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JP2001308501A - Method for mounting electronic parts - Google Patents

Method for mounting electronic parts

Info

Publication number
JP2001308501A
JP2001308501A JP2000127403A JP2000127403A JP2001308501A JP 2001308501 A JP2001308501 A JP 2001308501A JP 2000127403 A JP2000127403 A JP 2000127403A JP 2000127403 A JP2000127403 A JP 2000127403A JP 2001308501 A JP2001308501 A JP 2001308501A
Authority
JP
Japan
Prior art keywords
electronic component
mounting
conductive adhesive
conductive
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000127403A
Other languages
Japanese (ja)
Inventor
Yukihiro Ishimaru
幸宏 石丸
Tsutomu Mitani
力 三谷
Hiroteru Takezawa
弘輝 竹沢
Takashi Kitae
孝史 北江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2000127403A priority Critical patent/JP2001308501A/en
Publication of JP2001308501A publication Critical patent/JP2001308501A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a method by which electronic parts can be mounted on the conductor electrode of a circuit board by using a conductive adhesive by performing electrical inspections before the adhesive is cured and, if necessary, the parts can be exchanged with another parts or remounted. SOLUTION: This method includes a step (S101) of applying a conductive adhesive to the conductor electrode, a step (S102) of mounting electronic parts on the conductor electrode by positioning the parts to the electrode, and a step (S103) of pressing the parts against the circuit board. The method also includes a step (S104) of inspecting continuity between the circuit board and electronic parts, and a step (S106) of completing the mounting of the parts by curing the conductive adhesive. When the result of the inspection is not good, the electronic parts are removed (S108) and the steps from (S101) to (S106) are repeated again.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電子部品の実装の
分野において、はんだに代えて、導電性接着剤を用いて
電子部品を回路基板に実装する方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of mounting an electronic component on a circuit board by using a conductive adhesive instead of solder in the field of electronic component mounting.

【0002】[0002]

【従来の技術】最近の環境問題への認識の高まりから、
エレクトロニクスにおける実装の分野では、はんだに含
まれる鉛に対する規制が行われようとしており、電子部
品の実装に鉛を用いない接合技術の確立が急務となって
いる。鉛フリー実装技術としては、主として鉛フリーは
んだおよび導電性接着剤が挙げられるが、接合部の柔軟
性、実装温度の低温化等のメリットが期待される導電性
接着剤が、より注目されている。
2. Description of the Related Art Recently, awareness of environmental issues has increased,
In the field of mounting in electronics, regulation of lead contained in solder is about to be enforced, and there is an urgent need to establish a joining technology that does not use lead for mounting electronic components. Lead-free mounting technology mainly includes lead-free solder and conductive adhesives. However, conductive adhesives, which are expected to have advantages such as flexibility of joints and lower mounting temperatures, are receiving more attention. .

【0003】従来の導電性接着剤は、一般的に、樹脂系
接着成分中に導電フィラを分散させたものであり、接着
剤を介在して電子部品の接続端子と回路基板の接続端子
を接続した後に樹脂を硬化させ、接着剤中の導電フィラ
同士の接触により接続部分の電気的接続を確保するもの
である。従って、接続部分が樹脂で接着されているた
め、熱や外力による変形に対して柔軟に対応し、接続部
分が合金であるはんだと比較して、接続部分に亀裂が発
生しにくいというメリットを有していることから、はん
だの代替材料として期待されている。
Conventional conductive adhesives are generally obtained by dispersing a conductive filler in a resin-based adhesive component, and connect the connection terminals of an electronic component and the connection terminals of a circuit board with the adhesive interposed therebetween. After that, the resin is cured, and the electrical connection of the connection portion is secured by the contact between the conductive fillers in the adhesive. Therefore, since the connection portion is bonded with a resin, it has a merit that it flexibly responds to deformation due to heat or external force, and that the connection portion is less likely to crack as compared with solder in which the connection portion is an alloy. Therefore, it is expected as a substitute material for solder.

