電子用の回路接続材料及
びそれを用いた回路板の製造方法、回路板を提供するこ
とにある。
However, although the film adhesive disclosed in the above-mentioned Japanese Patent Application Laid-Open No. Sho 62-141083 is excellent in workability, it can be heated at about 140 to 180 ° C. with a connection time of about 20 seconds. 180-2 for 10 seconds
Heating of about 10 ° C. was required. The reason for this is that a catalyst-type curing agent that is inactive at room temperature is used for the purpose of obtaining good stability by achieving both short-time curing (rapid curing) and storage stability (preservability). This is because a sufficient reaction cannot be obtained during curing. In recent years, in the field of precision electronic devices, the density of circuits has been increasing, and the width of connection terminals,
The connection terminal interval is extremely narrow. For this reason, under the conventional connection condition of the circuit connection material using the epoxy resin system, there has been a problem that the wiring is dropped, peeled off or displaced. Further, there is a demand for a reduction in connection time in which connection can be made in 10 seconds or less in order to improve production efficiency. In order to satisfy these requirements, a low-temperature and fast-curing circuit connection material that can be cured at a low temperature in a short time is indispensable. (For example, JP-A-11-97825). However, the circuit connecting member has a problem in that the adhesive strength varies depending on the type of material constituting the circuit to be connected. In particular, when the substrate supporting the circuit terminals is made of an organic insulating material such as polyimide resin or glass, or the circuit member surface is coated with silicon nitride, silicone resin, or polyimide resin, or these resins adhere to the circuit member surface. In this case, there was a problem that the adhesive strength was significantly reduced. It is an object of the present invention to provide a circuit member comprising at least one selected from the group consisting of an organic insulating material and glass, and a silicon nitride or silicone substrate, wherein the substrate supporting the circuit terminals is made of at least one selected from the group consisting of: Resin, a particularly good adhesive strength is obtained for a circuit member coated or adhered with at least one selected from polyimide resins, a circuit connecting material for electric and electronic, a method of manufacturing a circuit board using the same, and a circuit board. To provide.

【0004】[0004]

【課題を解決するための手段】本発明は、〔1〕 相対
向する接続端子間に介在され、相対向する接続端子を加
圧し加圧方向の接続端子間を電気的に接続する接続材料
であって、(1)シリコン変成ポリイミド樹脂、(2)
ラジカル重合性物質、(3)加熱により遊離ラジカルを
発生する硬化剤を必須成分とし、(1)シリコン変成ポ
リイミド樹脂2〜75重量部、(2)ラジカル重合性物
質 30〜60重量部、(3)加熱により遊離ラジカル
を発生する硬化剤 0.1〜30重量部、(4)フィル
ム形成材 0〜40重量部を含む回路接続材料である。 〔2〕 (1)、(2)、(3)、(4)の成分とさら
に(5)導電性粒子を必須成分とする上記〔1〕に記載
の回路接続材料である。 〔3〕 (3)加熱により遊離ラジカルを発生する硬化
剤が、室温(25℃)常圧下で24時間の開放放置後に
20重量%以上の重量保持率を有する硬化剤である上記
〔1〕または上記〔2〕に記載の回路接続材料である。 〔4〕 (4)フィルム形成材が、ポリウレタン樹脂で
ある上記〔1〕ないし上記〔3〕のいずれかに記載の回
路接続材料である。 〔5〕 (2)ラジカル重合性物質が、ウレタンアクリ
レートである上記〔1〕ないし上記〔4〕のいずれかに
記載の回路接続材料である。 〔6〕 さらに25℃での弾性率が0.1〜100MP
aであるシリコーン微粒子を、上記(1)、(2)、
(4)成分の合計100重量部に対し5〜200重量部
含有する上記〔1〕ないし上記〔5〕のいずれかに記載
の回路接続材料である。 また、本発明は、〔7〕 第一の接続端子を有する第一
の回路部材と、第二の接続端子を有する第二の回路部材
とを、第一の接続端子と第二の接続端子を対向して配置
し、対向配置した第一の接続端子と第二の接続端子の間
に前記〔1〕ないし前記〔6〕のいずれかに記載の回路
接続材料を介在させ、加熱加圧して前記対向配置した第
一の接続端子と第二の接続端子を電気的に接続させる回
路板の製造方法である。 〔8〕 少なくとも一方の接続端子の表面が金、銀、白
金族の金属から選ばれる少なくとも一種で構成される上
記〔7〕に記載の回路板の製造方法である。
According to the present invention, there is provided [1] a connection material which is interposed between opposed connection terminals and presses the opposed connection terminals to electrically connect the connection terminals in the pressing direction. (1) Silicon modified polyimide resin, (2)
A radical polymerizable substance, (3) a curing agent that generates free radicals by heating as an essential component, (1) 2 to 75 parts by weight of a silicone-modified polyimide resin, (2) 30 to 60 parts by weight of a radical polymerizable substance, (3) A) a circuit connecting material containing 0.1 to 30 parts by weight of a curing agent that generates free radicals upon heating, and (4) a film forming material of 0 to 40 parts by weight. [2] The circuit connection material according to [1], wherein the circuit connection material includes the components (1), (2), (3), and (4) and further (5) conductive particles as essential components. [3] (3) The curing agent according to the above [1] or [1], wherein the curing agent that generates free radicals by heating has a weight retention of 20% by weight or more after being left open for 24 hours at room temperature (25 ° C.) and normal pressure. The circuit connection material according to the above [2]. [4] (4) The circuit connecting material according to any one of [1] to [3], wherein the film forming material is a polyurethane resin. [5] (2) The circuit connecting material according to any one of [1] to [4], wherein the radical polymerizable substance is urethane acrylate. [6] Further, the elastic modulus at 25 ° C. is 0.1 to 100 MPa.
a) the silicone fine particles described in (1), (2),
(4) The circuit connecting material according to any one of the above [1] to [5], which contains 5 to 200 parts by weight based on 100 parts by weight of the total of the components. Further, the present invention provides [7] a first circuit member having a first connection terminal, and a second circuit member having a second connection terminal, the first connection member and the second connection terminal. The circuit connection material according to any one of the above [1] to [6] is interposed between the first connection terminal and the second connection terminal which are arranged to face each other, and are heated and pressurized. This is a method of manufacturing a circuit board for electrically connecting a first connection terminal and a second connection terminal that are arranged to face each other. [8] The method for manufacturing a circuit board according to [7], wherein the surface of at least one of the connection terminals is made of at least one selected from gold, silver, and platinum group metals.

〔9〕 少なくとも一方の接続端子を支持する基板が有
機絶縁物質、ガラスから選ばれる少なくとも一種で構成
される上記〔7〕または上記〔8〕に記載の回路板の製
造方法である。 〔10〕 少なくとも一方の回路部材表面が窒化シリコ
ン、シリコーン化合物、ポリイミド樹脂から選ばれる少
なくとも一種でコーティングもしくは付着している上記
〔7〕ないし上記
[9] The method for manufacturing a circuit board according to the above [7] or [8], wherein the substrate supporting at least one connection terminal is made of at least one selected from an organic insulating material and glass. [10] The above [7] or the above, wherein at least one circuit member surface is coated or adhered with at least one selected from silicon nitride, a silicone compound, and a polyimide resin.

〔9〕のいずれかに記載の回路板の製
造方法である。 また、本発明は、〔11〕 上記〔7〕ないし上記〔1
0〕のいずれかに記載の回路板の製造方法で得られる回
路板である。
[9] The method for manufacturing a circuit board according to any one of [9]. In addition, the present invention relates to [11] above [7] to [1]
0] The circuit board obtained by the method for manufacturing a circuit board according to any one of the above.

【0005】[0005]

【発明の実施の形態】本発明に用いる(3)加熱により
遊離ラジカルを発生する硬化剤としては、過酸化化合
物、アゾ系化合物などの加熱により分解して遊離ラジカ
ルを発生するものであり、目的とする接続温度、接続時
間、ポットライフ等により適宜選定されるが、高反応性
とポットライフの点から、半減期10時間の温度が40
℃以上、かつ、半減期1分の温度が180℃以下の有機
過酸化物が好ましく、半減期10時間の温度が60℃以
上かつ、半減期1分の温度が170℃以下の有機過酸化
物がさらに好ましい。接続時間を10秒以下とした場
合、硬化剤の配合量は十分な反応率を得るためには、
0.1〜30重量部とするのが好ましく1〜20重量部
がより好ましい。硬化剤の配合量が0.1重量部未満で
は、十分な反応率を得ることができず良好な接着強度や
小さな接続抵抗が得られにくくなる傾向にある。配合量
が30重量部を超えると、回路接続材料の流動性が低下
したり、接続抵抗が上昇したり、回路接続材料のポット
ライフが短くなる傾向にある。
BEST MODE FOR CARRYING OUT THE INVENTION The curing agent (3) used in the present invention, which generates free radicals by heating, is a compound which decomposes by heating a peroxide compound or an azo compound to generate free radicals. Is appropriately selected depending on the connection temperature, connection time, pot life, and the like.
Organic peroxide having a temperature of not less than 180 ° C. and a half-life of 1 minute of 180 ° C. or less is preferable, and an organic peroxide having a temperature of a half-life of 10 hours of not less than 60 ° C. and a half-life of 1 minute of 170 ° C. or less. Is more preferred. When the connection time is set to 10 seconds or less, the amount of the curing agent is not sufficient to obtain a sufficient reaction rate.
It is preferably 0.1 to 30 parts by weight, more preferably 1 to 20 parts by weight. If the amount of the curing agent is less than 0.1 part by weight, a sufficient reaction rate cannot be obtained, and good adhesive strength and small connection resistance tend to be hardly obtained. If the amount exceeds 30 parts by weight, the fluidity of the circuit connecting material tends to decrease, the connection resistance increases, and the pot life of the circuit connecting material tends to be short.

【0006】有機過酸化物としては、ジアシルパーオキ
サイド類、パーオキシジカーボネート類、パーオキシエ
ステル類、パーオキシケタール類、ジアルキルパーオキ
サイド類、ハイドロパーオキサイド類、シリルパーオキ
サイド類が挙げられる。ジアシルパーオキサイド類とし
ては、イソブチルパーオキサイド、2,4−ジクロロベン
ゾイルパーオキサイド、3,5,5−トリメチルヘキサノ
イルパーオキサイド、オクタノイルパーオキサイド、ラ
ウロイルパーオキサイド、ステアロイルパーオキサイ
ド、スクシニックパーオキサイド、ベンゾイルパーオキ
シトルエン、ベンゾイルパーオキサイド等が挙げられ
る。
Examples of the organic peroxide include diacyl peroxides, peroxydicarbonates, peroxyesters, peroxyketals, dialkyl peroxides, hydroperoxides, and silyl peroxides. Examples of diacyl peroxides include isobutyl peroxide, 2,4-dichlorobenzoyl peroxide, 3,5,5-trimethylhexanoyl peroxide, octanoyl peroxide, lauroyl peroxide, stearoyl peroxide, succinic peroxide, Benzoyl peroxytoluene, benzoyl peroxide and the like can be mentioned.

