GB932799A - Improvements in or relating to surface roughness measuring instruments - Google Patents
Improvements in or relating to surface roughness measuring instrumentsInfo
- Publication number
- GB932799A GB932799A GB4171159A GB4171159A GB932799A GB 932799 A GB932799 A GB 932799A GB 4171159 A GB4171159 A GB 4171159A GB 4171159 A GB4171159 A GB 4171159A GB 932799 A GB932799 A GB 932799A
- Authority
- GB
- United Kingdom
- Prior art keywords
- tracer
- tracers
- roughness
- integrating
- dec
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B13/00—Measuring arrangements characterised by the use of fluids
- G01B13/22—Measuring arrangements characterised by the use of fluids for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
932,799. Roughness gauges. H. W. E. VAN GRODEK, and J. HASING. Dec. 8, 1959 [Dec. 13, 1958], No. 41711/59. Class 40 (1). [Also in Groups XIX and XL (b)] A tracer system for determining geometrical surface criteria of waviness and roughness on a workpiece surface, comprises at least two tracer means T1, T2 (Fig. 6), with ends of different radii and independently axially movable towards and away from the surface, a rail G for guiding longitudinal displacement of the means T1, T2, a transmitter sensitive to axial displacement of each means T1, T2 controlling integrating or recording apparatus and a timer rendering each transmitter operable only during the period its corresponding tracer is scanning the predetermined length l between two selected points of the surface. The apparatus described is used to measure the smoothness height, defined as the shaded area between the curves Pi, Pe (Fig. 3), divided by the length lto be inspected. The curve Pi is the actual profile and is described by a sharp-pointed tracer, while the curve Pe is the course of a tracer with a larger radius of curvature, e.g. one inch. Fig. 14 shows an electrical measuring apparatus employing two tracers T1, T2 supported on pairs of leaf springs N1, N2 and carrying flat steel blades Z1, Z2 respectively arranged between coils E1' E2 and F1, F2 of inductive transducers M1, M2. A timer element switches these transducers successively to the same parts of on electric bridge as the tracers pass over the test length so that a succession of pulses for each transducer is obtained which can be passed to integrating devices, the difference between the two integrals giving a measure of the roughness. Alternatively, the movements of the two tracers may be converted into D.C. voltages acting in opposition so that the difference can be fed into an integrating device to provide a direct roughness figure. An apparatus having four tracers is also described.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEW0024657 | 1958-12-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB932799A true GB932799A (en) | 1963-07-31 |
Family
ID=7597895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB4171159A Expired GB932799A (en) | 1958-12-13 | 1959-12-08 | Improvements in or relating to surface roughness measuring instruments |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB932799A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2140553A (en) * | 1983-05-24 | 1984-11-28 | Rieter Ag Maschf | Automat location system |
CN113358068A (en) * | 2021-04-26 | 2021-09-07 | 福建数博讯信息科技有限公司 | Floor type scaffold correcting method and device |
-
1959
- 1959-12-08 GB GB4171159A patent/GB932799A/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2140553A (en) * | 1983-05-24 | 1984-11-28 | Rieter Ag Maschf | Automat location system |
US4703617A (en) * | 1983-05-24 | 1987-11-03 | Rieter Machine Works, Ltd. | Automat location system |
CN113358068A (en) * | 2021-04-26 | 2021-09-07 | 福建数博讯信息科技有限公司 | Floor type scaffold correcting method and device |
CN113358068B (en) * | 2021-04-26 | 2023-06-20 | 福建数博讯信息科技有限公司 | Correction method and device for floor type scaffold |
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