【0004】[0004]

【発明が解決しようとする課題】従来のはんだを用いて
電子部品を実装する場合には、リフロー工程中にはんだ
が溶融し、その表面張力で電子部品が動くため、リフロ
ー工程で不良が発生する可能性もあり、部品実装工程が
完了した後に電気的な検査をする必要があった。不良が
発見された場合でも、部品を取り外すためにその部分の
みを加熱する装置が必要であり、また場合によっては、
はんだを取り除く必要がある。再度実装する場合も再加
熱が必要で、電子部品や回路基板に負荷がかかる。
When an electronic component is mounted using conventional solder, the solder melts during the reflow process and the electronic component moves due to its surface tension, so that a defect occurs in the reflow process. There is a possibility, and it is necessary to perform an electrical inspection after the component mounting process is completed. Even if a defect is found, a device that heats only that part is necessary to remove the part, and in some cases,
It is necessary to remove the solder. When re-mounting, re-heating is necessary, and a load is applied to the electronic components and the circuit board.

【0005】また、従来の導電性接着剤を用いた部品の
実装方法の場合、導電性接着剤を硬化させることで電気
的な接続を行うため、硬化させないと電気的な検査がで
きず、電気的な検査で不良が発生した場合には、電子部
品が実装された回路基板をリペアすることが困難であっ
た。つまり、導電性接着剤中の樹脂としては、接着強度
を確保するために熱硬化性樹脂が用いられることが多
く、熱硬化性樹脂では一度樹脂が硬化してしまうと、リ
ペアができるように電子部品を剥離することは困難であ
るからである。
In the case of a conventional mounting method of a component using a conductive adhesive, an electrical connection is made by hardening the conductive adhesive. When a failure occurs in a typical inspection, it is difficult to repair a circuit board on which electronic components are mounted. In other words, as the resin in the conductive adhesive, a thermosetting resin is often used in order to secure the adhesive strength, and once the thermosetting resin is cured, the resin is repaired so that it can be repaired. This is because it is difficult to peel off the part.

【0006】従って、従来の導電性接着剤を用いた部品
の実装方法は、図3に示す工程により行われていた。先
ず回路基板の導体電極上に、導電性接着剤を塗布し(S
301)、次に部品を位置決めして実装する(S30
2)。次に、導電性接着剤を硬化させ(S303)た
後、電気的な検査を行う(S304)。検査の結果、良
品であれば(S305)、実装完了となる(S30
6)。良品でなければ廃棄する(S307)。このよう
にリペアできないことが、製造工程における効率を下げ
る原因となっていた。
Therefore, a conventional method of mounting a component using a conductive adhesive has been performed by the steps shown in FIG. First, a conductive adhesive is applied on the conductor electrodes of the circuit board (S
301) Then, the components are positioned and mounted (S30).
2). Next, after the conductive adhesive is cured (S303), an electrical inspection is performed (S304). As a result of the inspection, if the product is non-defective (S305), the mounting is completed (S30).
6). If it is not good, it is discarded (S307). Such inability to repair has caused a reduction in efficiency in the manufacturing process.

【0007】また、熱可塑性樹脂が用いられる場合もあ
るが、接着強度を確保するのが難しく、アンダーフィル
などの樹脂で補強する必要がある場合が多い。
In some cases, a thermoplastic resin is used, but it is difficult to secure the adhesive strength, and it is often necessary to reinforce the resin with an underfill or the like.

【0008】そこで本発明は、導電性接着剤を用いて電
子部品を接続し、かつ電子部品のリペアが可能な状態で
検査できるような、電子部品を実装する方法を提供する
ことを目的とする。
Accordingly, an object of the present invention is to provide a method of mounting an electronic component so that the electronic component can be connected using a conductive adhesive and inspected in a state where the electronic component can be repaired. .