【0007】パーオキシジカーボネート類としては、ジ
−n−プロピルパーオキシジカーボネート、ジイソプロ
ピルパーオキシジカーボネート、ビス(4−t−ブチルシ
クロヘキシル)パーオキシジカーボネート、ジ−2−エ
トキシメトキシパーオキシジカーボネート、ジ(2−エ
チルヘキシルパーオキシ)ジカーボネート、ジメトキシ
ブチルパーオキシジカーボネート、ジ(3−メチル−3−
メトキシブチルパーオキシ)ジカーボネート等が挙げら
れる。
The peroxydicarbonates include di-n-propylperoxydicarbonate, diisopropylperoxydicarbonate, bis (4-t-butylcyclohexyl) peroxydicarbonate, and di-2-ethoxymethoxyperoxydicarbonate. Carbonate, di (2-ethylhexylperoxy) dicarbonate, dimethoxybutylperoxydicarbonate, di (3-methyl-3-
(Methoxybutylperoxy) dicarbonate.

【0008】パーオキシエステル類としては、クミルパ
ーオキシネオデカノエート、1,1,3,3−テトラメチル
ブチルパーオキシネオデカノエート、1−シクロヘキシ
ル−1−メチルエチルパーオキシノエデカノエート、t−
ヘキシルパーオキシネオデカノエート、t−ブチルパー
オキシピバレート、1,1,3,3−テトラメチルブチルパ
ーオキシ−2−エチルヘキサノネート、2,5−ジメチル
−2,5−ジ(2−エチルヘキサノイルパーオキシ)ヘキ
サン、1−シクロヘキシル−1−メチルエチルパーオキシ
−2−エチルヘキサノネート、t−ヘキシルパーオキシ−
2−エチルヘキサノネート、t−ブチルパーオキシ−2−
エチルヘキサノネート、t−ブチルパーオキシイソブチ
レート、1,1−ビス(t−ブチルパーオキシ)シクロヘ
キサン、t−ヘキシルパーオキシイソプロピルモノカー
ボネート、t−ブチルパーオキシ−3,5,5−トリメチル
ヘキサノネート、t−ブチルパーオキシラウレート、2,
5−ジメチル−2,5−ジ(m−トルオイルパーオキシ)ヘ
キサン、t−ブチルパーオキシイソプロピルモノカーボ
ネート、t−ブチルパーオキシ−2−エチルヘキシルモノ
カーボネート、t−ヘキシルパーオキシべンゾエート、t
−ブチルパーオキシアセテート等を挙げることができ
る。
The peroxy esters include cumyl peroxy neodecanoate, 1,1,3,3-tetramethylbutyl peroxy neodecanoate, 1-cyclohexyl-1-methylethyl peroxynodecanoate. , T-
Hexyl peroxy neodecanoate, t-butyl peroxy pivalate, 1,1,3,3-tetramethylbutyl peroxy-2-ethylhexanonate, 2,5-dimethyl-2,5-di (2 -Ethylhexanoylperoxy) hexane, 1-cyclohexyl-1-methylethylperoxy-2-ethylhexanonate, t-hexylperoxy-
2-ethylhexanonate, t-butylperoxy-2-
Ethyl hexanonate, t-butyl peroxyisobutyrate, 1,1-bis (t-butylperoxy) cyclohexane, t-hexylperoxyisopropyl monocarbonate, t-butylperoxy-3,5,5-trimethyl Hexanonate, t-butyl peroxylaurate, 2,
5-dimethyl-2,5-di (m-toluoylperoxy) hexane, t-butylperoxyisopropyl monocarbonate, t-butylperoxy-2-ethylhexyl monocarbonate, t-hexylperoxybenzoate, t-
-Butyl peroxyacetate and the like.

【0009】パーオキシケタール類では、1,1−ビス
(t−ヘキシルパーオキシ)−3,3,5−トリメチルシク
ロヘキサン、1,1−ビス(t−ヘキシルパーオキシ)シ
クロヘキサン、1,1−ビス(t−ブチルパーオキシ)−
3,3,5−トリメチルシクロヘキサン、1,1−(t−ブチ
ルパーオキシ)シクロドデカン、2,2−ビス(t−ブチ
ルパーオキシ)デカン等が挙げられる。
[0009] Among peroxyketals, 1,1-bis (t-hexylperoxy) -3,3,5-trimethylcyclohexane, 1,1-bis (t-hexylperoxy) cyclohexane, 1,1-bis (T-butyl peroxy)-
Examples include 3,3,5-trimethylcyclohexane, 1,1- (t-butylperoxy) cyclododecane, 2,2-bis (t-butylperoxy) decane, and the like.

【0010】ジアルキルパーオキサイド類では、α’,
α’−ビス(t−ブチルパーオキシ)ジイソプロピルベ
ンゼン、ジクミルパーオキサイド、2,5−ジメチル−
2,5−ジ(t−ブチルパーオキシ)ヘキサン、t−ブチル
クミルパーオキサイド等が挙げられる。
[0010] Among the dialkyl peroxides, α ',
α'-bis (t-butylperoxy) diisopropylbenzene, dicumyl peroxide, 2,5-dimethyl-
Examples thereof include 2,5-di (t-butylperoxy) hexane and t-butylcumyl peroxide.

【0011】ハイドロパーオキサイド類では、ジイソプ
ロピルベンゼンハイドロパーオキサイド、クメンハイド
ロパーオキサイド等が挙げられる。
The hydroperoxides include diisopropylbenzene hydroperoxide, cumene hydroperoxide and the like.

【0012】シリルパーオキサイド類としては、t−ブ
チルトリメチルシリルパーオキサイド、ビス(t−ブチ
ル)ジメチルシリルパーオキサイド、t−ブチルトリビ
ニルシリルパーオキサイド、ビス(t−ブチル)ジビニ
ルシリルパーオキサイド、トリス(t−ブチル)ビニル
シリルパーオキサイド、t−ブチルトリアリルシリルパ
ーオキサイド、ビス(t−ブチル)ジアリルシリルパー
オキサイド、トリス(t−ブチル)アリルシリルパーオ
キサイド等が挙げられる。
The silyl peroxides include t-butyltrimethylsilyl peroxide, bis (t-butyl) dimethylsilyl peroxide, t-butyltrivinylsilyl peroxide, bis (t-butyl) divinylsilyl peroxide, tris ( (t-butyl) vinylsilyl peroxide, t-butyltriallylsilyl peroxide, bis (t-butyl) diallylsilyl peroxide, tris (t-butyl) allylsilyl peroxide and the like.

【0013】また、回路部材の接続端子の腐食を抑える
ために、硬化剤中に含有される塩素イオンや有機酸は5
000ppm以下であることが好ましく、さらに、加熱
分解後に発生する有機酸が少ないものがより好ましい。
また、作製した回路接続材料の安定性が向上することか
ら室温(25℃)常圧下で24時間の開放放置後に20
重量%以上の重量保持率を有することが好ましい。これ
らは適宜混合して用いることができる。これらの遊離ラ
ジカル発生剤は単独または混合して使用することがで
き、分解促進剤、抑制剤等を混合して用いても良い。ま
た、これらの硬化剤をポリウレタン系、ポリエステル系
の高分子物質等で被覆してマイクロカプセル化したもの
は、可使時間が延長されるために好ましい。
Further, in order to suppress the corrosion of the connection terminals of the circuit member, chlorine ions and organic acids contained in the curing agent are 5% or less.
It is preferably at most 000 ppm, and more preferably an organic acid which is less generated after thermal decomposition.
In addition, since the stability of the prepared circuit connection material is improved, after leaving open for 24 hours under normal pressure at room temperature (25 ° C.),
It is preferable to have a weight retention of not less than% by weight. These can be used by mixing as appropriate. These free radical generators can be used alone or as a mixture, and a decomposition accelerator, an inhibitor and the like may be used as a mixture. A microcapsule obtained by coating these curing agents with a polyurethane-based or polyester-based polymer substance or the like is preferable because the pot life is extended.

【0014】本発明で用いる(1)シリコン変成ポリイ
ミド樹脂は、酸二無水物とジアミンのどちらか一方また
は両方がシロキサン骨格を有しており、例えばテトラカ
ルボン酸二無水物とシロキサン骨格を有するジアミンの
付加反応により合成したポリアミック酸を加熱縮合させ
イミド化したものであり溶解性、フィルム形成性の点か
ら、重量平均分子量は10000〜150000程度が
好ましい。この時、酸二無水物とジアミンは溶剤への溶
解性やラジカル重合性材料との相溶性の点から適宜選択
され、多成分を混合して用いることもできる。
The (1) silicon-modified polyimide resin used in the present invention has one or both of an acid dianhydride and a diamine having a siloxane skeleton, such as a tetracarboxylic dianhydride and a diamine having a siloxane skeleton. Is obtained by heating and condensing a polyamic acid synthesized by the addition reaction of the above, and from the viewpoint of solubility and film forming property, the weight average molecular weight is preferably about 10,000 to 150,000. At this time, the acid dianhydride and the diamine are appropriately selected from the viewpoint of solubility in a solvent and compatibility with the radically polymerizable material, and a mixture of multiple components can be used.

【0015】本発明で使用する(4)フィルム形成材と
しては、ポリウレタン樹脂、ポリビニルホルマール樹
脂、ポリスチレン樹脂、ポリビニルブチラール樹脂、ポ
リエステル樹脂、アクリル樹脂、ポリアミド樹脂、キシ
レン樹脂、フェノキシ樹脂等が挙げられる。これらは適
宜併用して用いることができる。フィルム形成材とは、
液状物を固形化し、構成組成物をフィルム形状とした場
合に、そのフィルムの取扱いが容易で、容易に裂けた
り、割れたり、べたついたりしない機械特性等を付与す
るものであり、通常の状態でフィルムとしての取扱いが
できるものである。また、フィルム形成材はラジカル重
合性の官能基により変成されていても良い。
The (4) film-forming material used in the present invention includes polyurethane resin, polyvinyl formal resin, polystyrene resin, polyvinyl butyral resin, polyester resin, acrylic resin, polyamide resin, xylene resin, phenoxy resin and the like. These can be used in combination as appropriate. What is a film-forming material?
When the liquid material is solidified and the constituent composition is in the form of a film, the film is easy to handle and easily tears, breaks, or imparts mechanical properties that do not stick, such as in a normal state. It can be handled as a film. Further, the film forming material may be modified by a radical polymerizable functional group.

