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ITMI912849A0 - REDUNDANCY DEVICE FOR REPLACING A DEFECTIVE NORMAL CELL WITH A SPARE CELL IN A SEMICONDUCTOR MEMORY DEVICE - Google Patents

REDUNDANCY DEVICE FOR REPLACING A DEFECTIVE NORMAL CELL WITH A SPARE CELL IN A SEMICONDUCTOR MEMORY DEVICE

Info

Publication number
ITMI912849A0
ITMI912849A0 IT91MI2849A ITMI912849A ITMI912849A0 IT MI912849 A0 ITMI912849 A0 IT MI912849A0 IT 91MI2849 A IT91MI2849 A IT 91MI2849A IT MI912849 A ITMI912849 A IT MI912849A IT MI912849 A0 ITMI912849 A0 IT MI912849A0
Authority
IT
Italy
Prior art keywords
cell
replacing
semiconductor memory
memory device
defective normal
Prior art date
Application number
IT91MI2849A
Other languages
Italian (it)
Inventor
Hyeon-Soon Jang
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of ITMI912849A0 publication Critical patent/ITMI912849A0/en
Publication of ITMI912849A1 publication Critical patent/ITMI912849A1/en
Application granted granted Critical
Publication of IT1251445B publication Critical patent/IT1251445B/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
ITMI912849A 1991-07-26 1991-10-25 REDUNDANCY DEVICE TO REPLACE A DEFECTIVE NORMAL CELL WITH A RESERVE CELL IN A SEMICONDUCTOR MEMORY DEVICE IT1251445B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910012919A KR930003164A (en) 1991-07-26 1991-07-26 Semiconductor Memory Redundancy Device

Publications (3)

Publication Number Publication Date
ITMI912849A0 true ITMI912849A0 (en) 1991-10-25
ITMI912849A1 ITMI912849A1 (en) 1993-04-25
IT1251445B IT1251445B (en) 1995-05-09

Family

ID=19317875

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI912849A IT1251445B (en) 1991-07-26 1991-10-25 REDUNDANCY DEVICE TO REPLACE A DEFECTIVE NORMAL CELL WITH A RESERVE CELL IN A SEMICONDUCTOR MEMORY DEVICE

Country Status (6)

Country Link
JP (1) JPH0528794A (en)
KR (1) KR930003164A (en)
DE (1) DE4132298A1 (en)
FR (1) FR2679692A1 (en)
GB (1) GB2258066A (en)
IT (1) IT1251445B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR950000275B1 (en) * 1992-05-06 1995-01-12 삼성전자 주식회사 Column Redundancy of Semiconductor Memory Devices
JPH08153399A (en) * 1994-11-29 1996-06-11 Nec Corp Semiconductor memory
KR0145223B1 (en) * 1995-04-24 1998-08-17 김광호 Semiconductor Memory Device with Redundancy Function
JP3301398B2 (en) 1998-11-26 2002-07-15 日本電気株式会社 Semiconductor storage device
JP4012474B2 (en) 2003-02-18 2007-11-21 富士通株式会社 Shift redundancy circuit, control method for shift redundancy circuit, and semiconductor memory device
JP2012174297A (en) 2011-02-18 2012-09-10 Elpida Memory Inc Semiconductor device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4639897A (en) * 1983-08-31 1987-01-27 Rca Corporation Priority encoded spare element decoder
KR910005601B1 (en) * 1989-05-24 1991-07-31 삼성전자주식회사 Semiconductor memory device having redundunt block
US5126973A (en) * 1990-02-14 1992-06-30 Texas Instruments Incorporated Redundancy scheme for eliminating defects in a memory device

Also Published As

Publication number Publication date
ITMI912849A1 (en) 1993-04-25
JPH0528794A (en) 1993-02-05
IT1251445B (en) 1995-05-09
DE4132298A1 (en) 1993-01-28
KR930003164A (en) 1993-02-24
GB2258066A (en) 1993-01-27
GB9123485D0 (en) 1991-12-18
FR2679692A1 (en) 1993-01-29

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Legal Events

Date Code Title Description
0001 Granted