【0009】[0009]

【課題を解決するための手段】本発明の電子部品の実装
方法は、回路基板の導体電極上に導電性接着剤を用いて
電子部品を実装する方法であって、上記目的を達成する
ために、導体電極上に導電性接着剤を塗布する工程と、
電子部品を位置決めして導体電極上に実装する工程と、
電子部品を回路基板に対して加圧する工程と、回路基板
と電子部品の電気的な導通検査をする工程と、検査の結
果が良好な場合に、導電性接着剤を硬化して、電子部品
の実装を完了する工程とを備える。検査の結果が不良の
場合には、電子部品を取り外して交換し、上記の導電性
接着剤を塗布する工程から導通検査をする工程に至るま
での工程を繰り返す。
A method for mounting an electronic component according to the present invention is a method for mounting an electronic component on a conductive electrode of a circuit board using a conductive adhesive. Applying a conductive adhesive on the conductor electrodes,
Positioning the electronic component and mounting it on the conductor electrode;
A step of pressing the electronic component against the circuit board, a step of performing an electrical continuity test between the circuit board and the electronic component, and, if the result of the test is good, curing the conductive adhesive to form the electronic component. And a step of completing the mounting. If the result of the inspection is defective, the electronic component is removed and replaced, and the steps from the step of applying the conductive adhesive to the step of conducting the continuity test are repeated.

【0010】この方法によれば、硬化前であっても十分
な荷重をかけることで、硬化後とほぼ同等の電気的特性
が得られる。そこで、導電性接着剤を硬化させる前に検
査し、必要に応じて部品の交換や再実装を行うことがで
きる。導電性接着剤の未硬化の状態で電気的に検査し、
良品のみを硬化させることで、製品作製時の不良をなく
すことができる。導電性接着剤を用いて実装する場合に
は、導電性接着剤の硬化工程では電子部品が動くことは
ないので、電気的に接続が取れていれば硬化工程前に検
査できる。硬化前であれば導電性接着剤はペースト状態
なので、常温で容易に部品を取り除け、また導電性接着
剤も拭き取りなどで取り除くことができる。このように
部品の交換および部品の再実装を簡便に行うことができ
る。
According to this method, by applying a sufficient load even before curing, almost the same electrical characteristics as after curing can be obtained. Therefore, the inspection can be performed before the conductive adhesive is cured, and parts can be replaced or remounted as necessary. Inspect electrically in the uncured state of the conductive adhesive,
By curing only non-defective products, it is possible to eliminate defects during product production. In the case of mounting using a conductive adhesive, the electronic component does not move in the step of curing the conductive adhesive, so that the electronic component can be inspected before the curing step if it is electrically connected. Before curing, since the conductive adhesive is in a paste state, the components can be easily removed at room temperature, and the conductive adhesive can also be removed by wiping or the like. In this manner, replacement of components and re-mounting of components can be performed easily.

【0011】上記の方法において好ましくは、電子部品
を加圧する際に、電子部品と回路基板が接する部分の荷
重を、0.2MPa以上とする。それにより、導電性接
着剤を硬化させる前に検査可能な、良好な電気的特性を
発揮させることができる。
In the above method, preferably, when the electronic component is pressurized, a load at a portion where the electronic component and the circuit board are in contact with each other is set to 0.2 MPa or more. Thereby, it is possible to exhibit good electrical characteristics that can be inspected before the conductive adhesive is cured.

【0012】上記の方法において、電子部品を加圧する
際に導電性接着剤が硬化する温度以下で加熱してもよ
い。温度を上げることで導電性接着剤の粘度を下げ、低
い荷重でも検査可能な電気的特性を発揮させることがで
きる。なお、電子部品を加圧する際に加熱することなく
荷重をかけるのみであっても、検査可能な電気的特性を
発揮させることは可能である。
In the above method, the electronic component may be heated at a temperature lower than a temperature at which the conductive adhesive is cured when the electronic component is pressed. By raising the temperature, the viscosity of the conductive adhesive can be reduced, and electrical characteristics that can be inspected even with a low load can be exhibited. It should be noted that even when a load is simply applied without heating the electronic component when heating it, it is possible to exhibit electrical characteristics that can be inspected.