【0016】本発明で用いるフィルム形成材のポリウレ
タン樹脂は、分子内に2個の水酸基を有するジオールと
2個のイソシアネート基を有するジイソシアネートの反
応により得られる樹脂であり、硬化時の応力緩和に優
れ、極性を有するため接着性が向上する。ジオールとし
ては線状の末端水酸基を有するものであれば好ましく使
用することができ、具体的には、ポリエチレンアジペー
ト、ポリジエチレンアジペート、ポリプロピレンアジペ
ート、ポリブチレンアジペート、ポリヘキサメチレンア
ジペート、ポリネオペンチルアジペート、ポリカプロラ
クトンポリオール、ポリヘキサメチレンカーボネート、
シリコーンポリオール、アクリルポリオール、ポリエチ
レングリコール、ポリプロピレングリコール、ポリテト
ラメチレングリコールなどが挙げられる。これらは、単
独でも、また、2種以上を併用することもできる。また
多価アルコールを併用することもできる。ジイソシアネ
ートとしては、イソホロンジイソシアネート、トリレン
ジイソシアネート、4,4’−ジフェニルメタンジイソシ
アネート、ナフタレン−1,5−ジイソシアネート、p−
フェニレンジイソシアネート、4,4’−メチレンビスシ
クロヘキシルジイソシアネート、ヘキサメチレンジイソ
シアネート、シクロヘキサンジイソシアネート等が挙げ
られる。これらは単独あるいは併用して用いても良い。
ポリウレタン樹脂の重量平均分子量は、10000〜1
000000が好ましい。重量平均分子量が、1000
0未満では、回路接続材料の凝集力が低下し、十分な接
着強度が得られにくくなる傾向にある。1000000
を超えると混合性、流動性が悪くなる傾向にある。ま
た、ジオールとジイソシアネートからポリウレタン樹脂
を合成する際に、多価アルコール、アミン類、酸無水物
等を配合し適宜反応させても良く、例えば酸無水物と反
応させて得られるイミド基含有ポリウレタンは、接着性
や耐熱性が向上するので好ましい。本発明で使用すると
好ましいポリウレタン樹脂は、ラジカル重合性の官能基
などによって変性されていても良く、ラジカル重合性の
官能基で変性したものは耐熱性が向上するため好まし
い。本発明で使用すると好ましいポリウレタン樹脂は、
フローテスタ法での流動点が40〜140℃の範囲内で
あるものが好ましい。フローテスタ法での流動点は、フ
ローテスタを用いて測定し、直径1mmのダイを用い、
3MPaの圧力をかけて、昇温速度2℃/分で昇温した
時のシリンダの動き始める温度である。本発明で使用す
ると好ましいポリウレタン樹脂は、このフローテスタ法
での流動点が40〜140℃の範囲内で適用可能であ
り、50℃〜100℃であることがより好ましい。フロ
ーテスタ法での流動点が、40℃未満では、フィルム成
形性、接着性に劣るようになり、140℃を超えると流
動性が悪化し電気的接続に悪影響するようになる。
The polyurethane resin of the film-forming material used in the present invention is a resin obtained by reacting a diol having two hydroxyl groups in a molecule with a diisocyanate having two isocyanate groups, and is excellent in stress relaxation during curing. , The adhesiveness is improved due to the polarity. As the diol, those having a linear terminal hydroxyl group can be preferably used.Specifically, polyethylene adipate, polydiethylene adipate, polypropylene adipate, polybutylene adipate, polyhexamethylene adipate, polyneopentyl adipate, Polycaprolactone polyol, polyhexamethylene carbonate,
Examples include silicone polyol, acrylic polyol, polyethylene glycol, polypropylene glycol, polytetramethylene glycol, and the like. These can be used alone or in combination of two or more. Further, a polyhydric alcohol can be used in combination. Examples of diisocyanates include isophorone diisocyanate, tolylene diisocyanate, 4,4'-diphenylmethane diisocyanate, naphthalene-1,5-diisocyanate, p-
Examples include phenylene diisocyanate, 4,4'-methylenebiscyclohexyl diisocyanate, hexamethylene diisocyanate, and cyclohexane diisocyanate. These may be used alone or in combination.
The weight average molecular weight of the polyurethane resin is 10,000 to 1
000000 is preferred. Weight average molecular weight of 1000
If it is less than 0, the cohesive force of the circuit connecting material is reduced, and it tends to be difficult to obtain a sufficient adhesive strength. 1,000,000
If it exceeds 300, the mixing property and the fluidity tend to deteriorate. Further, when synthesizing a polyurethane resin from a diol and a diisocyanate, a polyhydric alcohol, an amine, an acid anhydride and the like may be blended and appropriately reacted, for example, an imide group-containing polyurethane obtained by reacting with an acid anhydride is This is preferable because the adhesiveness and heat resistance are improved. The polyurethane resin which is preferably used in the present invention may be modified with a radical polymerizable functional group or the like, and a resin modified with a radical polymerizable functional group is preferable since heat resistance is improved. Polyurethane resin preferably used in the present invention,
Those having a pour point in the range of 40 to 140 ° C. by the flow tester method are preferred. The pour point in the flow tester method is measured using a flow tester, and using a die having a diameter of 1 mm,
This is the temperature at which the cylinder starts to move when a pressure of 3 MPa is applied and the temperature is raised at a rate of 2 ° C./min. The polyurethane resin preferably used in the present invention has a pour point in the flow tester method within a range of 40 to 140 ° C, and more preferably 50 to 100 ° C. If the pour point in the flow tester method is lower than 40 ° C., the film formability and adhesiveness will be poor.

【0017】本発明で使用する(2)ラジカル重合性物
質は、ラジカルにより重合する官能基を有する物質であ
り、アクリレート、メタクリレート、マレイミド化合物
等が挙げられる。ラジカル重合性物質はモノマー、オリ
ゴマーいずれの状態でも用いることが可能であり、モノ
マーとオリゴマーを併用することも可能である。アクリ
レートの具体例としては、メチルアクリレート、エチル
アクリレート、イソプロピルアクリレート、イソブチル
アクリレート、エチレングリコールジアクリレート、ジ
エチレングリコールジアクリレート、トリメチロールプ
ロパントリアクリレート、テトラメチロールメタンテト
ラアクリレート、2−ヒドロキシ−1,3−ジアクリロキ
シプロパン、2,2−ビス〔4−(アクリロキシメトキ
シ)フェニル〕プロパン、2,2−ビス〔4−(アクリロ
キシポリエトキシ)フェニル〕プロパン、ジシクロペン
テニルアクリレート、トリシクロデカニルアクリレー
ト、トリス(アクリロイロキシエチル)イソシアヌレー
ト、イソシアヌル酸エチレンオキサイド変性ジアクリレ
ート、ウレタンアクリレート及びそれらに対応するメタ
クリレート等が挙げられる。これらは単独または併用し
て用いることができ、必要によっては、ハイドロキノ
ン、メチルエーテルハイドロキノン類などの重合禁止剤
を適宜用いてもよい。ジシクロペンタニル基および/ま
たはトリシクロデカニル基および/またはトリアジン環
を有する場合は、耐熱性が向上するので好ましい。ま
た、リン酸エステル構造を有するラジカル重合性物質を
上記ラジカル重合性物質と併用して用いた場合、金属等
の無機物表面での接着強度が向上するので好ましい。
The (2) radical polymerizable substance used in the present invention is a substance having a functional group capable of polymerizing by radicals, and includes acrylate, methacrylate, and maleimide compounds. The radically polymerizable substance can be used in any state of a monomer and an oligomer, and the monomer and the oligomer can be used in combination. Specific examples of the acrylate include methyl acrylate, ethyl acrylate, isopropyl acrylate, isobutyl acrylate, ethylene glycol diacrylate, diethylene glycol diacrylate, trimethylolpropane triacrylate, tetramethylol methane tetraacrylate, and 2-hydroxy-1,3-diacrylate. Roxypropane, 2,2-bis [4- (acryloxymethoxy) phenyl] propane, 2,2-bis [4- (acryloxypolyethoxy) phenyl] propane, dicyclopentenyl acrylate, tricyclodecanyl acrylate, tris (Acryloyloxyethyl) isocyanurate, isocyanuric acid ethylene oxide-modified diacrylate, urethane acrylate and methacrylate corresponding thereto. That. These can be used alone or in combination. If necessary, a polymerization inhibitor such as hydroquinone or methyl ether hydroquinone may be appropriately used. It is preferable to have a dicyclopentanyl group and / or a tricyclodecanyl group and / or a triazine ring because heat resistance is improved. When a radical polymerizable substance having a phosphate ester structure is used in combination with the above-mentioned radical polymerizable substance, the adhesive strength on the surface of an inorganic substance such as a metal is preferably improved.

【0018】リン酸エステル構造を有するラジカル重合
性物質は、無水リン酸と2−ヒドロキシエチル(メタ)
アクリレートの反応物として得られる。具体的には、モ
ノ(2−メタクリロイルオキシエチル)アッシドホスフ
ェート、ジ(2−メタクリロイルオキシエチル)アッシ
ドホスフェート等が挙げられる。これらは単独でも併用
することもできる。ウレタンアクリレートは分子内に少
なくとも1個以上のウレタン基を有するもので、例えば
ポリテトラメチレングリコールなどのポリオールとポリ
イシシアネート及び水酸基含有アクリル化合物の反応物
として得られもので、接着性に優れるため好ましい。
Radical polymerizable substances having a phosphate ester structure include phosphoric anhydride and 2-hydroxyethyl (meth)
Obtained as an acrylate reactant. Specific examples include mono (2-methacryloyloxyethyl) acid phosphate, di (2-methacryloyloxyethyl) acid phosphate, and the like. These can be used alone or in combination. Urethane acrylate has at least one urethane group in the molecule, and is obtained as a reaction product of a polyol such as polytetramethylene glycol and a polyisocyanate and a hydroxyl group-containing acrylic compound, and is preferable because it has excellent adhesion. .

【0019】マレイミド化合物としては、分子中にマレ
イミド基を少なくとも2個以上含有するもので、例え
ば、1−メチル−2,4−ビスマレイミドベンゼン、N,
N’−m−フェニレンビスマレイミド、N,N’−p−フェ
ニレンビスマレイミド、N,N’−m−トルイレンビスマ
レイミド、N,N’−4,4−ビフェニレンビスマレイミ
ド、N,N’−4,4−(3,3’−ジメチルビフェニレン)
ビスマレイミド、N,N’−4,4−(3,3’−ジメチルジ
フェニルメタン)ビスマレイミド、N,N’−4,4−
(3,3’−ジエチルジフェニルメタン)ビスマレイミ
ド、N,N’−4,4−ジフェニルメタンビスマレイミド、
N,N’−4,4−ジフェニルプロパンビスマレイミド、
N,N’−4,4−ジフェニルエーテルビスマレイミド、
N,N’−3,3’−ジフェニルスルホンビスマレイミド、
2,2−ビス(4−(4−マレイミドフェノキシ)フェニ
ル)プロパン、2,2−ビス(3−s−ブチル−3,4−(4
−マレイミドフェノキシ)フェニル)プロパン、1,1−
ビス(4−(4−マレイミドフェノキシ)フェニル)デカ
ン、4,4’−シクロヘキシリデン−ビス(1−(4−マレ
イミドフェノキシ)−2−シクロヘキシルベンゼン、2,
2−ビス(4−(4−マレイミドフェノキシ)フェニル)
ヘキサフルオロプロパンなどを挙げることができる。
The maleimide compound is a compound containing at least two maleimide groups in the molecule, for example, 1-methyl-2,4-bismaleimidebenzene, N,
N'-m-phenylenebismaleimide, N, N'-p-phenylenebismaleimide, N, N'-m-toluylenebismaleimide, N, N'-4,4-biphenylenebismaleimide, N, N'- 4,4- (3,3'-dimethylbiphenylene)
Bismaleimide, N, N'-4,4- (3,3'-dimethyldiphenylmethane) bismaleimide, N, N'-4,4-
(3,3′-diethyldiphenylmethane) bismaleimide, N, N′-4,4-diphenylmethanebismaleimide,
N, N'-4,4-diphenylpropanebismaleimide,
N, N'-4,4-diphenylether bismaleimide,
N, N′-3,3′-diphenylsulfonebismaleimide,
2,2-bis (4- (4-maleimidophenoxy) phenyl) propane, 2,2-bis (3-s-butyl-3,4- (4
-Maleimidophenoxy) phenyl) propane, 1,1-
Bis (4- (4-maleimidophenoxy) phenyl) decane, 4,4'-cyclohexylidene-bis (1- (4-maleimidophenoxy) -2-cyclohexylbenzene, 2,
2-bis (4- (4-maleimidophenoxy) phenyl)
Hexafluoropropane and the like can be mentioned.

