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IT1010157B - Sistema di prova dinamica per alimentatori elettronici - Google Patents

Sistema di prova dinamica per alimentatori elettronici

Info

Publication number
IT1010157B
IT1010157B IT21988/74A IT2198874A IT1010157B IT 1010157 B IT1010157 B IT 1010157B IT 21988/74 A IT21988/74 A IT 21988/74A IT 2198874 A IT2198874 A IT 2198874A IT 1010157 B IT1010157 B IT 1010157B
Authority
IT
Italy
Prior art keywords
test system
dynamic test
electronic ballasts
ballasts
electronic
Prior art date
Application number
IT21988/74A
Other languages
English (en)
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of IT1010157B publication Critical patent/IT1010157B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Sources (AREA)
  • Stand-By Power Supply Arrangements (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Sewing Machines And Sewing (AREA)
IT21988/74A 1973-06-25 1974-04-29 Sistema di prova dinamica per alimentatori elettronici IT1010157B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US373539A US3867618A (en) 1973-06-25 1973-06-25 Dynamic power supply test system

Publications (1)

Publication Number Publication Date
IT1010157B true IT1010157B (it) 1977-01-10

Family

ID=23472812

Family Applications (1)

Application Number Title Priority Date Filing Date
IT21988/74A IT1010157B (it) 1973-06-25 1974-04-29 Sistema di prova dinamica per alimentatori elettronici

Country Status (6)

Country Link
US (1) US3867618A (it)
JP (1) JPS5247294B2 (it)
DE (1) DE2418650C2 (it)
FR (1) FR2234606B1 (it)
GB (1) GB1452193A (it)
IT (1) IT1010157B (it)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2458736C2 (de) * 1974-12-12 1981-09-17 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und Anordnung zur Überwachung von Stromversorgungsanlagen
FR2310024A1 (fr) * 1975-04-30 1976-11-26 Honeywell Bull Soc Ind Equipement de controle d'alimentations en courant continu
US4233682A (en) * 1978-06-15 1980-11-11 Sperry Corporation Fault detection and isolation system
US4255748A (en) * 1979-02-12 1981-03-10 Automation Systems, Inc. Bus fault detector
JPS57197766A (en) * 1981-05-30 1982-12-04 Matsushita Electric Works Ltd Cord connector with switch
US4747057A (en) * 1985-03-12 1988-05-24 Pitney Bowes Inc. Electronic postage meter having power up and power down protection circuitry
US4701856A (en) * 1985-03-12 1987-10-20 Pitney Bowes Inc. Reset delay circuit for an electronic postage meter
FR2603112B1 (fr) * 1986-08-19 1988-11-10 Sautel Pascale Procede et dispositif de surveillance de l'alimentation en courant continu de circuits electriques et/ou electroniques
US5208530A (en) * 1986-09-19 1993-05-04 Actel Corporation Testability architecture and techniques for programmable interconnect architecture
US5265099A (en) * 1991-02-28 1993-11-23 Feinstein David Y Method for heating dynamic memory units whereby
US7353410B2 (en) 2005-01-11 2008-04-01 International Business Machines Corporation Method, system and calibration technique for power measurement and management over multiple time frames
US7349813B2 (en) * 2006-05-16 2008-03-25 Dresser, Inc. Fault tolerant power system architecture for fluid flow measurement systems
US20090035121A1 (en) * 2007-07-31 2009-02-05 Dresser, Inc. Fluid Flow Modulation and Measurement
US8958702B2 (en) 2011-03-17 2015-02-17 Fujitsu Limited System and method for reducing interference of a polarization multiplexed signal
US10191121B2 (en) * 2017-05-31 2019-01-29 Quanta Computer Inc. System and method for voltage regulator self-burn-in test
DE102019200333A1 (de) * 2019-01-14 2020-07-16 Phoenix Contact Gmbh & Co. Kg Mess-System zur Erfassung von Störungen auf Leitungen eines Gerätes oder einer Anlage

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564528A (en) * 1966-08-22 1971-02-16 Ex Cell O Corp Electronic control circuit
US3706007A (en) * 1971-03-23 1972-12-12 Yung Chun Wu Overload and shock protective device
US3715573A (en) * 1971-04-14 1973-02-06 Ibm Failure activity determination technique in fault simulation
US3745316A (en) * 1971-12-13 1973-07-10 Elliott Bros Computer checking system
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system

Also Published As

Publication number Publication date
DE2418650A1 (de) 1975-01-16
GB1452193A (en) 1976-10-13
JPS5247294B2 (it) 1977-12-01
FR2234606A1 (it) 1975-01-17
US3867618A (en) 1975-02-18
DE2418650C2 (de) 1982-04-08
JPS5023950A (it) 1975-03-14
FR2234606B1 (it) 1976-06-25

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