【0013】上記の方法において好ましくは、電子部品
を加圧する際に振動を与える。荷重と振動により検査可
能な電気的特性をより好適に発揮させることができる。
In the above method, preferably, vibration is applied when the electronic component is pressed. Electrical characteristics that can be inspected by load and vibration can be exhibited more suitably.

【0014】上記の方法において、位置決めして電子部
品を実装する工程と、電子部品を加圧する工程とを同時
に行うことができる。それにより、製造工程の短縮がで
き、生産性の向上が可能となる。
In the above method, the step of positioning and mounting the electronic component and the step of pressing the electronic component can be performed simultaneously. Thereby, the manufacturing process can be shortened, and the productivity can be improved.

【0015】上記の方法において好ましくは、導電性接
着剤における導電フィラの含有量を、85wt%以下と
する。本発明の方法においては、荷重により導電性を発
揮させため、導電フィラの量は少なくともよい。それに
より、導電性接着剤中の樹脂の量を相対的に増やせるた
め、電子部品の接着強度を上げることができる。導電フ
ィラの含有量が減っていくにつれて抵抗値は上がるが、
導電フィラをまったく含有しない場合でも、電子部品の
電極と導体電極が荷重により直接接するため、硬化前で
も導通を発現させることができる。
In the above method, preferably, the content of the conductive filler in the conductive adhesive is 85 wt% or less. In the method of the present invention, the amount of the conductive filler is at least good in order to exhibit conductivity by a load. Thereby, since the amount of the resin in the conductive adhesive can be relatively increased, the adhesive strength of the electronic component can be increased. As the content of the conductive filler decreases, the resistance increases,
Even when the conductive filler is not contained at all, the electrode of the electronic component and the conductor electrode are in direct contact with each other due to the load, so that conduction can be exhibited even before curing.

【0016】上記の方法において好ましくは、導電性接
着剤が、導電フィラとして、少なくとも球状のものとフ
レーク状のものを同時に含む構成とする。球状のみの場
合やフレーク状のみの場合と比較して、低い電気抵抗を
得られる。
In the above method, preferably, the conductive adhesive is configured to include at least a spherical filler and a flake-like conductive filler at the same time. A lower electric resistance can be obtained as compared with the case of only a spherical shape or the case of only a flake shape.

【0017】上記の方法において好ましくは、導電性接
着剤に用いられる樹脂を熱硬化性樹脂とする。それによ
り、検査可能な電気的特性と硬化後の十分な電子部品の
接着強度が得られる。
In the above method, preferably, the resin used for the conductive adhesive is a thermosetting resin. Thereby, testable electrical characteristics and sufficient adhesive strength of the electronic component after curing are obtained.

【0018】[0018]

【発明の実施の形態】(実施の形態1)図1は、本発明
の実施の形態1における電子部品の実装方法の工程を示
す。先ず回路基板の導体電極上に、導電性接着剤を塗布
し(S101)、次に部品を位置決めして実装する(S
102)。次に部品を加圧し(S103)、その状態で
電気的な検査を行う(S104)。検査の結果、良品で
あれば(S105)、導電性接着剤を加熱して硬化させ
(S106)、実装完了となる(S107)。検査の結
果、良品でなければ(S105)、部品を取り外して洗
浄し(S108)、導電性接着剤を塗布する工程(S1
01)を繰り返す。このように、導電性接着剤の未硬化
の状態で電気的に検査し、良品のみを硬化させること
で、製品作製時の不良をなくすことができる。
(Embodiment 1) FIG. 1 shows steps of an electronic component mounting method according to Embodiment 1 of the present invention. First, a conductive adhesive is applied on the conductor electrodes of the circuit board (S101), and the components are positioned and mounted (S101).
102). Next, the component is pressurized (S103), and an electrical inspection is performed in that state (S104). As a result of the inspection, if the product is non-defective (S105), the conductive adhesive is cured by heating (S106), and the mounting is completed (S107). As a result of the inspection, if it is not a good product (S105), the component is removed and washed (S108), and a step of applying a conductive adhesive (S1).
01) is repeated. As described above, by electrically inspecting the conductive adhesive in an uncured state and curing only non-defective products, it is possible to eliminate defects at the time of manufacturing a product.