【0020】本発明において、回路接続材料中の(1)
シリコン変成ポリイミド樹脂、(2)ラジカル重合性物
質、(3)加熱により遊離ラジカルを発生する硬化剤、
(4)フィルム形成材について、(1)シリコン変成ポ
リイミド樹脂が、2〜75重量部、(2)ラジカル重合
性物質が、30〜60重量部、(3)加熱により遊離ラ
ジカルを発生する硬化剤が、0.1〜30重量部(4)
フィルム形成材0〜40重量部とされ、そのなかで適宜
決定される。 また、シリコーン微粒子は(1)シリコ
ン変成ポリイミド樹脂と(2)ラジカル重合性物質と
(4)フィルム形成材の和を100重量部とした場合、
5〜200重量部を配合するのが好ましく、そのなかで
適宜決定される。 (1)シリコーン変性ポリイミド樹脂の配合量が2重量
部未満では、回路接続材料の硬化時、熱負荷時等の応力
緩和の効果に乏しく接着強度が低下する。また、75重
量部を超えると、接続信頼性が低下する恐れがある。 (2)ラジカル重合性物質の配合量は、30重量部未満
では、硬化後の回路接続材料の機械的強度が低下する傾
向にあり、60重量部を超えると硬化前の回路接続材料
のタック性が増し、取扱性に劣るようになる。 (3)加熱により遊離ラジカルを発生する硬化剤の配合
量が、0.1重量部未満では、前記したように十分な反
応率を得ることができず良好な接着強度や小さな接続抵
抗が得られにくくなる傾向にある。配合量が30重量部
を超えると、回路接続材料の流動性が低下したり、接続
抵抗が上昇したり、回路接続材料のポットライフが短く
なる傾向にある。 また、(4)フィルム形成材の配合量が、40重量部を
超えると回路接続材料の流動性が低下したり、接続抵抗
が上昇したりする傾向にある。好ましくは1〜40重量
部である。フィルム形成材は、(1)シリコーン変成ポ
リイミド樹脂、(2)ラジカル重合性物質、(3)加熱
により遊離ラジカルを発生する硬化剤により、十分なフ
ィルム形成ができれば、配合しないこともできる。さら
に本発明の回路接続材料には、充填材、軟化剤、促進
剤、老化防止剤、着色剤、難燃化剤、チキソトロピック
剤、カップリング剤等を含有することもできる。
In the present invention, (1) in the circuit connecting material
A silicon-modified polyimide resin, (2) a radical polymerizable substance, (3) a curing agent that generates free radicals by heating,
(4) Regarding the film forming material, (1) 2 to 75 parts by weight of the silicone-modified polyimide resin, (2) 30 to 60 parts by weight of the radical polymerizable substance, (3) a curing agent that generates free radicals by heating But 0.1 to 30 parts by weight (4)
The film forming material is used in an amount of 0 to 40 parts by weight, which is appropriately determined. Further, when the sum of (1) silicone-modified polyimide resin, (2) radically polymerizable substance, and (4) film forming material is 100 parts by weight,
It is preferable to add 5 to 200 parts by weight, and the amount is appropriately determined. (1) If the blending amount of the silicone-modified polyimide resin is less than 2 parts by weight, the effect of relaxing the stress at the time of curing the circuit connection material or at the time of heat load is poor and the adhesive strength is reduced. If the amount exceeds 75 parts by weight, connection reliability may be reduced. (2) If the compounding amount of the radical polymerizable substance is less than 30 parts by weight, the mechanical strength of the circuit connecting material after curing tends to decrease, and if it exceeds 60 parts by weight, the tackiness of the circuit connecting material before hardening. And handling becomes inferior. (3) If the amount of the curing agent that generates free radicals by heating is less than 0.1 part by weight, a sufficient reaction rate cannot be obtained as described above, and good adhesive strength and small connection resistance can be obtained. It tends to be difficult. If the amount exceeds 30 parts by weight, the fluidity of the circuit connecting material tends to decrease, the connection resistance increases, and the pot life of the circuit connecting material tends to be short. If (4) the amount of the film-forming material exceeds 40 parts by weight, the fluidity of the circuit connecting material tends to decrease and the connection resistance tends to increase. Preferably it is 1 to 40 parts by weight. The film-forming material may not be blended with (1) a silicone-modified polyimide resin, (2) a radical polymerizable substance, and (3) a curing agent that generates free radicals by heating, as long as a sufficient film can be formed. Further, the circuit connecting material of the present invention may contain a filler, a softener, an accelerator, an antioxidant, a coloring agent, a flame retardant, a thixotropic agent, a coupling agent, and the like.

【0021】充填材を含有した場合、接続信頼性等の向
上が得られるので好ましい。充填材の最大径が導電性粒
子の粒径未満であることが好ましく、5〜60体積%の
範囲が好ましい。60体積%を超えると信頼性向上の効
果が飽和する。カップリング剤としては、ビニル基、ア
クリル基、アミノ基、エポキシ基及びイソシアネート基
含有物が、接着性の向上の点から好ましい。
It is preferable to include a filler since the connection reliability and the like can be improved. The maximum diameter of the filler is preferably smaller than the particle diameter of the conductive particles, and more preferably in the range of 5 to 60% by volume. If it exceeds 60% by volume, the effect of improving reliability is saturated. As the coupling agent, a vinyl group, an acryl group, an amino group, an epoxy group and an isocyanate group-containing material are preferable from the viewpoint of improving the adhesiveness.

【0022】本発明の回路接続材料は導電性粒子がなく
ても、接続時に相対向する接続端子の直接接触により接
続が得られるが、導電性粒子を含有した場合、より安定
した接続が得られる。導電性粒子としては、Au、A
g、Ni、Cu、はんだ等の金属粒子やカーボン等があ
り、十分なポットライフを得るためには、表層はNi、
Cuなどの遷移金属類ではなくAu、Ag、白金族の貴
金属類が好ましく、Auがより好ましい。また、Niな
どの遷移金属類の表面をAu等の貴金属類で被覆したも
のでもよい。また、非導電性のガラス、セラミック、プ
ラスチック等に前記した導通層を被覆等により形成し最
外層に貴金属類を被覆したものが好ましい。プラスチッ
クを核とした場合や熱溶融金属粒子の場合、加熱加圧に
より変形性を有するので接続時に接続端子との接触面積
が増加し、接続端子等の厚みのばらつきを吸収し信頼性
が向上するので好ましい。貴金族類の被覆層の厚みは良
好な抵抗を得るためには、100Å以上が好ましい。し
かし、Ni等の遷移金属の上に貴金属類の層を設ける場
合では、貴金属類層の欠損や導電粒子の混合分散時に生
じる貴金属類層の欠損等により生じる酸化還元作用で遊
離ラジカルが発生しポットライフの低下を引き起こすた
め、300Å以上が好ましい。そして、厚くなるとそれ
らの効果が飽和してくるので最大1μmにするのが望ま
しいが制限するものではない。導電性粒子は、接着剤成
分100体積に対して0.1〜30体積%の範囲で用途
により使い分ける。過剰な導電性粒子による隣接回路の
短絡等を防止するためには0.1〜10体積%とするの
がより好ましい。また、本構成の回路接続材料を2層以
上に分割し、遊離ラジカルを発生する硬化剤を含有する
層と導電性粒子を含有する層に分離した場合、従来の高
精細化可能の効果に加えて、ポットライフの向上が得ら
れる。
The circuit connection material of the present invention can be connected by direct contact of the connection terminals facing each other at the time of connection even without conductive particles. When the conductive particles are contained, more stable connection can be obtained. . Au, A as the conductive particles
g, Ni, Cu, metal particles such as solder, carbon and the like. In order to obtain a sufficient pot life, the surface layer is Ni,
Instead of transition metals such as Cu, Au, Ag, and platinum group noble metals are preferable, and Au is more preferable. Further, the surface of a transition metal such as Ni may be coated with a noble metal such as Au. Further, it is preferable that the above-described conductive layer is formed on a non-conductive glass, ceramic, plastic, or the like by coating or the like, and the outermost layer is coated with a noble metal. In the case of using plastic as a nucleus or hot-melt metal particles, they have deformability due to heating and pressurization, so the contact area with the connection terminal increases at the time of connection, absorbing variations in the thickness of the connection terminal etc. and improving reliability. It is preferred. The thickness of the noble metal coating layer is preferably 100 ° or more in order to obtain good resistance. However, when a layer of a noble metal is provided on a transition metal such as Ni, free radicals are generated due to oxidation-reduction caused by a defect in the noble metal layer or a defect in the noble metal layer generated during mixing and dispersion of conductive particles, and the like. In order to cause a reduction in the life, the thickness is preferably 300 ° or more. When the thickness increases, their effects become saturated. Therefore, it is preferable to set the thickness to 1 μm at the maximum, but there is no limitation. The conductive particles are properly used in a range of 0.1 to 30% by volume based on 100 volumes of the adhesive component. In order to prevent a short circuit or the like in an adjacent circuit due to excessive conductive particles, the content is more preferably 0.1 to 10% by volume. In addition, when the circuit connection material of the present configuration is divided into two or more layers and separated into a layer containing a hardener generating free radicals and a layer containing conductive particles, the conventional high definition can be obtained. Thus, the pot life can be improved.

【0023】本発明の回路接続材料は、ICチップとチ
ップ搭載基板との接着や電気回路相互の接着用のフィル
ム状接着剤としても有用である。すなわち、第一の接続
端子を有する第一の回路部材と、第二の接続端子を有す
る第二の回路部材とを、第一の接続端子と第二の接続端
子とを対向して配置し、前記対向配置した第一の接続端
子と第二の接続端子との間に本発明の回路接続材料(フ
ィルム状接着剤)を介在させ、加熱加圧して前記対向配
置した第一の接続端子と第二の接続端子を電気的に接続
させることができる。このような接続部材としては、半
導体チップ、抵抗体チップ、コンデンサチップ等のチッ
プ部品、チップ搭載及び/またはレジスト処理が施され
たプリント基板、TABテープにチップ搭載及びレジス
ト処理を施したTCP(テープキャリアパッケージ)、
液晶パネルなどがある。接続部材の材質は、半導体チッ
プ類のシリコーンやガリウム・ヒ素等や、ガラス、セラ
ミックス、ポリイミド樹脂、ガラス・エポキシ樹脂複合
体、プラスチック等がある。
The circuit connecting material of the present invention is also useful as a film adhesive for bonding an IC chip to a chip mounting substrate and bonding electric circuits to each other. That is, a first circuit member having a first connection terminal, and a second circuit member having a second connection terminal, the first connection terminal and the second connection terminal are arranged facing each other, The circuit connection material (film adhesive) of the present invention is interposed between the first connection terminal and the second connection terminal disposed opposite to each other, and heated and pressurized, and the first connection terminal and the second connection terminal disposed opposite each other. The two connection terminals can be electrically connected. Examples of such connecting members include chip components such as a semiconductor chip, a resistor chip, and a capacitor chip, a printed board on which chip mounting and / or resist processing has been performed, and a TCP (tape) on which chip mounting and resist processing have been performed on a TAB tape. Carrier package),
There are liquid crystal panels and the like. Examples of the material of the connection member include silicone, gallium, and arsenic of semiconductor chips, glass, ceramics, polyimide resin, glass-epoxy resin composite, and plastic.

