GB9313950D0 - Electron spectroscopy apparatus - Google Patents

Electron spectroscopy apparatus

Info

Publication number: GB9313950D0
Authority: GB; United Kingdom
Prior art keywords: electron spectroscopy; spectroscopy apparatus; electron; spectroscopy
Prior art date: 1992-07-09
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

GB939313950A

Other versions

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

National Institute of Advanced Industrial Science and Technology AIST

Japan Technological Research Association of Artificial Photosynthetic Chemical Process

Original Assignee

Agency of Industrial Science and Technology

Japan Technological Research Association of Artificial Photosynthetic Chemical Process

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1992-07-09

Filing date

1993-07-06

Publication date

1993-08-18

1993-07-06 Application filed by Agency of Industrial Science and Technology, Japan Technological Research Association of Artificial Photosynthetic Chemical Process filed Critical Agency of Industrial Science and Technology

1993-08-18 Publication of GB9313950D0 publication Critical patent/GB9313950D0/en

1994-01-19 Publication of GB2268802A publication Critical patent/GB2268802A/en

1995-12-20 Application granted granted Critical

1995-12-20 Publication of GB2268802B publication Critical patent/GB2268802B/en

2013-07-06 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
- G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/085—Investigating materials by wave or particle radiation secondary emission photo-electron spectrum [ESCA, XPS]
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/204—Sources of radiation source created from radiated target

Landscapes

Physics & Mathematics (AREA)
Analytical Chemistry (AREA)
General Physics & Mathematics (AREA)
High Energy & Nuclear Physics (AREA)
Spectroscopy & Molecular Physics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
General Engineering & Computer Science (AREA)
Biochemistry (AREA)
Chemical & Material Sciences (AREA)
General Health & Medical Sciences (AREA)
Engineering & Computer Science (AREA)
Immunology (AREA)
Pathology (AREA)
Analysing Materials By The Use Of Radiation (AREA)
Electron Tubes For Measurement (AREA)

GB9313950A 1992-07-09 1993-07-06 Electron spectroscopy apparatus Expired - Fee Related GB2268802B (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP4205954A JP2764505B2 (en)	1992-07-09	1992-07-09	Electron spectroscopy method and electron spectrometer using the same

Publications (3)

Publication Number	Publication Date
GB9313950D0 true GB9313950D0 (en)	1993-08-18
GB2268802A GB2268802A (en)	1994-01-19
GB2268802B GB2268802B (en)	1995-12-20

Family

ID=16515457

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
GB9313950A Expired - Fee Related GB2268802B (en)	1992-07-09	1993-07-06	Electron spectroscopy apparatus

Country Status (3)

Country	Link
JP (1)	JP2764505B2 (en)
DE (1)	DE4322852C2 (en)
GB (1)	GB2268802B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
FR2752101B1 (en) *	1996-07-30	1998-10-09	Commissariat Energie Atomique	DEVICE FOR GENERATING ULTRA-SHORT X-RAY PULSES
DE19924204A1 (en) *	1999-05-27	2000-11-30	Geesthacht Gkss Forschung	Device and method for generating x-rays
US7391036B2 (en)	2002-04-17	2008-06-24	Ebara Corporation	Sample surface inspection apparatus and method
JP5110812B2 (en) *	2006-07-14	2012-12-26	日本電子株式会社	Chemical state analysis method and apparatus by Auger electron spectroscopy
CN106198581B (en) *	2016-08-30	2023-04-07	中国工程物理研究院激光聚变研究中心	Ultrashort X-ray double-angle double-color backlight photographing system based on laser-driven solid target

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4435828A (en) *	1982-04-14	1984-03-06	Battelle Development Corporation	Fluorescence laser EXAFS
JPH0225737A (en) *	1988-07-15	1990-01-29	Hitachi Ltd	Surface analysis method and device
JPH0718960B2 (en) *	1989-08-25	1995-03-06	株式会社島津製作所	X-ray microscope
JP3152455B2 (en) *	1991-08-02	2001-04-03	浜松ホトニクス株式会社	Energy distribution measurement device for charged particles

1992
- 1992-07-09 JP JP4205954A patent/JP2764505B2/en not_active Expired - Lifetime
1993
- 1993-07-06 GB GB9313950A patent/GB2268802B/en not_active Expired - Fee Related
- 1993-07-08 DE DE19934322852 patent/DE4322852C2/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
DE4322852A1 (en)	1994-01-13
JPH0627058A (en)	1994-02-04
JP2764505B2 (en)	1998-06-11
GB2268802A (en)	1994-01-19
DE4322852C2 (en)	1999-10-14
GB2268802B (en)	1995-12-20

Publication	Publication Date	Title
GB9321202D0 (en)	1993-12-01	Receiving apparatus
EP0574307A3 (en)	1994-08-24	Bar-storage apparatus
GB9209859D0 (en)	1992-06-24	Electrical apparatus
GB2284673B (en)	1997-01-08	Pile-testing apparatus
GB2269499B (en)	1996-05-15	Radio apparatus
SG52764A1 (en)	1998-09-28	Infant-care apparatus
GB2267235B (en)	1995-07-12	Screening apparatus
SG73395A1 (en)	2000-06-20	Shielding apparatus
GB9302884D0 (en)	1993-03-31	Material-testing apparatus
GB2268802B (en)	1995-12-20	Electron spectroscopy apparatus
GB2264145B (en)	1995-04-19	Latching apparatus
SG49725A1 (en)	1998-06-15	Vapourizer apparatus
HUT63483A (en)	1993-08-30	Steam-condensing apparatus
GB2267521B (en)	1995-06-28	Well apparatus
GB9216727D0 (en)	1992-09-23	X-ray spectrometer
GB2304012B (en)	1997-08-13	Receiving apparatus
GB2265413B (en)	1996-03-27	Locking apparatus
GB9526301D0 (en)	1996-02-21	Receiving Apparatus
GB2269934B (en)	1996-03-27	Spectrometer
GB9321508D0 (en)	1993-12-08	Spectrometer
GB9301563D0 (en)	1993-03-17	Electrical apparatus
GB9217826D0 (en)	1992-10-07	Elevation apparatus
GB9222135D0 (en)	1992-12-02	Electron spectrometer
PL293570A1 (en)	1993-08-23	Stomatalogical apparatus
HU9201210D0 (en)	1992-06-29	Onion-seeding apparatus

Legal Events

Date	Code	Title	Description
2012-03-28	PCNP	Patent ceased through non-payment of renewal fee	Effective date: 20110706