【0019】次に、本実施の形態における電子部品の実
装方法について、図2を参照してより詳細に説明する。
Next, a method for mounting an electronic component according to the present embodiment will be described in more detail with reference to FIG.

【0020】まず導電性接着剤としては、銀の導電フィ
ラ(球状とフレーク状のものが1:1)を80wt%、
及び熱硬化性樹脂のエポキシ樹脂を含むものを用意し
た。そして図2(a)に示すように、回路基板として、
銅箔で回路パターンが形成されたガラスエポキシ基板1
を用意した。ガラスエポキシ基板1上に形成された回路
パターンは、導体電極2、及び測定用パッド3を含む。
First, as the conductive adhesive, a conductive filler of silver (1: 1 spherical and flake-like) is 80 wt%.
And a thermosetting resin containing an epoxy resin. Then, as shown in FIG. 2A, as a circuit board,
Glass epoxy board 1 with circuit pattern formed of copper foil
Was prepared. The circuit pattern formed on the glass epoxy substrate 1 includes a conductor electrode 2 and a measurement pad 3.

【0021】次に図2(b)に示すように、導体電極2
上に導電性接着剤4をディスペンスにより塗布し、図2
(c)に示すように、チップ抵抗5(ここでは3216
のショートチップ)を実装した。次に図2(d)に示す
ように、加圧用治具6を用いて、チップ抵抗5を加圧し
た。チップ抵抗5の加圧面は、3.2mm×1.6mm
の大きさである。この時の荷重に対する、硬化前及び硬
化後の抵抗値を(表1)に示す。なお、同一荷重につい
て、加圧を行っている際に50℃の加熱した場合と加熱
しない場合とについて、各々調べた。
Next, as shown in FIG.
The conductive adhesive 4 is applied by dispensing on the top, and FIG.
As shown in (c), the chip resistor 5 (here, 3216
Short chip). Next, as shown in FIG. 2D, the chip resistor 5 was pressed using the pressing jig 6. The pressing surface of the chip resistor 5 is 3.2 mm x 1.6 mm
Is the size of The resistance values before and after curing with respect to the load at this time are shown in (Table 1). In addition, about the same load, it investigated about the case where it heats at 50 degreeC during pressurization, and the case where it does not heat, respectively.

【0022】(表1)の実施例より、荷重を0.2MP
a以上とすることで、硬化前でも十分に低い抵抗値を示
すことがわかる。また加圧する際に加熱を行わなくても
十分な抵抗値を示す。このようにして、導電性接着剤を
硬化させる前に電気的検査を行うことができ、容易に電
子部品の交換が可能である。
According to the embodiment shown in Table 1, the load was set to 0.2MP.
It can be seen that a value of a or more shows a sufficiently low resistance value even before curing. In addition, it shows a sufficient resistance value without heating when pressing. In this manner, an electrical inspection can be performed before the conductive adhesive is cured, and the electronic component can be easily replaced.

【0023】[0023]

【表1】 [Table 1]

【0024】(実施の形態2)実施の形態1と同様に、
チップ抵抗を実装した。次に、チップ抵抗を加圧する際
に、振動を与えながら、抵抗値の測定を行った。その結
果を、(表2)に示す。与えた振動は、周波数50H
z、振幅2ミクロンとした。
(Embodiment 2) As in Embodiment 1,
A chip resistor was mounted. Next, when pressurizing the chip resistor, the resistance value was measured while applying vibration. The results are shown in (Table 2). The applied vibration has a frequency of 50H
z, amplitude 2 microns.