【0024】本発明の回路接続材料は、接続時に接着剤
が溶融流動し相対向する接続端子の接続を得た後、硬化
して接続を保持するものであり、接着剤の流動性は重要
な因子である。厚み0.7mm、15mm×15mmの
ガラスを用いて、厚み35μm、5mm×5mmの回路
接続材料をこのガラスに挟み、160℃、2MPa、1
0秒で加熱加圧を行った場合、初期の面積(A)と加熱
加圧後の面積(B)を用いて表わされる流動性(B)/
(A)の値は1.3〜3.0であることが好ましく、
1.5〜2.5であることがより好ましい。1.3未満
では流動性が悪く、良好な接続が得られず、3.0を超
える場合は、気泡が発生しやすく信頼性に劣る。
In the circuit connecting material of the present invention, the adhesive melts and flows at the time of connection, and after the connection of the connection terminals facing each other is obtained, the adhesive is hardened to maintain the connection. The fluidity of the adhesive is important. Is a factor. Using a glass having a thickness of 0.7 mm and a size of 15 mm × 15 mm, a circuit connecting material having a thickness of 35 μm and a size of 5 mm × 5 mm is sandwiched between the glasses, and is heated at 160 ° C., 2 MPa, and 1 MPa.
When the heating and pressurizing is performed in 0 seconds, the fluidity (B) expressed by using the initial area (A) and the area after the heating and pressurizing (B) /
The value of (A) is preferably from 1.3 to 3.0,
More preferably, it is 1.5 to 2.5. If it is less than 1.3, the fluidity is poor, and good connection cannot be obtained. If it is more than 3.0, bubbles are easily generated and the reliability is poor.

【0025】本発明の回路接続材料は、示差走査熱量計
(DSC)を用いて昇温速度10℃/分の測定におい
て、発熱反応の立ち上がり温度(Ta)が70〜110
℃の範囲内で、ピーク温度(Tp)がTa+5〜30℃
であり、かつ終了温度(Te)が160℃以下であるこ
とが好ましい。このようにすることにより、低温接続
性、室温での保存安定性を両立することができる。
The circuit connection material of the present invention has a rising temperature (Ta) of an exothermic reaction of 70 to 110 when measured at a heating rate of 10 ° C./min using a differential scanning calorimeter (DSC).
Within the range of ° C., the peak temperature (Tp) is Ta + 5 to 30 ° C.
And the end temperature (Te) is preferably 160 ° C. or lower. By doing so, both low-temperature connectivity and storage stability at room temperature can be compatible.

【0026】本発明の回路接続材料は、硬化後の25℃
での貯蔵弾性率100〜2000MPaが好ましく、3
00〜1500MPaがより好ましい。この場合、接続
後の樹脂の内部応力を低減し、接着力の向上に有利であ
り、かつ、良好な導通特性が得られる。
The circuit connecting material of the present invention has a temperature of 25 ° C. after curing.
The storage elastic modulus is preferably 100 to 2000 MPa,
00 to 1500 MPa is more preferable. In this case, the internal stress of the resin after the connection is reduced, which is advantageous for improving the adhesive strength, and good conduction characteristics can be obtained.

【0027】本発明の回路板の製造方法は、第一の接続
端子を有する第一の回路部材と、第二の接続端子を有す
る第二の回路部材とを、第一の接続端子と第二の接続端
子を対向して配置し、前記対向配置した第一の接続端子
と第二の接続端子の間に前記の回路接続材料を介在さ
せ、加熱加圧して前期対向配置した第一の接続端子と第
二の接続端子を電気的に接続させる。接続端子を有する
回路部材として、半導体チップのシリコン、ガリウム・
ヒ素等、ガラス、セラミックス、ガラス・熱硬化性樹脂
の複合材料、プラスチックフィルム、プラスチックシー
ト等の絶縁基板に接着剤を介して導電性の金属箔を形成
し接続端子を含めた回路を形成したもの、絶縁基板にめ
っきや蒸着で導電性の回路を形成したもの、あるいは、
めっき触媒等の材料を塗布して導電性の回路を形成した
ものを例示することができ、TABテープ、FPC、P
WB、ITO、接続パッドを有する半導体チップが代表
的なものである。
According to the method for manufacturing a circuit board of the present invention, the first circuit member having the first connection terminal and the second circuit member having the second connection terminal are connected to the first connection terminal and the second connection member. The first connection terminal is disposed opposite to the first connection terminal, the circuit connection material is interposed between the first connection terminal and the second connection terminal disposed opposite to each other, and heated and pressurized. And the second connection terminal are electrically connected. Circuit members having connection terminals include semiconductor chip silicon and gallium.
Arsenic, glass, ceramics, composite material of glass and thermosetting resin, plastic film, plastic sheet, etc., formed a conductive metal foil via an adhesive on an insulating substrate to form a circuit including connection terminals A conductive circuit formed by plating or vapor deposition on an insulating substrate, or
Examples of a conductive circuit formed by applying a material such as a plating catalyst can be used. TAB tape, FPC, PPC
A typical example is a semiconductor chip having WB, ITO and connection pads.

【0028】回路接続材料と接する導電性の接続端子
は、銅やニッケル等の遷移金属であると酸化還元作用で
遊離ラジカルを発生し、第一の接続端子に回路接続材料
を仮接着し、一定時間放置するとラジカル重合が進行し
てしまい、接続材料が流動しにくくなり、位置合わせし
た第二の接続端子との本接続時に十分な電気的接続を行
えなくなるおそれが生じる。そのため、少なくとも一方
の接続端子の表面を金、銀、白金族の金属または錫から
選ばれる少なくとも一種で構成することが好ましい。銅
/ニッケル/金のように複数の金属を組み合わせ多層構
成としても良い。さらに、本発明の回路板の製造方法に
おいては、少なくとも一方の接続端子がプラスチック上
に直接存在して構成されると好ましく、プラスチックが
ポリイミド樹脂であることが好ましい。プラスチックと
しては、ポリエチレンテレフタレート樹脂、ポリエチレ
ンナフタレート樹脂、ポリエーテルサルフォン樹脂、ポ
リカーボネート樹脂、ポリイミド樹脂のフィルムやシー
トが挙げられ、これらを用いることにより回路板の厚み
をより薄くし、しかも軽量化することができる。本発明
の回路接続材料を使用することにより低温で接続が可能
となるため、ガラス転移温度ないし融点が比較的低いプ
ラスチックを使用することができ、経済的に優れた回路
板を得ることができる。薄型、軽量化には接続部材とな
るプラスチックと導電材料の接続端子を接着剤で接着す
るよりも接着剤を使用しない接続端子がプラスチック上
に直接存在して構成される回路部材であると好ましい。
接着剤を用いないで銅箔等の金属箔上に直接樹脂溶液を
一定厚さに形成するダイレクトコート法により得られた
金属箔付ポリイミド樹脂が市販されており、好適に使用
することができる。その他に押出機等から直接フィルム
形状に押し出されたフィルムと金属箔を熱圧着したもの
も使用することができる。
When the conductive connection terminal in contact with the circuit connection material is a transition metal such as copper or nickel, free radicals are generated by an oxidation-reduction action, and the circuit connection material is temporarily adhered to the first connection terminal, and is fixed. If left for a long time, radical polymerization proceeds, the connection material becomes difficult to flow, and there is a possibility that sufficient electrical connection may not be performed at the time of full connection with the aligned second connection terminal. Therefore, it is preferable that the surface of at least one of the connection terminals is made of at least one selected from gold, silver, a platinum group metal or tin. A multilayer structure may be formed by combining a plurality of metals such as copper / nickel / gold. Furthermore, in the circuit board manufacturing method of the present invention, it is preferable that at least one of the connection terminals is formed directly on the plastic, and the plastic is preferably a polyimide resin. Examples of the plastic include films and sheets of polyethylene terephthalate resin, polyethylene naphthalate resin, polyether sulfone resin, polycarbonate resin, and polyimide resin, and by using these, the thickness of the circuit board is made thinner and moreover, the weight is reduced. be able to. By using the circuit connection material of the present invention, connection can be made at a low temperature, so that plastic having a relatively low glass transition temperature or melting point can be used, and a circuit board excellent in economy can be obtained. In order to reduce the thickness and weight, it is preferable that the connection member be made of a connection member that does not use an adhesive, and that a connection terminal that does not use an adhesive is directly provided on the plastic, rather than bonding a connection terminal made of a conductive material with a plastic that is a connection member.
A polyimide resin with a metal foil obtained by a direct coating method in which a resin solution is formed to a constant thickness directly on a metal foil such as a copper foil without using an adhesive is commercially available and can be suitably used. In addition, a material obtained by thermocompression bonding a film extruded directly from an extruder or the like into a film shape and a metal foil can also be used.

【0029】本発明においては、従来のエポキシ樹脂系
よりも低温速硬化性に優れ、かつ、回路端子を支持する
基板が有機絶縁物質、ガラスから選ばれる少なくとも一
種からなる回路部材及び表面が窒化シリコン、シリコー
ン樹脂、ポリイミド樹脂から選ばれる少なくとも一種で
コーティングもしくは付着した回路部材に対して特に良
好な接着強度が得られる、電気・電子用の回路接続材料
及びそれを用いた回路板の製造方法、回路板の提供が可
能となる。
In the present invention, the circuit member which is excellent in low-temperature and quick-curing properties compared with the conventional epoxy resin system and which supports the circuit terminals is made of at least one kind selected from an organic insulating material and glass, and the surface is made of silicon nitride. A circuit connecting material for electric and electronic devices, and a method and a circuit for manufacturing a circuit board using the same, which provide particularly good adhesive strength to a circuit member coated or adhered with at least one selected from silicone resin and polyimide resin. Boards can be provided.

