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IT1170173B - Circuito di controllo isolato otticamente e verificabile - Google Patents

Circuito di controllo isolato otticamente e verificabile

Info

Publication number
IT1170173B
IT1170173B IT8322193A IT2219383A IT1170173B IT 1170173 B IT1170173 B IT 1170173B IT 8322193 A IT8322193 A IT 8322193A IT 2219383 A IT2219383 A IT 2219383A IT 1170173 B IT1170173 B IT 1170173B
Authority
IT
Italy
Prior art keywords
control circuit
optically verifiable
verifiable control
optically
circuit
Prior art date
Application number
IT8322193A
Other languages
English (en)
Other versions
IT8322193A0 (it
Inventor
Peter Wsewolod Holoyda
Dennis Wayne Hollenbeck
William David Hill
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of IT8322193A0 publication Critical patent/IT8322193A0/it
Application granted granted Critical
Publication of IT1170173B publication Critical patent/IT1170173B/it

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B11/00—Automatic controllers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Selective Calling Equipment (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
  • Electronic Switches (AREA)
IT8322193A 1982-07-27 1983-07-22 Circuito di controllo isolato otticamente e verificabile IT1170173B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/402,368 US4498196A (en) 1982-07-27 1982-07-27 Testable optically isolated control circuit

Publications (2)

Publication Number Publication Date
IT8322193A0 IT8322193A0 (it) 1983-07-22
IT1170173B true IT1170173B (it) 1987-06-03

Family

ID=23591592

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8322193A IT1170173B (it) 1982-07-27 1983-07-22 Circuito di controllo isolato otticamente e verificabile

Country Status (7)

Country Link
US (1) US4498196A (it)
JP (1) JPS5951694A (it)
KR (1) KR840005568A (it)
DE (1) DE3322914A1 (it)
ES (1) ES8502556A1 (it)
IT (1) IT1170173B (it)
SE (1) SE8304113L (it)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3312777A1 (de) * 1983-04-09 1984-10-11 Sistemco N.V., Willemstad, Curacao, Niederländische Antillen Steueranordnung fuer ein kraftbetriebenes umlaufregal
DE8519788U1 (de) * 1985-07-09 1985-10-31 Albatron Elektronik GmbH, 2000 Hamburg Vorrichtung zur Verbindung der Schnittstellen insbesondere des Typs V24 selbständiger Schaltwerke von Datenverarbeitungsanlagen
US4885766A (en) * 1986-01-31 1989-12-05 Sharp Kabushiki Kaisha Remote control device using a telephone line
AU5949790A (en) * 1989-06-23 1991-01-17 At & E Corporation. Optoelectronic test apparatus for communicating with a receiver
IT1286293B1 (it) * 1996-04-02 1998-07-08 Cselt Centro Studi Lab Telecom Modulo costruttivo di apparecchiatura elettronica per telecomunicazioni con interfaccia verso un sistema di prova e diagnosi
US6750463B1 (en) * 2000-02-29 2004-06-15 Hill-Rom Services, Inc. Optical isolation apparatus and method
DE10055103A1 (de) * 2000-11-07 2002-05-08 Daimler Chrysler Ag Verfahren zum Betrieb eines Datennetzes
JP2013152176A (ja) * 2012-01-26 2013-08-08 Hitachi-Ge Nuclear Energy Ltd 離隔位置ｉｃタグ認識装置及び離隔位置ｉｃタグ認識方法
JP6516419B2 (ja) * 2014-07-24 2019-05-22 三菱電機株式会社 プラント制御システム
US10685800B2 (en) 2018-06-18 2020-06-16 Edward W. Anderson Testable sealed relay and self-diagnosing relay

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4871823A (it) * 1971-12-27 1973-09-28
US3924178A (en) * 1974-07-03 1975-12-02 Deutsch Relays Inc Relay tester
JPS5243089A (en) * 1975-10-03 1977-04-04 Hitachi Ltd Trouble diagnosis process in the remote supervisory control system
JPS5920300B2 (ja) * 1979-02-28 1984-05-12 富士通株式会社 光通信システム
JPS5652947A (en) * 1979-10-05 1981-05-12 Hitachi Ltd Signal transmitter and receiver
JPS57176422A (en) * 1981-04-23 1982-10-29 Hitachi Ltd Remote monitor and control device

Also Published As

Publication number Publication date
SE8304113L (sv) 1984-01-28
DE3322914A1 (de) 1984-02-09
JPS5951694A (ja) 1984-03-26
SE8304113D0 (sv) 1983-07-22
ES523595A0 (es) 1985-01-01
IT8322193A0 (it) 1983-07-22
KR840005568A (ko) 1984-11-14
US4498196A (en) 1985-02-05
ES8502556A1 (es) 1985-01-01

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