【0025】(表2)から、振動を加えることで、硬化
前でも十分に低い抵抗値が得られることがわかる。振動
としては数十Hz程度の周波数でもよく、また20kH
z以上の超音波振動でもよい。
From Table 2, it can be seen that by applying vibration, a sufficiently low resistance value can be obtained even before curing. The vibration may have a frequency of about several tens of Hz, and a frequency of 20 kHz.
Ultrasonic vibration of z or more may be used.

【0026】[0026]

【表2】 [Table 2]

【0027】(実施の形態3)導電性接着剤には、実施
の形態1と同様に、導電フィラとして銀(球状とフレー
ク状のものが1:1)を用い、樹脂として熱硬化性樹脂
のエポキシ樹脂を用いた。但し、導電フィラの含有量を
70wt%から90wt%まで変えたものを用意した。
各導電性接着剤を用いて、せん断強度を比較した結果を
(表3)に示す。せん断強度は、チップ部品の長手部分
に水平垂直にせん断力を加えた時に、破断に至った時の
せん断力を表す。
(Embodiment 3) As in Embodiment 1, silver (spherical and flake-like 1: 1) is used as a conductive filler and a thermosetting resin is used as a resin. Epoxy resin was used. However, a conductive filler whose content was changed from 70 wt% to 90 wt% was prepared.
The results of comparing the shear strengths with each conductive adhesive are shown in (Table 3). The shear strength indicates a shear force when a break is reached when a shear force is applied horizontally and vertically to a longitudinal portion of the chip component.

【0028】[0028]

【表3】 [Table 3]

【0029】導電フィラの含有量を増やすにつれて、導
電性接着剤中の樹脂成分の体積が減っていくため、せん
断強度が小さくなっていく。導電フィラを85wt%以
上含有させると樹脂の体積量が減り、90wt%では体
積比で50%程度になってしまう。(表3)より、導電
フィラが85wt%以下であれば、せん断強度として
3.8kgを保持でき、実用的に問題がないことが判
る。
As the content of the conductive filler increases, the volume of the resin component in the conductive adhesive decreases, so that the shear strength decreases. When the conductive filler is contained in an amount of 85 wt% or more, the volume of the resin decreases, and when the conductive filler is 90 wt%, the volume ratio becomes about 50%. From Table 3, it can be seen that when the conductive filler is 85 wt% or less, the shear strength can be maintained at 3.8 kg, and there is no practical problem.

【0030】(実施の形態4)導電性接着剤の樹脂とし
て、熱硬化性樹脂のエポキシ樹脂を用意した。導電フィ
ラとして銀を80wt%含有させたが、その時、球状粉
とフレーク状粉との配合比を変えた。配合比と抵抗値と
の関係について、(表4)に示した。
(Embodiment 4) As a resin of the conductive adhesive, an epoxy resin of a thermosetting resin was prepared. Although 80 wt% of silver was contained as the conductive filler, the mixing ratio of the spherical powder and the flake powder was changed at that time. Table 4 shows the relationship between the compounding ratio and the resistance value.

【0031】[0031]

【表4】 [Table 4]

【0032】球状粉とフレーク状粉を両方含有すること
で、抵抗値が下がることがわかる。フレーク状粉のみの
場合のほうが導電フィラの表面積が増え、導電性接着剤
としての体積抵抗は下がるが、球状粉をあわせて含有す
ることで部品や基板との接触抵抗が下がり、より低い抵
抗値が得られる。球状粉の配合比が25〜75wt%で
あれば実用上好ましい抵抗値が得られるが、含有割合と
しては1:1に近い割合がより好ましい。
It can be seen that the resistance value is reduced by containing both the spherical powder and the flake powder. In the case of flake-like powder alone, the surface area of the conductive filler increases and the volume resistance of the conductive adhesive decreases, but the contact resistance with components and substrates decreases by including the spherical powder together, resulting in a lower resistance value. Is obtained. If the compounding ratio of the spherical powder is 25 to 75 wt%, a practically preferable resistance value can be obtained, but the content ratio is more preferably close to 1: 1.