【0030】[0030]

【実施例】以下、本発明を実施例に基づいて具体的に説
明する。 (実施例1) 〔ポリイミド樹脂の合成〕酸二無水物として、2,2−ビ
ス(4−(3,4−ジカルボキシフェノキシ)フェニル)
プロパン二無水物(26.1g)をシクロヘキサノン1
20gに溶解し、ジアミンとして2,2−ビス(4−(4−
アミノフェノキシ)フェニル)プロパン(14.4
g)、1,3−ビス(3一アミノプロピル)−1,1,3,3
−テトラメチルジシロキサン(3.8g)をシクロヘキ
サノン120gに溶解した溶液を反応系の温度が50℃
を超えないように調節しながら、酸二無水物溶液のフラ
スコ内に滴下し、滴下終了後さらに10時間攪拌した。
次ぎに水分留管を取り付け、トルエン50gを加え12
0℃に昇温して8時間保持して、イミド化を行った。得
られた溶液を室温まで冷却した後、メタノール中で再沈
させ得られた沈降物を乾燥して重量平均分子量3200
0のポリイミド樹脂を得た。これをテトラヒドロフラン
に溶解して20重量%のポリイミド溶液Aを得た。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be specifically described below based on embodiments. (Example 1) [Synthesis of polyimide resin] As an acid dianhydride, 2,2-bis (4- (3,4-dicarboxyphenoxy) phenyl)
Propane dianhydride (26.1 g) was added to cyclohexanone 1
Dissolved in 20 g, and 2,2-bis (4- (4- (4-
Aminophenoxy) phenyl) propane (14.4
g), 1,3-bis (3-aminopropyl) -1,1,3,3
A solution of tetramethyldisiloxane (3.8 g) dissolved in 120 g of cyclohexanone was heated to a temperature of 50 ° C.
The solution was added dropwise to the flask of the acid dianhydride solution while adjusting so as not to exceed the above, and the mixture was further stirred for 10 hours after completion of the addition.
Next, a water retention tube was attached, 50 g of toluene was added, and 12
The temperature was raised to 0 ° C. and maintained for 8 hours to perform imidization. After cooling the obtained solution to room temperature, it was reprecipitated in methanol and the obtained precipitate was dried to obtain a weight average molecular weight of 3200.
No. 0 polyimide resin was obtained. This was dissolved in tetrahydrofuran to obtain a 20% by weight polyimide solution A.

【0031】ラジカル重合性物質としてジメチロールト
リシクロデカンジアクリレートを用いた。フィルム形成
材としてフェノキシ樹脂(PKHC;ユニオンカーバイ
ド社製商品名、重量平均分子45000)を用いた。加
熱により遊離ラジカルを発生する硬化剤としてラウロイ
ルパーオキサイド(室温(25℃)常圧下で24時間の
開放放置後の重量保持率97重量%)の20重量%DO
P溶液を用いた。ポリスチレンを核とする粒子の表面
に、厚み0.2μmのニッケル層を設け、このニッケル
層の外側に、厚み0.04μmの金層を設け、平均粒径
10μmの導電性粒子を作製した。固形重量比で前記で
合成したシリコン変成ポリイミド樹脂A(固形分とし
て)40g、ジメチロールトリシクロデカンジアクリレ
ート 39g、リン酸エステル型アクリレート(共栄社
油脂株式会社製商品名;P2M)1g、フェノキシ樹脂
20g、ラウロイルパーオキサイド 5g(DOP
(ジオクチルフタレート)溶液として25g)となるよ
うに配合し、さらに導電性粒子を3体積%配合分散さ
せ、厚み80μmの片面を表面処理したPET(ポリエ
チレンテレフテレート)フィルムに塗工装置を用いて塗
布し、70℃、10分の熱風乾燥により、接着剤層の厚
みが35μmの回路接続材料を得た。
As the radical polymerizable substance, dimethylol tricyclodecane diacrylate was used. A phenoxy resin (PKHC; trade name, manufactured by Union Carbide, weight average molecule: 45,000) was used as a film forming material. 20% by weight DO of lauroyl peroxide (weight retention of 97% by weight after leaving open for 24 hours at room temperature (25 ° C.) under normal pressure) as a curing agent that generates free radicals upon heating
The P solution was used. A nickel layer having a thickness of 0.2 μm was provided on the surface of the particles having polystyrene as a core, and a gold layer having a thickness of 0.04 μm was provided outside the nickel layer to produce conductive particles having an average particle diameter of 10 μm. 40 g of the silicone-modified polyimide resin A (as a solid content) synthesized above at a solid weight ratio, 39 g of dimethylol tricyclodecane diacrylate, 1 g of a phosphoric acid ester type acrylate (trade name of P2M manufactured by Kyoeisha Yushi Co., Ltd .; P2M), 20 g of a phenoxy resin , Lauroyl peroxide 5g (DOP
(Dioctyl phthalate) solution, and the conductive particles were further mixed and dispersed by 3% by volume, and a 80 μm-thick surface-treated PET (polyethylene terephthalate) film having one surface was coated using a coating apparatus. It was applied and dried with hot air at 70 ° C. for 10 minutes to obtain a circuit connection material having an adhesive layer thickness of 35 μm.

【0032】(回路の接続)ライン幅50μm、ピッチ
100μm、厚み18μmの銅回路500本をポリイミ
ドフィルム(厚み100μm)上に形成したフレキシブ
ル回路板(2層FPC)及び、ポリイミドとポリイミド
と銅箔を接着する接着剤及び厚み18μmの銅箔からな
る3層構成で、ライン幅50μm、ピッチ100μmの
フレキシブル回路板(3層FPC)と厚み1.1mmの
ガラス上にインジュウム−錫酸化物(ITO)を蒸着に
より形成したITO基板(表面抵抗;<20Ω/□)を
上記回路接続材料(接着剤組成物)を用い160℃、3
MPaで10秒間加熱加圧して幅2mmにわたり接続し
た。このとき、液状の接着剤組成物はITO基板上に塗
布し、フィルム状接着剤組成物はあらかじめITO基板
上に、接着剤組成物の接着面を貼り付けた後、70℃、
0.5MPaで5秒間加熱加圧して仮接続し、その後、
PETフィルムを剥離してもう一方のFPCと接続し
た。
(Connection of Circuits) A flexible circuit board (two-layer FPC) in which 500 copper circuits having a line width of 50 μm, a pitch of 100 μm, and a thickness of 18 μm are formed on a polyimide film (thickness: 100 μm), and a polyimide, polyimide and copper foil Indium-tin oxide (ITO) is formed on a flexible circuit board (three-layer FPC) having a line width of 50 μm and a pitch of 100 μm (three-layer FPC) and a glass having a thickness of 1.1 mm in a three-layer configuration including an adhesive to be bonded and a copper foil having a thickness of 18 μm. An ITO substrate (surface resistance; <20Ω / □) formed by vapor deposition was heated at 160 ° C. for 3 hours using the above circuit connection material (adhesive composition).
It was heated and pressed at 10 MPa for 10 seconds and connected over a width of 2 mm. At this time, the liquid adhesive composition was applied on the ITO substrate, and the film-shaped adhesive composition was applied on the ITO substrate in advance, after the adhesive surface of the adhesive composition was adhered, and then heated to 70 ° C.
Temporarily connect by heating and pressing at 0.5 MPa for 5 seconds,
The PET film was peeled off and connected to the other FPC.

【0033】(実施例2) 〔ウレタンアクリレートの合成〕平均分子量800のポ
リカプロラクトンジオール400重量部と、2−ヒドロ
キシプロピルアクリレート131重量部、触媒としてジ
ブチル錫ジラウレート0.5重量部、重合禁止剤として
ハイドロキノンモノメチルエーテル1.0重量部を攪拌
しながら50℃に加熱して混合した。次いでイソホロン
ジイソシアネート222重量部を滴下し更に攪拌しなが
ら80℃に昇温してウレタン化反応を行った。NCOの
反応率が99%以上になったことを確認後、反応温度を
下げてウレタンアクリレートBを得た。 〔ポリウレタン樹脂の合成〕平均分子量2000のポリ
ブチレンアジペートジオール450重量部、平均分子量
2000のポリオキシテトラメチレングリコール450
重量部、1,4−ブチレングリコール100重量部を混合
し、メチルエチルケトン4000重量部を加えて均一に
混合した後、ジフェニルメタンジイソシアネート390
重量部を加えて70℃にて反応し固形分20重量%で1
50ポイズ(25℃)のポリウレタン樹脂C溶液を得
た。このポリウレタン樹脂の重量平均分子量は35万で
あり、フローテスタ法での流動点は80℃であった。実
施例1で合成したシリコン変成ポリイミド樹脂A(固形
分として)40g、前記で合成したウレタンアクリレー
トB 39g、前記で合成したポリウレタン樹脂C(固
形分として)20g、リン酸エステル型アクリレート
1gとした以外は、実施例1と同様にして回路接続材料
を得て、回路板を作製した。
(Example 2) [Synthesis of urethane acrylate] 400 parts by weight of polycaprolactone diol having an average molecular weight of 800, 131 parts by weight of 2-hydroxypropyl acrylate, 0.5 parts by weight of dibutyltin dilaurate as a catalyst, and a polymerization inhibitor Hydroquinone monomethyl ether (1.0 part by weight) was heated and mixed at 50 ° C. while stirring. Next, 222 parts by weight of isophorone diisocyanate was added dropwise, and the temperature was raised to 80 ° C. with further stirring to carry out a urethanization reaction. After confirming that the conversion of NCO was 99% or more, the reaction temperature was lowered to obtain urethane acrylate B. [Synthesis of polyurethane resin] 450 parts by weight of polybutylene adipate diol having an average molecular weight of 2,000, and polyoxytetramethylene glycol 450 having an average molecular weight of 2,000
Parts by weight, 100 parts by weight of 1,4-butylene glycol, 4,000 parts by weight of methyl ethyl ketone, and uniform mixing.
The reaction was carried out at 70 ° C and the solid content was 20% by weight.
A polyurethane resin C solution of 50 poise (25 ° C.) was obtained. The weight average molecular weight of this polyurethane resin was 350,000, and the pour point by the flow tester method was 80 ° C. 40 g of the silicone-modified polyimide resin A (as a solid content) synthesized in Example 1, 39 g of the urethane acrylate B synthesized as described above, 20 g of the polyurethane resin C (as a solid content) synthesized as described above, and a phosphate ester type acrylate
A circuit connecting material was obtained in the same manner as in Example 1 except that the amount was 1 g, and a circuit board was produced.

【0034】(実施例3) 〔シリコーン微粒子の合成〕20℃でメチルトリメトキ
シシランを300rpmで攪拌したpH12のアルコー
ル水溶液に添加し、加水分解、縮合させ25℃における
弾性率8MPa、平均粒径2μmの球状粒子を得た。得
られたシリコーン微粒子100重量部を重量比でトルエ
ン/酢酸エチル=50/50の混合溶剤100重量部に
分散した。実施例1で合成したシリコン変成ポリイミド
樹脂A(固形分として)40g、ジメチロールトリシク
ロデカンジアクリレート 39g、フェノキシ樹脂 2
0g、リン酸エステル型アクリレート1g、前記で合成
したシリコーン微粒子(固形分として)10gとした以
外は、実施例1と同様にして回路接続材料を得て、回路
板を製造した。
Example 3 [Synthesis of Silicone Fine Particles] Methyltrimethoxysilane was added to an aqueous alcohol solution of pH 12 stirred at 300 rpm at 20 ° C., and hydrolyzed and condensed. The elastic modulus at 25 ° C. was 8 MPa, and the average particle size was 2 μm. Was obtained. 100 parts by weight of the obtained silicone fine particles were dispersed in 100 parts by weight of a mixed solvent of toluene / ethyl acetate = 50/50 in a weight ratio. 40 g of silicone-modified polyimide resin A (as solid content) synthesized in Example 1, 39 g of dimethylol tricyclodecane diacrylate, phenoxy resin 2
A circuit connecting material was obtained in the same manner as in Example 1 except that 0 g, 1 g of a phosphoric acid ester type acrylate, and 10 g of the silicone fine particles (as a solid content) synthesized above were used to produce a circuit board.

