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GB9127093D0 - Field-effect transistor - Google Patents

Field-effect transistor

Info

Publication number
GB9127093D0
GB9127093D0 GB919127093A GB9127093A GB9127093D0 GB 9127093 D0 GB9127093 D0 GB 9127093D0 GB 919127093 A GB919127093 A GB 919127093A GB 9127093 A GB9127093 A GB 9127093A GB 9127093 D0 GB9127093 D0 GB 9127093D0
Authority
GB
United Kingdom
Prior art keywords
field
effect transistor
transistor
effect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GB919127093A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of GB9127093D0 publication Critical patent/GB9127093D0/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/021Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/0223Manufacture or treatment of FETs having insulated gates [IGFET] having source and drain regions or source and drain extensions self-aligned to sides of the gate
    • H10D30/0227Manufacture or treatment of FETs having insulated gates [IGFET] having source and drain regions or source and drain extensions self-aligned to sides of the gate having both lightly-doped source and drain extensions and source and drain regions self-aligned to the sides of the gate, e.g. lightly-doped drain [LDD] MOSFET or double-diffused drain [DDD] MOSFET
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/601Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs 
    • H10D30/605Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs  having significant overlap between the lightly-doped extensions and the gate electrode
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/01Manufacture or treatment
    • H10D64/021Manufacture or treatment using multiple gate spacer layers, e.g. bilayered sidewall spacers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/20Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/27Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
    • H10D64/311Gate electrodes for field-effect devices
    • H10D64/411Gate electrodes for field-effect devices for FETs
    • H10D64/511Gate electrodes for field-effect devices for FETs for IGFETs
    • H10D64/517Gate electrodes for field-effect devices for FETs for IGFETs characterised by the conducting layers
    • H10D64/518Gate electrodes for field-effect devices for FETs for IGFETs characterised by the conducting layers characterised by their lengths or sectional shapes
GB919127093A 1991-02-26 1991-12-20 Field-effect transistor Pending GB9127093D0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR910003121 1991-02-26

Publications (1)

Publication Number Publication Date
GB9127093D0 true GB9127093D0 (en) 1992-02-19

Family

ID=19311519

Family Applications (1)

Application Number Title Priority Date Filing Date
GB919127093A Pending GB9127093D0 (en) 1991-02-26 1991-12-20 Field-effect transistor

Country Status (4)

Country Link
JP (1) JPH04317339A (en)
DE (1) DE4143115A1 (en)
FR (1) FR2673326A1 (en)
GB (1) GB9127093D0 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69227772T2 (en) * 1992-09-30 1999-06-24 Stmicroelectronics S.R.L., Agrate Brianza, Mailand/Milano Process for the production of non-volatile memories and memories produced in this way
US5568418A (en) * 1992-09-30 1996-10-22 Sgs-Thomson Microelectronics S.R.L. Non-volatile memory in an integrated circuit
DE69232311D1 (en) * 1992-09-30 2002-01-31 St Microelectronics Srl Method of manufacturing integrated devices and integrated device thus manufactured
US7064027B2 (en) 2003-11-13 2006-06-20 International Business Machines Corporation Method and structure to use an etch resistant liner on transistor gate structure to achieve high device performance
CN102074583B (en) * 2010-11-25 2012-03-07 北京大学 Low power consumption composite source structure MOS (Metal Oxide for and preparation method thereof
US9543427B2 (en) 2014-09-04 2017-01-10 Panasonic Intellectual Property Management Co., Ltd. Semiconductor device and method for fabricating the same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59205759A (en) * 1983-04-01 1984-11-21 Hitachi Ltd MIS type field effect transistor
JPS6032354A (en) * 1983-08-02 1985-02-19 Matsushita Electronics Corp Semiconductor integrated circuit
JPH0834310B2 (en) * 1987-03-26 1996-03-29 沖電気工業株式会社 Method for manufacturing semiconductor device
JPH01149449A (en) * 1987-12-04 1989-06-12 Fujitsu Ltd CMOS semiconductor device and its manufacturing method
EP0355691A3 (en) * 1988-08-23 1990-05-30 Seiko Epson Corporation Semiconductor device and process for producing the same
US4951100A (en) * 1989-07-03 1990-08-21 Motorola, Inc. Hot electron collector for a LDD transistor

Also Published As

Publication number Publication date
DE4143115A1 (en) 1992-09-03
JPH04317339A (en) 1992-11-09
FR2673326A1 (en) 1992-08-28

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