【0033】なお、以上に記した実施の形態では、電子
部品としてチップ抵抗を用いて説明したが、本発明は、
ベアICチップやその他の電子部品にも適応できること
は言うまでもない。
In the embodiment described above, a chip resistor has been described as an electronic component.
Needless to say, it can be applied to a bare IC chip and other electronic components.

【0034】[0034]

【発明の効果】本発明によれば、硬化前であっても十分
な荷重をかけることで硬化後とほぼ同等の電気的特性が
得られ、導電性接着剤の未硬化の状態で電気的な検査す
ることができる。導電性接着剤を硬化させる前に検査
し、必要に応じて部品の交換や再実装を行うことがで
き、良品のみを硬化させることで製品作製時の不良をな
くすことができる。
According to the present invention, by applying a sufficient load even before curing, almost the same electrical characteristics as those after curing can be obtained, and the electrical conductivity of the conductive adhesive in an uncured state is obtained. Can be inspected. Inspection can be performed before the conductive adhesive is cured, and parts can be replaced or re-mounted if necessary. By curing only non-defective products, it is possible to eliminate defects during product production.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施形態における電子部品の実装方法
を示す工程図
FIG. 1 is a process chart showing a mounting method of an electronic component according to an embodiment of the present invention.

【図2】本発明の実施形態における電子部品の実装方法
を工程毎に示し、(a)〜(c)は平面図、(d)は拡
大断面図
FIGS. 2A to 2C show a mounting method of an electronic component according to an embodiment of the present invention for each step, wherein FIGS. 2A to 2C are plan views and FIG.

【図3】従来の導電性接着剤を用いた電子部品の実装方
法を示す工程図
FIG. 3 is a process diagram showing a method for mounting an electronic component using a conventional conductive adhesive.

【符号の説明】[Explanation of symbols]

1 ガラスエポキシ基板 2 導体電極 3 測定用パッド 4 導電性接着剤 5 チップ抵抗 6 加圧用ジグ DESCRIPTION OF SYMBOLS 1 Glass epoxy board 2 Conductor electrode 3 Measurement pad 4 Conductive adhesive 5 Chip resistance 6 Jig for press

───────────────────────────────────────────────────── フロントページの続き (72)発明者 竹沢 弘輝 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 北江 孝史 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 Fターム(参考) 5E319 AA03 AA07 BB11 CC61 CD04 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Hiroki Takezawa 1006 Kazuma Kadoma, Kadoma, Osaka Prefecture Inside Matsushita Electric Industrial Co., Ltd. (72) Takashi Kitae 1006 Kadoma Kadoma, Kadoma City, Osaka Matsushita Electric Industrial Co. Terms (reference) 5E319 AA03 AA07 BB11 CC61 CD04