【0035】(実施例4)ITOガラスを表面にITO
接続端子で配線が施されている液晶パネルとした他は実
施例1と同様にして回路接続材料の厚みが15μmを用
いた回路板を得た。
(Example 4) ITO glass was coated on the surface with ITO.
A circuit board using a circuit connection material having a thickness of 15 μm was obtained in the same manner as in Example 1 except that a liquid crystal panel having wirings provided at connection terminals was used.

【0036】(実施例5)ITOガラスを、35μmの
銅箔を有した積層基板をライン幅100μm、ピッチ2
00μmに銅回路をパターニングし、レジスト処理を施
し銅箔表面に金メッキを施し作製したプリント基板(P
WB)とした他は実施例1と同様にして回路接続材料の
厚みが15μmを用いた回路板を得た。
Example 5 ITO glass was used to form a laminated substrate having a copper foil of 35 μm in a line width of 100 μm and a pitch of 2.
A printed circuit board (P) formed by patterning a copper circuit to 00 μm, applying a resist treatment, and applying a gold plating to the copper foil surface.
A circuit board using a circuit connecting material having a thickness of 15 μm was obtained in the same manner as in Example 1 except that WB) was used.

【0037】(比較例1)フェノキシ樹脂(PKHC;
ユニオンカーバイド社製商品名、重量平均分子量450
00)、ビスフェノールA型エポキシ樹脂(YL98
0;油化シェルエポキシ株式会社製商品名)、イミダゾ
ール系マイクロカプセル型硬化剤(3941HP;旭化
成工業株式会社製商品名)を用いて、フェノキシ樹脂/
ビスフェノールA型エポキシ樹脂/イミダゾール系マイ
クロカプセル型硬化剤の固形重量比40/20/40と
した他は、実施例1と同様にして回路接続材料を得て、
回路板を作製した。
Comparative Example 1 Phenoxy resin (PKHC;
Union Carbide product name, weight average molecular weight 450
00), bisphenol A type epoxy resin (YL98
0; trade name of Yuka Shell Epoxy Co., Ltd.) and imidazole-based microcapsule type hardener (3941HP; trade name of Asahi Kasei Corporation).
A circuit connecting material was obtained in the same manner as in Example 1, except that the solid weight ratio of bisphenol A type epoxy resin / imidazole microcapsule type curing agent was 40/20/40.
A circuit board was manufactured.

【0038】(比較例2)シリコン変成ポリイミド樹脂
Aの代わりにフェノキシ樹脂(PKHC)を用いた他
は、実施例1と同様にして回路接続材料を得て、回路板
を作製した。
Comparative Example 2 A circuit connecting material was obtained in the same manner as in Example 1 except that a phenoxy resin (PKHC) was used instead of the silicon-modified polyimide resin A, and a circuit board was produced.

【0039】上記実施例1〜4、比較例1、2で得られ
た回路接続材料及び回路板を用いて、接着力、接続抵
抗、保存性、絶縁性、ポリウレタン樹脂の流動性、回路
接続材料の流動性、硬化後の弾性率、DSC測定を測
定、評価した。その結果を表1に示した。測定、評価方
法は、下記のようにして行った。 (接着力の測定)上述で得られた回路の接続体(回路
板)を90度の方向に剥離速度50mm/分で、剥離し
接着力を測定した。接着力は、回路板の作製初期と、8
5℃、85%RHの高温高湿槽中に500時間保持した
後に測定した。 (接続抵抗の測定)上述の回路接続材料を用いて、上記
で作製したライン幅100μm、ピッチ200μm、厚
み18μmのSnメッキした銅回路を100本配置した
フレキシブル回路板(FPC)とITOベタガラスを1
60℃、3MPaで10秒間加熱加圧して幅2mmにわ
たり接続した。この接続体の隣接回路間の抵抗値を、初
期と、85℃、85%RHの高温高湿槽中に500時間
保持した後にマルチメータで測定した。抵抗値は隣接回
路間の抵抗50点の平均で示した。
Using the circuit connection materials and circuit boards obtained in Examples 1 to 4 and Comparative Examples 1 and 2, adhesive strength, connection resistance, preservability, insulation, fluidity of polyurethane resin, circuit connection material Was measured and evaluated for fluidity, elastic modulus after curing, and DSC measurement. The results are shown in Table 1. The measurement and evaluation methods were performed as follows. (Measurement of Adhesive Strength) The connected body (circuit board) of the circuit obtained above was peeled at a peeling speed of 50 mm / min in a direction of 90 °, and the adhesive strength was measured. The adhesive strength was 8 at the beginning of the circuit board production and 8
The measurement was performed after the sample was kept in a high-temperature and high-humidity bath at 5 ° C. and 85% RH for 500 hours. (Measurement of connection resistance) Using the above-mentioned circuit connection material, a flexible circuit board (FPC) in which 100 Sn-plated copper circuits each having a line width of 100 μm, a pitch of 200 μm, and a thickness of 18 μm were placed and one piece of ITO solid glass were used.
It was heated and pressurized at 60 ° C. and 3 MPa for 10 seconds and connected over a width of 2 mm. The resistance value between the adjacent circuits of the connection body was measured with a multimeter at the initial stage and after being kept in a high-temperature and high-humidity chamber at 85 ° C. and 85% RH for 500 hours. The resistance value is shown as an average of 50 resistances between adjacent circuits.

【0040】(保存性の評価)得られた回路接続材料を
30℃の恒温槽で30日間処理し、上記と同様にして回
路の接続を行い保存性を評価した。 (絶縁性の評価)得られた回路接続材料を用いて、ライ
ン幅100μm、ピッチ200μm、厚み45μmの銅
回路を交互に250本配置した櫛形回路を有するプリン
ト基板とライン幅100μm、ピッチ200μm、厚み
18μmの銅回路を500本有するフレキシブル回路板
(FPC)を160℃、3MPaで10秒間加熱加圧し
て幅2mmにわたり接続した。この接続体の櫛形回路に
100Vの電圧を印加し、85℃、85%RHの高温高
湿試験500時間後の絶縁抵抗値を測定した。
(Evaluation of Storage Property) The obtained circuit connection material was treated in a thermostat at 30 ° C. for 30 days, and the circuit was connected in the same manner as described above to evaluate the storage property. (Evaluation of Insulation) Using the obtained circuit connection material, a printed circuit board having a comb-shaped circuit in which 250 copper circuits having a line width of 100 μm, a pitch of 200 μm, and a thickness of 45 μm were alternately arranged, a line width of 100 μm, a pitch of 200 μm, and a thickness A flexible circuit board (FPC) having 500 18 μm copper circuits was heated and pressed at 160 ° C. and 3 MPa for 10 seconds, and connected over a width of 2 mm. A voltage of 100 V was applied to the comb-shaped circuit of this connection body, and the insulation resistance value after 500 hours of a high-temperature and high-humidity test at 85 ° C. and 85% RH was measured.

【0041】(ポリウレタン樹脂の流動点測定)フロー
テスタ(株式会社島津製作所製、商品名CFT−100
型)で直径1mmのダイを用い3MPaの圧力で2℃/
分の昇温速度でシリンダの動き出す温度を測定し流動点
とした。 (回路接続材料の流動性評価)厚み35μm、5mm×
5mmの回路接続材料を用い、これを厚み0.7mm、
15mm×15mmのガラスに挟み、160℃、2MP
a、10秒で加熱加圧を行った。初期の面積(A)と加
熱加圧後の面積(B)を用いて流動性(B)/(A)の
値を求め流動性とした。 (硬化後の弾性率)回路接続材料を、160℃のオイル
中に1分間浸漬して硬化させ、硬化したフィルムの貯蔵
弾性率を動的粘弾性測定装置を用いて測定し(昇温速度
5℃/分、10Hz)、25℃の弾性率を測定した。 (DSCの測定)得られた回路接続材料を用いて、示差
走査熱量計(DSC、TAインスツルメント社製商品名
910型)を用いて10℃/分の測定において発熱反応
の立ち上がり温度(Ta)、ピーク温度(Tp)、終了
温度(Te)を求めた。
(Measurement of Pour Point of Polyurethane Resin) Flow Tester (CFT-100, manufactured by Shimadzu Corporation)
Using a die with a diameter of 1 mm and a pressure of 3 MPa at 2 ° C /
The temperature at which the cylinder began to move at a rate of temperature rise for one minute was measured and defined as the pour point. (Evaluation of fluidity of circuit connection material) Thickness 35 μm, 5 mm ×
Using a circuit connection material of 5 mm, this is 0.7 mm thick,
Sandwiched between 15mm x 15mm glass, 160 ℃, 2MP
a, Heating and pressurization was performed for 10 seconds. The value of the fluidity (B) / (A) was determined using the initial area (A) and the area (B) after the heating and pressurization, and was defined as the fluidity. (Elastic modulus after curing) The circuit connection material was immersed in oil at 160 ° C. for 1 minute to cure, and the storage elastic modulus of the cured film was measured using a dynamic viscoelasticity measuring device (temperature rise rate 5 ° C / min, 10 Hz) and the elastic modulus at 25 ° C. (Measurement of DSC) Using the obtained circuit connection material, the rising temperature of the exothermic reaction (Ta) was measured at 10 ° C./min using a differential scanning calorimeter (DSC, trade name 910, manufactured by TA Instruments). ), Peak temperature (Tp) and end temperature (Te) were determined.