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 回路基板の導体電極上に導電性接着剤を
用いて電子部品を実装する方法において、前記導体電極
上に前記導電性接着剤を塗布する工程と、前記電子部品
を位置決めして前記導体電極上に実装する工程と、前記
電子部品を前記回路基板に対して加圧する工程と、前記
回路基板と前記電子部品の電気的な導通検査をする工程
と、前記検査の結果が良好な場合に、前記導電性接着剤
を硬化して、前記電子部品の実装を完了する工程とを備
え、前記検査の結果が不良の場合には、前記電子部品を
取り外して交換し、前記導電性接着剤を塗布する工程か
ら前記導通検査をする工程に至るまでの工程を繰り返す
ことを特徴とする電子部品の実装方法。
1. A method of mounting an electronic component on a conductive electrode of a circuit board using a conductive adhesive, the method comprising: applying the conductive adhesive on the conductive electrode; and positioning the electronic component. A step of mounting on the conductor electrode, a step of pressing the electronic component against the circuit board, a step of performing an electrical continuity test between the circuit board and the electronic component, and a result of the test being good. Curing the conductive adhesive, and completing the mounting of the electronic component.If the result of the inspection is defective, the electronic component is removed and replaced, and the conductive adhesive is removed. A method of mounting an electronic component, comprising repeating a process from a step of applying an agent to a step of performing the conduction test.
【請求項2】 電子部品を加圧する際に、電子部品と回
路基板が接する部分の荷重を、0.2MPa以上とする
ことを特徴とする請求項1記載の電子部品の実装方法。
2. The method for mounting an electronic component according to claim 1, wherein, when pressing the electronic component, a load at a portion where the electronic component and the circuit board are in contact with each other is set to 0.2 MPa or more.
【請求項3】 電子部品を加圧する際に、導電性接着剤
が硬化する温度以下で加熱することを特徴とする請求項
1または2記載の電子部品の実装方法。
3. The method for mounting an electronic component according to claim 1, wherein the pressing of the electronic component is performed at a temperature lower than a temperature at which the conductive adhesive cures.
【請求項4】 電子部品を加圧する際に振動を与えるこ
とを特徴とする請求項1から4のいずれか1項に記載の
電子部品の実装方法。
4. The method for mounting an electronic component according to claim 1, wherein vibration is applied when the electronic component is pressurized.
【請求項5】 位置決めして電子部品を実装する工程
と、前記電子部品を加圧する工程とを同時に行うことを
特徴とする請求項1記載の電子部品の実装方法。
5. The method according to claim 1, wherein the step of positioning and mounting the electronic component and the step of pressing the electronic component are performed simultaneously.
【請求項6】 導電性接着剤における導電フィラの含有
量が、85wt%以下であることを特徴とする請求項1
から5のいずれか1項に記載の電子部品の実装方法。
6. The conductive filler according to claim 1, wherein the content of the conductive filler in the conductive adhesive is 85 wt% or less.
6. The method for mounting an electronic component according to any one of claims 1 to 5.
【請求項7】 導電性接着剤が、導電フィラとして、少
なくとも球状のものとフレーク状のものを同時に含むこ
とを特徴とする請求項1から6のいずれか1項に記載の
電子部品の実装方法。
7. The electronic component mounting method according to claim 1, wherein the conductive adhesive includes at least a spherical filler and a flake-like conductive filler at the same time. .
【請求項8】 導電性接着剤に用いられる樹脂が熱硬化
性樹脂であることを特徴とする請求項1から7のいずれ
か1項に記載の電子部品の実装方法。
8. The electronic component mounting method according to claim 1, wherein the resin used for the conductive adhesive is a thermosetting resin.
JP2000127403A 2000-04-27 2000-04-27 Method for mounting electronic parts Pending JP2001308501A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000127403A JP2001308501A (en) 2000-04-27 2000-04-27 Method for mounting electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000127403A JP2001308501A (en) 2000-04-27 2000-04-27 Method for mounting electronic parts

Publications (1)

Publication Number Publication Date
JP2001308501A true JP2001308501A (en) 2001-11-02

Family

ID=18637000

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000127403A Pending JP2001308501A (en) 2000-04-27 2000-04-27 Method for mounting electronic parts

Country Status (1)

Country Link
JP (1) JP2001308501A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8113635B2 (en) 2007-01-16 2012-02-14 Brother Kogyo Kabushiki Kaisha Liquid discharge apparatus and check method of the same
JP2021100084A (en) * 2019-12-24 2021-07-01 株式会社鈴木 Manufacturing method and manufacturing apparatus of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8113635B2 (en) 2007-01-16 2012-02-14 Brother Kogyo Kabushiki Kaisha Liquid discharge apparatus and check method of the same
JP2021100084A (en) * 2019-12-24 2021-07-01 株式会社鈴木 Manufacturing method and manufacturing apparatus of semiconductor device

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