【0042】[0042]

【表1】 [Table 1]

【0043】 いずれの実施例においても2層FPCの
接着力の初期値は800〜1100N/m程度で、耐湿
試験後においても900〜1200N/m程度と接着強
度の著しい低下が無く良好な接着性を示した。比較例1
は硬化反応が不十分で、比較例2はシリコン変成ポリイ
ミド樹脂を用いていないため接着強度に200N/m程
度と接着力が低かった。いずれの実施例においても3層
FPCの接着力の初期値は1200〜1400N/m程
度で、耐湿試験後においても1200〜1400N/m
程度と接着強度の著しい低下が無く良好な接着性を示し
た。比較例1は硬化反応が不十分で、比較例2はシリコ
ン変成ポリイミド樹脂を用いていないため接着強度に6
00N/m程度と接着力が低かった。実施例1で得られ
た回路接続材料は2層FPC、3層FPCのいづれにお
いても初期の接続抵抗も低く、高温高湿試験後の抵抗の
上昇もわずかであり、良好な接続信頼性を示した。ま
た、実施例2、3、4、5、比較例2の回路接続材料も
同様に良好な接続信頼性が得られた。これらに対して、
比較例1は、硬化反応が不十分であるため接着状態が悪
く、初期の接続抵抗が高くなった。保存性を接続抵抗で
評価した結果,実施例1〜5では、30℃の恒温槽で3
0日間処理しない状態(初期)と処理した場合でほぼ同
等の接続結果が得られた。絶縁抵抗は,実施例1〜5に
おいて、1.0×109Ω以上の良好な絶縁性が得られ
絶縁性の低下は観察されなかった。流動性の測定結果、
実施例1は1.9であり、実施例2についても2.2で
あった。実施例1の回路接続材料の硬化後の25℃での
弾性率を測定したところ900MPaであった。実施例
1の立ち上がり温度は89℃、ピーク温度は107℃、
終了温度は148℃であった。実施例2の立ち上がり温
度は92℃、ピーク温度は106℃、終了温度は150
℃であった。これより、より低温で硬化することが示さ
れ、また、保存性の評価結果より保存性にも優れてい
る。また、接続抵抗の測定において、銅回路にSnメッ
キしたものとしないものを準備し、実施例1で作製した
回路接続材料を用い、実施例1と同様な条件でFPCに
仮接続し、1日放置後に本接続し、接続抵抗を測定した
ところ、Snメッキされた場合の2.2Ω(2層FP
C)、2.0Ω(3層FPC)に対し、Snメッキして
ない銅表面が露出したものではそれぞれ5Ω(2層FP
C)、4Ω(3層FPC)となった。
In any of the examples, the initial value of the adhesive strength of the two-layer FPC is about 800 to 1100 N / m, and even after the moisture resistance test, it is about 900 to 1200 N / m, and there is no significant decrease in the adhesive strength. showed that. Comparative Example 1
The curing reaction was insufficient, and Comparative Example 2 had a low adhesive strength of about 200 N / m because the silicone-modified polyimide resin was not used. In any of the examples, the initial value of the adhesive strength of the three-layer FPC is about 1200 to 1400 N / m, and even after the moisture resistance test is 1200 to 1400 N / m.
There was no significant decrease in degree and adhesive strength, indicating good adhesiveness. In Comparative Example 1, the curing reaction was insufficient, and in Comparative Example 2, the silicone-modified polyimide resin was not used.
The adhesive strength was as low as about 00 N / m. The circuit connection material obtained in Example 1 has a low initial connection resistance and a small increase in resistance after a high-temperature and high-humidity test in any of the two-layer FPC and the three-layer FPC, showing good connection reliability. Was. In addition, the circuit connection materials of Examples 2, 3, 4, 5, and Comparative Example 2 also had good connection reliability. For these,
In Comparative Example 1, the bonding state was poor because the curing reaction was insufficient, and the initial connection resistance was high. As a result of evaluating the storage stability by connection resistance, in Examples 1 to 5, 3
Almost the same connection results were obtained in the state where the processing was not performed for 0 days (initial) and when the processing was performed. As for the insulation resistance, in Examples 1 to 5, good insulation of 1.0 × 10 9 Ω or more was obtained, and no decrease in insulation was observed. Liquidity measurement results,
Example 1 was 1.9, and Example 2 was 2.2. The elastic modulus of the circuit connection material of Example 1 at 25 ° C. after curing was measured and found to be 900 MPa. The rising temperature of Example 1 was 89 ° C, the peak temperature was 107 ° C,
The end temperature was 148 ° C. Example 2 has a rising temperature of 92 ° C., a peak temperature of 106 ° C., and an end temperature of 150 ° C.
° C. This indicates that the composition is cured at a lower temperature, and that the storage stability is superior to the storage stability evaluation result. In the measurement of connection resistance, a copper circuit was prepared with and without Sn plating, and was temporarily connected to an FPC under the same conditions as in Example 1 using the circuit connection material prepared in Example 1. The main connection was made after standing, and the connection resistance was measured.
C) and 2.0 Ω (three-layer FPC), respectively, and 5 Ω (two-layer FP)
C) and 4Ω (three-layer FPC).

【0044】[0044]

【発明の効果】以上詳述したように本発明によれば、従
来のエポキシ樹脂系よりも低温速硬化性に優れかつ可使
時間を有し、回路腐食性が少ない電気・電子用の回路接
続材料、それを用いた回路板の製造方法、回路板の提供
が可能となる。
As described above in detail, according to the present invention, a circuit connection for electric and electronic use which has excellent low-temperature and fast-curing properties, has a long pot life, and has a low circuit corrosiveness, compared with the conventional epoxy resin system. A material, a method for manufacturing a circuit board using the same, and a circuit board can be provided.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H05K 3/32 H05K 3/32 B 3/36 3/36 A (72)発明者 藤縄 貢 茨城県下館市大字五所宮1150番地 日立化 成工業株式会社五所宮事業所内 (72)発明者 中澤 孝 茨城県下館市大字五所宮1150番地 日立化 成工業株式会社五所宮事業所内 (72)発明者 小島 和良 茨城県下館市大字五所宮1150番地 日立化 成工業株式会社五所宮事業所内 Fターム(参考) 4J040 EF002 EF222 EH031 EK032 FA292 KA03 KA16 LA09 MA10 NA20 5E319 AC01 BB11 CC61 CD25 GG09 GG11 5E344 AA01 AA22 BB02 BB04 CC21 CD06 CD14 DD06 EE11 5F044 LL07 NN20 5G301 DA05 DA10 DA29 DA42 DA51 DA59 DD03 ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H05K 3/32 H05K 3/32 B 3/36 3/36 A (72) Inventor Mitsugu Fujinawa Shimodate, Ibaraki 1150 Goshomiya, Gozamiya, Hitachi Chemical Co., Ltd. (72) Inventor Takashi Nakazawa Takashi Nakazawa 1150 Gozamiya, Oita, Shimodate, Ibaraki Pref. Goshomiya, Hitachi Chemical Co., Ltd. (72) Inventor Kazuyoshi Kojima, Ibaraki 1150 Goshomiya, Shimodate-shi F-term (reference) at Goshomiya Works, Hitachi Chemical Co., Ltd. 5F044 LL07 NN20 5G301 DA05 DA10 DA29 DA42 DA51 DA59 DD03

Claims (11)

【特許請求の範囲】[Claims] 【請求項1】 相対向する接続端子間に介在され、相対
向する接続端子を加圧し加圧方向の接続端子間を電気的
に接続する接続材料であって、(1)シリコン変成ポリ
イミド樹脂、(2)ラジカル重合性物質、(3)加熱に
より遊離ラジカルを発生する硬化剤を必須成分とし、
(1)シリコン変成ポリイミド樹脂 2〜75重量部、
(2)ラジカル重合性物質 30〜60重量部、(3)
加熱により遊離ラジカルを発生する硬化剤 0.1〜3
0重量部、(4)フィルム形成材0〜40重量部を含む
回路接続材料。
1. A connection material interposed between opposed connection terminals and pressurizing the opposed connection terminals to electrically connect the connection terminals in the pressure direction, (1) a silicon-modified polyimide resin, (2) a radical polymerizable substance, and (3) a curing agent that generates free radicals by heating as essential components,
(1) 2 to 75 parts by weight of silicone modified polyimide resin,
(2) 30-60 parts by weight of a radical polymerizable substance, (3)
Curing agent that generates free radicals upon heating 0.1-3
0 parts by weight, (4) a circuit connecting material containing 0 to 40 parts by weight of a film forming material.
【請求項2】 (1)、(2)、(3)、(4)の成分
とさらに(5)導電性粒子を必須成分とする請求項1に
記載の回路接続材料。
2. The circuit connection material according to claim 1, wherein the components (1), (2), (3) and (4) and (5) conductive particles are essential components.
【請求項3】 (3)加熱により遊離ラジカルを発生す
る硬化剤が、室温(25℃)常圧下で24時間の開放放
置後に20重量%以上の重量保持率を有する硬化剤であ
る請求項1または請求項2に記載の回路接続材料。
3. The curing agent which generates free radicals upon heating is a curing agent having a weight retention of 20% by weight or more after leaving open for 24 hours at room temperature (25 ° C.) and normal pressure. Or the circuit connection material according to claim 2.
【請求項4】 (4)フィルム形成材が、ポリウレタン
樹脂である請求項1ないし請求項3のいずれかに記載の
回路接続材料。
4. The circuit connecting material according to claim 1, wherein (4) the film forming material is a polyurethane resin.
【請求項5】 (2)ラジカル重合性物質が、ウレタン
アクリレートである請求項1ないし請求項4のいずれか
に記載の回路接続材料。
5. The circuit connection material according to claim 1, wherein (2) the radically polymerizable substance is urethane acrylate.
【請求項6】 さらに25℃での弾性率が0.1〜10
0MPaであるシリコーン微粒子を上記(1)、
(2)、(4)成分の合計100重量部に対し5〜20
0重量部含有する請求項1ないし請求項5のいずれかに
記載の回路接続材料。
6. An elastic modulus at 25 ° C. of 0.1 to 10
The silicone fine particles having a pressure of 0 MPa are mixed with the above (1),
5 to 20 based on a total of 100 parts by weight of the components (2) and (4)
The circuit connecting material according to any one of claims 1 to 5, which contains 0 parts by weight.
【請求項7】 第一の接続端子を有する第一の回路部材
と、第二の接続端子を有する第二の回路部材とを、第一
の接続端子と第二の接続端子を対向して配置し、対向配
置した第一の接続端子と第二の接続端子の間に請求項1
ないし請求項6のいずれかに記載の回路接続材料を介在
させ、加熱加圧して前記対向配置した第一の接続端子と
第二の接続端子を電気的に接続させる回路板の製造方
法。
7. A first circuit member having a first connection terminal and a second circuit member having a second connection terminal are arranged with the first connection terminal and the second connection terminal facing each other. And between the first connection terminal and the second connection terminal disposed opposite to each other.
A method for manufacturing a circuit board, wherein the circuit connection material according to any one of claims 6 to 6 is interposed, and the first connection terminal and the second connection terminal arranged opposite to each other are electrically connected by heating and pressing.
【請求項8】 少なくとも一方の接続端子の表面が金、
銀、白金族の金属から選ばれる少なくとも一種で構成さ
れる請求項7に記載の回路板の製造方法。
8. The surface of at least one of the connection terminals is gold,
The method for manufacturing a circuit board according to claim 7, wherein the circuit board is made of at least one selected from silver and platinum group metals.
【請求項9】 少なくとも一方の接続端子を支持する基
板が有機絶縁物質、ガラスから選ばれる少なくとも一種
で構成される請求項7または請求項8に記載の回路板の
製造方法。
9. The method for manufacturing a circuit board according to claim 7, wherein the substrate supporting at least one connection terminal is made of at least one selected from an organic insulating material and glass.
【請求項10】 少なくとも一方の回路部材表面が窒化
シリコン、シリコーン化合物、ポリイミド樹脂から選ば
れる少なくとも一種でコーティングもしくは付着してい
る請求項7ないし請求項9のいずれかに記載の回路板の
製造方法。
10. The method for manufacturing a circuit board according to claim 7, wherein at least one surface of the circuit member is coated or adhered with at least one selected from silicon nitride, a silicone compound, and a polyimide resin. .
【請求項11】 請求項7ないし請求項10のいずれか
に記載の回路板の製造方法で得られる回路板。
11. A circuit board obtained by the method for manufacturing a circuit board according to claim 7.
JP2000399825A 2000-12-28 2000-12-28 Circuit connection material, circuit board manufacturing method using the same, and circuit board Expired - Fee Related JP4590732B2 (en)

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